TAS5112DFDRG4 [TI]

Digital Amplifier Stereo Power Stage 56-HTSSOP 0 to 70;
TAS5112DFDRG4
型号: TAS5112DFDRG4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

Digital Amplifier Stereo Power Stage 56-HTSSOP 0 to 70

放大器 光电二极管 商用集成电路
文件: 总22页 (文件大小:806K)
中文:  中文翻译
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ꢀꢁ ꢂꢃ ꢄꢄꢅ  
SLES048C − JULY 2003 − REVISED MARCH 2004  
www.ti.com  
TM  
FEATURES  
APPLICATIONS  
D
D
D
D
DVD Receiver  
Home Theatre  
Mini/Micro Component Systems  
Internet Music Appliance  
D
D
D
D
D
D
50 W per Channel (BTL) Into 6 (Stereo)  
95-dB Dynamic Range With TAS5026  
Less Than 0.1% THD+N (1 W RMS Into 6 )  
Less Than 0.2% THD+N (50 W RMS into 6 )  
DESCRIPTION  
Power Efficiency Typically 90% Into 6-Load  
The TAS5112 is a high-performance, integrated stereo  
digital amplifier power stage designed to drive 6-  
speakers at up to 50 W per channel. The device  
incorporates TI’s PurePath Digitalt technology and is  
used with a digital audio PWM processor (TAS50XX) and  
a simple passive demodulation filter to deliver high-quality,  
high-efficiency, true-digital audio amplification.  
Self-Protecting Design (Undervoltage,  
Overtemperature and Short Conditions) With  
Error Reporting  
D
D
Internal Gate Drive Supply Voltage Regulator  
EMI Compliant When Used With  
Recommended System Design  
The efficiency of this digital amplifier is typically 90%,  
reducing the size of both the power supplies and heatsinks  
needed. Overcurrent protection, overtemperature  
protection, and undervoltage protection are built into the  
TAS5112, safeguarding the device and speakers against  
fault conditions that could damage the system.  
THD + NOISE vs OUTPUT POWER  
1
THD + NOISE vs FREQUENCY  
1
R
= 6  
= 75°C  
R
= 6 Ω  
= 75°C  
L
L
T
C
T
C
P
O
= 50 W  
0.1  
P
O
= 10 W  
0.1  
P
O
= 1 W  
0.01  
0.01  
0.001  
100m  
1
10  
100  
20  
100  
1k  
f − Frequency − Hz  
10k 20k  
P
− Output Power − W  
O
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments  
semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PurePath Digital and PowerPAD are trademarks of Texas Instruments.  
Other trademarks are the property of their respective owners.  
ꢋꢎ ꢏ ꢆꢑ ꢒ ꢀꢇ ꢏꢓ ꢆ ꢁꢀꢁ ꢔꢕ ꢖꢗ ꢘ ꢙꢚ ꢛꢔꢗꢕ ꢔꢜ ꢝꢞ ꢘ ꢘ ꢟꢕꢛ ꢚꢜ ꢗꢖ ꢠꢞꢡ ꢢꢔꢝ ꢚꢛꢔ ꢗꢕ ꢣꢚ ꢛꢟꢤ ꢋꢘ ꢗꢣꢞ ꢝꢛꢜ  
ꢝ ꢗꢕ ꢖꢗꢘ ꢙ ꢛꢗ ꢜ ꢠꢟ ꢝ ꢔ ꢖꢔ ꢝ ꢚ ꢛꢔ ꢗꢕꢜ ꢠ ꢟꢘ ꢛꢥꢟ ꢛꢟ ꢘ ꢙꢜ ꢗꢖ ꢀꢟꢦ ꢚꢜ ꢇꢕꢜ ꢛꢘ ꢞꢙ ꢟꢕꢛ ꢜ ꢜꢛ ꢚꢕꢣ ꢚꢘ ꢣ ꢧ ꢚꢘ ꢘ ꢚ ꢕꢛꢨꢤ  
ꢋꢘ ꢗ ꢣꢞꢝ ꢛ ꢔꢗ ꢕ ꢠꢘ ꢗ ꢝ ꢟ ꢜ ꢜ ꢔꢕ ꢩ ꢣꢗ ꢟ ꢜ ꢕꢗꢛ ꢕꢟ ꢝꢟ ꢜꢜ ꢚꢘ ꢔꢢ ꢨ ꢔꢕꢝ ꢢꢞꢣ ꢟ ꢛꢟ ꢜꢛꢔ ꢕꢩ ꢗꢖ ꢚꢢ ꢢ ꢠꢚ ꢘ ꢚꢙ ꢟꢛꢟ ꢘ ꢜꢤ  
Copyright 2004, Texas Instruments Incorporated  
ꢄꢄ  
www.ti.com  
SLES048C − JULY 2003 − REVISED MARCH 2004  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during  
storage or handling to prevent electrostatic damage to the MOS gates.  
GENERAL INFORMATION  
ABSOLUTE MAXIMUM RATINGS  
(1)  
over operating free-air temperature range unless otherwise noted  
Terminal Assignment  
TAS5112  
DVDD TO DGND  
UNITS  
–0.3 V to 4.2 V  
33.5 V  
33.5 V  
48 V  
The TAS5112 is offered in a thermally enhanced 56-pin  
TSSOP DFD (thermal pad is on the top), shown as follows.  
GVDD TO GND  
DFD PACKAGE  
(TOP VIEW)  
PVDD_X TO GND (dc voltage)  
PVDD_X TO GND (spike voltage  
OUT_X TO GND (dc voltage)  
(2)  
)
)
33.5 V  
48 V  
GND  
GND  
GND  
GVDD  
1
56  
55  
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
(2)  
OUT_X TO GND (spike voltage  
BST_X TO GND (dc voltage)  
BST_X TO GND (spike voltage  
2
GREG  
3
BST_D  
PVDD_D  
PVDD_D  
OUT_D  
OUT_D  
GND  
48 V  
OTW  
4
(2)  
)
53 V  
SD_CD  
SD_AB  
PWM_DP  
PWM_DM  
RESET_CD  
PWM_CM  
PWM_CP  
DREG_RTN  
M3  
5
(3)  
GREG TO GND  
14.2 V  
6
PWM_XP, RESET, M1, M2, M3, SD,  
OTW  
7
–0.3 V to DVDD + 0.3 V  
8
Maximum operating junction  
9
GND  
–40°C to 150°C  
–40°C to 125°C  
temperature, T  
J
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
OUT_C  
OUT_C  
PVDD_C  
PVDD_C  
BST_C  
BST_B  
PVDD_B  
PVDD_B  
OUT_B  
OUT_B  
GND  
Storage temperature  
(1)  
Stresses beyond those listed under “absolute maximum ratings”  
may cause permanent damage to the device. These are stress  
ratings only, and functional operation of the device at these or any  
other conditions beyond those indicated under “recommended  
operating conditions” is not implied. Exposure to absolute-  
maximum-ratedconditions for extended periods may affect device  
reliability.  
M2  
M1  
DREG  
PWM_BP  
PWM_BM  
RESET_AB  
PWM_AM  
PWM_AP  
GND  
(2)  
(3)  
The duration of voltage spike should be less than 100 ns.  
GREG is treated as an input when the GREG pin is overdriven by  
GVDD of 12 V.  
GND  
ORDERING INFORMATION  
OUT_A  
OUT_A  
PVDD_A  
PVDD_A  
BST_A  
GVDD  
T
A
PACKAGE  
DESCRIPTION  
DGND  
GND  
DVDD  
GREG  
GND  
GND  
0°C to 70°C  
TAS5112DFD  
56-pin small TSSOP  
(1)  
For the most current specification and package information, refer to  
our Web site at www.ti.com.  
PACKAGE DISSIPATION RATINGS  
R
R
GND  
θJC  
θJA  
PACKAGE  
(°C/W)  
(°C/W)  
56-pin DAD TSSOP  
1.14  
See Note 1  
(1)  
The TAS5112 package is thermally enhanced for conductive  
cooling using an exposed metal pad area. It is impractical to use the  
device with the pad exposed to ambient air as the only heat sinking  
of the device.  
For this reason, R  
thermaltreatment, is provided in theApplication Information section  
a system parameter that characterizes the  
θJA,  
of the data sheet. An example and discussion of typical system  
R
θJA  
values are provided in the Thermal Information section. This  
example provides additional information regarding the power  
dissipationratings. This example should be used as a reference to  
calculate the heat dissipation ratings for a specific application. TI  
application engineering provides technical support to design  
heatsinks if needed.  
2
www.ti.com  
ꢀꢁ ꢂꢃ ꢄꢄꢅ  
SLES048C − JULY 2003 − REVISED MARCH 2004  
Terminal Functions  
TERMINAL  
NAME  
BST_A  
(1)  
FUNCTION  
DESCRIPTION  
NO.  
31  
42  
43  
54  
23  
16  
12  
25  
P
P
P
P
P
P
P
P
P
High-side bootstrap supply (BST), external capacitor to OUT_A required  
High-side bootstrap supply (BST), external capacitor to OUT_B required  
HS bootstrap supply (BST), external capacitor to OUT_C required  
HS bootstrap supply (BST), external capacitor to OUT_D required  
Digital I/O reference ground  
BST_B  
BST_C  
BST_D  
DGND  
DREG  
Digital supply voltage regulator decoupling pin, capacitor connected to GND  
Digital supply voltage regulator decoupling return pin  
I/O reference supply input (3.3 V)  
DREG_RTN  
DVDD  
GND  
1, 2, 22, 24,  
27, 28, 29, 36,  
37, 48, 49, 56  
Power ground  
GREG  
3, 26  
30, 55  
15  
P
P
I
Gate drive voltage regulator decoupling pin, capacitor to REG_GND  
Voltage supply to on-chip gate drive and digital supply voltage regulators  
Mode selection pin  
GVDD  
M1 (TST0)  
M2  
14  
I
Mode selection pin  
M3  
13  
I
Mode selection pin  
OTW  
4
O
O
O
O
O
P
P
P
P
I
Overtemperature warning output, open drain with internal pullup resistor  
Output, half-bridge A  
OUT_A  
34, 35  
38, 39  
46, 47  
50, 51  
32, 33  
40, 41  
44, 45  
52, 53  
20  
OUT_B  
Output, half-bridge B  
OUT_C  
Output, half-bridge C  
OUT_D  
Output, half-bridge D  
PVDD_A  
PVDD_B  
PVDD_C  
PVDD_D  
PWM_AM  
PWM_AP  
PWM_BM  
PWM_BP  
PWM_CM  
PWM_CP  
PWM_DM  
PWM_DP  
RESET_AB  
RESET_CD  
SD_AB  
Power supply input for half-bridge A  
Power supply input for half-bridge B  
Power supply input for half-bridge C  
Power supply input for half-bridge D  
Input signal (negative), half-bridge A  
Input signal (positive), half-bridge A  
Input signal (negative), half-bridge B  
Input signal (positive), half-bridge B  
Input signal (negative), half-bridge C  
Input signal (positive), half-bridge C  
Input signal (negative), half-bridge D  
Input signal (positive), half-bridge D  
Reset signal, active low  
21  
I
18  
I
17  
I
10  
I
11  
I
8
I
7
I
19  
I
9
I
Reset signal, active low  
6
O
O
Shutdown signal for half-bridges A and B, active-low  
Shutdown signal for half-bridges C and D, active-low  
SD_CD  
5
(1)  
I = input, O = Output, P = Power  
3
ꢀꢁ  
ꢄꢄ  
www.ti.com  
SLES048C − JULY 2003 − REVISED MARCH 2004  
FUNCTIONAL BLOCK DIAGRAM  
BST_A  
GREG  
PVDD_A  
Gate  
Drive  
OUT_A  
GND  
PWM_AP  
PWM  
Timing  
Control  
Receiver  
Gate  
Drive  
Protection A  
BST_B  
RESET  
GREG  
PVDD_B  
Protection B  
Gate  
Drive  
PWM_BP  
OUT_B  
GND  
PWM  
Receiver  
Timing  
Control  
Gate  
Drive  
To Protection  
Blocks  
DREG  
DREG  
GVDD  
OTW  
SD  
GREG  
OT  
Protection  
UVP  
GREG  
GREG  
DREG  
GREG  
DREG_RTN  
DREG_RTN  
This diagram shows one channel.  
4
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ꢀꢁ ꢂꢃ ꢄꢄꢅ  
SLES048C − JULY 2003 − REVISED MARCH 2004  
RECOMMENDED OPERATING CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
(1)  
DVDD  
GVDD  
Digital supply  
Relative to DGND  
Relative to GND  
3
3.3  
3.6  
V
Supply for internal gate drive and logic  
regulators  
16  
29.5  
29.5  
30.5  
V
PVDD_x Half-bridge supply  
Junction temperature  
It is recommended for DVDD to be connected to DREG via a 100-resistor.  
Relative to GND, R = 6 to 8 Ω  
0
0
30.5  
125  
V
L
T
J
_C  
(1)  
ELECTRICAL CHARACTERISTICS  
PVDD_X = 29.5 V, GVDD = 29.5 V, DVDD connected to DREG via a 100-resistor, R = 6 , 8X f = 384 kHz, unless otherwise noted  
L
s
TYPICAL  
OVER TEMPERATURE  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
T
75°C  
=
T =40°C  
TO 85°C  
MIN/TYP/  
MAX  
Case  
A
T =25°C  
A
T =25°C  
A
UNITS  
AC PERFORMANCE, BTL Mode, 1 kHz  
R
= 8 , THD = 0.2%,  
L
40  
50  
50  
62  
W
W
W
W
Typ  
Typ  
Typ  
Typ  
Typ  
Typ  
Typ  
AES17 filter, 1 kHz  
R
L
= 8 , THD = 10%, AES17  
filter, 1 kHz  
Po  
Output power  
R
L
= 6 , THD = 0.2%,  
AES17 filter, 1 kHz  
R
L
= 6 , THD = 10%, AES17  
filter, 1 kHz  
Po = 1 W/ channel, R = 6 Ω,  
AES17 filter  
L
0.03%  
0.04%  
0.2%  
Po = 10 W/channel, R = 6 Ω,  
AES17 filter  
Total harmonic distortion  
+ noise  
L
THD+N  
Po = 50 W/channel, R = 6 Ω,  
AES17 filter  
L
Output integrated voltage A-weighted, mute, R = 6 ,,  
L
V
260  
96  
µV  
dB  
dB  
Max  
Typ  
Typ  
n
noise  
20 Hz to 20 kHz, AES17 filter  
SNR  
DR  
Signal-to-noise ratio  
A-weighted, AES17 filter  
f = 1 kHz, A-weighted,  
AES17 filter  
Dynamic range  
96  
INTERNAL VOLTAGE REGULATOR  
I
= 1 mA,  
o
DREG  
GREG  
IVGDD  
IDVDD  
Voltage regulator  
Voltage regulator  
3.1  
V
Typ  
Typ  
PVDD = 18 V−30.5 V  
I
o
= 1.2 mA,  
13.4  
V
PVDD = 18 V−30.5 V  
f = 384 kHz, no load, 50%  
S
GVDD supply current,  
operating  
24  
5
mA  
mA  
Max  
Max  
duty cycle  
DVDD supply current,  
operating  
f
S
= 384 kHz, no load  
1
OUTPUT STAGE MOSFETs  
Forward on-resistance,  
low side  
R
T = 25°C  
155  
155  
mΩ  
mΩ  
Typ  
Typ  
on,LS  
on,HS  
J
Forward on-resistance,  
high side  
R
T = 25°C  
J
5
ꢀꢁ  
ꢄꢄ  
www.ti.com  
SLES048C − JULY 2003 − REVISED MARCH 2004  
ELECTRICAL CHARACTERISTICS  
PVDD_x = 29.5 V, GVDD = 29.5 V, DVDD connected to DREG via a 100-resistor, R = 6 , 8X f = 384 kHz, unless otherwise noted  
L
s
TYPICAL  
OVER TEMPERATURE  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
T
=
T =40°C  
TO 85°C  
MIN/TYP/  
MAX  
Case  
75°C  
A
T =25°C  
A
T =25°C  
A
UNITS  
INPUT/OUTPUT PROTECTION  
Set the DUT in normal  
operation mode with all the  
protections enabled. Sweep  
GVDD up and down. Monitor  
SD output. Record the  
GREG reading when SD is  
triggered.  
6.9  
7.9  
V
Min  
Undervoltage protection  
limit, GVDD  
V
7.4  
uvp,G  
V
Max  
Typ  
Overtemperature warning,  
junction temperature  
OTW  
125  
°C  
Overtemperature error,  
junction temperature  
OTE  
OC  
150  
5.8  
°C  
Typ  
Typ  
Overcurrent protection  
See Note 1.  
A
STATIC DIGITAL SPECIFICATION  
PWM_AP, PWM_BP, M1,  
M2, M3, SD, OTW  
2
DVDD  
0.8  
V
V
Min  
Max  
Max  
Min  
V
V
High-level input voltage  
Low-level input voltage  
IH  
V
IL  
−10  
10  
µA  
µA  
Leakage  
Input leakage current  
Max  
OTW/SHUTDOWN (SD)  
Internally pull up R from  
30  
22.5  
0.4  
kΩ  
Min  
OTW/SD to DVDD  
V
OL  
Low-level output voltage  
I
O
= 4 mA  
V
Max  
(1)  
To optimize device performance and prevent overcurrent (OC) protection tripping, the demodulation filter must be designed with special care. See  
DemodulationFilter Design in the Application Information section of the data sheet and consider the recommended inductors and capacitors for  
optimalperformance. It is also important to consider PCB design and layout for optimum performance of the TAS5112. It is recommended to follow  
the TAS5112F2EVM (S/N 112) design and layout guidelines for best performance.  
6
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ꢀꢁ ꢂꢃ ꢄꢄꢅ  
SLES048C − JULY 2003 − REVISED MARCH 2004  
SYSTEM CONFIGURATION USED FOR CHARACTERIZATION  
Gate-Drive  
Power Supply  
External Power Supply  
H-Bridge  
Power Supply  
TAS5112DFD  
1
2
3
4
5
6
7
8
9
56  
55  
54  
53  
52  
51  
50  
49  
48  
47  
GND  
GND  
GVDD  
1 µF  
GND  
1.5 Ω  
100 nF  
GREG  
BST_D  
PVDD_D  
PVDD_D  
OUT_D  
OUT_D  
GND  
L
33 nF  
PCB  
OTW  
SD_CD  
SD_AB  
PWM_DP  
PWM_DM  
RESET_CD  
PWM_CM  
PWM_CP  
DREG_RTN  
M3  
100 nF  
ERR_RCVY  
PWM_AP_1  
PWM_AM_1  
VALID_1  
10 µH  
4.7 kΩ  
4.7 kΩ  
1.5 Ω  
{
470 nF  
100 nF  
100 nF  
GND  
10  
11  
12  
13  
14  
15  
1.5 Ω  
10 µH  
OUT_C  
OUT_C  
46  
45  
44  
43  
{
100 nF  
PVDD_C  
PVDD_C  
BST_C  
100 nF  
L
PWM PROCESSOR  
TAS5026  
PCB  
33 nF  
1000 µF  
M2  
1.5 Ω  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
M1  
BST_B  
PVDD_B  
PVDD_B  
OUT_B  
OUT_B  
GND  
16  
17  
L
33 nF  
PCB  
DREG  
PWM_BP  
PWM_AP_2  
PWM_AM_2  
VALID_2  
100 nF  
18  
19  
20  
21  
PWM_BM  
RESET_AB  
PWM_AM  
PWM_AP  
GND  
10 µH  
4.7 kΩ  
4.7 kΩ  
1.5 Ω  
{
470 nF  
100 nF  
100 nF  
GND  
OUT_A  
OUT_A  
PVDD_A  
PVDD_A  
BST_A  
GVDD  
22  
23  
1.5 Ω  
100 Ω  
10 µH  
DGND  
{
100 nF  
100 nF  
24  
25  
GND  
DVDD  
GREG  
GND  
L
PCB  
33 nF  
31  
30  
29  
26  
27  
1000 µF  
1 µF  
1.5 Ω  
28  
100 nF  
GND  
GND  
L
{
: TRACK IN THE PCB (1,0 mm wide and 50 mm long)  
Voltage Suppressor Diode: 1SMA33CAT  
PCB  
7
ꢀꢁ  
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SLES048C − JULY 2003 − REVISED MARCH 2004  
TYPICAL CHARACTERISTICS AND SYSTEM PERFORMANCE  
OF TAS5112 EVM WITH TAS5026 PWM PROCESSOR  
TOTAL HARMONIC DISTORTION + NOISE  
NOISE AMPLITUDE  
vs  
vs  
FREQUENCY  
FREQUENCY  
1
0
−20  
R
T
= 6 Ω  
= 75°C  
R
= 6 Ω  
L
C
L
FFT = −60 dB  
T
C
= 75°C  
TAS5026 Front End Device  
P
O
= 50 W  
−40  
0.1  
−60  
P
O
= 10 W  
−80  
P
O
= 1 W  
−100  
−120  
−140  
−160  
0.01  
0.001  
0
2
4
6
8
10 12 14 16 18 20 22  
20  
100  
1k  
10k 20k  
f − Frequency − Hz  
f − Frequency − kHz  
Figure 1  
Figure 2  
TOTAL HARMONIC DISTORTION + NOISE  
OUTPUT POWER  
vs  
vs  
OUTPUT POWER  
H-BRIDGE VOLTAGE  
10  
60  
50  
40  
30  
20  
10  
0
R
= 6 Ω  
= 75°C  
T
A
= 75°C  
L
T
C
1
R
L
= 6 Ω  
R
L
= 8 Ω  
0.1  
0.01  
0
4
8
12  
16  
20  
24  
28  
32  
100m  
1
10  
100  
P
O
− Output Power − W  
VDD − Supply Voltage − V  
Figure 3  
Figure 4  
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SYSTEM OUTPUT STAGE EFFICIENCY  
POWER LOSS  
vs  
vs  
OUTPUT POWER  
OUTPUT POWER  
11  
10  
9
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
f = 1 kHz  
R
T
= 6 Ω  
= 75°C  
L
C
8
7
6
5
4
3
2
f = 1 kHz  
R
T
= 6 Ω  
= 75°C  
L
1
C
0
0
5
10 15 20 25 30 35 40 45 50 55 60 65  
0
5
10 15 20 25 30 35 40 45 50 55 60 65  
P
O
− Output Power − W  
P
O
− Output Power − W  
Figure 5  
Figure 6  
OUTPUT POWER  
vs  
AMPLITUDE  
vs  
CASE TEMPERATURE  
FREQUENCY  
60  
58  
56  
54  
52  
50  
48  
46  
44  
42  
40  
3.0  
2.5  
PVDD = 29.5 V  
R
L
= 6 Ω  
2.0  
1.5  
1.0  
R
L
= 6 Ω  
0.5  
0.0  
Channel 1  
−0.5  
−1.0  
−1.5  
−2.0  
−2.5  
−3.0  
Channel 2  
R
L
= 8 Ω  
0
20  
40  
60  
80  
100  
120  
140  
10  
100  
1k  
10k  
50k  
T
C
− Case Temperature − °C  
f − Frequency − Hz  
Figure 7  
Figure 8  
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ON-STATE RESISTANCE  
vs  
JUNCTION TEMPERATURE  
200  
190  
180  
170  
160  
150  
140  
130  
120  
0
10 20 30 40 50 60 70 80 90 100  
T
J
− Junction Temperature − °C  
Figure 9  
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This precharges the bootstrap supply capacitors and  
discharges the output filter capacitor (see the Typical  
TAS5112 Application Configuration section).  
THEORY OF OPERATION  
POWER SUPPLIES  
After GVDD has been applied, it takes approximately 800  
µs to fully charge the BST capacitor. Within this time,  
RESET must be kept low. After approximately 1 ms, the  
back-end bootstrap capacitor is charged.  
The power device only requires two supply voltages,  
GVDD and PVDD_X.  
GVDD is the gate drive supply for the device, regulated  
internally down to approximately 12 V, and decoupled with  
regards to board GND on the GREG pins through an  
external capacitor. GREG powers both the low side and  
high side via a bootstrap step-up conversion. The  
bootstrap supply is charged after the first low-side turn-on  
pulse. Internal digital core voltage DREG is also derived  
from GVDD and regulated down by internal circuitry to  
3.3 V.  
RESET can now be released if the modulator is powered  
up and streaming valid PWM signals to the back-end  
PWM_xP. Valid means a switching PWM signal which  
complies with the frequency and duty cycle ranges stated  
in the Recommended Operating Conditions.  
A constant HIGH dc level on the PWM_xP is not permitted,  
because it would force the high-side MOSFET ON until it  
eventually ran out of BST capacitor energy and might  
damage the device.  
The gate-driver regulator can be bypassed for reducing  
idle loss in the device by shorting GREG to GVDD and  
directly feeding in 12.0 V. This can be useful in an  
application where thermal conduction of heat from the  
device is difficult.  
An unknown state of the PWM output signals from the  
modulator is illegal and should be avoided, which in  
practice means that the PWM processor must be powered  
up and initialized before RESET is de-asserted HIGH to  
the back end.  
PVDD_X is the H-bridge power supply pin. Two power pins  
exists for each half-bridge to handle the current density. It  
is important that the circuitry recommendations around  
the PVDD_X pins are followed carefully both topology-  
and layout-wise. For topology recommendations, see the  
Typical System Configuration section. Following these  
recommendations is important for parameters like EMI,  
reliability, and performance.  
POWERING DOWN  
For power down of the back end, an opposite approach is  
necessary. The RESET must be asserted LOW before the  
valid PWM signal is removed.  
When PWM processors are used with TI PurePath Digital  
amplifiers, the correct timing control of RESET and  
PWM_xP is performed by the modulator.  
POWERING UP  
PRECAUTION  
> 1 ms  
> 1 ms  
The TAS5112 must always start up in the high-impedance  
(Hi-Z) state. In this state, the bootstrap (BST) capacitor is  
precharged by a resistor on each PWM output node to  
ground. See the system configuration. This ensures that  
the back end is ready for receiving PWM pulses, indicating  
either HIGH- or LOW-side turnon after RESET is  
de-asserted to the back end.  
RESET  
GVDD  
With the following pulldown resistor and BST capacitor  
size, the charge time is:  
PVDD_x  
C = 33 nF, R = 4.7 kΩ  
R × C × 5 = 775.5 µs  
After GVDD has been applied, it takes approximately 800  
µs to fully charge the BST capacitor. During this time,  
RESET must be kept low. After approximately 1 ms the  
back end BST is charged and ready. RESET can now be  
released if the PWM modulator is ready and is streaming  
valid PWM signals to the back end. Valid PWM signals are  
switching PWM signals with a frequency between  
350−400 kHz. A constant HIGH level on the PWM+ would  
force the high-side MOSFET ON until it eventually ran out  
of BST capacitor energy. Putting the device in this  
condition should be avoided.  
PWM_xP  
NOTE: PVDD should not be powered up before GVDD.  
During power up when RESET is asserted LOW, all  
MOSFETs are turned off and the two internal half-bridges  
are in the high-impedance state (Hi-Z). The bootstrap  
capacitors supplying high-side gate drive are not charged  
at this point. To comply with the click and pop scheme and  
use of non-TI modulators it is recommended to use a 4-kΩ  
pulldown resistor on each PWM output node to ground.  
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In practice this means that the DVDD-to-PWM processor  
(front-end) should be stable and initialization should be  
completed before RESET is de-asserted to the back end.  
The device can be recovered by toggling RESET low and  
then high, after all errors are cleared.  
Overcurrent (OC) Protection  
The device has individual forward current protection on  
both high-side and low-side power stage FETs. The OC  
protection works only with the demodulation filter present  
at the output. See Demodulation Filter Design in the  
Application Information section of the data sheet for design  
constraints.  
CONTROL I/O  
Shutdown Pin: SD  
The SD pin functions as an output pin and is intended for  
protection-mode signaling to, for example, a controller or  
other front-end device. The pin is open-drain with an  
internal pullup resistor to DVDD.  
Overtemperature (OT) Protection  
The logic output is, as shown in the following table, a  
combination of the device state and RESET input:  
A dual temperature protection system asserts a warning  
signal when the device junction temperature exceeds  
125°C. The OT protection circuit is shared by all  
half-bridges.  
SD  
0
RESET  
DESCRIPTION  
0
1
Not used  
0
Device in protection mode, i.e., UVP and/or OC  
and/or OT error  
Undervoltage (UV) Protection  
(1)  
1
1
0
1
Device set high-impedance (Hi-Z), SD forced high  
Normal operation  
Undervoltage lockout occurs when GVDD is insufficient  
for proper device operation. The UV protection system  
protects the device under power-up and power-down  
situations. The UV protection circuits are shared by all  
half-bridges.  
(1)  
SD is pulled high when RESET is asserted low independent of chip  
state (i.e., protection mode). This is desirable to maintain  
compatibilitywith some TI PWM front ends.  
Temperature Warning Pin: OTW  
Reset Function  
The OTW pin gives a temperature warning signal when  
temperature exceeds the set limit. The pin is of the  
open-drain type with an internal pullup resistor to DVDD.  
The function of the reset input is twofold:  
D
D
Reset is used for re-enabling operation after a  
latching error event.  
OTW  
DESCRIPTION  
0
1
Junction temperature higher than 125°C  
Junction temperature lower than 125°C  
Reset is used for disabling output stage  
switching (mute function).  
Overall Reporting  
The error latch is cleared on the falling edge of reset and  
normal operation is resumed when reset goes high.  
The SD pin, together with the OTW pin, gives chip state  
information as described in Table 1.  
Table 1. Error Signal Decoding  
PROTECTION MODE  
OTW  
SD  
0
DESCRIPTION  
0
0
1
1
Overtemperatureerror (OTE)  
Autorecovery (AR) After Errors (PMODE0)  
1
Overtemperature warning (OTW)  
Overcurrent (OC) or undervoltage (UVP) error  
Normal operation, no errors/warnings  
0
In autorecovery mode (PMODE0) the TAS5112 is  
self-supported in handling of error situations. All protection  
systems are active, setting the output stage in the  
high-impedance state to protect the output stage and  
connected equipment. However, after a short time the  
device autorecovers, i.e., operation is automatically  
resumed provided that the system is fully operational.  
1
Chip Protection  
The TAS5112 protection function is implemented in a  
closed loop with, for example, a system controller and TI  
PWM processor. The TAS5112 contains three individual  
systems protecting the device against error conditions. All  
of the error events covered result in the output stage being  
set in a high-impedance state (Hi-Z) for maximum  
protection of the device and connected equipment.  
The autorecovery timing is set by counting PWM input  
cycles, i.e., the timing is relative to the switching frequency.  
The AR system is common to both half-bridges.  
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Timing and Function  
Table 3. Output Mode Selection  
The function of the autorecovery circuit is as follows:  
M3  
0
OUTPUT MODE  
Bridge-tied load output stage (BTL)  
Reserved  
1. An error event occurs and sets the  
protection latch (output stage goes Hi-Z).  
1
2. The counter is started.  
APPLICATION INFORMATION  
3. After n/2 cycles, the protection latch is  
cleared but the output stage remains Hi-Z  
(identical to pulling RESET low).  
DEMODULATION FILTER DESIGN  
4. After n cycles, operation is resumed  
(identical to pulling RESET high) (n = 512).  
The PurePath Digital amplifier outputs are driven by  
heavy-duty DMOS transistors in an H-bridge  
configuration. These transistors are either off or fully on,  
which reduces the DMOS transistor on-state resistance,  
R(DMOSon), and the power dissipated in the device,  
thereby increasing efficiency.  
Error  
Protection  
Latch  
The result is a square-wave output signal with a duty cycle  
that is proportional to the amplitude of the audio signal. It  
is recommended that a second-order LC filter be used to  
recover the audio signal. For this application, EMI is  
considered important; therefore, the selected filter is the  
full-output type shown in Figure 11.  
Shutdown  
SD  
Autorecovery  
PWM  
TAS51xx  
L
Counter  
Output A  
R
(Load)  
AR-RESET  
C1A  
C1B  
Figure 10. Autorecovery Function  
C2  
Latching Shutdown on All Errors (PMODE1)  
In latching shutdown mode, all error situations result in a  
power down (output stage Hi-Z). Re-enabling can be done  
by toggling the RESET pin.  
L
Output B  
All Protection Systems Disabled (PMODE2)  
Figure 11. Demodulation Filter  
In PMODE2, all protection systems are disabled. This  
mode is purely intended for testing and characterization  
purposes and thus not recommended for normal device  
operation.  
The main purpose of the output filter is to attenuate the  
high-frequency switching component of the PurePath  
Digital amplifier while preserving the signals in the audio  
band.  
MODE Pins Selection  
Design of the demodulation filter affects the performance  
of the power amplifier significantly. As a result, to ensure  
proper operation of the overcurrent (OC) protection circuit  
and meet the device THD+N specifications, the selection  
of the inductors used in the output filter must be considered  
according to the following. The rule is that the inductance  
should remain stable within the range of peak current seen  
at maximum output power and deliver at least 5 µH of  
inductance at 15 A.  
The protection mode is selected by shorting M1/M2 to  
DREG or DGND according to Table 2.  
Table 2. Protection Mode Selection  
M1 M2  
PROTECTION MODE  
Autorecovery after errors (PMODE 0)  
Latching shutdown on all errors (PMODE 1)  
All protection systems disabled (PMODE 2)  
Reserved  
0
0
1
1
0
1
0
1
If this rule is observed, the TAS5112 does not have  
distortion issues due to the output inductors and  
overcurrent conditions do not occur due to inductor  
saturation in the output filter.  
The output configuration mode is selected by shorting the  
M3 pin to DREG or DGND according to Table 3.  
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Another parameter to be considered is the idle current loss  
in the inductor. This can be measured or specified as  
inductor dissipation (D). The target specification for  
dissipation is less than 0.05.  
THERMAL INFORMATION  
The thermally augmented package provided with the  
TAS5112 is designed to be interfaced directly to heatsinks  
using a thermal interface compound (for example,  
Wakefield Engineering type 126 thermal grease.) The  
heatsink then absorbs heat from the ICs and couples it to  
the local air. If the heatsink is carefully designed, this  
process can reach equilibrium and heat can be continually  
removed from the ICs. Because of the efficiency of the  
TAS5112, heatsinks can be smaller than those required for  
linear amplifiers of equivalent performance.  
In general, 10-µH inductors suffice for most applications.  
The frequency response of the amplifier is slightly altered  
by the change in output load resistance; however, unless  
tight control of frequency response is necessary (better  
than 0.5 dB), it is not necessary to deviate from 10 µH.  
The graphs in Figure 12 display the inductance vs current  
characteristics of two inductors that are recommended for  
use with the TAS5112.  
R
is a system thermal resistance from junction to  
θ
JA  
ambient air. As such, it is a system parameter with roughly  
the following components:  
D
D
R
(the thermal resistance from junction to  
JC  
θ
case, or in this case the metal pad)  
Thermal grease thermal resistance  
Heatsink thermal resistance  
INDUCTANCE  
vs  
CURRENT  
D
11  
R
has been provided in the General Information  
θ
JC  
section.  
DFB1310A  
10  
The thermal grease thermal resistance can be calculated  
from the exposed pad area and the thermal grease  
manufacturer’s area thermal resistance (expressed in  
9
2
°C-in /W). The area thermal resistance of the example  
DASL983XX−1023  
8
thermal grease with a 0.002-inch thick layer is about 0.1  
2
°C-in /W. The approximate exposed pad area is as  
follows:  
7
6
5
4
2
56-pin HTSSOP  
0.045 in  
Dividing the example thermal grease area resistance by  
the surface area gives the actual resistance through the  
thermal grease for both ICs inside the package:  
56-pin HTSSOP  
2.27 °C/W  
0
5
10  
I − Current − A  
15  
The thermal resistance of thermal pads is generally  
considerably higher than a thin thermal grease layer.  
Thermal tape has an even higher thermal resistance.  
Neither pads nor tape should be used with either of these  
two packages. A thin layer of thermal grease with careful  
clamping of the heatsink is recommended. It may be  
difficult to achieve a layer 0.001-inch thick or less, so the  
modeling below is done with a 0.002-inch thick layer,  
which may be more representative of production thermal  
grease thickness.  
Figure 12. Inductance Saturation  
The selection of the capacitor that is placed across the  
output of each inductor (C2 in Figure 11) is simple. To  
complete the output filter, use a 0.47-µF capacitor with a  
voltage rating at least twice the voltage applied to the  
output stage (PVDD).  
Heatsink thermal resistance is generally predicted by the  
heatsink vendor, modeled using a continuous flow  
dynamics (CFD) model, or measured.  
This capacitor should be a good quality polyester dielectric  
such as a Wima MKS2-047ufd/100/10 or equivalent.  
Thus, for a single monaural IC, the system R  
= R  
+
JC  
θ
θ
JA  
thermal-grease resistance + heatsink resistance.  
In order to minimize the EMI effect of unbalanced ripple  
loss in the inductors, 0.1-µF 50-V SMD capacitors (X7R or  
better) (C1A and C1B in Figure 11) should be added from  
the output of each inductor to ground.  
Table 4, Table 5, and Table 6 indicate modeled  
parameters for one or two TAS5112 ICs on a single  
heatsink. The final junction temperature is set at 110°C in  
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all cases. It is assumed that the thermal grease is 0.002  
inch thick and that it is similar in performance to Wakefield  
Type 126 thermal grease. It is important that the thermal  
grease layer is 0.002 inches thick and that thermal pads  
or tape are not used in the pad-to-heatsink interface due  
to the high power density that results in these extreme  
power cases.  
Table 6. Case 2A (2 × 60 W Unclipped Into 6 ,  
(1)  
Channels in Separate IC Packages)  
56-Pin HTSSOP  
Ambient temperature  
25°C  
Power to load (per channel)  
Power dissipation per channel  
60 W (10% THD)  
5.4 W  
6.1°C, note 2 ×  
channel dissipation  
Delta T inside package  
Table 4. Case 1 (2 × 50 W Unclipped Into 6 ,  
22.3°C, note 2 ×  
channel dissipation  
Delta T through thermal grease  
(1)  
Both Channels in Same IC)  
Required heatsink thermal resistance  
Junction temperature  
5.3°C/W  
56-Pin HTSSOP  
110°C  
Ambient temperature  
Power to load (per channel)  
Power dissipation  
25°C  
System R  
θJA  
15.9°C/W  
85°C  
50 W (unclipped)  
4.5 W  
R
* power dissipation  
θJA  
Junction temperature  
85°C + 25°C = 110°C  
10.2°C, note 2 ×  
channel dissipation  
(1)  
Delta T inside package  
In this case, the power is also separated into two packages, but  
overdriving causes clipping to 10% THD. In this case, the high  
power requires extreme care in attachment of the heatsink to  
ensure that the thermal grease layer is 0.002 inches thick. Note  
that this power level should not be attempted with both channels in  
a single IC because of the high power density through the thermal  
grease layer.  
37.1°C, note 2 ×  
channel dissipation  
Delta T through thermal grease  
Required heatsink thermal resistance  
Junction temperature  
4.2°C/W  
110°C  
System R  
θJA  
19°C/W  
R
* power dissipation  
85°C  
θJA  
Junction temperature  
85°C + 25°C = 110°C  
(1)  
This case represents a stereo system with only one package. See  
Case 2 and Case 2A if doing a full-power, 2-channel test in a  
multichannelsystem.  
Table 5. Case 2 (2 × 50 W Unclipped Into 6 ,  
(1)  
Channels in Separate Packages)  
Thermal  
Pad  
8,20 mm  
7,20 mm  
56-Pin HTSSOP  
Ambient temperature  
25°C  
Power to load (per channel)  
Power dissipation  
50 W (unclipped)  
4.5 W  
Delta T inside package  
5.1°C  
Delta T through thermal grease  
Required heatsink thermal resistance  
Junction temperature  
18.6°C  
6.9°C/W  
110°C  
System R  
θJA  
19°C/W  
R
* power dissipation  
85°C  
θJA  
Junction temperature  
85°C + 25°C = 110°C  
3,90 mm  
2,98 mm  
(1)  
In this case, the power is separated into two packages. Note that  
this allows a considerably smaller heatsink because twice as much  
area is available for heat transfer through the thermal grease. For  
this reason, separating the stereo channels into two ICs is  
recommended in full-power stereo tests made on multichannel  
systems.  
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CLICK AND POP REDUCTION  
REFERENCES  
TI modulators feature a pop and click reduction system  
that controls the timing when switching starts and stops.  
1. TAS5000 Digital Audio PWM Processor data  
manual—TI (SLAS270)  
Going from nonswitching to switching operation causes a  
spectral energy burst to occur within the audio bandwidth,  
which is heard in the speaker as an audible click, for  
instance, after having asserted RESET LH during a  
system start-up.  
2. True Digital Audio Amplifier TAS5001 Digital Audio  
PWM Processor data sheet—TI (SLES009)  
3. True Digital Audio Amplifier TAS5010 Digital Audio  
PWM Processor data sheet—TI (SLAS328)  
To make this system work properly, the following design  
rules must be followed when using the TAS5112 back end:  
4. True Digital Audio Amplifier TAS5012 Digital Audio  
PWM Processor data sheet—TI (SLES006)  
D
The relative timing between the PWM_AP/M_x  
signals and their corresponding VALID_x signal  
should not be skewed by inserting delays,  
because this increases the audible amplitude  
level of the click.  
5. TAS5026 Six-Channel Digital Audio PWM  
Processor data manual—TI (SLES041)  
6. TAS5036A Six-Channel Digital Audio PWM  
Processor data manual—TI (SLES061)  
D
The output stage must start switching from a  
fully discharged output filter capacitor. Because  
the output stage prior to operation is in the  
high-impedance state, this is done by having a  
passive pulldown resistor on each speaker  
output to GND (see Typical System  
Configuration).  
7. TAS3103 Digital Audio Processor With 3D Effects  
data manual—TI (SLES038)  
8. Digital Audio Measurements application report—TI  
(SLAA114)  
9. PowerPADThermally Enhanced Package  
technical brief—TI (SLMA002)  
Other things that can affect the audible click level:  
10. System Design Considerations for True Digital  
Audio Power Amplifiers application report—TI  
(SLAA117)  
D
The spectrum of the click seems to follow the  
speaker impedance vs. frequency curve—the  
higher the impedance, the higher the click  
energy.  
D
Crossover filters used between woofer and  
tweeter in a speaker can have high impedance  
in the audio band, which should be avoided if  
possible.  
Another way to look at it is that the speaker impulse  
response is a major contributor to how the click energy is  
shaped in the audio band and how audible the click will be.  
The following mode transitions feature click and pop  
reduction.  
CLICK AND  
POP REDUCED  
STATE  
(1)  
Normal  
Mute  
Yes  
Yes  
(1)  
Mute  
Normal  
Error recovery  
(ERRCVY)  
(1)  
Normal  
Yes  
(1)  
Error recovery  
Normal  
Yes  
No  
(1)  
Normal  
Hard Reset  
(1)  
Normal  
Hard Reset  
Yes  
(1)  
Normal = switching  
16  
PACKAGE OPTION ADDENDUM  
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PACKAGING INFORMATION  
Orderable Device  
TAS5112DFD  
Status Package Type Package Pins Package  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
0 to 70  
Top-Side Markings  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4)  
NRND  
HTSSOP  
HTSSOP  
HTSSOP  
HTSSOP  
DFD  
56  
56  
56  
56  
35  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
Call TI  
Level-3-260C-168 HR  
Level-3-260C-168 HR  
Level-3-260C-168 HR  
Call TI  
TAS5112  
TAS5112DFDG4  
TAS5112DFDR  
TAS5112DFDRG4  
NRND  
NRND  
NRND  
DFD  
DFD  
DFD  
35  
Green (RoHS  
& no Sb/Br)  
0 to 70  
TAS5112  
TAS5112  
2000  
Green (RoHS  
& no Sb/Br)  
0 to 70  
TBD  
0 to 70  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4)  
Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a  
continuation of the previous line and the two combined represent the entire Top-Side Marking for that device.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
11-Apr-2013  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
26-Jan-2013  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TAS5112DFDR  
HTSSOP  
DFD  
56  
2000  
330.0  
24.4  
8.6  
15.6  
1.8  
12.0  
24.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
26-Jan-2013  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
HTSSOP DFD 56  
SPQ  
Length (mm) Width (mm) Height (mm)  
367.0 367.0 45.0  
TAS5112DFDR  
2000  
Pack Materials-Page 2  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other  
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest  
issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and  
complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale  
supplied at the time of order acknowledgment.  
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary  
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily  
performed.  
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and  
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adequate design and operating safeguards.  
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or  
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information  
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Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration  
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documentation. Information of third parties may be subject to additional restrictions.  
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voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.  
TI is not responsible or liable for any such statements.  
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements  
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requirements. Nonetheless, such components are subject to these terms.  
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www.ti.com/audio  
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Copyright © 2013, Texas Instruments Incorporated  

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