TIC10024-Q1 [TI]

具有 SPI 的汽车类 35V 多开关检测接口 (MSDI);
TIC10024-Q1
型号: TIC10024-Q1
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

具有 SPI 的汽车类 35V 多开关检测接口 (MSDI)

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中文:  中文翻译
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TIC10024-Q1  
ZHCSGQ0A SEPTEMBER 2017 REVISED FEBRUARY 2022  
适用于汽车系统并具有可调湿性电流TIC10024-Q1 24 路输入  
多开关检测接(MSDI) 器件  
1 特性  
3 说明  
• 符合汽车应用要求  
• 具有符AEC-Q100 标准的下列特性  
TIC10024-Q1 是一款先进的多开关检测接口 (MSDI)  
器件用于检测 12V 汽车系统中的外部开关状态。  
TIC10024-Q1 有可调阈值的比较器以独立于  
MCU 的方式监控数字开关。该器件监控多达 24 路直  
接开关输入并可配置其中 10 路输入以监控接地或连  
接到电池的开关。可为每路输入设定 6 种独特的湿性  
电流设置从而支持不同的应用场景。该器件支持所有  
开关输入的唤醒操作因此无需持续使 MCU 保持活动  
状态进而可降低系统功耗。TIC10024-Q1 还提供集  
成故障检测和 ESD 保护功能从而提高系统稳健性。  
TIC10024-Q1 支持 2 种工作模式连续模式和轮询模  
式。连续模式下将连续提供湿性电流。轮询模式下将根  
据可编程计时器来定期接通湿性电流以对输入状态进行  
采样从而显著降低系统功耗。  
– 器件温度等140°C 125°C 的工作环境  
温度范围  
– 器HBM ESD 分类等H2  
– 器CDM ESD 分类等C4B  
提供功能安全  
有助于进行功能安全系统设计的文档  
• 旨在支12V 汽车系统并提供过压和欠压警告  
• 监控多24 路直接开关输入并可配置其10 路  
输入以监控接地或连接到电池的开关  
• 开关输入可承受高40V 的电压负载突降条件)  
和低-24V 的电压反极性条件)  
6 种可配置的湿性电流设置:  
0mA1mA2mA5mA10mA 15mA)  
• 适用于数字开关监控并具4 个可编程阈值的集成  
比较器  
器件信息  
封装(1)  
封装尺寸标称值)  
器件型号  
TIC10024-Q1  
TSSOP (38)  
9.70 mm x 4.40 mm  
• 轮询模式下的超低工作电流:  
68μA 典型值tPOLL = 64mstPOLL_ACT  
128μs,  
=
(1) 如需了解所有可用封装请参阅数据表末尾的可订购产品附  
录。  
24 路输入均有效比较器模式所有开关均  
打开)  
VBAT  
Voltage  
Regulator  
GND  
• 使3.3V/5V 串行外设接(SPI) 协议直接MCU  
对接  
• 可产生中断来支持所有输入的唤醒操作  
• 采用适当的外部组件根ISO-10605 在输入引脚上  
±8kV 接触放ESD 保护  
37  
38  
VS  
VS  
VDD 19  
VDD  
/INT  
IN0  
IN1  
IN2  
13  
14  
25  
/INT  
/CS  
24  
15  
/CS  
IN9  
33  
MCU  
SCLK 16  
SCLK  
MOSI  
MISO  
GPIO  
SI  
38 TSSOP 封装  
17  
SO 18  
IN10  
IN11  
IN12  
34  
35  
36  
TIC10024-Q1  
RESET 21  
2 应用  
20  
CAP_A  
车身控制模块网关  
汽车照明  
CAP_D 23  
22  
IN23  
12  
CAP_PRE  
制热制冷  
电动座椅  
后视镜  
9
AGND  
DGND 28  
Copyright © 2016, Texas Instruments Incorporated  
EP  
简化版原理图  
本文档旨在为方便起见提供有TI 产品中文版本的信息以确认产品的概要。有关适用的官方英文版本的最新信息请访问  
www.ti.com其内容始终优先。TI 不保证翻译的准确性和有效性。在实际设计之前请务必参考最新版本的英文版本。  
English Data Sheet: SCPS268  
 
 
 
 
TIC10024-Q1  
ZHCSGQ0A SEPTEMBER 2017 REVISED FEBRUARY 2022  
www.ti.com.cn  
Table of Contents  
9.1 SPI Communication Interface Buses........................ 33  
9.2 SPI Sequence...........................................................34  
9.3 Programming Guidelines.......................................... 35  
9.4 Register Maps...........................................................36  
10 Application and Implementation................................65  
10.1 Application Information........................................... 65  
10.2 Digital Switch Detection in Automotive Body  
Control Module............................................................65  
10.3 Systems Examples................................................. 68  
11 Power Supply Recommendations..............................71  
12 Layout...........................................................................72  
12.1 Layout Guidelines................................................... 72  
12.2 Layout Example...................................................... 73  
13 Device and Documentation Support..........................74  
13.1 Receiving Notification of Documentation Updates..74  
13.2 Community Resources............................................74  
13.3 Trademarks.............................................................74  
14 Mechanical, Packaging, and Orderable  
1 特性................................................................................... 1  
2 应用................................................................................... 1  
3 说明................................................................................... 1  
4 Revision History.............................................................. 2  
5 Pin Configuration and Functions...................................3  
6 Specifications.................................................................. 5  
6.1 Absolute Maximum Ratings........................................ 5  
6.2 ESD Ratings............................................................... 5  
6.3 Recommended Operating Conditions.........................5  
6.4 Thermal Information....................................................6  
6.5 Electrical Characteristics.............................................6  
6.6 Timing Requirements..................................................9  
6.7 Typical Characteristics..............................................10  
7 Parameter Measurement Information.......................... 11  
8 Detailed Description......................................................12  
8.1 Overview...................................................................12  
8.2 Functional Block Diagram.........................................13  
8.3 Feature Description...................................................14  
8.4 Device Functional Modes..........................................26  
9 Programming................................................................. 33  
Information.................................................................... 74  
4 Revision History  
Changes from Revision * (September 2017) to Revision A (February 2022)  
Page  
• 添加了特性“提供功能安全”.............................................................................................................................1  
• 将提到的旧术语实例全部更改为控制器和响应器................................................................................................ 1  
Changed the paragraph following 8-3 for CRC calculations........................................................................ 25  
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TIC10024-Q1  
ZHCSGQ0A SEPTEMBER 2017 REVISED FEBRUARY 2022  
www.ti.com.cn  
5 Pin Configuration and Functions  
IN13  
1
2
3
38  
VS  
37  
36  
IN14  
IN15  
VS  
IN12  
35  
34  
IN16  
IN17  
4
5
IN11  
IN10  
6
7
33  
32  
IN18  
IN19  
IN9  
IN8  
IN20  
AGND  
IN21  
8
9
31  
30  
IN7  
IN6  
IN5  
Exposed  
Pad  
10  
11  
29  
28  
IN22  
IN23  
DGND  
IN4  
12  
13  
27  
26  
IN0  
IN1  
IN3  
IN2  
14  
15  
25  
24  
/CS  
/INT  
16  
17  
18  
19  
23  
22  
21  
20  
SCLK  
CAP_D  
SI  
CAP_PRE  
RESET  
SO  
VDD  
CAP_A  
Not to Scale  
5-1. DCP (TSSOP) Package, 38-Pin, Top View  
5-1. Pin Functions  
PIN  
TYPE(1)  
DESCRIPTION  
NO.  
1
NAME  
IN13  
IN14  
IN15  
IN16  
IN17  
IN18  
IN19  
IN20  
AGND  
IN21  
IN22  
IN23  
IN0  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
P
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground for analog circuitry  
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
I/O  
I/O  
I/O  
I/O  
I/O  
I
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Active-low input. Chip select from the commander for the SPI Interface.  
Serial clock output from the commander for the SPI Interface  
Serial data input for the SPI Interface.  
IN1  
CS  
SCLK  
SI  
I
I
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ZHCSGQ0A SEPTEMBER 2017 REVISED FEBRUARY 2022  
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5-1. Pin Functions (continued)  
PIN  
TYPE(1)  
DESCRIPTION  
NO.  
NAME  
18  
SO  
O
Serial data output for the SPI Interface  
3.3 V to 5 V logic supply for the SPI communication. The SPI I/Os are not fail-safe protected:  
VDD needs to be present during any SPI traffic to avoid excessive leakage currents and  
corrupted SPI I/O logic levels.  
19  
20  
VDD  
P
CAP_A  
I/O  
External capacitor connection for the analog LDO. Use capacitance value of 100nF.  
Keep RESET low for normal operation and drive RESET high and release it to perform a  
hardware reset of the device. The RESET pin is connected to ground via a 1Mpull-down  
resistor. If not used, the RESET pin shall be grounded to avoid any accidental device reset  
due to coupled noise onto this pin.  
21  
RESET  
I
22  
23  
CAP_Pre  
CAP_D  
I/O  
I/O  
External capacitor connection for the pre-regulator. Use capacitance value of 1 μF.  
External capacitor connection for the digital LDO. Use capacitance value of 100 nF.  
Open drain output. Pulled low (internally) upon change of state on the input or occurrence of  
a special event.  
24  
INT  
O
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
37  
38  
IN2  
IN3  
I/O  
I/O  
I/O  
P
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground for digital circuitry  
IN4  
DGND  
IN5  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
P
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground/VBAT switch monitoring input with configurable current sink or source.  
Ground switch monitoring input with current source  
IN6  
IN7  
IN8  
IN9  
IN10  
IN11  
IN12  
VS  
Ground switch monitoring input with current source  
Ground switch monitoring input with current source  
Power supply input pin.  
VS  
P
Power supply input pin.  
Exposed Pad. The exposed pad is not electrically connected to AGND or DGND. Connect  
EP to the board ground to achieve rated thermal and ESD performance.  
---  
EP  
P
(1) I = input, O = output, I/O = input and output, P = power.  
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TIC10024-Q1  
ZHCSGQ0A SEPTEMBER 2017 REVISED FEBRUARY 2022  
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6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
-0.3  
-0.3  
-24  
MAX  
40(2)  
6
UNIT  
V
VS, INT  
VDD, SCLK, SI, SO, CS, RESET  
V
IN0- IN23  
Input voltage  
40(2)  
5.5  
5.5  
2
V
CAP_Pre  
-0.3  
-0.3  
-0.3  
-40  
V
CAP_A  
CAP_D  
V
V
Operating junction temperature, TJ  
Storage temperature, Tstg  
150  
155  
°C  
°C  
-55  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under  
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
(2) Tested for load dump and jump start conditions with nominal operating voltage no greater than 16 V for the life of a 12-V automotive  
system. Refer to Using TIC10024-Q1 in a 12 V Automotive System for more details.  
6.2 ESD Ratings  
VALUE  
±2000  
±4000  
±500  
UNIT  
All pins  
Pins IN0-IN23(2)  
All pins  
Human-body model (HBM), per AEC Q100-002(1)  
Charged-device model (CDM), per AEC Q100-011  
Electrostatic  
discharge  
V(ESD)  
V
Corner pins (pin 1, 19, 20  
and 38)  
±750  
Contact discharge, un-powered, per ISO- 10605(3) (5)  
Contact discharge, powered-up, per ISO- 10605 (4) (6)  
Pins IN0-IN23  
Pins IN0-IN23  
±8000  
±8000  
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.  
(2) ±4kV rating on pins IN0-IN23 are stressed with respect to GND (with AGND, DGND, and EP tied together).  
(3) External components: capacitor = 15 nF; resistor = 10 Ω  
(4) External components: capacitor = 15 nF; resistor = 33 Ω  
(5) ESD generator parameters: storage capacitance = 150 pF; discharge resistance = 330 Ωor 2000 Ω  
(6) ESD generator parameters: storage capacitance = 150 pF or 330pF; discharge resistance = 330 Ωor 2000 Ω  
6.3 Recommended Operating Conditions  
over operating free-air temperature range and VS = 12 V (unless otherwise noted)  
MIN  
4.5  
3.0  
0
NOM  
MAX  
35 (2)  
5.5  
UNIT  
V
VS  
Power supply voltage  
Logic supply voltage  
VDD  
V
V/INT  
VINX  
VRESET  
VSPI_IO  
fSPI  
INT pin voltage  
35(2)  
35(2)  
5.5  
V
IN0 to IN23 input voltage  
RESET pin voltage  
0
V
0
V
SPI input/output logic level  
SPI communication frequency  
Operating free-air temperature  
0
VDD  
4M  
V
20(1)  
Hz  
°C  
TA  
-40  
125  
(1) Lowest frequency characterized.  
(2) Tested for load dump and jump start conditions with nominal operating voltage no greater than 16 V for the life of a 12-V automotive  
system. Refer to Using TIC10024-Q1 in a 12 V Automotive System for more details.  
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TIC10024-Q1  
ZHCSGQ0A SEPTEMBER 2017 REVISED FEBRUARY 2022  
www.ti.com.cn  
6.4 Thermal Information  
TIC10024-Q1  
DCP (TSSOP)  
38 PINS  
33.6  
THERMAL METRIC(1)  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
18.4  
15.2  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
0.5  
ψJT  
15.0  
ψJB  
RθJC(bot)  
1.2  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
6.5 Electrical Characteristics  
over operating free-air temperature range, VS = 4.5 V to 35 V, and VDD = 3 V to 5.5 V (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
POWER SUPPLY  
Continuous mode VS Continuous mode, IWETT= 10 mA, all switches open, no active  
power supply current comparator operation, no unserviced interrupt  
IS_CONT  
5.6  
7
mA  
IS_POLL_COMP_25  
IS_POLL_COMP_85  
IS_POLL_COMP  
TA= 25°  
68  
68  
68  
100  
110  
170  
µA  
µA  
µA  
Polling mode VS  
Polling mode, tPOLL= 64 ms, tPOLL_ACT= 128  
µs, all switches open, IWETT= 10 mA, no  
unserviced interrupt  
power supply average TA= -40° to 85°C  
current  
TA= -40° to 125°C  
Reset mode VS power  
supply current  
IS_RESET  
IS_IDLE_25  
IS_IDLE_85  
IS_IDLE  
Reset mode, VRESET= VDD. VS= 12 V, all switches open, TA=25°C  
12  
50  
50  
50  
1.5  
17  
75  
µA  
µA  
µA  
µA  
µA  
V
TRIGGER bit in CONFIG register = logic 0, TA= 25°C, no  
unserviced interrupt  
VS power supply  
average current in  
idle state  
TRIGGER bit in CONFIG register = logic 0, TA= -40°C to 85°C, no  
unserviced interrupt  
95  
TRIGGER bit in CONFIG register = logic 0, TA= -40°C to 125°C, no  
unserviced interrupt  
145  
10  
Logic supply current  
from VDD  
IDD  
SCLK = SI = 0 V, CS = INT = VDD, no SPI communication  
Threshold for rising VS from device OFF condition resulting in INT  
pin assertion and a flagged POR bit in the INT_STAT register  
VPOR_R  
VPOR_F  
VOV_R  
3.85  
1.95  
35  
4.5  
2.8  
40  
Power on reset (POR)  
voltage for VS  
Threshold for falling VS from device normal operation to reset mode  
and loss of SPI communication  
V
Over-voltage (OV)  
condition for VS  
Threshold for rising VS from device normal operation resulting in  
INT pin assertion and a flagged OV bit in the INT_STAT register  
V
Over-voltage (OV)  
condition hysteresis  
for VS  
VOV_HYST  
1
3.5  
V
Threshold for rising VS from under-voltage condition resulting in INT  
pin assertion and a flagged UV bit in the INT_STAT register  
VUV_R  
VUV_F  
3.85  
3.7  
4.5  
4.4  
V
V
Under-voltage (UV)  
condition for VS  
Threshold for falling VS from under-voltage condition resulting in  
INT pin assertion and a flagged UV bit in the INT_STAT register  
Under-voltage (UV)  
condition hysteresis  
for VS  
VUV_HYST  
75  
275  
mV  
(1)  
VDD_F  
Threshold for falling VDD resulting in loss of SPI communication  
2.5  
50  
2.9  
V
Valid VDD voltage  
hysteresis  
VDD_HYST  
150  
mV  
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6.5 Electrical Characteristics (continued)  
over operating free-air temperature range, VS = 4.5 V to 35 V, and VDD = 3 V to 5.5 V (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
WETTING CURRENT ACCURACY (DIGITAL SWITCHES, MAXIMUM RESISTANCE VALUE WITH SWITCH CLOSED 100, MINIMUM RESISTANCE  
VALUE WITH SWITCH OPEN 5000 )  
1 mA setting  
2 mA setting  
0.84  
1.71  
2.39  
4.3  
1
2
1.14  
2.32  
5.5  
4.5 V VS 35 V  
4.5 V VS < 5 V  
5 V VS 35 V  
4.5 V VS < 6 V  
6 V VS 35 V  
4.5 V VS < 6.5 V  
6.5 V VS 35 V  
5 mA setting  
10 mA setting  
15 mA setting  
Wetting current  
accuracy for CSO  
(switch closed)  
5
5.6  
IWETT (CSO)  
mA  
2.4  
11  
8.4  
10  
11.4  
16.5  
17  
2.4  
12.5  
0.75  
1.6  
15  
1.1  
1 mA setting  
2 mA setting  
5 mA setting  
10 mA setting  
2.05  
3.3  
2.2  
4.5 V VS 35 V  
Wetting current  
accuracy for CSI  
(switch closed)  
4.3  
5.6  
7.1  
IWETT (CSI)  
mA  
9.2  
11.5  
16.5  
16.5  
13.4  
19.2  
19.2  
11  
4.5 V VS < 6 V  
6 V VS 35V  
15 mA setting  
10 mA setting,  
13.7  
1.7  
1.7  
Voltage drop from INx  
pin to AGND across  
CSI (switch open)  
R
SW= 5k  
15 mA setting,  
SW= 5kΩ  
2mA setting, IIN  
VCSI_DROP_OPEN  
V
V
4.5 V VS 35V  
R
=
1mA (4.5V VS  
35V)  
1.2  
5mA setting, IIN  
1mA or 2mA  
=
1.3  
1.5  
V
V
Voltage drop from INx  
pin to ground across  
CSI (switch closed)  
VCSI_DROP_CLOSED  
4.5 V VS 35V  
10mA setting, IIN  
1mA, 2mA, or 5mA  
=
15mA setting, IIN  
=
1mA, 2mA, 5mA,  
or 10mA  
2.1  
V
LEAKAGE CURRENTS  
IIN_LEAK_OFF  
-4  
5.3  
0.5  
0 V VINx VS , channel disabled (EN_INx register bit= logic 0)  
Leakage current at  
input INx when  
channel is disabled  
µA  
0 V VINx VS , channel disabled (EN_INx register bit= logic 0),  
TA = 25°C  
IIN_LEAK_OFF_25  
-0.5  
Leakage current at  
input INx when  
wetting current setting  
is 0mA  
µA  
µA  
IIN_LEAK_0mA  
-110  
-5  
110  
0 V VINx 6 V, 6 V VS 35 V , IWETT setting = 0 mA  
Leakage current at  
input INx under loss  
of GND condition  
VS = 24 V, 0 V VINx 24 V, all grounds (AGND, DGND, and EP)  
IIN_LEAK_LOSS_OF_GND  
µA  
µA  
= 24 V, VDD shorted to the grounds(1)  
Leakage current at  
input INx under loss  
of VS condition  
IIN_LEAK_LOSS_OF_VS  
5
0 V VINx 24 V, VS shorted to the grounds = 0 V, VDD = 0 V  
LOGIC LEVELS  
I/INT = 2 mA  
I/INT = 4 mA  
0.35  
0.6  
INT output low  
voltage  
V/INT_L  
V
VSO_L  
VSO_H  
VIN_L  
VIN_H  
SO output low voltage ISO = 2 mA  
0.2VDD  
V
V
SO output high  
ISO = -2 mA  
voltage  
0.8VDD  
0.7VDD  
SI, SCLK, and CS  
input low voltage  
0.3VDD  
V
V
SI, SCLK, and CS  
input high voltage  
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6.5 Electrical Characteristics (continued)  
over operating free-air temperature range, VS = 4.5 V to 35 V, and VDD = 3 V to 5.5 V (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
RESET input low  
voltage  
VRESET_L  
VRESET_H  
0.8  
V
RESET input high  
voltage  
1.6  
V
RRESET_25  
RRESET  
VRESET= 0 to 5.5V, TA = 25°C  
0.85  
0.2  
1.25  
1.7  
2.1  
RESET pin internal  
pull-down resistor  
MΩ  
VRESET= 0 to 5.5V, TA = 40° to 125°C  
COMPARATOR PARAMETERS  
Comparator threshold  
for 2 V  
VTH_ COMP_2V  
VTH_ COMP_2p7V  
VTH_ COMP_3V  
VTH_ COMP_4V  
THRES_COMP = 2 V  
THRES_COMP = 2.7 V  
THRES_COMP = 3 V  
THRES_COMP = 4 V  
1.85  
2.4  
2.25  
2.9  
V
V
V
V
Comparator threshold  
for 2.7 V  
Comparator threshold  
for 3 V  
2.85  
3.7  
3.3  
Comparator threshold  
for 4 V  
4.35  
THRES_COMP = 2 V  
THRES_COMP = 2.7 V  
THRES_COMP = 3 V  
THRES_COMP = 4 V  
THRES_COMP = 2 V  
THRES_COMP = 2.7 V  
THRES_COMP = 3 V  
THRES_COMP = 4 V  
4.5  
5
Minimum VS  
requirement for  
proper detection  
VS_COMP  
V
5.5  
6.5  
30  
35  
35  
43  
130  
130  
105  
95  
Comparator  
equivalent input  
resistance  
RIN, COMP  
kΩ  
(1) Specified by design.  
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6.6 Timing Requirements  
VS= 4.5 V to 35 V, VDD= 3 V to 5.5 V, and 10 pF capacitive load on SO unless otherwise noted; verified by design and  
characterization  
MIN  
NOM  
MAX UNIT  
SWITCH MONITORING, INTERRUPT, STARTUP AND RESET  
tPOLL_ACT Polling active time accuracy  
Polling mode  
Polling mode  
-12%  
-12%  
12%  
12%  
µs  
tPOLL  
Polling time accuracy  
tCOMP  
Comparator detection time  
18  
20  
tCCP_TRA  
Transition time between last input sampling and start of clean current  
µs  
N
tCCP_ACT Clean current active time  
tSTARTUP Polling startup time  
-12%  
200  
12%  
300  
2
400  
2.5  
µs  
tINT_ACTIV  
Active INT assertion duration  
1.5  
ms  
E
tINT_INACT  
INT de-assertion duration during a pending interrupt  
3
80  
2
4
5
ms  
µs  
µs  
IVE  
tINT_IDLE Interrupt idle time  
100  
120  
Time required to keep the RESET pin high to successfully reset the device (no pending  
tRESET  
tREACT  
interrupt)(1)  
Delay between a fault event (OV, UV, TW, or TSD) to a  
high to low transition on the INT pin  
20  
µs  
See 7-2 for OV example.  
SPI INTERFACE  
tLEAD Falling edge of CS to rising edge of SCLK setup time  
tLAG  
100  
100  
30  
ns  
ns  
ns  
ns  
ns  
ns  
Falling edge of SCLK to rising edge of CS setup time  
SI to SCLK falling edge setup time  
tSU  
tHOLD  
tVALID  
tSO(EN)  
SI hold time after falling edge of SCLK  
20  
Time from rising edge of SCLK to valid SO data  
Time from falling edge of CS to SO low-impedance  
70  
60  
Loading of 1 kto GND.  
See 7-3.  
tSO(DIS)  
Time from rising edge of CS to SO high-impedance  
60  
ns  
tR  
tF  
SI, CS, and SCLK signals rise time  
SI, CS, and SCLK signals fall time  
5
5
30  
30  
ns  
ns  
tINTER_FR  
Delay between two SPI communication ( CS low) sequences  
1.5  
µs  
AME  
tCKH  
tCKL  
SCLK High time  
SCLK Low time  
120  
120  
45  
ns  
ns  
µs  
tINITIATION Delay between valid VDD voltage and initial SPI communication  
(1) If there is a pending interrupt (/INT pin asserted low), it can take up to 1ms for the device to complete the reset.  
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6.7 Typical Characteristics  
18  
16  
14  
12  
10  
8
IWETT=1mA  
IWETT=1mA  
16  
14  
12  
10  
8
IWETT=2mA  
IWETT=5mA  
IWETT=10mA  
IWETT=15mA  
IWETT=2mA  
IWETT=5mA  
IWETT=10mA  
IWETT=15mA  
6
6
4
4
2
2
0
0
0
5
10  
15  
20  
VS voltage (V)  
25  
30  
35  
40  
-40 -20  
0
20  
40  
60  
Temperature (C)  
80 100 120 140 160  
D001  
D001  
TA = 25°C  
VS = 12 V  
6-1. Wetting Current Output - CSO vs. VS Voltage  
6-2. Wetting Current Output - CSO vs. Temperature  
4
3.75  
3.5  
THRES_COMP=2V  
THRES_COMP=2.7V  
THRES_COMP=3V  
THRES_COMP=4V  
3.25  
3
2.75  
2.5  
2.25  
2
1.75  
0
5
10  
15  
20  
VS voltage (V)  
25  
30  
35  
40  
D001  
TA = 25°C  
6-3. Comparator Threshold vs. VS Voltage  
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7 Parameter Measurement Information  
VDD  
tINITIATION  
tINTERFRAME  
/CS  
ttLAG  
t
ttCKH  
t
ttCKLt  
ttLEAD  
t
SCLK  
tHOLD  
ttSU  
t
SI  
tSO(EN)  
tVALID  
tSO(DIS)  
SO  
7-1. SPI Timing Parameters  
VOV_R  
VS  
tREACT  
/INT  
V/INT_L  
7-2. tREACT Timing Parameters  
VIN_H  
/CS  
SO  
tSO(DIS)  
SO  
VSO_H  
GND  
7-3. tSO(DIS) Timing Parameters  
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8 Detailed Description  
8.1 Overview  
The TIC10024-Q1 is an advanced 24-input Multiple Switch Detection Interface (MSDI) device designed to detect  
external mechanical switch status in a 12-V automotive system by acting as an interface between the switches  
and the low-voltage microcontroller. The TIC10024-Q1 is an integrated solution that replaces many discrete  
components and provides integrated protection, input serialization, and system wake-up capability.  
The device monitors 14 switches to GND and 10 additional switches that can be programmed to be connected to  
either GND or VBAT. It features SPI interface to report individual switch status and provides programmability to  
control the device operation. The TIC10024-Q1 features an integrated comparator that can be used to monitor  
external digital switch input status. The device has 2 modes of operation: continuous mode and polling mode.  
The polling mode is a low-power mode that can be activated to reduce current drawn in the system by only  
turning on the wetting current for a small duty cycle to detect switch status changes. An interrupt is generated  
upon detection of switch status change and it can be used to wake up the microcontroller to bring the entire  
system back to operation.  
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8.2 Functional Block Diagram  
VS  
37  
VS  
38  
VS  
Over-voltage  
protection  
1mA to 15mA  
or  
Over-temperature  
protection  
OFF  
SW  
Under-voltage  
protection  
IN0  
IN1  
IN2  
IN3  
13  
14  
AGND  
ESD  
Protection  
1mA to 15mA  
22  
Pre-regulator  
CAP_PRE  
or  
OFF  
25  
26  
AGND  
20  
23  
Analog LDO  
Digital LDO  
CAP_A  
CAP_D  
VS  
Power management  
AGND  
1mA to 15mA  
or  
OFF  
SW  
IN9  
33  
ESD  
Protection  
1mA to 15mA  
VDIG  
or  
OFF  
Oscillator  
24  
/INT  
AGND  
State  
machine  
AGND  
R1  
SW  
+
19  
15  
16  
17  
18  
21  
VDD  
/CS  
VS  
œ
Control  
logic  
+
œ
SCLK  
SI  
Input/  
output  
buffer  
AGND  
AGND  
1mA to 15mA  
or  
OFF  
SO  
Registers  
SW  
RESET  
IN10 34  
ESD  
Protection  
Digital Block  
35  
IN11  
1MΩ  
VS  
DGND  
AGND  
IN12 36  
1
IN13  
1mA to 15mA  
or  
OFF  
SW  
IN23 12  
ESD  
Protection  
AGND  
DGND  
9
28  
DGND  
AGND  
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8.3 Feature Description  
8.3.1 VS Pin  
The VS supply provides power to the entire chip and it is designed to be connected directly to a 12-V automotive  
battery through a reverse-polarity blocking diode.  
8.3.2 VDD Pin  
The VDD supply is used to determine the logic level on the SPI communication interface, source the current for  
the SO driver, and sets the pull-up voltage for the CS pin. It can also be used as a possible external pull-up  
supply for the INT pin in addition to the VS and it shall be connected to a 3 V to 5.5-V logic supply. Removing  
VDD from the device disables SPI communications but does not reset the register configurations.  
8.3.3 Device Initialization  
When the device is powered up for the first time, the condition is called Power-On Reset (POR), which sets the  
registers to their default values and initializes the device state machine. The internal POR controller holds the  
device in a reset condition until VS has reached VPOR_R, at which the reset condition is released with the device  
registers and state machine initialized to their default values. After the initialization process is completed, the INT  
pin is asserted low to notify the microcontroller, and the register bit POR in the INT_STAT register is asserted to  
logic 1. The SPI flag bit POR is also asserted at the SPI output (SO).  
During device initialization, factory settings are programmed into the device to allow accurate device operation.  
The device performs a self-check after the device is programmed to ensure correct settings are loaded. If the  
self-check returns an error, the CHK_FAIL bit in the INT_STAT register will be flagged to logic 1 along with the  
POR bit. If this event occurs the microcontroller is recommended to initiate software reset (see section Software  
Reset) to re-initialize the device to allow the correct settings to be re-programmed.  
8.3.4 Device Trigger  
After device initialization, the TIC10024-Q1 is ready to be configured. The microcontroller can use SPI  
commands to program desired settings to the configuration registers. Once the device configuration is  
completed, the microcontroller is required to set the bit TRIGGER in the CONFIG register to logic 1 in order to  
activate wetting current and start external switch monitoring.  
After switch monitoring initiates, the configuration registers turn into read-only registers (with the exception of the  
TRIGGER, CRC_T, and RESET bits in the CONFIG register and all bits in the CCP_CFG1 register). If at any  
time the device setting needs to be re-configured, the microcontroller is required to first set the bit TRIGGER in  
the CONFIG register to logic 0 to stop wetting current and switch monitoring. The microcontroller can then  
program configuration registers to the desired settings. Once the re-configuration is completed the  
microcontroller can set the TRIGGER bit back to logic 1 to re-start switch monitoring.  
Note the cyclic redundancy check (CRC) feature stays accessible when TRIGGER bit is in logic 1, allowing the  
microcontroller to verify device settings at all time. Refer to section Cyclic Redundancy Check (CRC) for more  
details of the CRC feature.  
8.3.5 Device Reset  
There are 3 ways to reset the TIC10024-Q1 and re-initialize all registers to their default values:  
8.3.5.1 VS Supply POR  
The device is turned off and all register contents are lost if the VS voltage drops below VPOR_F. To turn the device  
back on, the VS voltage must be raised back above VPOR_R, as illustrated in 8-1. The device then starts the  
initialization process as described in section Device Initialization.  
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VS  
Device  
OFF  
Normal  
Operation  
Device  
OFF  
Normal  
Operation  
VPOR_R  
VPOR_F  
Time  
8-1. VS is Lowered Below The POR threshold, Then Ramped Back Up To Complete A POR Cycle  
8.3.5.2 Hardware Reset  
Microcontroller can toggle the RESET pin to perform a hardware reset to the device. The RESET pin is internally  
pulled-down by a resistor (1.25Mtypical) and must be kept low for normal operation. When the RESET pin is  
toggled high, the device enters the reset state with most of the internal blocks turned off and consumes very little  
current of IS_RESET. Switch monitoring and SPI communications are stopped in the reset state, and all register  
contents are cleared. When RESET pin is toggled back low, all the registers are set to their default values and  
the device state machine is re-initialized, similar to a POR event. When the re-initialization process is completed  
the INT pin is asserted low, and the interrupt register bit POR and the SPI status flag POR are both asserted to  
notify the microcontroller that the device has completed the reset process.  
Note in order to successfully reset the device, the RESET pin needs to be kept high for a minimum duration of  
tRESET. The pin is required to be driven with a stable input (below VRESET_L for logic low or above VRESET_H for  
logic H) to prevent the device from accidental reset.  
8.3.5.3 Software Reset  
In addition to hardware reset the microcontroller can also issue a SPI command to initiate software reset.  
Software reset is triggered by setting the RESET bit in the register CONFIG to logic 1, which re-initializes the  
device with all registers set to their default values. Once the re-initialization process is completed, the INT pin is  
asserted low, and the interrupt register bit POR and the SPI status flag POR are both asserted to notify the  
microcontroller that the device has completed the reset process.  
8.3.6 VS Under-Voltage (UV) Condition  
During normal operation of a typical 12 V automotive system, the VS voltage is usually quite stable and stays  
well above 11 V. However, the VS voltage may drop temporarily during certain vehicle operations, such as cold  
cranking. If the VS voltage drops below VUV_F, the TIC10024-Q1 enters the under-voltage (UV) condition since  
there is not enough voltage headroom for the device to accurately generate wetting currents. The following  
describes the behavior of the TIC10024-Q1 under UV condition:  
1. All current sources and sinks de-activate and switch monitoring stops.  
2. Interrupt is generated by asserting the INT pin low and the bit UV in the interrupt register (INT_STAT) is  
flagged to logic 1. The bit UV_STAT is asserted to logic 1 in the register IN_STAT_MISC. The OI SPI flag is  
asserted during any SPI transactions. The INT pin is released and the interrupt register (INT_STAT) is  
cleared on the rising edge of CS provided that the interrupt register has been read during the SPI  
transaction.  
3. SPI communication stays active, and all register settings stay intact without resetting. Previous switch status,  
if needed, can be retrieved without interruption.  
4. The device continues to monitor the VS voltage, and the UV condition sustains if the VS voltage continues to  
stay below VUV_R. No further interrupt is generated once cleared.  
Note the device resets as described in section VS Supply POR if the VS voltage drops below VPOR_F  
.
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When the VS voltage rises above VUV_R, the INT pin is asserted low to notify the microcontroller that the UV  
condition no longer exists. The UV bit in the register INT_STAT is flagged to logic 1 and the bit UV_STAT bit is  
de-asserted to logic 0 in the register IN_STAT_MISC to reflect the clearance of the UV condition. The device  
resumes operation using current register settings (regardless of the INT pin and SPI communication status) with  
polling restarted from the first enabled channel. The Switch State Change (SSC) interrupt is generated at the  
end of the first polling cycle and the detected switch status becomes the baseline switch status for subsequent  
polling cycles. The content of the INT_STAT register, once read by the microcontroller, is cleared, and the INT  
pin is released afterwards.  
The following diagram describes the TIC10024-Q1 operation at various different VS voltages. If the VS voltage  
stays above VUV_F (Case 1), the device stays in normal operation. If the VS voltage drops below VUV_F but stays  
above VPOR_F (Case 2), the device enters the UV condition. If VS voltage drops below VPOR_F (Case 3), the  
device resets and all register settings are cleared. The microcontroller is then required to re-program all the  
configuration registers in order to resume normal operation after the VS voltage recovers.  
VS  
tCrankingt  
Device  
OFF  
VPOR_R  
Case 1  
VUV_F  
Case 2  
VPOR_F  
Case 3  
Time  
8-2. TIC10024-Q1 Operation At Various VS Voltage Levels  
8.3.7 VS Over-Voltage (OV) Condition  
If VS voltage rises above VOV_R, the TIC10024-Q1 enters the over-voltage (OV) condition to prevent damage to  
internal structures of the device on the VS and INx (for battery-connected switches) pins. The following describes  
the behavior of the TIC10024-Q1 under OV condition:  
1. All current sources and sinks de-activate and switch monitoring stops.  
2. Interrupt is generated by asserting the INT pin low and the bit OV in the interrupt register (INT_STAT) is  
flagged to logic 1. The bit OV_STAT is asserted to logic 1 in the register IN_STAT_MISC. The OI SPI flag is  
asserted during any SPI transactions. The INT pin is released and the interrupt register (INT_STAT) is  
cleared on the rising edge of CS provided that the interrupt register has been read during the SPI  
transaction.  
3. SPI communication stays active, and all register settings stay intact without resetting. Previous switch status,  
if needed, can be retrieved without any interruption.  
4. The device continues to monitor the VS voltage, and the OV condition sustains if the VS voltage continues to  
stay above VOV_R- VOV_HYST. No further interrupt is generated once cleared.  
When the VS voltage drops below VOV_R - VOV_HYST, the INT pin is asserted low to notify the microcontroller that  
the over-voltage condition no longer exists. The OV bit in the register INT_STAT is flagged to logic 1 and the bit  
OV_STAT bit is de-asserted to logic 0 in the register IN_STAT_MISC to reflect the clearance of the OV condition.  
The device resumes operation using current register settings (regardless of the INT pin and SPI communication  
status) with polling restarted from the first enabled channel. The Switch State Change (SSC) interrupt is  
generated at the end of the first polling cycle and the detected switch status becomes the baseline status for  
subsequent polling cycles. The content of the INT_STAT register, once read by the microcontroller, is cleared  
and the INT pin is released afterwards.  
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8.3.8 Switch Inputs Settings  
IN0 to IN23 are inputs connected to external mechanical switches. The switch status of each input, whether  
open or closed, is indicated by the status registers. 8-1 below describes various settings that can be  
configured for each input. Note some settings are shared between multiple inputs. It is required to first stop  
device operation by setting the TRIGGER bit low in the register CONFIG before making any configuration  
changes, as described in Device Trigger.  
8-1. TIC10024-Q1 Wetting Current and Threshold Setting Details  
Current Source (CSO) / Current  
Input  
IN0  
IN1  
IN2  
IN3  
IN4  
IN5  
IN6  
IN7  
IN8  
IN9  
Threshold  
Wetting Current  
Supported Switch Type  
Sink (CSI)  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
WC_IN0_IN1  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
THRES_COMP_IN0_IN3  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
WC_IN2_IN3  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
WC_IN4  
WC_IN5  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
THRES_COMP_IN4_IN7  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
WC_IN6_IN7  
WC_IN8_IN9  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
CSO  
CSI  
Switch to GND  
Switch to VBAT  
THRES_COMP_IN8_IN11  
IN10  
IN11  
IN12  
IN13  
IN14  
IN15  
IN16  
IN17  
IN18  
IN19  
IN20  
IN21  
IN22  
IN23  
WC_IN10  
WC_IN11  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
CSO  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
Switch to GND  
WC_IN12_13  
WC_IN14_15  
WC_IN16_17  
WC_IN18_19  
WC_IN20_21  
THRES_COMP_IN12_IN15  
THRES_COMP_IN16_IN19  
THRES_COMP_IN20_IN23  
WC_IN22  
WC_IN23  
8.3.8.1 Input Current Source and Sink Selection  
Among the 24 inputs, IN10 to IN23 are intended for monitoring only ground-connected switches and are  
connected to current sources. IN0 to IN9 can be programmed to monitor either ground-connected switches or  
battery-connected switches by configuring the CS_SELECT register. The default configuration of the IN0-IN9  
inputs after POR is to monitor ground-connected switches (current sources are selected). To set an input to  
monitor battery-connected switches, set the corresponding bit to logic 1.  
8.3.8.2 Input Enable Selection  
The TIC10024-Q1 provides switch status monitoring for up to 24 inputs, but there might be circumstances in  
which not all inputs need to be constantly monitored. The microcontroller may choose to enable or disable  
monitoring of certain inputs by configuring the IN_EN register. Setting the corresponding bit to logic 0 de-  
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activates the wetting current source and sink and stops switch status monitoring for the input. Disabling  
monitoring of unused inputs reduces overall power consumption of the device.  
All inputs are disabled by default upon device reset.  
8.3.8.3 Thresholds Adjustment  
The threshold level for interrupt generation can be programmed by setting the THRES_COMP register. The  
threshold level settings can be set for each individual input groups and each group consists of 4 inputs. Four  
threshold levels are available: 2 V, 2.7 V, 3 V, and 4 V.  
Remember to use caution when setting up the threshold for switches that are connected externally to the battery  
as there is a finite voltage drop (as high as VCSI_DROP_OPEN for 10mA and 15mA settings) across the current  
sinks. Therefore, even for an open switch, then voltage on the INx pin can be as high as VCSI_DROP_OPEN and the  
detection threshold shall be configured above it. It shall also be noted that a lower wetting current sink setting  
may not be strong enough to pull the INx pin close to ground in the presence of a leaky open external switch, as  
illustrated in the diagram below (see 8-3). In this example, the external switch, although in the open state, has  
large leakage current and can be modelled as an equivalent resistor (RDIRT) of 5k. The 2mA current sink is only  
able to pull the INx pin voltage down to 4 V, even if the switch is in the open state.  
Battery- connected switch  
+
14V  
RDIRT  
RSW  
œ
VBAT  
5kΩ  
GND  
Open  
TIC10024-Q1  
INx  
2mA  
GND  
Copyright © 2016, Texas Instruments Incorporated  
8-3. Example Showing The Calculation of The INx Pin Voltage For A Leaky Battery-Connected Switch  
8.3.8.4 Wetting Current Configuration  
There are 6 different wetting current settings (0 mA, 1 mA, 2 mA, 5 mA, 10 mA, and 15mA) that can be  
programmed by configuring the WC_CFG0 and WC_CFG1 registers. 0 mA is selected by default upon device  
reset.  
The accuracy of the wetting current has stronger dependency on the VS voltage when VS voltage is low. The  
lower the VS voltage falls, the more deviation on the wetting currents from their nominal values. Refer to  
IWETT (CSO) and IWETT (CSI) specifications for more details.  
8.3.9 Interrupt Generation and INT Assertion  
The INT pin is an active-low, open-drain output that asserts low when an event (switch input state change,  
temperature warning, over-voltage shut down etc.) is detected by the TIC10024-Q1. An external pull-up resistor  
to VDD is needed on the INT pin (see 8-4). The INT pin can also be connected directly to a 12-V automotive  
battery to support the microcontroller wake-up feature, as describe in 8.3.9.3.  
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TIC10024-Q1  
Microcontroller  
VDD  
VDD  
/INT  
GPI  
AGND  
GND  
AGND  
GND  
Copyright © 2016, Texas Instruments Incorporated  
8-4. INT Connection Example #1  
8.3.9.1 INT Pin Assertion Scheme  
TIC10024-Q1 supports two configurable schemes for INT assertion: static and dynamic. The scheme can be  
adjusted by configuring the INT_CONFIG bit in the CONFIG register.  
If the static INT assertion scheme is used (INT_CONFIG = 0 in the CONFIG register), the INT pin is asserted low  
upon occurrence of an event. The INT pin is released on the rising edge of CS only if a READ command has  
been issued to read the INT_STAT register while CS is low, otherwise the INT will be kept low indefinitely. The  
content of the INT_STAT interrupt register is latched on the first rising edge of SCLK after CS goes low for every  
SPI transaction, and the content is cleared upon a READ command issued to the INT_STAT register, as  
illustrated in 8-5.  
ꢀꢁINT_STAT register  
content cleared  
ꢀꢁ/INT pin released  
Event  
occurrence  
/INT  
/CS  
Register READ  
(non- INT_STAT register)  
Register READ  
(INT_STAT register)  
8-5. Static INT Assertion Scheme  
In some system implementations an edge-triggered based microcontroller might potentially miss the INT  
assertion if it is configured to the static scheme, especially when the microcontroller is in the process of waking  
up. To prevent missed INT assertion and improve robustness of the interrupt behavior, the TIC10024-Q1  
provides the option to use the dynamic assertion scheme for the INT pin. When the dynamic scheme is used  
(INT_CONFIG= 1 in the CONFIG register), the INT pin is asserted low for a duration of tINT_ACTIVE and is de-  
asserted back to high if the INT_STAT register has not been read after tINT_ACTIVE has elapsed. The INT is kept  
high for a duration of tINT_INACTIVE, and is re-asserted low after tINT_INACTIVE has elapsed. The INT pin continues  
to toggle until the INT_STAT register is read.  
If the INT_STAT register is read when INT pin is asserted low, the INT pin is released on the READ commands  
CS rising edge and the content of the INT_STAT register is also cleared, as shown in 8-6. If the INT_STAT  
register is read when INT pin is de-asserted, the content of the INT_STAT register is cleared on the READ  
commands CS rising edge, and the INT pin is not re-asserted back low, as shown in 8-7.  
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ꢀꢁINT_STAT register  
content cleared  
ꢀꢁ/INT pin released  
Event  
occurrence  
ttINT_INACTIVE  
t
/INT  
/CS  
tINT_ACTIVE  
Register READ  
(INT_STAT register)  
8-6. Dynamic INT Assertion Scheme With INT_STAT Register Read During tINT_ACTIVE  
ꢀꢁINT_STAT register  
content cleared  
ꢀꢁ/INT pin will not be re-  
asserted tINT_INACTIVE  
after /INT returns high  
Event  
occurrence  
ttINT_INACTIVE  
t
/INT  
/CS  
tINT_ACTIVE  
Register READ  
(INT_STAT register)  
8-7. Dynamic INT Assertion Scheme With INT_STAT Register Read During tINT_INACTIVE  
The static INT assertion scheme is selected by default upon device reset. The INT pin assertion scheme can  
only be changed when bit TRIGGER is logic 0 in the CONFIG register.  
8.3.9.2 Interrupt Idle Time (tINT_IDLE) Time  
Interrupt idle time (tINT_IDLE) is implemented in TIC10024-Q1 to:  
Allow the INT pin enough time to be pulled back high by the external pull-up resistor and allow the next  
assertion to be detectable by an edge-triggered microcontroller.  
Minimize the chance of glitching on the INT pin if back-to-back events occur.  
When there is a pending interrupt event and the interrupt event is not masked, tINT_IDLE is applied after the  
READ command is issued to the INT_STAT register. If another event occurs during the interrupt idle time the  
INT_STAT register content is updated instantly but the INT pin is not asserted low until tINT_IDLE has elapsed. If  
another READ command is issued to the INT_STAT register during tINT_IDLE, the INT_STAT register content is  
cleared immediately, but the INT pin is not re-asserted back low after tINT_IDLE has elapsed. An example of the  
interrupt idle time is given below to illustrate the INT pin behavior under the static INT assertion schemes:  
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/INT pin is not  
asserted until  
tINT_IDLE has expired  
1st Event  
2nd Event  
occurrence  
occurrence  
/INT  
/CS  
ttINT_IDLE  
Register READ  
(INT_STAT register)  
Register READ  
(INT_STAT register)  
8-8. INT Assertion Scheme With tINT_IDLE  
8.3.9.3 Microcontroller Wake-Up  
Using a few external components, the INT pin can be used for wake-up purpose to activate a voltage regulator  
through its inhibit inputs. An implementation example is shown in 8-9. This implementation is especially useful  
for waking up a microcontroller in sleep mode to allow significant system-level power savings.  
Before the wake-up event, the INT pin is in high impedance state on the TIC10024-Q1. The microcontroller can  
be kept in sleep state with all its GPIOs in logic low. Hence, Q2 remains off with its based in logic low state and  
the base of Q1 is weakly pulled-high to the VS level. This causes Q1 to remain off, and the LDO_EN signal is  
pulled-down to logic low to disable the regulator's output. VDD is therefore unavailable to both the TIC10024-Q1  
device and the microcontroller and SPI communication is not supported. Switch status monitoring, however, is  
still active in the TIC10024-Q1.  
When an event, such as switch status change, temperature warning, or overvoltage, occurs, the INT pin is  
asserted low by TIC10024-Q1, causing Q1 to turn on to activate the voltage regulator. The microcontroller is  
then reactivated, and the communication between the microcontroller and the TIC10024-Q1 is reestablished.  
The microcontroller can then access stored event information using SPI communication. Note since the INT pin  
is de-asserted after the INT_STAT register is read, the microcontroller is required to keep the regulator on by  
driving the μC_LDO_EN signal high. This allows VDD to stay high to provide power to the microcontroller and  
support SPI communications.  
The wake-up implementation is applicable only when the device is configured to use the static INT assertion  
scheme.  
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Regulator  
VIN  
+
VBAT  
10kΩ  
œ
VOUT  
Q1  
GND  
Microcontroller  
LDO_EN  
10kΩ  
TIC10024-Q1  
10kΩ  
GND  
V3p3  
VDD  
VDD  
10kΩ  
/INT  
C_INT  
GPIO 1  
GPIO 2  
Q2  
C_LDO_EN  
AGND  
GND  
GND  
10kΩ  
GND  
GND  
8-9. INT Connection to Support Microcontroller Wake-Up  
8.3.9.4 Interrupt Enable / Disable And Interrupt Generation Conditions  
Each switch input can be programmed to enable or disable interrupt generation upon status change by  
configuring registers INT_EN_COMP1 to INT_EN_COMP2 .  
The abovementioned registers can also be used to control interrupt generation condition based on the following  
settings:  
1. Rising edge: an interrupt is generated if the current input measurement is above the corresponding  
threshold and the previous measurement was below.  
2. Falling edge: an interrupt is generated if the current input measurement is below the corresponding  
threshold and the previous measurement was above.  
3. Both edges: changes of the input voltage in either direction results in an interrupt generation.  
Note interrupt generation from switch status change is disabled for all inputs by default upon device reset.  
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8.3.9.5 Detection Filter  
When monitoring the switch input status, a detection filter can be configured by setting the DET_FILTER bits in  
the CONFIG register to generate Switch Status Change (SSC) interrupt only if the same input status (w.r.t the  
threshold) is sampled consecutively. This detection filter can be useful to debounce inputs during a switch toggle  
event. Four different filtering schemes are available:  
1. Generate an SSC interrupt if the voltage level at an input crossed its threshold  
2. Generate an SSC interrupt if the voltage level at an input crossed its threshold and the status is stable (w.r.t.  
the threshold) for at least 2 consecutive polling cycles  
3. Generate an SSC interrupt if the voltage level at an input crossed its threshold and the status is stable (w.r.t.  
the threshold) for at least 3 consecutive polling cycles  
4. Generate an SSC interrupt if the voltage level at an input crossed its threshold and the status is stable (w.r.t.  
the threshold) for at least 4 consecutive polling cycles  
The default value of switch status is stored internally after the 1st detection cycle, even if detection filter (by  
configure the DET_FILTER in the CONFIG register) is used. An example is illustrated below with the assumption  
that DET_FILTER in register CONFIG is set to 11 (SSC interrupt is generated if the input crosses the threshold  
and the status is stable w.r.t. the threshold for at least 4 consecutive detection cycles). Assume switch status  
change is detected in the 3rd detection cycle and stays the same for the next 3 cycles.  
DETECTION CYCLE  
1
2
3
4
5
6
Default Switch status stored  
INT asserted  
INT asserted  
SSC flagged  
Switch status change  
detected  
Event  
SSC flagged  
The detection filter counter is reset to 0 when the TRIGGER bit in the CONFIG register is de-asserted to logic 0.  
Upon device reset, the default setting for the detection filter is set to generating an SSC interrupt at every  
threshold crossing.  
8.3.10 Temperature Monitor  
With multiple switch inputs are closed and high wetting current setting is enabled, considerable power can be  
dissipated by the device and raise the device temperature. TIC10024-Q1 has integrated temperature monitoring  
and protection circuitry to put the device in low power mode to prevent damage due to overheating. Two types of  
temperature protection mechanisms are integrated in the device: Temperature Warning (TW) and Temperature  
Shutdown (TSD). The triggering temperatures and hysteresis are specified in 8-2 below:  
8-2. Temperature Monitoring Characteristics of TIC10024-Q1  
PARAMETER  
MIN  
130  
150  
TYP  
140  
160  
15  
MAX  
155  
UNIT  
°C  
Temperature warning trigger temperature (TTW  
)
Temperature shutdown trigger temperature (TTSD  
)
175  
°C  
Temperature hysteresis (THYS) for TTW and TTSD  
°C  
8.3.10.1 Temperature Warning (TW)  
When the device temperature goes above the temperature warning trigger temperature (TTW), the TIC10024-Q1  
performs the following operations:  
1. Generate an interrupt by asserting the INT pin low and flag the TW bit in INT_STAT register to logic 1. The  
TEMP bit in the SPI flag is also flagged to logic 1 for all SPI transactions.  
2. The TW_STAT bit of the IN_STAT_MISC register is flagged to logic 1.  
3. If the TW_CUR_DIS_CSO or TW_CUR_DIS_CSO bit in CONFIG register is set to logic 0 (default), the  
wetting current is adjusted down to 2 mA for 10 mA or 15 mA settings. The wetting current stays at its pre-  
configured value if 0 mA, 1 mA, 2 mA, or 5 mA setting is used.  
4. Maintain the low wetting current as long as the device junction temperature stays above TTW - THYS  
.
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The INT pin is released and the INT_STAT register content is cleared on the rising edge of CS provided the  
INT_STAT register has been read during CS low. The TIC10024-Q1 continues to monitor the temperature, but  
does not issue further interrupts if the temperature continues to stay above TTW- THYS. The status bit TW_STAT  
in register IN_STAT_MISC continues to stay at logic 1 as long as the temperature warning condition exists.  
If desired, the reduction of wetting current down to 2mA setting (from 10 mA or 15 mA) can be disabled by  
setting the TW_CUR_DIS_CSO or TW_CUR_DIS_CSI bit in the CONFIG register to 1. The interrupt is still  
generated ( INT asserted low and INT_STAT interrupt register is updated) when the temperature warning event  
occurs but the wetting current is not reduced. This setting applies to both the polling and continuous mode  
operation. Note if the feature is enabled, switch detection result might be impacted upon TTW event if the wetting  
current is reduced to 2mA from 10mA or 15mA.  
When the temperature drops below TTW- THYS, the INT pin is asserted low (if released previously) to notify the  
microcontroller that the temperature warning condition no longer exists. The TW bit of the interrupt register  
INT_STAT is flagged logic 1. The TW_STAT bit in the IN_STAT_MISC register is de-asserted back to logic 0. The  
device resumes operation using the current programmed settings (regardless of the INT and CS status).  
8.3.10.2 Temperature Shutdown (TSD)  
After the device enters TW condition, if the junction temperature continues to rise and goes above the  
temperature shutdown threshold (TTSD), the TIC10024-Q1 enters the Temperature Shutdown (TSD) condition  
and performs the following operations:  
1. Opens all the switches connected to the current sources or sinks to prevent any further heating due to  
excessive current flow.  
2. Generate an interrupt by asserting the INT pin (if not already asserted) low and flag the TSD bit in the  
INT_STAT register to logic 1. The TEMP bit in the SPI flag is also flagged to logic 1 for all SPI transactions.  
3. The TSD_STAT bit of the IN_STAT_MISC register is flagged to logic 1. The TW_STAT bit also stays at logic  
1.  
4. SPI communication stays on and all register settings stay intact without resetting. Previous switch status, if  
needed, can be retrieved without any interruption.  
5. Maintain the setting as long as the junction temperature stays above TTSD- THYS  
.
The INT pin is released and the INT_STAT register content is cleared on the rising edge of CS provided the  
INT_STAT register has been read during CS low. The TIC10024-Q1 continues to monitor the temperature, but  
does not issue further interrupts if the temperature continues to stay above TTSD - THYS. The status bit  
TSD_STAT in register IN_STAT_MISC continues to stay at logic 1 as long as the temperature shutdown  
condition exists.  
When the temperature drops below TTSD - THYS, the INT pin is asserted low (if released previously) to notify the  
microcontroller that the temperature shutdown condition no longer exists. The TSD bit of the interrupt register  
INT_STAT is flagged logic 1. In the IN_STAT_MISC register, the TSD_STAT bit is de-asserted back to logic 0,  
while the TW_STAT bit stays at logic 1. The device resumes operation using the wetting current setting  
described in section Temperature Warning if the temperature stays above TTW - THYS. Note the polling restarts  
from the first enabled channel and the SSC interrupt is generated at the end of the first polling cycle. The  
detected switch status from the first polling cycle becomes the default switch status for subsequent polling.  
8.3.11 Parity Check And Parity Generation  
The TIC10024-Q1 uses parity bit check to ensure error-free data transmission from/to the SPI commander.  
The device uses odd parity, for which the parity bit is set so that the total number of ones in the transmitted data  
on SO (including the parity bit) is an odd number (i.e. Bit0 Bit1 …⊕Bit30 Bit31Parity = 1).  
The device also uses odd parity check after receiving data on SI from the SPI commander. If the total number of  
ones in the received data (including the parity bit) is an even number the received data is discarded. The INT will  
be asserted low and the PRTY_FAIL bit in the interrupt register (INT_STAT) is flagged to logic 1 to notify the host  
that transmission error occurred. The PRTY_FAIL flag is also asserted during SPI communications.  
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8.3.12 Cyclic Redundancy Check (CRC)  
The TIC10024-Q1 includes a CRC module to support redundancy checks on the configuration registers to  
ensure the integrity of data. The CRC calculation is based on the ITU-T X.25 implementation, and the CRC  
polynomial (0x1021) used is popularly known as CRC-CCITT-16 since it was initially proposed by the ITU-T  
(formerly CCITT) committee. The CRC calculation rule is defined in 8-3:  
8-3. CRC Calculation Rule  
CRC RULE  
CRC result width  
Polynomial  
VALUE  
16 bits  
x16 + x12 + x5 +1 (1021h)  
Initial (seed) value  
Input data reflected  
Result data reflected  
XOR value  
FFFFh  
No  
No  
0000h  
The CRC calculation is done on all the configuration registers starting from register CONFIG and ending at  
register INT_EN_CFG0 (address 1Ah through 24h). The device substitutes a zerofor each reserved  
configuration register bit during the CRC calculation. The CRC calculation can be triggered by asserting the  
CRC_T bit in the CONFIG register. Once completed, the CRC_CALC interrupt bit in the INT_STAT register is  
asserted and an interrupt is issued. The 16-bit CRC calculation result is stored in the register CRC. This interrupt  
can be disabled by de-asserting the CRC_CALC_EN bit in the INT_EN_CFG0 register. It is important to avoid  
writing data to the configuration registers when the device is undergoing CRC calculations to prevent false  
calculation results.  
8-10 shows the block diagram of the CRC module. The module consists of 16 shift-registers and 3 exclusive-  
OR gates. The registers start with 1111-1111-1111-1111 (or FFFFh) and the module performs an XOR function  
and shifts its content until the last bit of the register string is used. The final registers content after the last data  
bit is the calculated CRC value of the data set and the content is stored in the CRC register.  
Note the CRC_T bit self-clears after the CRC calculation is completed. Logic 1 is used for CRC_T bit during  
CRC calculation.  
X15 X14 X13 X12  
X11 X10  
X9  
X8  
X7  
X6  
X5  
X4  
X3  
X2  
X1  
X0  
+
+
+
XOR  
XOR  
XOR  
Data  
MSB  
LSB  
8-10. CCITT-16 CRC Module Block Diagram  
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8.4 Device Functional Modes  
The TIC10024-Q1 has 2 modes of operation: continuous mode and polling mode. The following sections  
describe the two operation modes in details as well as some of the advanced features that could be activated  
during normal operations.  
8.4.1 Continuous Mode  
In continuous mode, wetting current is continuously applied to each enabled input channel, and the status of  
each channel is sampled sequentially (starting from the IN0 to IN23). The TIC10024-Q1 monitors enabled inputs  
and issues an interrupt (if enabled) if a switch status change event is detected. The wetting current setting for  
each input can be individually adjusted by configuring the WC_CFG0 and WC_CFG1 to the 0mA, 1mA, 2mA,  
5mA, 10mA, or 15mA setting.  
8-11 below illustrates an example of the timing diagram of the detection sequence in continuous mode. After  
the TRIGGER bit in register CONFIG is set to logic 1, it takes tSTARTUP to activate the wetting current for all  
enabled inputs. The wetting currents stay on continuously, while each input is routed to the comparator for  
sampling in a sequential fashion. After detection is done for an input, the switch status (below or above detection  
threshold) is stored in the register (IN_STAT_COMP) to be used as the default state for subsequent detection  
cycles. After the end of the first polling cycle, the INT pin is asserted low to notify the microcontroller that the  
default switch status is ready to be read. The SSC bit in INT_STAT register and the SPI status flag SSC are also  
asserted to logic 1. The polling cycle time (tPOLL) determines how frequently each input is sampled and can be  
configured in the register CONFIG.  
Input sampling restarts  
from first enabled input  
after tPOLL_TIME  
Wetting  
current  
TRIGGER bit set  
to logic 1 in  
CONFIG register  
ttPOLL_TIME  
t
ttSTARTUP  
t
IN0  
IN1  
IN3  
tCOMP  
t
tCOMP  
t
IN23  
/INT  
ñ Default input status is stored  
ñ /INT pin is asserted after the  
1st detection cycle  
Time  
8-11. An Example Of The Detection Sequence In Continuous Mode  
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The INT_STAT register is cleared and INT pin de-asserted if a SPI READ command is issued to the register.  
Note the interrupt is always generated after the 1st detection cycle (after the TRIGGER bit in register CONFIG is  
set to logic 1). In subsequent detection cycles, the interrupt is generated only if switch status change is detected.  
No wetting currents are applied to 0mA- configured inputs, although some biasing current (as specified by  
IIN_LEAK_0mA) may still flow in and out of the input. Threshold crossing monitoring is still performed for the input  
using the defined threshold(s). The 0mA setting is useful to utilize the integrated comparator to measure applied  
voltage on a specific input without being affected by the device wetting current.  
8.4.2 Polling Mode  
The polling mode can be activated to reduce current drawn in ignition-off condition to conserve battery charge.  
Unlike the continuous mode, the current sources/sinks do not stay on continuously in the polling mode. Instead,  
they are turned on/off sequentially from IN0 to IN23 and cycled through each individual input channel. The  
microcontroller can be put to sleep to reduce overall system power. If a switch status change (SSC) is detected  
by the TIC10024-Q1, the INT pin (if enabled for the input channel) is asserted low (and the SSC bit in INT_STAT  
register and the SPI status flag SSC are also asserted to logic 1). The INT pin assertion can be used to wake up  
the system regulator which, in turn, wakes up the microcontroller as described in section Microcontroller Wake-  
Up. The microcontroller can then use SPI communication to read the switch status information.  
The polling is activated when the TRIGGER bit in the CONFIG register is set to logic 1.  
In polling mode, wetting current is applied to each input for a pre-programmed polling active time between 64 μs  
and 2048 μs, set by the POLL_ACT_TIME bits in the CONFIG register . At the end of the wetting current  
application, the input voltage is sampled by the comparator. Each input is cycled through in sequential order  
from IN0 to IN23. Sampling is repeated at a frequency from 2 ms to 4096 ms, set by the POLL_TIME bits in the  
CONFIG register . Wetting currents are applied to closed switches only during the polling active time; hence the  
overall system current consumption can be greatly reduced.  
Similar to continuous mode, after the first polling cycle, the switch status of each input (below or above detection  
threshold) is stored in the register (IN_STAT_COMP) to be used as the default state for subsequent polling  
cycles. The INT pin is asserted low to notify the microcontroller that the default switch status is ready to be read.  
The SSC bit in INT_STAT register and the SPI status flag SSC are also asserted to logic 1. The INT_STAT  
register is cleared and INT pin de-asserted if a SPI READ command is issued to the register. Note the interrupt  
is always generated after the 1st polling cycle (after the TRIGGER bit in register CONFIG is set to logic 1). In  
subsequent polling cycles the interrupt is generated only if switch status change is detected.  
An example of the timing diagram of the polling mode operation is shown in 8-12.  
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Wetting current is  
activated for  
tPOLL_ACT_TIME  
Wetting  
current  
Input sampling restarts  
from first enabled input  
after tPOLL_TIME  
TRIGGER bit set  
to logic 1 in  
CONFIG register  
ttPOLL_ACT_TIME  
t
ttPOLL_TIME  
t
ttSTARTUP  
t
ttPOLL_ACT_TIMEt  
ttSTARTUP  
t
IN0  
IN1  
IN3  
tCOMP  
t
tCOMP  
t
IN23  
/INT  
ñ Default input status is stored  
ñ /INT pin is asserted after the  
1st detection cycle  
tCOMP  
t
Time  
8-12. An Example Of The Polling Sequence In Standard Polling Mode  
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If the switch position changes between two active polling times, no interrupt will be generated and the status  
register (IN_STAT_COMP) will not reflect such a change. An example is shown in 8-13.  
Wetting  
current  
Switch  
state  
Ignored  
Initial switch  
switch state  
state change  
change  
/INT  
/INT asserted  
due to initial  
state change  
/CS  
Time  
8-13. Example For Ignored Switch Position Change Between 2 Wetting Current Cycles  
8.4.3 Additional Features  
There are additional features that can be enabled during continuous and polling mode to increase robustness of  
device operation or provide more system information. These features are described in detail in the following  
sections.  
8.4.3.1 Clean Current Polling (CCP)  
In real automotive system, lower wetting current is generally desired to reduce the system's overall power  
consumption. However, certain system design requires 10 mA or higher cleaning current to clear oxide build-up  
on the mechanical switch contact surface when the current is applied to closed switches. A special type of  
polling, called the Clean Current Polling (CCP), can be used for this application.  
If CCP is enabled each polling cycle consists of two wetting current activation steps. The first step uses the  
wetting current setting configured in the WC_CFG0 and WC_CFG1 registers as in the continuous mode or  
polling mode. The second step (cleaning cycle) is activated simultaneously for all CCP enabled inputs at a time  
tCCP_TRAN after the normal polling step of the last enabled input. Interrupt generation and INT pin assertion is not  
impacted by the clean current pulses.  
The wetting current and its active time for the cleaning cycle can be configured in the CCP_CFG0 register. The  
cleaning cycle can be disabled, if desired, for each individual input by programming the CCP_CFG1 register.  
CCP is available for both continuous mode and polling mode. To use the CCP feature, at least one input has to  
be enabled.  
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8-14 illustrates the operation of the CCP when the device is configured to the polling mode.  
Wetting  
current  
TRIGGER bit set  
to logic 1 in  
CONFIG register  
ttPOLL_TIME  
t
tSTARTUP  
IN0  
tSTARTUP  
IN1  
IN2  
tCOMP  
t
ttCCP_TIME  
t
IN22  
IN23  
ttCCP_TRAN  
t
/INT  
/CS  
ñ Default input status is stored  
ñ /INT pin is asserted after the  
1st detection cycle  
Read on INT_STAT register  
release the /INT pin  
Time  
8-14. Polling With CCP Enabled  
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8-15 illustrates the operation of the CCP when the device is configured to the continuous mode:  
Wetting  
current  
TRIGGER bit set  
to logic 1 in  
CONFIG register  
ttPOLL_TIME  
t
tSTARTUP  
IN0  
tSTARTUP  
IN1  
IN2  
tCOMP  
t
ttCCP_TIME  
t
IN22  
IN23  
/INT  
/CS  
ñ Default input status is stored  
ñ /INT pin is asserted after the  
1st detection cycle  
Read on INT_STAT register  
release the /INT pin  
Time  
8-15. Continue Mode With CCP Enabled  
8.4.3.2 Wetting Current Auto-Scaling  
The 10 mA and 15 mA wetting current settings are useful to clean oxide build-up on the mechanical switch  
contact surface when the switch changes state from open to close. After the switch is closed, it is undesirable to  
keep the wetting current level at high level if only digital switches are monitored since it results in high current  
consumption and could potentially heat up the device quickly if multiple inputs are monitored. The wetting current  
auto-scaling feature helps mitigate this issue.  
When enabled (AUTO_SCALE_DIS_CSO or AUTO_SCALE_DIS_CSI bit = logic 0 in the WC_CFG1 register),  
wetting current is reduced to 2 mA from 10 mA or 15 mA setting after switch closure is detected. The threshold  
used to determine a switch closure is the threshold configured in the THRES_COMP register.  
The current reduction takes place N cycles after switch closure is detected on an input, where N depends on the  
setting of the DET_FILTER bits in the CONFIG register:  
DET_FILTER= 00: wetting current is reduced immediately in the next detection cycle after a closed switch is  
detected.  
DET_FILTER= 01: wetting current is reduced when a closed switch is detected and the switch status is stable  
for at least 2 consecutive detection cycles.  
DET_FILTER= 10: wetting current is reduced when a closed switch is detected and the switch status is stable  
for at least 3 consecutive detection cycles.  
DET_FILTER= 11: wetting current is reduced when a closed switch is detected and the switch status is stable  
for at least 4 consecutive detection cycles.  
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The wetting current is adjusted back to the original setting of 10 mA or 15 mA at a time of N cycles after an open  
switch is detected, where N again depends on the DET_FILTER bit setting in the CONFIG register. 8-16  
depicts the behavior of the wetting current auto-scaling feature.  
Switch open  
Switch closed  
Auto-scaling  
disabled  
15mA  
15mA  
0mA  
0mA  
Auto-scaling  
enabled  
2mA  
8-16. Wetting Current Auto-scaling Behavior  
The wetting current auto-scaling only applies to 10 mA and 15 mA settings and is only available in continuous  
mode. If AUTO_SCALE_DIS_CSO or AUTO_SCALE_DIS_CSI bit is set to logic 1 in the WC_CFG1 registers,  
the wetting current stays at its original setting when a closed switch is detected. Power dissipation needs to be  
closely monitored when wetting current auto-scaling is disabled for multiple inputs as the device could heat up  
quickly when high wetting current settings are used. If the auto-scaling feature is disabled in continuous mode,  
the total power dissipation can be approximated using 方程1.  
P
=VS ì  
(
IS _CONT + IWETT (TOTAL)  
)
TOTAL  
(1)  
where IWETT (TOTAL) is the sum of all wetting currents from all input channels. Increase in device junction  
temperature can be calculated based on P × RθJA. The junction temperature must be below TTSD for proper  
device operation. An interrupt will be issued when the junction temperature exceeds TTW or TTSD. For detailed  
description of the temperature monitoring, please refer to sections Temperature Warning (TW) and Temperature  
Shutdown (TSD).  
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9 Programming  
The SPI interface communication consists of the 4 pins: CS, SCLK, SI, and SO. The interface can work with  
SCLK frequency up to 4 MHz.  
9.1 SPI Communication Interface Buses  
9.1.1 Chip Select ( CS)  
The system microcontroller selects the TIC10024-Q1 to receive communication using the CS pin. With the CS  
pin in a logic LOW state, command words may be sent to the TIC10024-Q1 through the serial input (SI) pin, and  
the device information can be retrieved by the microcontroller through the serial output (SO) pin. The falling edge  
of the CS enables the SO output and latches the content of the interrupt register INT_STAT. The microcontroller  
may issue a READ command to retrieve information stored in the registers. Rising edge on the CS pin initiates  
the following operations:  
1. Disable the output driver and makes SO high-impedance.  
2. INT pin is reset to logic HIGH if a READ command to the INT_STAT register was issued during CS = LOW.  
To avoid corrupted data, it is essential the HIGH-to-LOW and LOW-to-HIGH transitions of the CS signal occur  
only when SCLK is in a logic LOW state. A clean CS signal is needed to ensure that no incomplete SPI words  
are sent to the device. The CS pin should be externally pulled up to VDD by a 10 kΩresistor.  
9.1.2 System Clock (SCLK)  
The system clock (SCLK) input is used to clock the internal shift register of the TIC10024-Q1. The SI data is  
latched into the input shift register on the falling edge of the SCLK signal. The SO pin shifts the device stored  
information out on the rising edge of SCLK. The SO data is available for the microcontroller to read on the falling  
edge of SCLK.  
False clocking of the shift register must be avoided to ensure validity of data and it is essential the SCLK pin be  
in a logic LOW state whenever CS makes any transition. Therefore, it is recommended that the SCLK pin gets  
pulled to a logic LOW state as long as the device is not accessed and CS is in a logic HIGH state. When the CS  
is in a logic HIGH state, any signal on the SCLK and SI pins will be ignored and the SO pin remains as a high  
impedance output. Refer to 9-1 and 9-2 for examples of typical SPI read and write sequence.  
9.1.3 Slave In (SI)  
The SI pin is used for serial instruction data input. SI information is latched into the input register on the falling  
edge of the SCLK. To program a complete word, 32 bits of information must be entered into the device. The SPI  
logic counts the number of bits clocked into the IC and enables data latching only if exactly 32 bits have been  
clocked in. In case the word length exceeds or does not meet the required length, the SPI_FAIL bit of the  
INT_STAT register is asserted to logic 1 and the INT pin will be asserted low. The data received is considered  
invalid. Note the SPI_FAIL bit is not flagged if SCLK is not present.  
9.1.4 Slave Out (SO)  
The SO pin is the output from the internal shift register. The SO pin remains high-impedance until the CS pin  
transitions to a logic LOW state. The negative transition of CS enables the SO output driver and drives the SO  
output to the HIGH state (by default). The first positive transition of SCLK makes the status data bit 31 available  
on the SO pin. Each successive positive clock makes the next status data bit available for the microcontroller to  
read on the falling edge of SCLK. The SI/SO shifting of the data follows a first-in, first-out scheme, with both  
input and output words transferring the most significant bit (MSB) first.  
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9.2 SPI Sequence  
9-1 and 9-2 depict the SPI communication sequence during read and write operations for the TIC10024-  
Q1.  
Bit 31  
(MSB)  
Bit 0  
(LSB)  
...  
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22  
Bit 1  
Read/  
Write  
SI  
Register address  
Data in  
PAR  
0
Bit 31  
(MSB)  
Bit 0  
(LSB)  
...  
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22  
Bit 1  
SO  
Status flag  
Data out  
PAR  
SPI_ PRTY_  
POR  
SSC  
RES TEMP  
OI  
FAIL  
FAIL  
9-1. TIC10024-Q1 Read SPI Sequence  
Bit 31  
(MSB)  
Bit 0  
(LSB)  
...  
...  
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22  
Bit 1  
Read/  
Write  
SI  
Register address  
Data in  
PAR  
1
Bit 31  
(MSB)  
Bit 0  
(LSB)  
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22  
Bit 1  
SO  
Status flag  
Previous content of the  
register addressed  
PAR  
SPI_ PRTY_  
FAIL FAIL  
POR  
SSC  
RES TEMP  
OI  
9-2. TIC10024-Q1 Write SPI Sequence  
9.2.1 Read Operation  
The Read/Write bit (bit 31) of the SI bus needs to be set to logic 0 for a READ operation. The 6-bits address of  
the register to be accessed follows next on the SI bus. The content from bit 24 to bit 1 does not represent a valid  
command for a read operation and will be ignored. The LSB (bit 0) is the parity bit used to detect communication  
errors.  
On the SO bus, the status flags will be outputted from the TIC10024-Q1, followed by the data content in the  
register that was requested. The LSB is the parity bit used to detect communication errors.  
Note there are several test mode registers used in the TIC10024-Q1 in addition to the normal functional  
registers, and a READ command to these test registers returns the register content. If a READ command is  
issued to an invalid register address, the TIC10024-Q1 returns all 0s.  
9.2.2 Write Operation  
The Read/Write bit (bit 31) on the SI bus needs to be set to 1 for a write operation. The 6-bits address of the  
register to be accessed follows next on the SI bus. Note the register needs to be a writable configuration register,  
or otherwise the command will be ignored. The content from bit 24 to bit 1 represents the data to be written to  
the register. The LSB (bit 0) is the parity bit used to detect communication errors.  
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On the SO bus, the status flags will be output from the TIC10024-Q1, followed by the previous data content of  
the written register. The previous content of the register is latched after the full register address is decoded in the  
SI command (after bit 25 is transmitted). The new data will replace the previous data content at the end of the  
SPI transaction if the SI write is a valid command (valid register address and no SPI/parity error). If the write  
command is invalid, the new data will be ignored and the register content will remain unchanged. The LSB is the  
parity bit used to detect communication errors.  
Note there are several test mode registers used in the TIC10024-Q1 in addition to the normal functional  
registers. A WRITE command to these test registers has no effect on the register content, even though the  
register content is returned on the SO output. If a WRITE command is issued to an invalid register address, the  
SO output returns all 0s.  
9.2.3 Status Flag  
The status flags are output from SO during every READ or WRITE SPI transaction to indicate system conditions.  
These bits do not belong to an actual register, but their content is mirrored from the interrupt register INT_STAT.  
A READ command executed on the INT_STAT would clear both the bits inside the register and the status flag.  
The following table describes the information that can be obtained from each SPI status flag:  
9-1. TIC10024-Q1 SPI Status Flag Description  
SYMBOL  
NAME  
DESCRIPTION  
This flag mirrors the POR bit in the interrupt register INT_STAT, and it indicates, if set to 1, that a reset event has  
occurred. This bit is asserted after a successful power-on-reset, hardware reset, or software reset. Refer to 节  
8.3.5 for more details.  
POR  
Power-on Reset  
This flag mirrors the SPI_FAIL bit in the interrupt register INT_STAT and it indicates, if set to 1, that the last SPI  
responder in (SI) transaction is invalid. To program a complete word, 32 bits of information must be entered into  
the device. The SPI logic counts the number of bits clocked into the IC and enables data latching only if exactly  
32 bits have been clocked in. In case the word length exceeds or does not meet the required size, the SPI_FAIL  
bit, which mirrors its value to this SPI_FAIL status flag, of the interrupt register INT_STAT will be set to 1 and the  
INT pin will be asserted low. The data received will be considered invalid. Once the INT_STAT register is read, its  
content will be cleared on the rising edge of CS. The SPI_FAIL status flag, which mirrors the SPI_FAIL bit in the  
INT_STAT register, will also be de-asserted. Note the SPI_FAIL bit is not flagged if SCLK is not present.  
SPI_FAIL  
SPI Error  
This flag mirrors the PRTY_FAIL bit in the interrupt register INT_STAT and it indicates, if set to 1, that the last SPI  
responder in (SI) transaction has a parity error. The device uses odd parity. If the total number of ones in the  
received data (including the parity bit) is an even number, the received data is discarded. The INT will be  
asserted low and the PRTY_FAIL bit in the interrupt register (INT_STAT) is flagged to logic 1, and the  
PRTY_FAIL status flag, which mirrors the PRTY_FAIL bit in the INT_STAT register, is also set to 1. Once the  
INT_STAT register is read, its content will be cleared on the rising edge of CS. The PRTY_FAIL status flag, which  
mirrors the PRTY_FAIL bit in the INT_STAT register, will also be de-asserted.  
PRTY_FAIL  
Parity Fail  
This flag mirrors the SSC bit in the interrupt register INT_STAT and it indicates, if set to 1, that one or more switch  
inputs crossed a threshold. To determine the origin of the state change, the microcontroller can read the content  
of the register IN_STAT_COMP. Once the interrupt register (INT_STAT) is read, its content will be cleared on the  
rising edge of CS. The SSC status flag, which mirrors the SSC bit in the INT_STAT register, will also be de-  
asserted.  
SSC  
RES  
Switch State Change  
Reserved  
This flag is reserved and is always at logic 0.  
This flag is set to 1 if either Temperature Warning (TW) or Temperature Shutdown (TSD) bit in the interrupt  
register INT_STAT is flagged to 1. It indicates a TW event or a TSD event has occurred. It is also flagged to 1 if a  
TW event or a TSD event is cleared. The interrupt register INT_STAT should be read to determine which event  
occurred. The SPI commander can also read the IN_STAT_MISC register to get information on the temperature  
status of the device. Once the interrupt register (INT_STAT) is read, its content will be cleared on the rising edge  
of CS, and the TEMP status flag will also be de-asserted.  
TEMP  
Temperature Event  
Other Interrupt  
Other interrupt include interrupts such as OV, UV, CRC_CALC and CHK_FAIL. This flag will be asserted 1 when  
any of the above mentioned bits is flagged in the interrupt register INT_STAT. The interrupt register INT_STAT  
should be read to determine which event(s) occurred. The SPI commander can also read the IN_STAT_MISC  
register to get information on the latest status of the device. Once the INT_STAT register is read, its content will  
be cleared on the rising edge of CS, and the OI status flag will also be de-asserted.  
OI  
9.3 Programming Guidelines  
When configuring the TIC10024-Q1, it is critical to follow the programming guideline summarized below (see 表  
9-2) to ensure proper behavior of the device:  
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9-2. TIC10024-Q1 Programming Guidelines  
Category  
Programming Requirement  
Clean Current Polling (if CCP_INx = 1 in the  
CCP_CFG1 register)  
At least one input has to be enabled: IN_EN_x = 1 in the IN_EN register  
The wetting current auto-scaling feature is only activated in the continuous mode:  
POLL_EN = 0 (1)  
Wetting current auto-scaling (if WC_CFG1  
[22:21] != 2b11)  
The wetting current auto-scaling only applies to 10mA or 15mA wetting currents:  
WC_INx bits = 3b100, 3b101, 3b110, or 3b111 in the WC_CFG0 and  
WC_CFG1 registers.(1)  
tPOLL_TIME and tPOLL_ACT_TIME settings have to meet the below requirement: tPOLL_TIM E  
1.3 × [ tPOLL_ACT_TIME + n × 24 μs + 10 μs](2)  
Continuous mode  
Polling mode  
n: the number of enabled channels configured in register IN_EN  
tPOLL_TIME: timing setting configured in CONFIG[4:1]  
tPOLL_ACT_TIME: timing setting configured in CONFIG[8:5]  
(1) These are soft requirements to take advantage of the wetting current auto-scaling feature. The feature takes no effect otherwise.  
(2) If CCP is enabled, add tCCP_TRAN +tCCP_TIME, where tCCP_TIME is the timing setting configured in CCP_CFG0[6:4]  
9.4 Register Maps  
9-3 lists the memory-mapped registers for the TIC10024-Q1. All register offset addresses not listed in 9-3  
should be considered as reserved locations and the register contents should not be modified.  
9-3. TIC10024-Q1 Registers  
OFFSET  
1h  
TYPE  
R
RESET  
120h  
1h  
ACRONYM  
REGISTER NAME  
SECTION  
Go  
DEVICE_ID  
INT_STAT  
Device ID Register  
2h  
RC  
R
Interrupt Status Register  
Go  
3h  
FFFFh CRC  
CRC Result Register  
Go  
4h  
R
0h  
0h  
IN_STAT_MISC  
IN_STAT_COMP  
Miscellaneous Status Register  
Comparator Status Register  
RESERVED  
Go  
5h  
R
Go  
6h-19h  
1Ah  
RESERVED  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
CONFIG  
Device Global Configuration Register  
Input Enable Register  
Go  
Go  
Go  
Go  
Go  
Go  
Go  
1Bh  
IN_EN  
1Ch  
CS_SELECT  
Current Source/Sink Selection Register  
Wetting Current Configuration Register  
Clean Current Polling Register  
Comparator Threshold Control Register  
1Dh-1Eh  
1Fh-20h  
21h  
WC_CFG0, WC_CFG1  
CCP_CFG0, CCP_CFG1  
THRES_COMP  
22h-23h  
INT_EN_COMP1,  
INT_EN_COMP2  
Comparator Input Interrupt Generation Control  
Register  
24h  
R/W  
0h  
INT_EN_CFG0  
RESERVED  
Global Interrupt Generation Control Register  
RESERVED  
Go  
25h-32h  
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9.4.1 DEVICE_ID register (Offset = 1h) [reset = 20h]  
DEVICE_ID is shown in 9-3 and described in 9-4.  
Return to Summary Table.  
This register represents the device ID of the TIC10024-Q1.  
9-3. DEVICE_ID Register  
23  
22  
10  
21  
9
20  
8
19  
18  
RESERVED  
R-0h  
17  
16  
15  
3
14  
2
13  
1
12  
0
11  
7
6
5
4
RESERV  
ED  
MAJOR  
MINOR  
R-0h  
R-0h  
R-12h  
LEGEND: R = Read only  
9-4. DEVICE_ID Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-11  
RESERVED  
R
0h  
RESERVED  
10-4  
MAJOR  
R
12h  
These 7 bits represents major revision ID. For TIC10024-Q1 the  
major revision ID is 12h.  
3-0  
MINOR  
R
0h  
These 4 bits represents minor revision ID. For TIC10024-Q1 the  
minor revision ID is 0h.  
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9.4.2 INT_STAT Register (Offset = 2h) [reset = 1h]  
INT_STAT is shown in 9-4 and described in 9-5.  
Return to Summary Table.  
This register records the information of the event as it occurs in the device. A READ command executed on this  
register clears its content and resets the register to its default value. The INT pin is released at the rising edge of  
the CS pin from the READ command.  
9-4. INT_STAT Register  
23  
22  
21  
20  
19  
18  
10  
2
17  
16  
RESERVED  
R-0h  
15  
14  
13  
12  
11  
9
8
RESERVED  
R-0h  
CHK_FAIL  
RC-0h  
RESERVED  
R-0h  
CRC_CALC  
RC-0h  
7
6
5
4
3
1
0
UV  
OV  
TW  
TSD  
SSC  
RC-0h  
PRTY_FAIL  
RC-0h  
SPI_FAIL  
RC-0h  
POR  
RC-1h  
RC-0h  
RC-0h  
RC-0h  
RC-0h  
LEGEND: R = Read only; RC = Read to clear  
9-5. INT_STAT Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-14  
RESERVED  
R
0h  
RESERVED  
13  
CHK_FAIL  
RC  
0h  
0h = Default factory setting is successfully loaded upon device  
initialization or the event status got cleared after a READ command  
was executed on the INT_STAT register.  
1h = An error is detected when loading factory settings into the  
device upon device initialization.  
During device initialization, factory settings are programmed into the  
device to allow proper device operation. The device performs a self-  
check after the device is programmed to diagnose whether correct  
settings are loaded. If the self-check returns an error, the CHK_FAIL  
bit is flagged to logic 1 along with the POR bit. The host controller is  
then recommended to initiate a software reset (see section Software  
Reset) to re-initialize the device and allow correct settings to be re-  
programmed.  
12-9  
8
RESERVED  
CRC_CALC  
R
0h  
0h  
RESERVED  
RC  
0h = CRC calculation is running, not started, or was acknowledged  
after a READ command was executed on the INT_STAT register.  
1h = CRC calculation is finished.  
CRC calculation (see section Cyclic Redundancy Check (CRC)) can  
be triggered to make sure correct register values are programmed  
into the device. Once the calculation is completed, the CRC_CALC  
bit is flagged to logic 1 to indicate completion of the calculation, and  
the result can then be accessed from the CRC (offset = 3h) register.  
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9-5. INT_STAT Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
7
UV  
RC  
0h  
0h = No under-voltage condition occurred or cleared on the VS pin,  
or the event status got cleared after a READ command was  
executed on the INT_STAT register.  
1h = Under-voltage condition occurred or cleared on the VS pin.  
When the UV bit is flagged to logic 1, it indicates the Under-Voltage  
(UV) event has occurred. The bit is also flagged to logic 1 when the  
event clears. For more details about the UV operation, please refer  
to section VS under-voltage (UV) condition.  
6
5
4
OV  
RC  
RC  
RC  
0h  
0h  
0h  
0h = No over-voltage condition occurred or cleared on the VS pin, or  
the event status got cleared after a READ command was executed  
on the INT_STAT register.  
1h = Over-voltage condition occurred or cleared on the VS pin.  
When the OV bit is flagged to logic 1, it indicates the Over-Voltage  
(OV) event has occurred. The bit is also flagged to logic 1 when the  
event clears. For more details about the OV operation, please refer  
to section VS over-voltage (OV) condition.  
TW  
0h = No temperature warning event occurred or the event status got  
cleared after a READ command was executed on the INT_STAT  
register.  
1h = Temperature warning event occurred or cleared.  
When the TW bit is flagged to logic 1, it indicates the temperature  
warning event has occurred. The bit is also flagged to logic 1 when  
the event clears. For more details about the temperature warning  
operation, please refer to section Temperature Warning (TW)  
TSD  
0h = No temperature Shutdown event occurred or the event status  
got cleared after a READ command was executed on the INT_STAT  
register.  
1h = Temperature Shutdown event occurred or cleared.  
When the TSD bit is flagged to logic 1, it indicates the temperature  
shutdown event has occurred. The bit is also flagged to logic 1 when  
the event clears. For more details about the temperature shutdown  
operation, please refer to section Temperature shutdown (TSD)  
3
SSC  
RC  
0h  
0h = No switch state change occurred or the status got cleared after  
a READ command was executed on the INT_STAT register.  
1h = Switch state change occurred.  
The Switch State Change (SSC) bit indicates whether input threshold  
crossing has occurred from switch inputs IN0 to IN23. This bit is also  
flagged to logic 1 after the first polling cycle is completed after device  
polling is triggered.  
2
PRTY_FAIL  
RC  
0h  
0h = No parity error occurred in the last received SI stream or the  
error status got cleared after a READ command was executed on the  
INT_STAT register.  
1h = Parity error occurred.  
When the PRTY_FAIL bit is flagged to logic 1, it indicates the last  
SPI responder in (SI) transaction has a parity error. The device uses  
odd parity. If the total number of ones in the received data (including  
the parity bit) is an even number, the received data is discarded. The  
value of this register bit is mirrored to the PRTY_FLAG SPI status  
flag.  
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9-5. INT_STAT Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
1
SPI_FAIL  
RC  
0h  
0h = 32 clock pulse during a CS = low sequence was detected or the  
error status got cleared after a READ command was executed on the  
INT_STAT register.  
1h = SPI error occurred  
When the SPI_FAIL bit is flagged to logic 1, it indicates the last SPI  
responder in (SI) transaction is invalid. To program a complete word,  
32 bits of information must be entered into the device. The SPI logic  
counts the number of bits clocked into the IC and enables data  
latching only if exactly 32 bits have been clocked in. In case the word  
length exceeds or does not meet the required length, the SPI_FAIL  
bit is flagged to logic 1, and the data received is considered invalid.  
The value of this register bit is mirrored to the SPI_FLAG SPI status  
flag. Note the SPI_FAIL bit is not flagged if SCLK is not present.  
0
POR  
RC  
1h  
0h = no Power-On-Reset (POR) event occurred or the status got  
cleared after a READ command was executed on the INT_STAT  
register.  
1h = Power-On-Reset (POR) event occurred.  
The Power-On-Reset (POR) interrupt bit indicates whether a reset  
event has occurred. A reset event sets the registers to their default  
values and re-initializes the device state machine. This bit is  
asserted after a successful power-on-reset, hardware reset, or  
software reset. The value of this register bit is mirrored to the POR  
SPI status flag.  
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9.4.3 CRC Register (Offset = 3h) [reset = FFFFh]  
CRC is shown in 9-5 and described in 9-6.  
Return to Summary Table.  
This register returns the CRC-16-CCCIT calculation result. The microcontroller can compare this value with its  
own calculated value to ensure correct register settings are programmed to the device.  
9-5. CRC Register  
23 22 21 20 19 18 17 16 15 14 13 12  
11  
10  
9
8
7
6
5
4
3
2
1
0
RESERVED  
R-0h  
CRC  
R-FFFFh  
LEGEND: R = Read only  
9-6. CRC Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-16  
RESERVED  
R
0h  
Reserved  
15-0  
CRC  
R
FFFFh  
CRC-16-CCITT calculation result: Bit1: LSB of CRC Bit16: MSB or  
CRC  
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9.4.4 IN_STAT_MISC Register (Offset = 4h) [reset = 0h]  
IN_STAT_MISC is shown in 9-6 and described in 9-7.  
Return to Summary Table.  
This register indicates current device status unrelated to switch input monitoring.  
9-6. IN_STAT_MISC Register  
23  
15  
7
22  
14  
6
21  
13  
5
20  
12  
4
19  
11  
3
18  
10  
17  
9
16  
8
RESERVED  
R-0h  
RESERVED  
R-0h  
2
1
0
RESERVED  
R-0h  
UV_STAT  
R-0h  
OV_STAT  
R-0h  
TW_STAT  
R-0h  
TSD_STAT  
R-0h  
9-7. IN_STAT_MISC Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-4  
3
RESERVED  
UV_STAT  
R
0h  
Reserved  
R
R
R
0h  
0h  
0h  
0h = VS voltage is above the under-voltage condition threshold.  
1h = VS voltage is below the under-voltage condition threshold.  
2
1
OV_STAT  
TW_STAT  
0h = VS voltage is below the over-voltage condition threshold.  
1h = VS voltage is above the over-voltage condition threshold.  
0h = Device junction temperature is below the temperature warning  
threshold TTW  
1h = Device junction temperature is above the temperature warning  
threshold TTW  
.
.
0
TSD_STAT  
R
0h  
0h = Device junction temperature is below the temperature shutdown  
threshold TTSD  
1h = Device junction temperature is above the temperature shutdown  
threshold TTSD  
.
.
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9.4.5 IN_STAT_COMP Register (Offset = 5h) [reset = 0h]  
IN_STAT_COMP is shown in 9-7 and described in 9-8.  
Return to Summary Table.  
This register indicates whether an input is below or above the comparator threshold.  
9-7. IN_STAT_COMP Register  
23  
22  
21  
20  
19  
18  
17  
16  
INC_23  
R-0h  
INC_22  
R-0h  
INC_21  
R-0h  
INC_20  
R-0h  
INC_19  
R-0h  
INC_18  
R-0h  
INC_17  
R-0h  
INC_16  
R-0h  
15  
14  
13  
12  
11  
10  
9
8
INC_15  
R-0h  
INC_14  
R-0h  
INC_13  
R-0h  
INC_12  
R-0h  
INC_11  
R-0h  
INC_10  
R-0h  
INC_9  
R-0h  
INC_8  
R-0h  
7
6
5
4
3
2
1
0
INC_7  
R-0h  
INC_6  
R-0h  
INC_5  
R-0h  
INC_4  
R-0h  
INC_3  
R-0h  
INC_2  
R-0h  
INC_1  
R-0h  
INC_0  
R-0h  
LEGEND: R = Read only  
9-8. IN_STAT_COMP Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23  
INC_23  
R
0h  
0h = Input IN23 is below the comparator threshold.  
1h = Input IN23 is above the comparator threshold.  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
INC_22  
INC_21  
INC_20  
INC_19  
INC_18  
INC_17  
INC_16  
INC_15  
INC_14  
INC_13  
INC_12  
INC_11  
R
R
R
R
R
R
R
R
R
R
R
R
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = Input IN22 is below the comparator threshold.  
1h = Input IN22 is above the comparator threshold.  
0h = Input IN21 is below the comparator threshold.  
1h = Input IN21 is above the comparator threshold.  
0h = Input IN20 is below the comparator threshold.  
1h = Input IN20 is above the comparator threshold.  
0h = Input IN19 is below the comparator threshold.  
1h = Input IN19 is above the comparator threshold.  
0h = Input IN18 is below the comparator threshold.  
1h = Input IN18 is above the comparator threshold.  
0h = Input IN17 is below the comparator threshold.  
1h = Input IN17 is above the comparator threshold.  
0h = Input IN16 is below the comparator threshold.  
1h = Input IN16 is above the comparator threshold.  
0h = Input IN15 is below the comparator threshold.  
1h = Input IN15 is above the comparator threshold.  
0h = Input IN14 is below the comparator threshold.  
1h = Input IN14 is above the comparator threshold.  
0h = Input IN13 is below the comparator threshold.  
1h = Input IN13 is above the comparator threshold.  
0h = Input IN12 is below the comparator threshold.  
1h = Input IN12 is above the comparator threshold.  
0h = Input IN11 is below the comparator threshold.  
1h = Input IN11 is above the comparator threshold.  
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9-8. IN_STAT_COMP Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
10  
INC_10  
R
0h  
0h = Input IN10 is below the comparator threshold.  
1h = Input IN10 is above the comparator threshold.  
9
8
7
6
5
4
3
2
1
0
INC_9  
INC_8  
INC_7  
INC_6  
INC_5  
INC_4  
INC_3  
INC_2  
INC_1  
INC_0  
R
R
R
R
R
R
R
R
R
R
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = Input IN9 is below the comparator threshold.  
1h = Input IN9 is above the comparator threshold.  
0h = Input IN8 is below the comparator threshold.  
1h = Input IN8 is above the comparator threshold.  
0h = Input IN7 is below the comparator threshold.  
1h = Input IN7 is above the comparator threshold.  
0h = Input IN6 is below the comparator threshold.  
1h = Input IN6 is above the comparator threshold.  
0h = Input IN5 is below the comparator threshold.  
1h = Input IN5 is above the comparator threshold.  
0h = Input IN4 is below the comparator threshold.  
1h = Input IN4 is above the comparator threshold.  
0h = Input IN3 is below the comparator threshold.  
1h = Input IN3 is above the comparator threshold.  
0h = Input IN2 is below the comparator threshold.  
1h = Input IN2 is above the comparator threshold.  
0h = Input IN1 is below the comparator threshold.  
1h = Input IN1 is above the comparator threshold.  
0h = Input IN0 is below the comparator threshold.  
1h = Input IN0 is above the comparator threshold.  
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9.4.6 CONFIG Register (Offset = 1Ah) [reset = 0h]  
CONFIG is shown in 9-8 and described in 9-9.  
Return to Summary Table.  
9-8. CONFIG Register  
23  
15  
7
22  
14  
6
21  
20  
19  
18  
17  
16  
RESERVED  
TW_CUR_DIS_  
CSI  
R-0h  
12  
R/W-0h  
8
13  
11  
10  
9
DET_FILTER  
R/W-0h  
TW_CUR_DIS_ INT_CONFIG  
CSO  
TRIGGER  
POLL_EN  
CRC_T  
POLL_ACT_TI  
ME  
R/W-0h  
5
R/W-0h  
4
R/W-0h  
3
R/W-0h  
2
R/W-0h  
1
R/W-0h  
0
POLL_ACT_TIME  
R/W-0h  
POLL_TIME  
R/W-0h  
RESET  
R/W-0h  
LEGEND: R/W = Read/Write  
9-9. CONFIG Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-17  
RESERVED  
R
0h  
Reserved  
16  
TW_CUR_DIS_CSI  
R/W  
0h  
0h = Enable wetting current reduction (to 2 mA) for 10mA and 15mA  
settings upon TW event for all inputs enabled with CSI.  
1h = Disable wetting current reduction (to 2 mA) for 10mA and 15mA  
settings upon TW event for all inputs enabled with CSI.  
15-14  
DET_FILTER  
R/W  
0h  
For detailed descriptions for the detection filter, refer to section  
Detection Filter.  
0h = every sample is valid and taken for threshold evaluation  
1h = 2 consecutive and equal samples required to be valid data  
2h = 3 consecutive and equal samples required to be valid data  
3h = 4 consecutive and equal samples required to be valid data  
13  
12  
TW_CUR_DIS_CSO  
INT_CONFIG  
R/W  
R/W  
0h  
0h  
0h = Enable wetting current reduction (to 2mA) for 10mA and 15mA  
settings upon TW event for all inputs enabled with CSO.  
1h = Disable wetting current reduction (to 2mA) for 10mA and 15mA  
settings upon TW event for all inputs enabled with CSO.  
For detailed descriptions for the INT pin assertion scheme, refer to  
section Interrupt Generation and /INT Assertion.  
0h = INT pin assertion scheme set to static  
1h = INT pin assertion scheme set to dynamic  
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9-9. CONFIG Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
11  
TRIGGER  
R/W  
0h  
When the TRIGGER bit is set to logic 1, normal device operation  
(wetting current activation and polling) starts. To stop device  
operation and keep the device in an idle state, de-assert this bit to 0.  
After device normal operation is triggered, if at any time the device  
setting needs to be re-configured, the microcontroller is required to  
first set the bit TRIGGER to logic 0 to stop device operation. Once  
the re-configuration is completed, the microcontroller can set the  
TRIGGER bit back to logic 1 to re-start device operation. If re-  
configuration is done on the fly without first stopping the device  
operation, false switch status could be reported and accidental  
interrupt might be issued. The following register bits are the  
exception and can be configured when TRIGGER bit is set to logic 1:  
TRIGGER (bit 11 of the CONFIG register)  
CRC_T (bit 9 of the CONFIG register)  
RESET (bit 0 of the CONFIG register)  
The CCP_CFG1 register  
0h = Stop TIC10024-Q1 from normal operation.  
1h = Trigger TIC10024-Q1 normal operation  
10  
9
POLL_EN  
CRC_T  
R/W  
R/W  
0h  
0h  
0h = Polling disabled. Device operates in continuous mode.  
1h = Polling enabled and the device operates in one of the polling  
modes.  
Set this bit to 1 to trigger a CRC calculation on all the configuration  
register bits. Once triggered, it is strongly recommended the SPI  
commander does not change the content of the configuration  
registers until the CRC calculation is completed to avoid erroneous  
CRC calculation result. The TIC10024-Q1 sets the CRC_CALC  
interrupt bit and asserts the INT pin low when the CRC calculation is  
completed. The calculated result will be available in the CRC  
register. This bit self-clears back to 0 after CRC calculation is  
executed.  
0h = no CRC calculation triggered  
1h = trigger CRC calculation  
8-5  
POLL_ACT_TIME  
R/W  
0h  
0h = 64μs  
1h = 128μs  
2h = 192μs  
3h = 256μs  
4h = 320μs  
5h = 384μs  
6h = 448μs  
7h = 512μs  
8h = 640μs  
9h = 768μs  
Ah = 896μs  
Bh = 1024μs  
Ch = 2048μs  
Dh-15h = 512μs (most frequently-used setting)  
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9-9. CONFIG Register Field Descriptions (continued)  
Bit  
Field  
POLL_TIME  
Type  
Reset  
Description  
4-1  
R/W  
0h  
0h = 2ms  
1h = 4ms  
2h = 8ms  
3h = 16ms  
4h = 32ms  
5h = 48ms  
6h = 64ms  
7h = 128ms  
8h = 256ms  
9h = 512ms  
Ah = 1024ms  
Bh = 2048ms  
Ch = 4096ms  
Dh-15h = 8ms (most frequently-used setting)  
0
RESET  
R/W  
0h  
0h = No reset  
1h = Trigger software reset of the device.  
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9.4.7 IN_EN Register (Offset = 1Bh) [reset = 0h]  
IN_EN is shown in 9-9 and described in 9-10.  
Return to Summary Table.  
9-9. IN_EN Register  
23  
22  
21  
20  
19  
18  
17  
16  
IN_EN_23  
R/W-0h  
IN_EN_22  
R/W-0h  
IN_EN_21  
R/W-0h  
IN_EN_20  
R/W-0h  
IN_EN_19  
R/W-0h  
IN_EN_18  
R/W-0h  
IN_EN_17  
R/W-0h  
IN_EN_16  
R/W-0h  
15  
14  
13  
12  
11  
10  
9
8
IN_EN_15  
R/W-0h  
IN_EN_14  
R/W-0h  
IN_EN_13  
R/W-0h  
IN_EN_12  
R/W-0h  
IN_EN_11  
R/W-0h  
IN_EN_10  
R/W-0h  
IN_EN_9  
R/W-0h  
IN_EN_8  
R/W-0h  
7
6
5
4
3
2
1
0
IN_EN_7  
R/W-0h  
IN_EN_6  
R/W-0h  
IN_EN_5  
R/W-0h  
IN_EN_4  
R/W-0h  
IN_EN_3  
R/W-0h  
IN_EN_2  
R/W-0h  
IN_EN_1  
R/W-0h  
IN_EN_0  
R/W-0h  
LEGEND: R/W = Read/Write  
9-10. IN_EN Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23  
IN_EN_23  
R/W  
0h  
0h = Input channel IN23 disabled. Polling sequence skips this  
channel  
1h = Input channel IN23 enabled.  
22  
21  
20  
19  
18  
17  
16  
15  
IN_EN_22  
IN_EN_21  
IN_EN_20  
IN_EN_19  
IN_EN_18  
IN_EN_17  
IN_EN_16  
IN_EN_15  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = Input channel IN22 disabled. Polling sequence skips this  
channel  
1h = Input channel IN22 enabled.  
0h = Input channel IN21 disabled. Polling sequence skips this  
channel  
1h = Input channel IN21 enabled.  
0h = Input channel IN20 disabled. Polling sequence skips this  
channel  
1h = Input channel IN20 enabled.  
0h = Input channel IN19 disabled. Polling sequence skips this  
channel  
1h = Input channel IN19 enabled.  
0h = Input channel IN18 disabled. Polling sequence skips this  
channel  
1h = Input channel IN18 enabled.  
0h = Input channel IN17 disabled. Polling sequence skips this  
channel  
1h = Input channel IN17 enabled.  
0h = Input channel IN16 disabled. Polling sequence skips this  
channel  
1h = Input channel IN16 enabled.  
0h = Input channel IN15 disabled. Polling sequence skips this  
channel  
1h = Input channel IN15 enabled.  
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9-10. IN_EN Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
14  
IN_EN_14  
IN_EN_13  
IN_EN_12  
IN_EN_11  
IN_EN_10  
R/W  
0h  
0h = Input channel IN14 disabled. Polling sequence skips this  
channel  
1h = Input channel IN14 enabled.  
13  
12  
11  
10  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h = Input channel IN13 disabled. Polling sequence skips this  
channel  
1h = Input channel IN13 enabled.  
0h = Input channel IN12 disabled. Polling sequence skips this  
channel  
1h = Input channel IN12 enabled.  
0h = Input channel IN11 disabled. Polling sequence skips this  
channel  
1h = Input channel IN11 enabled.  
0h = Input channel IN10 disabled. Polling sequence skips this  
channel  
1h = Input channel IN10 enabled.  
9
8
7
6
5
4
3
2
1
0
IN_EN_9  
IN_EN_8  
IN_EN_7  
IN_EN_6  
IN_EN_5  
IN_EN_4  
IN_EN_3  
IN_EN_2  
IN_EN_1  
IN_EN_0  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = Input channel IN9 disabled. Polling sequence skips this channel  
1h = Input channel IN9 enabled.  
0h = Input channel IN8 disabled. Polling sequence skips this channel  
1h = Input channel IN8 enabled.  
0h = Input channel IN7 disabled. Polling sequence skips this channel  
1h = Input channel IN7 enabled.  
0h = Input channel IN6 disabled. Polling sequence skips this channel  
1h = Input channel IN6 enabled.  
0h = Input channel IN5 disabled. Polling sequence skips this channel  
1h = Input channel IN5 enabled.  
0h = Input channel IN4 disabled. Polling sequence skips this channel  
1h = Input channel IN4 enabled.  
0h = Input channel IN3 disabled. Polling sequence skips this channel  
1h = Input channel IN3 enabled.  
0h = Input channel IN2 disabled. Polling sequence skips this channel  
1h = Input channel IN2 enabled.  
0h = Input channel IN1 disabled. Polling sequence skips this channel  
1h = Input channel IN1 enabled.  
0h = Input channel IN0 disabled. Polling sequence skips this channel  
1h = Input channel IN0 enabled.  
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9.4.8 CS_SELECT Register (Offset = 1Ch) [reset = 0h]  
CS_SELECT is shown in 9-10 and described in 9-11.  
Return to Summary Table.  
9-10. CS_SELECT Register  
23  
22  
21  
20  
19  
18  
RESERVED  
R-0h  
17  
16  
15  
14  
13  
1
12  
0
11  
10  
9
8
7
6
5
4
3
2
RESERVED  
R-0h  
CS_IN9  
R/W-0h  
CS_IN8  
R/W-0h  
CS_IN7  
R/W-0h  
CS_IN6  
R/W-0h  
CS_IN5  
R/W-0h  
CS_IN4  
R/W-0h  
CS_IN3  
R/W-0h  
CS_IN2  
R/W-0h  
CS_IN1  
R/W-0h  
CS_IN0  
R/W-0h  
LEGEND: R/W = Read/Write; R = Read only  
9-11. CS_SELECT Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-10  
RESERVED  
R
0h  
Reserved  
9
8
7
6
5
4
3
2
1
0
CS_IN9  
CS_IN8  
CS_IN7  
CS_IN6  
CS_IN5  
CS_IN4  
CS_IN3  
CS_IN2  
CS_IN1  
CS_IN0  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
0h = Current Source (CSO) selected  
1h = Current Sink (CSI) selected  
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9.4.9 WC_CFG0 Register (Offset = 1Dh) [reset = 0h]  
WC_CFG0 is shown in 9-11 and described in 9-12.  
Return to Summary Table.  
9-11. WC_CFG0 Register  
23  
11  
22  
21  
9
20  
8
19  
18  
17  
16  
WC_IN8_IN9  
R/W-0h  
15  
3
14  
2
13  
WC_IN6_IN7  
R/W-0h  
12  
0
WC_IN11  
R/W-0h  
10  
WC_IN10  
R/W-0h  
7
6
5
4
1
WC_IN5  
R/W-0h  
WC_IN4  
R/W-0h  
WC_IN2_IN3  
R/W-0h  
WC_IN0_IN1  
R/W-0h  
LEGEND: R/W = Read/Write  
9-12. WC_CFG0 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-21  
WC_IN11  
R/W  
0h  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
20-18  
17-15  
14-12  
11-9  
WC_IN10  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
WC_IN8_IN9  
WC_IN6_IN7  
WC_IN5  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
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9-12. WC_CFG0 Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
8-6  
WC_IN4  
R/W  
0h  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
5-3  
2-0  
WC_IN2_IN3  
WC_IN0_IN1  
R/W  
R/W  
0h  
0h  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
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9.4.10 WC_CFG1 Register (Offset = 1Eh) [reset = 0h]  
WC_CFG1 is shown in 9-12 and described in 9-13.  
Return to Summary Table.  
9-12. WC_CFG1 Register  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
12  
RESERV AUTO_S AUTO_S  
WC_IN23  
WC_IN22  
WC_IN20_IN21  
ED  
CALE_DI CALE_DI  
S_CSI  
S_CSO  
R/W-0h  
9
R-0h  
11  
R/W-0h  
R/W-0h  
7
R/W-0h  
4
R/W-0h  
1
10  
8
6
5
3
2
0
WC_IN18_IN19  
R/W-0h  
WC_IN16_IN17  
R/W-0h  
WC_IN14_IN15  
R/W-0h  
WC_IN12_IN13  
R/W-0h  
LEGEND: R/W = Read/Write; R = Read only  
9-13. WC_CFG1 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23  
RESERVED  
R
0h  
Reserved  
22  
AUTO_SCALE_DIS_CSI R/W  
0h  
0h = Enable wetting current auto-scaling (to 2mA) in continuous  
mode for 10mA and 15mA settings upon switch closure for all inputs  
enabled with CSI  
1h = Disable wetting current auto-scaling (to 2mA) in continuous  
mode for 10mA and 15mA settings upon switch closure for all inputs  
enabled with CS  
For detailed descriptions for the wetting current auto-scaling, refer to  
section Wetting Current Auto-Scaling.  
21  
AUTO_SCALE_DIS_CSO R/W  
0h  
0h = Enable wetting current auto-scaling (to 2mA) in continuous  
mode for 10mA and 15mA settings upon switch closure for all inputs  
enabled with CSO  
1h = Disable wetting current auto-scaling (to 2mA) in continuous  
mode for 10mA and 15mA settings upon switch closure for all inputs  
enabled with CSO  
For detailed descriptions for the wetting current auto-scaling, refer to  
section Wetting Current Auto-Scaling.  
20-18  
17-15  
WC_IN23  
WC_IN22  
R/W  
R/W  
0h  
0h  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
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9-13. WC_CFG1 Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
14-12  
WC_IN20_IN21  
R/W  
0h  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
11-9  
8-6  
5-3  
2-0  
WC_IN18_IN19  
WC_IN16_IN17  
WC_IN14_IN15  
WC_IN12_IN13  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
0h = no wetting current  
1h = 1mA (typ.) wetting current  
2h = 2mA (typ.) wetting current  
3h = 5mA (typ.) wetting current  
4h = 10mA (typ.) wetting current  
5h-7h = 15mA (typ.) wetting current  
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9.4.11 CCP_CFG0 Register (Offset = 1Fh) [reset = 0h]  
CCP_CFG0 is shown in 9-13 and described in 9-14.  
Return to Summary Table.  
9-13. CCP_CFG0 Register  
23  
11  
22  
10  
21  
20  
8
19  
18  
RESERVED  
R-0h  
17  
16  
15  
3
14  
2
13  
1
12  
0
9
7
6
5
4
RESERVED  
CCP_TIME  
WC_CCP WC_CCP WC_CCP WC_CCP  
3
2
1
0
R-0h  
R-0h  
R-0h  
R-0h  
R-0h  
R-0h  
LEGEND: R/W = Read/Write; R = Read only  
9-14. CCP_CFG0 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-7  
RESERVED  
R
0h  
Reserved  
6-4  
CCP_TIME  
R/W  
0h  
Wetting current activation time in CCP mode  
0h = 64μs  
1h = 128μs  
2h = 192μs  
3h = 256μs  
4h = 320μs  
5h = 384μs  
6h = 448μs  
7h = 512μs  
3
2
1
0
WC_CCP3  
WC_CCP2  
WC_CCP1  
WC_CCP0  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
Wetting current setting for IN18 to IN23 in CCP mode  
0h = 10mA (typ.) wetting current  
1h = 15mA (typ.) wetting current  
Wetting current setting for IN12 to IN17 in CCP mode  
0h = 10mA (typ.) wetting current  
1h = 15mA (typ.) wetting current  
Wetting current setting for IN6 to IN11 in CCP mode  
0h = 10mA (typ.) wetting current  
1h = 15mA (typ.) wetting current  
Wetting current setting for IN0 to IN5 in CCP mode  
0h = 10mA (typ.) wetting current  
1h = 15mA (typ.) wetting current  
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9.4.12 CCP_CFG1 Register (Offset = 20h) [reset = 0h]  
CCP_CFG1 is shown in 9-14 and described in 9-15.  
Return to Summary Table.  
9-14. CCP_CFG1 Register  
23  
22  
21  
20  
19  
18  
17  
16  
CCP_IN23  
R/W-0h  
CCP_IN22  
R/W-0h  
CCP_IN21  
R/W-0h  
CCP_IN20  
R/W-0h  
CCP_IN19  
R/W-0h  
CCP_IN18  
R/W-0h  
CCP_IN17  
R/W-0h  
CCP_IN16  
R/W-0h  
15  
14  
13  
12  
11  
10  
9
8
CCP_IN15  
R/W-0h  
CCP_IN14  
R/W-0h  
CCP_IN13  
R/W-0h  
CCP_IN12  
R/W-0h  
CCP_IN11  
R/W-0h  
CCP_IN10  
R/W-0h  
CCP_IN9  
R/W-0h  
CCP_IN8  
R/W-0h  
7
6
5
4
3
2
1
0
CCP_IN7  
R/W-0h  
CCP_IN6  
R/W-0h  
CCP_IN5  
R/W-0h  
CCP_IN4  
R/W-0h  
CCP_IN3  
R/W-0h  
CCP_IN2  
R/W-0h  
CCP_IN1  
R/W-0h  
CCP_IN0  
R/W-0h  
LEGEND: R/W = Read/Write  
9-15. CCP_CFG1 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23  
CCP_IN23  
R/W  
0h  
0h = no CCP wetting current  
1h = CCP wetting current activated  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
10  
CCP_IN22  
CCP_IN21  
CCP_IN20  
CCP_IN19  
CCP_IN18  
CCP_IN17  
CCP_IN16  
CCP_IN15  
CCP_IN14  
CCP_IN13  
CCP_IN12  
CCP_IN11  
CCP_IN10  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
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9-15. CCP_CFG1 Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
9
CCP_IN9  
CCP_IN8  
CCP_IN7  
CCP_IN6  
CCP_IN5  
CCP_IN4  
CCP_IN3  
CCP_IN2  
CCP_IN1  
CCP_IN0  
R/W  
0h  
0h = no CCP wetting current  
1h = CCP wetting current activated  
8
7
6
5
4
3
2
1
0
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
0h = no CCP wetting current  
1h = CCP wetting current activated  
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9.4.13 THRES_COMP Register (Offset = 21h) [reset = 0h]  
THRES_COMP is shown in 9-15 and described in 9-16.  
Return to Summary Table.  
9-15. THRES_COMP Register  
23  
15  
7
22  
14  
6
21  
13  
5
20  
12  
4
19  
18  
10  
17  
9
16  
8
RESERVED  
R-0h  
11  
RESERVED  
R-0h  
THRES_COMP_IN20_IN23  
R/W-0h  
THRES_COMP_IN16_IN19  
R/W-0h  
3
2
1
0
THRES_COMP_IN12_IN15  
R/W-0h  
THRES_COMP_IN8_IN11  
R/W-0h  
THRES_COMP_IN4_IN7  
R/W-0h  
THRES_COMP_IN0_IN3  
R/W-0h  
LEGEND: R/W = Read/Write; R = Read only  
9-16. THRES_COMP Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-12  
RESERVED  
R
0h  
Reserved  
11-10  
THRES_COMP_IN20_IN2 R/W  
3
0h  
0h  
0h  
0h  
0h  
These 2 bits configures the comparator thresholds for input channels  
IN20 to IN23  
0h = comparator threshold set to 2V  
1h = comparator threshold set to 2.7V  
2h = comparator threshold set to 3V  
3h = comparator threshold set to 4V  
9-8  
THRES_COMP_IN16_IN1 R/W  
9
These 2 bits configures the comparator thresholds for input channels  
IN16 to IN19  
0h = comparator threshold set to 2V  
1h = comparator threshold set to 2.7V  
2h = comparator threshold set to 3V  
3h = comparator threshold set to 4V  
7-6  
THRES_COMP_IN12_IN1 R/W  
5
These 2 bits configures the comparator thresholds for input channels  
IN12 to IN15  
0h = comparator threshold set to 2V  
1h = comparator threshold set to 2.7V  
2h = comparator threshold set to 3V  
3h = comparator threshold set to 4V  
5-4  
THRES_COMP_IN8_IN11 R/W  
These 2 bits configures the comparator thresholds for input channels  
IN8 to IN11  
0h = comparator threshold set to 2V  
1h = comparator threshold set to 2.7V  
2h = comparator threshold set to 3V  
3h = comparator threshold set to 4V  
3-2  
THRES_COMP_IN4_IN7 R/W  
These 2 bits configures the comparator thresholds for input channels  
IN4 to IN7  
0h = comparator threshold set to 2V  
1h = comparator threshold set to 2.7V  
2h = comparator threshold set to 3V  
3h = comparator threshold set to 4V  
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9-16. THRES_COMP Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
1-0  
THRES_COMP_IN0_IN3 R/W  
0h  
These 2 bits configures the comparator thresholds for input channels  
IN0 to IN3  
0h = comparator threshold set to 2V  
1h = comparator threshold set to 2.7V  
2h = comparator threshold set to 3V  
3h = comparator threshold set to 4V  
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9.4.14 INT_EN_COMP1 Register (Offset = 22h) [reset = 0h]  
INT_EN_COMP1 is shown in 9-16 and described in 9-17.  
Return to Summary Table.  
9-16. INT_EN_COMP1 Register  
23  
INC_EN_11  
R/W-0h  
22  
21  
INC_EN_10  
R/W-0h  
20  
19  
INC_EN_9  
R/W-0h  
18  
17  
INC_EN_8  
R/W-0h  
16  
15  
INC_EN_7  
R/W-0h  
14  
13  
12  
INC_EN_6  
R/W-0h  
11  
10  
9
8
7
6
5
4
3
2
1
0
INC_EN_5  
R/W-0h  
INC_EN_4  
R/W-0h  
INC_EN_3  
R/W-0h  
INC_EN_2  
R/W-0h  
INC_EN_1  
R/W-0h  
INC_EN_0  
R/W-0h  
LEGEND: R/W = Read/Write  
9-17. INT_EN_COMP1 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-22  
INC_EN_11  
R/W  
0h  
0h = no interrupt generation for IN11  
1h = interrupt generation on rising edge above  
THRES_COMP_IN8_IN11 for IN11  
2h = interrupt generation on falling edge below  
THRES_COMP_IN8_IN11 for IN11  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN8_IN11 for IN11  
21-20  
19-18  
17-16  
15-14  
INC_EN_10  
INC_EN_9  
INC_EN_8  
INC_EN_7  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h = no interrupt generation for IN10  
1h = interrupt generation on rising edge above  
THRES_COMP_IN8_IN11 for IN10  
2h = interrupt generation on falling edge below  
THRES_COMP_IN8_IN11 for IN10  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN8_IN11 for IN10  
0h = no interrupt generation for IN9  
1h = interrupt generation on rising edge above  
THRES_COMP_IN8_IN11 for IN9  
2h = interrupt generation on falling edge below  
THRES_COMP_IN8_IN11 for IN9  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN8_IN11 for IN9  
0h = no interrupt generation for IN8  
1h = interrupt generation on rising edge above  
THRES_COMP_IN8_IN11 for IN8  
2h = interrupt generation on falling edge below  
THRES_COMP_IN8_IN11 for IN8  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN8_IN11 for IN8  
0h = no interrupt generation for IN7  
1h = interrupt generation on rising edge above  
THRES_COMP_IN4_IN7 for IN7  
2h = interrupt generation on falling edge below  
THRES_COMP_IN4_IN7 for IN7  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN4_IN7 for IN7  
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9-17. INT_EN_COMP1 Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
13-12  
INC_EN_6  
INC_EN_5  
INC_EN_4  
INC_EN_3  
INC_EN_2  
INC_EN_1  
INC_EN_0  
R/W  
0h  
0h = no interrupt generation for IN6  
1h = interrupt generation on rising edge above  
THRES_COMP_IN4_IN7 for IN6  
2h = interrupt generation on falling edge below  
THRES_COMP_IN4_IN7 for IN6  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN4_IN7 for IN6  
11-10  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h = no interrupt generation for IN5  
1h = interrupt generation on rising edge above  
THRES_COMP_IN4_IN7 for IN5  
2h = interrupt generation on falling edge below  
THRES_COMP_IN4_IN7 for IN5  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN4_IN7 for IN5  
9-8  
0h = no interrupt generation for IN4  
1h = interrupt generation on rising edge above  
THRES_COMP_IN4_IN7 for IN4  
2h = interrupt generation on falling edge below  
THRES_COMP_IN4_IN7 for IN4  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN4_IN7 for IN4  
7-6  
0h = no interrupt generation for IN3  
1h = interrupt generation on rising edge above  
THRES_COMP_IN0_IN3 for IN3  
2h = interrupt generation on falling edge below  
THRES_COMP_IN0_IN3 for IN3  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN0_IN3 for IN3  
5-4  
0h = no interrupt generation for IN2  
1h = interrupt generation on rising edge above  
THRES_COMP_IN0_IN3 for IN2  
2h = interrupt generation on falling edge below  
THRES_COMP_IN0_IN3 for IN2  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN0_IN3 for IN2  
3-2  
0h = no interrupt generation for IN1  
1h = interrupt generation on rising edge above  
THRES_COMP_IN0_IN3 for IN1  
2h = interrupt generation on falling edge below  
THRES_COMP_IN0_IN3 for IN1  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN0_IN3 for IN1  
1-0  
0h = no interrupt generation for IN0  
1h = interrupt generation on rising edge above  
THRES_COMP_IN0_IN3 for IN0  
2h = interrupt generation on falling edge below  
THRES_COMP_IN0_IN3 for IN0  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN0_IN3 for IN0  
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9.4.15 INT_EN_COMP2 Register (Offset = 23h) [reset = 0h]  
INT_EN_COMP2 is shown in 9-17 and described in 9-18.  
Return to Summary Table.  
9-17. INT_EN_COMP2 Register  
23  
INC_EN_23  
R/W-0h  
22  
21  
INC_EN_22  
R/W-0h  
20  
19  
INC_EN_21  
R/W-0h  
18  
17  
INC_EN_20  
R/W-0h  
16  
15  
INC_EN_19  
R/W-0h  
14  
13  
12  
INC_EN_18  
R/W-0h  
11  
10  
9
8
7
6
5
4
3
2
1
0
INC_EN_17  
R/W-0h  
INC_EN_16  
R/W-0h  
INC_EN_15  
R/W-0h  
INC_EN_14  
R/W-0h  
INC_EN_13  
R/W-0h  
INC_EN_12  
R/W-0h  
LEGEND: R/W = Read/Write  
9-18. INT_EN_COMP2 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-22  
INC_EN_23  
R/W  
0h  
0h = no interrupt generation for IN23  
1h = interrupt generation on rising edge above  
THRES_COMP_IN20_IN23 for IN23  
2h = interrupt generation on falling edge below  
THRES_COMP_IN20_IN23 for IN23  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN20_IN23 for IN23  
21-20  
19-18  
17-16  
15-14  
INC_EN_22  
INC_EN_21  
INC_EN_20  
INC_EN_19  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h = no interrupt generation for IN22  
1h = interrupt generation on rising edge above  
THRES_COMP_IN20_IN23 for IN22  
2h = interrupt generation on falling edge below  
THRES_COMP_IN20_IN23 for IN22  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN20_IN23 for IN22  
0h = no interrupt generation for IN21  
1h = interrupt generation on rising edge above  
THRES_COMP_IN20_IN23 for IN21  
2h = interrupt generation on falling edge below  
THRES_COMP_IN20_IN23 for IN21  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN20_IN23 for IN21  
0h = no interrupt generation for IN20  
1h = interrupt generation on rising edge above  
THRES_COMP_IN20_IN23 for IN20  
2h = interrupt generation on falling edge below  
THRES_COMP_IN20_IN23 for IN20  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN20_IN23 for IN20  
0h = no interrupt generation for IN19  
1h = interrupt generation on rising edge above  
THRES_COMP_IN16_IN19 for IN19  
2h = interrupt generation on falling edge below  
THRES_COMP_IN16_IN19 for IN19  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN16_IN19 for IN19  
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9-18. INT_EN_COMP2 Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
13-12  
INC_EN_18  
INC_EN_17  
INC_EN_16  
INC_EN_15  
INC_EN_14  
INC_EN_13  
INC_EN_12  
R/W  
0h  
0h = no interrupt generation for IN18  
1h = interrupt generation on rising edge above  
THRES_COMP_IN16_IN19 for IN18  
2h = interrupt generation on falling edge below  
THRES_COMP_IN16_IN19 for IN18  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN16_IN19 for IN18  
11-10  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h = no interrupt generation for IN17  
1h = interrupt generation on rising edge above  
THRES_COMP_IN16_IN19 for IN17  
2h = interrupt generation on falling edge below  
THRES_COMP_IN16_IN19 for IN17  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN16_IN19 for IN17  
9-8  
0h = no interrupt generation for IN16  
1h = interrupt generation on rising edge above  
THRES_COMP_IN16_IN19 for IN16  
2h = interrupt generation on falling edge below  
THRES_COMP_IN16_IN19 for IN16  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN16_IN19 for IN16  
7-6  
0h = no interrupt generation for IN15  
1h = interrupt generation on rising edge above  
THRES_COMP_IN12_IN15 for IN15  
2h = interrupt generation on falling edge below  
THRES_COMP_IN12_IN15 for IN15  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN12_IN15 for IN15  
5-4  
0h = no interrupt generation for IN14  
1h = interrupt generation on rising edge above  
THRES_COMP_IN12_IN15 for IN14  
2h = interrupt generation on falling edge below  
THRES_COMP_IN12_IN15 for IN14  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN12_IN15 for IN14  
3-2  
0h = no interrupt generation for IN13  
1h = interrupt generation on rising edge above  
THRES_COMP_IN12_IN15 for IN13  
2h = interrupt generation on falling edge below  
THRES_COMP_IN12_IN15 for IN13  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN12_IN15 for IN13  
1-0  
0h = no interrupt generation for IN12  
1h = interrupt generation on rising edge above  
THRES_COMP_IN12_IN15 for IN12  
2h = interrupt generation on falling edge below  
THRES_COMP_IN12_IN15 for IN12  
3h = interrupt generation on falling and rising edge of  
THRES_COMP_IN12_IN15 for IN12  
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9.4.16 INT_EN_CFG0 Register (Offset = 24h) [reset = 0h]  
INT_EN_CFG0 is shown in 9-18 and described in 9-19.  
Return to Summary Table.  
9-18. INT_EN_CFG0 Register  
23  
15  
7
22  
21  
20  
12  
4
19  
18  
10  
17  
9
16  
8
RESERVED  
R-0h  
14  
13  
11  
RESERVED  
R-0h  
6
5
3
2
1
0
CRC_CALC_E  
N
UV_EN  
OV_EN  
TW_EN  
TSD_EN  
SSC_EN  
PRTY_FAIL_EN SPI_FAIL_EN  
R/W-0h  
R/W-0h  
R/W-0h  
R/W-0h  
R/W-0h  
R/W-0h  
R/W-0h R/W-0h  
LEGEND: R/W = Read/Write; R = Read only  
9-19. INT_EN_CFG0 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
23-8  
RESERVED  
R
0h  
Reserved  
7
6
5
4
3
2
1
0
CRC_CALC_EN  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h  
0h = INT pin assertion due to CRC calculation completion disabled.  
1h = INT pin assertion due to CRC calculation completion enabled.  
UV_EN  
0h = INT pin assertion due to UV event disabled.  
1h = INT pin assertion due to UV event enabled.  
OV_EN  
0h = INT pin assertion due to OV event disabled.  
1h = INT pin assertion due to OV event enabled.  
TW_EN  
0h = INT pin assertion due to TW event disabled.  
1h = INT pin assertion due to TW event enabled.  
TSD_EN  
0h = INT pin assertion due to TSD event disabled.  
1h = INT pin assertion due to TSD event enabled.  
SSC_EN  
0h = INT pin assertion due to SSC event disabled.  
1h = INT pin assertion due to SSC event enabled.  
PRTY_FAIL_EN  
SPI_FAIL_EN  
0h = INT pin assertion due to parity fail event disabled.  
1h = INT pin assertion due to parity fail event enabled.  
0h = INT pin assertion due to SPI fail event disabled.  
1h = INT pin assertion due to SPI fail event enabled.  
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10 Application and Implementation  
备注  
Information in the following applications sections is not part of the TI component specification, and TI  
does not warrant its accuracy or completeness. TIs customers are responsible for determining  
suitability of components for their purposes. Customers should validate and test their design  
implementation to confirm system functionality.  
10.1 Application Information  
The TIC10024-Q1 is an advanced 24-input Multiple Switch Detection Interface (MSDI) device designed to detect  
external mechanical switch status in a 12-V automotive system by acting as an interface between the switches  
and the low- voltage microcontroller. The device offers a number of unique features to replace systems  
implemented with discrete components, saving board space and reducing the bill of materials (BOM). The device  
can also be configured into low-power polling mode, which provides significant savings on system power  
consumption.  
10.2 Digital Switch Detection in Automotive Body Control Module  
The body control module (BCM) is an electronic control unit responsible for monitoring and controlling various  
electronic accessories in a vehicle body. Detection of various mechanical switches status in a vehicle is one  
important task handled by the BCM. Most switches inside the BCM are digital in nature, meaning they have  
either an ON or an OFF state. The TIC10024-Q1 can detect up to 24 digital switches. The following application  
diagram depicts how the TIC10024-Q1 is used in a BCM to detect an external digital switch and a detailed  
design example is shown in the following sections.  
VBAT  
Voltage  
Regulator  
GND  
VS  
VS  
VDD  
VDD  
/INT  
RESD  
/INT  
/CS  
INx  
/CS  
CESD  
SW  
SCLK  
SI  
SCLK  
MOSI  
MISO  
SO  
TIC10024-Q1  
MCU  
Body Control Module  
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10-1. Using TIC10024-Q1 to Monitor a Digital Switch in Body Control Module Application  
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10.2.1 Design Requirements  
10-1. Example Digital Switch Specification  
PARAMETER  
SPECIFICATION  
7 V VBAT 16 V  
0 V VDIODE 1 V  
50 Ω± 8%  
MIN  
MAX  
16 V  
1 V  
VBAT  
7 V  
VDIODE (voltage drop across the reverse-blocking diode)  
RESD  
0 V  
46 Ω  
54 Ω  
220 ΩMax when  
closed ± 8%  
RSW  
0 Ω  
237.6 Ω  
RDIRT  
5000 ΩMin  
5000 Ω  
Wetting current requirement  
10mA Typical  
An example of digital switch connected to ground shown in 10-1, with 10-1 summarizing its detailed  
requirements. The goal of this design is to utilize the TIC10024-Q1s integrated comparator to detect and  
differentiate between the 2 switch states:  
1. State 1: SW open  
2. State 2: SW closed  
To mimic real automotive systems, the battery is assumed to be fluctuating between 7 V and 16 V. Taking into  
account the voltage drop across the reverse-blocking diode, the VS supply voltage to the TIC10024-Q1 device  
can fluctuate between 6 V and 16 V. RDIRT is introduced to model the small leakage flowing across the switch in  
open state. When the switch changes position and the switch state changes from one to another, the TIC10024-  
Q1 is required to correctly detect the state transition and issue an interrupt to alert the microcontroller. The  
switch information needs to be stored in the status registers for the microcontroller to retrieve.  
10.2.2 Detailed Design Procedure  
10-2. Detailed Design Procedure  
STEP 1  
STEP 2  
VINX (V)  
Equivalent Resistance Value (Ω)  
MIN  
5000  
0
MAX  
MIN  
>10  
0
MAX  
-
State 1: SW open  
State 2: SW closed  
291.6  
3.32  
Use the following procedures to calculate thresholds to program to the TIC10024-Q1 for proper switch detection:  
1. Calculate the equivalent resistance values at the 2 switch states, taking into account RDIRT and the 8%  
resistance variation.  
2. Estimate the voltage established when wetting current flows through the switch by utilizing the relationship  
VINX = RSW_EQU × IWETT_ACT, where RSW _EQU is the equivalent switch resistance value and IWETT_ACT is the  
actual wetting current flowing through the switch. The 10 mA wetting current setting is selected in this design  
as required by the specification. The wetting current variation, however, can occur depending on  
manufacturing process variation and operating temperature, and needs to be taken into account. Referring  
to the electrical table of the TIC10024-Q1 and assuming enough headroom for the current source (CSO) to  
operate, the 10mA wetting current setting produces current ranging between 8.4 mA and 11.4 mA (for 6 V ≤  
VS 35 V condition). The voltage established on the TIC10024-Q1 input pin (VINX) can be calculated  
accordingly.  
3. After the VINX voltage is calculated for the 2 switch states, the proper threshold value needs to be chosen  
between minimum VINX voltage of state 1 (>10 V) and maximum VINX voltage of state 2 (3.32 V). The  
TIC10024-Q1 has 4 thresholds that can be configured for the comparator: 2 V, 2.7 V, 3 V, and 4 V. As a  
result, the proper threshold to be used in this design example is 4 V.  
4. To properly program the device, follow the below recommend procedure:  
Enable channel IN0 by setting IN_EN_0 bit to 1 in the IN_EN register  
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Program the wetting current to source by setting CS_IN0 bit to 0 in the CS SELECT register  
Program the wetting current to 10 mA by configuring WC_IN0_IN1 bits to 100 in the WC_CFG0 register  
Disable wetting current auto-scaling by setting AUTO_SCALE_DIS_CSO bit in WC_CFG1 register to 1  
Program the comparator threshold to 4 V by setting the THRES_COMP_IN0_IN3 bits to 11 in the  
THRES_COMP register  
Program interrupt generation to both rising and falling transitions by setting the INC_EN_0 bits to 11 in  
the INT_EN_COMP1 register  
Enable interrupt generation from switch state change by setting the SSC bit to 1 in the INT_EN_CFG0  
register  
Program the CONFIG register: Keep the device in continuous mode by setting the POLL_EN bit to 0.  
Start device operation by setting the TRIGGER bit to 1.  
Read the INT_STAT register to clear the baseline SSC interrupt once the interrupt is observed.  
Toggle the external switch open and monitor the INT pin. Read the INT_STAT register and  
IN_STATE_COMP register to make sure the correct switch status is reported.  
10.2.3 Application Curves  
10-2 is the scope shot showing the switch getting toggled from close to open at time a). Before toggling, the  
voltage at VIN0 stays low at roughly 2.7 V. Once the switch opens, the voltage at VIN0 gets pulled high to the VS  
voltage. The INT pin is asserted shortly after the switch toggles at time b) to notify the microcontroller a switch  
state change event has occurred.  
10-2. Measured Waveform Showing VIN0 Pin and INT Pin Voltages  
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10.3 Systems Examples  
10.3.1 Using TIC10024-Q1 in a 12 V Automotive System  
US  
Voltage  
Regulator  
GND  
12-V  
Automotive  
Battery  
VS  
VS  
VDD  
VDD  
/INT  
/INT  
/CS  
INx  
/CS  
SCLK  
SI  
SCLK  
MOSI  
MISO  
SO  
AGND DGND EP  
MCU  
TIC10024-Q1  
Body Control Module  
Copyright © 2016, Texas Instruments Incorporated  
10-3. Typical System Diagram of Battery Connections for TIC10024-Q1  
The TIC10024-Q1 is designed to operate with a 12 V automotive system. 10-3 depicts a typical system  
diagram to show how the device is connected to the battery. Please remember to be careful when connecting  
the battery directly to the device on the VS supply pin (through a reverse-blocking diode) or the input (INX) pins  
since an automotive battery can be subjected to various transient and over-voltage events. Manufacturers have  
independently created standards and test procedures in an effort to prevent sensitive electronics from failing due  
to these events. Recently, combined efforts are made with ISO to develop the ISO 16750-2 standard (Road  
vehicles -- Environmental conditions and testing for electrical and electronic equipment -- Part 2: Electrical  
loads), which describe the possible transients that could occur to an automotive battery and specify test methods  
to simulate them.  
It shall be noted that the TIC10024-Q1 is designed and tested according to the ISO 16750-2 standard. A few  
voltage stress tests and their test conditions are listed below. Exposing the device to more severe transient  
events than described by the standard can potentially causes performance degradation and long-term damage  
to the device.  
Direct current supply voltage: VBAT, min = 6 V; VBAT, max= 16 V  
To emulate a jump start event, voltage profile described in 10-4 is used.  
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VBAT  
VBAT, max  
VBAT, min  
tr  
t1  
tf  
t
10-4. Voltage Profile to Test a Jump Start Event  
10-3. Voltage Profile Parameters to Test a Jump Start Event  
Parameter  
Value  
VBAT, min  
10.8 V  
VBAT, max  
24 V  
tr  
t1  
tf  
< 10 ms  
60 s ± 6 s  
< 10 ms  
Number of cycles  
1
To emulate a load dump event for an alternator with centralized load dump suppression, voltage profile  
described in 10-5 is used. UA and US* are applied directly to VBAT  
.
10-5. Voltage Profile to Test a Load Dump Event With Centralized Load Dump Suppression  
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10-4. Voltage Profile to Test a Load Dump Event With Centralized Load Dump Suppression  
Parameter  
Value  
UA  
13.5 V  
US  
79 V US 101  
35 V  
US*  
td  
40 ms td 400 ms  
< 10 ms  
tr  
Number of cycles  
5 pulses at intervals of 1 min  
To emulate a cranking event, voltage profile describe in 10-6 is used. US, US6, and UA are applied directly to  
VBAT  
.
10-6. Voltage Profile to Test a Cranking Event  
10-5. Voltage Profile Used to Test a Cranking Event  
Parameter  
Value - Level I  
Value - Level II  
Value - Level IV  
6 V  
US6  
US  
UB  
tf  
8 V  
4.5 V  
9.5 V  
6.5 V  
6.5 V  
14 V ± 0.2 V  
5 ms ± 0.5 ms  
15 ms ± 1.5 ms  
50 ms ± 5 ms  
1000 ms ± 100 ms  
40 ms ± 4 ms  
14 V ± 0.2 V  
5 ms ± 0.5 ms  
15 ms ± 1.5 ms  
50 ms ± 5 ms  
10000 ms ± 1000 ms  
100 ms ± 10 ms  
14 V ± 0.2 V  
5 ms ± 0.5 ms  
15 ms ± 1.5 ms  
50 ms ± 5 ms  
10000 ms ± 1000 ms  
100 ms ± 10 ms  
t6  
t7  
t8  
tr  
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11 Power Supply Recommendations  
There are two supply input pins for the TIC10024-Q1: VS and VDD. VS is the main power supply for the entire  
chip and is essential for all critical functions of the device. The VS supply is designed to be connected to a 12-V  
automotive battery (through a reverse blocking diode) with nominal operating voltage no greater than 16V. The  
VDD supply is used to determine the logic level on the SPI communication interface, source the current for the  
SO driver, and sets the pull-up voltage for the /CS pin. It can also be used as a possible external pull-up supply  
for the /INT pin as an alternative to the VS supply and it shall be connected to a 3 V to 5.5 V logic supply.  
Removing VDD from the device disables SPI communications, but does not impact normal operation of the  
device.  
To improve stability of the supply inputs, some decoupling capacitors are recommended on the PCB. 11-1  
shows an example on the on-board power supply decoupling scheme. The battery voltage (VBAT) is decoupled  
on the Electronic Control Unit (ECU) board using a large decoupling capacitor (CBUFF). The diode is installed to  
prevent damage to the internal system under reversed battery condition. CVS shall be installed close to the  
TIC10024-Q1 for best decoupling performance. The voltage regulator provides a regulated voltage for the digital  
portion of the device and for the local microcontroller and its output is decoupled with CDECOUPLE. 11-1 lists  
recommended values for each individual decoupling capacitor shown in the system diagram.  
11-1. Decoupling Capacitor Recommendations  
CRC RULE  
VALUE  
CBUFF  
100 μF, 50 V rated, ±20%  
100 nF, 50V rated, ±10%; X7R  
100 nF, 50 V rated  
CVBAT  
CVS  
CDECOUPLE  
100 nF~1 μF  
ECU  
connector  
VBAT  
Voltage  
Regulator  
CDECOUPLE  
GND  
CVBAT CBUFF  
CVS  
37  
38  
VS  
VS  
VDD 19  
VDD  
TIC10024-Q1  
MCU  
Electronic Control Unit (ECU)  
Copyright © 2016, Texas Instruments Incorporated  
11-1. Recommended Power Supply Decoupling  
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12 Layout  
12.1 Layout Guidelines  
1. 12-1 illustrates an example of a PCB layout with the TIC10024-Q1. Some key considerations are:  
2. Decouple the VS and VDD pins with capacitor using recommended values from section Power Supply  
Recommendations and place them as close to the pin as possible. Make sure that the capacitor voltage  
rating is sufficient for the VS and VDD supplies.  
3. Keep the input lines as short as possible.  
4. Use a solid ground plane to help distribute heat and reduce electromagnetic interference (EMI) noise pickup.  
5. Do not run sensitive analog traces in parallel with digital traces. Avoid crossing digital and analog traces if  
possible, and only make perpendicular crossings when necessary.  
6. To achieve good thermal performance, the exposed thermal pad underneath the device must be soldered to  
the board and flooded with vias to ground planes. For simple double-sided PCBs where there are no internal  
layers, the surface layers can be used to remove heat. For multilayer PCBs, internal ground planes can be  
used for heat removal.  
7. Minimize the inductive parasitic between the INx input capacitors and the thermal pad ground return.  
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12.2 Layout Example  
VIA to  
ground plane  
C
C
IN13  
VS  
VIAs to ground  
plane and heat  
sink of the PCB  
IN14  
IN15  
VS  
IN12  
IN16  
IN17  
IN11  
IN10  
IN18  
IN19  
IN9  
IN8  
IN20  
AGND  
IN21  
IN7  
IN6  
IN5  
VIA to  
ground plane  
VIA to  
ground plane  
IN22  
IN23  
DGND  
IN4  
IN0  
IN1  
IN3  
IN2  
/CS  
/INT  
C
C
SCLK  
CAP_D  
VIA to  
ground plane  
SI  
CAP_PRE  
RESET  
SO  
VDD  
CAP_A  
Not to Scale  
VIA to  
ground plane  
C
R
R
VIA to ground plane  
12-1. Example Layout  
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13 Device and Documentation Support  
13.1 Receiving Notification of Documentation Updates  
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper  
right corner, click on Alert me to register and receive a weekly digest of any product information that has  
changed. For change details, review the revision history included in any revised document.  
13.2 Community Resources  
13.3 Trademarks  
所有商标均为其各自所有者的财产。  
14 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OPTION ADDENDUM  
www.ti.com  
3-Jan-2022  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
TIC10024QDCPRQ1  
ACTIVE  
HTSSOP  
DCP  
38  
2000 RoHS & Green  
NIPDAU  
Level-3-260C-168 HR  
-40 to 125  
TIC10024Q  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
3-Jan-2022  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TIC10024QDCPRQ1  
HTSSOP DCP  
38  
2000  
330.0  
16.4  
6.9  
10.2  
1.8  
12.0  
16.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
3-Jan-2022  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
HTSSOP DCP 38  
SPQ  
Length (mm) Width (mm) Height (mm)  
350.0 350.0 43.0  
TIC10024QDCPRQ1  
2000  
Pack Materials-Page 2  
GENERIC PACKAGE VIEW  
DCP 38  
4.4 x 9.7, 0.5 mm pitch  
PowerPAD TSSOP - 1.2 mm max height  
SMALL OUTLINE PACKAGE  
This image is a representation of the package family, actual package may vary.  
Refer to the product data sheet for package details.  
4224560/B  
www.ti.com  
PACKAGE OUTLINE  
DCP0038A  
PowerPADTM TSSOP - 1.2 mm max height  
S
C
A
L
E
2
.
0
0
0
SMALL OUTLINE PACKAGE  
C
6.6  
6.2  
TYP  
A
0.1 C  
PIN 1 INDEX  
AREA  
SEATING  
PLANE  
36X 0.5  
38  
1
2X  
9
9.8  
9.6  
NOTE 3  
19  
20  
0.27  
0.17  
0.08  
38X  
4.5  
4.3  
B
C A B  
SEE DETAIL A  
(0.15) TYP  
2X 0.95 MAX  
NOTE 5  
19  
20  
2X 0.95 MAX  
NOTE 5  
0.25  
GAGE PLANE  
1.2 MAX  
39  
4.70  
3.94  
THERMAL  
PAD  
0.15  
0.05  
0.75  
0.50  
0 -8  
A
20  
DETAIL A  
TYPICAL  
1
38  
2.90  
2.43  
4218816/A 10/2018  
PowerPAD is a trademark of Texas Instruments.  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed 0.15 mm per side.  
4. Reference JEDEC registration MO-153.  
5. Features may differ or may not be present.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DCP0038A  
PowerPADTM TSSOP - 1.2 mm max height  
SMALL OUTLINE PACKAGE  
(3.4)  
NOTE 9  
METAL COVERED  
BY SOLDER MASK  
(2.9)  
SYMM  
38X (1.5)  
38X (0.3)  
SEE DETAILS  
38  
1
(R0.05) TYP  
36X (0.5)  
3X (1.2)  
SYMM  
39  
(4.7)  
(9.7)  
NOTE 9  
(0.6) TYP  
SOLDER MASK  
DEFINED PAD  
(
0.2) TYP  
VIA  
20  
19  
(1.2)  
(5.8)  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE: 8X  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
SOLDER MASK  
OPENING  
METAL  
EXPOSED METAL  
EXPOSED METAL  
0.05 MAX  
ALL AROUND  
0.05 MIN  
ALL AROUND  
NON-SOLDER MASK  
DEFINED  
SOLDER MASK  
DEFINED  
15.000  
SOLDER MASK DETAILS  
4218816/A 10/2018  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
8. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature  
numbers SLMA002 (www.ti.com/lit/slma002) and SLMA004 (www.ti.com/lit/slma004).  
9. Size of metal pad may vary due to creepage requirement.  
10. Vias are optional depending on application, refer to device data sheet. It is recommended that vias under paste be filled, plugged  
or tented.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DCP0038A  
PowerPADTM TSSOP - 1.2 mm max height  
SMALL OUTLINE PACKAGE  
(2.9)  
BASED ON  
0.125 THICK  
STENCIL  
38X (1.5)  
38X (0.3)  
METAL COVERED  
BY SOLDER MASK  
1
38  
(R0.05) TYP  
36X (0.5)  
(4.7)  
SYMM  
39  
BASED ON  
0.125 THICK  
STENCIL  
19  
20  
SYMM  
(5.8)  
SEE TABLE FOR  
DIFFERENT OPENINGS  
FOR OTHER STENCIL  
THICKNESSES  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE: 8X  
STENCIL  
THICKNESS  
SOLDER STENCIL  
OPENING  
0.1  
3.24 X 5.25  
2.90 X 4.70 (SHOWN)  
2.65 X 4.29  
0.125  
0.15  
0.175  
2.45 X 3.97  
4218816/A 10/2018  
NOTES: (continued)  
11. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
12. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
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