TPD4E02B04 [TI]

适用于 USB 3.0、HDMI 2.0 和高速信号的四路 0.25pF、±3.6V、±12kV ESD 保护二极管;
TPD4E02B04
型号: TPD4E02B04
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

适用于 USB 3.0、HDMI 2.0 和高速信号的四路 0.25pF、±3.6V、±12kV ESD 保护二极管

二极管
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中文:  中文翻译
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TPD4E02B04  
ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
TPD4E02B04 用于 USB Type-C HDMI 2.0 4 通道 ESD 保护二极管  
1 特性  
接口  
USB Type-C  
1
IEC 61000-4-2 4 级静电放电 (ESD) 保护  
USB 3.1 2 代  
高清多媒体接口 (HDMI) 2.0/1.4  
USB 3.0  
±12kV 接触放电  
±15kV 气隙放电  
IEC 61000-4-4 瞬态放电 (EFT) 保护  
80A (5/50ns)  
IEC 61000-4-5 浪涌保护  
2A (8/20µs)  
DisplayPort 1.3  
PCI Express 3.0  
3 说明  
IO 电容:0.27pF(典型值)、0.37pF(最大值)  
直流击穿电压:5.5V(最小值)  
TPD4E02B04 是一款双向瞬态电压抑制器 (TVS) ESD  
保护二极管阵列,用于为 USB Type-C HDMI 2.0  
电路提供保护。TPD4E02B04 的额定 ESD 冲击消散  
值等于 IEC 61000-4-24 级)国际标准中规定的最高  
水平。  
超低泄漏电流:10nA(最大值)  
低静电放电 (ESD) 钳位电压:5A 传输线路脉冲  
(TLP) 时为 8.8V  
支持速率高达 10Gbps 的高速接口  
工业温度范围:–40°C 125°C  
简易直通布线封装  
该器件 的每条 通道具有一个 0.27pF IO 电容,适用于  
保护速率高达 10Gbps 的高速接口(例如 USB 3.1 第  
2 代)。低动态电阻和低钳位电压可针对瞬变事件提供  
系统级保护。  
2 应用  
终端设备  
TPD4E02B04 采用符合工业标准的 USON-10 (DQA)  
封装。该封装 采用 直通布线,其引脚间距为 0.5mm,  
能够简化应用实现并缩短设计时间。  
便携式计算机和台式机  
机顶盒  
电视和监视器  
手机和平板电脑  
器件信息(1)  
数字视频录像机 (DVR) 和网络视频录像机  
器件型号  
封装  
封装尺寸(标称值)  
(NVR)  
TPD4E02B04  
USON (10) 2.50mm x 1.00mm  
(1) 要了解所有可用封装,请见数据表末尾的可订购产品附录。  
典型应用电路原理图  
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1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SLVSD85  
 
 
 
 
 
TPD4E02B04  
ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
www.ti.com.cn  
目录  
7.4 Device Functional Modes........................................ 10  
Application and Implementation ........................ 11  
8.1 Application Information............................................ 11  
8.2 Typical Application ................................................. 11  
Power Supply Recommendations...................... 14  
1
2
3
4
5
6
特性.......................................................................... 1  
应用.......................................................................... 1  
说明.......................................................................... 1  
修订历史记录 ........................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications......................................................... 4  
6.1 Absolute Maximum Ratings ...................................... 4  
6.2 ESD Ratings.............................................................. 4  
6.3 Recommended Operating Conditions....................... 4  
6.4 Thermal Information.................................................. 4  
6.5 Electrical Characteristics........................................... 5  
6.6 Typical Characteristics.............................................. 5  
Detailed Description .............................................. 9  
7.1 Overview ................................................................... 9  
7.2 Functional Block Diagram ......................................... 9  
7.3 Feature Description................................................... 9  
8
9
10 Layout................................................................... 14  
10.1 Layout Guidelines ................................................. 14  
10.2 Layout Examples................................................... 14  
11 器件和文档支持 ..................................................... 16  
11.1 文档支持 ............................................................... 16  
11.2 社区资源................................................................ 16  
11.3 ....................................................................... 16  
11.4 静电放电警告......................................................... 16  
11.5 Glossary................................................................ 16  
12 机械、封装和可订购信息....................................... 16  
7
4 修订历史记录  
注:之前版本的页码可能与当前版本有所不同。  
Changes from Original (Novemeber 2015) to Revision A  
Page  
已将器件状态由产品预览更改为量产数据” .......................................................................................................................... 1  
2
版权 © 2015–2016, Texas Instruments Incorporated  
 
TPD4E02B04  
www.ti.com.cn  
ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
5 Pin Configuration and Functions  
DQA Package  
10-Pin USON  
Top View  
IO1  
IO2  
1
2
3
4
5
10 NC  
9
8
7
6
NC  
GND  
IO3  
GND  
NC  
IO4  
NC  
Pin Functions  
PIN  
TYPE  
DESCRIPTION  
NAME  
GND  
GND  
IO1  
NO.  
3
Ground  
Ground  
Ground. Connect to ground.  
ESD Protected Channel  
8
1
IO2  
2
I/O  
NC  
IO3  
4
IO4  
5
NC  
6
NC  
7
Not Connected; Used for optional straight-through routing. Can be left floating or  
grounded.  
NC  
9
NC  
10  
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3
TPD4E02B04  
ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
www.ti.com.cn  
6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
MAX  
80  
UNIT  
A
Electrical Fast Transient  
Peak Pulse  
IEC 61000-4-5 (5/50 ns)  
IEC 61000-4-5 Power (tp - 8/20 µs)  
IEC 61000-4-5 Current (tp - 8/20 µs)  
Operating free-air temperature  
Storage temperature  
17  
W
2
A
TA  
–40  
–65  
125  
155  
°C  
°C  
Tstg  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended  
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
6.2 ESD Ratings  
VALUE  
UNIT  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
±2500  
Charged-device model (CDM), per JEDEC specification JESD22-  
C101(2)  
±1000  
V(ESD)  
Electrostatic discharge  
V
IEC 61000-4-2 contact discharge  
IEC 61000-4-2 air-gap discharge  
±12000  
±15000  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
MAX  
3.6  
UNIT  
VIO  
TA  
Input pin voltage  
–3.6  
–40  
V
Operating free-air temperature  
125  
°C  
6.4 Thermal Information  
TPD4E02B04  
THERMAL METRIC(1)  
DQA (USON)  
10 PINS  
348.7  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
214.1  
270.7  
ψJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
81.7  
ψJB  
270.7  
RθJC(bot)  
N/A  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report, SPRA953.  
4
Copyright © 2015–2016, Texas Instruments Incorporated  
TPD4E02B04  
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ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
6.5 Electrical Characteristics  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
VRWM  
VBRF  
Reverse stand-off voltage  
IIO < 10 nA  
-3.6  
3.6  
V
Breakdown Voltage, any IO pin to  
GND(1)  
IIO = 1 mA, TA = 25°C  
5.5  
6.4  
7.5  
V
Breakdown Voltage, GND to any IO  
pin(1)  
VBRR  
IIO = 1 mA, TA = 25°C  
-5.5  
-6.4  
-7.5  
V
V
VHOLD  
Holding voltage(2)  
Clamping voltage  
IIO = 1 mA  
5.8  
6.6  
8.8  
6.6  
8.8  
IPP = 1 A, TLP, from IO to GND  
IPP = 5 A, TLP, from IO to GND  
IPP = 1 A, TLP, from GND to IO  
IPP = 5A, TLP, from GND to IO  
VIO = ±2.5 V  
VCLAMP  
V
ILEAK  
RDYN  
Leakage current, any IO to GND  
Dynamic Resistance  
10  
nA  
IO to GND  
0.47  
0.47  
Ω
GND to IO  
VIO = 0 V, f = 1 MHz, IO to GND, TA  
= 25°C  
CL  
Line Capacitance  
0.27  
0.01  
0.13  
0.37  
0.07  
pF  
pF  
pF  
Delta of capacitance between any  
two IO pins, VIO = 0 V, f = 1 MHz, TA  
= 25°C, GND = 0 V  
ΔCL  
Variation of Line Capacitance  
Channel to Channel Capacitance  
Capacitance from one IO to another,  
VIO = 0 V, f = 1 MHz, GND = 0 V  
CCROSS  
(1) VBRF and VBRR are defined as the voltage when 1mA is applied in the positive-going direction, before the device latches into the  
snapback state  
(2) VHOLD is defined as the voltage when 1mA is applied in the negative-going direction, after the device has successfully latched into the  
snapback state  
6.6 Typical Characteristics  
30  
25  
20  
15  
10  
5
30  
25  
20  
15  
10  
5
0
0
0
3
6
9
12  
15  
18  
21  
24  
0
3
6
9
12  
15  
18  
21  
24  
Voltage (V)  
Voltage (V)  
C001  
C002  
Figure 1. Positive TLP Curve  
Figure 2. Negative TLP Curve  
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Typical Characteristics (continued)  
3
24  
20  
16  
12  
8
160  
140  
120  
100  
80  
Current  
Power  
2.5  
2
1.5  
1
60  
40  
20  
0.5  
4
0
0
0
-20  
-5  
0
5
10  
15  
20  
25  
30  
35  
40  
45  
-25  
0
25  
50  
75 100 125 150 175 200 225  
Time (ms)  
Time (ns)  
D001  
D001  
Figure 3. Surge Curve (tp = 8/20µs), any IO pin to GND  
Figure 4. 8-kV IEC Waveform  
20  
0.5  
0.45  
0.4  
0
-20  
-40  
-60  
-80  
0.35  
0.3  
0.25  
0.2  
-100  
0.15  
0.1  
-120  
-140  
-160  
0.05  
0
-25  
0
25  
50  
75 100 125 150 175 200 225  
Time (ns)  
-3.6 -3 -2.4 -1.8 -1.2 -0.6  
0
0.6 1.2 1.8 2.4  
3
3.6  
Bias Voltage (V)  
D001  
D001  
Figure 5. –8-kV IEC Waveform  
Figure 6. Capacitance vs. Bias Voltage  
0.5  
0.45  
0.4  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
Bias = -2.5V  
Bias = 2.5V  
0.35  
0.3  
0.25  
0.2  
0.15  
0.1  
0.05  
0
-40 -25 -10  
5
20 35 50 65 80 95 110 125  
Ambient Temperature (èC)  
-40 -25 -10  
5
20 35 50 65 80 95 110 125  
Temperature (èC)  
D001  
D001  
Figure 7. Capacitance vs. Ambient Temperature  
Figure 8. Leakage Current vs. Temperature  
6
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ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
Typical Characteristics (continued)  
1
0.5  
0.4  
0.3  
0.2  
0.1  
0
0.75  
0.5  
0.25  
0
-0.25  
-0.5  
-0.75  
-1  
-7 -6 -5 -4 -3 -2 -1  
0
1
2
3
4
5
6
7
6E+8  
1E+9  
2E+9  
3E+9  
5E+9 7E+9 1E+10  
Voltage (V)  
Frequency (Hz)  
D001  
D001  
Figure 9. DC Voltage Sweep I-V Curve  
Figure 10. Capacitance vs. Frequency  
40  
35  
30  
25  
20  
15  
10  
5
5
0
-5  
-10  
-15  
-20  
-25  
-30  
-35  
-40  
-45  
-50  
0
-5  
-10  
0
10 20 30 40 50 60 70 80 90 100 110  
Time (ns)  
-10  
0
10 20 30 40 50 60 70 80 90 100 110  
Time (ns)  
D001  
D001  
Figure 11. 8-kV IEC Waveform through 2m HDMI Cable  
Figure 12. –8-kV IEC Waveform through 2m HDMI Cable  
Figure 13. USB3.0 Eye Diagram (Bare Board)  
Figure 14. USB3.0 Eye Diagram (with TPD4E02B04)  
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Typical Characteristics (continued)  
Figure 15. USB3.1 Gen 2 Eye Diagram (Bare Board)  
Figure 16. USB3.1 Gen 2 Eye Diagram (with TPD4E02B04)  
Figure 17. HDMI2.0 6Gbps TP2 Eye Diagram (Bare Board)  
Figure 18. HDMI2.0 6Gbps TP2 Eye Diagram (with  
TPD4E02B04)  
0
-3  
-6  
-9  
0
0
3E+5  
1E+6  
1E+7  
1E+8  
1E+9  
1E+12E+1  
D001  
Frequency (Hz)  
Figure 19. Differential Insertion Loss  
8
Copyright © 2015–2016, Texas Instruments Incorporated  
TPD4E02B04  
www.ti.com.cn  
ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
7 Detailed Description  
7.1 Overview  
The TPD4E02B04 is a bidirectional ESD Protection Diode with ultra-low capacitance. This device can dissipate  
ESD strikes above the maximum level specified by the IEC 61000-4-2 International Standard. The ultra-low  
capacitance makes this device ideal for protecting any super high-speed signal pins.  
7.2 Functional Block Diagram  
Lh1  
Lh2  
Lh3  
Lh4  
Db5  
7.3 Feature Description  
7.3.1 IEC 61000-4-2 ESD Protection  
The I/O pins can withstand ESD events up to ±12-kV contact and ±15-kV air gap. An ESD/surge clamp diverts  
the current to ground.  
7.3.2 IEC 61000-4-4 EFT Protection  
The I/O pins can withstand an electrical fast transient burst of up to 80 A (5/50 ns waveform, 4 kV with 50  
impedance). An ESD/surge clamp diverts the current to ground.  
7.3.3 IEC 61000-4-5 Surge Protection  
The I/O pins can withstand surge events up to 2 A and 17 W (8/20 µs waveform). An ESD/surge clamp diverts  
this current to ground.  
7.3.4 IO Capacitance  
The capacitance between each I/O pin to ground is 0.27 pF (typical) and 0.37 pF (maximum). This device  
supports data rates up to 10 Gbps.  
7.3.5 DC Breakdown Voltage  
The DC breakdown voltage of each I/O pin is a minimum of ±5.5 V. This ensures that sensitive equipment is  
protected from surges above the reverse standoff voltage of ±3.6 V.  
7.3.6 Ultra Low Leakage Current  
The I/O pins feature an ultra-low leakage current of 10 nA (max) with a bias of ±2.5 V  
7.3.7 Low ESD Clamping Voltage  
The I/O pins feature an ESD clamp that is capable of clamping the voltage to 8.8 V (IPP = 5 A).  
7.3.8 Supports High Speed Interfaces  
This device is capable of supporting high speed interfaces up to 10 Gbps, because of the extremely low IO  
capacitance.  
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Feature Description (continued)  
7.3.9 Industrial Temperature Range  
This device features an industrial operating range of –40°C to 125°C.  
7.3.10 Easy Flow-Through Routing Package  
The layout of this device makes it simple and easy to add protection to an existing layout. The packages offers  
flow-through routing, requiring minimal modification to an existing layout.  
7.4 Device Functional Modes  
The TPD4E02B04 is a passive integrated circuit that triggers when voltages are above VBRF or below VBRR  
.
During ESD events, voltages as high as ±15 kV (air) can be directed to ground via the internal diode network.  
When the voltages on the protected line fall below the trigger levels of TPD4E02B04 (usually within 10s of nano-  
seconds) the device reverts to passive.  
10  
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TPD4E02B04  
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ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
8 Application and Implementation  
NOTE  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
8.1 Application Information  
The TPD4E02B04 is a diode type TVS which is used to provide a path to ground for dissipating ESD events on  
high-speed signal lines between a human interface connector and a system. As the current from ESD passes  
through the TVS, only a small voltage drop is present across the diode. This is the voltage presented to the  
protected IC. The low RDYN of the triggered TVS holds this voltage, VCLAMP, to a safe level for the protected IC.  
8.2 Typical Application  
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Figure 20. USB 3.1 Gen 2 Type-C ESD Schematic  
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Typical Application (continued)  
Figure 21. USB 3.1 Gen 2 SuperSpeed Layout  
8.2.1 Design Requirements  
For this design example two TPD4E02B04 devices and two TPD4E05U06 devices are being used in a USB 3.1  
Gen 2 Type-C application. This will provide a complete ESD protection scheme.  
Given the USB 3.1 Gen 2 Type-C application, the parameters listed in Table 1 are known.  
Table 1. Design Parameters  
DESIGN PARAMETER  
VALUE  
0 V to 3.6 V  
5 GHz  
Signal Range on SuperSpeed+ Lines  
Operating Frequency on SuperSpeed+ Lines  
Signal Range on CC, SBU, and DP/DM  
Lines  
0 V to 5 V  
Operating Frequency on CC, SBU, and  
DP/DM Lines  
up to 480 MHz  
12  
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8.2.2 Detailed Design Procedure  
8.2.2.1 Signal Range  
The TPD4E02B04 supports signal ranges between -3.6 V and 3.6 V, which supports the SuperSpeed+ pairs on  
the USB Type-C application. The TPD4E05U06 supports signal ranges between 0 and 5.5 V, which supports the  
CC, SBU, and DP/DM lines.  
8.2.2.2 Operating Frequency  
The TPD4E02B04 has a 0.27 pF (typ) capacitance, which supports the USB3.1 Gen 2 data rates of 10 Gbps.  
The layout example in Figure 21 is intended to negate some of the loading capacitance of the TPD4E02B04 by  
narrowing the traces slightly over the device itself. The TPD4E05U06 has a 0.5 pF (typical) capacitance, which  
easily supports the CC, SBU, and DP/DM data rates.  
8.2.3 Application Curves  
Figure 22. USB 3.1 Gen 2 10Gbps Eye Diagram (Bare  
Board)  
Figure 23. USB 3.1 Gen 2 10Gbps Eye Diagram (with  
TPD4E02B04)  
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9 Power Supply Recommendations  
This device is a passive ESD device so there is no need to power it. Take care not to violate the recommended  
I/O specification (-3.6 V to 3.6 V) to ensure the device functions properly.  
10 Layout  
10.1 Layout Guidelines  
The optimum placement is as close to the connector as possible.  
EMI during an ESD event can couple from the trace being struck to other nearby unprotected traces,  
resulting in early system failures.  
The PCB designer needs to minimize the possibility of EMI coupling by keeping any unprotected traces  
away from the protected traces which are between the TVS and the connector.  
Route the protected traces as straight as possible.  
Eliminate any sharp corners on the protected traces between the TVS and the connector by using rounded  
corners with the largest radii possible.  
Electric fields tend to build up on corners, increasing EMI coupling.  
10.2 Layout Examples  
[egend  
Çop [ayer  
.oꢀꢀom [ayer  
tin ꢀo Db5  
ëL! ꢀo ë.Ü{ tlane  
ëL! ꢀo hꢀꢁer [ayer  
ëL! ꢀo Db5 tlane  
Figure 24. USB Type-C Mid-Mount, Hybrid Connector with One-Sided ESD Layout  
14  
Copyright © 2015–2016, Texas Instruments Incorporated  
TPD4E02B04  
www.ti.com.cn  
ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
Layout Examples (continued)  
Çt54902.04  
Çt54902.04  
Çt5490ꢀÜ06  
Ça5{_52+  
Db5  
Ça5{_52+  
Ça5{_52-  
Ça5{_52-  
Ça5{_51+  
Db5  
[egend  
Çop [ꢃyer  
Ça5{_51+  
Ça5{_51-  
Db5  
Ça5{_51-  
Ça5{_50+  
Db5  
Ça5{_50+  
Ça5{_50-  
.oꢁꢁom [ꢃyer  
tin ꢁo Db5  
Ça5{_50-  
Db5  
Ça5{_/Y+  
Ça5{_/Y+  
Ça5{_/Y-  
Db5  
Ça5{_/Y-  
/9/  
ëL! ꢁo hꢁꢂer [ꢃyer  
ëL! ꢁo Db5 tlꢃne  
/9/  
ÜÇL[LÇò  
ÜÇL[LÇò  
55/_/[Y  
Db5  
55/_5!Ç  
55/_/[Y  
55/_5!Ç  
Db5  
ꢀë_hÜÇ  
IhÇt[ÜD_59Ç  
Ço DtLh  
IhÇt[ÜD_59Ç  
Db5  
ꢀë_{Ütt[ò  
Çt53{014  
Figure 25. HDMI2.0 Type-A Transmitter Port Layout  
版权 © 2015–2016, Texas Instruments Incorporated  
15  
TPD4E02B04  
ZHCSEN2A NOVEMBER 2015REVISED FEBRUARY 2016  
www.ti.com.cn  
11 器件和文档支持  
11.1 文档支持  
11.1.1 相关文档ꢀ  
相关文档请参见以下部分:  
《阅读并理解 ESD 保护数据表》SLLA305  
ESD 布局布线指南》SLVA680  
TPD4E02B04EVM 用户指南》SLVUAH6  
11.2 社区资源  
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective  
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of  
Use.  
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration  
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help  
solve problems with fellow engineers.  
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and  
contact information for technical support.  
11.3 商标  
E2E is a trademark of Texas Instruments.  
All other trademarks are the property of their respective owners.  
11.4 静电放电警告  
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损  
伤。  
11.5 Glossary  
SLYZ022 TI Glossary.  
This glossary lists and explains terms, acronyms, and definitions.  
12 机械、封装和可订购信息  
以下页中包括机械、封装和可订购信息。这些信息是针对指定器件可提供的最新数据。这些数据会在无通知且不对  
本文档进行修订的情况下发生改变。欲获得该数据表的浏览器版本,请查阅左侧的导航栏。  
16  
版权 © 2015–2016, Texas Instruments Incorporated  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
TPD4E02B04DQAR  
ACTIVE  
USON  
DQA  
10  
3000 RoHS & Green  
NIPDAU  
Level-1-260C-UNLIM  
-40 to 125  
1SG  
1SY  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
16-Jun-2023  
TAPE AND REEL INFORMATION  
REEL DIMENSIONS  
TAPE DIMENSIONS  
K0  
P1  
W
B0  
Reel  
Diameter  
Cavity  
A0  
A0 Dimension designed to accommodate the component width  
B0 Dimension designed to accommodate the component length  
K0 Dimension designed to accommodate the component thickness  
Overall width of the carrier tape  
W
P1 Pitch between successive cavity centers  
Reel Width (W1)  
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE  
Sprocket Holes  
Q1 Q2  
Q3 Q4  
Q1 Q2  
Q3 Q4  
User Direction of Feed  
Pocket Quadrants  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TPD4E02B04DQAR  
USON  
DQA  
10  
3000  
180.0  
9.5  
1.18  
2.68  
0.72  
4.0  
8.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
16-Jun-2023  
TAPE AND REEL BOX DIMENSIONS  
Width (mm)  
H
W
L
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
USON DQA 10  
SPQ  
Length (mm) Width (mm) Height (mm)  
189.0 185.0 36.0  
TPD4E02B04DQAR  
3000  
Pack Materials-Page 2  
PACKAGE OUTLINE  
DQA0010A  
USON - 0.55 mm max height  
SCALE 6.000  
PLASTIC SMALL OUTLINE - NO LEAD  
1.1  
0.9  
A
B
PIN 1 INDEX AREA  
2.6  
2.4  
C
0.55 MAX  
SEATING PLANE  
(0.13) TYP  
0.08 C  
0.05  
0.00  
5
6
4X 0.5  
(R0.125)  
2X  
2
0.45  
0.35  
2X  
0.1  
C A  
B
0.05  
1
10  
0.25  
0.15  
8X  
PIN 1 ID  
(OPTIONAL)  
0.1  
0.05  
C A  
B
0.43  
0.30  
10X  
C
4220328/A 12/2015  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DQA0010A  
USON - 0.55 mm max height  
PLASTIC SMALL OUTLINE - NO LEAD  
10X (0.565)  
8X (0.2)  
1
10  
SYMM  
2X (0.4)  
4X (0.5)  
6
5
(R0.05) TYP  
SYMM  
(0.835)  
LAND PATTERN EXAMPLE  
SCALE:30X  
0.07 MIN  
ALL AROUND  
0.07 MAX  
ALL AROUND  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
METAL  
SOLDER MASK  
OPENING  
NON SOLDER MASK  
DEFINED  
SOLDER MASK  
DEFINED  
(PREFERRED)  
SOLDER MASK DETAILS  
4220328/A 12/2015  
NOTES: (continued)  
3. For more information, see Texas Instruments literature number SLUA271 (www.ti.com/lit/slua271).  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DQA0010A  
USON - 0.55 mm max height  
PLASTIC SMALL OUTLINE - NO LEAD  
10X (0.565)  
8X (0.2)  
1
10  
METAL  
TYP  
SYMM  
2X (0.36)  
8
3
4X (0.5)  
6
5
(R0.05) TYP  
SYMM  
(0.835)  
SOLDER PASTE EXAMPLE  
BASED ON 0.1 mm THICK STENCIL  
EXPOSED PADS 3 & 8:  
90% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE  
SCALE:40X  
4220328/A 12/2015  
NOTES: (continued)  
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
www.ti.com  
重要声明和免责声明  
TI“按原样提供技术和可靠性数据(包括数据表)、设计资源(包括参考设计)、应用或其他设计建议、网络工具、安全信息和其他资源,  
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这些资源可供使用 TI 产品进行设计的熟练开发人员使用。您将自行承担以下全部责任:(1) 针对您的应用选择合适的 TI 产品,(2) 设计、验  
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