TPS2350PWG4 [TI]
具有 ORing 的 -12V 至 -80V 热插拔控制器 | PW | 14 | -40 to 85;型号: | TPS2350PWG4 |
厂家: | TEXAS INSTRUMENTS |
描述: | 具有 ORing 的 -12V 至 -80V 热插拔控制器 | PW | 14 | -40 to 85 控制器 光电二极管 电源管理电路 电源电路 |
文件: | 总21页 (文件大小:366K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
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FEATURES
DESCRIPTION
D
D
D
D
D
D
D
D
D
D
Replaces OR-ing Diodes
The TPS2350 is a hot swap power manager
optimized for replacing OR-ing diodes in
redundant power −48-V systems. The TPS2350
operates with supply voltages from −12 V to
−80 V, and withstands spikes to −100 V.
Operating Supply Range of −12 V to −80 V
Withstands Transients to –100 V
Programmable Current Limit
Programmable Linear Inrush Slew Rate
Programmable UV/OV Thresholds
Programmable UV and OV Hysteresis
Fault Timer to Eliminate Nuisance Trips
Power Good and Fault Outputs
The TPS2350 uses two power FETs as low
voltage drop diodes to efficiently select between
two redundant power supplies. This minimizes
system power dissipation and also minimizes
voltage drop through the power management
chain.
14-Pin SOIC and TSSOP Package
The TPS2350 also uses a third power FET to
provide load current slew rate control and peak
current limiting that is programmed by one resistor
and one capacitor. The device also provides a
power good output to enable down-stream power
converters and a fault output to indicate load
problems.
APPLICATIONS
D
D
D
D
−48-V Distributed Power Systems
Central Office Switching
ONET
Base Stations
TYPICAL APPLICATION DIAGRAM
R
LOAD
1
C
LOAD
RTN
3
12
2
UV
PG
FLT
Q1
11
10
7
GAT
R
SENSE
Power Good
Fault
0.01 Ω
TPS2350
SENSE
SOURCE
GATA
9
4
OV
GATB
8
FLTTIM RAMP
−VINA −VINB
14 13
5
6
−VINB
−VINA
C
C
RAMP
FLT
UDG−03125
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Copyright 2003, Texas Instruments Incorporated
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ꢢ ꢦ ꢣ ꢢꢛ ꢜꢰ ꢞꢝ ꢡ ꢩꢩ ꢧꢡ ꢟ ꢡ ꢠ ꢦ ꢢ ꢦ ꢟ ꢣ ꢫ
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1
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature (unless otherwise noted)
(1)
PARAMETER
TPS2350
−0.3 to 100
−100 to 100
−0.3 to 15
−0.3 to 100
10
UNIT
V
(2)
Input voltage range, RTN
Input voltage range, −VINA to –VINB
(2)
Input voltage range, FLTTIM, RAMP, SENSE, OV, UV
(2)(3)
Output voltage range, FLT, PG
Continuous output current, FLT, PG
Continuous total power dissipation
Operating junction temperature range, T
mA
°C
TBD
−55 to 125
−65 to 150
260
J
Storage temperature range, T
stg
Lead temperature soldering 1,6 mm (1/16 inch) from case for 10 seconds
(1)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions”
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltages are with respect to the more negative of –VINA and −VINB (unless otherwise noted).
(2)
(3)
With 10 kΩ minimum series resistance. Range limited to –0.3V to 80V from low impedance source.
SOIC/TSSOP-14 PACKAGE
(TOP VIEW)
RTN
FLT
UV
1
2
3
4
5
6
7
14
13
12
11
10
9
−VINA
−VINB
PG
OV
GAT
FLTTIM
RAMP
SOURCE
SENSE
GATA
GATB
8
ELECTROSTATIC DISCHARGE
(ESD) PROTECTION
AVAILABLE OPTIONS
T
PACKAGE
(4)
PART NUMBER
TPS2350D
A
MIN
UNIT
SOIC−14
−40°C to 85°C
Human body model (HBM)
2
kV
(4)
TSSOP−14
TPS2350PW
(4)
Charged device model (CDM)
1.5
The D and PW packages are also available taped and reeled.
Add an R suffix to the device type (i.e. TPS2350DR).
RECOMMENDED OPERATING CONDITIONS
MIN
−80
−40
NOM
MAX
−12
85
UNIT
V
Input supply, −VINA, −VINB to RTN
Operating junction temperature range
−48
_C
DISSIPATION RATING TABLE
PACKAGE
T
< 25 _C
DERATING FACTOR
T
= 85 _C
A
A
POWER RATING
ABOVE T = 25 _C
POWER RATING
A
SOIC−14
750 mW
7.5 mW/C
7.5 mW/C
300 mW
TSSOP−14
750 mW
300 mW
2
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ꢀꢁ ꢂ ꢃꢄ ꢅꢆ
SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
ELECTRICAL CHARACTERISTICS
−VINA = −48 V, −VINB = 0 V, UV = 2.5 V, OV = 0.5 V, SENSE = 0 V, RAMP = 0 V, SOURCE = more negative of –VINA
and –VINB, all outputs unloaded, T = −40 _C to 85 _C (unless otherwise noted)†‡
A
Input Supply
PARAMETER
Supply current
TEST CONDITIONS
−VINA = −48 V, −VINB = 0 V
−VINA = −80 V, −VINB = 0 V
−VINB = −48 V, −VINA = 0 V
−VINB = −80 V, −VINA = 0 V
To GAT pull up
MIN
TYP
MAX
1500
2000
1500
2000
−8.0
500
UNIT
I
I
I
I
1000
CC1A
CC2A
CC1B
CC2B
Supply current
µA
Supply current
1000
Supply current
V
Internal UVLO threshold voltage
Internal UVLO hysteresis voltage
−11.8
50
−10
240
V
UVLO_I
V
mV
HYST
Overvoltage and Undervoltage Inputs (OV and UV)
PARAMETER
TEST CONDITIONS
MIN
1.391
1.387
1.384
−11
TYP
1.400
1.400
1.400
−10
MAX
1.409
1.413
1.419
−9
UNIT
To GAT pull up, 25 _C
To GAT pull up, 0 to 70 _C
To GAT pull up, −40 to 85 _C
UV = −45.5 V
V
UV threshold voltage, UV rising, to –VINA
V
THUV
I
I
UV hysteresis
HYSUV
µA
UV low−level input current
OV threshold voltage, OV rising, to −VINA
OV hysteresis
UV = −47 V
−1
1
ILUV
V
To GAT pull up
1.376
−11.1
−1
1.400
−10
1.426
−8.6
1
V
THOV
HYSOV
ILOV
I
I
OV = −45.5 V
µA
OV low−level input current
OV = −47 V
Linear Curent Amplifier (LCA)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
V
High level output, GAT−SOURCE
GAT sink current in fault
SENSE = SOURCE
11
14
17
V
OH
SENSE – SOURCE = 80 mV, GAT = −43
V, FLTTIME = 5 V
I
30
75
5
SINK_f
mA
SENSE – SOURCE = 80 mV, GAT =
−43 V, FLTTIME = 2 V
I
I
GAT sink current in linear mode
SENSE input current
10
1
SINK_l
0.0 V < SENSE – SOURCE < 0.2 V
RAMP – SOURCE = 6 V
−1
34
−7
µA
IN
Reference clamp voltage, SENSE −
SOURCE
V
42
50
9
REF_K
mV
V
IO
Input offset voltage, SENSE − SOURCE
RAMP – SOURCE = 0 V
Ramp Generator
PARAMETER
TEST CONDITIONS
RAMP − SOURCE = 0.25 V
RAMP − SOURCE = 1 V and 3 V
UV = SOURCE
MIN
−800
−11.3
TYP
−550
−10
MAX
−300
−8.5
5
UNIT
nA
I
I
RAMP source current, slow turn-on rate
RAMP source current, normal rate
Low-level output voltage
SRC1
µA
SRC2
V
OL
mV
A
V
Voltage gain, relative to SENSE
0 V < RAMP − SOURCE < 5 V
9.5
10
10.7
mV/V
†
‡
All voltages are with respect to RTN unless otherwise stated.
Currents are positive into and negative out of the specified terminal.
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ꢀ ꢁ ꢂ ꢃ ꢄꢅ ꢆ
SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
ELECTRICAL CHARACTERISTICS
−VINA = −48 V, −VINB = 0 V, UV = 2.5 V, OV = 0.5 V, SENSE = 0 V, RAMP = 0 V, SOURCE = more negative of –VINA
and –VINB, all outputs unloaded, T = −40 _C to 85 _C (unless otherwise noted)†‡
A
Overload Comparator
PARAMETER
SENSE current overload threshold
Response time
TEST CONDITIONS
MIN
100
TYP
120
MAX
140
UNIT
mV
µs
V
TH_OL
t
SENSE – SOURCE = 200 mV
2
4
7
RSP
Fault Timer
PARAMETER
TEST CONDITIONS
UV = −48 V
MIN
TYP
MAX
5
UNIT
mV
V
OL
FLTTIM low−level output voltage, to −VINA
FLTTIM charging current, current limit mode
FLTTIM fault threshold voltage to SOURCE
Fault reset threshold to SOURCE
I
FLTTIM − SOURCE = 2 V
−54
−50
4.00
0.5
−41
4.25
µA
CHG
V
3.75
FLT
RST
DSG
V
V
I
FLTTIM Discharge current, retry mode
FLTTIM – SOURCE = 2 V
0.38
0.75
µA
SENSE − SOURCE = 80 mV,
FLTTIM − SOURCE = 2 V
D
Output duty cycle during retry cycles
1.0%
1
1.5%
I
FLTTIM discharge current, timer reset mode
FLTTIM − SOURCE = 2 V, SENSE = V
mA
RST
Logic Outputs (FLT, PG)
PARAMETER
TEST CONDITIONS
UV = −48 V, FLT – SOURCE = 80 V
UV = −45 V, PG – SOURCE = 80 V
MIN
−10
−10
TYP
MAX
10
UNIT
I
I
FLT high-level output leakage current
PG high-level output leakage current
OHFLT
µA
10
OHPG
SENSE−SOURCE = 80 mV,
FLTTIM−SOURCE = 5 V,
I(FLT) = 1 mA
R
R
FLT ON resistance
PG ON resistance
50
50
80
80
DS(on)
DS(on)
Ω
UV = −48 V, I (PG) = 1 mA
O
Supply Selector
PARAMETER
TEST CONDITIONS
−VINB = −48 V, −VINA falling
−VINA = −48 V, −VINB falling
MIN
TYP
MAX
UNIT
V
V
Threshold voltage, −VINA falling
Threshold voltage, −VINB falling
−48.45 −48.40 −48.35
−48.45 −48.40 −48.35
THA
V
THB
−VINA = 0 V, −VINB = −48 V,
GATA = −41 V
I
GATA sink current
GATA source current
GATB sink current
GATB source current
30
80
−50
80
mA
µA
SINK
−VINA = −48 V, −VINB = −0 V,
GATA = −41 V
I
−20
SOURCE
−VINA = −48 V, −VINB = −0 V,
GATB = −41 V
I
30
mA
µA
SINK
−VINA = 0 V, −VINB = −48 V,
GATB = −41 V
I
−50
−20
SOURCE
V
GATA low voltage to –VINA
GATA high voltage to –VINA
GATB low voltage to –VINB
GATB high voltage to −VINB
−VINA = 0 V, −VINB = −48 V
−VINA = −48 V, −VINB = 0 V
−VINA = −48 V, −VINB = 0 V
−VINA = 0 V, −VINB = −48 V
0.1
17
OLA
OLA
OLB
OLB
V
V
V
11
11
14
14
V
0.1
17
†
‡
All voltages are with respect to RTN unless otherwise stated.
Currents are positive into and negative out of the specified terminal.
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
TERMINAL FUNCTIONS
TERMINAL
I/O
DESCRIPTION
NAME
NO.
2
FLT
O
Open-drain, active-low indication that the part is in fault.
Connection for user programming of the fault timeout period.
FLTTIM
5
I/O
Gate drive for external N-channel FET that ramps load current and disconnects in the event of a
fault.
GAT
11
O
GATA
GATB
OV
9
8
O
Gate drive for external N-channel FET that selects –VINA.
Gate drive for external N-channel FET that selects –VINB.
Over voltage sense input.
O
4
I
PG
12
6
O
Open-drain, active-high indication that the power FET is fully enhanced.
Programming input for setting the inrush current slew rate.
Supply return (ground).
RAMP
RTN
I/O
1
I
SENSE
SOURCE
UV
10
7
I
Positive current sense input.
I/O
Negative current sense input.
3
I
I
I
Under voltage sense input.
−VINA
−VINB
14
13
Negative supply input A.
Negative supply input B.
PIN DESCRIPTIONS
FLT: Open-drain, active-low indication that TPS2350 has shut down due to a faulted load. This happens if the
load current stays limited by the linear current amplifier for more than the fault time (time to charge the FLTTIM
capacitor). FLT is cleared when both supplies drop below the UV-comparator threshold or one supply exceeds
the OV-comparator threshold. The FLT output is pulled to the lower of –VINA and –VINB. The FLT output is able
to sink 10 mA when in fault, withstand 80 V without leakage when not faulted, and withstand transients as high
as 100 V when limited by a series resistor of at least 10 kΩ.
FLTTIM: Connection for user programming of the fault timeout period. An external capacitor connected from
FLTTIM to SOURCE establishes the timeout period to declare a fault condition. This timeout protects against
indefinite current sourcing into a faulted load, and also provides a filter against nuisance trips from momentary
current spikes or surges. TPS2350 define a fault condition as voltage at the SENSE pin at or greater than the
42-mV fault threshold. When a fault condition exists, the timer is active. The devices manage fault timing by
charging the external capacitor to the 4-V fault threshold, then subsequently discharging it at approximately 1%
the charge rate to establish the duty cycle for retrying the load. Whenever the fault latch is set (timer expired),
GAT and FLT are pulled low.
GAT: Gate drive for an external N-channel protection power MOSFET. When either input supply is above the
UV threshold and both are below the OV threshold, gate drive is enabled and the device begins charging the
external capacitor connected to RAMP. RAMP develops the reference voltage at the non-inverting input of the
internal LCA. The inverting input is connected to the current sense node, SENSE. The LCA acts to slew the pass
FET gate to force the SENSE voltage to track the reference. The reference is internally clamped to 42 mV, so
the maximum current that can be sourced to the load is determined by the sense resistor value as IMAX ≤
42 mV/R
. Once the load voltage has ramped up to the input dc potential and current demand drops off,
SENSE
the LCA drives GAT 14 V above SOURCE to fully enhance the pass FET, completing the low-impedance supply
return path for the load.
GATA: Gate drive for an external N-channel power MOSFET to select −VINA. When –VINA is more negative
than –VINB, GATA is pulled 14 V above –VINA, turning on the –VINA power FET. When –VINB is more negative
than –VINA, GATA is pulled down to –VINB, turning off the –VINA power FET.
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
PIN DESCRIPTIONS (cont.)
GATB: Gate drive for an external N-channel power MOSFET to select −VINB. When –VINB is more negative
than –VINA, GATB is pulled 14 V above –VINB, turning on the –VINB power FET. When –VINA is more negative
than –VINB, GATB is pulled down to –VINA, turning off the –VINB power FET.
PG: Open-drain, active-high indication that load current is below the commanded current and the power FET
is fully enhanced. When commanded load current is more than the actual load current, the linear current
amplifier (LCA) will raise the power MOSFET gate voltage to fully enhance the power MOSFET. At this time,
the PG output will go high. This output can be used to enable a down-stream dc-to-dc converter. The PG output
is pulled to the lower of –VINA and –VINB. The PG output is able to sink 10 mA when in fault, withstand 80 V
without leakage when power is not good, and withstand transients as high as 100 V when limited by a series
resistor of at least 10 kΩ.
OV: Over voltage comparator input. This input is typically connected to a voltage divider between RTN and
SOURCE to sense the magnitude of the more negative input supply. If OV is less than 1.4 V above SOURCE,
UV is more than 1.4 V above SOURCE, and there is no fault, the linear current amp will be enabled. In the event
of a fault, pulling OV high or UV low will reset the fault latch and allow restarting. OV can also be used as an
active-low logic enable input. The over-voltage comparator hysteresis is programmed by the equivalent
resistance seen looking into the divider at the OV input.
RAMP: Programming input for setting inrush current and current slew rate. An external capacitor connected
between RAMP and SOURCE establishes turn-on current slew rate. During turn-on, TPS2350 charges this
capacitor to establish the reference input to the LCA at 1% of the voltage from RAMP to SOURCE. The
closed-loop control of the LCA and the pass FET maintains the current-sense voltage from SENSE to SOURCE
at the reference potential, so the load current slew rate is directly set by the voltage ramp rate at the RAMP pin.
When fully charged, RAMP can exceed SOURCE by 6 V, but the reference is internally clamped to 42 mV,
limiting load current to 42 mV/R
capacitor is discharged and held low to initialize for the next turn on.
. When the output is disabled via OV, UV, or due to a load fault, the RAMP
SENSE
RTN: Positive supply input. For negative voltage systems, this pin connects directly to the return node of the
input power bus.
SENSE: Current sense input. An external low-value resistor connected between SENSE and SOURCE is used
to monitor current magnitude. There are two internal device thresholds associated with the voltage at the
SENSE pin. During ramp-up of the load capacitance or during other periods of excessive demand, the linear
current amp (LCA) will regulate this voltage to 42 mV. Whenever the LCA is in current regulation mode, the
capacitor at FLTTIM is charging and the timer is running. If the LCA is saturated, GAT is pulled 14 V above
SOURCE. At this time, a fast fault such as a short circuit can cause the SENSE voltage to rapidly exceed 120 mV
(the overload threshold). In this case, the GAT pin is pulled low rapidly, bypassing the fault timer.
SOURCE: Connection to the sources of the input supply negative rail selector FETs and the negative terminal
of the current sense resistor. The supply select comparator will turn on the appropriate power FET to connect
SOURCE to the more negative of –VINA and –VINB.
UV: Under voltage comparator input. This input is typically connected to a voltage divider between RTN and
SOURCE to sense the magnitude of the more negative input supply. If UV is more than 1.4 V above SOURCE,
OV is less than 1.4 V above SOURCE, and there is no fault, the linear current amp will be enabled. In the event
of a fault, pulling UV low or OV high will reset the fault latch and allow restarting. UV can also be used as an
active high logic enable input. The under-voltage comparator hysteresis is programmed by the equivalent
resistance seen looking into the divider at the UV input.
−VINA: Negative supply input A. This pin connects directly to the first input supply negative rail.
−VINB: Negative supply input B. This pin connects directly to the second input supply negative rail.
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ꢀꢁ ꢂ ꢃꢄ ꢅꢆ
SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
TYPICAL CHARACTERISTICS
SUPPLY SELECTOR THRESHOLD VOLTAGE
SUPPLY SELECTOR THRESHOLD VOLTAGE
vs
vs
AMBIENT TEMPERATURE, −VINA FALLING
AMBIENT TEMPERATURE, −VINB FALLING
−0.350
−0.375
−0.400
−0.425
−0.450
−0.350
−0.375
−0.400
−0.425
−0.450
V
= 0 V
V
= 0 V
(RTN)
Relative to −VINA
(RTN)
Relative to −VINB
V
= −48 V
(−VINB)
V
= −48 V
(−VINA)
V
= −20 V
(−VINB)
V
= −20 V
(−VINA)
V
= −80 V
(−VINB)
V
= −80 V
(−VINA)
−40
−15
10
35
60
85
−40
−15
T
10
35
60
85
T
A
− Ambient Temperature − °C
− Ambient Temperature − °C
A
Figure 1
Figure 2
GATA HIGH-LEVEL OUTPUT VOLTAGE
GATB HIGH-LEVEL OUTPUT VOLTAGE
vs
vs
AMBIENT TEMPERATURE
AMBIENT TEMPERATURE
16
12
8
16
12
8
V
= −20 V
(−VINA)
V
= −48 V
V
= −20 V
(−VINB)
V
= −48 V
(−VINB)
(−VINA)
V
= −12 V
V
= −12 V
(−VINB)
(−VINA)
4
4
V
= V
(−VINB)
= 0 V
10
V
= V = 0 V
(−VINA)
(RTN)
Relative to −VINA
(RTN)
Relative to −VINB
0
0
−40
−40
−15
T
35
60
85
−15
10
35
60
85
− Ambient Temperature − °C
T
A
− Ambient Temperature − °C
A
.
Figure 3
Figure 4
7
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
TYPICAL CHARACTERISTICS
GATx SINK CURRENT
vs
AMBIENT TEMPERATURE
SUPPLY CURRENT
vs
AMBIENT TEMPERATURE
100
80
1500
1200
V
= V = 0 V
(−VINB)
(RTN)
V
= −80 V
(−VINA)
GATA Output
V
=V
(−VINB)
OUT(GATA)
=0V
= −48 V
= −41 V
(RTN) (−VINA)
V
60
40
20
V
900
600
300
0
GATB Output
=V
V
V
=0V
(RTN) (−VINB)
V
= −48 V
(−VINA)
OUT(GATB)
= −41 V
V
= −48 V
(−VINA)
V
= −20 V
(−VINA)
V
= −12 V
(−VINA)
0
−40
−40
−15
10
35
60
85
−15
10
35
60
85
T
A
− Ambient Temperature − °C
T
A
− Ambient Temperature − °C
Figure 5
Figure 6
UNDERVOLTAGE PULL-UP CURRENT
VOLTAGE COMPARATOR THRESHOLDS
vs
vs
AMBIENT TEMPERATURE
AMBIENT TEMPERATURE
1.42
1.41
1.40
1.39
1.38
−9.0
−9.4
V
= V = 0 V
(RTN) (−VINB)
V
= V
(−VINA)
−V
= 0 V
≤ −20 V
(RTN)
(−VINB)
Relative to −VINA
−48 V ≤ V
V
=2.5V
IN(UV) IN(SOURCE)
OV Comparator
= −80 V
V
(−VINA)
−9.8
−10.2
−−10.6
−11.0
UV Comparator
−48 V≤ V ≤ −20 V
(−VINA)
−40
−15
T
10
35
60
85
−40
−15
T
10
35
60
85
− Ambient Temperature − °C
− Ambient Temperature − °C
A
A
Figure 7
Figure 8
8
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
TYPICAL CHARACTERISTICS
RAMP OUTPUT CURRENT
GAT HIGH-LEVEL OUTPUT VOLTAGE
vs
vs
AMBIENT TEMPERATURE, REDUCED RATE MODE
AMBIENT TEMPERATURE
−460
16
12
8
V
V
= V
= 0 V
(RTN)
(−VINB)
−V
=0.25V
OUT(RAMP) IN(SOURCE)
−480
−500
V
= −48 V
(−VINA)
V
= −20 V
(−VINA)
V
= −12 V
(−VINA)
−520
−540
V
= −12 V
(−VINA)
V
= −48 V
(−VINA)
4
V
= −36 V
(−VINA)
−560
V
V
= V = 0 V
(−VINB)
(RTN)
−V
=0V
35
IN(SENSE) IN(SOURCE)
I
= −10 µA
OUT(GAT)
−580
0
−40
−40
−15
10
35
60
85
−15
10
60
85
T
A
− Ambient Temperature − °C
T
A
− Ambient Temperature − °C
Figure 9
Figure 10
TIMER CHARGING CURRENT
vs
AMBIENT TEMPERATURE
RAMP OUTPUT CURRENT
vs
AMBIENT TEMPERATURE, NORMAL RATE MODE
−8.5
−46
−48
V
V
= V
(−VINB)
= 0 V
Average for V
−V
=1V, 3 V
(RTN)
OUT(RAMP) IN(SOURCE)
− V
= 2 V
V
= V
= 0 V
OUT(FLTTIM)
IN(SOURCE)
(RTN)
−80 V ≤ V
(−VINB)
−80 V ≤ V
≤ −20 V
≤ −12 V
(−VINA)
(−VINA)
−9.1
−9.7
−52
−54
−10.3
−10.9
−11.5
0
−40
−15
10
35
60
85
−40
−15
10
35
60
85
T
A
− Ambient Temperature − °C
T
A
− Ambient Temperature − °C
Figure 11
Figure 12
9
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
TYPICAL CHARACTERISTICS
TIMER DISCHARGE CURRENT
FAULT LATCH THRESHOLD VOLTAGE
vs
vs
AMBIENT TEMPERATURE
AMBIENT TEMPERATURE
0.50
0.45
4.25
4.15
V
= V
(−VINA)
= 0 V
≤ −20 V
V
= V
= −48 V
= 0 V
(RTN)
(−VINB)
(RTN) (−VINB)
−80 V ≤ V
V
(−VINA)
V
−V
=2V
Relative to SOURCE
OUT(FLTTIM) IN(SOURCE)
0.40
0.35
4.05
3.95
0.30
0.25
3.85
3.75
0.20
−40
−15
T
10
35
60
85
−40
−15
10
35
60
85
− Ambient Temperature − °C
T
A
− Ambient Temperature − °C
A
Figure 13
Figure 14
10
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
FUNCTIONAL BLOCK DIAGRAM
RTN
1
Input UV
Comparator
3
4
UV
OV
+
1.4 V
Input OV
Comparator
Disable
2
FLT
+
1.4 V
Fault Latch
S
Q
120 mV
4 µs
Filter
Retry
Timer
Fault
Timer
+
R
Q
Overload
Comparator
5
FLTTIM
SENSE
+
11
GAT
10
Linear Current
Amp
99R
6
RAMP
Power Good
Detection
Disable
12
PG
42 mV
R
+
7
SOURCE
Supply Select
Comparator
+
9
8
GATA
GATB
400 mV
Hysteresis
14
−VINA
13
−VINB
11
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APPLICATION INFORMATION
SUPPLY SECTION
The supply selection comparator selects between –VINA and –VINB based on which supply has a larger
magnitude. To prevent chattering between two nearly identical supplies, the supply selection comparator has
400 mV of hysteresis. This prevents supply noise or ripple from tripping the comparator and should be adequate
for most systems. Hysteresis is set to 400 mV to give the highest noise margin without allowing conduction in
the body diodes of the supply selection FETs.
For systems with many cards, high current cards, or long cables between the power and the load, the voltage
loss in the cable can be significant. If the supplies are close to the same magnitude, then the voltage loss in the
cable could cause enough drop to exceed the supply selection comparator hysteresis. In this case, the supply
selection comparator hysteresis must be increased.
TPS2350 allows you to increase the hysteresis of the supply selection comparator with external resistors,
limited to the threshold of the external FETs. Figure 15 shows shows a system with higher hysteresis, set by
R4, R5, R6 and R7. The resistors act as a simple multiplier to increase the voltage differential required to switch
the comparator. For example, for R4 = R5 = 40 kΩ, and R6 = R7 = 20 kΩ, the hysteresis is approximately 1.2 V.
Because of the large hysteresis, the supply selection power FETs are replaced with dual power FETs, configured
so that the body diodes can never conduct. The GATA and GATB outputs are able to switch dual FETs, so no
additional drive or logic circuits are required.
RTN
C
LOAD
R
R1
1
LOAD
RTN
Q1
POWER GOOD
FAULT
12
2
11
10
PG
FLT
UV
GAT
SENSE
TPS2350
R
SENSE
3
7
9
8
SOURCE
GATA
R2
R3
Q2
Q4
4
OV
Q3
GATB
FLTTIM RAMP −VINA −VINB
5
6
14
13
Q5
R6
R7
R4
R5
C
C
RAMP
FLT
UDG−03121
−VINB
−VINA
Figure 15. Typical Application to Develop Higher Supply Comparator Hysteresis
12
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
APPLICATION INFORMATION
Setting the Sense Resistor Value
Due to the current-limiting action of the internal LCA, the maximum allowable load current for an implementation
is easily programmed by selecting the appropriate sense resistor value. The LCA acts to limit the sense voltage
V
to its internal reference. Once the voltage at the RAMP pin exceeds approximately 4 V, this limit is the
SENSE
clamp voltage, V
. Therefore, a maximum sense resistor value can be determined from equation (1).
REF_K
34 mV
R
v
SENSE
I
IMAX
(1)
where
D
D
R
is the resistor value
SENSE
I
is the desired current limit
IMAX
When setting the sense resistor value, it is important to consider two factors, the minimum current that may be
imposed by the TPS2350, and the maximum load under normal operation of the module. For the first factor,
the specification minimum clamp value is used, as seen in equation (1). This method accounts for the tolerance
in the sourced current limit below the typical level expected (42 mV/R
). (The clamp measurement includes
SENSE
LCA input offset voltage; therefore, this offset does not have to be factored into the current limit again.) Second,
if the load current varies over a range of values under normal operating conditions, then the maximum load level
must be allowed for by the value of R
. One example of this is when the load is a switching converter, or
SENSE
brick, which draws higher input current, for a given power output, when the distribution bus is at the low end of
its voltage range, with decreasing draw at higher supply voltages. To avoid current limit operation under normal
loading, some margin should be designed in between this maximum anticipated load and the minimum current
limit level, or I
> I
, for equation (1).
IMAX
LOAD(max)
For example, using a 10-mΩ sense resistor for a nominal 2-A load application provides a minimum of 1.4 A of
overhead for load variance/margin. Typical bulk capacitor charging current during turn-on is 4.2 A
(42 mV/10 mΩ).
Setting the Inrush Slew Rate
The TPS2350 device enables user-programming of the maximum current slew rate during load start-up events.
A capacitor tied to the RAMP pin (C
sense resistor value has been established, a value for C
equation (2).
in the typical application diagram) controls the di/dt rate. Once the
RAMP
, in microfarads, can be determined from
RAMP
11.3
C
+
RAMP
di
ǒ Ǔ
100 R
SENSE
dt
(max)
(2)
where
D
D
R
is the sense resistor value in Ω
SENSE
(di/dt)
is the desired maximum slew rate in A/s
(max)
For example, if the desired slew rate for the typical application shown is 1500 mA/ms, the calculated value for
C
is about 7500 pF. Selecting the next larger standard value of 8200 pF provides some margin for capacitor
RAMP
and sense resistor tolerances.
The TPS2350 initiates ramp capacitor charging, and consequently load current slewing, at a reduced rate. This
reduced rate applies until the voltage on the RAMP pin is about 0.5 V. The maximum di/dt rate, as set by equation
(2), is effective once the device switches to a 10-µA charging source.
13
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
APPLICATION INFORMATION
Setting the Fault Timing Capacitor
The fault timeout period is established by the value of the capacitor connected to the FLTTIM pin, C . The
FLT
timeout period permits riding out spurious current glitches and surges that may occur during operation of the
system, and prevents indefinite sourcing into faulted loads. However, to ensure smooth voltage ramping under
all conditions of load capacitance and input supply potential, the minimum timeout should be set to
accommodate these system variables. To do this, a rough estimate of the maximum voltage ramp time for a
completely discharged plug-in card provides a good basis for setting the minimum timer delay. This section
presents a quick procedure for calculating the timing capacitance requirement. However, for proper operation
of the TPS2350, there is an absolute minimum value of 0.01-µF for C . This minimum requirement overrides
FLT
any smaller results of equations (7) and (8) below.
Due to the three-phase nature of the load current at turn-on, the load voltage ramp has potentially three distinct
phases. This profile depends on the relative values of load capacitance, input DC potential, maximum current
limit and other factors. The first two phases are characterized by the two different slopes of the current ramp;
the third phase, if required to complete load charging, is the constant-current charging at IMAX. Considering
the two current ramp phases to be one period at an average di/dt simplifies calculation of the required timing
capacitor.
For the TPS2350, the typical duration of the soft-start period, t , is given by equation (3)
SS
t
+ 1260 C
RAMP
SS
(3)
where
D
D
t
is the soft-start period in ms
SS
C
is given in µF
RAMP
During this current ramp period, the load voltage magnitude which is attained is estimated by equation (4).
ǒt Ǔ2
i
AVG
V
+
LSS
SS
2 C
C
100 R
RAMP
SENSE
LOAD
(4)
where
D
D
D
D
V
is the load voltage reached during soft-start
is 3.18 µA for the TPS2350
LSS
i
AVG
C
is the load capacitance in Farads
LOAD
t
is the soft-start period in s
SS
The quantity i
in equation (4) is a weighted average of the two charge currents applied to C
during
RAMP
AVG
turn-on, considering the typical output values.
14
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
APPLICATION INFORMATION
If the result of equation (4) is larger than the maximum input supply value, then the load can be expected to
charge completely during the inrush slewing portion of the insertion event. However, if this voltage is less than
the maximum supply input, V
remaining amount of time required at IMAX is determined from equation (5).
, the HSPM transitions to the constant-current charging of the load. The
IN(MAX)
ǒV
LSSǓ
C
* V
IN(MAX)
LOAD
t
+
CC
V
REF_K(MIN)
R
SENSE
(5)
where
D
D
t
is the constant-current voltage ramp time, in seconds
CC
V
is the minimum clamp voltage, 34 mV
REF_K(MIN)
With this information, the minimum recommended value timing capacitor C
can be determined. The delay
FLT
time needed will be either a time t
load. The quantity t
or the sum of t
and t , according to the estimated time to charge the
SS2
SS2 CC
is the duration of the normal rate current ramp period, and is given by equation (6).
SS2
t
+ 0.35 C
RAMP
SS2
(6)
where
D
C
is given in µF
RAMP
Since fault timing is generated by the constant-current charging of C , the capacitor value is determined from
FLT
either equation (7) or (8), as appropriate.
54 t
SS2
C
C
+
+
FLT(MIN)
FLT(MIN)
3.75
(7)
(8)
54 ǒt
CCǓ
) t
SS2
3.75
where
D
D
D
C
is the recommended capacitor value, in µ-Farads
FLT(MIN)
t
is the result of equation (6), in seconds
SS2
t
is the result of equation (5), in seconds
CC
Continuing this calculation example, using a 220-µF input capacitor (C
), equations (3) and (4) estimate the
LOAD
load voltage ramping to approximately −45 V during the soft-start period. If the module should operate down
to −72-V input supply, approximately another 1.4 ms of constant-current charging may be required. Therefore,
equations (6) and (8) are used to determine C
, and the result is approximately 0.039-µF.
FLT(MIN)
15
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
APPLICATION INFORMATION
Setting the Undervoltage and Overvoltage Thresholds
The UV and OV pins can be used to set the undervoltage (V ) and overvoltage (V ) thresholds of the hot
UV
OV
OV
swap circuit. When the input supply is below V
or above V , the GAT pin is held low, disconnecting power
UV
from the load, and the PG output is deasserted. When input voltage is within the UV/OV window, the GAT pin
drive is enabled, assuming all other input conditions are valid for turn-on.
Threshold hysteresis is provided via two internal sources which are switched to either pin whenever the
corresponding input level exceeds the internal 1.4-V reference. The additional bias shifts the pin voltage in
proportion to the external resistance connected to it. This small voltage shift at the device pin is gained up by
the external divider to input supply levels.
(a)
(b)
GND
GND
R1
200 kΩ
1 %
1
1
R1
R2
R8
RTN
RTN
3
4
UV
3
4
UV
R2
4.99 kΩ
1 %
TPS2350*
OV
TPS2350*
OV
R3
3.92 kΩ
1 %
SOURCE
7
SOURCE
7
R9
−48V
−48V
R1 ) R2 ) R3
R2 ) R3
R1 ) R2
VUV_L
+
+
VTHUV
VUV_L
+
+
VTHUV
R2
R1 ) R2 ) R3
R8 ) R9
VOV_L
VTHOV * IHYSUV R1
VOV_L
VTHOV
UDG−03121
R3
R9
*Additional details omitted for clarity
Figure 16. Programming the Undervoltage and Overvoltage Thresholds
The UV and OV thresholds can be individually programmed with a three-resistor divider connected to the
TPS2350 as shown in the typical application diagram, and again in Figure 16a. When the desired trip voltages
and undervoltage hysteresis have been established for the protected board, the resistor values needed can be
determined from the following equations. Generally, the process is simplest by first selecting the top leg of the
divider (R1 in the diagram) needed to obtain the threshold hysteresis. This value is calculated from equation (9).
V
HYS_UV
R1 +
10 mA
(9)
where
D
V
is the undervoltage hysteresis value
HYS_UV
16
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SLUS574A − JULY 2003 − REVISED SEPTEMBER 2003
APPLICATION INFORMATION
For example, assume the typical application design targets have been set to undervoltage turn-on at 33 V (input
supply rising), turn-off at 31 V (input voltage falling), and overvoltage shutdown at 72 V. Then equation (9) yields
R1 = 200 kΩ for the 2-V hysteresis. Once the value of R1 is selected, it is used to calculate resistors R2 and
R3.
ȱ
Ȳ
ȳ
V
UV_L
1.4 R1
R2 + ǒV * 1.4Ǔ 1 * ǒV
R1Ǔ
ȧ
ȧ
*5
) 10
OV_L
ȴ
UV_L
(10)
(11)
1.4 R1 V
UV_L
R3 + ǒV * 1.4Ǔ ǒV
R1Ǔ
*5
) 10
OV_L
UV_L
where
D
D
V
V
is the UVLO threshold when the input supply is low; i.e., less than V , and
UV
UV_L
is the OVLO threshold when the input supply is low; i.e., less than V
OV
OV_L
Again referring to the Figure 17a schematic, equations (10) and (11) produce R2 = 4.909 kΩ (4.99 kΩ selected)
and R3 = 3.951 kΩ (3.92 kΩ selected), as shown. For the selected values, the expected nominal supply
thresholds are V
= 32.8 V, V
= 30.8 V, and V
= 72.6 V. The hysteresis of the overvoltage threshold,
UV_L
UV_H
OV_L
as seen at the supply inputs, is given by the quantity (10 µA) × (R1 + R2). For the majority of applications, this
value is very nearly the same as the UV hysteresis, since typically R1 >> R2.
If more independent control is needed for the OVLO hysteresis, there are several options. One option is to use
separate dividers for both the UV and OV pins, as shown in Figure 16b. In this case, once R1 and R8 have been
selected for the required hysteresis per equation (9), and values for the bottom resistors in the divider (R2 and
R9 in Figure 16b) can be calculated using equation (12).
V
REF
R
R
(TOP)
+ ǒV
REFǓ
XVLO
* V
XV_L
(12)
where
D
D
D
D
R
R
V
is R2 or R9
XVLO
is R1 or R8 as appropriate for the threshold being set
(TOP)
is the under (V
) or overvoltage (V
) threshold at the supply input, and
XV_L
UV_L
OV_L
V
is either V
or V
from the specification table, as required for the resistor being calculated.
REF
THUV
THOV
17
www.ti.com
PACKAGE OPTION ADDENDUM
www.ti.com
19-Jul-2005
PACKAGING INFORMATION
Orderable Device
TPS2350D
Status (1)
ACTIVE
ACTIVE
ACTIVE
ACTIVE
Package Package
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)
Qty
Type
Drawing
SOIC
D
14
14
14
14
50 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
TPS2350DR
SOIC
D
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
TPS2350PW
TPS2350PWR
TSSOP
TSSOP
PW
PW
90 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan
-
The planned eco-friendly classification: Pb-Free (RoHS) or Green (RoHS
&
no Sb/Br)
-
please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
MECHANICAL DATA
MTSS001C – JANUARY 1995 – REVISED FEBRUARY 1999
PW (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
14 PINS SHOWN
0,30
0,19
M
0,10
0,65
14
8
0,15 NOM
4,50
4,30
6,60
6,20
Gage Plane
0,25
1
7
0°–8°
A
0,75
0,50
Seating Plane
0,10
0,15
0,05
1,20 MAX
PINS **
8
14
16
20
24
28
DIM
3,10
2,90
5,10
4,90
5,10
4,90
6,60
6,40
7,90
9,80
9,60
A MAX
A MIN
7,70
4040064/F 01/97
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.
D. Falls within JEDEC MO-153
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