UCC3957M-2G4 [TI]

THREE-OR FOUR-CELL LITHIUM-ION PROTECTOR CIRCUIT; 三或四芯锂离子电池保护电路
UCC3957M-2G4
型号: UCC3957M-2G4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

THREE-OR FOUR-CELL LITHIUM-ION PROTECTOR CIRCUIT
三或四芯锂离子电池保护电路

电源电路 电池 电源管理电路 光电二极管 过电流保护 信息通信管理
文件: 总15页 (文件大小:296K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Not Recommended for New Designs  
SLUS236B – JANUARY 1999 – REVISED SEPTEMBER 2002  
FEATURES  
DESCRIPTION  
D
D
D
D
D
D
D
D
Three- or Four-Cell Operation  
Two-Tier Overcurrent Limiting  
The UCC3957 is a BiCMOS three- or four-cell  
lithium-ion battery pack protector designed to  
operate with external P-channel MOSFETs.  
Utilizing external P-channel MOSFETs provides  
the benefits of no loss-of-system ground in an  
overdischarge state, and protects the IC as well as  
battery cells from damage during an overcharge  
state. An internal state machine runs continuously  
to protect each lithium-ion cell from overcharge  
and overdischarge. A separate overcurrent-  
protection block protects the battery pack from  
excessive discharge currents.  
30-µA Typical Supply-Current Consumption  
3.5-µA Typical Supply Current in Sleep Mode  
Smart Discharge Minimizes Losses in  
Overcharge Mode  
6.5-V to 20-V VDD Supply Range  
Highly Accurate Internal Voltage Reference  
Externally Adjustable Delays in Overcurrent  
Controller  
If any cell voltage exceeds the overvoltage  
threshold, the appropriate external P-channel  
MOSFET is turned off, preventing further charge  
current. An external N-channel MOSFET is  
required to level shift to this high-side P-channel  
MOSFET. Discharge current can still flow through  
the second P-channel MOSFET. Likewise, if any  
cell voltage falls below the undervoltage limit, the  
second P-channel MOSFET is turned off and only  
charge current is allowed. Such a cell-voltage  
condition causes the chip to go into low-power  
sleep mode. Attempting to charge the battery  
pack wakes up the chip. A cell-count pin (CLCNT)  
is provided to program the IC for three- or four-cell  
operations.  
D
Detection of Loss-of-Cell Sense Connections  
M PACKAGE  
(TOP VIEW)  
VDD  
CLCNT  
WU  
DVDD  
AVDD  
CDLY2  
DCHG  
CHG  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
AN1  
AN2  
A two-tiered overcurrent controller and external  
current shunt protect the battery pack from  
excessive discharge currents. If the first  
overcurrent threshold level is exceeded, an  
internal timing circuit charges an external  
capacitor to provide a user programmable  
blanking time. If at the end of the blanking time the  
overcurrent condition still exists, the external  
discharge FET is turned off for a period 17 times  
longer than the first blanking period, and then the  
discharge FET is turned back on. If at any time a  
second higher overcurrent threshold is exceeded  
for more than a user programmable time, the  
discharge FET is turned off, and remains off for the  
same period as the first tier off time. This two tiered  
overcurrent-protection scheme allows for  
charging capacitive loads while retaining effective  
short-circuit protection.  
AN3  
AN4  
AN4  
10 CDLY1  
CHGEN  
BATLO  
9
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments  
semiconductor products and disclaimers thereto appears at the end of this data sheet.  
ꢋꢣ  
Copyright 2002, Texas Instruments Incorporated  
ꢟ ꢣ ꢠ ꢟꢘ ꢙꢭ ꢛꢚ ꢞ ꢦ ꢦ ꢤꢞ ꢜ ꢞ ꢝ ꢣ ꢟ ꢣ ꢜ ꢠ ꢨ  
1
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Not Recommended for New Designs  
ꢁꢁ  
ꢇꢈ  
ꢃꢄ  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
block diagram  
VDD  
CLCNT  
WU  
1
2
3
4
5
6
7
8
16 DVDD  
15 AVDD  
14 CDLY2  
CELL  
VOLTAGE  
SELECT  
STATE  
MACHINE  
REFERENCE  
VOLTAGE  
SELECT AND  
COMPARE  
REF  
CLOCK  
DCHG  
AN1  
13  
S
R
Q
UV  
SLEEP  
AN2  
12 CHG  
11 AN4  
VDD  
+
AN3  
AN4  
10 CDLY1  
OVERCURRENT  
CONTROLLER  
BATLO  
9
CHGEN  
UDG00129  
†‡  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage (VDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 V  
Supply current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 mA  
Output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 mA  
Input voltage: (WU) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 V  
(AN1, AN2, AN3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VAN4 VDD  
(CLCNT, CHGEN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 V  
Input voltage range (BATLO) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to 2.5 V  
Storage temperature range, T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
stg  
Operating virtual junction temperature range, T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55°C to 150°C  
J
Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 300°C  
Stresses beyond those listed under absolute maximum ratingsmay cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditionsis not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
Unless otherwise indicated, voltages are reference to ground and currents are positive into and negative out of the specified terminals. Consult  
Packaging Information section of the Portable Products Databook (TI Literature No. SLUD001) for thermal limitations and considerations of  
packages. All voltages are referenced to the AN4 terminal.  
AVAILABLE OPTIONS  
PACKAGED DEVICES  
SSOP (M)  
T
A
NORMAL TO OVERCHARGE VOLTAGE (V)  
4.25 4.30  
UCC3957M1 UCC3957M2 UCC3957M3 UCC3957M4  
4.20  
4.35  
20°C to 70°C  
The M package is available taped and reeled. Add TR suffix to device type (e.g.  
UCC3957M1TR) to order quantities of 2500 devices per reel.  
2
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Not Recommended for New Designs  
ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢇ ꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢉ ꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢂ ꢈ ꢀꢁ ꢁꢂ ꢃꢄ ꢅꢆ ꢊ  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
electrical characteristics over recommended operating free-air temperature range, VDD = 16 V,  
20_C < T < 70_C, T = T . (unless otherwise noted)  
A
A
J
supply  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
5.0  
30  
MAX UNIT  
VDD  
IDD  
Minimum VDD  
Supply current  
5.5  
40  
V
µA  
µA  
V
min  
I
Sleep-mode supply current  
Input voltage for WU  
VDD = 10.4 V  
See Note 2  
3.5  
7.5  
20  
SL  
V
IN  
output  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
70  
MAX UNIT  
Driving-logic low,  
Driving-logic high,  
Driving-logic low,  
Driving-logic high,  
V
O
V
O
V
O
V
O
= 1 V  
40  
100  
3  
µA  
mA  
µA  
I
I
DCHG output current  
DCHG  
= (VDD 1)  
= 1 V  
13  
70  
40  
100  
3  
CHG ouput current  
CHG  
= (VDD 1V)  
15  
mA  
state transitions  
PARAMETER  
TEST CONDITIONS  
See Note 1  
MIN  
4.15  
3.95  
4.20  
4.00  
4.25  
4.05  
4.30  
4.10  
2.5  
2.2  
8
TYP  
4.20  
4.00  
4.25  
4.05  
4.30  
4.10  
4.35  
4.15  
2.6  
MAX UNIT  
V
V
V
V
V
V
V
V
V
V
Normal to overcharge voltage  
Overcharge to normal voltage  
Normal to overcharge voltage  
Overcharge to normal voltage  
Normal to overcharge voltage  
Overcharge to normal voltage  
Normal to overcharge voltage  
Overcharge to normal voltage  
Undercharge to normal voltage  
Normal to undercharge voltage  
Overvoltage to CHG delay  
Undervoltage to DCHG Delay  
Cell sample rate  
4.25  
4.05  
4.30  
4.10  
4.35  
4.15  
4.40  
4.20  
2.7  
V
V
OV  
UCC39571  
UCC39572  
UCC39573  
UCC39574  
OVR  
OV  
See Note 1  
See Note 1  
See Note 1  
See Note 1  
V
V
OVR  
OV  
V
V
OVR  
OV  
V
V
OVR  
UV  
V
2.3  
2.4  
V
UVR  
td  
OV  
td  
UV  
17  
23  
ms  
ms  
ms  
mV  
mV  
V
8
17  
23  
t
S
4
8.5  
11.5  
25  
V
SM  
V
WU  
V
CE  
Smart discharge threshold  
Wakeup input threshold  
BATLO voltage  
4
15  
With respect to VDD  
50  
230  
1.3  
750  
2.6  
Charge-enable input threshold  
0.8  
short-circuit protection  
PARAMETER  
First-tier threshold level  
TEST CONDITIONS  
MIN  
120  
275  
30  
TYP  
150  
375  
50  
MAX UNIT  
V
V
V
V
190  
450  
70  
mV  
mV  
ms  
ms  
µs  
CL1  
BATLO  
Second-tier threshold level  
First-tier blanking time  
Restart time  
CL2  
BATLO  
t
t
t
CDLY1 = 0.1 µF  
CDLY1 = 0.1 µF  
CDLY2 = 10 pF  
B1  
300  
100  
500  
400  
700  
600  
RST  
B2  
Second-tier blanking time  
NOTE 1: Other overvoltage or undervoltage thresholds are available. Please consult the factory.  
2: Refer to Figure 6, for WU leakage characteristics.  
3
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Not Recommended for New Designs  
ꢀ ꢁꢁꢂ ꢃ ꢄ ꢅ ꢆꢇꢈ ꢀ ꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢉ ꢈ ꢀꢁ ꢁꢂ ꢃ ꢄ ꢅ ꢆꢂꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢊ  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
Terminal Functions  
TERMINAL  
I/O  
DESCRIPTION  
NAME  
AN1  
NO.  
4
I
I
Connects to the negative terminal of the top battery cell and the positive terminal of the second battery cell.  
Connects to the bottom terminal of the second battery cell and the top terminal of the third battery cell.  
AN2  
AN3  
5
6
Connects to the bottom terminal of the third battery cell and the top terminal of the fourth battery cell in a four  
cell stack. In a three cell pack it connects to the bottom terminal of the third battery and to AN4.  
I
I
AN4  
7
Connects to the bottom terminal of the battery stack and the top of the current sense resistor.  
AVDD  
15  
Internal analog supply bypass cap pin. Connect a 0.1-µF capacitor between this pin and AN4. This pin is  
nominally 7.3 V.  
O
I
BATLO  
8
9
Connects to the bottom of the current sense resistor and the negative terminal of the battery pack.  
CHGEN  
The charge enable input for the protection IC. This point must be driven high to DVDD or AVDD to allow  
charging of the battery pack. This pin has a very weak pulldown.  
I
CDLY1  
10  
Delay control pin for the short-circuit protection feature. A capacitor connected between this point and AN4  
determines the time delay from when an overcurrent situation is detected to when the FET is turned off. This  
capacitor also controls the hiccup mode timeout period.  
O
O
I
CDLY2  
CLCNT  
14  
2
An external cap can be tied between this pin and AN4 to extend the blanking time on the second current limit  
tier.  
This pin programs the IC for three or four cell operation. Tying this pin low (to AN4) sets four cell operation,  
while tying it high (to DVDD or AVDD) sets three cell operation. This pin is internally pulled low, so open cir-  
cuit conditions always result in four-cell mode.  
DCHG  
CHG  
13  
12  
16  
This pin is used to prevent overdischarge. If the state machine indicates that any cell is undervoltage, this pin  
is driven high with respect to chip substrate so that the external P-channel MOSFET prevents further dis-  
charge. If all cell voltages are above the minimum threshold, this pin is driven low.  
O
O
This pin is used to control an external N-channel MOSFET, which in turn drives a P-channel MOSFET. If at  
least one cell voltage is over the overvoltage threshold, this pin is driven low with respect to AN4. If all cell  
voltages are below this threshold, this pin is driven high.  
DVDD  
Internal digital supply bypass capacitor pin. Connect a 0.1-µF capacitor between this pin and AN4. This pin is  
nominally 7.3V.  
O
I
VDD  
WU  
1
3
Supply voltage to the IC. Connect this point to the top of the lithium-ion battery stack.  
This pin is used to provide a wakeup signal to the IC during sleep mode. Connect this pin to the drain of the  
N-channel level shift MOSFET.  
I
4
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Not Recommended for New Designs  
ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢇ ꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢉ ꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢂ ꢈ ꢀꢁ ꢁꢂ ꢃꢄ ꢅꢆ ꢊ  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
APPLICATION INFORMATION  
overview  
The UCC3957 provides complete protection against overdischarge, overcharge and overcurrent for a three-  
or four-cell lithium-ion battery pack. It uses a flying capacitor technique to sample the voltage across each  
battery cell and compare it to a precision reference. If any cell is in overvoltage or undervoltage, the  
internal-state machine takes the appropriate action to prevent further charge or discharge. High-side P-channel  
MOSFETs are used to independently control charge and discharge current. Figure 1 shows a three-cell  
lithium-ion protector application diagram with the optional charge-enable switch. In this application, the diode  
D1 protects the MOSFET Q2 from inductive kick at turn-off.  
R1  
1 MΩ  
PACK (+)  
Q3  
Q1  
2N7002  
IFR7416  
CHARGE  
D1  
1 A, 50 V  
Q2  
IFR7416  
DISCHARGE  
C1  
0.1 µF  
VDD  
1
2
3
4
5
6
7
8
16  
DVDD  
C2  
0.1 µF  
LIION  
C5  
4.7 µF  
25 V  
BATTERY  
STACK  
CLCNT  
WU  
AVDD 15  
CDLY2 14  
C3  
OPTIONAL  
+
+
+
13  
DCHG  
AN1  
AN2  
AN3  
AN4  
CHG 12  
AN4 11  
C4  
0.022 µF  
CDLY1 10  
R
SENSE  
0.025 Ω  
PACK ()  
BATLO CHGEN  
9
S1  
CLOSE TO ENABLE CHARGING  
UDG98016  
Figure 1. Three-Cell Lithium-Ion Protector Application Diagram  
5
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Not Recommended for New Designs  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
APPLICATION INFORMATION  
overview (continued)  
Figure 2 shows a four-cell protector with optional components to protect the charge FET from excessive  
gate-to-source transients. In this application, the Zener diode VR1 and the resistor R2 are optional. They protect  
the MOSFET Q1 from excessive open-circuit charger voltage. Diode D1 protects MOSFET Q2 from inductive  
kick during turn-off.  
VR1 18 V  
PACK (+)  
R1 1 MΩ  
R2  
10 kΩ  
Q1  
IFR7416  
CHARGE  
D1  
1 A, 50 V  
Q3  
2N7002  
Q2  
IFR7416  
DISCHARGE  
C5  
C1  
0.1 µF  
4.7 µF  
25 V  
VDD  
CLCNT  
WU  
1
2
3
4
5
6
7
8
16  
DVDD  
C2  
0.1 µF  
LIION  
BATTERY  
STACK  
AVDD 15  
CDLY2 14  
C3  
OPTIONAL  
+
+
+
+
13  
AN1  
AN2  
AN3  
AN4  
DCHG  
CHG 12  
AN4 11  
C4  
0.022 µF  
CDLY1 10  
R
SENSE  
0.025 Ω  
BATLO CHGEN  
9
PACK ()  
UDG98017  
Figure 2. Four-Cell Lithium-Ion Protector Application Diagram  
connecting the cell stack  
When connecting the cell stack to the circuit, it is important to do so in the proper order. First, the bottom of the  
stack should be connected to AN4 . Next, the top of the stack should be connected to VDD. The cell taps can  
then be connected to AN1, AN2, and AN3 in any order.  
choosing three or four cells  
For three-cell packs, the cell-count pin (CLCNT) should be connected to the DVDD pin, and the AN3 pin should  
be tied to the AN4 pin. For four-cell applications, the CLCNT pin should be grounded (to AN4) and the AN3 pin  
is connected to the positive terminal of the bottom cell in the stack.  
6
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SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
APPLICATION INFORMATION  
undervoltage protection  
When any cell is found to be overdischarged (below the normal-to-undercharge threshold), the state machine  
turns off both high-side FETs and enters the sleep mode, where current consumption drops to about 3.5 µA.  
It remains in sleep mode until the application of a charger is sensed by the wakeup pin (WU) being raised above  
VDD.  
charging  
Once a charger has been applied, the charge FET is turned on as long as the charge-enable input pin (CHGEN)  
is pulled up to the DVDD pin. If the CHGEN input is left open (or connected to AN4), the charge FET remains  
off.  
During charge, the charge and discharge FETs cycle on and off while the device is in the sleep state  
(undercharge mode), until the cell voltages are all above the undercharge-to-normal threshold. Once the cell  
voltages are above this threshold, the device enters the normal state and the FETs remain on continuously.  
While the device is charging and in undercharge mode, there is an approximate on time of 8 ms corresponding  
to one sampling period, with a very short off time corresponding to undercharge-voltage detect and sleep-mode;  
once WU is pulled back up to PACK(+), wake-up detect again occurs, and a new sampling period/charge cycle  
is initiated.  
open wire protection  
The UCC3957 provides protection against broken-cell sense connections within the pack. If the sense  
connection to one of the cells (pins AN1, AN2, or AN3) should become disconnected, weak internal-current  
sources make the cells that are connected to that wire appear to be in overcharge and charging of the pack is  
prevented.  
overvoltage protection and the smart discharge feature  
If any cell is charged to a voltage exceeding the normal-to-overcharge threshold, the charge FET is turned off,  
preventing further charge current. Hysteresis keeps the charge FET off until the cell voltages have dropped  
below the overcharge-to-normal threshold. In most protector designs, the charge FET is held off completely  
within this voltage band. During this time, discharge current must be conducted through the body diode of the  
charge FET. This forward voltage drop can be as high as 1 V, causing significant power dissipation in the charge  
FET and wasting precious battery power.  
The UCC3957 has a unique smart discharge feature that allows the charge FET to return to on mode (for  
discharge only) while still in the overcharge hysteresis band. This greatly reduces power dissipation in the  
charge FET. This is accomplished by sensing the voltage drop across the current-sense resistor. If this drop  
exceeds 15 mV (corresponding to 0.6 A of discharge current using a .025 sense resistor), the charge FET  
is turned back on. This threshold assures that only discharge current is conducted. In an example using a  
20-mW FET with a 1-V body diode drop and a 1-A load, the power dissipation in Q1 would be reduced from 1  
W to 0.02 W.  
NOTE: A similar technique is not used during charge (when the discharge MOSFET is off due to  
cells being in undervoltage) because the charge current should be low while the cells are in  
undervoltage.  
7
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SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
APPLICATION INFORMATION  
protection against a runaway charger  
The use of a small N-channel level shifter (Q3 in the application diagrams) allows the IC to interface with the  
high-side charge FET (Q1), even in the presence of a runaway charger. Only the drain-source voltage rating  
of the charge FET limits the charge voltage that the protection circuit can withstand. The wakeup (WU) pin is  
designed to handle input voltages greater than VDD, as long as the current is limited. In the examples shown,  
the charge FETs gate-source resistor (R1) provides this current limiting. Note that in Figure 2, a resistor and  
zener (R2 and VR1) have been added to protect Q1 against any possibility of a voltage transient exceeding its  
maximum gate-source rating.  
overcurrent protection  
The UCC3957 protects the battery pack from an overload or a hard short circuit using a two-tier overcurrent  
protection scheme. The overcurrent protection is designed to go into a hiccup mode when the voltage drop  
across an external-sense resistor (connected to the AN4 and BATLO pins) exceeds a certain threshold. In this  
mode, the discharge FET is periodically turned off and on until the fault is removed. Once the fault is removed,  
normal operation is automatically resumed.  
To facilitate charging large capacitive loads, there are two overcurrent threshold voltages, each with its own  
user-programmable time delay. This two-tier approach provides fast response to short circuits, while enabling  
the battery pack to provide short-duration surge currents. It also facilitates the charging of large filter caps  
without causing nuisance overcurrent trips.  
The first-tier threshold is 150 mV nominal, corresponding to 6 A using a .025-sense resistor as shown in the  
examples of Figure 1 and Figure 2. If the pack-discharge current exceeds this amount for a period of time,  
determined by the capacitor on the CDLY1 pin, it then enters the hiccup mode. The first-tier hiccup duty cycle  
is fixed at approximately 6%, minimizing power dissipation in the event of a sustained overload. The absolute  
on and off times of the discharge FET (Q2) are controlled by the CDLY1 capacitor. A curve relating the delay  
(on time) to this capacitor value is shown in Figure 4. The off time is approximately 17 times longer than the on  
time.  
The second-tier overcurrent threshold is nominally 375 mV, corresponding to 15 A using a .025-sense resistor.  
If the pack current exceeds this value for a period of time, determined by the capacitor on the CDLY2 pin, it then  
enters the hiccup-mode with a much lower duty cycle, typically less than 1%. The relationship of this time delay  
(on time) to the CDLY2 capacitor value is shown in the curve of Figure 5. The off time during this hiccup mode  
is still determined by the CDLY1 capacitor, as previously described. This technique greatly reduces the stress  
and power dissipation in the FETs during short-circuit conditions.  
In the examples shown in Figure 1 and Figure 2 (with CDLY1 = .022 µF), the first-tier overcurrent on time is  
approximately 10 msec, while the off time is approximately 170 msec, resulting in a 5.9% duty cycle for currents  
over 6 A (but less than 15 A). If no CDLY2 capacitor is used, the second-tier on time is less than 200 µsec  
(assuming no stray capacitance), resulting in a duty cycle of about 0.1% for currents over 15 A. If CDLY2 = 22pF,  
the typical on time for currents exceeding 15 A is approximately 800 µsec, resulting in a duty cycle of 0.5%.  
8
www.ti.com  
Not Recommended for New Designs  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
APPLICATION INFORMATION  
protecting against inductive kick at turn-off  
In the case of a short circuit, the di/dt that occurs when the discharge FET is turned off can result in a significant  
voltage undershoot at the pack output due to stray inductance. This undershoot can potentially exceed the  
breakdown voltage rating of the discharge FET. A clamp diode (D1 in Figure 1, Figure 2, and Figure 3), or a  
capacitor across the pack output, protects against this possibility. A diode also provides protection from a  
reverse-polarity charger.  
During turn-off, a voltage overshoot can occur at the top of the cell stack, due to wiring inductance and the cells’  
internal equivalent series inductance (ESL). During very high di/dt conditions, such as occurs when turning off  
in response to a short circuit, this voltage overshoot can be significant and potentially damage the IC or the  
discharge FET (Q2). For this reason, it is strongly recommended that a capacitor (C5) be placed across the cell  
stack, from VDD to AN4, and that stray inductance be minimized in the battery-current path. Additional methods  
to reduce di/dt across the cell stack are discussed in the following section.  
controlling discharge FET turn-on and turn-off times  
Slew-rate limiting the pack output voltage at turn-on greatly reduces the surge current into large capacitive  
loads.  
This allows the designer to select shorter overcurrent-delay times, minimizing the stress on Q1 and Q2 in the  
event of a shorted pack output. A simple method of implementing slew-rate limiting is shown in Figure 3. It  
consists of an RC network (R3 and C6) between gate and drain of the discharge FET (Q2) to control its turn-on  
time. This circuit relies on the relatively high-sink impedance (about 20 k) of the UCC3957s DCHG output.  
The values shown for R3 and C6 provide a pack output voltage rise time of about 4.5 ms when the discharge  
FET (Q2) is turned on. Note that the addition of R3 and C6 has made it possible to eliminate the CDLY2  
capacitor, for the quickest response to a true short circuit. While this circuit does not prevent a large surge current  
when inserting a live battery pack into a highly-capacitive load, it does allow it to restart (after one hiccup cycle)  
if this initial surge-current trips the overcurrent protection.  
Increasing the turn-off time of the discharge FET (Q2) reduces the inductive kick that results during turn-off after  
an overcurrent condition. This is accomplished by adding a resistor (R4) in series with the DCHG output. This  
reduction of di/dt at turn-off minimizes the need for a capacitor across the battery stack. It is recommended that  
this resistor value not exceed a few hundred Ohms, in which case the ability to turn off quickly enough into a  
short may be compromised.  
Due to the relatively low-charge currents (typically a few Amperes max), controlling the turn-on and turn-off  
times of the charge FET is not beneficial. In fact, the turn-off time of the charge FET is slow due to the large value  
of R1, the gate-to-source resistor.  
9
www.ti.com  
Not Recommended for New Designs  
ꢀ ꢁꢁꢂ ꢃ ꢄ ꢅ ꢆꢇꢈ ꢀ ꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢉ ꢈ ꢀꢁ ꢁꢂ ꢃ ꢄ ꢅ ꢆꢂꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢊ  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
APPLICATION INFORMATION  
controlling discharge FET turn-on and turn-off times  
Figure 3 shows a four-cell protector with slew-rate limiting the discharge FET. In this application, VR1 and R2  
are optional, They protect Q1 from excessive open-circuit charger voltage. R3 and C6 are chosen based on  
capacitive load that must be driven. R4 minimizes inductive kick at turn-off.  
VR1 18 V  
PACK (+)  
R1 1 MΩ  
R2  
10 kΩ  
Q1  
IFR7416  
CHARGE  
D1  
1 A, 50 V  
R3 1 kΩ  
Q3  
2N7002  
C6  
0.22 µF  
R4  
100 Ω  
Q2  
IFR7416  
DISCHARGE  
C5  
4.7 µF  
25 V  
C1  
0.1 µF  
VDD  
1
2
3
4
5
6
7
8
16  
DVDD  
C2  
0.1 µF  
LIION  
BATTERY  
STACK  
CLCNT  
WU  
AVDD 15  
CDLY2 14  
C3  
OPTIONAL  
+
+
+
+
13  
AN1  
AN2  
AN3  
AN4  
DCHG  
CHG 12  
AN4 11  
C4  
0.022 µF  
CDLY1 10  
R
SENSE  
0.025 Ω  
BATLO CHGEN  
9
PACK ()  
UDG98018  
Figure 3. Four-Cell Lithium-Ion Protector Application Diagram  
10  
www.ti.com  
Not Recommended for New Designs  
ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢇ ꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢉ ꢈ ꢀꢁꢁ ꢂ ꢃꢄ ꢅ ꢆꢂ ꢈ ꢀꢁ ꢁꢂ ꢃꢄ ꢅꢆ ꢊ  
SLUS236B JANUARY 1999 REVISED SEPTEMBER 2002  
TYPICAL CHARACTERISTICS  
TYPICAL TIER-TWO OVERCURRENT DELAY TIME  
TYPICAL TIER-ONE OVERCURRENT DELAY TIME  
vs  
vs  
DELAY CAPACITANCE  
DELAY CAPACITANCE  
1000  
1400  
1200  
100  
10  
1
1000  
800  
Off-time  
600  
400  
Delay  
200  
0
0.1  
0
10  
20  
30  
40  
0.001  
0.01  
0.1  
C
Delay Capacitance pF  
CDLY2  
C
Delay Capacitance µF  
Figure 4  
CDLY1  
Figure 5  
WU LEAKAGE CURRENT  
vs  
INPUT VOLTAGE  
70  
60  
50  
Maximum  
Typical  
40  
30  
20  
Minimum  
10  
0
14  
16  
18  
20  
22  
24  
26  
V
WU  
Wake-Up Input Voltage V  
Figure 6  
11  
www.ti.com  
PACKAGE OPTION ADDENDUM  
www.ti.com  
7-Oct-2013  
PACKAGING INFORMATION  
Orderable Device  
UCC3957M-1  
Status Package Type Package Pins Package  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
-20 to 70  
-20 to 70  
-20 to 70  
-20 to 70  
-20 to 70  
-20 to 70  
-20 to 70  
-20 to 70  
-20 to 70  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
OBSOLETE  
SSOP  
SSOP  
SSOP  
SSOP  
SSOP  
SSOP  
SSOP  
SSOP  
SSOP  
DBQ  
16  
16  
16  
16  
16  
16  
16  
16  
16  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
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Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
UCC3957  
M-1  
UCC3957M-1G4  
UCC3957M-2  
OBSOLETE  
OBSOLETE  
OBSOLETE  
OBSOLETE  
OBSOLETE  
OBSOLETE  
OBSOLETE  
OBSOLETE  
DBQ  
DBQ  
DBQ  
DBQ  
DBQ  
DBQ  
DBQ  
DBQ  
UCC3957  
M-1  
UCC3957  
M-2  
UCC3957M-2G4  
UCC3957M-3  
UCC3957  
M-2  
UCC3957  
M-3  
UCC3957M-3G4  
UCC3957M-4  
UCC3957  
M-3  
UCC3957  
M-4  
UCC3957M-4G4  
UCC3957MTR-3  
UCC3957  
M-4  
UCC3957  
M-3  
UCC3957MTR-3G4  
UCC3957MTR-4  
OBSOLETE  
OBSOLETE  
SSOP  
SSOP  
DBQ  
DBQ  
16  
16  
TBD  
TBD  
Call TI  
Call TI  
Call TI  
Call TI  
-20 to 70  
-20 to 70  
UCC3957  
M-4  
UCC3957MTR-4G4  
OBSOLETE  
SSOP  
DBQ  
16  
TBD  
Call TI  
Call TI  
-20 to 70  
UCC3957  
M-4  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
7-Oct-2013  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
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provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other  
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest  
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TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary  
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TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and  
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