SSM3J108TU [TOSHIBA]

Field Effect Transistor Silicon P-Channel MOS Type High Speed Switching Applications; 场效应晶体管的硅P沟道MOS型高速开关应用
SSM3J108TU
型号: SSM3J108TU
厂家: TOSHIBA    TOSHIBA
描述:

Field Effect Transistor Silicon P-Channel MOS Type High Speed Switching Applications
场效应晶体管的硅P沟道MOS型高速开关应用

晶体 开关 晶体管 场效应晶体管
文件: 总5页 (文件大小:143K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SSM3J108TU  
TOSHIBA Field Effect Transistor Silicon P-Channel MOS Type  
SSM3J108TU  
High Speed Switching Applications  
1.8V drive  
Unit: mm  
Low on-resistance:  
R
on  
R
on  
R
on  
= 363m(max) (@V  
= 230m(max) (@V  
= 158m(max) (@V  
= 1.8 V)  
= 2.5 V)  
= 4.0 V)  
GS  
GS  
GS  
2.1±0.1  
1.7±0.1  
Absolute Maximum Ratings (Ta = 25°C)  
1
2
3
Characteristic  
Drain-Source voltage  
Symbol  
Rating  
Unit  
V
20  
± 8  
V
V
DS  
Gate-Source voltage  
V
GSS  
DC  
I
1.8  
3.6  
800  
D
Drain current  
A
Pulse  
I
DP  
P
P
D (Note 1)  
D (Note 2)  
Drain power dissipation  
Channel temperature  
mW  
500  
T
150  
°C  
°C  
ch  
1: Gate  
Storage temperature range  
T
55~150  
stg  
2: Source  
3: Drain  
Note: Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings.  
UFM  
JEDEC  
JEITA  
Please design the appropriate reliability upon reviewing the  
Toshiba Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual  
reliability data (i.e. reliability test report and estimated failure  
rate, etc).  
TOSHIBA  
2-2U1A  
Weight: 6.6 mg (typ.)  
Note 1: Mounted on ceramic board.  
(25.4 mm × 25.4 mm × 0.8 mm, Cu Pad: 645 mm2 )  
Note 2: Mounted on FR4 board.  
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm2 )  
Electrical Characteristics (Ta = 25°C)  
Characteristic  
Symbol  
Test Conditions  
Min  
Typ.  
Max  
Unit  
V
V
V
I
I
= −1 mA, V  
= −1 mA, V  
= 0  
20  
12  
(BR) DSS  
(BR) DSX  
D
D
GS  
Drain-Source breakdown voltage  
= +8 V  
GS  
Drain cut-off current  
I
V
V
V
V
= −20 V, V = 0  
GS  
10  
μA  
μA  
V
DSS  
DS  
GS  
DS  
DS  
Gate leakage current  
Gate threshold voltage  
Forward transfer admittance  
I
= ±8V, V = 0  
0.3  
1.9  
±1  
1.0  
GSS  
DS  
V
= −3 V, I = −1 mA  
th  
D
Y ⏐  
= −3 V, I =− 0.8 A  
(Note3)  
(Note3)  
3.2  
125  
S
fs  
D
I
= −0.8 A, V  
= −4.0 V  
158  
D
GS  
Drain-Source on-resistance  
R
mΩ  
DS (ON)  
I
I
= −0.4 A, V  
= −0.1 A, V  
= −2.5 V  
= −1.8 V  
(Note3)  
(Note3)  
170  
230  
230  
363  
D
D
GS  
GS  
Input capacitance  
C
V
V
V
= −10 V, V  
= −10 V, V  
= −10 V, V  
= 0, f = 1 MHz  
= 0, f = 1 MHz  
= 0, f = 1 MHz  
250  
45  
pF  
pF  
iss  
DS  
DS  
DS  
GS  
GS  
GS  
Output capacitance  
C
oss  
pF  
Reverse transfer capacitance  
C
35  
rss  
on  
Turn-on time  
Switching time  
t
t
12  
V
V
= −10 V, I = −0.25 A,  
D
= 0~2.5 V, R = 4.7 Ω  
DD  
GS  
ns  
V
G
Turn-off time  
18  
off  
Drain-Source forward voltage  
Note3: Pulse test  
V
I
= 1.8A, V = 0 V  
GS  
(Note3)  
0.85  
1.2  
DSF  
D
1
2007-11-01  
SSM3J108TU  
Switching Time Test Circuit  
(a) Test circuit  
(b) V  
(c) V  
IN  
0 V  
OUT  
10%  
0
IN  
90%  
2.5V  
10 μs  
R
2.5 V  
L
V
DD  
V
OUT  
DS (ON)  
90%  
10%  
V
= -10 V  
= 4.7 Ω  
DD  
R
G
<
D.U. 1%  
V
=
DD  
t
t
f
r
V
: t , t < 5 ns  
IN  
r
f
Common Source  
t
t
off  
on  
Ta = 25°C  
Marking  
Equivalent Circuit (top view)  
3
3
JJ1  
1
2
1
2
Precaution  
V
th  
can be expressed as the voltage between gate and source when the low operating current value is I =1mA for  
D
this product. For normal switching operation, V  
requires a higher voltage than V and V  
requires a lower  
GS (off)  
GS (on)  
th,  
voltage than V  
th.  
(The relationship can be established as follows: V  
< V < V  
)
GS (off)  
th  
GS (on)  
Take this into consideration when using the device.  
Handling Precaution  
When handling individual devices which are not yet mounted on a circuit board, be sure that the environment is  
protected against electrostatic discharge. Operators should wear anti-static clothing, and containers and other objects  
that come into direct contact with devices should be made of anti-static materials.  
2
2007-11-01  
SSM3J108TU  
ID - VGS  
ID - VDS  
-4.0  
10  
1
-5  
-4  
-3  
-2  
-1  
-0  
-10  
Ta=85°C  
0.1  
-2.5  
-1.8  
0.01  
0.001  
0.0001  
25°C  
-25°C  
-1.5  
Common Source  
Ta=25°C  
Common Source  
VDS=-3V  
VGS=-1.2V  
-0.0  
-0.2  
-0.4  
-0.6  
-0.8  
-1.0  
0
1
2
Gate-Source voltage VGS (V)  
Drain-Source voltage VDS (V)  
RDS(ON) - VGS  
RDS(ON) - Ta  
400  
350  
300  
250  
200  
150  
100  
50  
300  
250  
200  
150  
100  
50  
Common Source  
Ta=25°C  
Common Source  
-0.8A  
-1.8V,-0.1A  
-0.4A  
ID=-0.1A  
-2.5V,-0.4A  
VGS=-4V,ID=-0.8A  
0
0
-0 -1 -2 -3 -4 -5 -6 -7 -8 -9 -10  
Gate-Source voltage VGS (V)  
-60 -40 -20  
0
20 40 60 80 100 120 140 160  
Ambient temperature Ta(  
)
RDS(ON) - ID  
Vth - Ta  
400  
350  
300  
250  
200  
150  
100  
50  
-1  
Common Source  
ID=-1mA  
-0.8  
-0.6  
-0.4  
-0.2  
-0  
VDS=-3V  
-1.8V  
-2.5V  
VGS=-4V  
Common Source  
Ta=25°C  
0
-60 -40 -20  
0
20 40 60 80 100 120 140 160  
-0  
-1  
-2  
-3  
-4  
-5  
Ambient temperature Ta(°C)  
Drain current ID (A)  
3
2007-11-01  
SSM3J108TU  
|Yfs| - ID  
IDR - VDS  
Common Source  
VGS=0V  
Ta=25°C  
10.0  
-10  
-1  
25°C  
-25°C  
25°C  
Ta=85°C  
-25°C  
1.0  
-0.1  
Ta=85°C  
-0.01  
-0.001  
Common Source  
VDS=-3V  
Ta=25°C  
0.1  
-0.01  
-0.1  
-1  
-10  
0
0.2  
0.4  
0.6  
0.8  
1
Drain-Source voltage VDS (V)  
Drain current ID (A)  
t - ID  
C - VDS  
1000  
100  
10  
1000  
100  
10  
Common Source  
VDD=10V  
VGS=0 to 2.5V  
Ta=25°C  
toff  
tf  
Ciss  
ton  
tr  
Common Source  
Coss  
Crss  
VGS=0V  
f=1MHz  
Ta=25°C  
1
0.1  
1
10  
100  
-0.01  
-0.1  
-1  
-10  
Drain current ID (A)  
Drain-Source voltage VDS (V)  
Rth - tw  
c
PD - Ta  
1000  
800  
600  
400  
200  
0
1000  
a: mounted on FR4 board  
(25.4mm×25.4mm×1.6mm)  
Cu Pad :25.4mm×25.4mm  
b:mounted on ceramic board  
(25.4mm×25.4mm×0.8mm)  
Cu Pad :25.4mm×25.4mm  
b
a
b
a
100  
10  
1
Single pulse  
a:Mounted on ceramic board  
(25.4mm×25.4mm×0.8mm)  
Cu Pad :25.4mm×25.4mm  
b:Mounted on FR4 board  
(25.4mm×25.4mm×1.6mm)  
Cu Pad :25.4mm×25.4mm  
c:Mounted on FR4 Board  
(25.4mm×25.4mm×1.6mm)  
Cu Pad :0.45mm×0.8mm×3  
0.001  
0.01  
0.1  
1
10  
100  
1000  
0
20 40 60 80 100 120 140 160  
Ambient temperature Ta(°C)  
Pulse w idth tw (S)  
4
2007-11-01  
SSM3J108TU  
RESTRICTIONS ON PRODUCT USE  
20070701-EN GENERAL  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patents or other rights of  
TOSHIBA or the third parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
5
2007-11-01  

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