TLP2601(TP1) [TOSHIBA]

Optocoupler - IC Output, 1 CHANNEL LOGIC OUTPUT OPTOCOUPLER, 10 Mbps, DIP-8;
TLP2601(TP1)
型号: TLP2601(TP1)
厂家: TOSHIBA    TOSHIBA
描述:

Optocoupler - IC Output, 1 CHANNEL LOGIC OUTPUT OPTOCOUPLER, 10 Mbps, DIP-8

输出元件 光电
文件: 总9页 (文件大小:205K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TLP2601  
TOSHIBA Photocoupler GaAAs Ired & PhotoIC  
TLP2601  
Isolated Line Receiver  
Unit in mm  
Simplex / Multiplex Data Transmission  
ComputerPeripheral Interface  
Microprocessor System Interface  
Digital Isolation For A/D, D/A Conversion  
Direct Replacement For HCPL2601  
The TOSHIBA TLP2601 a photocoupler which combines a GaAAs IRed  
as the emitter and an integrated high gain, high speed photodetector.  
The output of the detector circuit is an open collector, Schottky clamped  
transistor.  
A Faraday shield integrated on the photodetector chip reduces the effects  
of capacitive coupling between the input LED emitter and the high gain  
stages of the detector. This provides an effective common mode transient  
immunity of 1000V/µs.  
TOSHIBA  
Weight: 0.54g  
1110C4  
·
·
·
·
·
·
Input current thresholds: I = 5mA max.  
F
Isolation voltage: 2500Vrms min.  
Switching speed: 10MBd  
Common mode transient immunity: 1000V/µs min.  
Guaranteed performance over temp.: 0°C~70°C  
UL Recognized: UL1577, file No. E67349  
Pin Configuration (top view)  
1
2
8
7
Truth Table  
(positive logic)  
3
4
6
5
Input  
Enable  
Output  
SHIELD  
H
L
H
H
L
L
H
H
H
Schematic  
H
L
I
I
CC  
F
L
V
V
2
CC  
I
O
8
+
-
A 0.01 to 0.1µF bypass capacitor must be  
connected between pins 8 and 5 (see Note 1).  
V
F
3
O
6
GND  
SHIELD  
5
I
E
7
V
E
1
2002-09-25  
TLP2601  
Recommended Operating Conditions  
Characteristic  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Input current, low level  
Input current, high level  
Supply voltage, output  
High level enable voltage  
Low level enable voltage  
I
0
6.3 (*)  
4.5  
2.0  
0
¾
¾
¾
¾
¾
250  
20  
µA  
mA  
V
FL  
I
FH  
V
V
5.5  
CC  
EH  
V
V
CC  
V
0.8  
8
V
EL  
Fan out (TTL load)  
N
¾
¾
¾
¾
Operating temperature  
T
0
70  
°C  
opr  
(*) 6.3mA is a guard banded value which allows for at least 20% CTR degradation.  
Initial input current threshold value is 5.0mA or less.  
Maximum Ratings (no derating required)  
Characteristic  
Forward current  
Symbol  
Rating  
Unit  
I
20  
5
mA  
V
F
Reverse voltage  
V
R
Output current  
I
25  
mA  
V
O
Output voltage  
V
-0.5~7  
O
Supply voltage  
V
7
V
V
CC  
(1 minute maximum)  
Enable input voltage  
V
5.5  
E
(not to exceed V  
by more than 500mV)  
CC  
Output collector power dissipation  
Operating temperature range  
Storage temperature range  
Lead solder temperature (10s)  
Isolation voltage  
P
40  
-40~85  
-55~125  
260  
mW  
°C  
o
T
opr  
T
T
°C  
stg  
(**)  
°C  
sol  
2500  
Vrms  
BV  
S
(R.H.60%,AC 1min.,  
(Note 10)  
3540  
V
dc  
(**) 1.6mm below seating plane.  
2
2002-09-25  
TLP2601  
Electrical Characteristics (Ta = 0°C ~70°C unless otherwise noted)  
Characteristic  
Symbol  
Test Condition  
= 5.5V, V = 5.5V  
Min.  
Typ.  
1
Max.  
Unit  
V
CC  
O
High level output current  
I
¾
250  
mA  
OH  
I
= 250mA, V = 2.0V  
E
F
V
V
= 5.5V, I = 5mA  
F
CC  
Low level output voltage  
High level supply current  
V
¾
¾
0.4  
7
0.6  
15  
V
OL  
= 2.0V, I (sinking) = 13mA  
E
OL  
I
V
= 5.5V, I = 0, V = 0.5V  
mA  
CCH  
CC  
F
E
V
V
= 5.5V, I = 10mA  
F
CC  
Low level supply current  
I
¾
12  
19  
mA  
CCL  
= 0.5V  
E
Low level enable current  
High level enable current  
I
V
V
= 5.5V, V = 0.5V  
E
¾
¾
-1.6  
-1  
-2.0  
mA  
mA  
EL  
CC  
CC  
I
= 5.5V, V = 2.0V  
E
¾
EH  
High level enable voltage  
V
(Note 11)  
2.0  
¾
¾
EH  
V
Low level enable voltage  
Input forward voltage  
V
¾
¾
¾
¾
0.8  
EL  
V
I
I
= 10mA, Ta = 25  
= 10mA, Ta = 25℃  
1.65  
1.75  
V
V
F
F
Input reverse breakdown  
voltage  
BV  
5
¾
45  
¾
¾
¾
R
R
Input capacitance  
C
V
= 0, f = 1MHz  
F
¾
¾
pF  
IN  
Input diode temperature  
coefficient  
V /T  
I = 10mA  
F
-2.0  
mV / °C  
F
A
Relative humidity = 45%  
Input-output insulation  
I
Ta=25, t = 5 second  
¾
¾
1
mA  
I-O  
leakage current  
V
V
= 3000Vdc,  
(Note 10)  
I-O  
= 500V, R.H.60%  
Resistance (input-output)  
Capacitance (input-output)  
R
C
5×1010  
¾
¾
W
1014  
0.6  
I-O  
I-O  
(Note 10)  
f = 1MHz,  
(Note 10)  
¾
pF  
I-O  
(**)All typ.values are at VCC = 5V, Ta = 25°C.  
3
2002-09-25  
TLP2601  
Switching Characteristics (Ta = 25, V = 5 V)  
CC  
Test  
Characteristic  
Symbol  
Test Condition  
Min.  
Typ.  
60  
Max.  
75  
Unit  
ns  
Circuit  
Propagation delay time to  
high output level  
t
t
pLH  
pHL  
R = 350, C = 15pF  
L
L
I
= 7.5mA  
Propagation delay time to  
low output level  
F
1
60  
75  
ns  
(Note 2), (Note 3),  
(Note 4)&(Note 5)  
Output rise time(10-90%)  
Output fall time(90-10%)  
Propagation delay time of  
t
t
30  
30  
ns  
ns  
r
f
R = 350, C = 15pF  
L
L
t
t
25  
ns  
ELH  
enable from V to V  
I = 7.5mA  
F
EH  
EL  
2
V
V
= 3.0V  
= 0.5V  
EH  
EL  
Propagation delay time of  
enable from V to V  
25  
ns  
EHL  
EL  
EH  
(Note 6)&(Note 7)  
V
= 400V  
CM  
Common mode transient  
immunity at high output  
level  
R = 350Ω  
L
CM  
1000 10000  
V/µs  
V/µs  
H
V
= 2V  
O(min.)  
I
= 0mA,  
(Note 9)  
(Note 8)  
F
3
V
= 400V  
CM  
Common mode transient  
immunity at low output  
level  
R = 350Ω  
L
CM  
-1000 -10000  
L
V
= 0.8V  
O(max.)  
I
= 7.5mA,  
F
4
2002-09-25  
TLP2601  
Test Circuit 1.  
5V  
t
and t  
pLH  
pHL  
Pulse  
1
2
3
4
8
7
6
5
V
CC  
generator  
I
I
= 7.5mA  
= 3.75mA  
F
F
R
L
Z
r
= 50W  
O
Input I  
F
t = 5ns  
V
O
t
pHL  
(*)  
Output  
monitor-  
ing  
I
V
V
F
OH  
OL  
t
pLH  
C
L
Monitoring  
Output V  
O
GND  
node  
1.5V  
node  
(*) C is approximately 15pF which includes probe and stray wiring capacitance.  
L
Test Circuit 2.  
Input V  
E
monitoring node  
t
and t  
EHL  
ELH  
Pulse  
generator  
5V  
Z
= 50 W  
O
t = 5ns  
r
1
2
3
4
8
V
CC  
3.0V  
1.5V  
R
7.5mA  
dc  
L
7
6
5
Input V  
E
V
O
t
EHL  
I
F
(*)  
Output  
monitor-  
ing  
V
V
OH  
OL  
t
ELH  
C
L
Output V  
O
GND  
1.5V  
node  
(*) C is approximately 15pF which includes probe and stray wiring capacitance.  
L
Test Circuit 3.  
Transient Immunity and Typ. Waveforms.  
1
8
V
5V  
CC  
400V  
0V  
I
F
10%  
90%  
2
7
6
5
R
L
10%  
90%  
t
f
V
A
CM  
3
V
O
t
r
B
4
GND  
V
5V  
V
V
O
O
Switch at A : I = 0mA  
V
FF  
Pulse gen.  
F
Z
= 50 W  
CM  
O
V
OL  
Switch at B : I = 5mA  
F
5
2002-09-25  
TLP2601  
I
– V  
F
DV / DTa – I  
F
F
F
100  
10  
1
-2.6  
-2.4  
-2.2  
-2.0  
-1.8  
-1.6  
-1.4  
Ta = 25°C  
0.1  
1
0.1  
0.3  
3
10  
(mA)  
30  
0.01  
1.0  
1.2  
1.4  
1.6  
(V)  
1.8  
Forward current  
I
F
Forward voltage  
V
F
I
Ta  
V
– I  
F
OH  
O
100  
8
6
4
2
0
V
= 5V  
CC  
I
= 250mA  
F
Ta = 25°C  
50  
30  
V
CC  
= 5.5V  
V
O
= 5.5V  
R =350W  
L
1kW  
10  
4kW  
5
3
0
2
1
3
4
6
5
1
Forward current  
I
F
(mA)  
0
10  
20  
30  
40  
50  
60  
70  
Ambient temperature Ta (°C)  
V
– I  
V
– T  
OL a  
O
F
8
6
4
2
0
I
= 5mA  
F
V
= 5V  
CC  
0.5  
0.4  
0.3  
V
CC  
= 5.5V  
R =350W  
L
V
E
= 2V  
R =4kW  
L
I
=16mA  
OL  
Ta = 70°C  
0°C  
12.8mA  
9.6mA  
6.4mA  
0
1
2
3
4
6
5
0.2  
Forward current  
I
F
(mA)  
80  
0
20  
Ambient temperature Ta (°C)  
40  
60  
6
2002-09-25  
TLP2601  
t
t
– I  
t
t
Ta  
pHL, pLH  
F
pHL, pLH  
120  
120  
100  
R = 4kW  
L
t
R =4kW  
pLH  
L
t
pLH  
100  
80  
350W  
1kW  
t
pLH  
1kW  
t
80  
60  
40  
20  
pLH  
350W  
350W  
350W  
t
pLH  
t
pHL  
60  
1kW  
4kW  
t
1kW  
4kW  
pHL  
40  
T
= 25°C  
a
20  
V
CC  
= 5 V  
V
= 5V  
CC  
17  
I
= 7.5mA  
60  
F
0
9
5
11  
13  
15  
19  
7
0
10  
20  
30  
0
40  
50  
70  
Forward current  
I
F
(mA)  
Ambient temperature Ta (°C)  
t
t
Ta  
t t Ta  
EHL, ELH  
r, f  
320  
300  
80  
70  
60  
50  
40  
30  
20  
10  
0
V
= 5V  
= 7.5mA  
CC  
V
V
= 5V  
= 3V  
CC  
I
F
EH  
R = 4kW  
L
t
R = 4kW  
ELH  
L
I = 7.5mA  
F
t
f
f
280  
80  
1kW  
t
60  
40  
20  
0
350W  
350W  
t
f
1kW  
350W  
350W  
t
ELH  
t
r
t
ELH  
1kW  
4kW  
20  
Ambient temperature Ta (°C)  
10  
30  
40  
50  
60  
70  
0
t
EHL  
1kW  
4kW  
10  
20  
0
30  
40  
50  
60  
70  
Ambient temperature Ta (°C)  
7
2002-09-25  
TLP2601  
Notes  
1. The V  
supply voltage to each TLP2601 isolator must be bypassed by a 0.1µF capacitor of larger.This can be  
CC  
either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected  
as close aspossible to the package V  
CC  
and GND pins of each device.  
2.  
3.  
4.  
5.  
6.  
7.  
t
t
t
t
t
t
Propagation delay is measured from the 3.75mA level on the low to high transition of the input  
current pulse to the 1.5V level on the high to low transition of the output voltage pulse.  
pHL  
pLH  
f
Propagation delay is measured from the 3.75mA level on the high to low transition of the input  
current pulse to the 1.5V level on the low to high transition of the output voltage pulse.  
Fall time is measured from the 10% to the 90% levels of the high to low transition on the output  
pulse.  
Rise time is measured from the 90% to 10% levels of the low to high transition on the output  
pulse.  
r
Enable input propagation delay is measured from the 1.5V level on the low to high transition of  
the input voltage pulse to the 1.5V level on the high to low transition of the output voltage pulse.  
EHL  
ELH  
Enable input propagation delay is measured from the 1.5V level on the high to low transition of  
the input voltage pulse to the 1.5V level on the low to high transition of the output voltage pulse.  
8. CM  
9. CM  
The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain  
L
in the low output state (i.e., V  
< 0.8V).  
OUT  
Measured in volts per microsecond (V / µs).  
The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain  
H
in the high state (i.e., V  
> 2.0V).  
OUT  
Measured in volts per microsecond(V / µs).  
Volts/microsecond can be translated to sinusoidal voltages:  
(dv  
)
CM  
V / µs =  
= f (p.p.)  
V
CM CM  
dt  
Max.  
Example:  
= 318V when f  
V
= 1MHz using CM and CM = 1000V / µs data sheet specified  
L H  
CM  
pp  
CM  
minimum.  
10.  
Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and  
8 shorted together.  
11. Enable  
input  
No pull up resistor required as the device has an internal pull up resistor.  
8
2002-09-25  
TLP2601  
RESTRICTIONS ON PRODUCT USE  
000707EBC  
· TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc..  
· The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this  
document shall be made at the customer’s own risk.  
· Gallium arsenide (GaAs) is a substance used in the products described in this document. GaAs dust and fumes  
are toxic. Do not break, cut or pulverize the product, or use chemicals to dissolve them. When disposing of the  
products, follow the appropriate regulations. Do not dispose of the products with other industrial waste or with  
domestic garbage.  
· The products described in this document are subject to the foreign exchange and foreign trade laws.  
· The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other  
rights of the third parties which may result from its use. No license is granted by implication or otherwise under  
any intellectual property or other rights of TOSHIBA CORPORATION or others.  
· The information contained herein is subject to change without notice.  
9
2002-09-25  

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