ZXTD3M832TA [ZETEX]

MPPSTM Miniature Package Power Solutions DUAL 40V PNP LOW SATURATION TRANSISTOR; MPPSTM微型封装的电源解决方案双路40V PNP低饱和晶体管
ZXTD3M832TA
型号: ZXTD3M832TA
厂家: ZETEX SEMICONDUCTORS    ZETEX SEMICONDUCTORS
描述:

MPPSTM Miniature Package Power Solutions DUAL 40V PNP LOW SATURATION TRANSISTOR
MPPSTM微型封装的电源解决方案双路40V PNP低饱和晶体管

晶体 小信号双极晶体管 开关
文件: 总6页 (文件大小:137K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ZXTD3M832  
TM  
MPPS Miniature Package Pow er Solutions  
DUAL 40V PNP LOW SATURATION TRANSISTOR  
SUMMARY  
PNP  
V
= -40V; R  
= 104m ; I = -3A  
SAT C  
CEO  
DESCRIPTION  
Packaged in the new innovative 3m m x 2m m MLP (Micro Leaded Package)  
outline, these new 4th generation low saturation dual PNP transistors offer  
extrem ely low on state losses m aking them ideal for use in DC-DC circuits and  
various driving and power m anagem ent functions.  
Additionally users gain several other key benefits:  
Perform ance capability equivalent to m uch larger packages  
Im proved circuit efficiency & pow er levels  
PCB area and device placem ent savings  
Low er Package Height (0.9m m nom )  
MLP832  
Reduced com ponent count  
FEATURES  
Low Equivalent On Resistance  
Extrem ely Low Saturation Voltage (-220m V m ax @1A)  
hFE specified up to -3A  
IC = -3A Continuous Collector Current  
3m m x 2m m MLP  
APPLICATIONS  
DC - DC Converters  
Charging circuits  
Power switches  
Motor control  
CCFL Backlighting  
ORDERING INFORMATION  
DEVICE  
REEL  
SIZE  
TAPE  
WIDTH  
QUANTITY  
PER REEL  
ZXTD3M832TA  
ZXTD3M832TC  
7”  
8m m  
8m m  
3000  
13”  
10000  
Underside view  
DEVICE MARKING  
D33  
ISSUE 1 - J UNE 2003  
1
S E M IC O N D U C T O R S  
ZXTD3M832  
ABSOLUTE MAXIMUM RATINGS  
PARAMETER  
S YMBOL  
LIMIT  
-50  
UNIT  
V
Co lle cto r-Ba s e Vo lta g e  
Co lle cto r-Em itte r Vo lta g e  
Em itte r-Ba s e Vo lta g e  
V
V
V
CBO  
CEO  
EBO  
-40  
V
-7.5  
-4  
V
Pe a k Pu ls e Cu rre n t  
I
I
I
A
CM  
(a ) (f)  
Co n tin u o u s Co lle cto r Cu rre n t  
-3  
A
C
B
Ba s e Cu rre n t  
-1000  
m A  
(a )(f)  
Po w e r Dis s ip a tio n a t TA=25°C  
Lin e a r De ra tin g Fa cto r  
P
P
P
P
P
P
1.5  
12  
W
m W/ЊC  
D
D
D
D
D
D
(b )(f)  
Po w e r Dis s ip a tio n a t TA=25°C  
Lin e a r De ra tin g Fa cto r  
2.45  
19.6  
W
m W/ЊC  
(c)(f)  
Po w e r Dis s ip a tio n a t TA=25°C  
Lin e a r De ra tin g Fa cto r  
1
8
W
m W/ЊC  
(d )(f)  
Po w e r Dis s ip a tio n a t TA=25°C  
Lin e a r De ra tin g Fa cto r  
1.13  
9
W
m W/ЊC  
(d )(g )  
Po w e r Dis s ip a tio n a t TA=25°C  
Lin e a r De ra tin g Fa cto r  
1.7  
13.6  
W
m W/ЊC  
(e )(g )  
Po w e r Dis s ip a tio n a t TA=25°C  
3
W
Lin e a r De ra tin g Fa cto r  
24  
m W/ЊC  
Op e ra tin g & S to ra g e Te m p e ra tu re Ra n g e  
J u n ctio n Te m p e ra tu re  
T :T  
-55 to +150  
150  
ЊC  
ЊC  
j
s tg  
T
j
THERMAL RESISTANCE  
PARAMETER  
S YMBOL  
VALUE  
83.3  
51  
UNIT  
ЊC/W  
ЊC/W  
ЊC/W  
ЊC/W  
ЊC/W  
ЊC/W  
(a )(f)  
J u n ctio n to Am b ie n t  
R
R
R
R
R
R
J A  
J A  
J A  
J A  
J A  
J A  
(b )(f)  
J u n ctio n to Am b ie n t  
(b )(f)  
J u n ctio n to Am b ie n t  
125  
(d )(f)  
J u n ctio n to Am b ie n t  
111  
(d )(g )  
J u n ctio n to Am b ie n t  
73.5  
41.7  
(e )(g )  
J u n ctio n to Am b ie n t  
NOTES  
(a) For a dual device surface m ounted on 8 sq cm single sided 2oz copper on FR4 PCB, in still air conditions w ith all exposed pads attached.  
The copper area is split down the centre line into two separate areas with one half connected to each half of the dual device.  
(b) Measured at tϽ5 secs for a dual device surface m ounted on 8 sq cm single sided 2oz copper on FR4 PCB, in still air conditions w ith all  
exposed pads attached. The copper area is split down the centre line into two separate areas with one half connected to each half of the dual  
device.  
(c) For a dual device surface m ounted on 8 sq cm single sided 2oz copper FR4 PCB, in still air conditions w ith m inim al lead connections only.  
(d) For a dual device surface m ounted on 10 sq cm single sided 1oz copper FR4 PCB, in still air conditions w ith all exposed pads attached.  
The copper area is split down the centre line into two separate areas with one half connected to each half of the dual device.  
(e) For a dual device surface m ounted on 85 sq cm single sided 2oz copper FR4 PCB, in still air conditions w ith all exposed pads attached.  
The copper area is split down the centre line into two separate areas with one half connected to each half of the dual device.  
(f) For dual device with one active die.  
(g) For dual device with 2 active die running at equal power.  
(h) Repetitive rating - pulse width lim ited by m ax junction tem perature. Refer to Transient Therm al Im pedance graph.  
(i) The m inim um copper dim ensions required for m ounting are no sm aller than the exposed m etal pads on the base of the device as shown in the  
package dim ensions data. The therm al resistance for a dual device m ounted on 1.5m m thick FR4 board using m inim um copper of 1 oz weight,  
1m m wide tracks and one half of the device active is Rth= 250°C/W giving a power rating of Ptot=500m W  
ISSUE 1 - J UNE 2003  
2
S E M IC O N D U C T O R S  
ZXTD3M832  
TYPICAL CHARACTERISTICS  
ISSUE 1 - J UNE 2003  
3
S E M IC O N D U C T O R S  
ZXTD3M832  
PNP TRANSISTOR ELECTRICAL CHARACTERISTICS (at T  
= 25°C unless otherwise stated)  
am b  
PARAMETER  
S YMBOL  
MIN.  
-50  
TYP. MAX. UNIT CONDITIONS  
Co lle cto r-Ba s e Bre a kd o w n Vo lta g e  
Co lle cto r-Em itte r Bre a kd o w n Vo lta g e  
Em itte r-Ba s e Bre a kd o w n Vo lta g e  
Co lle cto r Cu t-Off Cu rre n t  
V
V
V
-80  
-70  
V
V
I =-100A  
C
(BR)CBO  
(BR)CEO  
(BR)EBO  
CBO  
-40  
I =-10m A*  
C
-7.5  
-8.5  
V
I =-100A  
E
I
I
I
-25  
-25  
-25  
nA  
nA  
nA  
V
V
V
=-40V  
=-6V  
CB  
Em itte r Cu t-Off Cu rre n t  
EBO  
EB  
Co lle cto r Em itte r Cu t-Off Cu rre n t  
Co lle cto r-Em itte r S a tu ra tio n Vo lta g e  
=-32V  
CES  
CES  
V
-25  
-40  
m V I =-0.1A, I =-10m A*  
C B  
CE(s a t)  
-150  
-195  
-210  
-260  
-220  
-300  
-300  
-370  
m V I =-1A, I =-50m A*  
C B  
I =-1.5A, I =-100m A*  
m V  
m V  
m V  
C
B
I =-2A, I =-200m A*  
C
B
I =-2.5A, I =-250m A*  
C
B
Ba s e -Em itte r S a tu ra tio n Vo lta g e  
Ba s e -Em itte r Tu rn -On Vo lta g e  
V
V
-0.97 -1.05  
-0.89 -0.95  
V
V
I =-2.5A, I =-250m A*  
C B  
BE(s a t)  
BE(o n )  
FE  
I =-2.5A, V =-2V*  
C
CE  
S ta tic Fo rw a rd Cu rre n t Tra n s fe r Ra tio  
h
300  
300  
180  
60  
480  
450  
290  
130  
22  
I =-10m A, V =-2V*  
C CE  
I =-0.1A, V =-2V*  
C
CE  
I =-1A, V =-2V*  
C
CE  
I =-1.5A, V =2V*  
C
CE  
I =-3A, V =-2V*  
12  
C
CE  
Tra n s itio n Fre q u e n cy  
f
150  
190  
MHz I =-50m A, V =-10V  
T
C
CE  
f=100MHz  
Ou tp u t Ca p a cita n ce  
Tu rn -On Tim e  
C
t
19  
40  
25  
pF  
ns  
ns  
V
=-10A, f=1MHz  
o b o  
CB  
V
=-15V, I =-0.75A  
C
=I =-15m A  
(o n )  
(o ff)  
CC  
I
B1 B2  
Tu rn -Off Tim e  
t
435  
*Measured under pulsed conditions. Pulse width=300s. Duty cycle Յ 2%  
ISSUE 1 - J UNE 2003  
4
S E M IC O N D U C T O R S  
ZXTD3M832  
TYPICAL CHARACTERISTICS  
ISSUE 1 - J UNE 2003  
5
S E M IC O N D U C T O R S  
ZXTD3M832  
PACKAGE OUTLINE  
Controlling dim ensions are in m illim etres. Approxim ate conversions are given in inches  
PACKAGE DIMENSIONS  
Millim etres  
Inches  
Min  
Millim etres  
Min Max  
0.65 REF  
2.00 BSC  
Inches  
Min Max  
DIM  
DIM  
Min  
0.80  
0.00  
0.65  
0.15  
0.24  
0.17  
Max  
Max  
0.039  
0.002  
A
A1  
A2  
A3  
b
1.00  
0.05  
0.75  
0.25  
0.34  
0.30  
0.031  
0.00  
e
E
0.0256 BSC  
0.0787 BSC  
0.0255 0.0295  
E2  
E4  
L
0.43  
0.63  
0.36  
0.017  
0.006  
0.0249  
0.014  
0.006  
0.009  
0.0098  
0.013  
0.16  
0.20  
0.45  
0.0078 0.0157  
b1  
D
0.0066 0.0118  
0.118 BSC  
L2  
r
0.125  
0.00  
0.005  
3.00 BSC  
0.075 BSC  
0.0029  
D2  
D3  
0.82  
1.01  
1.02  
1.21  
0.032  
0.040  
0Њ  
12Њ  
0Њ  
12Њ  
0.0397 0.0476  
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ISSUE 1 - J UNE 2003  
6
S E M IC O N D U C T O R S  

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