0906-2

更新时间:2024-12-04 05:23:29
品牌:FREESCALE
描述:N-Channel Enhancement-Mode Lateral MOSFETs

0906-2 概述

N-Channel Enhancement-Mode Lateral MOSFETs N沟道增强模式横向的MOSFET

0906-2 数据手册

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Document Number: MRF5S4125N  
Rev. 0, 1/2007  
Freescale Semiconductor  
Technical Data  
RF Power Field Effect Transistors  
N-Channel Enhancement-Mode Lateral MOSFETs  
MRF5S4125NR1  
MRF5S4125NBR1  
Designed for broadband commercial and industrial applications with  
frequencies up to 500 MHz. The high gain and broadband performance of  
these devices make them ideal for large-signal, common-source amplifier  
applications in 28 volt base station equipment.  
Typical Single-Carrier N-CDMA Performance @ 465 MHz: VDD = 28 Volts,  
450-480 MHz, 25 W AVG., 28 V  
SINGLE N-CDMA  
I
DQ = 1100 mA, Pout = 25 Watts Avg., IS-95 CDMA (Pilot, Sync, Paging,  
Traffic Codes 8 Through 13). Channel Bandwidth = 1.2288 MHz. PAR =  
9.8 dB @ 0.01% Probability on CCDF.  
Power Gain — 23 dB  
Drain Efficiency — 30.2%  
ACPR @ 750 kHz Offset — -47.6 dBc in 30 kHz Bandwidth  
LATERAL N-CHANNEL  
RF POWER MOSFETs  
Capable of Handling 10:1 VSWR, @ 28 Vdc, 465 MHz, 125 Watts CW  
Output Power  
Features  
Characterized with Series Equivalent Large-Signal Impedance Parameters  
Internally Matched for Ease of Use  
Qualified Up to a Maximum of 32 VDD Operation  
Integrated ESD Protection  
CASE 1486-03, STYLE 1  
TO-270 WB-4  
MRF5S4125NR1  
200°C Capable Plastic Package  
RoHS Compliant  
In Tape and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel.  
CASE 1484-04, STYLE 1  
TO-272 WB-4  
MRF5S4125NBR1  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
-0.5, +65  
-0.5, +15  
- 65 to +150  
200  
Unit  
Vdc  
Vdc  
°C  
Drain-Source Voltage  
Gate-Source Voltage  
Storage Temperature Range  
V
DSS  
V
GS  
T
stg  
(1,2)  
Operating Junction Temperature  
T
°C  
J
Table 2. Thermal Characteristics  
Characteristic  
(2,3)  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
Case Temperature 90°C, 125 W CW  
Case Temperature 90°C, 25 W CW  
R
θ
JC  
°C/W  
0.33  
0.43  
1. Continuous use at maximum temperature will affect MTTF.  
2. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to access the MTTF  
calculators by product.  
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.  
Select Documentation/Application Notes - AN1955.  
© Freescale Semiconductor, Inc., 2007. All rights reserved.  
Table 3. ESD Protection Characteristics  
Test Methodology  
Class  
Human Body Model (per JESD22-A114)  
Machine Model (per EIA/JESD22-A115)  
Charge Device Model (per JESD22-C101)  
1B (Minimum)  
A (Minimum)  
IV (Minimum)  
Table 4. Moisture Sensitivity Level  
Test Methodology  
Rating  
Package Peak Temperature  
Unit  
Per JESD 22-A113, IPC/JEDEC J-STD-020  
3
260  
°C  
Table 5. Electrical Characteristics (T = 25°C unless otherwise noted)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
Off Characteristics  
Zero Gate Voltage Drain Leakage Current  
I
I
I
10  
1
μAdc  
μAdc  
μAdc  
DSS  
DSS  
GSS  
(V = 65 Vdc, V = 0 Vdc)  
DS  
GS  
Zero Gate Voltage Drain Leakage Current  
(V = 28 Vdc, V = 0 Vdc)  
DS  
GS  
Gate-Source Leakage Current  
10  
(V = 5 Vdc, V = 0 Vdc)  
GS  
DS  
On Characteristics  
Gate Threshold Voltage  
(V = 10 Vdc, I = 400 μAdc)  
V
V
2
3
4
5
Vdc  
Vdc  
Vdc  
GS(th)  
GS(Q)  
DS(on)  
DS  
D
Gate Quiescent Voltage  
(V = 28 Vdc, I = 1100 mAdc, Measured in Functional Test)  
3.5  
4.25  
0.175  
DS  
D
Drain-Source On-Voltage  
(V = 10 Vdc, I = 1.5 Adc)  
V
0.05  
0.3  
GS  
D
(1)  
Dynamic Characteristics  
Reverse Transfer Capacitance  
(V = 28 Vdc 30 mV(rms)ac @ 1 MHz, V = 0 Vdc)  
DS  
C
2.41  
pF  
pF  
rss  
GS  
Output Capacitance  
C
oss  
74.61  
(V = 28 Vdc 30 mV(rms)ac @ 1 MHz, V = 0 Vdc)  
DS  
GS  
Functional Tests (In Freescale Test Fixture, 50 ohm system) V = 28 Vdc, I = 1100 mA, P = 25 W Avg. N-CDMA, f = 465 MHz,  
DD  
DQ  
out  
Single-Carrier N-CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ 750 kHz Offset.  
PAR = 9.8 dB @ 0.01% Probability on CCDF.  
Power Gain  
G
22  
28  
23  
25  
dB  
%
ps  
Drain Efficiency  
η
30.2  
-47.6  
-15  
D
Adjacent Channel Power Ratio  
Input Return Loss  
ACPR  
IRL  
-45  
-9  
dBc  
dB  
1. Part internally input matched.  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
2
B1  
R1  
V
V
BIAS  
SUPPLY  
+
C14 C15 C16  
R2  
C5  
C6  
C13  
B2  
Z19  
L3  
Z10  
R3  
Z9  
Z11 Z12  
Z13  
Z18  
RF  
INPUT  
Z20  
Z21  
L1  
L2  
Z1  
Z2  
Z3  
Z6  
Z7  
Z8  
RF  
OUTPUT  
Z14  
C8  
C11  
Z22  
C7  
C1  
DUT  
C9  
C2  
Z5  
C12  
C3  
C4  
C10  
Z17  
Z15  
Z16  
Z4  
Z1  
Z2  
Z3  
Z4  
Z5  
Z6, Z7  
Z8  
0.186x 0.084Microstrip  
0.206x 0.084Microstrip  
1.171x 0.084Microstrip  
0.275x 0.084Microstrip  
0.985x 0.084Microstrip  
0.130x 0.084Microstrip  
0.131x 0.084Microstrip  
0.675x 0.504Microstrip  
0.397x 0.656Microstrip  
0.071x 0.084Microstrip  
0.008x 0.084Microstrip  
Z13  
0.063x 0.084Microstrip  
0.315x 0.084Microstrip  
0.473x 0.084Microstrip  
0.522x 0.084Microstrip  
0.448x 0.084Microstrip  
0.628x 0.084Microstrip  
0.291x 0.084Microstrip  
0.318x 0.084Microstrip  
0.202x 0.084Microstrip  
0.190x 0.084Microstrip  
Z14  
Z15  
Z16  
Z17  
Z18  
Z19  
Z20  
Z21  
Z22  
Z9  
Z10  
Z11  
Z12  
PCB  
Arlon AD250, 0.030, ε = 2.5  
r
Figure 1. MRF5S4125NR1(NBR1) Test Circuit Schematic  
Table 6. MRF5S4125NR1(NBR1) Test Circuit Component Designations and Values  
Part  
Description  
Part Number  
Manufacturer  
Fair-Rite  
B1, B2  
Ferrite Beads, Short  
2743019447  
C1, C6, C12, C13  
120 pF Chip Capacitors  
0.8-8.0 pF, Variable Capacitors, Gigatrim  
20 pF Chip Capacitors  
ATC600B121BT250XT  
27291SL  
ATC  
C2, C10  
C3, C9  
C4  
Johanson  
ATC  
ATC600B200BT250XT  
ATC600B8R2BT250XT  
GRM55DR61H106KA88L  
ATC600B270BT250XT  
ATC600B470BT250XT  
ATC600B3R3BT250XT  
T491X226K035A5  
8.2 pF Chip Capacitor  
ATC  
C5, C14, C15  
C7  
10 μF, 50 V Chip Capacitors  
27 pF Chip Capacitor  
Murata  
ATC  
C8  
47 pF Chip Capacitor  
ATC  
C11  
3.3 pF Chip Capacitor  
ATC  
C16  
22 μF, 35 V Tantalum Capacitor  
1.6 nH Inductors  
Kemet  
Coilcraft  
Coilcraft  
Vishay  
Vishay  
Vishay  
L1, L2  
L3  
0906-2  
27 nH Inductor  
1812SMS-27N_L  
R1  
1000 Ω, 1/4 W Chip Resistor  
10 kΩ, 1/4 W Chip Resistor  
100 Ω, 1/4 W Chip Resistor  
CRCW12061001FKTA  
CRCW12061002FKTA  
CRCW1206100RFKTA  
R2  
R3  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
3
C14  
C6  
B1  
R1  
C5  
C15  
C16  
B2  
R2  
L1  
C13  
L3  
R3  
C1  
L2  
C8  
C7  
C12  
C4  
C2  
C3  
C9  
C11  
C10  
MRF5S4125N  
Rev. 1  
Figure 2. MRF5S4125NR1(NBR1) Test Circuit Component Layout  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
4
TYPICAL CHARACTERISTICS  
25  
24  
23  
22  
21  
36  
32  
28  
η
D
24  
G
V
I
= 28 Vdc, P = 25 W (Avg.)  
DD out  
= 1100 mA, Single−Carrier N−CDMA  
ps  
DQ  
−45  
−50  
−55  
−60  
−65  
0
ACPR  
−5  
20  
19  
1.2288 MHz Channel Bandwidth  
PAR = 9.8 dB @ 0.01% Probability (CCDF)  
−10  
−15  
−20  
IRL  
18  
17  
ALT1  
420  
430  
440  
450  
460  
470  
480  
490  
500  
f, FREQUENCY (MHz)  
Figure 3. Single-Carrier N-CDMA Broadband Performance @ Pout = 25 Watts Avg.  
25  
24  
52  
48  
44  
40  
23  
22  
21  
20  
19  
18  
17  
η
D
V
I
= 28 Vdc, P = 58 W (Avg.)  
out  
= 1100 mA, Single−Carrier N−CDMA  
DD  
−20  
−30  
−40  
−50  
−60  
0
G
DQ  
ps  
1.2288 MHz, Channel Bandwidth  
PAR = 9.8 dB @ 0.01% Probability (CCDF)  
−5  
ACPR  
IRL  
−10  
−15  
−20  
ALT1  
420  
430  
440  
450  
460  
470  
480  
490  
500  
f, FREQUENCY (MHz)  
Figure 4. Single-Carrier N-CDMA Broadband Performance @ Pout = 58 Watts Avg.  
25  
10  
I
= 1650 mA  
V
= 28 Vdc  
f1 = 465 MHz, f2 = 467.5 MHz  
DQ  
DD  
24  
23  
22  
21  
20  
19  
18  
1375 mA  
1100 mA  
TwoTone Measurements, 2.5 MHz Tone Spacing  
20  
30  
825 mA  
I
= 550 mA  
DQ  
562.5 mA  
550 mA  
825 mA  
40  
−50  
V
= 28 Vdc  
f1 = 465 MHz, f2 = 467.5 MHz  
DD  
1375 mA  
10  
1100 mA  
TwoTone Measurements, 2.5 MHz Tone Spacing  
1
10  
100  
200 300  
1
100  
200 300  
P
, OUTPUT POWER (WATTS) PEP  
out  
P , OUTPUT POWER (WATTS) PEP  
out  
Figure 5. Two-Tone Power Gain versus  
Output Power  
Figure 6. Third Order Intermodulation Distortion  
versus Output Power  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
5
TYPICAL CHARACTERISTICS  
−10  
10  
V
I
= 28 Vdc, P = 120 W (PEP)  
out  
= 1100 mA, TwoTone Measurements  
V
= 28 Vdc  
f1 = 465 MHz, f2 = 467.5 MHz  
DD  
DD  
DQ  
−20  
−30  
−40  
−50  
−60  
−70  
(f1 + f2)/2 = Center Frequency of 465 MHz  
TwoTone Measurements, 2.5 MHz Tone Spacing  
20  
30  
40  
50  
IM3−U  
IM3−L  
3rd Order  
IM5−L  
IM5−U  
5th Order  
IM7−U  
7th Order  
IM7−L  
60  
1
10  
100  
200 300  
1
10  
100  
TWOTONE SPACING (MHz)  
P
, OUTPUT POWER (WATTS) PEP  
out  
Figure 7. Intermodulation Distortion Products  
versus Output Power  
Figure 8. Intermodulation Distortion Products  
versus Tone Spacing  
59  
58  
Ideal  
P6dB = 52.98 dBm (198.6 W)  
57  
56  
P3dB = 52.26 dBm (168.27 W)  
55  
54  
P1dB = 51.16 dBm (130.62 W)  
53  
52  
51  
50  
49  
Actual  
= 28 Vdc, I = 1100 mA  
V
DD  
DQ  
CW  
f = 465 MHz  
24 25 26 27 28 29 30 31 32 33 34 35 36  
P , INPUT POWER (dBm)  
in  
Figure 9. Pulsed CW Output Power versus  
Input Power  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
−25  
−30  
−35  
−40  
−45  
−50  
−55  
−60  
−65  
−70  
−75  
V
= 28 Vdc, I = 1100 mA, f = 465 MHz  
DQ  
SingleCarrier N−CDMA  
DD  
1.2288 MHz Channel Bandwidth, PAR = 9.8 dB  
@ 0.01% Probability (CCDF)  
ACPR  
G
25_C  
ps  
85_C  
T = −30_C  
C
η
D
85_C  
−30_C  
25_C  
ALT1  
−30_C  
25_C  
85_C  
0
1
10  
60  
P
, OUTPUT POWER (WATTS) AVG.  
out  
Figure 10. Single-Carrier N-CDMA ACPR, ALT1, Power  
Gain and Drain Efficiency versus Output Power  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
6
TYPICAL CHARACTERISTICS  
24  
90  
80  
70  
26  
25  
−30_C  
I = 1100 mA  
DQ  
f = 465 MHz  
G
ps  
25_C  
T = −30_C  
C
24  
23  
22  
21  
23  
22  
21  
20  
25_C  
85_C  
85_C 60  
50  
40  
20  
19  
30  
20  
V
I
= 28 Vdc  
= 1100 mA  
DD  
η
D
DQ  
18  
17  
10  
f = 465 MHz  
V
= 24 V  
32 V  
200  
28 V  
DD  
0
0
50  
100  
150  
250  
1
10  
100  
300  
P
, OUTPUT POWER (WATTS) CW  
out  
P , OUTPUT POWER (WATTS) CW  
out  
Figure 12. Power Gain versus Output Power  
Figure 11. Power Gain and Drain Efficiency  
versus CW Output Power  
9
10  
8
10  
7
10  
6
10  
5
10  
90  
110  
130  
150  
170  
190  
210  
230  
250  
T , JUNCTION TEMPERATURE (°C)  
J
This above graph displays calculated MTTF in hours when the device  
is operated at V = 28 Vdc, P = 25 W Avg., and η = 30.2%.  
DD  
out  
D
MTTF calculator available at http:/www.freescale.com/rf. Select  
Tools/Software/Application Software/Calculators to access the MTTF  
calculators by product.  
Figure 13. MTTF versus Junction Temperature  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
7
N-CDMA TEST SIGNAL  
100  
10  
−10  
−20  
−30  
1.2288 MHz  
Channel BW  
1
−40  
−50  
−60  
−70  
−80  
−90  
0.1  
0.01  
IS−95 CDMA (Pilot, Sync, Paging, Traffic Codes 8  
Through 13) 1.2288 MHz Channel Bandwidth  
Carrier. ACPR Measured in 30 kHz Bandwidth @  
750 kHz Offset. PAR = 9.8 dB @ 0.01%  
Probability on CCDF.  
0.001  
−ACPR in 30 kHz −ACPR in 30 kHz  
Integrated BW  
Integrated BW  
0.0001  
0
2
4
6
8
10  
−100  
110  
PEAKTOAVERAGE (dB)  
Figure 14. Single-Carrier CCDF N-CDMA  
−3.6 −2.9 −2.2 −1.5 −0.7  
0
0.7 1.5  
2.2 2.9 3.6  
f, FREQUENCY (MHz)  
Figure 15. Single-Carrier N-CDMA Spectrum  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
8
f = 545 MHz  
Z
f = 545 MHz  
load  
Z
source  
f = 385 MHz  
Z = 25 Ω  
o
f = 385 MHz  
V
= 28 Vdc, I = 1100 mA, P = 25 W Avg.  
DQ out  
DD  
f
Z
Z
load  
W
source  
W
MHz  
385  
405  
425  
445  
465  
485  
505  
525  
545  
4.735 + j2.917  
4.073 + j4.202  
3.987 + j5.466  
3.909 + j6.743  
4.094 + j7.661  
4.128 + j9.483  
4.446 + j11.620  
4.921 + j13.710  
5.437 + j15.838  
2.229 + j5.627  
1.809 + j6.123  
1.842 + j6.684  
1.767 + j7.187  
1.822 + j7.338  
1.566 + j8.397  
1.525 + j9.787  
1.769 + j11.120  
2.023 + j12.467  
Z
Z
=
=
Test circuit impedance as measured from  
gate to ground.  
source  
Test circuit impedance as measured  
from drain to ground.  
load  
Output  
Matching  
Network  
Device  
Under  
Test  
Input  
Matching  
Network  
Z
Z
source  
load  
Figure 16. Series Equivalent Source and Load Impedance  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
9
PACKAGE DIMENSIONS  
E1  
B
A
2X  
E3  
GATE LEAD  
DRAIN LEAD  
D
D1  
4X  
e
4X  
b1  
M
aaa  
C A  
2X  
D2  
2X  
E
NOTES:  
1. CONTROLLING DIMENSION: INCH.  
2. INTERPRET DIMENSIONS AND TOLERANCES  
PER ASME Y14.5M−1994.  
3. DATUM PLANE H− IS LOCATED AT THE TOP OF  
LEAD AND IS COINCIDENT WITH THE LEAD  
WHERE THE LEAD EXITS THE PLASTIC BODY AT  
THE TOP OF THE PARTING LINE.  
4. DIMENSIONS D" AND E1" DO NOT INCLUDE  
MOLD PROTRUSION. ALLOWABLE PROTRUSION  
IS .006 PER SIDE. DIMENSIONS D" AND E1" DO  
INCLUDE MOLD MISMATCH AND ARE DETER−  
MINED AT DATUM PLANE H−.  
5. DIMENSION b1" DOES NOT INCLUDE DAMBAR  
PROTRUSION. ALLOWABLE DAMBAR  
PROTRUSION SHALL BE .005 TOTAL IN EXCESS  
OF THE b1" DIMENSION AT MAXIMUM MATERIAL  
CONDITION.  
F
DATUM  
PLANE  
ZONE J  
H
c1  
A
A1  
2X  
E2  
A2  
NOTE 7  
SEATING  
C
PLANE  
E5  
E4  
PIN 5  
6. DATUMS A− AND −B− TO BE DETERMINED AT  
DATUM PLANE H−.  
7. DIMENSION A2 APPLIES WITHIN ZONE J" ONLY.  
8. HATCHING REPRESENTS THE EXPOSED AREA  
OF THE HEAT SLUG.  
NOTE 8  
INCHES  
DIM MIN MAX  
MILLIMETERS  
MIN  
2.54  
0.99  
1.02  
18.08  
17.48  
0.28  
15.24  
14  
8.97  
3.35  
3.15  
6.86  
8.79  
MAX  
2.64  
1.09  
1.07  
18.29  
17.58  
0.48  
− − −  
14.2  
9.07  
3.56  
3.35  
− − −  
A
A1  
A2  
D
.100  
.039  
.040  
.712  
.688  
.011  
.600  
.551  
.353  
.132  
.124  
.270  
.346  
.104  
.043  
.042  
.720  
.692  
.019  
− − −  
.559  
.357  
.140  
.132  
− − −  
4
1
2
D1  
D2  
D3  
E
D3  
E1  
E2  
E3  
E4  
E5  
F
3
.350  
8.89  
.025 BSC  
0.64 BSC  
b1  
c1  
e
.164  
.007  
.170  
.011  
4.17  
0.18  
4.32  
0.28  
.106 BSC  
.004  
2.69 BSC  
0.10  
aaa  
STYLE 1:  
PIN 1. DRAIN  
2. DRAIN  
3. GATE  
4. GATE  
5. SOURCE  
CASE 1486-03  
ISSUE C  
E5  
BOTTOM VIEW  
TO-270 WB-4  
PLASTIC  
MRF5S4125NR1  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
10  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
11  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
Freescale Semiconductor  
12  
MRF5S4125NR1 MRF5S4125NBR1  
RF Device Data  
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PRODUCT DOCUMENTATION  
Refer to the following documents to aid your design process.  
Application Notes  
AN1907: Solder Reflow Attach Method for High Power RF Devices in Plastic Packages  
AN1955: Thermal Measurement Methodology of RF Power Amplifiers  
AN3263: Bolt Down Mounting Method for High Power RF Transistors and RFICs in Over-Molded Plastic Packages  
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EB212: Using Data Sheet Impedances for RF LDMOS Devices  
REVISION HISTORY  
The following table summarizes revisions to this document.  
Revision  
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Description  
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Jan. 2007  
Initial Release of Data Sheet  
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RF Device Data  
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Rev. 0,1/2007

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