EVAL-AD5533EB [ADI]

32-Channel Precision Infinite Sample-and-Hold; 32通道,高精度无限采样和保持
EVAL-AD5533EB
型号: EVAL-AD5533EB
厂家: ADI    ADI
描述:

32-Channel Precision Infinite Sample-and-Hold
32通道,高精度无限采样和保持

文件: 总16页 (文件大小:354K)
中文:  中文翻译
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32-Channel Precision  
a
Infinite Sample-and-Hold  
AD5533B*  
GENERAL DESCRIPTION  
FEATURES  
The AD5533B combines a 32-channel voltage translation function  
with an infinite output hold capability. An analog input voltage on  
the common input pin, VIN, is sampled and its digital represen-  
tation transferred to a chosen DAC register. VOUT for this DAC  
is then updated to reflect the new contents of the DAC register.  
Channel selection is accomplished via the parallel address inputs  
A0–A4 or via the serial input port. The output voltage range is  
determined by the offset voltage at the OFFS_IN pin and the gain  
of the output amplifier. It is restricted to a range from VSS + 2 V  
to VDD – 2 V because of the headroom of the output amplifier.  
Infinite Sample-and-Hold Capability to ؎0.018% Accuracy  
Infinite Sample-and-Hold Total Unadjusted Error ؎2.5 m V  
High Integration:  
32-Channel DAC in 12 mm 
؋
 12 mm CSPBGA  
Per Channel Acquisition Time of 16 s Max  
Adjustable Voltage Output Range  
Output Impedance 0.5 ⍀  
Output Voltage Span 10 V  
Readback Capability  
DSP/Microcontroller Compatible Serial Interface  
Parallel Interface  
Temperature Range 40؇C to +85؇C  
The device is operated with AVCC = +5 V 5%, DVCC = +2.7 V  
to +5.25 V, VSS = –4.75 V to –16.5 V, and VDD = +8 V to  
+16.5 V and requires a stable 3 V reference on REF_IN as well  
as an offset voltage on OFFS_IN.  
APPLICATIONS  
Optical Networks  
Automatic Test Equipment  
Level Setting  
PRODUCT HIGHLIGHTS  
1. Precision infinite droopless sample-and-hold capability.  
Instrumentation  
Industrial Control Systems  
Data Acquisition  
Low Cost I/O  
2. The AD5533B is available in a 74-lead CSPBGA with a  
body size of 12 mm ϫ 12 mm.  
3. In infinite sample-and-hold mode, a total unadjusted error of  
2.5 mV is achieved by laser-trimming on-chip resistors.  
FUNCTIONAL BLOCK DIAGRAM  
DV  
AV  
V
V
SS  
OFFS IN  
REF IN REF OUT  
CC  
CC  
DD  
V
0
OUT  
V
IN  
DAC  
ADC  
TRACK/RESET  
BUSY  
DAC GND  
AGND  
V
31  
OUT  
AD5533B  
DAC  
DAC  
OFFS OUT  
DGND  
INTERFACE  
CONTROL  
LOGIC  
SER/PAR  
WR  
ADDRESS INPUT REGISTER  
SCLK  
D
D
A4–A0  
CAL OFFSET SEL  
SYNC/CS  
IN  
OUT  
*Protected by U.S. Patent No. 5,969,657; other patents pending.  
REV. A  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, norforanyinfringementsofpatentsorotherrightsofthirdpartiesthat  
may result from its use. No license is granted by implication or otherwise  
under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781/329-4700  
Fax: 781/326-8703  
www.analog.com  
© Analog Devices, Inc., 2002  
(VDD = +8 V to +16.5 V, VSS = –4.75 V to –16.5 V; AVCC = +4.75 V to +5.25 V;  
DVCC = 2.7 V to 5.25 V; AGND = DGND = DAC_GND = 0 V; REF_IN = 3 V; OFFS_IN = 0 V;  
Output Range from VSS + 2 V to VDD – 2 V. All outputs unloaded. All specifications TMIN to TMAX, unless otherwise noted.)  
–SPECIFICATIONS  
AD5533B  
Parameter1  
B Version2  
Unit  
Conditions/Comments  
ANALOG CHANNEL  
VIN to VOUT Nonlinearity  
0.006  
0.018  
2.5  
% typ  
% max  
mV typ  
Input Range 100 mV to 2.96 V  
After Gain and Offset Adjustment  
See TPC 6.  
Total Unadjusted Error (TUE)  
12  
mV max  
min/typ/max  
mV typ  
mV max  
Gain  
Offset Error  
3.51/3.52/3.53  
1
10  
See TPC 2.  
ANALOG INPUT (VIN)  
Input Voltage Range  
Input Lower Dead Band  
0 to 3  
70  
V
Nominal Input Range  
50 mV typ. Referred to VIN.  
See Figure 5.  
mV max  
Input Upper Dead Band  
Input Current  
40  
1
mV max  
µA max  
pF typ  
12 mV typ. Referred to VIN.  
See Figure 5.  
100 nA typ. VIN acquired on  
one channel.  
Input Capacitance3  
20  
ANALOG INPUT (OFFS_IN)  
Input Voltage Range  
0/4  
1
V min/max  
Output Range Restricted from  
VSS + 2 V to VDD – 2 V  
100 nA typ  
Input Current  
µA max  
VOLTAGE REFERENCE  
REF_IN  
Nominal Input Voltage  
Input Voltage Range3  
Input Current  
3.0  
2.85/3.15  
1
V
V min/max  
µA max  
<1 nA typ  
REF_OUT  
Output Voltage  
3
280  
60  
V typ  
ktyp  
ppm/°C typ  
Output Impedance3  
Reference Temperature Coefficient3  
ANALOG OUTPUTS (VOUT 0–31)  
Output Temperature Coefficient3, 4  
DC Output Impedance  
Output Range  
10  
0.5  
ppm/°C typ  
typ  
V
5
SS + 2/VDD – 2  
V min/max  
kmin  
pF max  
mA typ  
dB typ  
dB typ  
µV max  
100 µA Output Load  
Resistive Load3, 5  
Capacitive Load3, 5  
100  
7
–70  
–70  
250  
Short-Circuit Current3  
DC Power Supply Rejection Ratio3  
VDD = +15 V 5%  
VSS = –15 V 5%  
Outputs Loaded  
DC Crosstalk3  
ANALOG OUTPUT (OFFS_OUT)  
Output Temperature Coefficient3, 4  
DC Output Impedance3  
Output Range  
10  
1.3  
ppm/°C typ  
ktyp  
mV typ  
50 to REF_IN – 12  
Output Current  
Capacitive Load  
10  
100  
µA max  
pF max  
Source Current  
DIGITAL INPUTS3  
Input Current  
Input Low Voltage  
10  
0.8  
0.4  
2.4  
2.0  
200  
10  
µA max  
V max  
V max  
V min  
V min  
mV typ  
pF max  
5 µA typ  
DVCC = 5 V 5%  
DVCC = 3 V 10%  
DVCC = 5 V 5%  
DVCC = 3 V 10%  
Input High Voltage  
Input Hysteresis (SCLK and CS Only)  
Input Capacitance  
–2–  
REV. A  
AD5533B  
Parameter1  
B Version2  
Unit  
Conditions/Comments  
3
DIGITAL OUTPUTS (BUSY, DOUT  
Output Low Voltage  
)
0.4  
4.0  
0.4  
2.4  
1
V max  
V min  
V max  
V min  
µA max  
pF typ  
DVCC = 5 V. Sinking 200 µA.  
DVCC = 5 V. Sourcing 200 µA.  
DVCC = 3 V. Sinking 200 µA.  
DVCC = 3 V. Sourcing 200 µA.  
DOUT Only  
Output High Voltage  
Output Low Voltage  
Output High Voltage  
High Impedance Leakage Current  
High Impedance Output Capacitance  
15  
DOUT Only  
POWER REQUIREMENTS  
Power Supply Voltages  
VDD  
VSS  
AVCC  
8/16.5  
V min/max  
V min/max  
V min/max  
V min/max  
–4.75/–16.5  
4.75/5.25  
2.7/5.25  
DVCC  
Power Supply Currents6  
IDD  
ISS  
AICC  
15  
15  
33  
1.5  
280  
mA max  
mA max  
mA max  
mA max  
mW typ  
10 mA typ. All channels full-scale.  
10 mA typ. All channels full-scale.  
26 mA typ  
1 mA typ  
VDD = +10 V, VSS = –5 V  
DICC  
Power Dissipation6  
NOTES  
1See Terminology section.  
2B Version: Industrial temperature range –40°C to +85°C; typical at +25°C.  
3Guaranteed by design and characterization, not production tested.  
4AD780 as reference for the AD5533B.  
5Ensure that you do not exceed TJ (max). See Absolute Maximum Ratings.  
6Outputs unloaded.  
Specifications subject to change without notice.  
(VDD = +8 V to +16.5 V, VSS = –4.75 V to –16.5 V; AVCC = +4.75 V to +5.25 V; DVCC = +2.7 V to +5.25 V;  
AC CHARACTERISTICS AGND = DGND = DAC_GND = 0 V; REF_IN = 3 V; OFFS_IN = 0 V; Output Range from VSS + 2 V to VDD – 2 V.  
All outputs unloaded. All specifications TMIN to TMAX, unless otherwise noted.)  
Parameter  
B Version1  
Unit  
Conditions/Comments  
Output Settling Time2  
Acquisition Time  
3
µs max  
16  
10  
0.2  
400  
5
µs max  
OFFS_IN Settling Time2  
Digital Feedthrough2  
µs max  
500 pF, 5 kLoad; 0 V–3 V Step  
nV-s typ  
nV/Hz typ  
nV-s typ  
Output Noise Spectral Density @ 1 kHz2  
AC Crosstalk2  
NOTES  
1B version: Industrial temperature range –40°C to +85°C; typical at 25°C.  
2Guaranteed by design and characterization, not production tested.  
Specifications subject to change without notice.  
–3–  
REV. A  
AD5533B  
TIMING CHARACTERISTICS  
PARALLEL INTERFACE  
Limit at TMIN, TMAX  
Parameter1, 2  
(B Version)  
Unit  
Conditions/Comments  
t1  
t2  
t3  
t4  
t5  
t6  
0
0
50  
50  
20  
7
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
CS to WR Setup Time  
CS to WR Hold Time  
CS Pulsewidth Low  
WR Pulsewidth Low  
A4–A0, CAL, OFFS_SEL to WR Setup Time  
A4–A0, CAL, OFFS_SEL to WR Hold Time  
NOTES  
1See Parallel Interface Timing Diagram.  
2Guaranteed by design and characterization, not production tested.  
Specifications subject to change without notice.  
SERIAL INTERFACE  
Limit at TMIN, TMAX  
Parameter1, 2  
(B Version)  
Unit  
Conditions/Comments  
fCLKIN  
t1  
t2  
t3  
t4  
t5  
t6  
t73  
t83  
t9  
20  
20  
20  
15  
50  
10  
5
MHz max  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
ns max  
ns max  
ns min  
ns min  
SCLK Frequency  
SCLK High Pulsewidth  
SCLK Low Pulsewidth  
SYNC Falling Edge to SCLK Falling Edge Setup Time  
SYNC Low Time  
DIN Setup Time  
DIN Hold Time  
5
SYNC Falling Edge to SCLK Rising Edge Setup Time for Readback  
SCLK Rising Edge to DOUT Valid  
SCLK Falling Edge to DOUT High Impedance  
10th SCLK Falling Edge to SYNC Falling Edge for Readback  
SCLK Falling Edge to SYNC Falling Edge Setup Time for  
Readback  
20  
60  
400  
7
t10  
t11  
4
NOTES  
1See Serial Interface Timing Diagrams.  
2Guaranteed by design and characterization, not production tested.  
3These numbers are measured with the load circuit of Figure 2.  
4SYNC should be taken low while SCLK is low for readback.  
Specifications subject to change without notice.  
PARALLEL INTERFACE TIMING DIAGRAM  
I
200A  
CS  
OL  
TO  
OUTPUT  
PIN  
1.6V  
WR  
C
50pF  
L
I
200A  
OH  
A4–A0, CAL,  
OFFS SEL  
Figure 1. Parallel Write (ISHA Mode Only)  
Figure 2. Load Circuit for DOUT Timing Specifications  
–4–  
REV. A  
AD5533B  
SERIAL INTERFACE TIMING DIAGRAMS  
t1  
SCLK  
1
2
3
4
5
6
7
8
9
10  
t2  
t3  
SYNC  
t4  
t5  
t6  
D
IN  
MSB  
LSB  
Figure 3. 10-Bit Write (ISHA Mode and Both Readback Modes)  
t1  
t7  
SCLK  
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
10  
t11  
t2  
SYNC  
t10  
t4  
t8  
t9  
D
OUT  
MSB  
LSB  
Figure 4. 14-Bit Read (Both Readback Modes)  
–5–  
REV. A  
AD5533B  
ABSOLUTE MAXIMUM RATINGS1, 2  
Max Continuous Load Current at TJ = 70°C,  
per Channel Group . . . . . . . . . . . . . . . . . . . . . . . 15.5 mA4  
(TA = 25°C, unless otherwise noted.)  
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +17 V  
NOTES  
1Stresses above those listed under Absolute Maximum Ratings may cause perma-  
nent damage to the device. This is a stress rating only; functional operation of the  
device at these or any other conditions above those listed in the operational sections  
of this specification is not implied. Exposure to absolute maximum rating condi-  
tions for extended periods may affect device reliability.  
2Transient currents of up to 100 mA will not cause SCR latch-up.  
3This limit includes load power.  
VSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –17 V  
AVCC to AGND, DAC_GND . . . . . . . . . . . . . –0.3 V to +7 V  
DVCC to DGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V  
Digital Inputs to DGND . . . . . . . . . . –0.3 V to DVCC + 0.3 V  
Digital Outputs to DGND . . . . . . . . . –0.3 V to DVCC + 0.3 V  
REF_IN to AGND, DAC_GND . . . . –0.3 V to AVCC + 0.3 V  
VIN to AGND, DAC_GND . . . . . . . . –0.3 V to AVCC + 0.3 V  
VOUT0–31 to AGND . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V  
OFFS_IN to AGND . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V  
OFFS_OUT to AGND . . . . AGND – 0.3 V to AVCC + 0.3 V  
AGND to DGND . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V  
Operating Temperature Range  
4This maximum allowed continuous load current is spread over eight channels,  
with channels grouped as follows:  
Group 1: Channels 3, 4, 5, 6, 7, 8, 9, 10  
Group 2: Channels 14, 16, 18, 20, 21, 24, 25, 26  
Group 3: Channels 15, 17, 19, 22, 23, 27, 28, 29  
Group 4: Channels 0, 1, 2, 11, 12, 13, 30, 31  
For higher junction temperatures, derate as follows:  
Industrial . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C  
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C  
Junction Temperature (TJ max) . . . . . . . . . . . . . . . . . . 150°C  
74-Lead CSPBGA Package, θJA Thermal Impedance . . 41°C/W  
Reflow Soldering  
Peak Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 220°C  
Time at Peak Temperature . . . . . . . . . . . . 10 sec to 40 sec  
Max Power Dissipation . . . . . . . . . . . . (150°C – TA)/θJA mW3  
Max Continuous  
Load Current  
per Group (mA)  
TJ (°C)  
70  
90  
15.5  
9.025  
6.925  
5.175  
3.425  
2.55  
100  
110  
125  
135  
150  
1.5  
ORDERING GUIDE  
Output  
Output  
Impedance Voltage Span Package  
Package  
Option  
Description  
Function  
(Typ)  
(V)  
Description  
AD5533BBC-1  
AD5533ABC-1  
AD5532ABC-1  
AD5532ABC-2  
AD5532ABC-3  
AD5532ABC-5  
32-Channel Precision ISHA Only  
32-Channel ISHA Only  
0.5 Ω  
0.5 Ω  
0.5 Ω  
0.5 Ω  
500 Ω  
1 kΩ  
10  
10  
10  
20  
10  
10  
10  
74-Lead CSPBGA  
74-Lead CSPBGA  
74-Lead CSPBGA  
74-Lead CSPBGA  
74-Lead CSPBGA  
74-Lead CSPBGA  
74-Lead CSPBGA  
BC-74  
BC-74  
BC-74  
BC-74  
BC-74  
BC-74  
BC-74  
*
*
*
*
*
32 DACs, 32-Channel ISHA  
32 DACs, 32-Channel ISHA  
32 DACs, 32-Channel ISHA  
32 DACs, 32-Channel ISHA  
32 DACs, 32-Channel Precision ISHA  
AD5532/AD5533 Evaluation Board  
AD5532BBC-1  
*
0.5 Ω  
EVAL-AD5533EB  
*Separate Data Sheet  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection. Although  
the AD5533B features proprietary ESD protection circuitry, permanent damage may occur on  
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are  
recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
–6–  
REV. A  
AD5533B  
PIN CONFIGURATION  
1
2
3
4
5
6
7
8
9
10 11  
A
B
C
D
E
F
A
B
C
D
E
F
G
H
J
G
H
J
K
L
K
L
1
2
3
4
5
6
7
8
9
10 11  
74-Lead CSPBGA Ball Configuration  
CSPBGA  
Number  
Ball  
Name  
CSPBGA  
Number  
Ball  
Name  
CSPBGA  
Number  
Ball  
Name  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
A10  
A11  
B1  
B2  
B3  
B4  
B5  
B6  
B7  
B8  
B9  
B10  
B11  
C1  
C2  
C6  
NC*  
A4  
A2  
A0  
CS/SYNC  
DVCC  
SCLK  
OFFSET_SEL  
BUSY  
TRACK/RESET  
NC*  
VO16  
NC*  
A3  
A1  
WR  
DGND  
DIN  
C10  
C11  
D1  
AVCC1  
REF_OUT  
VO20  
DAC_GND2  
AVCC2  
OFFS_OUT  
VO26  
J10  
J11  
K1  
K2  
K3  
K4  
K5  
K6  
K7  
K8  
K9  
K10  
K11  
L1  
L2  
L3  
L4  
L5  
L6  
L7  
L8  
L9  
VO9  
VO11  
VO17  
VO15  
VO27  
VSS3  
VSS1  
VSS4  
VDD2  
VO2  
VO10  
VO13  
VO12  
NC*  
VO28  
VO29  
VO30  
VDD3  
VDD1  
VDD4  
VO31  
VO0  
D2  
D10  
D11  
E1  
E2  
VO14  
E10  
E11  
F1  
AGND1  
OFFS_IN  
VO25  
VO21  
AGND2  
VO6  
VO24  
VO8  
VO5  
VO3  
VO23  
VIN  
VO4  
VO7  
VO22  
VO19  
VSS2  
F2  
F10  
F11  
G1  
G2  
G10  
G11  
H1  
H2  
H10  
H11  
J1  
CAL  
SER/PAR  
DOUT  
REF_IN  
VO18  
DAC_GND1  
NC*  
L10  
L11  
VO1  
NC*  
J2  
J6  
*NC = Not Connected  
REV. A  
–7–  
AD5533B  
PIN FUNCTION DESCRIPTIONS  
Pin  
Function  
AGND (1–2)  
AVCC (1–2)  
Analog GND Pins  
Analog Supply Pins. Voltage range from 4.75 V to 5.25 V.  
VDD Supply Pins. Voltage range from 8 V to 16.5 V.  
VSS Supply Pins. Voltage range from –4.75 V to –16.5 V.  
Digital GND Pins  
V
V
DD (1–4)  
SS (1–4)  
DGND  
DVCC  
DAC_GND (1–2)  
REF_IN  
Digital Supply Pins. Voltage range from 2.7 V to 5.25 V.  
Reference GND Supply for all the DACs  
Reference Voltage for Channels 0–31  
REF_OUT  
Reference Output Voltage  
V
VIN  
A4–A11, A02  
CAL1  
OUT (0–31)  
Analog Output Voltages from the 32 Channels  
Analog Input Voltage  
Parallel Interface. 5-address pins for 32 channels. A4 = MSB of channel address. A0 = LSB.  
Parallel Interface. Control input that allows all 32 channels to acquire VIN simultaneously.  
CS/SYNC  
This pin is both the active low chip select pin for the parallel interface and the frame synchronization pin for  
the serial interface.  
Parallel Interface. Write pin. Active low. This is used in conjunction with the CS pin to address the device  
WR1  
using the parallel interface.  
OFFSET_SEL1  
SCLK2  
Parallel Interface. Offset select pin. Active high. This is used to select the offset channel.  
Serial Clock Input for Serial Interface. This operates at clock speeds up to 20 MHz.  
Data Input for Serial Interface. Data must be valid on the falling edge of SCLK.  
2
DIN  
DOUT  
Output from the DAC Registers for Readback. Data is clocked out on the rising edge of SCLK and is valid  
on the falling edge of SCLK.  
SER/PAR1  
OFFS_IN  
OFFS_OUT  
BUSY  
This pin allows the user to select whether the serial or parallel interface will be used. If the pin is tied low,  
the parallel interface will be used. If it is tied high, the serial interface will be used.  
Offset Input. The user can supply a voltage here to offset the output span. OFFS_OUT can also be tied to  
this pin if the user wants to drive this pin with the offset channel.  
Offset Output. This is the acquired/programmed offset voltage that can be tied to the OFFS_IN pin to  
offset the span.  
This output tells the user when the input voltage is being acquired. It goes low during acquisition and  
returns high when the acquisition operation is complete.  
If this input is held high, VIN is acquired once the channel is addressed. While it is held low, the input to the  
gain/offset stage is switched directly to VIN. The addressed channel begins to acquire VIN on the rising edge  
of TRACK. See TRACK Input section for further information. This input can also be used as a means of  
resetting the complete device to its power-on-reset conditions. This is achieved by applying a low going  
pulse of between 90 ns and 200 ns to this pin. See section on RESET Function for further details.  
TRACK/RESET2  
NOTES  
1Internal pull-down devices on these logic inputs. Therefore, they can be left floating and will default to a logic low condition.  
2Internal pull-up devices on these logic inputs. Therefore, they can be left floating and will default to a logic high condition.  
–8–  
REV. A  
AD5533B  
TERMINOLOGY  
DC Power Supply Rejection Ratio  
VIN to VOUT Nonlinearity  
DC Power Supply Rejection Ratio (PSRR) is a measure of  
the change in analog output for a change in supply voltage  
(VDD and VSS). It is expressed in dBs. VDD and VSS are varied 5%.  
This is a measure of the maximum deviation from a straight line  
passing through the endpoints of the VIN versus VOUT transfer  
function. It is expressed as a percentage of the full-scale span.  
DC Crosstalk  
Total Unadjusted Error (TUE)  
This is the dc change in the output level of one channel in response  
to a full-scale change in the output of all other channels. It is  
expressed in µV.  
This is a comprehensive specification that includes relative accu-  
racy, gain, and offset errors. It is measured by sampling a range  
of voltages on VIN and comparing the measured voltages on  
VOUT to the ideal value. It is expressed in mV.  
Output Settling Time  
This is the time taken from when BUSY goes high to when the  
output has settled to 0.018%.  
Offset Error  
This is a measure of the output error when VIN = 70 mV. Ideally,  
with VIN = 70 mV:  
Acquisition Time  
This is the time taken for the VIN input to be acquired. It is the  
length of time that BUSY stays low.  
VOUT = (Gain × 70) ((Gain 1) × VOFFS _ IN ) mV  
OFFS_IN Settling Time  
This is the time taken from a 0 V–3 V step change in input  
voltage on OFFS_IN until the output has settled to within 0.39%.  
Offset error is a measure of the difference between VOUT (actual)  
and VOUT (ideal). It is expressed in mV and can be positive or  
negative. See Figure 5.  
Digital Feedthrough  
Gain Error  
This is a measure of the impulse injected into the analog outputs  
from the digital control inputs when the part is not being written  
to, i.e., CS/SYNC is high. It is specified in nV-secs and is measured  
with a worst-case change on the digital input pins, e.g., from all  
0s to all 1s and vice versa.  
This is a measure of the span error of the analog channel. It is  
the deviation in slope of the transfer function. See Figure 5. It is  
calculated as:  
Gain Error = Actual Full-Scale Output −  
Ideal Full-Scale Output Offset Error  
Output Noise Spectral Density  
This is a measure of internally generated random noise. Random  
noise is characterized as a spectral density (voltage per root Hertz).  
It is measured by acquiring 1.5 V on all channels and measuring  
noise at the output. It is measured in nV/Hz typ.  
where  
Ideal Full-Scale Output = (Gain × 2.96) ((Gain 1) × VOFFS _ IN  
)
Ideal Gain = 3.52  
AC Crosstalk  
Output Temperature Coefficient  
This is a measure of the change in analog output with changes in  
temperature. It is expressed in ppm/°C.  
This is the area of the glitch that occurs on the output of one chan-  
nel while another channel is acquiring. It is expressed in nV-secs.  
V
OUT  
GAIN ERROR +  
OFFSET ERROR  
IDEAL  
TRANSFER  
FUNCTION  
ACTUAL  
TRANSFER  
FUNCTION  
OFFSET  
ERROR  
0V  
70mV  
2.96 3V  
V
IN  
LOWER  
DEAD BAND  
UPPER  
DEAD BAND  
Figure 5. ISHA Transfer Function  
REV. A  
–9–  
AD5533B–Typical Performance Characteristics  
0.0024  
T
= 25 C  
A
5V  
0.0020  
0.0016  
0.0012  
0.0008  
0.0004  
0.0000  
–0.0004  
–0.0008  
–0.0012  
V
= 3V  
= 0V  
REFIN  
V
OFFS_IN  
100  
90  
BUSY  
V
OUT  
T
= 25؇C  
A
V
= 3V  
REFIN  
V
= 0V TO 1.5V  
IN  
10  
0%  
–0.0016  
–0.0020  
–0.0024  
2s  
1V  
0.1  
2.96  
V
–V  
IN  
TPC 4. Acquisition Time and Output Settling Time  
TPC 1. VIN to VOUT Accuracy After Offset and  
Gain Adjustment  
4
3.530  
70k  
T
= 25 C  
63791  
A
V
= 3V  
= 1.5V  
REFIN  
60k  
50k  
40k  
30k  
20k  
10k  
0
V
IN  
V
= 0V  
OFFS_IN  
3
3.525  
3.520  
3.515  
3.500  
GAIN  
2
OFFSET ERROR  
1
1545  
200  
5.2670  
0
–40  
0
40  
80  
120  
5.2676  
–V  
5.2682  
V
TEMPERATURE –  
C
OUT  
TPC 2. Offset Error and Gain vs. Temperature  
TPC 5. ISHA Mode Repeatability (64 K Acquisitions)  
3.530  
3.525  
3.520  
3.515  
40  
T
V
V
= 25؇C  
A
= 3V  
REFIN  
= 1V  
IN  
20  
0
6
4
2
0
–2  
–4  
–6  
–4 –3 –2 –1  
0
1
2
3
4
5
6
7
8
SINK/SOURCE CURRENT – mA  
TOTAL UNADJUSTED ERROR – mV  
TPC 3. VOUT Source and Sink Capability  
TPC 6. TUE Distribution at 25°C (ISHA Mode)  
–10–  
REV. A  
AD5533B  
ADDRESSED CHANNEL  
FUNCTIONAL DESCRIPTION  
The AD5533B can be thought of as consisting of an ADC and  
32 DACs in a single package. The input voltage VIN is sampled  
and converted into a digital word. The digital result is loaded into  
one of the DAC registers and is converted (with gain and offset)  
into an analog output voltage (VOUT0–VOUT31). Since the chan-  
nel output voltage is effectively the output of a DAC there is no  
droop associated with it. As long as power to the device is main-  
tained, the output voltage will remain constant until this channel  
is addressed again.  
V
IN  
C2  
C1  
7.5pF  
20pF  
Figure 6. Analog Input Circuit  
Large source impedances will significantly affect the performance  
of the ADC. This may necessitate the use of an input buffer  
amplifier.  
To update a single channel’s output voltage, the required new  
voltage level is set up on the common input pin, VIN. The desired  
channel is then addressed via the parallel port or the serial port.  
When the channel address has been loaded, provided TRACK is  
high, the circuit begins to acquire the correct code to load to the  
DAC so that the DAC output matches the voltage on VIN. The  
BUSY pin goes low and remains so until the acquisition is com-  
plete. The noninverting input to the output buffer is tied to VIN  
during the acquisition period to avoid spurious outputs while the  
DAC acquires the correct code. The acquisition is completed in  
16 µs max. The BUSY pin goes high and the updated DAC output  
assumes control of the output voltage. The output voltage of the  
DAC is connected to the noninverting input of the output buffer.  
Since the internal DACs are offset by 70 mV (max) from GND,  
the minimum VIN in ISHA mode is 70 mV. The maximum VIN is  
2.96 V due to the upper dead band of 40 mV (max).  
Output Buffer Stage—Gain and Offset  
The function of the output buffer stage is to translate the  
50 mV–3 V typical output of the DAC to a wider range. This  
is done by gaining up the DAC output by 3.52 and offsetting  
the voltage by the voltage on OFFS_IN pin.  
VOUT = 3.52 ×VDAC 2.52 ×VOFFS_IN  
V
V
DAC is the output of the DAC.  
OFFS_IN is the voltage at the OFFS_IN pin.  
Table I shows how the output range on VOUT relates to the  
offset voltage supplied by the user.  
Table I. Sample Output Voltage Ranges  
VOFFS_IN (V)  
VDAC (V)  
VOUT (V)  
0
1
0.05 to 3  
0.05 to 3  
0.05 to 3  
0.176 to 10.56  
–2.34 to +8.04  
–5.192 to +5.192  
On power-on, all the DACs, including the offset channel, are loaded  
with zeros. Each of the 33 DACs is offset internally by 50 mV (typ)  
from GND so the outputs VOUT0 to VOUT31 are 50 mV (typ) on  
power-on if the OFFS_IN pin is driven directly by the on-board  
offset channel (OFFS_OUT), i.e., if OFFS_IN = OFFS_OUT =  
50 mV = > VOUT = (Gain ϫ VDAC)(Gain – 1) ϫ VOFFS_IN = 50 mV.  
2.130  
VOUT is limited only by the headroom of the output amplifiers.  
VOUT must be within maximum ratings.  
Offset Voltage Channel  
Analog Input  
The offset voltage can be externally supplied by the user at  
OFFS_IN or it can be supplied by an additional offset voltage  
channel on the device itself. The required offset voltage is set up  
on VIN and acquired by the offset DAC. This offset channel’s DAC  
output is directly connected to OFFS_OUT. By connecting  
OFFS_OUT to OFFS_IN, this offset voltage can be used as the  
offset voltage for the 32 output amplifiers. It is important to  
choose the offset so that VOUT is within maximum ratings.  
The equivalent analog input circuit is shown in Figure 6. The  
capacitor C1 is typically 20 pF and can be attributed to pin capaci-  
tance and 32 off-channels. When a channel is selected, an extra  
7.5 pF (typ) is switched in. This capacitor C2 is charged to the  
previously acquired voltage on that particular channel so it must  
charge/discharge to the new level. It is essential that the external  
source can charge/discharge this additional capacitance within  
1 µs–2 µs of channel selection so that VIN can be acquired accu-  
rately. For this reason, a low impedance source is recommended.  
PIN  
DRIVER  
V
1
OUT  
OUTPUT  
STAGE  
DEVICE  
UNDER  
TEST  
V
IN  
ACQUISITION  
CIRCUIT  
CONTROLLER  
DAC  
BUSY  
TRACK  
AD5533B  
THRESHOLD  
VOLTAGE  
ONLY ONE CHANNEL SHOWN FOR SIMPLICITY  
Figure 7. Typical ATE Circuit Using TRACK Input  
REV. A  
–11–  
AD5533B  
Reset Function  
1. ISHA Mode  
The reset function on the AD5533B can be used to reset all  
nodes on this device to their power-on-reset condition. This is  
implemented by applying a low-going pulse of between 90 ns and  
200 ns to the TRACK/RESET pin on the device. If the applied  
pulse is less than 90 ns, it is assumed to be a glitch and no opera-  
tion takes place. If the applied pulse is wider than 200 ns, this pin  
adopts its track function on the selected channel, VIN is switched to  
the output buffer, and an acquisition on the channel will not occur  
until a rising edge of TRACK.  
In this standard mode, a channel is addressed and that channel  
acquires the voltage on VIN. This mode requires a 10-bit  
write (see Figure 3) to address the relevant channel  
(VOUT0–VOUT31, offset channel, or all channels). MSB is  
written first.  
2. Acquire and Readback Mode  
This mode allows the user to acquire VIN and read back the  
data in a particular DAC register. The relevant channel is  
addressed (10-bit write, MSB first) and VIN is acquired in 16 µs  
(max). Following the acquisition, after the next falling edge of  
SYNC, the data in the relevant DAC register is clocked out  
onto the DOUT line in a 14-bit serial format (see Figure 4).  
During readback, DIN is ignored. The full acquisition time  
must elapse before the DAC register data can be clocked out.  
TRACK Function  
Normally in ISHA mode of operation, TRACK is held high and  
the channel begins to acquire when it is addressed. However, if  
TRACK is low when the channel is addressed, VIN is switched  
to the output buffer and an acquisition on the channel will not  
occur until a rising edge of TRACK. At this stage the BUSY pin  
will go low until the acquisition is complete, at which point the  
DAC assumes control of the voltage to the output buffer and  
VIN is free to change again without affecting this output value.  
3. Readback Mode  
Again, this is a readback mode but no acquisition is performed.  
The relevant channel is addressed (10-bit write, MSB first) and  
on the next falling edge of SYNC, the data in the relevant DAC  
register is clocked out onto the DOUT line in a 14-bit serial format  
(see Figure 4). The user must allow 400 ns (min) between the  
last SCLK falling edge in the 10-bit write and the falling edge  
of SYNC in the 14-bit readback. The serial write and read words  
can be seen in Figure 8.  
This is useful in an application where the user wants to ramp up  
V
IN until VOUT reaches a particular level (Figure 7). VIN does  
not need to be acquired continuously while it is ramping up.  
TRACK can be kept low and only when VOUT has reached its  
desired voltage is TRACK brought high. At this stage, the  
acquisition of VIN begins.  
This feature allows the user to read back the DAC register  
code of any of the channels. Readback is useful if the system  
has been calibrated and the user wants to know what code in  
In the example shown, a desired voltage is required on the output  
of the pin driver. This voltage is represented by one input to a  
comparator. The microcontroller/microprocessor ramps up the  
input voltage on VIN through a DAC. TRACK is kept low while  
the voltage on VIN ramps up so that VIN is not continually  
acquired. When the desired voltage is reached on the output of the  
pin driver, the comparator output switches. The µC/µP then  
knows what code is required to be input in order to obtain the  
desired voltage at the DUT. The TRACK input is now brought  
high and the part begins to acquire VIN. BUSY goes low until VIN  
has been acquired. When BUSY goes high, the output buffer  
is switched from VIN to the output of the DAC.  
the DAC corresponds to a desired voltage on VOUT  
.
INTERFACES  
Serial Interface  
The SER/PAR pin is tied high to enable the serial interface and  
to disable the parallel interface. The serial interface is controlled  
by four pins as follows:  
SYNC, DIN, SCLK  
Standard 3-wire interface pins. The SYNC pin is shared  
with the CS function of the parallel interface.  
DOUT  
MODES OF OPERATION  
Data out pin for reading back the contents of the DAC registers.  
The data is clocked out on the rising edge of SCLK and is  
valid on the falling edge of SCLK.  
The AD5533B can be used in three different modes. These modes  
are set by two mode bits, the first two bits in the serial word.  
The 01 option (DAC Mode) is not available for the AD5533B.  
For information on this mode, refer to the AD5532B data sheet.  
If you attempt to set up DAC Mode, the AD5533B will enter a  
test mode and a 24-clock write will be necessary to clear this.  
Mode Bits  
There are four different modes of operation as described above.  
Cal Bit  
When this is high, all 32 channels acquire VIN simultaneously. The  
acquisition time is then 45 µs (typ) and accuracy may be reduced.  
This bit is set low for normal operation.  
Table II. Modes of Operation  
Mode Bit 1  
Mode Bit 2  
Operating Mode  
Offset_Sel Bit  
0
0
1
1
0
1
0
1
ISHA Mode  
If this bit is set high, the offset channel is selected and bits  
A4–A0 are ignored.  
DAC Mode (Not Available)  
Acquire and Readback  
Readback  
Test Bit  
This must be set low for correct operation of the part.  
A4–A0 Bit  
Used to address any one of the 32 channels (A4 = MSB of  
address, A0 = LSB).  
–12–  
REV. A  
AD5533B  
MSB  
LSB  
0
0
CAL  
OFFSET SEL  
0
A4–A0  
MODE BIT 1 MODE BIT 2  
MODE BITS  
TEST BIT  
a. 10-Bit Input Serial Write Word (ISHA Mode)  
MSB  
LSB  
A4–A0  
MSB  
LSB  
1
0
CAL  
OFFSET SEL  
0
DB13–DB0  
TEST BIT  
MODE BITS  
14-BIT DATA  
10-BIT  
READ FROM PART AFTER  
NEXT FALLING EDGE OF SYNC  
(DB13 = MSB OF DAC WORD)  
SERIAL WORD  
WRITTEN TO PART  
b. Input Serial Interface (Acquire and Readback Mode)  
MSB  
LSB  
A4–A0  
MSB  
LSB  
1
1
0
OFFSET SEL  
0
DB13–DB0  
TEST BIT  
MODE BITS  
14-BIT DATA  
10-BIT  
READ FROM PART AFTER  
NEXT FALLING EDGE OF SYNC  
(DB13 = MSB OF DAC WORD)  
SERIAL WORD  
WRITTEN TO PART  
c. Input Serial Interface (Readback Mode)  
Figure 8. Serial Interface Formats  
DB13–DB0 Bit  
Parallel Interface  
These are used in both readback modes to read a 14-bit word  
from the addressed DAC register.  
The SER/PAR bit is tied low to enable the parallel interface and  
disable the serial interface. The parallel interface is controlled  
by nine pins as follows:  
The serial interface is designed to allow easy interfacing to most  
microcontrollers and DSPs, e.g., PIC16C, PIC17C, QSPI™,  
SPI™, DSP56000, TMS320, and ADSP-21xx, without the  
need for any glue logic. When interfacing to the 8051, the  
SCLK must be inverted. The Microprocessor/Microcontroller  
Interface section explains how to interface to some popular  
DSPs and microcontrollers.  
CS  
Active low package select pin. This pin is shared with the  
SYNC function for the serial interface.  
WR  
Active low write pin. The values on the address pins are  
latched on a rising edge of WR.  
Figures 3 and 4 show the timing diagram for a serial read and  
write to the AD5533B. The serial interface works with both a  
continuous and a noncontinuous serial clock. The first falling  
edge of SYNC resets a counter that counts the number of serial  
clocks to ensure the correct number of bits are shifted in and out  
of the serial shift registers. Any further edges on SYNC are ignored  
until the correct number of bits are shifted in or out. Once the  
correct number of bits have been shifted in or out, the SCLK is  
ignored. In order for another serial transfer to take place, the  
counter must be reset by the falling edge of SYNC. In readback,  
the first rising SCLK edge after the falling edge of SYNC causes  
DOUT to leave its high impedance state and data is clocked out  
onto the DOUT line and also on subsequent SCLK rising edges.  
The DOUT pin goes back into a high impedance state on the falling  
edge of the 14th SCLK. Data on the DIN line is latched in on the  
first SCLK falling edge after the falling edge of the SYNC signal  
and on subsequent SCLK falling edges. The serial interface will  
not shift data in or out until it receives the falling edge of the  
SYNC signal.  
A4–A0  
Five address pins (A4 = MSB of address, A0 = LSB). These  
are used to address the relevant channel (out of a possible 32).  
Offset_Sel  
Offset select pin. This has the same function as the Offset_Sel  
bit in the serial interface. When it is high, the offset channel  
is addressed and the address on A4–A0 is ignored.  
Cal  
Same functionality as the Cal bit in the serial interface. When  
this pin is high, all 32 channels acquire VIN simultaneously.  
MICROPROCESSOR INTERFACING  
AD5533B to ADSP-21xx Interface  
The ADSP-21xx family of DSPs is easily interfaced to the  
AD5533B without the need for extra logic.  
A data transfer is initiated by writing a word to the TX register  
after the SPORT has been enabled. In a write sequence, data is  
clocked out on each rising edge of the DSP’s serial clock and  
clocked into the AD5533B on the falling edge of its SCLK. In  
*SPI and QSPI are trademarks of Motorola, Inc.  
REV. A  
–13–  
AD5533B  
readback, 16 bits of data are clocked out of the AD5533B on  
each rising edge of SCLK and clocked into the DSP on the rising  
edge of SCLK. DIN is ignored. The valid 14 bits of data will be  
centered in the 16-bit RX register when using this configuration.  
The SPORT control register should be set up as follows:  
AD5533B to PIC16C6x/7x  
The PIC16C6x synchronous serial port (SSP) is configured as an  
SPI Master with the clock polarity bit = 0. This is done by writing  
to the Synchronous Serial Port Control Register (SSPCON). See  
PIC16/17 Microcontroller User Manual. In this example I/O port  
RA1 is being used to pulse SYNC and enable the serial port  
of the AD5533B. This microcontroller transfers only eight bits of  
data during each serial transfer operation; therefore, two consecu-  
tive read/write operations are needed for a 10-bit write and a 14-bit  
readback. Figure 11 shows the connection diagram.  
TFSW = RFSW = 1, Alternate Framing  
INVRFS = INVTFS = 1, Active Low Frame Signal  
DTYPE = 00, Right-Justify Data  
ISCLK = 1, Internal Serial Clock  
TFSR  
IRFS  
ITFS  
= RFSR = 1, Frame Every Word  
= 0, External Framing Signal  
= 1, Internal Framing Signal  
PIC16C6x/7x  
*
AD5533B  
*
SLEN = 1001, 10-Bit Data-Words (ISHA Mode Write)  
SLEN = 1111, 16-Bit Data-Words (Readback Mode)  
SCK/RC3  
SCLK  
SDO/RC5  
SDI/RC4  
RA1  
D
OUT  
D
Figure 9 shows the connection diagram.  
IN  
SYNC  
ADSP-2101/  
*ADDITIONAL PINS OMITTED FOR CLARITY  
AD5533B  
*
ADSP-2103  
*
DR  
D
OUT  
Figure 11. AD5533B to PIC16C6x/7x Interface  
AD5533B to 8051  
TFS  
RFS  
DT  
SYNC  
The AD5533B requires a clock synchronized to the serial  
data. The 8051 serial interface must therefore be operated in  
Mode 0. In this mode, serial data enters and exits through RxD  
and a shift clock is output on TxD. Figure 12 shows how the 8051  
is connected to the AD5533B. Because the AD5533B shifts data  
out on the rising edge of the shift clock and latches data in on  
the falling edge, the shift clock must be inverted. The AD5533B  
requires its data with the MSB first. Since the 8051 outputs  
the LSB first, the transmit routine must take this into account.  
D
IN  
SCLK  
SCLK  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 9. AD5533B to ADSP-2101/ADSP-2103 Interface  
AD5533B to MC68HC11  
The serial peripheral interface (SPI) on the MC68HC11 is config-  
ured for master mode (MSTR = 1), clock polarity bit (CPOL) = 0  
and the clock phase bit (CPHA) = 1. The SPI is configured by  
writing to the SPI control register (SPCR)— see 68HC11 User  
Manual. SCK of the 68HC11 drives the SCLK of the AD5533B,  
the MOSI output drives the serial data line (DIN) of the AD5533B,  
and the MISO input is driven from DOUT. The SYNC signal is  
derived from a port line (PC7). When data is being transmitted to  
the AD5533B, the SYNC line is taken low (PC7). Data appear-  
ing on the MOSI output is valid on the falling edge of SCK.  
Serial data from the 68HC11 is transmitted in 8-bit bytes with  
only eight falling clock edges occurring in the transmit cycle.  
Data is transmitted MSB first. In order to transmit 10 data bits  
in ISHA mode it is important to left-justify the data in the SPDR  
register. PC7 must be pulled low to start a transfer. It is taken  
high and pulled low again before any further read/write cycles  
can take place. A connection diagram is shown in Figure 10.  
8051  
*
AD5533B  
*
SCLK  
TXD  
RXD  
D
OUT  
D
IN  
SYNC  
P1.1  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 12. AD5533B to 8051 Interface  
APPLICATION CIRCUITS  
AD5533B in a Typical ATE System  
The AD5533B infinite sample-and-hold is ideally suited for use  
in automatic test equipment. Several ISHAs are required to  
control pin drivers, comparators, active loads, and signal timing.  
Traditionally, sample-and-hold devices with droop were used in  
these applications. These required refreshing to prevent the voltage  
from drifting.  
MC68HC11  
*
AD5533B  
*
MISO  
PC7  
D
OUT  
SYNC  
The AD5533B has several advantages: no refreshing is required,  
there is no droop, pedestal error is eliminated, and there is no  
need for extra filtering to remove glitches. Overall, a higher level  
of integration is achieved in a smaller area. See Figure 13.  
SCK  
MOSI  
SCLK  
D
IN  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 10. AD5533B to MC68HC11 Interface  
–14–  
REV. A  
AD5533B  
POWER SUPPLY DECOUPLING  
PARAMETRIC  
MEASUREMENT  
UNIT  
SYSTEM BUS  
In any circuit where accuracy is important, careful consideration  
of the power supply and ground return layout helps to ensure  
the rated performance. The printed circuit board on which the  
AD5533B is mounted should be designed so that the analog  
and digital sections are separated and confined to certain areas  
of the board. If the AD5533B is in a system where multiple  
devices require an AGND-to-DGND connection, the connection  
should be made at one point only. The star ground point should  
be established as close as possible to the device. For supplies with  
multiple pins (VSS, VDD, AVCC) it is recommended to tie those  
pins together. The AD5533B should have ample supply bypass-  
ing of 10 µF in parallel with 0.1 µF on each supply located as  
close to the package as possible, ideally right up against the device.  
The 10 µF capacitors are the tantalum bead type. The 0.1 µF  
capacitor should have low effective series resistance (ESR) and  
effective series inductance (ESI), like the common ceramic types  
that provide a low impedance path to ground at high frequencies,  
to handle transient currents due to internal logic switching.  
ISHA  
ISHA  
ISHA  
ACTIVE  
LOAD  
STORED  
DATA  
DRIVER  
AND INHIBIT  
PATTERN  
ISHA  
FORMATTER  
DUT  
ISHA  
PERIOD  
GENERATION  
AND  
DELAY  
TIMING  
ISHA  
ISHA  
COMPARE  
REGISTER  
COMPARATOR  
SYSTEM BUS  
ISHAs  
The power supply lines of the AD5533B should use as large a trace  
as possible to provide low impedance paths and reduce the effects  
of glitches on the power supply line. Fast switching signals such  
as clocks should be shielded with digital ground to avoid radiating  
noise to other parts of the board, and should never be run near  
the reference inputs. A ground line routed between the DIN and  
SCLK lines will help reduce crosstalk between them (not required  
on a multilayer board as there will be a separate ground plane,  
but separating the lines will help). It is essential to minimize  
noise on VIN and REFIN lines.  
Figure 13. AD5533B in an ATE System  
Typical Application Circuit  
The AD5533B can be used to set up voltage levels on 32 channels as  
shown in the circuit below. An AD780 provides the 3 V reference  
for the AD5533B, and for the AD5541 16-bit DAC. A simple 3-wire  
serial interface is used to write to the AD5541. Because the AD5541  
has an output resistance of 6.25 k(typ), the time taken to charge/  
discharge the capacitance at the VIN pin is significant. Thus an  
AD820 is used to buffer the DAC output. Note that it is important  
to minimize noise on VIN and REFIN when laying out this circuit.  
Note it is essential to minimize noise on VIN and REFIN lines.  
Particularly for optimum ISHA performance, the VIN line must  
be kept noise-free. Depending on the noise performance of the  
board, a noise filtering capacitor may be required on the VIN line.  
If this capacitor is necessary, then for optimum throughput it may  
be necessary to buffer the source that is driving VIN. Avoid cross-  
over of digital and analog signals. Traces on opposite sides of the  
board should run at right angles to each other. This reduces the  
effects of feedthrough through the board. A microstrip technique is  
by far the best, but not always possible with a double-sided board.  
In this technique, the component side of the board is dedicated  
to ground plane while signal traces are placed on the solder side.  
AV  
AV  
DV  
V
SS  
CC  
CC  
CC  
V
DD  
V
AD820  
IN  
AD5541*  
CS  
DIN  
SCLK  
V
0–31  
OUT  
AD5533B*  
OFFS_IN  
OFFS_OUT  
REFIN  
REF  
AD780*  
As is the case for all thin packages, care must be taken to avoid  
flexing the CSPBGA package and to avoid a point load on the  
surface of this package during the assembly process.  
V
OUT  
SCLK DIN  
SYNC  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 14. Typical Application Circuit  
REV. A  
–15–  
AD5533B  
OUTLINE DIMENSIONS  
74-Lead Chip Scale Ball Grid Array [CSPBGA]  
(BC-74)  
Dimensions shown in millimeters  
A1 CORNER  
INDEX AREA  
12.00 BSC  
SQ  
11 10  
9 8 7 6 5 4 3 2 1  
A
B
C
D
E
F
G
H
J
A1  
1.00  
BSC  
10.00 BSC  
SQ  
BOTTOM  
VIEW  
TOP VIEW  
K
L
1.00 BSC  
1.70  
DETAIL A  
MAX  
DETAIL A  
0.30 MIN  
0.20 MAX  
COPLANARITY  
0.70  
0.60  
0.50  
SEATING  
PLANE  
BALL DIAMETER  
COMPLIANT TO JEDEC STANDARDS MO-192ABD-1  
Revision History  
Location  
Page  
9/02—Data Sheet changed from REV. 0 to REV. A.  
Term LFBGA updated to CSPBGA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Global  
Replaced FUNCTIONAL BLOCK DIAGRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Additions to SERIAL INTERFACE Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Replaced Figure 4 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Changes to ABSOLUTE MAXIMUM RATINGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Additions to POWER SUPPLY DECOUPLING section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
Updated BC-74 package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
–16–  
REV. A  

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