AOD9N40 [AOS]

400V,8A N-Channel MOSFET; 400V , 8A N沟道MOSFET
AOD9N40
型号: AOD9N40
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

400V,8A N-Channel MOSFET
400V , 8A N沟道MOSFET

文件: 总6页 (文件大小:266K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOD9N40  
400V,8A N-Channel MOSFET  
General Description  
Product Summary  
The AOD9N40 is fabricated using an advanced high  
voltage MOSFET process that is designed to deliver high  
levels of performance and robustness in popular AC-DC  
applications.By providing low RDS(on), Ciss and Crss along  
with guaranteed avalanche capability this device can be  
adopted quickly into new and existing offline power supply  
designs.This device is ideal for boost converters and  
synchronous rectifiers for consumer, telecom, industrial  
power supplies and LED backlighting.  
500V@150  
VDS  
ID (at VGS=10V)  
RDS(ON) (at VGS=10V)  
8A  
<0.8Ω  
100% UIS Tested!  
100% Rg Tested!  
TO252  
DPAK  
D
Top View  
Bottom View  
D
D
G
G
S
S
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
VDS  
Drain-Source Voltage  
Gate-Source Voltage  
400  
±30  
8
V
V
VGS  
Continuous Drain  
CurrentB  
Pulsed Drain Current C  
Avalanche Current C  
TC=25°C  
ID  
TC=100°C  
5
A
IDM  
22  
3.2  
150  
300  
5
IAR  
A
C
Repetitive avalanche energy  
Single pulsed avalanche energy H  
Peak diode recovery dv/dt  
TC=25°C  
EAR  
EAS  
dv/dt  
mJ  
mJ  
V/ns  
W
125  
PD  
Power Dissipation B  
o
Derate above 25oC  
1
W/ C  
-50 to 150  
TJ, TSTG  
TL  
Junction and Storage Temperature Range  
Maximum lead temperature for soldering  
purpose, 1/8" from case for 5 seconds  
°C  
300  
°C  
Thermal Characteristics  
Parameter  
Maximum Junction-to-Ambient A,G  
Maximum Case-to-sink A  
Maximum Junction-to-CaseD,F  
Symbol  
RθJA  
Typical  
Maximum  
Units  
°C/W  
°C/W  
°C/W  
45  
-
55  
0.5  
1
RθCS  
RθJC  
0.7  
Rev0: Dec 2010  
www.aosmd.com  
Page 1 of 6  
AOD9N40  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V, TJ=25°C  
ID=250µA, VGS=0V, TJ=150°C  
400  
BVDSS  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Zero Gate Voltage Drain Current  
500  
0.4  
V
BVDSS  
V/ oC  
ID=250µA, VGS=0V  
/TJ  
VDS=400V, VGS=0V  
1
10  
IDSS  
µA  
VDS=320V, TJ=125°C  
IGSS  
VGS(th)  
RDS(ON)  
gFS  
V
DS=0V, VGS=±30V  
±100  
4.5  
0.8  
Gate-Body leakage current  
Gate Threshold Voltage  
nΑ  
V
VDS=5V ID=250µA  
3.4  
4
Static Drain-Source On-Resistance  
Forward Transconductance  
Diode Forward Voltage  
V
V
GS=10V, ID=4A  
DS=40V, ID=4A  
0.64  
8
S
VSD  
IS=1A,VGS=0V  
0.75  
1
8
V
IS  
Maximum Body-Diode Continuous Current  
Maximum Body-Diode Pulsed Current  
A
ISM  
22  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
500  
45  
2
630  
73  
760  
100  
9
pF  
pF  
pF  
V
V
GS=0V, VDS=25V, f=1MHz  
GS=0V, VDS=0V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
5.7  
2.6  
1.2  
4.0  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
10  
13.1  
3.9  
4.8  
17  
16  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
VGS=10V, VDS=320V, ID=8A  
V
GS=10V, VDS=200V, ID=8A,  
52  
RG=25Ω  
tD(off)  
tf  
25  
30  
trr  
IF=8A,dI/dt=100A/µs,VDS=100V  
IF=8A,dI/dt=100A/µs,VDS=100V  
150  
1.5  
195  
1.9  
240  
2.3  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
µC  
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=150°C in a TO252 package, using junction-to-case thermal resistance, and is more useful in setting  
the upper dissipation limit for cases where additional heatsinking is used.  
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C.  
D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a  
maximum junction temperature of TJ(MAX)=150°C.  
G.These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.  
H. L=60mH, IAS=3.2A, VDD=150V, RG=10, Starting TJ=25°C  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev0: Dec 2010  
www.aosmd.com  
Page 2 of 6  
AOD9N40  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
16  
12  
8
100  
10  
1
VDS=40V  
-55°C  
10V  
6.5V  
125°C  
6V  
4
VGS=5.5V  
25°C  
0.1  
0
2
4
6
8
10  
0
5
10  
15  
20  
25  
30  
VGS(Volts)  
VDS (Volts)  
Figure 2: Transfer Characteristics  
Fig 1: On-Region Characteristics  
2.0  
3
2.5  
2
1.6  
1.2  
0.8  
0.4  
0.0  
VGS=10V  
ID=4A  
VGS=10V  
1.5  
1
0.5  
0
0
3
6
9
12  
15  
18  
-100  
-50  
0
50  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
100  
150  
200  
I
D (A)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage  
1.2  
1.0E+02  
1.0E+01  
1.1  
125°C  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
25°C  
1
0.9  
0.8  
0
-100  
-50  
50  
TJ (oC)  
Figure 5: Break Down vs. Junction Temperature  
100  
150  
200  
0.2  
0.4  
0.6  
0.8  
1.0  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
Rev0: Dec 2010  
www.aosmd.com  
Page 3 of 6  
AOD9N40  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
12  
9
10000  
1000  
100  
10  
Ciss  
VDS=320V  
ID=8A  
Coss  
6
Crss  
3
0
1
0
4
8
12  
16  
20  
0.1  
1
10  
100  
VDS (Volts)  
Qg (nC)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
100  
800  
600  
400  
200  
0
10µs  
TJ(Max)=150°C  
TC=25°C  
10  
1
RDS(ON)  
limited  
100µs  
1ms  
10ms  
TJ(Max)=150°C  
TC=25°C  
DC  
0.1  
0.01  
0.0001  
0.001  
0.01  
0.1  
1
10  
1
10  
100  
1000  
VDS (Volts)  
Pulse Width (s)  
Figure 10: Single Pulse Power Rating Junction-to-  
Case (Note F)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
10  
1
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TC+PDM.ZθJC.RθJC  
RθJC=1°C/W  
0.1  
PD  
0.01  
Single Pulse  
Ton  
T
0.001  
0.000001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Rev0: Dec 2010  
www.aosmd.com  
Page 4 of 6  
AOD9N40  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
150  
120  
90  
60  
30  
0
10  
8
6
4
2
0
0
25  
50  
75  
100  
125  
150  
0
25  
50  
75  
100  
125  
150  
T
CASE (°C)  
T
CASE (°C)  
Figure 12: Power De-rating (Note B)  
Figure 13: Current De-rating (Note B)  
400  
300  
200  
100  
0
TA=25°C  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 14: Single Pulse Power Rating Junction-to-Ambient (Note G)  
10  
1
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=55°C/W  
0.1  
0.01  
0.001  
0.0001  
PD  
Ton  
T
Single Pulse  
0.01  
0.0001  
0.001  
0.1  
1
10  
100  
1000  
10000  
Pulse Width (s)  
Figure 15: Normalized Maximum Transient Thermal Impedance (Note G)  
Rev0: Dec 2010  
www.aosmd.com  
Page 5 of 6  
AOD9N40  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching TestCircuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
2
EAR= 1/2 LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTest Circuit & Waveforms  
Qrr = - Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Rev0: Dec 2010  
www.aosmd.com  
Page 6 of 6  

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