AOI508 [AOS]

30V N-Channel AlphaMOS; 30V N通道AlphaMOS
AOI508
型号: AOI508
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

30V N-Channel AlphaMOS
30V N通道AlphaMOS

文件: 总6页 (文件大小:308K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOD508/AOI508  
30V N-Channel AlphaMOS  
General Description  
Product Summary  
VDS  
30V  
• Latest Trench Power MOSFET technology  
• Very Low RDS(on) at 10VGS  
• Low Gate Charge  
• High Current Capability  
• RoHS and Halogen-Free Compliant  
ID (at VGS=10V)  
RDS(ON) (at VGS=10V)  
RDS(ON) (at VGS = 4.5V)  
70A  
< 3m  
< 4.5mΩ  
Application  
• DC/DC Converters in Computing  
100% UIS Tested  
100% Rg Tested  
• Isolated DC/DC Converters in Telecom and Industrial  
TO252  
DPAK  
TO-251A  
IPAK  
D
Top View  
Bottom View  
TopView  
Bottom View  
D
D
G
D
S
D
S
G
S
D
D
S
G
G
S
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
VDS  
30  
±20  
70  
V
V
VGS  
TC=25°C  
Continuous Drain  
Current G  
ID  
TC=100°C  
55  
A
Pulsed Drain Current C  
IDM  
159  
22  
TA=25°C  
TA=70°C  
Continuous Drain  
Current  
IDSM  
A
18  
Avalanche Current C  
Avalanche energy L=0.1mH C  
IAS  
37  
A
mJ  
V
EAS  
68  
VDS Spike  
100ns  
VSPIKE  
36  
TC=25°C  
TC=100°C  
TA=25°C  
TA=70°C  
50  
PD  
W
Power Dissipation B  
25  
2.5  
PDSM  
W
°C  
Power Dissipation A  
1.6  
Junction and Storage Temperature Range  
TJ, TSTG  
-55 to 175  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
16  
Max  
20  
50  
3
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A  
t 10s  
RθJA  
Maximum Junction-to-Ambient A D  
Maximum Junction-to-Case  
Steady-State  
Steady-State  
41  
RθJC  
2.1  
Rev 1: April 2012  
www.aosmd.com  
Page 1 of 6  
AOD508/AOI508  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
30  
V
VDS=30V, VGS=0V  
1
IDSS  
Zero Gate Voltage Drain Current  
µA  
5
TJ=55°C  
V
DS=0V, VGS= ±20V  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
100  
2.2  
3
nA  
V
VGS(th)  
VDS=VGSID=250µA  
1.2  
1.8  
2.4  
3.5  
3.3  
105  
0.7  
VGS=10V, ID=20A  
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
TJ=125°C  
4.4  
4.5  
VGS=4.5V, ID=20A  
VDS=5V, ID=20A  
IS=1A,VGS=0V  
mΩ  
S
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
1
V
Maximum Body-Diode Continuous Current G  
58  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
2010  
898  
124  
1.8  
pF  
pF  
pF  
VGS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
VGS=0V, VDS=0V, f=1MHz  
0.9  
2.7  
SWITCHING PARAMETERS  
Qg(10V) Total Gate Charge  
36  
17  
49  
23  
nC  
nC  
nC  
nC  
ns  
Qg(4.5V) Total Gate Charge  
VGS=10V, VDS=15V, ID=20A  
Qgs  
Qgd  
tD(on)  
tr  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
6
8
7.5  
4.0  
37.0  
7.5  
VGS=10V, VDS=15V, RL=0.75,  
RGEN=3Ω  
ns  
tD(off)  
tf  
ns  
ns  
trr  
IF=20A, dI/dt=500A/µs  
IF=20A, dI/dt=500A/µs  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
14  
ns  
Qrr  
nC  
20.3  
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The  
Power dissipation PDSM is based on R θJA and the maximum allowed junction temperature of 150°C. The value in any given application depends  
on the user's specific board design, and the maximum temperature of 175°C may be used if the PCB allows it.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C. Single pulse width limited by junction temperature TJ(MAX)=175°C.  
D. The RθJA is the sum of the thermal impedance from junction to case RθJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming  
a maximum junction temperature of TJ(MAX)=175°C. The SOA curve provides a single pulse rating.  
G. The maximum current rating is package limited.  
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev 1: April 2012  
www.aosmd.com  
Page 2 of 6  
AOD508/AOI508  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
100  
80  
60  
40  
20  
0
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
VDS=5V  
4.5V  
3.5V  
10V  
3V  
125°C  
25°C  
VGS=2.5V  
4
0
0
1
2
3
4
5
6
0
1
2
3
5
VGS(Volts)  
VDS (Volts)  
Fig 1: On-Region Characteristics (Note E)  
Figure 2: Transfer Characteristics (Note E)  
6
5
4
3
2
1
0
1.8  
1.6  
1.4  
1.2  
1
VGS=10V  
ID=20A  
VGS=4.5V  
VGS=4.5V  
ID=20A  
VGS=10V  
0.8  
0
25  
50  
75  
100 125 150 175 200  
0
5
10  
15  
ID (A)  
20  
25  
30  
Temperature (°C)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage (Note E)  
Figure 4: On-Resistance vs. Junction Temperature  
(Note E)  
8
6
4
2
0
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
ID=20A  
125°C  
125°C  
25°C  
25°C  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
1.2  
2
4
6
8
10  
VGS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
(Note E)  
Rev 1: April 2012  
www.aosmd.com  
Page 3 of 6  
AOD508/AOI508  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
3000  
VDS=15V  
ID=20A  
2500  
2000  
1500  
1000  
500  
Ciss  
8
6
4
Coss  
2
Crss  
0
0
0
10  
20  
Qg (nC)  
30  
40  
50  
0
5
10  
VDS (Volts)  
15  
20  
25  
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
400  
300  
200  
100  
0
1000.0  
100.0  
10.0  
1.0  
RDS(ON)  
10µs  
100µs  
DC  
1ms  
10ms  
TJ(Max)=150°C  
TC=25°C  
TJ(Max)=150°C  
TC=25°C  
0.1  
0.0  
0.01  
0.1  
1
10  
100  
0.0001  
0.001  
0.01  
0.1  
1
10  
VDS (Volts)  
Pulse Width (s)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
Figure 10: Single Pulse Power Rating Junction-to-Case  
(Note F)  
10  
1
D=T /T  
on
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
T
=T +P .Z .R  
J,PKCDMθJC
θJC  
R
=3°C/W  
θJC
0.1  
Single Pulse  
0.01  
1E-05  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Rev 1: April 2012  
www.aosmd.com  
Page 4 of 6  
AOD508/AOI508  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
80  
60  
50  
40  
30  
20  
10  
0
60  
40  
20  
0
0
25  
50  
75  
100  
125  
150  
0
25  
50  
75  
TCASE (°C)  
Figure 13: Current De-rating (Note F)  
100  
125  
150  
175  
TCASE (°C)  
Figure 12: Power De-rating (Note F)  
10000  
TA=25°C  
1000  
100  
10  
1
1E-05  
0.001  
0.1  
Pulse Width (s)  
10  
1000  
Figure 14: Single Pulse Power Rating Junction-to-  
Ambient (Note H)  
10  
1
D=Ton/T  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
In descending order  
TJ,PK=TA+PDM.ZθJA.RθJA  
R
θJA=50°C/W  
0.1  
0.01  
SinglePulse
0.001  
0.001  
1E-05  
0.0001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 15: Normalized Maximum Transient Thermal Impedance (Note H)  
Rev 1: April 2012  
www.aosmd.com  
Page 5 of 6  
AOD508/AOI508  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
td(on)  
t
r
td(off)  
t
f
ton  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
EAR= 1/2 LIA2R  
BVDSS  
Vds  
Id  
Vgs  
Vds  
+
Vgs  
Vdd  
I AR  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Qrr = - Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
trr  
L
Isd  
I F  
Isd  
Vgs  
dI/dt  
I RM  
+
Vdd  
VDC  
Vdd  
-
Vds  
Rev 1: April 2012  
www.aosmd.com  
Page 6 of 6  

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