AOT8N50 [AOS]

500V, 8A N-Channel MOSFET; 500V , 8A N沟道MOSFET
AOT8N50
型号: AOT8N50
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

500V, 8A N-Channel MOSFET
500V , 8A N沟道MOSFET

文件: 总6页 (文件大小:147K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOT8N50/AOTF8N50  
500V, 8A N-Channel MOSFET  
General Description  
Features  
The AOT8N50 & AOTF8N50 have been fabricated  
using an advanced high voltage MOSFET process that  
is designed to deliver high levels of performance and  
robustness in popular AC-DC applications.  
By providing low RDS(on), Ciss and Crss along with  
guaranteed avalanche capability these parts can be  
adopted quickly into new and existing offline power  
supply designs.  
VDS (V) = 600V @ 150°C  
ID = 8A  
(VGS = 10V)  
RDS(ON) < 0.85Ω  
100% UIS Tested!  
100% R g Tested!  
Top View  
TO-220F  
TO-220  
D
G
G
G
D
D
S
S
S
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
AOT8N50  
AOTF8N50  
Units  
VDS  
Drain-Source Voltage  
500  
V
VGS  
Gate-Source Voltage  
±30  
V
A
TC=25°C  
8
8*  
5.6*  
Continuous Drain  
Current  
Pulsed Drain Current C  
Avalanche Current C, G  
ID  
TC=100°C  
5.6  
IDM  
30  
3.2  
154  
307  
5
IAR  
A
Repetitive avalanche energy C, G  
EAR  
EAS  
dv/dt  
mJ  
G
Single pulsed avalanche energy  
Peak diode recovery dv/dt  
TC=25°C  
mJ  
V/ns  
W
W/ oC  
176  
1.4  
38.5  
0.3  
PD  
Power Dissipation B  
Derate above 25oC  
TJ, TSTG  
Junction and Storage Temperature Range  
-50 to 150  
300  
°C  
Maximum lead temperature for soldering  
purpose, 1/8" from case for 5 seconds  
Thermal Characteristics  
TL  
°C  
Parameter  
Maximum Junction-to-Ambient A,D  
Symbol  
RθJA  
AOT8N50  
AOTF8N50  
Units  
65  
65  
°C/W  
Maximum Case-to-Sink A  
Maximum Junction-to-Case  
--  
°C/W  
°C/W  
RθCS  
0.5  
RθJC  
0.71  
3.25  
* Drain current limited by maximum junction temperature.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOT8N50/AOTF8N50  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V, TJ=25°C  
ID=250µA, VGS=0V, TJ=150°C  
500  
V
V
BVDSS  
Drain-Source Breakdown Voltage  
600  
BVDSS  
Breakdown Voltage Temperature  
Coefficient  
V/ oC  
ID=250µA, VGS=0V  
/TJ  
0.56  
VDS=500V, VGS=0V  
1
IDSS  
Zero Gate Voltage Drain Current  
µA  
10  
V
DS=400V, TJ=125°C  
VDS=0V, VGS=±30V  
DS=VGS, ID=250µA  
IGSS  
VGS(th)  
RDS(ON)  
gFS  
Gate-Body leakage current  
Gate Threshold Voltage  
±100  
4.6  
nA  
V
V
3.4  
4
Static Drain-Source On-Resistance  
Forward Transconductance  
Diode Forward Voltage  
VGS=10V, ID=4A  
VDS=40V, ID=4A  
IS=1A, VGS=0V  
0.63  
10  
0.85  
S
VSD  
0.73  
1
8
V
Maximum Body-Diode Continuous Current  
Maximum Body-Diode Pulsed Current  
IS  
A
ISM  
30  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
694  
74  
6.2  
2
868  
93  
7.8  
4
1042  
112  
9.4  
pF  
pF  
pF  
VGS=0V, VDS=25V, f=1MHz  
GS=0V, VDS=0V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
V
6.0  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
23.6  
5.2  
28.3  
6.2  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
VGS=10V, VDS=400V, ID=8A  
10.6  
19.5  
47  
12.7  
323  
56.4  
62.0  
46.0  
VGS=10V, VDS=250V, ID=8A,  
RG=25Ω  
tD(off)  
tf  
51.5  
38.5  
206  
2.14  
trr  
IF=8A,dI/dt=100A/µs,VDS=100V  
IF=8A,dI/dt=100A/µs,VDS=100V  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
247.0  
2.6  
ns  
Qrr  
µC  
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial  
TJ =25°C.  
D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming  
a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.  
G. L=60mH, IAS=3.2A, VDD=50V, RG=25, Starting TJ=25°C  
Rev 3.  
Dec-08  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOT8N50/AOTF8N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
16  
100  
10V  
VDS=40V  
14  
12  
10  
8
-55°C  
6.5V  
10  
1
6V  
125°C  
6
VGS=5.5V  
4
25°C  
2
0.1  
0
0
5
10  
15  
20  
25  
30  
2
4
6
8
10  
VDS (Volts)  
V
GS(Volts)  
Fig 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
3
2.5  
2
VGS=10V  
ID=4A  
VGS=10V  
1.5  
1
0.5  
0
0
2
4
6
8
10 12 14 16 18  
D (A)  
-100  
-50  
0
50  
100  
150  
200  
I
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
1.2  
1.1  
1
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125°C  
25°C  
0.9  
0.8  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
0.6  
0.8  
1.0  
-100  
-50  
0
50  
100  
150  
200  
TJ (oC)  
Figure 5: Break Down vs. Junction Temperature  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOT8N50/AOTF8N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
12  
9
10000  
1000  
100  
10  
VDS=400V  
ID=8A  
Ciss  
Coss  
6
3
Crss  
0
1
0
5
10  
15  
Q
20  
g (nC)  
Figure 7: Gate-Charge Characteristics  
25  
30  
35  
0.1  
1
10  
100  
VDS (Volts)  
Figure 8: Capacitance Characteristics  
100  
100  
10  
1
10µs  
10µs  
10  
1
RDS(ON)  
limited  
RDS(ON)  
limited  
100µs  
100µs  
1ms  
10ms  
0.1s  
DC  
1ms  
10ms  
0.1s  
1s  
DC  
0.1  
0.01  
0.1  
10s  
TJ(Max)=150°C  
TC=25°C  
TJ(Max)=150°C  
TC=25°C  
0.01  
1
1
10  
100  
1000  
10  
100  
1000  
VDS (Volts)  
VDS (Volts)  
Figure 9: Maximum Forward Biased Safe Operating  
Area for AOT8N50 (Note F)  
Figure 10: Maximum Forward Biased Safe  
Operating Area for AOTF8N50 (Note F)  
10  
8
6
4
2
0
0
25  
50  
75  
100  
125  
150  
TCASE (°C)  
Figure 11: Current De-rating (Note B)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOT8N50/AOTF8N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TA+PDM.ZθJC.RθJC  
RθJC=0.71°C/W  
1
0.1  
PD  
0.01  
Ton  
T
Single Pulse  
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
Pulse Width (s)  
Figure 12: Normalized Maximum Transient Thermal Impedance for AOT8N50 (Note F)  
10  
1
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TA+PDM.ZθJC.RθJC  
RθJC=3.25°C/W  
0.1  
PD  
0.01  
Ton  
T
Single Pulse  
0.001  
0.001  
0.00001  
0.0001  
0.01  
Pulse Width (s)  
Figure 13: Normalized Maximum Transient Thermal Impedance for AOTF8N50 (Note F)  
0.1  
1
10  
100  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOT8N50/AOTF8N50  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
2
EAR= 1/2 LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTest Circuit & Waveforms  
Qrr = - Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

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