AOT8N80 [AOS]

800V, 7.4A N-Channel MOSFET; 800V , 7.4A N沟道MOSFET
AOT8N80
型号: AOT8N80
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

800V, 7.4A N-Channel MOSFET
800V , 7.4A N沟道MOSFET

文件: 总6页 (文件大小:354K)
中文:  中文翻译
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AOT8N80/AOTF8N80  
800V, 7.4A N-Channel MOSFET  
General Description  
Product Summary  
VDS  
900V@150  
7.4A  
The AOT8N80 & AOTF8N80 have been fabricated using  
an advanced high voltage MOSFET process that is  
designed to deliver high levels of performance and  
robustness in popular AC-DC applications.By providing  
low RDS(on), Ciss and Crss along with guaranteed avalanche  
capability these parts can be adopted quickly into new and  
existing offline power supply designs.  
ID (at VGS=10V)  
RDS(ON) (at VGS=10V)  
< 1.63  
100% UIS Tested  
100% Rg Tested  
For Halogen Free add "L" suffix to part number:  
AOT8N80L & AOTF8N80L  
Top View  
D
TO-220  
TO-220F  
G
S
D
S
S
D
G
G
AOT8N80  
AOTF8N80  
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
AOT8N80  
AOTF8N80  
Units  
Drain-Source Voltage  
VDS  
800  
±30  
V
Gate-Source Voltage  
VGS  
V
A
TC=25°C  
7.4  
4.6  
7.4*  
4.6*  
Continuous Drain  
Current  
ID  
TC=100°C  
Pulsed Drain Current C  
Avalanche Current C  
IDM  
26  
3.8  
217  
433  
5
IAR  
A
Repetitive avalanche energy C  
EAR  
EAS  
dv/dt  
mJ  
Single pulsed avalanche energy G  
Peak diode recovery dv/dt  
TC=25°C  
mJ  
V/ns  
W
W/ oC  
245  
2.0  
50  
PD  
Power Dissipation B  
Derate above 25oC  
0.4  
Junction and Storage Temperature Range  
TJ, TSTG  
-55 to 150  
300  
°C  
Maximum lead temperature for soldering  
purpose, 1/8" from case for 5 seconds  
Thermal Characteristics  
TL  
°C  
Parameter  
Symbol  
RθJA  
AOT8N80  
AOTF8N80  
Units  
Maximum Junction-to-Ambient A,D  
65  
65  
°C/W  
Maximum Case-to-sink A  
RθCS  
0.5  
--  
°C/W  
°C/W  
Maximum Junction-to-Case  
RθJC  
0.51  
2.5  
* Drain current limited by maximum junction temperature.  
Rev0: Jun 2012  
www.aosmd.com  
Page 1 of 6  
AOT8N80/AOTF8N80  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250A, VGS=0V, TJ=25°C  
ID=250A, VGS=0V, TJ=150°C  
800  
BVDSS  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Zero Gate Voltage Drain Current  
900  
V
BVDSS  
/TJ  
V/ oC  
ID=250A, VGS=0V  
0.86  
VDS=800V, VGS=0V  
VDS=640V, TJ=125°C  
1
IDSS  
µA  
10  
IGSS  
VGS(th)  
RDS(ON)  
gFS  
VDS=0V, VGS=±30V  
Gate-Body leakage current  
Gate Threshold Voltage  
±100  
4.5  
nΑ  
V
VDS=5V, ID=250µA  
VGS=10V, ID=4A  
VDS=40V, ID=4A  
IS=1A,VGS=0V  
3.3  
3.9  
1.35  
9
Static Drain-Source On-Resistance  
Forward Transconductance  
Diode Forward Voltage  
1.63  
S
VSD  
0.72  
1
V
IS  
Maximum Body-Diode Continuous Current  
Maximum Body-Diode Pulsed Current  
7.4  
26  
A
ISM  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1100 1375 1650  
pF  
pF  
pF  
VGS=0V, VDS=25V, f=1MHz  
VGS=0V, VDS=0V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
70  
6
101  
11  
132  
16  
1.7  
3.5  
5.3  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
20  
26  
7.3  
9.1  
35  
51  
69  
41  
484  
6
32  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
V
GS=10V, VDS=640V, ID=8A  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
VGS=10V, VDS=400V, ID=8A,  
Turn-On Rise Time  
R
G
=25
Ω  
tD(off)  
tf  
Turn-Off DelayTime  
Turn-Off Fall Time  
trr  
IF=8A,dI/dt=100A/µs,VDS=100V  
IF=8A,dI/dt=100A/µs,VDS=100V  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
380  
4.5  
585  
7.5  
ns  
Qrr  
µC  
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial  
TJ =25°C.  
D. The R θJA is the sum of the thermal impedance from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a  
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.  
G. L=60mH, IAS=3.8A, VDD=150V, RG=25, Starting TJ=25°C  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev0: Jun 2012  
www.aosmd.com  
Page 2 of 6  
AOT8N80/AOTF8N80  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
100  
10V  
VDS=40V  
-55°C  
12  
9
6.5V  
10  
1
125°C  
6V  
5.5V  
6
3
25°C  
VGS=5V  
25  
0
0.1  
0
5
10  
15  
20  
30  
2
4
6
8
10  
VDS (Volts)  
VGS(Volts)  
Fig 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
3
2.5  
2
VGS=10V  
VGS=10V  
1.5  
1
0.5  
0
-100  
-50  
0
50  
100  
150  
200  
0
2
4
6
8
10  
12  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
ID (A)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage  
1.2  
1.1  
1
1E+02  
1E+01  
1E+00  
1E-01  
1E-02  
1E-03  
1E-04  
1E-05  
125°C  
25°C  
0.9  
0.8  
-100  
-50  
0
50  
100  
150  
200  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
TJ (°C)  
Figure 5: Break Down vs. Junction Temparature  
Rev0: Jun 2012  
www.aosmd.com  
Page 3 of 6  
AOT8N80/AOTF8N80  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
12  
9
10000  
1000  
100  
10  
VDS=640V  
ID=8A  
Ciss  
Coss  
6
Crss  
3
0
1
0
8
16  
Qg (nC)  
Figure 7: Gate-Charge Characteristics  
24  
32  
40  
0.1  
1
10  
100  
VDS (Volts)  
Figure 8: Capacitance Characteristics  
100  
10  
100  
10  
10µs  
10µs  
RDS(ON)  
limited  
RDS(ON)  
limited  
100µs  
100µs  
1ms  
1
1
1ms  
DC  
10ms  
10ms  
DC  
0.1s  
1s  
0.1  
0.01  
0.1  
0.01  
TJ(Max)=150°C  
TC=25°C  
TJ(Max)=150°C  
TC=25°C  
1
10  
100  
1000  
1
10  
100  
1000  
VDS (Volts)  
VDS (Volts)  
Figure 9: Maximum Forward Biased Safe  
Operating Area for AOT8N80 (Note F)  
Figure 10: Maximum Forward Biased Safe  
Operating Area for AOTF8N80 (Note F)  
10  
8
6
4
2
0
0
25  
50  
75  
100  
125  
150  
TCASE (°C)  
Figure 11: Current De-rating (Note B)  
Rev0: Jun 2012  
www.aosmd.com  
Page 4 of 6  
AOT8N80/AOTF8N80  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
D=Ton/T  
TJ,PK=TC+PDM.ZθJC.RθJC  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
RθJC=0.51°C/W  
1
0.1  
PD  
Single Pulse  
0.0001  
0.01  
0.001  
Ton  
T
0.000001  
0.00001  
0.001  
Pulse Width (s)  
Figure 12: Normalized Maximum Transient Thermal Impedance for AOT8N80 (Note F)  
0.01  
0.1  
1
10  
100  
10  
D=Ton/T  
TJ,PK=TC+PDM.ZθJC.RθJC  
θJC=2.5°C/W  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
R
1
0.1  
PD  
Single Pulse  
0.01  
Ton  
T
0.001  
0.000001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
Pulse Width (s)  
Figure 13: Normalized Maximum Transient Thermal Impedance for AOTF8N80 (Note F)  
Rev0: Jun 2012  
www.aosmd.com  
Page 5 of 6  
AOT8N80/AOTF8N80  
Gate Charge Test Circuit &Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
2
EAR=1/2 LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTestCircuit &Waveforms  
Qrr=- Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Rev0: Jun 2012  
www.aosmd.com  
Page 6 of 6  

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