AOTF16N50 [AOS]

500V, 16A N-Channel MOSFET; 500V , 16A N沟道MOSFET
AOTF16N50
型号: AOTF16N50
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

500V, 16A N-Channel MOSFET
500V , 16A N沟道MOSFET

文件: 总6页 (文件大小:166K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOT16N50/AOTF16N50  
500V, 16A N-Channel MOSFET  
General Description  
Product Summary  
VDS  
600V@150  
16A  
The AOT16N50 & AOTF16N50 have been fabricated  
using an advanced high voltage MOSFET process that is  
designed to deliver high levels of performance and  
robustness in popular AC-DC applications.  
By providing low RDS(on), Ciss and Crss along with  
guaranteed avalanche capability these parts can be  
adopted quickly into new and existing offline power supply  
designs.  
ID (at VGS=10V)  
R
DS(ON) (at VGS=10V)  
< 0.37  
100% UIS Tested  
100% Rg Tested  
For Halogen Free add "L" suffix to part number:  
AOT16N50L & AOTF16N50L  
Top View  
TO-220F  
TO-220  
D
G
G
G
D
D
S
S
S
AOT16N50  
AOTF16N50  
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
VDS  
AOT16N50  
AOTF16N50  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
500  
±30  
V
V
VGS  
TC=25°C  
16  
11  
16*  
11*  
Continuous Drain  
Current  
ID  
TC=100°C  
A
Pulsed Drain Current C  
IDM  
64  
6
Avalanche Current C  
IAR  
A
Repetitive avalanche energy C  
EAR  
EAS  
dv/dt  
540  
1080  
5
mJ  
Single plused avalanche energy G  
Peak diode recovery dv/dt  
TC=25°C  
mJ  
V/ns  
W
W/ oC  
278  
2.2  
50.0  
0.4  
PD  
Power Dissipation B  
Derate above 25oC  
Junction and Storage Temperature Range  
Maximum lead temperature for soldering  
purpose, 1/8" from case for 5 seconds  
Thermal Characteristics  
TJ, TSTG  
TL  
-55 to 150  
300  
°C  
°C  
Parameter  
Symbol  
RθJA  
AOT16N50  
AOTF16N50  
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A,D  
65  
0.5  
65  
--  
Maximum Case-to-sink A  
RθCS  
Maximum Junction-to-Case  
RθJC  
0.45  
2.5  
* Drain current limited by maximum junction temperature.  
Rev3: Jul 2011  
www.aosmd.com  
Page 1 of 6  
AOT16N50/AOTF16N50  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250A, VGS=0V, TJ=25°C  
ID=250A, VGS=0V, TJ=150°C  
500  
BVDSS  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Zero Gate Voltage Drain Current  
600  
0.5  
V
BVDSS  
/TJ  
V/ oC  
ID=250A, VGS=0V  
VDS=500V, VGS=0V  
VDS=400V, TJ=125°C  
1
IDSS  
µA  
10  
IGSS  
VGS(th)  
RDS(ON)  
gFS  
VDS=0V, VGS=±30V  
Gate-Body leakage current  
Gate Threshold Voltage  
±100  
4.5  
nΑ  
V
VDS=5V, ID=250µA  
VGS=10V, ID=8A  
VDS=40V, ID=8A  
IS=1A,VGS=0V  
3.3  
4
Static Drain-Source On-Resistance  
Forward Transconductance  
Diode Forward Voltage  
0.29  
20  
0.37  
S
VSD  
0.71  
1
V
IS  
Maximum Body-Diode Continuous Current  
Maximum Body-Diode Pulsed Current  
16  
64  
A
ISM  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1531 1914 2297  
pF  
pF  
pF  
VGS=0V, VDS=25V, f=1MHz  
VGS=0V, VDS=0V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
153  
11  
191  
16  
229  
20  
1.75  
3.5  
5.3  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
34  
7.5  
16  
42.8  
9.3  
20.3  
44  
51  
11  
24  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
VGS=10V, VDS=400V, ID=16A  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
VGS=10V, VDS=250V, ID=16A,  
Turn-On Rise Time  
84  
RG=25Ω  
tD(off)  
tf  
Turn-Off DelayTime  
92  
Turn-Off Fall Time  
50  
trr  
IF=16A,dI/dt=100A/µs,VDS=100V  
IF=16A,dI/dt=100A/µs,VDS=100V  
265  
4.5  
334  
6
400  
7.5  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
µC  
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial TJ  
=25°C.  
D. The R θJA is the sum of the thermal impedance from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a  
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse ratin g.  
G. L=60mH, IAS=6A, VDD=150V, RG=25, Starting TJ=25°C  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev3: Jul 2011  
www.aosmd.com  
Page 2 of 6  
AOT16N50/AOTF16N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
32  
100  
10V  
-55°C  
28  
VDS=40V  
125°C  
6.5V  
24  
10  
20  
16  
6V  
12  
VGS=5.5V  
1
8
4
25°C  
0
0.1  
0
5
10  
15  
20  
25  
30  
2
4
6
8
10  
V
DS (Volts)  
V
GS(Volts)  
Fig 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
0.7  
3
2.5  
2
0.6  
0.5  
0.4  
0.3  
0.2  
VGS=10V  
ID=8A  
VGS=10V  
1.5  
1
0.5  
0
0
4
8
12  
16  
20  
24  
28  
32  
-100  
-50  
0
50  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
100  
150  
200  
I
D (A)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage  
1.2  
1.1  
1
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125°C  
25°C  
0.9  
0.8  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
-100  
-50  
0
50  
100  
150  
200  
TJ (°C)  
Figure 5:Break Down vs. Junction Temparature  
Rev3: Jul 2011  
www.aosmd.com  
Page 3 of 6  
AOT16N50/AOTF16N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
12  
9
10000  
1000  
100  
10  
VDS=400V  
ID=16A  
Ciss  
Coss  
6
Crss  
3
0
1
0
10  
20  
30  
40  
50  
60  
0.1  
1
10  
100  
VDS (Volts)  
Qg (nC)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
100  
10  
100  
10  
10µs  
10µs  
RDS(ON)  
limited  
RDS(ON)  
limited  
100µs  
100µs  
1ms  
1ms  
10ms  
0.1s  
1s  
1
1
10ms  
0.1s  
DC  
DC  
TJ(Max)=150°C  
TC=25°C  
0.1  
0.01  
0.1  
0.01  
10s  
TJ(Max)=150°C  
TC=25°C  
1
10  
100  
1000  
1
10  
100  
1000  
V
DS (Volts)  
V
DS (Volts)  
Figure 9: Maximum Forward Biased Safe  
Operating Area for AOT16N50 (Note F)  
Figure 10: Maximum Forward Biased Safe Operating  
Area for AOTF16N50 (Note F)  
18  
15  
12  
9
6
3
0
0
25  
50  
75  
100  
125  
150  
TCASE (°C)  
Figure 11: Current De-rating (Note B)  
Rev3: Jul 2011  
www.aosmd.com  
Page 4 of 6  
AOT16N50/AOTF16N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TC+PDM.ZθJC.RθJC  
RθJC=0.45°C/W  
1
0.1  
PD  
Ton  
0.01  
0.001  
T
1
Single Pulse  
0.001  
0.00001  
0.0001  
0.01  
0.1  
10  
100  
Pulse Width (s)  
Figure 12: Normalized Maximum Transient Thermal Impedance for AOT16N50 (Note F)  
10  
1
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TC+PDM.ZθJC.RθJC  
RθJC=2.5°C/W  
0.1  
PD  
0.01  
0.001  
Ton  
T
Single Pulse  
0.001  
0.00001  
0.0001  
0.01  
0.1  
1
10  
100  
Pulse Width (s)  
Figure 13: Normalized Maximum Transient Thermal Impedance for AOTF16N50 (Note F)  
Rev3: Jul 2011  
www.aosmd.com  
Page 5 of 6  
AOT16N50/AOTF16N50  
Gate Charge Test Circuit &Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
2
EAR=1/2 LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTestCircuit &Waveforms  
Qrr=- Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Rev3: Jul 2011  
www.aosmd.com  
Page 6 of 6  

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