CAS300M12BM2 [CREE]

1.2kV, 5.0 mΩ All-Silicon Carbide Half-Bridge Module;
CAS300M12BM2
型号: CAS300M12BM2
厂家: CREE, INC    CREE, INC
描述:

1.2kV, 5.0 mΩ All-Silicon Carbide Half-Bridge Module

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CAS300M12BM2  
1.2kV, 5.0 mAll-Silicon Carbide  
Half-Bridge Module  
Z-FETMOSFET and Z-RecDiode  
VDS  
= 1.2 kV  
Esw,Total@300A  
RDS(on)  
= 12.0 mJ  
= 5.0 mΩ  
Module Features  
Package  
62 mm x 106 mm x 30 mm  
Ultra Low Loss  
High-Frequency Operation  
Zero Reverse Recovery Current from Diode  
Zero Turn-off Tail Current from MOSFET  
Normally-off, fail-safe device operation  
Ease of paralleling  
Copper baseplate and aluminum nitride insulator  
System Benefits  
Enables compact and lightweight systems  
High efficiency operation  
Mitigates over-voltage protection  
Reduces thermal requirements  
Enables simplified topologies  
Applications  
Induction Heating  
Motor Drives  
Solar and Wind Inverters  
UPS and SMPS  
Traction  
Part Number  
Package  
Marking  
CAS300M12BM2  
Half Bridge Module  
CAS300M12BM2  
Maximum Ratings (TC = 25°C unless otherwise specified)  
Note  
Symbol  
Parameter  
Value  
Unit  
Test Conditions  
VDSmax  
VGSmax  
VGSop  
Drain Source Voltage  
Gate Source Voltage  
Gate Source Voltage  
1.2  
-10/+25  
-5/+20  
404  
kV  
V
V
A
A
Absolute maximum values  
Recommended operational values  
VGS = 20 V, TC = 25 °C  
VGS = 20 V, TC = 90 °C  
Pulse width tP = 200 µs repetition rate  
limited by TJ(max), TC = 25°C  
Fig 20  
ID  
Continuous Drain Current  
Pulsed Drain Current  
285  
IDpulse  
1500  
A
TJmax  
TC  
Junction Temperature  
Case and Storage Temperature  
Range  
Maximum Power Dissipation  
Case Isolation Voltage  
Stray Inductance  
Mounting Torque  
Weight  
Clearance Distance  
150  
-40 to  
+125  
1660  
4.0  
14  
5
300  
12  
30  
°C  
°C  
Tstg  
Ptot  
Visol  
Lstray  
M
W
kV  
nH  
Nm  
g
mm  
mm  
mm  
TC = 25 °C, TJ = 150 °C  
AC, 50 Hz, 1 min  
Measured between terminals 2 and 3  
To heatsink and terminals  
G
Terminal to terminal  
Terminal to terminal  
Terminal to baseplate  
Creepage Distance  
40  
1
Electrical Characteristics (TC = 25°C unless otherwise specified)  
Value  
Typ  
Symbol  
Parameter  
Unit  
Test Conditions  
Notes  
Min  
Max  
Drain Source Breakdown  
Voltage  
Gate Threshold Voltage  
V(BR)DSS  
VGS(th)  
1.2  
kV  
V
VGS = 0 V, IDS = 1 mA  
VDS = 10 V, IDS = 15 mA  
Fig 11  
2.0  
2.3  
500  
2000  
VDS = 1.2 kV, VGS = 0 V  
VDS = 1.2 kV, VGS = 0 V  
TJ = 150 °C  
VGS = 20 V, VDS = 0 V  
VGS = 20 V, IDS = 300 A  
VGS = 20 V, IDS = 300 A,  
TJ = 150 °C  
Zero Gate Voltage  
Drain Current  
IDSS  
µA  
nA  
1000  
IGSS  
Gate-Source Leakage Current  
1
5.0  
100  
5.7  
Drain-Source On-State  
Resistance  
Fig 4, 5  
and 6  
RDS(on)  
mΩ  
8.6  
9.8  
94.8  
93.3  
VDS = 20 V, IDS = 300 A  
VDS = 20 V, IDS = 300 A,  
TJ = 150 °C  
Fig 7  
gfs  
Transconductance  
S
CISS  
COSS  
CRSS  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
11.7  
2.55  
0.07  
VDS = 600 V f = 200 kHz,  
VAC = 25 mV  
Fig 17,  
18  
nF  
VDD = 600 V, VGS = -5/20 V  
ID = 300 A, RG(ext) = 2.5 Ω,  
Timing relative to VDS  
Per IEC60747-8-4 pg 83  
Inductive Load  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
76  
68  
Fig 24  
Fig 25  
Turn-Off Delay Time  
Fall Time  
168  
43  
VDS = 600 V, VGS = -5 / 20 V  
IDS = 300 A, RG = 2.5 Ω,  
Inductive Load  
EON  
Turn-On Switching Energy  
Turn-Off Switching Energy  
6.05  
5.95  
mJ  
EOFF  
Free-Wheeling Diode Characteristics  
Value  
Typ  
1.7  
2.2  
3.2  
Symbol  
Parameter  
Unit  
Test Conditions  
Notes  
Min  
Max  
2.0  
2.5  
V
V
ISD = 300 A, TJ = 25°C, VGS = 0 V  
ISD = 300 A, TJ = 150°C, VGS = 0 V  
Fig 8, 9  
and 10  
VSD  
QC  
Diode Forward Voltage  
Total Capacitive Charge  
µC  
Note: The reverse recovery is purely capacitive.  
Gate Charge Characteristics  
Value  
Typ  
Symbol  
Parameter  
Unit  
Test Conditions  
Notes  
Min  
Max  
QGS  
QGD  
QG  
Gate to Source Charge  
Gate to Drain Charge  
Total Gate Charge  
166  
475  
1025  
3.0  
VDS = 800 V, VGS = -5 /+ 20 V  
IDS = 300 Amps  
Per JEDEC24 pg 27  
Fig 12  
nC  
RG  
Internal Gate Resistance  
Ω
f = 200 kHz, VAC = 25 mV  
Thermal Characteristics  
Value  
Typ  
Symbol  
Parameter  
Unit  
Test Conditions  
Notes  
Fig 17  
Fig 18  
Min  
Max  
Thermal Resistance Junction to  
Case for MOSFET  
RθJCM  
0.070 0.075  
0.073 0.076  
TC = 90 °C, Tj =150 °C  
Pdis = Pmax  
°C/W  
Thermal Resistance Junction to  
Case for Diode  
RθJCD  
2
Typical Performance  
600  
600  
500  
400  
300  
200  
100  
0
VGS = 20 V  
VGS = 20 V  
VGS = 18 V  
VGS = 16 V  
500  
400  
300  
200  
100  
0
VGS = 18 V  
VGS = 16 V  
VGS = 14 V  
VGS = 12 V  
VGS = 14 V  
VGS = 12 V  
VGS = 10 V  
VGS = 10 V  
Conditions:  
TJ = -40°C  
tp = 200 µs  
Conditions:  
TJ = 25°C  
tp = 200 µs  
0
1
2
3
4
5
6
7
8
0
1
2
3
4
5
6
7
8
Drain-Source VoltageVDS (V)  
Drain-Source VoltageVDS (V)  
Fig 1. Typical Output Characteristics TJ = -40 °C  
Fig 2. Typical Output Characteristics TJ = 25 °C  
2.0  
600  
Conditions:  
VGS = 20 V  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
IDS = 300 A  
VGS = 20 V  
tp = 200 µs  
VGS = 12 V  
VGS = 18 V  
500  
VGS = 16 V  
VGS = 14 V  
400  
VGS = 10 V  
300  
200  
100  
0
Conditions:  
TJ = 150°C  
tp = 200 µs  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
0
1
2
3
4
5
6
7
8
Junction Temperature, TJ (°C)  
Drain-Source VoltageVDS (V)  
Fig 3. Typical Output Characteristics TJ = 150 °C  
Fig 4. Normalized On-Resistance vs. Temperature  
12  
10  
20  
Conditions:  
IDS = 300 A  
tp = 200 µs  
18  
16  
14  
12  
10  
8
VGS = 12 V  
VGS = 14 V  
Tj = -40 °C  
8
VGS = 16 V  
6
VGS = 18 V  
Tj = 150 °C  
VGS = 20 V  
4
Tj = 25 °C  
6
4
Conditions:  
IDS = 300 A  
tp = 200 µs  
2
0
2
0
-50  
-25  
0
25  
50  
75  
100  
125  
150  
10  
12  
14  
16  
18  
20  
Junction Temperature, TJ (°C)  
Gate-SourceVoltage, VGS (V)  
Fig 5. Typical On-Resistance vs. Temperature and  
Gate Voltage  
Fig 6. Typical On-Resistance vs. Gate Voltage  
3
Typical Performance  
-4.0  
-3.5  
-3.0  
-2.5  
-2.0  
-1.5  
-1.0  
-0.5  
0.0  
500  
Conditions:  
0
VDS = 20 V  
tp < 200 µs  
400  
VGS = 0 V  
-100  
-200  
-300  
-400  
-500  
-600  
TJ = 150 °C  
300  
200  
100  
0
VGS = -2 V  
TJ = 25 °C  
TJ = -40 °C  
VGS = -5 V  
Conditions:  
TJ = -40 °C  
tp = 200 µs  
0
2
4
6
8
10  
12  
14  
Drain-Source VoltageVDS (V)  
Gate-SourceVoltage, VGS (V)  
Fig 7. Typical Transfer Characteristic For Various  
Temperatures  
Fig 8. Typical Diode Behavior TJ = -40 °C  
-4.0  
-3.5  
-3.0  
-2.5  
-2.0  
-1.5  
-1.0  
-0.5  
0.0  
-4.0  
-3.5  
-3.0  
-2.5  
-2.0  
-1.5  
-1.0  
-0.5  
0.0  
0
0
-100  
-200  
-300  
-400  
-500  
-600  
-100  
-200  
-300  
-400  
-500  
-600  
VGS = -2 V  
VGS = -2 V  
VGS = 0 V  
VGS = -5 V  
Conditions:  
TJ = 25°C  
tp = 200 µs  
Conditions:  
TJ = 150°C  
tp = 200 µs  
VGS = 0 V  
VGS = -5 V  
Drain-Source VoltageVDS (V)  
Drain-Source VoltageVDS (V)  
Fig 9. Typical Diode Behavior TJ = 25 °C  
Fig 10. Typical Diode Behavior TJ = 150 °C  
3.0  
25  
Conditions  
VDS = 10 V  
IDS = 15mA
Conditions:  
TJ = 25 °C  
IDS = 300 A  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
20  
VDS = 1000 V  
15  
10  
5
0
-5  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
0
200  
400  
600  
800  
1000  
1200  
Junction Temperature TJ (°C)  
Gate Charge (nC)  
Fig 11. Typical Threshold Voltage vs. Temperature  
Fig 12. Typical Gate Charge  
4
Typical Performance  
-3.0  
-2.5  
-2.0  
-1.5  
-1.0  
-0.5  
0.0  
-3.0  
-2.5  
-2.0  
-1.5  
-1.0  
-0.5  
0.0  
0
0
VGS = 0 V  
VGS = 0 V  
-100  
-200  
-300  
-400  
-500  
-600  
-100  
-200  
-300  
-400  
-500  
-600  
VGS = 5 V  
VGS = 5 V  
VGS = 10 V  
VGS = 10 V  
VGS = 15 V  
VGS = 15 V  
VGS = 20 V  
VGS = 20 V  
Conditions:  
TJ = -40°C  
tp = 200 µs  
Conditions:  
TJ = 25°C
tp = 200 µs  
Drain-Source VoltageVDS (V)  
Drain-Source VoltageVDS (V)  
Fig 13. Typical 3rd Quadrant Behavior TJ = -40 °C  
Fig 14. Typical 3rd Quadrant Behavior TJ = 25 °C  
1.6  
1.4  
1.2  
1
-3.0  
-2.5  
-2.0  
-1.5  
-1.0  
-0.5  
0.0  
0
VGS = 0 V  
-100  
-200  
-300  
-400  
-500  
-600  
VGS = 5 V  
VGS = 10 V  
VGS = 20 V  
0.8  
0.6  
0.4  
0.2  
0
VGS = 15 V  
Conditions:  
TJ = 150°C  
tp = 200 µs  
0
200  
400  
600  
800  
1000  
1200  
Drain to Source Voltage, VDS (V)  
Drain-Source VoltageVDS (V)  
Fig 15. Typical 3rd Quadrant Behavior TJ = 150 °C  
Fig 16. Typical Output Capacitor Stored Energy  
100  
100  
Conditions:  
Conditions:  
TJ = 25 °C  
TJ = 25 °C  
VAC = 25 mV  
f = 200 kHz  
VAC = 25 mV  
f = 200 kHz  
Ciss  
Ciss  
10  
10  
Coss  
Coss  
1
1
Crss  
Crss  
0.1  
0.1  
0.01  
0.01  
0
50  
100  
150  
200  
0
200  
400  
600  
800  
1000  
Drain-Source Voltage, VDS (V)  
Drain-Source Voltage, VDS (V)  
Fig 17. Typical Capacitances vs. Drain-Source  
Voltage. (0-200V)  
Fig 18. Typical Capacitances vs. Drain-Source  
Voltage. (0-1000V)  
5
Typical Performance  
1800  
1600  
1400  
1200  
1000  
800  
600  
450  
400  
350  
300  
250  
200  
150  
100  
50  
Conditions:  
TJ ≤ 150 °C  
Conditions:  
TJ ≤ 150 °C  
400  
200  
0
0
-25  
0
25  
50  
75  
100  
125  
-25  
0
25  
50  
75  
100  
125  
Case Temperature, TC (°C)  
Case Temperature, TC (°C)  
Fig 19. Max. Continuous Power Derating Curve vs.  
Case Temperature.  
Fig 20. Max. Continuous Current Derating Curve  
vs. Case Temperature  
100E-3  
0.5  
100E-3  
0.5  
0.3  
0.3  
0.1  
0.1  
10E-3  
10E-3  
0.05  
0.05  
0.02  
0.02  
1E-3  
1E-3  
SinglePulse  
0.01  
SinglePulse  
0.01  
100E-6  
10E-6  
100E-6  
10E-6  
1E-6  
10E-6  
100E-6  
1E-3  
Time, tp (s)  
10E-3  
100E-3  
1
1E-6  
10E-6  
100E-6  
1E-3  
Time, tp (s)  
10E-3  
100E-3  
1
Fig 21. Typical Transient Thermal Impedance -  
MOSFET  
Fig 22. Typical Transient Thermal Impedance -  
DIODE  
1200  
Conditions:  
TJ = 25 °C  
1000.00  
100.00  
10.00  
1.00  
1 µs  
VDD = 600 V  
IDS = 300 A  
VGS = -5/+20 V  
1000  
100 µs  
Limited by RDS On  
1 ms  
800  
100 ms  
td (off)  
600  
td (on)  
400  
tr  
tf  
0.10  
200  
0
Conditions:  
TC = 25 °C  
D = 0,  
Parameter: tp  
0.01  
0
5
10  
15  
20  
25  
30  
35  
40  
0.100  
1.000  
10.000  
100.000  
1000.000  
External Gate Resistor, RG(ext) (Ohms)  
Drain-Source Voltage, VDS (V)  
Fig 24. Typical Inductive Switching Time vs Gate  
Resistance (VDD = 600V, ID = 300A)  
Fig 23. MOSFET Safe Operating Area  
6
Typical Performance  
20  
30  
25  
20  
15  
10  
5
Conditions:  
TJ = 25 °C  
VDD = 600 V  
RG(ext) = 2.5 Ω  
VGS = -5/+20 V  
L = 77 μH  
Conditions:  
TJ = 25 °C  
VDD = 800 V  
RG(ext) = 2.5 Ω  
VGS = -5/+20 V  
L = 77 μH  
18  
16  
14  
12  
10  
8
ETotal  
ETotal  
6
EOn  
EOn  
4
EOff  
EOff  
2
0
0
0
50  
100  
150  
200  
250  
300  
350  
400  
450  
0
50  
100  
150  
200  
250  
300  
350  
400  
450  
Drain to Source Current, IDS (A)  
Drain to Source Current, IDS (A)  
Fig 25. Typical Clamped Inductive Switching  
Energy vs Drain Current (VDD = 600V)  
Fig 26. Typical Clamped Inductive Switching  
Energy vs Drain Current (VDD = 800V)  
14  
120  
Conditions:  
TJ = 25 °C  
VDD = 600 V  
ETotal  
12  
100  
IDS =300 A  
VGS = -5/+20 V  
L = 77 μH  
ETotal  
10  
8
80  
60  
40  
20  
0
EOff  
6
EOn  
EOff  
EOn  
Conditions:  
4
2
0
VDD = 600 V  
RG(ext) = 2.5 Ω  
IDS =300 A  
VGS = -5/+20 V  
L = 77 μH  
0
25  
50  
75  
100  
125  
150  
175  
0
5
10  
15  
20  
25  
30  
35  
40  
45  
Junction Temperature, TJ (°C)  
External Gate Resistor RG(ext) (Ohms)  
Fig 27. Typical Switching Loss vs. Temperature  
Fig 28. Typical Switching Loss vs. Gate Resistance  
7
Schematic  
Mechanical Characteristics (in mm)  
8

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