ZXMHC10A07N8TC [DIODES]

100V SO8 Complementary enhancement mode MOSFET H-Bridge; 100V SO8互补增强型MOSFET的H桥
ZXMHC10A07N8TC
型号: ZXMHC10A07N8TC
厂家: DIODES INCORPORATED    DIODES INCORPORATED
描述:

100V SO8 Complementary enhancement mode MOSFET H-Bridge
100V SO8互补增强型MOSFET的H桥

晶体 小信号场效应晶体管 开关 光电二极管
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A Product Line of  
Diodes Incorporated  
ZXMHC10A07N8  
100V SO8 Complementary enhancement mode MOSFET H-Bridge  
Summary  
ID  
Device  
V(BR)DSS  
QG  
RDS(on)  
TA= 25°C  
0.70@ VGS= 10V  
0.90@ VGS= 6.0V  
1.00@ VGS= -10V  
1.45@ VGS= -6.0V  
1.0A  
N-CH  
100V  
2.9nC  
0.9A  
-0.9A  
-0.7A  
P-CH  
-100V  
3.5nC  
P1S/P2S  
Description  
This new generation complementary MOSFET H-Bridge  
features low on-resistance achievable with low gate drive.  
P1G  
P2G  
Features  
P1D/N1D  
P2D/N2D  
2 x N + 2 x P channels in a SOIC package  
Applications  
N1G  
N2G  
DC Motor control  
DC-AC Inverters  
N1S/N2S  
Ordering information  
Device  
Reel size Tape width Quantity  
(inches)  
(mm)  
per reel  
ZXMHC10A07N8TC  
13  
12  
2,500  
Device marking  
ZXMHC  
10A07  
Issue 1.0 - March 2009  
© Diodes Incorporated  
1
www.diodes.com  
ZXMHC10A07N8  
Absolute maximum ratings  
Parameter  
Symbol  
N-  
P-  
Unit  
channel channel  
VDSS  
VGS  
Drain-Source voltage  
Gate-Source voltage  
100  
-100  
V
V
±20  
±20  
(b)  
(b)  
(a)  
(f)  
1.00  
0.80  
0.80  
0.81  
-0.85  
-0.68  
-0.68  
-0.69  
A
ID  
Continuous Drain current @ VGS= 10V; TA=25°C  
@ VGS= 10V; TA=70°C  
@ VGS= 10V; TA=25°C  
@ VGS= 10V; TL=25°C  
(c)  
IDM  
4.30  
0.70  
4.30  
-3.64  
-0.60  
-3.64  
A
A
A
Pulsed Drain current @ VGS= 10V; TA=25°C  
(b)  
Continuous Source current (Body diode) at TA =25°C  
IS  
(c)  
Pulsed Source current (Body diode) at TA =25°C  
ISM  
PD  
(a)  
0.87  
6.94  
1.36  
10.9  
0.90  
7.19  
W
mW/°C  
Power dissipation at TA =25°C  
Linear derating factor  
(b)  
W
mW/°C  
Power dissipation at TA =25°C  
P
D
P
D
Linear derating factor  
(f)  
W
mW/°C  
Power dissipation at TL =25°C  
Linear derating factor  
T , T  
j
Operating and storage temperature range  
-55 to 150  
stg  
°C  
Thermal resistance  
Parameter  
Symbol  
Value  
Unit  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
(a)  
R
θJA  
144  
Junction to ambient  
(b)  
R
θJA  
92  
Junction to ambient  
(d)  
R
θJA  
106  
254  
139  
Junction to ambient  
(e)  
R
θJA  
Junction to ambient  
(f)  
R
θJL  
Junction to lead  
NOTES:  
(a) For a device surface mounted on 25mm x 25mm x 1.6mm FR4 PCB with high coverage of single sided 1oz copper, in still  
air conditions with the heat-sink split into two equal areas (one for each drain connection); the device is measured when  
operating in a steady-state condition with one active die.  
(b) Same as note (a), except the device is measured at t 10 sec.  
(c) Same as note (a), except the device is pulsed with D= 0.02 and pulse width 300 µs. The pulse current is limited by the  
maximum junction temperature.  
(d) For a device surface mounted on 50mm x 50mm x 1.6mm FR4 PCB with high coverage of single sided 2oz copper, in still  
air conditions with the heat-sink split into two equal areas (one for each drain connection); the device is measured when  
operating in a steady-state condition with one active die.  
(e) For a device surface mounted on minimum copper 1.6mm FR4 PCB, in still air conditions; the device is measured when  
operating in a steady-state condition with one active die.  
(f) Thermal resistance from junction to solder-point (at the end of the drain lead); the device is operating in a steady-state  
condition with one active die.  
Issue 1.0 - March 2009  
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ZXMHC10A07N8  
Thermal characteristics  
10  
10  
1
RDS(ON)  
RDS(ON)  
Limited  
1
Limited  
DC  
DC  
1s  
100m  
100m  
10m  
1s  
100ms  
100ms  
10ms  
Note (a)  
Note (a)  
10ms  
1ms  
1ms  
10m  
Single Pulse, Tamb=25°C  
Single Pulse, Tamb=25°C  
100us  
100us  
1
10  
100  
1
10  
100  
VDS Drain-Source Voltage (V)  
-VDS Drain-Source Voltage (V)  
N-channel Safe Operating Area  
P-channel Safe Operating Area  
1.0  
140  
One Active Die  
25 x 25mm 1oz  
120  
100  
Any one  
active die  
D=0.5  
80  
0.5  
60  
Single Pulse  
D=0.05  
D=0.1  
10  
D=0.2  
40  
20  
0
0.0  
100µ 1m 10m 100m  
1
100  
1k  
0
25  
50  
75  
100  
125  
150  
Pulse Width (s)  
Temperature (°C)  
Transient Thermal Impedance  
Derating Curve  
One Active Die  
Single Pulse  
Tamb=25°C  
100  
10  
1
100µ 1m 10m 100m  
1
10  
100  
1k  
Pulse Width (s)  
Pulse Power Dissipation  
Issue 1.0 - March 2009  
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ZXMHC10A07N8  
N-channel electrical characteristics (at Tamb = 25°C unless otherwise stated)  
Parameter  
Static  
Symbol  
Min.  
Typ.  
Max.  
Unit Conditions  
Drain-Source breakdown  
voltage  
100  
V
V(BR)DSS  
ID = 250μA, VGS= 0V  
DS= 100V, VGS= 0V  
Zero Gate voltage Drain  
current  
IDSS  
0.5  
µA  
nA  
V
IGSS  
Gate-Body leakage  
±100  
VGS= ±20V, VDS= 0V  
ID= 250μA, VDS= VGS  
VGS= 10V, ID= 1.5A  
Gate-Source threshold  
voltage  
VGS(th)  
2.0  
4.0  
V
Static Drain-Source  
0.7  
0.9  
RDS(on)  
(a)  
on-state resistance  
VGS= 6.0V, ID= 1.0A  
Forward  
gfs  
(a) (c)  
1.6  
S
VDS= 15V, ID= 1.0A  
Transconductance  
Dynamic  
(c)  
Capacitance  
138  
12  
Input capacitance  
Output capacitance  
Ciss  
pF  
pF  
VDS= 60V, VGS= 0V  
Coss  
f= 1MHz  
Reverse transfer  
capacitance  
Crss  
6
pF  
(b) (c)  
Switching  
Turn-on-delay time  
Rise time  
1.8  
1.5  
4.1  
2.1  
ns  
ns  
ns  
ns  
td(on)  
tr  
td(off)  
tf  
V
DD= 50V, VGS= 10V  
ID= 1.0A  
Turn-off delay time  
Fall time  
RG 6.0Ω,  
(c)  
Gate charge  
Total Gate charge  
Gate-Source charge  
Gate-Drain charge  
Source–Drain diode  
2.9  
0.7  
1.0  
nC  
nC  
nC  
Qg  
V
DS=50V, VGS= 10V  
Qgs  
Qgd  
ID= 1.0A  
(a)  
IS= 1.5A, VGS= 0V  
Diode forward voltage  
0.95  
V
VSD  
trr  
(c)  
27  
12  
ns  
nC  
Reverse recovery time  
IS= 1.8A, di/dt= 100A/μs  
(c)  
Qrr  
Reverse recovery charge  
NOTES:  
(a) Measured under pulsed conditions. Pulse width 300μs; duty cycle 2%.  
(b) Switching characteristics are independent of operating junction temperature.  
(c) For design aid only, not subject to production testing  
Issue 1.0 - March 2009  
© Diodes Incorporated  
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ZXMHC10A07N8  
N-channel typical characteristics  
10V  
7V  
10V  
7V  
T =150°C  
T =25°C  
6V  
6V  
5V  
1
0.1  
1
0.1  
5V  
4.5V  
4.5V  
4V  
VGS  
VGS  
0.01  
3.5V  
4V  
0.01  
0.1  
1
10  
0.1  
1
10  
VDS Drain-Source Voltage (V)  
VDS Drain-Source Voltage (V)  
Output Characteristics  
Output Characteristics  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
VGS =10V  
ID =1.5A  
1
0.1  
RDS(on)  
T =150°C  
VGS(th)  
T =25°C  
VGS =VDS  
ID =250uA  
VDS =10V  
0.01  
3
4
5
6
-50  
0
50  
100  
150  
VGS Gate-Source Voltage (V)  
Tj Junction Temperature (°C)  
Typical Transfer Characteristics  
Normalised Curves v Temperature  
10  
10  
4.5V  
6V  
5V  
VGS  
T =150°C  
1
1
7V  
T =25°C  
10V  
0.1  
T =25°C  
0.4  
0.6  
0.8  
1.0  
1.2  
0.01  
0.1  
1
VSD Source-Drain Voltage (V)  
ID Drain Current (A)  
On-Resistance v Drain Current  
Source-Drain Diode Forward Voltage  
Issue 1.0 - March 2009  
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ZXMHC10A07N8  
N-channel typical characteristics –continued  
200  
10  
8
VGS =0V  
f =1MHz  
180  
160  
140  
120  
100  
80  
ID =1.0A  
6
VDS =50V  
CISS  
COSS  
4
CRSS  
60  
40  
2
20  
0
0
1
10  
100  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
VDS - Drain - Source Voltage (V)  
Capacitance v Drain-Source Voltage  
Q - Charge (nC)  
Gate-Source Voltage v Gate Charge  
Test circuits  
Current  
regulator  
QG  
50k  
Same as  
D.U.T  
12V  
QGS  
QGD  
VG  
VDS  
IG  
D.U.T  
ID  
VGS  
Charge  
Basic gate charge waveform  
Gate charge test circuit  
VDS  
90%  
RD  
VGS  
VDS  
RG  
VDD  
10%  
VGS  
td(on)  
tr  
td(off)  
tr  
t(on)  
t(on)  
Switching time waveforms  
Switching time test circuit  
Issue 1.0 - March 2009  
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ZXMHC10A07N8  
P-channel electrical characteristics (at Tamb = 25°C unless otherwise stated)  
Parameter  
Static  
Symbol  
Min.  
Typ.  
Max.  
Unit Conditions  
Drain-Source breakdown  
voltage  
-100  
V
V(BR)DSS  
ID = -250μA, VGS= 0V  
DS= -100V, VGS= 0V  
Zero Gate voltage Drain  
current  
IDSS  
-0.5  
µA  
nA  
V
IGSS  
Gate-Body leakage  
±100  
VGS= ±20V, VDS= 0V  
ID= -250μA, VDS= VGS  
VGS= -10V, ID= -0.6A  
Gate-Source threshold  
voltage  
VGS(th)  
-2.0  
-4.0  
V
Static Drain-Source  
1.0  
RDS(on)  
(a)  
on-state resistance  
VGS= -6.0V, ID= -0.5A  
1.45  
Forward  
gfs  
(a) (c)  
1.2  
S
VDS= -15V, ID= -0.6A  
Transconductance  
Dynamic  
(c)  
Capacitance  
141  
Input capacitance  
Output capacitance  
Ciss  
pF  
pF  
VDS= -50V, VGS= 0V  
Coss  
13.1  
f= 1MHz  
Reverse transfer  
capacitance  
Crss  
10.8  
pF  
(b) (c)  
Switching  
Turn-on-delay time  
Rise time  
1.6  
2.1  
5.9  
3.3  
ns  
ns  
ns  
ns  
td(on)  
tr  
td(off)  
tf  
V
DD= -50V, VGS= -10V  
ID= -1.0A  
Turn-off delay time  
Fall time  
RG 6.0Ω  
(c)  
Gate charge  
Total Gate charge  
Gate-Source charge  
Gate-Drain charge  
Source–Drain diode  
3.5  
0.6  
1.6  
nC  
nC  
nC  
Qg  
V
DS= -50V, VGS= -10V  
Qgs  
Qgd  
ID= -0.6A  
(a)  
IS= -0.7A, VGS= 0V  
Diode forward voltage  
-0.85  
29  
-0.95  
V
VSD  
trr  
(c)  
ns  
nC  
Reverse recovery time  
IS= -0.9A, di/dt= 100A/μs  
(c)  
31  
Qrr  
Reverse recovery charge  
NOTES:  
(a) Measured under pulsed conditions. Pulse width 300μs; duty cycle 2%.  
(b) Switching characteristics are independent of operating junction temperature.  
(c) For design aid only, not subject to production testing  
Issue 1.0 - March 2009  
© Diodes Incorporated  
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ZXMHC10A07N8  
P-channel typical characteristics  
10  
10  
1
10V  
7V  
10V  
7V  
T = 150°C  
T = 25°C  
5V  
4.5V  
4V  
5V  
1
0.1  
4.5V  
4V  
3.5V  
0.1  
3.5V  
-VGS  
3V  
0.01  
1E-3  
0.01  
1E-3  
-VGS  
0.1  
1
10  
0.1  
1
10  
-V  
Drain-Source Voltage (V)  
-V  
Drain-Source Voltage (V)  
DS  
DS  
Output Characteristics  
Output Characteristics  
2.2  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
VGS = -10V  
ID = - 0.6A  
1
0.1  
T = 150°C  
RDS(on)  
T = 25°C  
VGS(th)  
VGS = VDS  
-VDS = 10V  
ID = -250uA  
0.01  
3
4
5
-50  
0
50  
100  
150  
-V  
Gate-Source Voltage (V)  
Tj Junction Temperature (°C)  
GS  
Typical Transfer Characteristics  
Normalised Curves v Temperature  
10  
3.5V  
-VGS  
4V  
T = 25°C  
100  
10  
1
T = 150°C  
1
4.5V  
5V  
T = 25°C  
0.1  
7V  
10V  
0.01  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
0.01  
0.1  
1
10  
-V  
Source-Drain Voltage (V)  
-I Drain Current (A)  
SD  
D
On-Resistance v Drain Current  
Source-Drain Diode Forward Voltage  
Issue 1.0 - March 2009  
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ZXMHC10A07N8  
P-channel typical characteristics –continued  
10  
8
VGS = 0V  
ID = -0.6A  
200  
f = 1MHz  
150  
CISS  
6
COSS  
CRSS  
100  
4
50  
2
VDS = -50V  
0
0.1  
0
1
10  
100  
0
1
2
3
4
-V - Drain - Source Voltage (V)  
Q - Charge (nC)  
DS  
Capacitance v Drain-Source Voltage  
Gate-Source Voltage v Gate Charge  
Test circuits  
Current  
regulator  
QG  
50k  
Same as  
D.U.T  
0.2F  
12V  
QGS  
QGD  
VG  
VDS  
IG  
D.U.T  
ID  
VGS  
Charge  
Basic gate charge waveform  
Gate charge test circuit  
VDS  
90%  
RD  
VGS  
VDS  
RG  
VDD  
10%  
VGS  
Pulse width Ͻ 1S  
Duty factor 0.1%  
tr  
td(off)  
tr  
td(on)  
t(on)  
t(on)  
Switching time waveforms  
Switching time test circuit  
Issue 1.0 - March 2009  
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ZXMHC10A07N8  
Packaging details - SO8  
DIM  
Inches  
Min.  
Millimeters  
DIM  
Inches  
Millimeters  
Max.  
1.27 BSC  
Max.  
0.069  
0.010  
0.197  
0.244  
0.157  
0.050  
Min.  
Max.  
1.75  
0.25  
5.00  
6.20  
4.00  
1.27  
Min.  
Max.  
Min.  
A
A1  
D
0.053  
0.004  
0.189  
0.228  
0.150  
0.016  
1.35  
0.10  
4.80  
5.80  
3.80  
0.40  
e
b
c
θ
-
0.050 BSC  
0.013  
0.020  
0.33  
0.51  
0.008  
0.010  
0.19  
0.25  
H
0°  
-
8°  
-
0°  
-
8°  
E
-
-
L
-
-
-
-
Note: Controlling dimensions are in inches. Approximate dimensions are provided in millimeters  
Issue 1.0 - March 2009  
© Diodes Incorporated  
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ZXMHC10A07N8  
IMPORTANT NOTICE  
DIODES INCORPORATED MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARDS TO THIS  
DOCUMENT, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS  
FOR A PARTICULAR PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS OF ANY JURISDICTION).  
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other changes without further notice to this document and any product described herein. Diodes Incorporated does not assume  
any liability arising out of the application or use of this document or any product described herein; neither does Diodes  
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damages.  
Diodes Incorporated does not warrant or accept any liability whatsoever in respect of any products purchased through  
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Products described herein may be covered by one or more United States, international or foreign patents pending. Product  
names and markings noted herein may also be covered by one or more United States, international or foreign trademarks.  
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Diodes Incorporated products are specifically not authorized for use as critical components in life support devices or systems  
without the express written approval of the Chief Executive Officer of Diodes Incorporated. As used herein:  
A. Life support devices or systems are devices or systems which:  
1. are intended to implant into the body, or  
2. support or sustain life and whose failure to perform when properly used in accordance with instructions for use  
provided in the  
labeling can be reasonably expected to result in significant injury to the user.  
B. A critical component is any component in a life support device or system whose failure to perform can be reasonably  
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Copyright © 2009, Diodes Incorporated  
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Issue 1.0 - March 2009  
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