STB80NF10-T4 [ETC]
TRANSISTOR | MOSFET | N-CHANNEL | 100V V(BR)DSS | 80A I(D) | TO-263AB ; 晶体管| MOSFET | N沟道| 100V V( BR ) DSS | 80A I( D) | TO- 263AB\n型号: | STB80NF10-T4 |
厂家: | ETC |
描述: | TRANSISTOR | MOSFET | N-CHANNEL | 100V V(BR)DSS | 80A I(D) | TO-263AB
|
文件: | 总7页 (文件大小:68K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
STB80NF10
2
2
N - CHANNEL 100V - 0.014Ω - 80A I PAK/D PAK
LOW Qg STripFET POWER MOSFET
PRELIMINARY DATA
TYPE
VDSS
RDS(on )
ID
STB80NF10
100 V < 0.018 Ω
80 A
■
■
■
■
TYPICAL RDS(on) = 0.014 Ω
EXCEPTIONAL dv/dt CAPABILITY
100% AVALANCHE TESTED
APPLICATIONORIENTED
CHARACTERIZATION
■
SURFACE-MOUNTING D2PAK (TO-263)
POWER PACKAGE IN TUBE (NO SUFFIX)
OR IN TAPE & REEL (SUFFIX ”T4”)
3
3
2
1
1
I2PAK
TO-262
D2PAK
TO-263
DESCRIPTION
This MOSFET
series
realized
with
STMicroelectronics unique STripFET process has
specifically been designed to minimize input
capacitance and gate charge. It is therefore
suitable as primary switch in advanced
high-efficiency, high-frequency isolated DC-DC
(Suffix ”-1”)
(Suffix ”T4”)
INTERNAL SCHEMATIC DIAGRAM
converters for
Telecom and
Computer
applications. It is also intended for any
applicationswith low gate drive requirements.
APPLICATIONS
■
HIGH-EFFICIENCY DC-DC CONVERTERS
UPS AND MOTOR CONTROL
■
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
ID
Parameter
Value
100
Unit
Drain-source Voltage (VGS = 0)
Drain- gate Voltage (RGS = 20 kΩ)
Gate-source Voltage
V
V
100
± 20
80
V
o
Drain Current (continuous) at Tc = 25 C
A
o
ID
Drain Current (continuous) at Tc = 100 C
50
A
IDM( ) Drain Current (pulsed)
320
A
•
o
Ptot
Total Dissipation at Tc = 25 C
Derating Factor
210
W
1.4
W/oC
V/ns
mJ
oC
oC
dv/dt(1) Peak Diode Recovery voltage slope
EAS(2) Single Pulse Avalanche Energy
9
245
Tstg
Tj
Storage Temperature
-65 to 175
Max. Operating Junction Temperature
175
(•) Pulse width limitedby safe operatingarea
( 2) starting Tj = 25 oC, ID =80A , VDD = 50V
(1) ISD ≤ 80 A, di/dt ≤ 300A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMA
1/7
April 2000
STB80NF10
THERMAL DATA
Rthj-case Thermal Resistance Junction-case
Rthj-amb Thermal Resistance Junction-ambient
Max
Max
0.71
62.5
300
oC/W
oC/W
oC
Tl
Maximum Lead Temperature For Soldering Purpose
(Tcase = 25 oC unless otherwisespecified)
ELECTRICAL CHARACTERISTICS
OFF
Symbol
Parameter
Test Conditions
ID = 250 µA VGS = 0
Min.
Typ.
Max.
Unit
V(BR)DSS Drain-source
100
V
Breakdown Voltage
Zero Gate Voltage
Drain Current (VGS = 0) VDS = Max Rating
IDSS
IGSS
VDS = Max Rating
1
10
µA
A
µ
o
Tc =125 C
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20 V
± 100
nA
ON ( )
Symbol
VGS(th)
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
V
Gate Threshold Voltage VDS = VGS ID = 250 µA
2
3
4
RDS(on)
Static Drain-source On VGS = 10 V
Resistance
ID = 40 A
0.014 0.018
Ω
ID(on)
On State Drain Current VDS > ID(on) x RDS(on)max
VGS = 10 V
80
A
DYNAMIC
Symbol
Parameter
Forward
Test Conditions
VDS > ID(on) x RDS(on)max ID =40 A
Min.
Typ.
Max.
Unit
gfs ( )
20
S
Transconductance
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 25 V f = 1 MHz VGS = 0
4300
600
240
pF
pF
pF
2/7
STB80NF10
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
Min.
Min.
Min.
Typ.
Max.
Max.
Max.
Unit
td(on)
tr
Turn-on Delay Time
Rise Time
VDD = 50 V
RG = 4.7
ID = 40 A
VGS = 10 V
40
145
ns
ns
Ω
(Resistive Load, see fig. 3)
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD = 80 V ID = 80 A VGS = 10 V
140
23
51
nC
nC
nC
SWITCHING OFF
Symbol
Parameter
Test Conditions
Typ.
Unit
td(off)
tf
Turn-off Delay Time
Fall Time
VDD = 27 V
ID = 40 A
134
115
ns
ns
RG = 4.7 Ω
VGS = 10 V
(Resistive Load, see fig. 3)
td(off)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
Vclamp = 80 V
RG = 4.7 Ω
ID = 80 A
VGS = 10 V
111
125
185
ns
ns
ns
(Inductive Load, see fig. 5)
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
Typ.
Unit
ISD
ISDM ( )
Source-drain Current
Source-drain Current
(pulsed)
80
320
A
A
•
VSD ( ) Forward On Voltage
ISD = 80 A VGS = 0
1.5
V
trr
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
ISD = 80 A
VDD = 50 V
(see test circuit, fig. 5)
di/dt = 100 A/ s
155
850
11
ns
µ
Tj = 150 oC
Qrr
nC
A
IRRM
( ) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limitedby safe operatingarea
3/7
STB80NF10
Fig. 1
: Unclamped Inductive Load Test Circuit
Fig. 2
: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For
Fig. 4: Gate Charge test Circuit
Resistive Load
Fig. 5
: Test Circuit For Inductive Load Switching
And Diode Recovery Times
4/7
STB80NF10
2
TO-262 (I PAK) MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
4.4
TYP.
MAX.
4.6
MIN.
0.173
0.098
0.027
0.044
0.017
0.048
0.352
0.094
0.393
0.515
0.137
0.050
MAX.
0.181
0.106
0.036
0.067
0.023
0.053
0.368
0.106
0.409
0.531
0.149
0.055
A
A1
B
2.49
0.7
2.69
0.93
1.7
B2
C
1.14
0.45
1.23
8.95
2.4
0.6
C2
D
1.36
9.35
2.7
e
E
10
10.4
13.6
3.78
1.4
L
13.1
3.48
1.27
L1
L2
L1
L2
D
L
P011P5/E
5/7
STB80NF10
2
TO-263 (D PAK) MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
4.4
TYP.
MAX.
4.6
MIN.
0.173
0.098
0.027
0.044
0.017
0.047
0.352
0.393
0.192
0.590
0.050
0.055
MAX.
0.181
0.106
0.036
0.067
0.023
0.053
0.368
0.409
0.208
0.624
0.055
0.068
A
A1
B
2.49
0.7
2.69
0.93
1.7
B2
C
1.14
0.45
1.21
8.95
10
0.6
C2
D
1.36
9.35
10.4
5.28
15.85
1.4
E
G
4.88
15
L
L2
L3
1.27
1.4
1.75
D
A
C
C2
DETAIL”A”
DETAIL”A”
A1
B
B2
E
G
L3
L2
L
P011P6/E
6/7
STB80NF10
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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7/7
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