FAN3278TMX [FAIRCHILD]
30V PMOS-NMOS Bridge Driver; 30V PMOS- NMOS桥驱动器型号: | FAN3278TMX |
厂家: | FAIRCHILD SEMICONDUCTOR |
描述: | 30V PMOS-NMOS Bridge Driver |
文件: | 总15页 (文件大小:458K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
January 2011
FAN3278
30V PMOS-NMOS Bridge Driver
Description
Features
The FAN3278 dual 1.5A gate driver is optimized to drive
.
.
8V to 27V Optimum Operating Range
a
high-side P-channel MOSFET and a low-side
Drives High-Side PMOS and Low-Side NMOS in
Motor Control or Buck Step-Down Applications
N-channel MOSFET in motor control applications
operating from a voltage rail up to 27V. Internal circuitry
limits the voltage applied to the gates of the external
MOSFETs to 13V maximum. The driver has TTL input
thresholds and provides buffer and level translation from
logic inputs. Internal circuitry prevents the output
switching devices from operating if the VDD supply
voltage is below the IC operation level. Internal 100kΩ
resistors bias the non-inverting output LOW and the
inverting output to VDD to keep the external MOSFETs
off during startup intervals when logic control signals
may not be present.
.
.
Output Drive-Voltage Magnitude Limited: < 13V
for VDD up to 30V
Biases Each Load Device OFF with a 100kΩ
Resistor when VDD Below Operating Level
.
.
.
Low-Voltage TTL Input Thresholds
Peak Gate Drives at 12V: +1.5A Sink, -1.0A Source
Internal Resistors Hold Driver Off When
No Inputs Present
.
.
8-Lead SOIC Package
The FAN3278 driver incorporates MOSFET devices for
the final output stage, providing high current throughout
the MOSFET turn-on / turn-off transition to minimize
switching loss. The internal gate-drive regulators
provide optimum gate-drive voltage when operating
from a rail of 8V to 27V. The FAN3278 can be driven
from a voltage rail of less than 8V; however, its gate
drive current is reduced.
Rated from –40°C to +125°C Ambient
Applications
.
.
.
Motor Control with PMOS / NMOS Half-Bridge
Configuration
Buck Converters with High-Side PMOS Device;
100% Duty Cycle Operation Possible
The FAN3278 has two independent ENABLE pins that
default to ON if not connected. If the ENABLE pin for
non-inverting channel A is pulled LOW, OUTA is forced
LOW. If the ENABLE pin for inverting channel B is
pulled LOW, OUTB is forced HIGH. If an input is left
unconnected, internal resistors bias the inputs such that
the external MOSFETs are OFF.
Logic-Controlled Load Circuits with High-Side
PMOS Switch
Figure 1. Typical Application
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
Ordering Information
Input
Threshold
Packing
Method
Part Number
Logic
2,500 Units on
Tape & Reel
FAN3278TMX
Non-Inverting Channel and Inverting Channel with Dual Enable
TTL
Figure 2. Typical 3-Phase Blower Motor Drive Application
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
2
Pin Configuration
Figure 3. Pin Configuration (Top View)
Thermal Characteristics(1)
Package
(2)
(3)
(4)
(5)
(6)
Unit
JL
JT
JA
JB
JT
40
31
89
43
3
°C/W
8-Pin Small-Outline Integrated Circuit (SOIC)
Notes:
1. Estimates derived from thermal simulation; actual values depend on the application.
2. Theta_JL (JL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads
(including any thermal pad) that are typically soldered to a PCB.
3. Theta_JT (JT): Thermal resistance between the semiconductor junction and the top surface of the package,
assuming it is held at a uniform temperature by a top-side heatsink.
4. Theta_JA (ΘJA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking,
and airflow. The value given is for natural convection with no heatsink using a 2S2P board, as specified in
JEDEC standards JESD51-2, JESD51-5, and JESD51-7, as appropriate.
5. Psi_JB (JB): Thermal characterization parameter providing correlation between semiconductor junction
temperature and an application circuit board reference point for the thermal environment defined in Note 4. For
the SOIC-8 package, the board reference is defined as the PCB copper adjacent to pin 6.
6. Psi_JT (JT): Thermal characterization parameter providing correlation between the semiconductor junction
temperature and the center of the top of the package for the thermal environment defined in Note 4.
Pin Definitions
Pin# Name
Description
1
8
3
2
4
7
ENA Enable Input for Channel A. Pull pin LOW to inhibit driver A. ENA has TTL thresholds.
ENB Enable Input for Channel B. Pull pin LOW to inhibit driver B. ENB has TTL thresholds.
GND Ground. Common ground reference for input and output circuits.
INA
INB
Input to Channel A.
Input to Channel B.
Gate Drive Output A: Held LOW unless required input is present and VDD is above the internal
voltage threshold where the IC is functional.
OUTA
Gate Drive Output B (inverted from the input). Held HIGH unless the required input is present
and VDD is above the internal voltage threshold where the IC is functional.
5
6
OUTB
VDD Supply Voltage. Provides power to the IC.
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
3
Output Logic
FAN3278 (Channel A)
FAN3278 (Channel B)
ENA
INA
OUTA
ENB
INB
OUTB
0
0(7)
0
0
0
1
0
0(7)
1
1
1
0
0
1
0
1
1(7)
1(7)
0(7)
1
1(7)
1(7)
0(7)
1
Note:
7. Default input signal if no external connection is made.
Block Diagram
VDD
VDD
100k
100k
1
2
8
7
ENB
ENA
INA
13V
OUTA
LS
Predriver
100k
100k
Low-Side
Drive
Regulator
6
VDD
3
GND
High-Side
Drive
Regulator
100k
HS
5
Predriver
OUTB
INB
4
100k
VDD - 13V
Figure 4. Block Diagram
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
4
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
VDD
Parameter
Min.
Max.
Unit
V
VDD to PGND
-0.3
30.0
VEN
ENA, ENB to GND
INA, INB to GND
OUTA, OUTB to GND
GND - 0.3 VDD + 0.3
GND - 0.3 VDD + 0.3
GND - 0.3 VDD + 0.3
+260
V
VIN
V
VOUT
TL
V
Lead Soldering Temperature (10 Seconds)
Junction Temperature
ºC
ºC
ºC
TJ
-55
-65
2
+150
+150
TSTG
Storage Temperature
Human Body Model, JEDEC JESD22-A114
Charged Device Model, JEDEC JESD22-C101
Electrostatic Discharge
Protection Level
ESD
kV
2
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
VDD
Parameter
Min.
8
Max.
27
Unit
V
Supply Voltage Range
VEN
Enable Voltage (ENA, ENB)
Input Voltage (INA, INB)
0
VDD
V
VIN
0
VDD
V
TA
Operating Ambient Temperature
-40
+125
°C
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
5
Electrical Characteristics
Unless otherwise noted, VDD=12V and TJ=-40°C to +125°C. Currents are defined as positive into the device (Isink) and
negative out of the device (Isource).
Symbol
Supply
VDD
Parameter
Conditions
Min.
Typ. Max. Unit
Optimum Operating Range(8)
8
27
V
Supply Current Inputs / EN Not
Connected
IDD
1.3
2.0
mA
VON
VHYS
Input(9)
VIL
Turn-On Voltage(9)
INA=ENA=VDD, INB=ENB=0V
INA=ENA=VDD, INB=ENB=0V
3.8
10
V
Turn-On / Turn-Off Hysteresis (9)
mV
INx Logic Low Threshold
INx Logic High Threshold
Logic Hysteresis Voltage
0.8
0.4
0.8
1.1
1.80
0.7
V
V
V
VIH
2.25
1.0
VHYS
Enable
VENL
VENH
VHYS
RPU
Enable Logic Low Threshold
EN from 5V to 0V
EN from 0V to 5V
1.2
1.60
0.7
100
44
V
V
Enable Logic High Threshold
Logic Hysteresis Voltage(10)
2.25
V
Enable Pull-Up Resistance
kΩ
ns
ns
ns
ns
tD1
Propagation A Delay, EN Rising(11)
Propagation A Delay, EN Falling(11)
Propagation B Delay, EN Rising(11)
Propagation B Delay, EN Falling(11)
0 - 5VIN, 1V/ns Slew Rate
0 – 5VIN, 1V/ns Slew Rate
0 - 5VIN, 1V/ns Slew Rate
0 – 5VIN, 1V/ns Slew Rate
70
60
70
60
tD2
33
tD2
39
tD1
29
Continued on the following page…
Timing Diagrams
90%
Output
10%
Input
or
Enable
VINH
VINL
tD1
tD2
tFALL
tRISE
Figure 5. Non-Inverting
Figure 6. Inverting
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
6
Electrical Characteristics (Continued)
Unless otherwise noted, VDD=12V and TJ=-40°C to +125°C. Currents are defined as positive into the device (Isink) and
negative out of the device (Isource).
Symbol
Output
Parameter
Conditions
Min. Typ. Max. Unit
IPK_OFF OUT Current, Peak, Turn-Off(10)
CLOAD=0.1µF, f=1kHz
CLOAD=0.1µF, f=1kHz
1.5
A
A
IPK_ON
IOFF
OUT Current, Peak, Turn-On(10)
-1.0
OUT at VDD, CLOAD=0.1µF,
f=1kHz
OUT Current, Mid-Voltage, Turn-Off(10
1.0
A
A
OUT at VDD/2, CLOAD=0.1µF,
f=1kHz
ION
OUT Current, Mid-Voltage, Turn-On(10)
-0.5
VOUTA
VOUTB
VOUTA
VOUTB
OUTA Drive Voltage
VDD=27V, INA=“HI”
VDD=27V, INA=“HI”
VDD=10V, INB=“HI”
VDD=10V, INB=“HI”
VDD=6V, CLOAD=0.1µF
11
11
13
13
V
V
OUTB Drive Voltage, VDD – VOUTB
OUTA Drive Voltage
6.5
6.5
7.0
7.0
4.2
10.3
6.8
13.7
17
V
OUTB Drive Voltage, VDD – VOUTB
V
RO_A_SINK OUTA Sink Impedance (Turn-Off)(10)
Ω
RO_A_SRC OUTA Source Impedance (Turn-On)(10) VDD=6V, CLOAD=0.1µF
RO_B_SINK OUTB Sink Impedance (Turn-On)(10)
VDD=6V, CLOAD=0.1µF
RO_B_SRC OUTB Source Impedance (Turn-Off)(10) VDD=6V, CLOAD=0.1µF
Ω
Ω
Ω
tON,N
tOFF,N
tON,P
tOFF,P
tD1
Output A Rise Time(11)
CLOAD=1000pF to GND
CLOAD=1000pF to GND
CLOAD=1000pF to VDD
CLOAD=1000pF to VDD
0 - 5VIN, 1V/ns Slew Rate
0 - 5VIN, 1V/ns Slew Rate
30
15
30
15
70
60
ns
ns
ns
ns
ns
ns
mA
Output A Fall Time(11)
Output B Fall Time(11)
8
21
Output B Rise Time(11)
8
Output Propagation Delay On(11)
Output Propagation Delay Off(11)
Output Reverse Current Withstand(10)
45
tD2
35
IRVS
500
Notes:
8. The internal gate-drive regulators provide optimum gate-drive voltage when operating from a rail of 8V to 27V.
The FAN3278 can be driven from a voltage rail of less than 8V; however, with reduced gate drive current.
9. EN inputs have near-TTL thresholds (refer to the ENABLE section).
10. Not tested in production.
11. See the Timing Diagrams of Figure 5 and Figure 6.
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
7
Typical Performance Characteristics
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.
Figure 7. IDD (Static) vs. Supply Voltage(12)
Figure 8. IDD (Static) vs. Temperature(12)
Figure 10. IDD (1nF Load) vs. Frequency
Figure 9. IDD (No Load) vs. Frequency
Figure 11. Input Thresholds vs. Temperature
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
8
Typical Performance Characteristics
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.
Figure 12. Propagation Delays vs. Temperature
Figure 13. Propagation Delays vs. Temperature
Figure 14. Rise and Fall Times vs. Temperature
Figure 15. Rise and Fall Times vs. Temperature
Figure 16. Gate Drive Voltage vs. Temperature
Figure 17. Gate Drive Voltage vs. Temperature
Note:
12. For any inverting inputs pulled LOW, non-inverting inputs pulled HIGH, or outputs driven HIGH; static IDD
increases by the current flowing through the corresponding pull-up/down resistor, shown in Figure 4.
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
9
Applications Information
Input Thresholds
The FAN3278 driver has TTL input thresholds and
provides buffer and level translation functions from
logic inputs. The input thresholds meet industry-
standard TTL-logic thresholds, independent of the VDD
voltage, and there is
a
hysteresis voltage of
approximately 0.4V. These levels permit the inputs to
be driven from a range of input logic signal levels for
which a voltage over 2V is considered logic HIGH. The
driving signal for the TTL inputs should have fast rising
and falling edges with a slew rate of 6V/µs or faster, so
a rise time from 0 to 3.3V should be 550ns or less.
With reduced slew rate, circuit noise could cause the
driver input voltage to exceed the hysteresis voltage
and retrigger the driver input inadvertently.
Figure 18. Non-Inverting Startup Waveforms
Static Supply Current
In the IDD (static) typical performance characteristics
(see Figure 7 and Figure 8), the curve is produced with
all inputs / enables floating (OUTA is LOW, OUTB is
HIGH) and indicates the lowest static IDD current for the
tested configuration. For other states, additional current
flows through the 100k resistors on the inputs and
outputs, shown in the block diagram (see Figure 4). In
these cases, the static IDD current is the value obtained
from the curves plus this additional current.
Figure 19 illustrates startup waveforms for inverting
channel B. At power-up, the driver output for channel B
is tied to VDD through an internal 100kΩ resistor until
VDD reaches the voltage where the device starts
operating, then OUTB operates out of phase with INB.
Gate Drive Regulator
FAN3278 incorporates internal regulators to regulate the
gate drive voltage. The output pin slew rate is
determined by this gate drive voltage and the load on
the output. It is not user adjustable, but a series resistor
can be added if a slower rise or fall time is needed at
the MOSFET gate.
Startup Operation
The FAN3278 startup logic is optimized to drive a ground-
referenced N-channel MOSFET with channel A and a
VDD-referenced P-channel MOSFET with channel B.
The optimum operating voltage of the FAN3278 is 8V to
27V. It has an internal “watchdog” circuit that provides a
loose UVLO turn-on voltage (VON) of approximately 3.8V
with a small hysteresis of about 10mV. However, it is
recommended that VDD is greater than 4.75V in all
application circuits.
Figure 19. Inverting Startup Waveforms
It is possible, during startup, before VDD has reached
approximately 4.5V, that the output pulse width may
take a few switching cycles to reach the full duty-cycle
of the input pulse. This is due to internal propagation
delays affecting the operation with higher switching
frequency (e.g. >100kHz) and slow VDD ramp-up (e.g.
<20V/ms). For this reason, it is recommended that VDD
should be greater than 4.75V before any INA or INB
signals are present.
When the VDD supply voltage is below the level needed
to operate the internal circuitry, the outputs are biased
to hold the external MOSFETs in OFF state. Internal
100kΩ resistors bias the non-inverting output LOW and
the inverting output to VDD to keep the external
MOSFETs off during startup intervals when input control
signals may not be present.
For high-frequency applications (several hundred kHz
up to 1MHz), where the above recommendation of VDD
> 4.75V is not possible, the use of ENABLES to
actively hold the outputs LOW until VDD > 4.75V
assures the driver output pulse width follows the input
from 4.75V up to 28V.
Figure 18 shows startup waveforms for non-inverting
channel A. At power-up, the driver output for channel A
remains LOW until VDD reaches the voltage where the
device starts operating, then OUTA operates in-phase
with INA.
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
10
best results, make connections to all pins as short
and direct as possible.
VDD Bypass Capacitor Guidelines
To enable this IC to turn a device on quickly, a local
high-frequency bypass capacitor, CBYP, with low ESR
and ESL should be connected between the VDD and
GND pins with minimal trace length. This capacitor is in
addition to bulk electrolytic capacitance of 10µF to 47µF
commonly found on driver and controller bias circuits.
.
The turn-on and turn-off current paths should be
minimized, as discussed above.
Thermal Guidelines
Gate drivers used to switch MOSFETs and IGBTs at
high frequencies can dissipate significant amounts of
power. It is important to determine the driver power
dissipation and the resulting junction temperature in the
application to ensure the part is operating within
acceptable temperature limits.
A typical criterion for choosing the value of CBYP is to
keep the ripple voltage on the VDD supply to ≤5%. This
is often achieved with a value ≥20 times the equivalent
load capacitance CEQV, defined as QGATE/VDD. Ceramic
capacitors of 0.1µF to 1µF or larger are common
choices, as are dielectrics, such as X5R and X7R, with
stable temperature characteristics and high pulse
current capability.
The total power dissipation in a gate driver is the sum of
two components, PGATE and PDYNAMIC
:
PTOTAL=PGATE + PDYNAMIC
(1)
If circuit noise affects normal operation, the value of
CBYP may be increased to 50-100 times the CEQV or CBYP
may be split into two capacitors. One should be a larger
value, based on equivalent load capacitance, and the
other a smaller value, such as 1-10nF, mounted closest
to the VDD and GND pins to carry the higher-frequency
components of the current pulses. The bypass capacitor
must provide the pulsed current from both of the driver
channels and, if the drivers are switching
simultaneously, the combined peak current sourced
from the CBYP can be twice as large as when a single
channel is switching.
Gate Driving Loss: The most significant power loss
results from supplying gate current (charge per unit
time) to switch the load MOSFET on and off at the
switching frequency. The power dissipation that results
from driving a MOSFET with a specified gate-source
voltage, VGS, with gate charge, QG, at switching
frequency, fSW, is determined by:
PGATE=QG • VGS • fSW
(2)
This needs to be calculated for each P-channel and N-
channel MOSFET where the QG is likely to be different.
Dynamic Pre-drive / Shoot-through Current: Power loss
resulting from internal current consumption under
dynamic operating conditions, including pin pull-up /
pull-down resistors, can be obtained using the “IDD (No-
Load) vs. Frequency” graphs in Figure 9 to determine
the current IDYNAMIC drawn from VDD under actual
operating conditions.
Layout and Connection Guidelines
The FAN3278 gate driver incorporates fast-reacting
input circuits, short propagation delays, and powerful
output stages capable of delivering current peaks over
1.5A to facilitate fast voltage transition times. The
following layout and connection guidelines are strongly
recommended:
PDYNAMIC=IDYNAMIC • VDD
(3)
.
Keep high-current output and power ground paths
separate from logic and enable input signals and
signal ground paths. This is especially critical when
dealing with TTL-level logic thresholds at driver
inputs and enable pins.
Once the power dissipated in the driver is determined,
the driver junction rise with respect to circuit board can
be evaluated using the following thermal equation,
JB
assuming
was determined for a similar thermal
design (heat sinking and air flow):
.
Keep the driver as close to the load as possible to
minimize the length of high-current traces. This
reduces the series inductance to improve high-
speed switching, while minimizing the loop area
that can couple EMI to the driver inputs and
surrounding circuitry.
TJ =PTOTAL
where:
•
JB + TB
(4)
TJ =driver junction temperature
JB
=(psi) thermal characterization parameter relating
temperature rise to total power dissipation
.
.
If the inputs to a channel are not externally
connected, the internal 100k resistors indicated
on block diagrams command a low output on
channel A and a high output on channel B. In noisy
environments, it may be necessary to tie inputs of
an unused channel to VDD or GND using short
traces to prevent noise from causing spurious
output switching.
TB =board temperature in location defined in
Note 1 under Thermal Resistance table.
As an example of a power dissipation calculation,
consider an application driving two MOSFETs (one P-
channel and one N-channel, both with a gate charge of
60nC each) with VGS=VDD=12V. At
a
switching
frequency of 200kHz, the total power dissipation is:
PGATE=60nC • 12V • 200kHz • 2=0.288W
PDYNAMIC=1.65mA • 12V =0.020W
PTOTAL=0.308W
(5)
(6)
(7)
Many high-speed power circuits can be susceptible
to noise injected from their own output or other
external sources, possibly causing output mis-
triggering. These effects can be obvious if the
circuit is tested in breadboard or non-optimal circuit
layouts with long input, enable, or output leads. For
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
11
The SOIC-8 package has a junction-to-board thermal
Test Circuit
characterization parameter of JB=43°C/W. In a system
application, the localized temperature around the device
is a function of the layout and construction of the PCB
along with airflow across the surfaces. To ensure
reliable operation, the maximum junction temperature of
the device must not exceed the absolute maximum
rating of 150°C; with 80% derating, TJ would be limited
to 120°C. Rearranging Equation 4 determines the board
temperature required to maintain the junction
temperature below 120°C:
TB=TJ - PTOTAL
•
(8)
(9)
JB
TB=120°C – 0.308W • 43°C/W=107°C
Figure 20. Quasi-Static IOUT / VOUT Test Circuit
Differences between FAN3278 and FAN3268
FAN3278 and FAN3268 are pin-compatible to each other and are designed to drive one P-Channel and one
N-channel MOSFET in applications such as battery-powered compact fan / pump DC motor drives. However, there
are key differences, highlighted in Table 1.
Table 1. Differences between FAN3278 and FAN3268
FAN3278
FAN3268
27V Operating Maximum
30V Absolute Maximum
18V Operating Maximum
20V Absolute Maximum
Supply Voltage
Yes, since the maximum operating VDD can No gate drive regulator is needed. The
be as high as 27V, the gate voltage to the gate drive voltage is VDD and the
external MOSFETs is limited to about 13V. FAN3268 switches rail-to-rail.
Gate Drive Regulator
The optimum operating range is 8V to 27V.
After the IC turns on at about 3.8V, the
output tracks VDD up to the regulated
voltage rail of about 11~13V. Below 8V of
4.1V is the UVLO turn-off voltage
which is the minimum operating
VDD, the FAN3278 operates, but (a) slower voltage.
and (b) with limited gate drive voltage until
it reaches around 8V.
Minimum Operating
Voltage
The IC starts operating approximately at
3.8V which acts as a loose UVLO
Has the tight UVLO threshold of 4.5V
on / 4.1V off. Incorporates “smart
threshold. It incorporates a “smart startup” startup” (outputs held OFF before IC is
Startup
feature where the outputs are held OFF
before the IC starts operating.
fully operational at the UVLO
threshold).
Compound MillerDrive™ architecture
in the final output stage to provide a
more efficient gate drive current during
the Miller plateau stage of the turn-
on/turn-off switching transition.
Output Gate Drive
Architecture
Standard MOS-based output structure with
gate drive clamp.
OUTB Gate Drive
Current Strength
Optimized for P-channel: The turn-OFF
(1.5 A) is stronger than turn-ON (1.0A).
P-channel turn-ON (2.4A) is stronger
than turn-OFF (1.6A).
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
12
Table 2. Related Products
Gate
Part
Input
Threshold
Type
Drive(13)
Logic
Package
Number
(Sink / Src)
FAN3111C Single 1A +1.1A / -0.9A
FAN3111E Single 1A +1.1A / -0.9A
FAN3100C Single 2A +2.5A / -1.8A
FAN3100T Single 2A +2.5A / -1.8A
CMOS
External(14)
CMOS
TTL
Single Channel of Dual-Input/Single-Output
SOT23-5, MLP6
Single Non-Inverting Channel with External Reference SOT23-5, MLP6
Single Channel of Two-Input/One-Output
SOT23-5, MLP6
SOT23-5, MLP6
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
Single Channel of Two-Input/One-Output
FAN3226C Dual 2A
FAN3226T Dual 2A
FAN3227C Dual 2A
FAN3227T Dual 2A
FAN3228C Dual 2A
FAN3228T Dual 2A
FAN3229C Dual 2A
FAN3229T Dual 2A
+2.4A / -1.6A
+2.4A / -1.6A
+2.4A / -1.6A
+2.4A / -1.6A
+2.4A / -1.6A
+2.4A / -1.6A
+2.4A / -1.6A
+2.4A / -1.6A
CMOS
TTL
Dual Inverting Channels + Dual Enable
Dual Inverting Channels + Dual Enable
CMOS
TTL
Dual Non-Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
Dual Channels of Two-Input/One-Output, Pin Config.1
Dual Channels of Two-Input/One-Output, Pin Config.1
Dual Channels of Two-Input/One-Output, Pin Config.2
Dual Channels of Two-Input/One-Output, Pin Config.2
CMOS
TTL
CMOS
TTL
Non-Inverting Channel (NMOS) and Inverting Channel
(PMOS) + Dual Enables
FAN3268T Dual 2A
+2.4A / -1.6A
TTL
SOIC8
30V Non-Inverting (NMOS) and Inverting (PMOS) +
Dual Enable
FAN3278T Dual 2A
+1.4A / -1.0A
TTL
SOIC8
FAN3223C Dual 4A
FAN3223T Dual 4A
FAN3224C Dual 4A
FAN3224T Dual 4A
FAN3225C Dual 4A
FAN3225T Dual 4A
+4.3A / -2.8A
+4.3A / -2.8A
+4.3A / -2.8A
+4.3A / -2.8A
+4.3A / -2.8A
+4.3A / -2.8A
CMOS
TTL
Dual Inverting Channels + Dual Enable
Dual Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
Dual Channels of Two-Input/One-Output
Dual Channels of Two-Input/One-Output
Single Inverting Channel + Enable
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
SOIC8, MLP8
CMOS
TTL
CMOS
TTL
FAN3121C Single 9A +9.7A / -7.1A
FAN3121T Single 9A +9.7A / -7.1A
FAN3122T Single 9A +9.7A / -7.1A
FAN3122C Single 9A +9.7A / -7.1A
Notes:
CMOS
TTL
Single Inverting Channel + Enable
CMOS
TTL
Single Non-Inverting Channel + Enable
Single Non-Inverting Channel + Enable
13. Typical currents with OUT at 6V and VDD=12V.
14. Thresholds proportional to an externally supplied reference voltage.
© 2010 Fairchild Semiconductor Corporation
www.fairchildsemi.com
FAN3278 • Rev. 1.0.0
13
Physical Dimensions
5.00
4.80
A
0.65
3.81
8
5
B
1.75
6.20
5.80
4.00
3.80
5.60
1
4
PIN ONE
INDICATOR
1.27
1.27
(0.33)
M
0.25
C B A
LAND PATTERN RECOMMENDATION
SEE DETAIL A
0.25
0.10
0.25
0.19
C
1.75 MAX
0.10
C
0.51
0.33
OPTION A - BEVEL EDGE
0.50
0.25
x 45°
R0.10
R0.10
GAGE PLANE
OPTION B - NO BEVEL EDGE
0.36
NOTES: UNLESS OTHERWISE SPECIFIED
8°
0°
0.90
A) THIS PACKAGE CONFORMS TO JEDEC
MS-012, VARIATION AA, ISSUE C,
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE MOLD
FLASH OR BURRS.
SEATING PLANE
(1.04)
0.406
D) LANDPATTERN STANDARD: SOIC127P600X175-8M.
E) DRAWING FILENAME: M08AREV13
DETAIL A
SCALE: 2:1
Figure 21. 8-Lead, Small-Outline Integrated Circuit (SOIC)
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,
specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/.
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
14
© 2010 Fairchild Semiconductor Corporation
FAN3278 • Rev. 1.0.0
www.fairchildsemi.com
15
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