FAN3278TMX [FAIRCHILD]

30V PMOS-NMOS Bridge Driver; 30V PMOS- NMOS桥驱动器
FAN3278TMX
型号: FAN3278TMX
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

30V PMOS-NMOS Bridge Driver
30V PMOS- NMOS桥驱动器

驱动器
文件: 总15页 (文件大小:458K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 2011  
FAN3278  
30V PMOS-NMOS Bridge Driver  
Description  
Features  
The FAN3278 dual 1.5A gate driver is optimized to drive  
.
.
8V to 27V Optimum Operating Range  
a
high-side P-channel MOSFET and a low-side  
Drives High-Side PMOS and Low-Side NMOS in  
Motor Control or Buck Step-Down Applications  
N-channel MOSFET in motor control applications  
operating from a voltage rail up to 27V. Internal circuitry  
limits the voltage applied to the gates of the external  
MOSFETs to 13V maximum. The driver has TTL input  
thresholds and provides buffer and level translation from  
logic inputs. Internal circuitry prevents the output  
switching devices from operating if the VDD supply  
voltage is below the IC operation level. Internal 100k  
resistors bias the non-inverting output LOW and the  
inverting output to VDD to keep the external MOSFETs  
off during startup intervals when logic control signals  
may not be present.  
.
.
Output Drive-Voltage Magnitude Limited: < 13V  
for VDD up to 30V  
Biases Each Load Device OFF with a 100kΩ  
Resistor when VDD Below Operating Level  
.
.
.
Low-Voltage TTL Input Thresholds  
Peak Gate Drives at 12V: +1.5A Sink, -1.0A Source  
Internal Resistors Hold Driver Off When  
No Inputs Present  
.
.
8-Lead SOIC Package  
The FAN3278 driver incorporates MOSFET devices for  
the final output stage, providing high current throughout  
the MOSFET turn-on / turn-off transition to minimize  
switching loss. The internal gate-drive regulators  
provide optimum gate-drive voltage when operating  
from a rail of 8V to 27V. The FAN3278 can be driven  
from a voltage rail of less than 8V; however, its gate  
drive current is reduced.  
Rated from –40°C to +125°C Ambient  
Applications  
.
.
.
Motor Control with PMOS / NMOS Half-Bridge  
Configuration  
Buck Converters with High-Side PMOS Device;  
100% Duty Cycle Operation Possible  
The FAN3278 has two independent ENABLE pins that  
default to ON if not connected. If the ENABLE pin for  
non-inverting channel A is pulled LOW, OUTA is forced  
LOW. If the ENABLE pin for inverting channel B is  
pulled LOW, OUTB is forced HIGH. If an input is left  
unconnected, internal resistors bias the inputs such that  
the external MOSFETs are OFF.  
Logic-Controlled Load Circuits with High-Side  
PMOS Switch  
Figure 1. Typical Application  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
Ordering Information  
Input  
Threshold  
Packing  
Method  
Part Number  
Logic  
2,500 Units on  
Tape & Reel  
FAN3278TMX  
Non-Inverting Channel and Inverting Channel with Dual Enable  
TTL  
Figure 2. Typical 3-Phase Blower Motor Drive Application  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
2
Pin Configuration  
Figure 3. Pin Configuration (Top View)  
Thermal Characteristics(1)  
Package  
(2)  
(3)  
(4)  
(5)  
(6)  
Unit  
JL  
JT  
JA  
JB  
JT  
40  
31  
89  
43  
3
°C/W  
8-Pin Small-Outline Integrated Circuit (SOIC)  
Notes:  
1. Estimates derived from thermal simulation; actual values depend on the application.  
2. Theta_JL (JL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads  
(including any thermal pad) that are typically soldered to a PCB.  
3. Theta_JT (JT): Thermal resistance between the semiconductor junction and the top surface of the package,  
assuming it is held at a uniform temperature by a top-side heatsink.  
4. Theta_JA (ΘJA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking,  
and airflow. The value given is for natural convection with no heatsink using a 2S2P board, as specified in  
JEDEC standards JESD51-2, JESD51-5, and JESD51-7, as appropriate.  
5. Psi_JB (JB): Thermal characterization parameter providing correlation between semiconductor junction  
temperature and an application circuit board reference point for the thermal environment defined in Note 4. For  
the SOIC-8 package, the board reference is defined as the PCB copper adjacent to pin 6.  
6. Psi_JT (JT): Thermal characterization parameter providing correlation between the semiconductor junction  
temperature and the center of the top of the package for the thermal environment defined in Note 4.  
Pin Definitions  
Pin# Name  
Description  
1
8
3
2
4
7
ENA Enable Input for Channel A. Pull pin LOW to inhibit driver A. ENA has TTL thresholds.  
ENB Enable Input for Channel B. Pull pin LOW to inhibit driver B. ENB has TTL thresholds.  
GND Ground. Common ground reference for input and output circuits.  
INA  
INB  
Input to Channel A.  
Input to Channel B.  
Gate Drive Output A: Held LOW unless required input is present and VDD is above the internal  
voltage threshold where the IC is functional.  
OUTA  
Gate Drive Output B (inverted from the input). Held HIGH unless the required input is present  
and VDD is above the internal voltage threshold where the IC is functional.  
5
6
OUTB  
VDD Supply Voltage. Provides power to the IC.  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
3
Output Logic  
FAN3278 (Channel A)  
FAN3278 (Channel B)  
ENA  
INA  
OUTA  
ENB  
INB  
OUTB  
0
0(7)  
0
0
0
1
0
0(7)  
1
1
1
0
0
1
0
1
1(7)  
1(7)  
0(7)  
1
1(7)  
1(7)  
0(7)  
1
Note:  
7. Default input signal if no external connection is made.  
Block Diagram  
VDD  
VDD  
100k  
100k  
1
2
8
7
ENB  
ENA  
INA  
13V  
OUTA  
LS  
Predriver  
100k  
100k  
Low-Side  
Drive  
Regulator  
6
VDD  
3
GND  
High-Side  
Drive  
Regulator  
100k  
HS  
5
Predriver  
OUTB  
INB  
4
100k  
VDD - 13V  
Figure 4. Block Diagram  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
4
Absolute Maximum Ratings  
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be  
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.  
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.  
The absolute maximum ratings are stress ratings only.  
Symbol  
VDD  
Parameter  
Min.  
Max.  
Unit  
V
VDD to PGND  
-0.3  
30.0  
VEN  
ENA, ENB to GND  
INA, INB to GND  
OUTA, OUTB to GND  
GND - 0.3 VDD + 0.3  
GND - 0.3 VDD + 0.3  
GND - 0.3 VDD + 0.3  
+260  
V
VIN  
V
VOUT  
TL  
V
Lead Soldering Temperature (10 Seconds)  
Junction Temperature  
ºC  
ºC  
ºC  
TJ  
-55  
-65  
2
+150  
+150  
TSTG  
Storage Temperature  
Human Body Model, JEDEC JESD22-A114  
Charged Device Model, JEDEC JESD22-C101  
Electrostatic Discharge  
Protection Level  
ESD  
kV  
2
Recommended Operating Conditions  
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended  
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not  
recommend exceeding them or designing to Absolute Maximum Ratings.  
Symbol  
VDD  
Parameter  
Min.  
8
Max.  
27  
Unit  
V
Supply Voltage Range  
VEN  
Enable Voltage (ENA, ENB)  
Input Voltage (INA, INB)  
0
VDD  
V
VIN  
0
VDD  
V
TA  
Operating Ambient Temperature  
-40  
+125  
°C  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
5
Electrical Characteristics  
Unless otherwise noted, VDD=12V and TJ=-40°C to +125°C. Currents are defined as positive into the device (Isink) and  
negative out of the device (Isource).  
Symbol  
Supply  
VDD  
Parameter  
Conditions  
Min.  
Typ. Max. Unit  
Optimum Operating Range(8)  
8
27  
V
Supply Current Inputs / EN Not  
Connected  
IDD  
1.3  
2.0  
mA  
VON  
VHYS  
Input(9)  
VIL  
Turn-On Voltage(9)  
INA=ENA=VDD, INB=ENB=0V  
INA=ENA=VDD, INB=ENB=0V  
3.8  
10  
V
Turn-On / Turn-Off Hysteresis (9)  
mV  
INx Logic Low Threshold  
INx Logic High Threshold  
Logic Hysteresis Voltage  
0.8  
0.4  
0.8  
1.1  
1.80  
0.7  
V
V
V
VIH  
2.25  
1.0  
VHYS  
Enable  
VENL  
VENH  
VHYS  
RPU  
Enable Logic Low Threshold  
EN from 5V to 0V  
EN from 0V to 5V  
1.2  
1.60  
0.7  
100  
44  
V
V
Enable Logic High Threshold  
Logic Hysteresis Voltage(10)  
2.25  
V
Enable Pull-Up Resistance  
kΩ  
ns  
ns  
ns  
ns  
tD1  
Propagation A Delay, EN Rising(11)  
Propagation A Delay, EN Falling(11)  
Propagation B Delay, EN Rising(11)  
Propagation B Delay, EN Falling(11)  
0 - 5VIN, 1V/ns Slew Rate  
0 – 5VIN, 1V/ns Slew Rate  
0 - 5VIN, 1V/ns Slew Rate  
0 – 5VIN, 1V/ns Slew Rate  
70  
60  
70  
60  
tD2  
33  
tD2  
39  
tD1  
29  
Continued on the following page…  
Timing Diagrams  
90%  
Output  
10%  
Input  
or  
Enable  
VINH  
VINL  
tD1  
tD2  
tFALL  
tRISE  
Figure 5. Non-Inverting  
Figure 6. Inverting  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
6
Electrical Characteristics (Continued)  
Unless otherwise noted, VDD=12V and TJ=-40°C to +125°C. Currents are defined as positive into the device (Isink) and  
negative out of the device (Isource).  
Symbol  
Output  
Parameter  
Conditions  
Min. Typ. Max. Unit  
IPK_OFF OUT Current, Peak, Turn-Off(10)  
CLOAD=0.1µF, f=1kHz  
CLOAD=0.1µF, f=1kHz  
1.5  
A
A
IPK_ON  
IOFF  
OUT Current, Peak, Turn-On(10)  
-1.0  
OUT at VDD, CLOAD=0.1µF,  
f=1kHz  
OUT Current, Mid-Voltage, Turn-Off(10  
1.0  
A
A
OUT at VDD/2, CLOAD=0.1µF,  
f=1kHz  
ION  
OUT Current, Mid-Voltage, Turn-On(10)  
-0.5  
VOUTA  
VOUTB  
VOUTA  
VOUTB  
OUTA Drive Voltage  
VDD=27V, INA=“HI”  
VDD=27V, INA=“HI”  
VDD=10V, INB=“HI”  
VDD=10V, INB=“HI”  
VDD=6V, CLOAD=0.1µF  
11  
11  
13  
13  
V
V
OUTB Drive Voltage, VDD – VOUTB  
OUTA Drive Voltage  
6.5  
6.5  
7.0  
7.0  
4.2  
10.3  
6.8  
13.7  
17  
V
OUTB Drive Voltage, VDD – VOUTB  
V
RO_A_SINK OUTA Sink Impedance (Turn-Off)(10)  
RO_A_SRC OUTA Source Impedance (Turn-On)(10) VDD=6V, CLOAD=0.1µF  
RO_B_SINK OUTB Sink Impedance (Turn-On)(10)  
VDD=6V, CLOAD=0.1µF  
RO_B_SRC OUTB Source Impedance (Turn-Off)(10) VDD=6V, CLOAD=0.1µF  
tON,N  
tOFF,N  
tON,P  
tOFF,P  
tD1  
Output A Rise Time(11)  
CLOAD=1000pF to GND  
CLOAD=1000pF to GND  
CLOAD=1000pF to VDD  
CLOAD=1000pF to VDD  
0 - 5VIN, 1V/ns Slew Rate  
0 - 5VIN, 1V/ns Slew Rate  
30  
15  
30  
15  
70  
60  
ns  
ns  
ns  
ns  
ns  
ns  
mA  
Output A Fall Time(11)  
Output B Fall Time(11)  
8
21  
Output B Rise Time(11)  
8
Output Propagation Delay On(11)  
Output Propagation Delay Off(11)  
Output Reverse Current Withstand(10)  
45  
tD2  
35  
IRVS  
500  
Notes:  
8. The internal gate-drive regulators provide optimum gate-drive voltage when operating from a rail of 8V to 27V.  
The FAN3278 can be driven from a voltage rail of less than 8V; however, with reduced gate drive current.  
9. EN inputs have near-TTL thresholds (refer to the ENABLE section).  
10. Not tested in production.  
11. See the Timing Diagrams of Figure 5 and Figure 6.  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
7
Typical Performance Characteristics  
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.  
Figure 7. IDD (Static) vs. Supply Voltage(12)  
Figure 8. IDD (Static) vs. Temperature(12)  
Figure 10. IDD (1nF Load) vs. Frequency  
Figure 9. IDD (No Load) vs. Frequency  
Figure 11. Input Thresholds vs. Temperature  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
8
Typical Performance Characteristics  
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.  
Figure 12. Propagation Delays vs. Temperature  
Figure 13. Propagation Delays vs. Temperature  
Figure 14. Rise and Fall Times vs. Temperature  
Figure 15. Rise and Fall Times vs. Temperature  
Figure 16. Gate Drive Voltage vs. Temperature  
Figure 17. Gate Drive Voltage vs. Temperature  
Note:  
12. For any inverting inputs pulled LOW, non-inverting inputs pulled HIGH, or outputs driven HIGH; static IDD  
increases by the current flowing through the corresponding pull-up/down resistor, shown in Figure 4.  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
9
Applications Information  
Input Thresholds  
The FAN3278 driver has TTL input thresholds and  
provides buffer and level translation functions from  
logic inputs. The input thresholds meet industry-  
standard TTL-logic thresholds, independent of the VDD  
voltage, and there is  
a
hysteresis voltage of  
approximately 0.4V. These levels permit the inputs to  
be driven from a range of input logic signal levels for  
which a voltage over 2V is considered logic HIGH. The  
driving signal for the TTL inputs should have fast rising  
and falling edges with a slew rate of 6V/µs or faster, so  
a rise time from 0 to 3.3V should be 550ns or less.  
With reduced slew rate, circuit noise could cause the  
driver input voltage to exceed the hysteresis voltage  
and retrigger the driver input inadvertently.  
Figure 18. Non-Inverting Startup Waveforms  
Static Supply Current  
In the IDD (static) typical performance characteristics  
(see Figure 7 and Figure 8), the curve is produced with  
all inputs / enables floating (OUTA is LOW, OUTB is  
HIGH) and indicates the lowest static IDD current for the  
tested configuration. For other states, additional current  
flows through the 100kresistors on the inputs and  
outputs, shown in the block diagram (see Figure 4). In  
these cases, the static IDD current is the value obtained  
from the curves plus this additional current.  
Figure 19 illustrates startup waveforms for inverting  
channel B. At power-up, the driver output for channel B  
is tied to VDD through an internal 100kresistor until  
VDD reaches the voltage where the device starts  
operating, then OUTB operates out of phase with INB.  
Gate Drive Regulator  
FAN3278 incorporates internal regulators to regulate the  
gate drive voltage. The output pin slew rate is  
determined by this gate drive voltage and the load on  
the output. It is not user adjustable, but a series resistor  
can be added if a slower rise or fall time is needed at  
the MOSFET gate.  
Startup Operation  
The FAN3278 startup logic is optimized to drive a ground-  
referenced N-channel MOSFET with channel A and a  
VDD-referenced P-channel MOSFET with channel B.  
The optimum operating voltage of the FAN3278 is 8V to  
27V. It has an internal “watchdog” circuit that provides a  
loose UVLO turn-on voltage (VON) of approximately 3.8V  
with a small hysteresis of about 10mV. However, it is  
recommended that VDD is greater than 4.75V in all  
application circuits.  
Figure 19. Inverting Startup Waveforms  
It is possible, during startup, before VDD has reached  
approximately 4.5V, that the output pulse width may  
take a few switching cycles to reach the full duty-cycle  
of the input pulse. This is due to internal propagation  
delays affecting the operation with higher switching  
frequency (e.g. >100kHz) and slow VDD ramp-up (e.g.  
<20V/ms). For this reason, it is recommended that VDD  
should be greater than 4.75V before any INA or INB  
signals are present.  
When the VDD supply voltage is below the level needed  
to operate the internal circuitry, the outputs are biased  
to hold the external MOSFETs in OFF state. Internal  
100kresistors bias the non-inverting output LOW and  
the inverting output to VDD to keep the external  
MOSFETs off during startup intervals when input control  
signals may not be present.  
For high-frequency applications (several hundred kHz  
up to 1MHz), where the above recommendation of VDD  
> 4.75V is not possible, the use of ENABLES to  
actively hold the outputs LOW until VDD > 4.75V  
assures the driver output pulse width follows the input  
from 4.75V up to 28V.  
Figure 18 shows startup waveforms for non-inverting  
channel A. At power-up, the driver output for channel A  
remains LOW until VDD reaches the voltage where the  
device starts operating, then OUTA operates in-phase  
with INA.  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
10  
best results, make connections to all pins as short  
and direct as possible.  
VDD Bypass Capacitor Guidelines  
To enable this IC to turn a device on quickly, a local  
high-frequency bypass capacitor, CBYP, with low ESR  
and ESL should be connected between the VDD and  
GND pins with minimal trace length. This capacitor is in  
addition to bulk electrolytic capacitance of 10µF to 47µF  
commonly found on driver and controller bias circuits.  
.
The turn-on and turn-off current paths should be  
minimized, as discussed above.  
Thermal Guidelines  
Gate drivers used to switch MOSFETs and IGBTs at  
high frequencies can dissipate significant amounts of  
power. It is important to determine the driver power  
dissipation and the resulting junction temperature in the  
application to ensure the part is operating within  
acceptable temperature limits.  
A typical criterion for choosing the value of CBYP is to  
keep the ripple voltage on the VDD supply to 5%. This  
is often achieved with a value 20 times the equivalent  
load capacitance CEQV, defined as QGATE/VDD. Ceramic  
capacitors of 0.1µF to 1µF or larger are common  
choices, as are dielectrics, such as X5R and X7R, with  
stable temperature characteristics and high pulse  
current capability.  
The total power dissipation in a gate driver is the sum of  
two components, PGATE and PDYNAMIC  
:
PTOTAL=PGATE + PDYNAMIC  
(1)  
If circuit noise affects normal operation, the value of  
CBYP may be increased to 50-100 times the CEQV or CBYP  
may be split into two capacitors. One should be a larger  
value, based on equivalent load capacitance, and the  
other a smaller value, such as 1-10nF, mounted closest  
to the VDD and GND pins to carry the higher-frequency  
components of the current pulses. The bypass capacitor  
must provide the pulsed current from both of the driver  
channels and, if the drivers are switching  
simultaneously, the combined peak current sourced  
from the CBYP can be twice as large as when a single  
channel is switching.  
Gate Driving Loss: The most significant power loss  
results from supplying gate current (charge per unit  
time) to switch the load MOSFET on and off at the  
switching frequency. The power dissipation that results  
from driving a MOSFET with a specified gate-source  
voltage, VGS, with gate charge, QG, at switching  
frequency, fSW, is determined by:  
PGATE=QG • VGS • fSW  
(2)  
This needs to be calculated for each P-channel and N-  
channel MOSFET where the QG is likely to be different.  
Dynamic Pre-drive / Shoot-through Current: Power loss  
resulting from internal current consumption under  
dynamic operating conditions, including pin pull-up /  
pull-down resistors, can be obtained using the “IDD (No-  
Load) vs. Frequency” graphs in Figure 9 to determine  
the current IDYNAMIC drawn from VDD under actual  
operating conditions.  
Layout and Connection Guidelines  
The FAN3278 gate driver incorporates fast-reacting  
input circuits, short propagation delays, and powerful  
output stages capable of delivering current peaks over  
1.5A to facilitate fast voltage transition times. The  
following layout and connection guidelines are strongly  
recommended:  
PDYNAMIC=IDYNAMIC • VDD  
(3)  
.
Keep high-current output and power ground paths  
separate from logic and enable input signals and  
signal ground paths. This is especially critical when  
dealing with TTL-level logic thresholds at driver  
inputs and enable pins.  
Once the power dissipated in the driver is determined,  
the driver junction rise with respect to circuit board can  
be evaluated using the following thermal equation,  
JB  
assuming  
was determined for a similar thermal  
design (heat sinking and air flow):  
.
Keep the driver as close to the load as possible to  
minimize the length of high-current traces. This  
reduces the series inductance to improve high-  
speed switching, while minimizing the loop area  
that can couple EMI to the driver inputs and  
surrounding circuitry.  
TJ =PTOTAL  
where:  
JB + TB  
(4)  
TJ =driver junction temperature  
JB  
=(psi) thermal characterization parameter relating  
temperature rise to total power dissipation  
.
.
If the inputs to a channel are not externally  
connected, the internal 100kresistors indicated  
on block diagrams command a low output on  
channel A and a high output on channel B. In noisy  
environments, it may be necessary to tie inputs of  
an unused channel to VDD or GND using short  
traces to prevent noise from causing spurious  
output switching.  
TB =board temperature in location defined in  
Note 1 under Thermal Resistance table.  
As an example of a power dissipation calculation,  
consider an application driving two MOSFETs (one P-  
channel and one N-channel, both with a gate charge of  
60nC each) with VGS=VDD=12V. At  
a
switching  
frequency of 200kHz, the total power dissipation is:  
PGATE=60nC • 12V • 200kHz • 2=0.288W  
PDYNAMIC=1.65mA • 12V =0.020W  
PTOTAL=0.308W  
(5)  
(6)  
(7)  
Many high-speed power circuits can be susceptible  
to noise injected from their own output or other  
external sources, possibly causing output mis-  
triggering. These effects can be obvious if the  
circuit is tested in breadboard or non-optimal circuit  
layouts with long input, enable, or output leads. For  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
11  
The SOIC-8 package has a junction-to-board thermal  
Test Circuit  
characterization parameter of JB=43°C/W. In a system  
application, the localized temperature around the device  
is a function of the layout and construction of the PCB  
along with airflow across the surfaces. To ensure  
reliable operation, the maximum junction temperature of  
the device must not exceed the absolute maximum  
rating of 150°C; with 80% derating, TJ would be limited  
to 120°C. Rearranging Equation 4 determines the board  
temperature required to maintain the junction  
temperature below 120°C:  
TB=TJ - PTOTAL  
(8)  
(9)  
JB  
TB=120°C – 0.308W • 43°C/W=107°C  
Figure 20. Quasi-Static IOUT / VOUT Test Circuit  
Differences between FAN3278 and FAN3268  
FAN3278 and FAN3268 are pin-compatible to each other and are designed to drive one P-Channel and one  
N-channel MOSFET in applications such as battery-powered compact fan / pump DC motor drives. However, there  
are key differences, highlighted in Table 1.  
Table 1. Differences between FAN3278 and FAN3268  
FAN3278  
FAN3268  
27V Operating Maximum  
30V Absolute Maximum  
18V Operating Maximum  
20V Absolute Maximum  
Supply Voltage  
Yes, since the maximum operating VDD can No gate drive regulator is needed. The  
be as high as 27V, the gate voltage to the gate drive voltage is VDD and the  
external MOSFETs is limited to about 13V. FAN3268 switches rail-to-rail.  
Gate Drive Regulator  
The optimum operating range is 8V to 27V.  
After the IC turns on at about 3.8V, the  
output tracks VDD up to the regulated  
voltage rail of about 11~13V. Below 8V of  
4.1V is the UVLO turn-off voltage  
which is the minimum operating  
VDD, the FAN3278 operates, but (a) slower voltage.  
and (b) with limited gate drive voltage until  
it reaches around 8V.  
Minimum Operating  
Voltage  
The IC starts operating approximately at  
3.8V which acts as a loose UVLO  
Has the tight UVLO threshold of 4.5V  
on / 4.1V off. Incorporates “smart  
threshold. It incorporates a “smart startup” startup” (outputs held OFF before IC is  
Startup  
feature where the outputs are held OFF  
before the IC starts operating.  
fully operational at the UVLO  
threshold).  
Compound MillerDrive™ architecture  
in the final output stage to provide a  
more efficient gate drive current during  
the Miller plateau stage of the turn-  
on/turn-off switching transition.  
Output Gate Drive  
Architecture  
Standard MOS-based output structure with  
gate drive clamp.  
OUTB Gate Drive  
Current Strength  
Optimized for P-channel: The turn-OFF  
(1.5 A) is stronger than turn-ON (1.0A).  
P-channel turn-ON (2.4A) is stronger  
than turn-OFF (1.6A).  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
12  
Table 2. Related Products  
Gate  
Part  
Input  
Threshold  
Type  
Drive(13)  
Logic  
Package  
Number  
(Sink / Src)  
FAN3111C Single 1A +1.1A / -0.9A  
FAN3111E Single 1A +1.1A / -0.9A  
FAN3100C Single 2A +2.5A / -1.8A  
FAN3100T Single 2A +2.5A / -1.8A  
CMOS  
External(14)  
CMOS  
TTL  
Single Channel of Dual-Input/Single-Output  
SOT23-5, MLP6  
Single Non-Inverting Channel with External Reference SOT23-5, MLP6  
Single Channel of Two-Input/One-Output  
SOT23-5, MLP6  
SOT23-5, MLP6  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
Single Channel of Two-Input/One-Output  
FAN3226C Dual 2A  
FAN3226T Dual 2A  
FAN3227C Dual 2A  
FAN3227T Dual 2A  
FAN3228C Dual 2A  
FAN3228T Dual 2A  
FAN3229C Dual 2A  
FAN3229T Dual 2A  
+2.4A / -1.6A  
+2.4A / -1.6A  
+2.4A / -1.6A  
+2.4A / -1.6A  
+2.4A / -1.6A  
+2.4A / -1.6A  
+2.4A / -1.6A  
+2.4A / -1.6A  
CMOS  
TTL  
Dual Inverting Channels + Dual Enable  
Dual Inverting Channels + Dual Enable  
CMOS  
TTL  
Dual Non-Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Channels of Two-Input/One-Output, Pin Config.1  
Dual Channels of Two-Input/One-Output, Pin Config.1  
Dual Channels of Two-Input/One-Output, Pin Config.2  
Dual Channels of Two-Input/One-Output, Pin Config.2  
CMOS  
TTL  
CMOS  
TTL  
Non-Inverting Channel (NMOS) and Inverting Channel  
(PMOS) + Dual Enables  
FAN3268T Dual 2A  
+2.4A / -1.6A  
TTL  
SOIC8  
30V Non-Inverting (NMOS) and Inverting (PMOS) +  
Dual Enable  
FAN3278T Dual 2A  
+1.4A / -1.0A  
TTL  
SOIC8  
FAN3223C Dual 4A  
FAN3223T Dual 4A  
FAN3224C Dual 4A  
FAN3224T Dual 4A  
FAN3225C Dual 4A  
FAN3225T Dual 4A  
+4.3A / -2.8A  
+4.3A / -2.8A  
+4.3A / -2.8A  
+4.3A / -2.8A  
+4.3A / -2.8A  
+4.3A / -2.8A  
CMOS  
TTL  
Dual Inverting Channels + Dual Enable  
Dual Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Channels of Two-Input/One-Output  
Dual Channels of Two-Input/One-Output  
Single Inverting Channel + Enable  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
SOIC8, MLP8  
CMOS  
TTL  
CMOS  
TTL  
FAN3121C Single 9A +9.7A / -7.1A  
FAN3121T Single 9A +9.7A / -7.1A  
FAN3122T Single 9A +9.7A / -7.1A  
FAN3122C Single 9A +9.7A / -7.1A  
Notes:  
CMOS  
TTL  
Single Inverting Channel + Enable  
CMOS  
TTL  
Single Non-Inverting Channel + Enable  
Single Non-Inverting Channel + Enable  
13. Typical currents with OUT at 6V and VDD=12V.  
14. Thresholds proportional to an externally supplied reference voltage.  
© 2010 Fairchild Semiconductor Corporation  
www.fairchildsemi.com  
FAN3278 • Rev. 1.0.0  
13  
Physical Dimensions  
5.00  
4.80  
A
0.65  
3.81  
8
5
B
1.75  
6.20  
5.80  
4.00  
3.80  
5.60  
1
4
PIN ONE  
INDICATOR  
1.27  
1.27  
(0.33)  
M
0.25  
C B A  
LAND PATTERN RECOMMENDATION  
SEE DETAIL A  
0.25  
0.10  
0.25  
0.19  
C
1.75 MAX  
0.10  
C
0.51  
0.33  
OPTION A - BEVEL EDGE  
0.50  
0.25  
x 45°  
R0.10  
R0.10  
GAGE PLANE  
OPTION B - NO BEVEL EDGE  
0.36  
NOTES: UNLESS OTHERWISE SPECIFIED  
8°  
0°  
0.90  
A) THIS PACKAGE CONFORMS TO JEDEC  
MS-012, VARIATION AA, ISSUE C,  
B) ALL DIMENSIONS ARE IN MILLIMETERS.  
C) DIMENSIONS DO NOT INCLUDE MOLD  
FLASH OR BURRS.  
SEATING PLANE  
(1.04)  
0.406  
D) LANDPATTERN STANDARD: SOIC127P600X175-8M.  
E) DRAWING FILENAME: M08AREV13  
DETAIL A  
SCALE: 2:1  
Figure 21. 8-Lead, Small-Outline Integrated Circuit (SOIC)  
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner  
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or  
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,  
specifically the warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/packaging/.  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
14  
© 2010 Fairchild Semiconductor Corporation  
FAN3278 • Rev. 1.0.0  
www.fairchildsemi.com  
15  

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