HUF76629D3ST_F085 [FAIRCHILD]

Power Field-Effect Transistor, 20A I(D), 100V, 0.055ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, ROHS COMPLIANT, DPAK-3/2;
HUF76629D3ST_F085
型号: HUF76629D3ST_F085
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Power Field-Effect Transistor, 20A I(D), 100V, 0.055ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, ROHS COMPLIANT, DPAK-3/2

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April 2013  
HUF76629D3ST_F085  
®
N-Channel Logic Level UltraFET Power MOSFET  
100V, 20A, 52mΩ  
D
Features  
„ Typ r  
= 41mΩ at V = 10V, I = 20A  
GS D  
DS(on)  
„ Typ Q  
= 39nC at V = 10V, I = 20A  
GS D  
g(tot)  
G
„ UIS Capability  
„ RoHS Compliant  
„ Qualified to AEC Q101  
S
Applications  
„ Automotive Engine Control  
„ Powertrain Management  
„ Solenoid and Motor Drivers  
„ Distributed Power Architectures and VRM  
„ Primary Switch for 12V Systems  
MOSFET Maximum Ratings TJ = 25°C unless otherwise noted  
Symbol  
VDSS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
100  
V
V
VGS  
±16  
Drain Current - Continuous (VGS=10) (Note 1)  
Pulsed Drain Current  
TC = 25°C  
TC = 25°C  
20  
ID  
A
See Figure4  
EAS  
PD  
Single Pulse Avalanche Energy  
(Note 2)  
(Note 3)  
231  
mJ  
W
W/oC  
oC  
oC/W  
oC/W  
Power Dissipation  
Derate above 25oC  
150  
1
TJ, TSTG Operating and Storage Temperature  
-55 to + 175  
RθJC  
RθJA  
Thermal Resistance Junction to Case  
1
Maximum Thermal Resistance Junction to Ambient  
52  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
Tape Width  
12mm  
Quantity  
2500 units  
HUF76629D3ST HUF76629D3ST_F085 D-PAK(TO-252)  
13”  
Notes:  
1: Current is limited by bondwire configuration.  
2: Starting T = 25°C, L = 1.8mH, I = 16A, V = 100V during inductor charging and V = 0V during time in avalanche  
J
AS  
DD  
DD  
3: RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder  
mounting surface of the drain pins. RθJC is guaranteed by design while RθJAis determined by the user's board design. The maximum rating  
2
presented here is based on mounting on a 1 in pad of 2oz copper.  
©2013 Fairchild Semiconductor Corporation  
HUF76629D3ST_F085 Rev. C1  
1
www.fairchildsemi.com  
Electrical Characteristics TJ = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
IDSS  
Drain to Source Breakdown Voltage  
Drain to Source Leakage Current  
Gate to Source Leakage Current  
ID = 250μA, VGS = 0V  
100  
-
-
-
-
-
1
V
V
DS=100V, TJ = 25oC  
-
-
-
μA  
mA  
nA  
VGS = 0V  
TJ = 175oC(Note 4)  
1
IGSS  
VGS = ±16V  
±100  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250μA  
1.0  
1.6  
41  
3.0  
52  
V
TJ = 25oC  
-
-
mΩ  
mΩ  
mΩ  
mΩ  
ID = 20A,  
TJ = 175oC(Note 4)  
TJ = 25oC  
102  
47  
128  
55  
V
GS= 10V  
ID = 20A,  
GS= 4.5V  
rDS(on)  
Drain to Source On Resistance  
TJ = 175oC(Note 4)  
115  
135  
V
Dynamic Characteristics  
Ciss  
Input Capacitance  
-
-
-
-
-
-
-
-
1280  
214  
33  
-
-
pF  
pF  
pF  
Ω
VDS = 25V, VGS = 0V,  
f = 1MHz  
Coss  
Crss  
Rg  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
-
f = 1MHz  
2.5  
39  
-
Qg(ToT)  
Qg(th)  
Qgs  
Total Gate Charge  
VGS = 0 to 10V  
V
43  
3
-
nC  
nC  
nC  
nC  
DD = 50V  
D = 20A  
Threshold Gate Charge  
Gate to Source Gate Charge  
Gate to Drain “Miller“ Charge  
VGS = 0 to 2V  
2.3  
3.5  
11  
I
Qgd  
-
Switching Characteristics  
ton  
td(on)  
tr  
Turn-On Time  
Turn-On Delay Time  
Rise Time  
-
-
-
-
-
-
-
7
27  
-
ns  
ns  
ns  
ns  
ns  
ns  
12  
38  
5
-
V
V
DD = 50V, ID = 20A,  
GS = 10V, RGEN = 8.2Ω  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
-
-
toff  
Turn-Off Time  
-
47  
Drain-Source Diode Characteristics  
I
SD = 20A, VGS = 0V  
-
-
-
-
-
-
1.25  
1.0  
V
VSD  
Source to Drain Diode Voltage  
ISD = 10A, VGS = 0V  
V
Trr  
Reverse Recovery Time  
77  
221  
99  
ns  
nC  
IF = 20A, dISD/dt = 100A/μs,  
V
DD=80V  
Qrr  
Reverse Recovery Charge  
305  
Notes:  
4: The maximum value is specified by design at T = 175°C. Product is not tested to this condition in production.  
J
HUF76629D3ST_F085 Rev. C1  
2
www.fairchildsemi.com  
Typical Characteristics  
25  
20  
15  
10  
5
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
VGS = 10V  
VGS = 4.5V  
0
25  
50  
T
75  
100  
125  
150  
175  
0
25  
50  
75  
100  
125  
150  
175  
, CASE TEMPERATURE(oC)  
TC, CASE TEMPERATURE(oC)  
C
Figure 2. Maximum Continuous Drain Current vs  
Case Temperature  
Figure 1. Normalized Power Dissipation vs Case  
Temperature  
DUTY CYCLE - DESCENDING ORDER  
1
D = 0.50  
0.20  
0.10  
0.05  
P
DM  
0.02  
0.01  
0.1  
t
1
t
2
NOTES:  
DUTY FACTOR: D = t /t  
1
2
SINGLE PULSE  
PEAK T = P  
x Z  
x R  
+ T  
J
DM  
θJA  
θJA C  
0.01  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
t, RECTANGULAR PULSE DURATION(s)  
Figure 3. Normalized Maximum Transient Thermal Impedance  
1000  
100  
10  
VGS = 10V  
TC = 25oC  
FOR TEMPERATURES  
ABOVE 25oC DERATE PEAK  
CURRENT AS FOLLOWS:  
175 - TC  
I = I2  
150  
SINGLE PULSE  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
t, RECTANGULAR PULSE DURATION(s)  
Figure 4. Peak Current Capability  
HUF76629D3ST_F085 Rev. C1  
3
www.fairchildsemi.com  
Typical Characteristics  
100  
10  
1
If R = 0  
= (L)(I )/(1.3*RATED BV  
100  
10  
t
- V  
)
AV  
AS  
DSS  
DD  
If R  
AV  
0  
t
= (L/R)ln[(I *R)/(1.3*RATED BV  
- V ) +1]  
DSS DD  
AS  
100us  
1ms  
STARTING TJ = 25oC  
STARTING TJ = 150oC  
1
10ms  
OPERATION IN THIS  
AREA MAY BE  
LIMITED BY r  
DS(on)  
SINGLE PULSE  
T
T
= MAX RATED  
o
J
100ms  
= 25  
C
C
0.1  
0.001  
0.01  
0.1  
1
10  
100  
1
10  
100  
300  
tAV, TIME IN AVALANCHE (ms)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515  
Figure 6. Unclamped Inductive Switching  
Capability  
Figure 5. Forward Bias Safe Operating Area  
50  
100  
PULSE DURATION = 80μs  
DUTY CYCLE = 0.5% MAX  
VGS = 0 V  
40  
30  
20  
10  
0
VDD = 5V  
10  
TJ = 175 o  
C
TJ = 25 o  
C
TJ = 175oC  
TJ = 25oC  
1
TJ = -55oC  
0.1  
1
2
3
4
5
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 7. Transfer Characteristics  
Figure 8. Forward Diode Characteristics  
80  
50  
40  
60  
40  
20  
0
30  
VGS  
10V Top  
8V  
6V  
5V  
4.5V  
4V Bottom  
VGS  
10V Top  
8V  
6V  
5V  
4.5V  
4V Bottom  
20  
10  
80μs PULSE WIDTH  
Tj=25oC  
80μs PULSE WIDTH  
Tj=175oC  
0
0
1
2
3
4
5
0
1
2
3
4
5
VDS, DRAIN TO SOURCE VOLTAGE (V)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 9. Saturation Characteristics  
Figure 10. Saturation Characteristics  
HUF76629D3ST_F085 Rev. C1  
4
www.fairchildsemi.com  
Typical Characteristics  
200  
3.0  
2.4  
1.8  
1.2  
0.6  
0.0  
ID = 20A  
PULSE DURATION = 80μs  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 80μs  
DUTY CYCLE = 0.5% MAX  
150  
100  
50  
TJ = 175oC  
ID = 20A  
TJ = 25oC  
VGS = 10V  
0
0
2
4
6
8
10  
-80  
-40  
0
40  
80  
120  
160  
200  
TJ, JUNCTION TEMPERATURE(oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 11. Rdson vs Gate Voltage  
Figure 12. Normalized Rdson vs Junction  
Temperature  
1.4  
1.2  
VGS = VDS  
ID = 1mA  
I
= 250μA  
D
1.2  
1.0  
0.8  
0.6  
0.4  
1.1  
1.0  
0.9  
0.8  
-80  
-40  
0
40  
80  
120  
160  
200  
-80  
-40  
0
40  
80  
120  
160  
200  
TJ, JUNCTION TEMPERATURE (oC)  
TJ, JUNCTION TEMPERATURE(oC)  
Figure 13. Normalized Gate Threshold Voltage vs  
Temperature  
Figure 14. Normalized Drain to Source  
Breakdown Voltage vs Junction Temperature  
10000  
10  
ID = 20A  
8
Ciss  
VDD = 40V  
1000  
6
VDD = 50V  
VDD = 60V  
Coss  
4
2
0
100  
Crss  
f = 1MHz  
VGS = 0V  
10  
0.1  
1
10  
100  
0
10  
20  
30  
40  
Qg, GATE CHARGE(nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 15. Capacitance vs Drain to Source  
Voltage  
Figure 16. Gate Charge vs Gate to Source  
Voltage  
HUF76629D3ST_F085 Rev. C1  
5
www.fairchildsemi.com  
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The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not  
intended to be an exhaustive list of all such trademarks.  
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Sync-Lock™  
®*  
®
tm  
®
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®
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®
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MicroPak2™  
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®
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®
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®
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®
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE  
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As used here in:  
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and (c) whose failure to perform when properly used in accordance with  
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2. A critical component in any component of a life support, device, or  
system whose failure to perform can be reasonably expected to cause  
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PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Datasheet contains the design specifications for product development. Specifications  
may change in any manner without notice.  
Advance Information  
Formative / In Design  
Datasheet contains preliminary data; supplementary data will be published at a later  
date. Fairchild Semiconductor reserves the right to make changes at any time without  
notice to improve design.  
Preliminary  
First Production  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to  
make changes at any time without notice to improve the design.  
No Identification Needed  
Obsolete  
Full Production  
Datasheet contains specifications on a product that is discontinued by Fairchild  
Semiconductor. The datasheet is for reference information only.  
Not In Production  
Rev. I64  
HUF76629D3ST_F085 Rev. C1  
6
www.fairchildsemi.com  

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