MB86061PFQ [FUJITSU]
D/A Converter, 1 Func, Parallel, Word Input Loading, 0.006us Settling Time, PQFP64, PLASTIC, QFP-64;型号: | MB86061PFQ |
厂家: | FUJITSU |
描述: | D/A Converter, 1 Func, Parallel, Word Input Loading, 0.006us Settling Time, PQFP64, PLASTIC, QFP-64 转换器 |
文件: | 总4页 (文件大小:55K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Product Flyer
January 2000
Version 1.1
MB86061
12-Bit 400MSa/s Digital to Analog Converter
FME/MS/SFDAC1E/FL_1/4269
The Fujitsu MB86061 is a high performance 12-bit 400MSa/s
digital to analog converter (DAC). Use of novel techniques for the
converter architecture delivers high speed operation consistent
with BiCMOS or bipolar devices but at the low power of CMOS.
Fujitsu’s proprietary architecture is the subject of several patent
applications. Excellent SFDR performance coupled with high
speed conversion rate and low power make this device particularly
suitable for high performance communication systems, graphics
and test/instrumentation equipment applications.
PLASTIC PACKAGE
QFP-64
Features
• 12-bit 400MSa/s Digital to Analog converter
• True ECL digital interface (-2V supply)
• 85dBc SFDR @ 10MHz, 200MSa/s (Shuffle On)
(FPT-64P-M09)
• Low power, +3.3V and -2V operation
(308mW @ 300MSa/s)
• 0.35µm CMOS technology with Triple Well
• Industrial temperature range (-40 °C / +85 °C)
• Plastic Package 64-pin QFP
Ordering Information
Applications
• Test & Instrumentation equipment
Order
Number
Part
• Communications systems
• High performance graphics
MB86061 Datasheet
MB86061 DAC
Contact Sales
MB86061PFQ
MB86061Development DK86061-3
Kit
MB86061Development Contact Sales
Kit User Manual
This product has Patents applied for in the US and elsewhere including GB2333191A, EP0935345A, JP11-274934A, GB2333171A, EP0930717A, JP11-274935A,
GB2333190A, EP0929158A, JP11-243339A, GB2335097A, EP0940923A, JP11-317667A, GB2335076A, EP0940852A, JP11-251530A.
Copyright © 2000 Fujitsu Microelectronics Europe GmbH
Page 1 of 4
January 2000 Version 1.1
FME/MS/SFDAC1E/FL_1/4269
MB86061 12-Bit 400MSa/s Digital to Analog Converter
Functional Description
The MB86061 is a high performance 12-bit 400MSa/s digital to analog converter. Versatile interfacing via the
12-bit true ECL data input allows existing system requirements to be accommodated, using either offset binary
or 2’s complement data formats. The device requires an external clock.
A 1.25V bandgap reference is provided on-chip, which may be overdriven where an external reference is to be
used. A power-down mode is enabled during device reset, with the current output drive and reference circuitry
disabled.
The device is manufactured in a 0.35µm advanced CMOS process with Triple Well extension giving improved
isolation between analog blocks and digital-analog.
Clock Buffer
CLK
CLKB
12
DAC
Output
DAC
ECL Data In
ECL Threshold
2
Shuffle
Control
Data Format
Reset
Bandgap
Reference
RRef
FML Mixed Signal
Bandgap
VRef
MB86061 Functional Block Diagram
Converter Architecture
The DAC core incorporates a number of novel design aspects that are subject to patent applications. Key to its
operation are the current sources where segmented, common centroid, interleaved techniques for the most
significant bits, as well as load matching ensure good linearity and low distortion to at least the 12-bit level. In
the switch elements tracking capacitance is minimised to improve settling, while controlled rise and fall times
improve SFDR performance. Finally the digital decoding uses a 3-dimensional addressing approach to minimise
propagation delays from latch to element.
Page 2 of 4
Copyright © 2000 Fujitsu Microelectronics Europe GmbH
January 2000 Version 1.1
FME/MS/SFDAC1E/FL_1/4269
MB86061 12-Bit 400MSa/s Digital to Analog Converter
Segment Shuffling
The DAC core incorporates a proprietary segment shuffling capability which is provided to further improve
linearity, and hence improve SFDR. This feature reduces any signal level dependent effects on linearity as the
same code can be generated by the same number of MSB cells but taken from any quarter of the MSB
segments. Segment shuffling can be selected to operate every 4, 8 or 16 updates of the DAC output using a
random shuffle sequence between the four
95
segments.
90
The effect of segment shuffling is to produce a
spread noise spectrum, raising the overall noise
Shuffle On
200MSa/s DAC Rate
Amplitude = -1dBFS
85
floor, but reducing the distortion. For minimum
distortion when generating low frequency signals,
80
Shuffle Off
it is recommended that the shuffling clock rate is
75
no more than 25MHz (DAC Rate / Segment
Shuffling Setting). However, low shuffle clock
70
rates give reduced spreading out of distortion
components.
65
60
0
10
20
30
40
Single Tone SFDR Performance
Generated Frequency
(MHz)
Spurious Free Dynamic Range (SFDR)
Spurious Free Dynamic Range (SFDR) is defined as the highest spurious product (harmonic or non-
harmonically related) within a defined bandwidth while generating a test tone or tones. SFDR varies with
amplitude and frequency of the test tone(s) and is either quoted as the difference between the tone and highest
spurious component (dBc) or referenced to full scale (dBFS). The measurement bandwidth is typically regarded
as DC to Nyquist but occasionally systems will specify an appropriate narrow band.
Development Kit
A development kit, reference DK86061, is available for the MB86061 12-Bit 400MSa/s Digital to Analog
Converter. The kit includes an evaluation board that enables simple and effective evaluation of the device.
The board provides a complete evaluation environment for the DAC. A transformer coupled differential output
interface is provided to simplify integration into target
applications and development environments. An RF clock
source can be connected via the transformer coupled input,
and 12-bit data via a 40-way IDC header.
The development kit includes,
•
•
•
Evaluation board with MB86061 device fitted
Spare MB86061 for customer development
User Manual
Copyright © 2000 Fujitsu Microelectronics Europe GmbH
Page 3 of 4
January 2000 Version 1.1
FME/MS/SFDAC1E/FL_1/4269
MB86061 12-Bit 400MSa/s Digital to Analog Converter
Worldwide Headquarters
Fujitsu Limited
Fujitsu Microelectronics Asia
Pte Limited
Japan
Asia
Tel: +81 44 754 3753
Tel:
Fax:
+65 281 0770
+65 281 0220
1015 Kamikodanaka 4-1-1
Nakahara-ku
Kawasaki-shi
151 Lorong Chuan
#05-08 New Tech Park
Singapore 556741
Fax:
+81 44 754 3329
Kanagawa-ken 211-88
Japan
http://www.fujitsu.co.jp/
http://www.fmap.com.sg/
Fujitsu Microelectronics Inc
Fujitsu Microlectronics Europe
GmbH
USA
Europe
Tel: +1 408 922 9000
Tel: +49 6103 6900
3545 North First Street
San Jose CA 95134-1804
USA
Am Siebenstein 6-10
D-63303 Dreieich-Buchschlag
Germany
Fax:
Fax:
+1 408 922 9179
+49 6103 690122
Tel: +1 800 866 8608
Fax:
http://www.fujitsu-fme.com/
Customer Response Center
Mon-Fri: 7am-5pm (PST)
+1 408 922 9179
http://www.fujitsumicro.com/
he contents of this document are subject to change without notice. Customers are advised to consult with FUJITSU sales
T
representatives before ordering.
The information and circuit diagrams in this document presented as examples of semiconductor device applications, and are not intended
to be incorporated in devices for actual use. Also, FUJITSU is unable to assume responsibility for infringement of any patent rights or
other rights of third parties arising from the use of this information or circuit diagrams.
FUJITSU semiconductor devices are intended for use in standard applications (computers, office automation and other office equipment,
industrial, communications, and measurement equipment, personal or household devices, etc.). CAUTION: Customers considering the
use of our products in special applications where failure or abnormal operation may directly affect human lives or cause physical injury
or property damage, or where extremely high levels of reliability are demanded (such as aerospace systems, atomic energy controls, sea
floor repeaters, vehicle operating controls, medical devices for life support, etc.) are requested to consult with FUJITSU sales
representatives before such use. The company will not be responsible for damages arising from such use without prior approval.
Any semiconductor devices have inherently a certain rate of failure. You must protect against injury, damage or loss from such failures
by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention ofover-
current levels and other abnormal operating conditions.
If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign
Exchange and Foreign Trade Control Law of Japan, the prior authorization by Japanese government should be required for export of
those products from Japan.
FME/MS/SFDAC1E/FL_1/4269 - 1.1
Page 4 of 4
Copyright © 2000 Fujitsu Microelectronics Europe GmbH
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