IRF7807TR [INFINEON]

Power Field-Effect Transistor, 8.3A I(D), 30V, 0.025ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SO-8;
IRF7807TR
型号: IRF7807TR
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 8.3A I(D), 30V, 0.025ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SO-8

开关 脉冲 光电二极管 晶体管
文件: 总8页 (文件大小:252K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD – 91747C  
IRF7807/IRF7807A  
HEXFET® Chip-Set for DC-DC Converters  
• N Channel Application Specific MOSFETs  
• Ideal for Mobile DC-DC Converters  
• Low Conduction Losses  
A
D
1
8
S
S
2
3
4
7
6
5
D
• Low Switching Losses  
S
D
D
Description  
G
These new devices employ advanced HEXFET Power  
MOSFET technology to achieve an unprecedented  
balance of on-resistance and gate charge. The  
reduced conduction and switching losses make them  
ideal for high efficiency DC-DC Converters that power  
the latest generation of mobile microprocessors.  
SO-8  
Vds  
Top View  
Device Features  
IRF7807 IRF7807A  
A pair of IRF7807 devices provides the best cost/  
performance solution for system voltages, such as 3.3V  
and 5V.  
30V  
30V  
25mΩ  
17nC  
Rds(on) 25mΩ  
Qg  
17nC  
Qsw  
Qoss  
5.2nC  
16.8nC 16.8nC  
Absolute Maximum Ratings  
Parameter  
Symbol  
IRF7807  
IRF7807A  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
Continuous Drain or Source  
Current (VGS 4.5V)  
Pulsed Drain Current  
Power Dissipation  
VDS  
VGS  
ID  
30  
V
±12  
25°C  
70°C  
8.3  
6.6  
66  
8.3  
6.6  
66  
A
IDM  
PD  
25°C  
70°C  
2.5  
1.6  
W
Junction & Storage Temperature Range  
Continuous Source Current (Body Diode)  
Pulsed source Current  
TJ, TSTG  
IS  
–55 to 150  
°C  
A
2.5  
66  
2.5  
66  
ISM  
Thermal Resistance  
Parameter  
Max.  
Units  
Maximum Junction-to-Ambientƒ  
RθJA  
50  
°C/W  
www.irf.com  
1
10/10/00  
IRF7807/IRF7807A  
Electrical Characteristics  
Parameter  
IRF7807  
IRF7807A  
Min Typ Max Min Typ Max Units  
Conditions  
Drain-to-Source  
V(BR)DSS 30  
30  
V
VGS = 0V, ID = 250µA  
Breakdown Voltage*  
Static Drain-Source  
on Resistance*  
RDS(on)  
17  
25  
17  
25 mVGS = 4.5V, ID = 7A‚  
GateThresholdVoltage* VGS(th) 1.0  
1.0  
V
VDS = VGS, ID = 250µA  
VDS = 24V, VGS = 0  
Drain-Source Leakage IDSS  
Current*  
30  
30  
µA  
150  
150  
VDS = 24V, VGS = 0,  
Tj = 100°C  
Gate-Source Leakage  
Current*  
IGSS  
±100  
17  
±100 nA  
17  
VGS = ±12V  
Total Gate Charge*  
Qg  
12  
12  
VGS = 5V, ID = 7A  
VDS = 16V, ID = 7A  
Pre-Vth  
Qgs1  
2.1  
2.1  
Gate-Source Charge  
Post-Vth  
Qgs2  
0.76  
0.76  
nC  
Gate-Source Charge  
Gate to Drain Charge  
Qgd  
2.9  
2.9  
Switch Charge*  
(Qgs2 + Qgd)  
QSW  
3.66 5.2  
3.66  
Output Charge*  
Gate Resistance  
Turn-on DelayTime  
RiseTime  
Qoss  
Rg  
14 16.8  
14 16.8  
VDS = 16V, VGS = 0  
1.2  
12  
17  
25  
6
1.2  
12  
17  
25  
6
td(on)  
tr  
VDD = 16V  
ID = 7A  
ns  
Turn-off DelayTime  
FallTime  
td (off)  
tf  
Rg = 2Ω  
VGS = 4.5V  
Resistive Load  
Source-Drain Rating & Characteristics  
Parameter  
Min Typ Max Min Typ Max Units  
1.2 1.2  
Conditions  
Diode Forward  
Voltage*  
VSD  
Qrr  
V
IS = 7A‚, VGS = 0V  
Reverse Recovery  
Charge„  
80  
50  
80  
50  
nC di/dt = 700A/µs  
VDS = 16V, VGS = 0V, IS = 7A  
di/dt = 700A/µs  
(with 10BQ040)  
VDS = 16V, VGS = 0V, IS = 7A  
Reverse Recovery  
Charge (with Parallel  
Schotkky)„  
Qrr(s)  
Notes:  

‚
ƒ
„
*
Repetitive rating; pulse width limited by max. junction temperature.  
Pulse width 300 µs; duty cycle 2%.  
When mounted on 1 inch square copper board, t < 10 sec.  
Typ = measured - Qoss  
Devices are 100% tested to these parameters.  
2
www.irf.com  
IRF7807/IRF7807A  
Power MOSFET Selection for DC/DC  
Converters  
4
Drain Current  
Control FET  
1
Special attention has been given to the power losses  
in the switching elements of the circuit - Q1 and Q2.  
Power losses in the high side switch Q1, also called the  
Control FET, are impacted by the Rds(on) of the MOSFET,  
but these conduction losses are only about one half of  
the total losses.  
Gate Voltage  
t2  
t3  
t1  
VGTH  
t0  
Power losses in the control switch Q1 are given by;  
2
Drain Voltage  
Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput  
This can be expanded and approximated by;  
Figure 1: Typical MOSFET switching waveform  
2
Synchronous FET  
P
I
R
×
ds(on)  
=
+
(
)
loss  
rms  
The power loss equation for Q2 is approximated  
by;  
Qgd  
ig  
Qgs2  
ig  
I
V
f
I
V
f
×
×
×
×
+
×
×
in  
in  
P
P
P
P*  
+
output  
=
=
+
loss  
conduction  
drive  
Q
(
V
f
×
+
+
×
)
g
g
2
P
Irms  
R
×
ds(on)  
loss  
( )  
Qoss  
2
V
f
×
×
in  
Q
(
V
f
×
+
×
)
g
g
This simplified loss equation includes the terms Qgs2  
and Qoss which are new to Power MOSFET data sheets.  
is a sub element of traditional gate-source charge  
Qoss  
2
V
f
Q
V
×
in  
f
×
+
×
×
+
(
)
in  
rr  
Q
gs2  
that is included in all MOSFET data sheets.The impor-  
tance of splitting this gate-source charge into two sub  
elements, Qgs1 and Qgs2, can be seen from Fig 1.  
Qgs2 indicates the charge that must be supplied by  
the gate driver between the time that the threshold volt-  
age has been reached (t1) and the time the drain cur-  
rent rises to Idmax (t2) at which time the drain voltage  
begins to change. Minimizing Qgs2 is a critical factor in  
reducing switching losses in Q1.  
*dissipated primarily in Q1.  
Qoss is the charge that must be supplied to the output  
capacitance of the MOSFET during every switching  
cycle. Figure 2 shows how Qoss is formed by the paral-  
lel combination of the voltage dependant (non-linear)  
capacitance’s Cds and Cdg when multiplied by the power  
supply input buss voltage.  
www.irf.com  
3
IRF7807/IRF7807A  
For the synchronous MOSFET Q2, Rds(on) is an im-  
portant characteristic;however, once again the impor-  
tance of gate charge must not be overlooked since it  
impacts three critical areas. Under light load the  
MOSFET must still be turned on and off by the con-  
trol IC so the gate drive losses become much more  
significant. Secondly, the output charge Qoss and re-  
verse recovery charge Qrr both generate losses that  
are transfered to Q1 and increase the dissipation in  
that device. Thirdly, gate charge will impact the  
MOSFETs’ susceptibility to Cdv/dt turn on.  
the MOSFET on, resulting in shoot-through current .  
The ratio of Qgd/Qgs1 must be minimized to reduce the  
potential for Cdv/dt turn on.  
Spice model for IRF7807 can be downloaded in ma-  
chine readable format at www.irf.com.  
The drain of Q2 is connected to the switching node  
of the converter and therefore sees transitions be-  
tween ground and Vin. As Q1 turns on and off there is  
a rate of change of drain voltage dV/dt which is ca-  
pacitively coupled to the gate of Q2 and can induce  
a voltage spike on the gate that is sufficient to turn  
Figure 2: Qoss Characteristic  
Typical Mobile PC Application  
The performance of these new devices has been tested  
in circuit and correlates well with performance predic-  
tions generated by the system models. An advantage  
of this new technology platform is that the MOSFETs  
it produces are suitable for both control FET and syn-  
chronous FET applications. This has been demon-  
strated with the 3.3V and 5V converters. (Fig 3 and  
Fig 4). In these applications the same MOSFET IRF7807  
was used for both the control FET (Q1) and the syn-  
chronous FET (Q2). This provides a highly effective  
cost/performance solution.  
3.3V Supply : Q1=Q2=IRF7807  
5V Supply : Q1=Q2=IRF7807  
93  
92  
91  
90  
89  
88  
87  
95  
94  
93  
92  
91  
Vin = 10V  
Vin = 10V  
86  
Vin = 14V  
90  
Vin = 14V  
85  
Vin = 24V  
Vin=24V  
89  
84  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
Load Current (A)  
Load Current (A)  
Figure 3  
Figure 4  
4
www.irf.com  
IRF7807/IRF7807A  
Typical Characteristics  
IRF7807  
IRF7807A  
Figure 5. Normalized On-Resistance vs.Temperature  
Figure 6. Normalized On-Resistance vs.Temperature  
Figure 7.Typical Gate Charge vs.Gate-to-SourceVoltage  
Figure 8.Typical Gate Charge vs.Gate-to-Source Voltage  
Figure 9.Typical Rds(on) vs.Gate-to-SourceVoltage  
Figure 10.Typical Rds(on) vs.Gate-to-SourceVoltage  
www.irf.com  
5
IRF7807/IRF7807A  
IRF7807  
IRF7807A  
10  
10  
°
°
T = 150 C  
T = 150 C  
J
J
1
1
°
°
T = 25 C  
T = 25 C  
J
J
V
= 0 V  
V
= 0 V  
GS  
GS  
0.1  
0.4  
0.1  
0.4  
0.5  
0.6  
0.7  
0.8  
0.9  
0.5  
0.6  
0.7  
0.8  
0.9  
V
,Source-to-Drain Voltage (V)  
V
,Source-to-Drain Voltage (V)  
SD  
SD  
Figure 11.Typical Source-Drain Diode ForwardVoltage  
Figure 12.Typical Source-Drain Diode ForwardVoltage  
100  
D = 0.50  
0.20  
10  
0.10  
0.05  
0.02  
P
DM  
0.01  
1
SINGLE PULSE  
(THERMAL RESPONSE)  
t
1
t
2
Notes:  
1. Duty factor D =  
t / t  
1 2  
2. Peak T = P  
J
x Z  
+ T  
A
DM  
thJA  
0.1  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t , Rectangular Pulse Duration (sec)  
1
Figure 13. Maximum EffectiveTransientThermal Impedance, Junction-to-Ambient  
6
www.irf.com  
IRF7807/IRF7807A  
Package Outline  
SO-8 Outline  
Part Marking Information  
SO-8  
www.irf.com  
7
IRF7807/IRF7807A  
Tape & Reel Information  
SO-8  
Dimensions are shown in millimeters (inches)  
TER M IN AL N U M BE R  
1
12.3 ( .484  
11.7 ( .461  
)
)
8.1 ( .318  
7.9 ( .312  
)
)
FEED D IRE C TIO N  
N O TES :  
1 . C O N TR O L LIN G D IM EN SIO N : M ILL IM ETER .  
2 . A LL D IM EN SIO N S A RE SH O W N IN M ILL IM ETER S(INC H ES).  
3 . O UTL IN E C O N FO R M S TO EIA -4 81 & EIA-54 1.  
330.00  
(12.992)  
M AX.  
14.40 ( .566 )  
12.40 ( .488 )  
N O TE S :  
1. C O N TR O LLIN G D IM EN SIO N : M ILLIM ETER .  
2. O UTLIN E C O N FO RM S TO EIA -481 & EIA-541.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
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IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111  
IR JAPAN:K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086  
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Data and specifications subject to change without notice. 10/00  
8
www.irf.com  

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