HI5810JIB-T [INTERSIL]
CMOS 10 Microsecond, 12-Bit, Sampling A/D Converter with Internal Track and Hold; CMOS 10微秒, 12位,采样A / D转换器,内置跟踪保持型号: | HI5810JIB-T |
厂家: | Intersil |
描述: | CMOS 10 Microsecond, 12-Bit, Sampling A/D Converter with Internal Track and Hold |
文件: | 总13页 (文件大小:763K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
HI5810
TM
May 2001
File Number 3633.3
CMOS 10 Microsecond, 12-Bit, Sampling
A/D Converter with Internal Track and
Hold
Features
• Conversion Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10µs
• Throughput Rate . . . . . . . . . . . . . . . . . . . . . . . . 100kSPS
• Built-In Track and Hold
The HI5810 is a fast, low power, 12-bit, successive-
approximation, analog-to-digital converter. It can operate
from a single 3V to 6V supply and typically draws just 1.9mA
when operating at 5V. The HI5810 features a built-in track
and hold. The conversion time is as low as 10µs with a 5V
supply.
itle
I581
• Single Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . .+5V
• Maximum Power Consumption . . . . . . . . . . . . . . . 40mW
• Internal or External Clock
b-
t
MO
0
cro-
-
• 1MHz Input Bandwidth. . . . . . . . . . . . . . . . . . . . . . . . -3dB
The twelve data outputs feature full high speed CMOS
three-state bus driver capability, and are latched and held
through a full conversion cycle. The output is user
selectable: [i.e., 12-bit, 8-bit (MSBs), and/or 4-bit (LSBs)]. A
data ready flag, and conversion-start input complete the
digital interface.
Applications
• Remote Low Power Data Acquisition Systems
• Digital Audio
d,
-Bit,
m-
ng
D
n-
rter
th
• DSP Modems
An internal clock is provided and is available as an output.
The clock may also be over-driven by an external source.
• General Purpose DSP Front End
• µP Controlled Measurement Systems
• Process Controls
Part Number Information
INL (LSB)
(MAX OVER
TEMP.)
TEMP.
• Industrial Controls
PART
NUMBER
RANGE
PKG.
NO.
o
( C)
PACKAGE
er-
l
ck
d
Related Literature
• Technical Brief TB363 “Guidelines for Handling and
Processing Moisture Sensitive Surface Mount Devices
(SMDs)”
HI5810JIB-T
2.5
-40 to 85 24 Ld SOIC
Tape and Reel
M24.3
ld)
utho
)
ey-
rds
ter-
Pinout
HI5810
(SOIC)
TOP VIEW
DRDY
(LSB) D0
D1
1
2
3
4
5
6
7
8
9
24
V
DD
23 OEL
22 CLK
21 STRT
rpo-
ion,
mi-
n-
ctor,
D,
D2
20
19
18
17
16
V
V
-
REF
D3
+
D4
REF
D5
V
IN
D6
V
+
AA
D7
V
-
AA
D8 10
D9 11
15 OEM
C,
14 D11 (MSB)
13 D10
sh,
V
12
SS
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil and Design is a trademark of Intersil Americas Inc. | Copyright © Intersil Americas Inc. 2001
1
HI5810
Functional Block Diagram
STRT
V
DD
TO INTERNAL LOGIC
V
SS
V
IN
CLK
CLOCK
CONTROL
AND
TIMING
DRDY
32C
OEM
V
+
REF
16C
8C
D11 (MSB)
50Ω
SUBSTRATE
D10
D9
4C
2C
V
+
AA
C
D8
V
-
32C
AA
64C
63
D7
16C
12-BIT
12-BIT EDGE
SUCCESSIVE
APPROXIMATION
REGISTER
D6
D5
D4
D3
TRIGGERED
“D” LATCHES
8C
4C
2C
C
C
P1
D2
D1
V
-
REF
D0 (LSB)
OEL
2
HI5810
Absolute Maximum Ratings
Thermal Information
o
Supply Voltage
Thermal Resistance (Typical, Note 1)
θ
( C/W)
JA
V
to V
. . . . . . . . . . . . . . . . . . . . (V
-0.5V) < V
DD
< +6.5V
+6.5V)
DD
SS
SS
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum Junction Temperature
Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150 C
Maximum Storage Temperature Range. . . . . . . . . . -65 C to 150 C
Maximum Lead Temperature (Soldering, 10s). . . . . . . . . . . . .300 C
75
V
+ to V - . . . . . . . . . . . . . . . . . . . (V -0.5V) to (V
+ to V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3V
AA AA SS
SS
o
V
AA DD
o
o
Analog and Reference Inputs
+ V - . . . . . . . . (V -0.3V) < V
o
V
V
< (V
+0.3V)
+0.3V)
IN, REF
,
REF SS
INA
DD
DD
Digital I/O Pins . . . . . . . . . . . . . . . (V -0.3V) < V < (V
SS I/O
(SOIC - Lead Tips Only)
Operating Conditions
o
o
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . -40 C to 85 C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θ is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
JA
Electrical Specifications
V
= V + = 5V, V
+ = +4.608V, V = V - = V
SS AA
- = GND, CLK = External 1.5MHz,
REF
DD
Unless Otherwise Specified
AA REF
o
o
o
25 C
-40 C TO 85 C
PARAMETER
MIN
TYP
MAX
MIN
MAX
TEST CONDITIONS
UNITS
ACCURACY
Resolution
12
-
-
-
-
-
-
-
12
-
-
Bits
LSB
LSB
LSB
LSB
Integral Linearity Error, INL (End Point)
Differential Linearity Error, DNL
2.5
2.0
3.5
2.5
2.5
2.0
3.5
2.5
-
-
Gain Error, FSE (Adjustable to Zero)
-
-
Offset Error, V
(Adjustable to Zero)
-
-
OS
DYNAMIC CHARACTERISTICS
Signal to Noise Ratio, SINAD
RMS Signal
f
f
= Internal Clock, f = 1kHz
IN
-
-
68.8
62.1
-
-
-
-
-
-
dB
dB
S
S
= 1.5MHz, f = 1kHz
IN
RMS Noise + Distortion
Signal to Noise Ratio, SNR
RMS Signal
f
f
= Internal Clock, f = 1kHz
IN
70.5
63.2
dB
dB
S
S
= 1.5MHz, f = 1kHz
IN
RMS Noise
Total Harmonic Distortion, THD
f
f
= Internal Clock, f = 1kHz
IN
-
-
-73.9
-68.4
-
-
-
-
-
-
dBc
dBc
S
S
= 1.5MHz, f = 1kHz
IN
Spurious Free Dynamic Range, SFDR
f
f
= Internal Clock, f = 1kHz
IN
75.4
69.2
dB
dB
S
S
= 1.5MHz, f = 1kHz
IN
ANALOG INPUT
Input Current, Dynamic
Input Current, Static
Input Bandwidth -3dB
Reference Input Current
At V = V
+, 0V
-
-
-
-
-
-
-
125
0.6
1
150
-
-
-
-
-
-
-
150
µA
µA
MHz
µA
W
IN REF
Conversion Stopped
10
-
10
-
160
420
380
20
-
-
Input Series Resistance, R
In Series with Input C
During Sample State
During Hold State
-
-
S
SAMPLE
HOLD
SAMPLE
Input Capacitance, C
Input Capacitance, C
-
-
pF
-
-
pF
3
HI5810
Electrical Specifications
V
= V + = 5V, V
+ = +4.608V, V = V - = V
- = GND, CLK = External 1.5MHz,
REF
DD
AA REF
SS
AA
Unless Otherwise Specified (Continued)
o
o
o
25 C
-40 C TO 85 C
PARAMETER
MIN
TYP
MAX
MIN
MAX
TEST CONDITIONS
UNITS
DIGITAL INPUTS OEL, OEM, STRT
High-Level Input Voltage, V
2.4
-
-
-
0.8
10
-
2.4
-
0.8
10
-
V
V
IH
Low-Level Input Voltage, V
-
-
-
-
-
-
IL
Input Leakage Current, I
Except CLK, V = 0V, 5V
IN
-
µA
pF
IL
Input Capacitance, C
10
IN
DIGITAL OUTPUTS
High-Level Output Voltage, V
I
I
= -400µA
4.6
-
-
-
0.4
10
-
4.6
-
0.4
10
-
V
V
OH
SOURCE
Low-Level Output Voltage, V
= 1.6mA
-
-
-
-
-
-
OL
SINK
Three-State Leakage, I
Except DRDY, V
Except DRDY
= 0V, 5V
OUT
-
µA
pF
OZ
Output Capacitance, C
20
OUT
CLOCK
High-Level Output Voltage, V
I
I
= -100µA (Note 2)
4
-
-
-
-
-
4
-
-
V
V
OH
SOURCE
Low-Level Output Voltage, V
Input Current
= 100µA (Note 2)
1
5
1
5
OL
SINK
CLK Only, V = 0V, 5V
IN
-
-
mA
TIMING
Conversion Time (t
(Includes Acquisition Time)
+ t
)
10
-
-
10
-
µs
CONV
ACQ
Clock Frequency
Internal Clock, (CLK = Open)
External CLK (Note 2)
External CLK (Note 2)
(Note 2)
200
300
-
400
2.0
-
150
500
-
kHz
MHz
ns
0.05
-
Clock Pulse Width, t
, t
LOW HIGH
100
-
100
-
Aperture Delay, t APR
-
-
35
105
100
30
60
4
50
150
160
-
-
70
180
195
-
ns
D
Clock to Data Ready Delay, t DRDY
D1
(Note 2)
-
ns
Clock to Data Ready Delay, t DRDY
D2
(Note 2)
-
-
75
100
15
-
ns
Start Removal Time, t STRT
(Note 2)
75
85
10
-
ns
R
Start Setup Time, t STRT
SU
(Note 2)
-
-
ns
Start Pulse Width, t STRT
(Note 2)
-
-
ns
W
Start to Data Ready Delay, t DRDY
D3
(Note 2)
65
60
20
80
105
-
120
-
ns
Clock Delay from Start, t STRT
(Note 2)
-
-
ns
D
Output Enable Delay, t
(Note 2)
-
30
95
-
50
120
ns
EN
Output Disabled Delay, t
(Note 2)
-
-
ns
DIS
POWER SUPPLY CHARACTERISTICS
Supply Current, I
+ I
AA
-
2.6
8
-
8.5
mA
DD
NOTE:
2. Parameter guaranteed by design or characterization, not production tested.
4
HI5810
Timing Diagrams
5 - 14
4
15
1
3
1
2
2
3
CLK
(EXTERNAL
OR INTERNAL)
t
LOW
t
DRDY
D1
t
HIGH
STRT
DRDY
t
DRDY
D2
DATA N - 1
D0 - D11
DATA N
HOLD N
V
TRACK N
TRACK N + 1
IN
OEL = OEM = V
SS
FIGURE 1. CONTINUOUS CONVERSION MODE
2
2
3
15
2
4
1
5
CLK
(EXTERNAL)
t STRT
SU
t
STRT
R
t
STRT
W
STRT
t
DRDY
D3
DRDY
HOLD
HOLD
TRACK
V
IN
FIGURE 2. SINGLE SHOT MODE EXTERNAL CLOCK
15
1
3
4
5
CLK
(INTERNAL)
2
t
STRT
D
t
STRT
R
t
STRT
W
STRT
DRDY
DON’T CARE
t
DRDY
D3
HOLD
HOLD
TRACK
V
IN
FIGURE 3. SINGLE SHOT MODE INTERNAL CLOCK
5
HI5810
Timing Diagrams (Continued)
OEL OR OEM
t
t
DIS
EN
D0 - D3 OR
90%
10%
D4 - D11
50%
HIGH
IMPEDANCE
TO HIGH
TO
OUTPUT
PIN
HIGH
IMPEDANCE
50%
TO LOW
1.6mA
1.6mA
+2.1V
50pF
+2.1V
50pF
-400µA
-1.6mA
FIGURE 4. OUTPUT ENABLE/DISABLE TIMING DIAGRAM
FIGURE 5. TIMING LOAD CIRCUIT
Typical Performance Curves
1.00
0.95
0.90
0.85
0.80
0.75
0.70
0.65
0.60
0.55
0.50
0.45
0.40
0.35
0.30
2.0
V
= V + = 5V, V
AA
+ = 4.608V, CLK = 1.5MHz
REF
DD
V
= V + = 5V, V
AA REF
+ = 4.608V, CLK = 1.5MHz
1.9
1.8
1.7
1.6
1.5
1.4
1.3
1.2
1.1
1.0
DD
0
-50 -40 -30 -20 -10
0
10 20 30 40 50 60 70 80 90
o
-50 -40 -30 -20 -10
10 20 30 40 50 60 70 80 90
o
TEMPERATURE ( C)
TEMPERATURE ( C)
FIGURE 6. NL vs TEMPERATURE
FIGURE 7. OFFSET ERROR vs TEMPERATURE
-1.0
-1.1
-1.2
-1.3
-1.4
-1.5
-1.6
-1.7
-1.8
-1.9
-2.0
-2.1
-2.2
-2.3
-2.4
-2.5
1.75
1.70
1.65
1.60
1.55
1.50
1.45
1.40
1.35
1.30
1.25
1.20
1.15
1.10
1.05
1.00
V
= V + = 5V, V
AA
+ = 4.608V, CLK = 1.5MHz
REF
V
= V + = 5V, V
AA
+ = 4.608V, CLK = 1.5MHz
REF
DD
DD
-50 -40 -30 -20 -10
0
10 20 30 40 50 60 70 80 90
o
-50 -40 -30 -20 -10
0
10 20 30 40 50 60 70 80 90
o
TEMPERATURE ( C)
TEMPERATURE ( C)
FIGURE 8. DNL vs TEMPERATURE
FIGURE 9. FULL SCALE ERROR vs TEMPERATURE
6
HI5810
Typical Performance Curves (Continued)
6.5
6.0
5.5
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
INPUT FREQUENCY = 1kHz
SAMPLING RATE = 100kHz
SNR = 64.92dB
SINAD = 63.82dB
EFFECTIVE BITS = 10.30
THD = -69.44dBc
PEAK NOISE = -70.1dB
SFDR = 70.1dB
-50 -40 -30 -20 -10
0
10 20 30 40 50 60 70 80 90
o
FREQUENCY
TEMPERATURE ( C)
FIGURE 10. SUPPLY CURRENT vs TEMPERATURE
FIGURE 11. FFT SPECTRUM
500
V
= V + = 5V, V + = 4.608V
AA REF
DD
450
400
350
300
250
200
150
-60 -40 -20
0
20
40
60
80 100 120 140
o
TEMPERATURE ( C)
FIGURE 12. INTERNAL CLOCK FREQUENCY vs TEMPERATURE
7
HI5810
capacitors to V
-. The capacitor common node, after the
REF
TABLE 1. PIN DESCRIPTIONS
charges balance out, will indicate whether the input was
1
above
/
of (V
+ - V
-). At the end of the fourth
REF
PIN NO. NAME
DESCRIPTION
2
REF
period, the comparator output is stored and the MSB
capacitor is either left connected to V + (if the comparator
1
DRDY Output flag signifying new data is available.
Goes high at end of clock period 15. Goes low
when new conversion is started.
REF
was high) or returned to V
comparison to be at either / or / of (V
-. This allows the next
1
REF
3
+ - V
-).
2
3
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
Bit 0 (Least Significant Bit, LSB).
4
4
REF
REF
Bit 1.
At the end of periods 5 through 14, capacitors representing
D10 through D1 are tested, the result stored, and each
4
Bit 2.
5
Bit 3.
capacitor either left at V
+ or at V
-.
REF
REF
6
Bit 4.
At the end of the 15th period, when the LSB (D0) capacitor is
tested, (D0) and all the previous results are shifted to the
output registers and drivers. The capacitors are reconnected
to the input, the comparator returns to the balance state, and
the data ready output goes active. The conversion cycle is
now complete.
7
Bit 5.
8
Bit 6.
9
Bit 7.
10
11
12
13
14
15
Bit 8.
Bit 9.
V
Digital Ground, (0V).
Analog Input
SS
D10 Bit 10.
The analog input pin is a predominately capacitive load that
changes between the track and hold periods of the
conversion cycle. During hold, clock period 4 through 15, the
input loading is leakage and stray capacitance, typically less
than 5µA and 20pF.
D11 Bit 11 (Most Significant Bit, MSB)
OEM Three-State Enable for D4-D11. Active low
input.
16
17
18
19
V
V
-
Analog Ground, (0V).
AA
+
Analog Positive Supply. (+5V) (See text.)
Analog Input.
At the start of input tracking, clock period 1, some charge is
dumped back to the input pin. The input source must have low
enough impedance to dissipate the current spike by the end of
the tracking period as shown in Figure 13. The amount of
charge is dependent on supply and input voltages. The
average current is also proportional to clock frequency.
AA
V
IN
V
+
Reference Voltage Positive Input, sets 4095
code end of input range.
REF
20
21
22
V
-
Reference Voltage Negative Input, sets 0
code end of input range.
REF
STRT Start Conversion Input active low, recognized
after end of clock period 15.
CLK CLK Input or Output. Conversion functions are
synchronized to positive going edge (see text).
20mA
I
IN
10mA
0mA
23
24
OEL Three-State Enable for D0 D3. Active low input.
V
Digital Positive Supply (+5V).
DD
Theory of Operation
5V
The HI5810 is a CMOS 12-bit, Analog-to-Digital Converter
that uses capacitor charge balancing to successively
approximate the analog input. A binarily weighted capacitor
network forms the A/D heart of the device. See the block
diagram for the HI5810.
CLK
0V
5V
DRDY
0V
200ns/DIV.
The capacitor network has a common node which is
connected to a comparator. The second terminal of each
CONDITIONS: V
V
= V + = 5.0V, V + = 4.608V,
REF
DD
AA
= 4.608V, CLK = 750kHz, T = 25 C
o
IN
A
capacitor is individually switchable to the input, V
+ or
REF
FIGURE 13. TYPICAL ANALOG INPUT CURRENT
V
-.
REF
During the first three clock periods of a conversion cycle, the
switchable end of every capacitor is connected to the input
and the comparator is being auto balanced at the capacitor
common node.
As long as these current spikes settle completely by end of
the signal acquisition period, converter accuracy will be
preserved. The analog input is tracked for 3 clock cycles.
With an external clock of 1.5MHz the track period is 2µs.
During the fourth period, all capacitors are disconnected
from the input; the one representing the MSB (D11) is
A simplified analog input model is presented in Figure 14.
During tracking, the A/D input (V ) typically appears as a
IN
connected to the V
+ terminal; and the remaining
380pF capacitor being charged through a 420Ω internal
REF
8
HI5810
switch resistance. The time constant is 160ns. To charge this
capacitor from an external “zero Ω” source to 0.5 LSB
(1/8192), the charging time must be at least 9 time constants
accuracy is of utmost importance full scale and offset errors
may be adjusted to zero.
The V
REF
+ and V - pins reference the two ends of the
REF
or 1.4µs. The maximum source impedance (R
Max)
SOURCE
analog input range and may be used for offset and full scale
for a 2µs acquisition time settling to within 0.5 LSB is 164Ω.
adjustments. In a typical system the V - might be returned
REF
to a clean ground, and the offset adjustment done on an input
amplifier. V + would then be adjusted to null out the full
If the clock frequency was slower, or the converter was not
restarted immediately (causing a longer sample time), a
higher source impedance could be tolerated.
REF
scale error. When this is not possible, the V
- input can be
REF
- must be well
adjusted to null the offset error, however, V
decoupled.
REF
V
IN
R
SW ≈ 420Ω
C
SAMPLE ≈ 380pF
Full scale and offset error can also be adjusted to zero in the
R
SOURCE
signal conditioning amplifier driving the analog input (V ).
IN
-t
ACQ
ln [2
- R
R
=
C
SW
SOURCE (MAX)
-(N + 1)
Control Signal
]
SAMPLE
The HI5810 may be synchronized from an external source
by using the STRT (Start Conversion) input to initiate
conversion, or if STRT is tied low, may be allowed to free
run. Each conversion cycle takes 15 clock periods.
FIGURE 14. ANALOG INPUT MODEL IN TRACK MODE
Reference Input
The reference input V
+ should be driven from a low
REF
impedance source and be well decoupled.
The input is tracked from clock period 1 through period 3,
then disconnected as the successive approximation takes
As shown in Figure 15, current spikes are generated on the
reference pin during each bit test of the successive
approximation part of the conversion cycle as the charge
place. After the start of the next period 1 (specified by t
D
data), the output is updated.
balancing capacitors are switched between V
- and
REF
The DRDY (Data Ready) status output goes high (specified
V
+ (clock periods 5 - 14). These current spikes must
REF
settle completely during each bit test of the conversion to not
degrade the accuracy of the converter. Therefore V
by t DRDY) after the start of clock period 1, and returns
D1
low (specified by t DRDY) after the start of clock period 2.
D2
+
-
REF
REF
- should be well bypassed. Reference input V
The 12 data bits are available in parallel on three-state bus
driver outputs. When low, the OEM input enables the most
significant byte (D4 through D11) while the OEL input
and V
REF
is normally connected directly to the analog ground plane. If
- is biased for nulling the converters offset it must be
V
REF
enables the four least significant bits (D0 - D3). t
specify the output enable and disable times.
and t
DIS
stable during the conversion cycle.
EN
If the output data is to be latched externally, either the trailing
edge of data ready or the next falling edge of the clock after
data ready goes high can be used.
20mA
I
+
10mA
0mA
REF
When STRT input is used to initiate conversions, operation is
slightly different depending on whether an internal or
external clock is used.
Figure 3 illustrates operation with an internal clock. If the
5V
0V
CLK
STRT signal is removed (at least t STRT) before clock
R
period 1, and is not reapplied during that period, the clock
will shut off after entering period 2. The input will continue to
track and the DRDY output will remain high during this time.
5V
0V
DRDY
2µs/DIV.
A low signal applied to STRT (at least t STRT wide) can
W
now initiate a new conversion. The STRT signal (after a
delay of (t STRT)) causes the clock to restart.
D
CONDITIONS: V
= V + = 5.0V, V
+ = 4.608V,
o
DD
AA REF
V
= 2.3V, CLK = 750kHz, T = 25 C
A
IN
FIGURE 15. TYPICAL REFERENCE INPUT CURRENT
Depending on how long the clock was shut off, the low
portion of clock period 2 may be longer than during the
remaining cycles.
The HI5810 is specified with a 4.608V reference, however, it
will operate with a reference down to 3V having a slight
degradation in performance.
The input will continue to track until the end of period 3, the
same as when free running.
Full Scale and Offset Adjustment
In many applications the accuracy of the HI5810 would be
sufficient without any adjustments. In applications where
9
HI5810
Figure 2 illustrates the same operation as above but with an
Except for V +, which is a substrate connection to V , all
AA DD
external clock. If STRT is removed (at least t STRT) before
pins have protection diodes connected to V
and V
.
R
DD
SS
clock period 2, a low signal applied to STRT will drop the
DRDY flag as before, and with the first positive going clock
Input transients above V
the digital supplies.
or below V will get steered to
SS
DD
edge that meets the (t STRT) setup time, the converter will
continue with clock period 3.
SU
The V + and V - terminals supply the charge balancing
AA AA
comparator only. Because the comparator is autobalanced
between conversions, it has good low frequency supply
rejection. It does not reject well at high frequencies however;
Clock
The HI5810 can operate either from its internal clock or from
one externally supplied. The CLK pin functions either as the
clock output or input. All converter functions are
V
- should be returned to a clean analog ground and V +
AA AA
should be RC decoupled from the digital supply as shown in
Figure 17.
synchronized with the rising edge of the clock signal.
There is approximately 50Ω of substrate impedance
Figure 16 shows the configuration of the internal clock. The
clock output drive is low power: if used as an output, it
should not have more than 1 CMOS gate load applied, and
stray wiring capacitance should be kept to a minimum.
between V
and V +. This can be used, for example, as
DD
part of a low pass RC filter to attenuate switching supply
AA
noise. A 10µF capacitor from V + to ground would
AA
attenuate 30kHz noise by approximately 40dB. Note that
The internal clock will shut down if the A/D is not restarted
after a conversion. The clock could also be shut down with
an open collector driver applied to the CLK pin. This should
only be done during the sample portion (the first three clock
periods) of a conversion cycle, and might be useful for using
the device as a digital sample and hold.
back-to-back diodes should be placed from V
handle supply to capacitor turn-on or turn-off current spikes.
to V + to
DD
AA
Dynamic Performance
Fast Fourier Transform (FFT) techniques are used to
evaluate the dynamic performance of the A/D. A low
distortion sine wave is applied to the input of the A/D
converter. The input is sampled by the A/D and its output
stored in RAM. The data is than transformed into the
frequency domain with a 4096 point FFT and analyzed to
evaluate the converters dynamic performance such as SNR
and THD. See Typical Performance Characteristics.
If an external clock is supplied to the CLK pin, it must have
sufficient drive to overcome the internal clock source. The
external clock can be shut off, but again, only during the
sample portion of a conversion cycle. At other times, it must
be above the minimum frequency shown in the
specifications. In the above two cases, a further restriction
applies in that the clock should not be shut off during the
third sample period for more than 1ms. This might cause an
internal charge pump voltage to decay.
Signal-To-Noise Ratio
The signal to noise ratio (SNR) is the measured RMS signal to
RMS sum of noise at a specified input and sampling frequency.
The noise is the RMS sum of all except the fundamental and
the first five harmonic signals. The SNR is dependent on the
number of quantization levels used in the converter. The
theoretical SNR for an N-bit converter with no differential or
integral linearity error is: SNR = (6.02N + 1.76)dB. For an ideal
12-bit converter the SNR is 74dB. Differential and integral
linearity errors will degrade SNR.
If the internal or external clock was shut off during the
conversion time (clock cycles 4 through 15) of the A/D, the
output might be invalid due to balancing capacitor droop.
An external clock must also meet the minimum t
and
LOW
times shown in the specifications. A violation may
t
HIGH
cause an internal miscount and invalidate the results.
Sinewave Signal Power
SNR = 10 Log
INTERNAL
ENABLE
Total Noise Power
CLOCK
CLK
Signal-To-Noise + Distortion Ratio
OPTIONAL
EXTERNAL
CLOCK
SINAD is the measured RMS signal to RMS sum of noise
plus harmonic power and is expressed by the following.
100kΩ
18pF
Sinewave Signal Power
SINAD = 10 Log
FIGURE 16. INTERNAL CLOCK CIRCUITRY
Noise + Harmonic Power (2nd - 6th)
Power Supplies and Grounding
Effective Number of Bits
V
and V are the digital supply pins: they power all
DD
SS
internal logic and the output drivers. Because the output
drivers can cause fast current spikes in the V and V
The effective number of bits (ENOB) is derived from the
SINAD data;
DD
SS
lines, V should have a low impedance path to digital
SS
ground and V
SINAD - 1.76
should be well bypassed.
DD
ENOB =
6.02
10
HI5810
Total Harmonic Distortion
Spurious-Free Dynamic Range
The total harmonic distortion (THD) is the ratio of the RMS
sum of the second through sixth harmonic components to
the fundamental RMS signal for a specified input and
sampling frequency.
The spurious-free dynamic range (SFDR) is the ratio of the
fundamental RMS amplitude to the RMS amplitude of the
next largest spur or spectral component. If the harmonics
are buried in the noise floor it is the largest peak.
Total Harmonic Power (2nd - 6th Harmonic)
THD = 10Log
Sinewave Signal Power
SFDR = 10Log
Sinewave Signal Power
Highest Spurious Signal Power
TABLE 2. CODE TABLE
BINARY OUTPUT CODE
INPUT VOLTAGE†
+ = 4.608V
MSB
LSB
D0
1
CODE
DESCRIPTION
V
DECIMAL
COUNT
REF
V
- = 0V (V)
D11
1
D10
1
D9
1
D8
1
D7
1
D6
1
D5
1
D4
1
D3
1
D2
1
D1
1
REF
Full Scale (FS)
4.6069
4.6058
3.4560
2.3040
1.1520
0.001125
0
4095
4094
3072
2048
1024
1
FS - 1 LSB
3
1
1
1
1
1
1
1
1
1
1
1
0
/
/
/
FS
FS
FS
1
1
0
0
0
0
0
0
0
0
0
0
4
2
4
1
1
1
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
1 LSB
Zero
0
0
0
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
†The voltages listed above represent the ideal lower transition of each output code shown as a function of the reference voltage.
+5V
0.1µF
4.7µF
10µF
0.1µF
0.1µF
0.01µF
V
+
V
DD
AA
D11
.
.
.
OUTPUT
DATA
D0
V
REF
V
+
REF
0.001µF
4.7µF
DRDY
OEM
OEL
ANALOG
INPUT
V
V
IN
STRT
CLK
1.5MHz CLOCK
-
V
-
V
SS
REF
AA
FIGURE 17. GROUND AND SUPPLY DECOUPLING
11
HI5810
Die Characteristics
DIE DIMENSIONS
PASSIVATION
3200µm x 3940µm
Type: PSG
Thickness: 13kÅ 2.5kÅ
METALLIZATION
WORST CASE CURRENT DENSITY
Type: AlSi
Thickness: 11kÅ 1kÅ
5
2
1.84 x 10 A/cm
Metallization Mask Layout
HI5810
DRDY
D0
(LSB)
D1
V
OEL
DD
CLK
D2
D3
STRT
V
-
REF
D4
D5
D6
V
+
REF
D7
D8
V
IN
V
+
-
AA
V
AA
D9
V
D10
D11
(MSB)
OEM
SS
12
HI5810
Small Outline Plastic Packages (SOIC)
M24.3 (JEDEC MS-013-AD ISSUE C)
N
24 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE
INDEX
AREA
0.25(0.010)
M
B M
H
INCHES
MILLIMETERS
E
SYMBOL
MIN
MAX
MIN
2.35
0.10
0.33
0.23
MAX
2.65
0.30
0.51
0.32
15.60
7.60
NOTES
-B-
A
A1
B
C
D
E
e
0.0926
0.0040
0.013
0.1043
0.0118
0.020
-
-
1
2
3
L
9
SEATING PLANE
A
0.0091
0.5985
0.2914
0.0125
-
-A-
o
0.6141 15.20
3
h x 45
D
0.2992
7.40
4
-C-
0.05 BSC
1.27 BSC
-
α
µ
H
h
0.394
0.010
0.016
0.419
0.029
0.050
10.00
0.25
0.40
10.65
0.75
1.27
-
e
A1
C
5
B
0.10(0.004)
L
6
0.25(0.010) M
C A M B S
N
α
24
24
7
o
o
o
o
0
8
0
8
-
NOTES:
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of
Publication Number 95.
Rev. 0 12/93
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
3. Dimension “D” does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm
(0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions. Inter-
lead flash and protrusions shall not exceed 0.25mm (0.010 inch) per
side.
5. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch)
10. Controlling dimension: MILLIMETER. Converted inch dimensions
are not necessarily exact.
All Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at website www.intersil.com/design/quality/iso.asp.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice.
Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. How-
ever, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use.
No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
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13
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