UPA1817GR-9JG [NEC]

P-CHANNEL MOS FIELD EFFECT TRANSISTOR FOR SWITCHING; P沟道MOS场效应晶体管切换
UPA1817GR-9JG
型号: UPA1817GR-9JG
厂家: NEC    NEC
描述:

P-CHANNEL MOS FIELD EFFECT TRANSISTOR FOR SWITCHING
P沟道MOS场效应晶体管切换

晶体 晶体管 功率场效应晶体管 开关 脉冲 光电二极管
文件: 总8页 (文件大小:76K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATA SHEET  
MOS FIELD EFFECT TRANSISTOR  
µPA1817  
P-CHANNEL MOS FIELD EFFECT TRANSISTOR  
FOR SWITCHING  
DESCRIPTION  
The µPA1817 is a switching device which can be  
PACKAGE DRAWING (Unit: mm)  
driven directly by a 2.5 V power source.  
8
5
This device features a low on-state resistance and  
excellent switching characteristics, and is suitable for  
applications such as power management of notebook  
computers and so on.  
1, 2, 3 :Source  
:Gate  
5, 6, 7, 8:Drain  
1.2 MAX.  
1.0±0.05  
4
0.25  
FEATURES  
+5°  
–3°  
2.5 V drive available  
3°  
0.5  
Low on-state resistance  
0.1±0.05  
+0.15  
–0.1  
0.6  
RDS(on)1 = 12 mMAX. (VGS = 4.5 V, ID = 6.0 A)  
RDS(on)2 = 12.5 mMAX. (VGS = 4.0 V, ID = 6.0 A)  
RDS(on)3 = 19.2 mMAX. (VGS = 2.5 V, ID = 6.0 A)  
Built-in G-S protection diode against ESD  
1
4
6.4 ±0.2  
4.4 ±0.1  
3.15 ±0.15  
3.0 ±0.1  
1.0 ±0.2  
ORDERING INFORMATION  
PART NUMBER  
PACKAGE  
µPA1817GR-9JG  
Power TSSOP8  
0.65  
0.8 MAX.  
0.1  
+0.03  
–0.08  
0.27  
0.10 M  
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)  
EQUIVALENT CIRCUIT  
Drain to Source Voltage (VGS = 0 V)  
Gate to Source Voltage (VDS = 0 V)  
Drain Current (DC) (TA = 25°C)  
Drain Current (pulse) Note1  
VDSS  
VGSS  
ID(DC)  
ID(pulse)  
PT  
20  
V
V
m 12  
m 12  
Drain  
A
Body  
48  
A
m
Diode  
Gate  
Note2  
Total Power Dissipation  
2.0  
W
°C  
°C  
Gate  
Channel Temperature  
Storage Temperature  
Tch  
150  
Protection  
Diode  
Tstg  
55 to +150  
Source  
Notes 1. PW 10 µs, Duty Cycle 1%  
2. Mounted on ceramic substrate of 5000 mm2 x 1.1 mm  
Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When  
this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated  
voltage may be applied to this device.  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all devices/types available in every country. Please check with local NEC representative for  
availability and additional information.  
Document No. G16253EJ1V0DS00 (1st edition)  
Date Published August 2002 NS CP(K)  
Printed in Japan  
2002  
©
µPA1817  
ELECTRICAL CHARACTERISTICS (TA = 25°C)  
CHARACTERISTICS  
Zero Gate Voltage Drain Current  
Gate Leakage Current  
SYMBOL  
IDSS  
TEST CONDITIONS  
MIN. TYP. MAX. UNIT  
VDS = 20 V, VGS = 0 V  
VGS = 12 V, VDS = 0 V  
1.0  
µA  
µA  
V
10  
IGSS  
m
m
Gate Cut-off Voltage  
VGS(off)  
| yfs |  
RDS(on)1  
RDS(on)2  
RDS(on)3  
Ciss  
VDS = 10 V, ID = 1.0 mA  
VDS = 10 V, ID = 6.0 A  
VGS = 4.5 V, ID = 6.0 A  
VGS = 4.0 V, ID = 6.0 A  
VGS = 2.5 V, ID = 6.0 A  
VDS = 10 V  
0.5 1.1 1.5  
Forward Transfer Admittance  
Drain to Source On-state Resistance  
15  
30  
9.6  
10  
S
12  
mΩ  
mΩ  
mΩ  
pF  
pF  
pF  
ns  
12.5  
19.2  
14.5  
3100  
730  
450  
29  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Turn-on Delay Time  
Rise Time  
Coss  
VGS = 0 V  
Crss  
f = 1.0 MHz  
td(on)  
tr  
td(off)  
tf  
VDD = 10 V, ID = 6.0 A  
VGS = 4.0 V  
235  
170  
230  
27  
ns  
Turn-off Delay Time  
Fall Time  
RG = 10 Ω  
ns  
ns  
Total Gate Charge  
QG  
VDD = 16 V  
nC  
nC  
nC  
V
Gate to Source Charge  
Gate to Drain Charge  
Body Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
QGS  
VGS = 4.0 V  
5.6  
12  
QGD  
VF(S-D)  
trr  
ID = 12 A  
IF = 12 A, VGS = 0 V  
IF = 12 A, VGS = 0 V  
di/dt = 100 A/µs  
0.82  
70  
ns  
Qrr  
52  
nC  
TEST CIRCUIT 1 SWITCHING TIME  
TEST CIRCUIT 2 GATE CHARGE  
V
V
GS()  
D.U.T.  
D.U.T.  
90%  
VGS  
V
GS  
Wave Form  
10%  
I
G
= 2 mA  
R
L
0
R
L
DS()  
RG  
PG.  
V
DD  
50 Ω  
PG.  
V
DD  
90%  
90%  
VDS  
0
10% 10%  
V
DS  
Wave Form  
V
GS ()  
0
td(on)  
t
r
td(off)  
tf  
τ
ton  
toff  
τ = 1  
µs  
Duty Cycle 1%  
2
Data Sheet G16253EJ1V0DS  
µPA1817  
TYPICAL CHARACTERISTICS (TA = 25°C)  
DERATING FACTOR OF FORWARD BIAS  
SAFE OPERATING AREA  
TOTAL POWER DISSIPATION vs.  
AMBIENT TEMPERATURE  
120  
100  
80  
60  
40  
20  
0
2.5  
2
Mounted on ceramic substrate of  
5000 mm2 x 1.1 mm  
Mounted on FR-4 board  
of 2500 mm2 x 1.6 mm  
1.5  
1
0.5  
0
0
25  
50  
75  
100  
125  
150  
175  
0
25  
50  
75  
100 125 150 175  
TA - Ambient Temperature - °C  
TA - Ambient Temperature - °C  
FORWARD BIAS SAFE OPERATING AREA  
- 100  
ID(pulse)  
PW = 1 ms  
ID(DC)  
- 10  
- 1  
10 ms  
RDS(on) Limited  
(VGS = 4.5 V)  
100 ms  
DC  
- 0.1  
Single pulse  
Mounted on ceramic substrate of  
5000 mm2 x 1.1 mm  
- 0.01  
- 0.1  
- 1  
- 10  
- 100  
VDS - Drain to Source Voltage - V  
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH  
1000  
100  
10  
Single pulse  
Mounted on FR-4 board of  
2500 mm2 x 1.6 mm  
°
125 C/W  
Mounted on ceramic substrate of  
5000 mm2 x 1.1 mm  
62.5 C/W  
°
1
0.1  
1 m  
10 m  
100 m  
1
10  
100  
1000  
PW - Pulse Width - s  
3
Data Sheet G16253EJ1V0DS  
µPA1817  
DRAIN CURRENT vs.  
FORWARD TRANSFER CHARACTERISTICS  
DRAIN TO SOURCE VOLTAGE  
- 100  
- 50  
- 40  
- 30  
- 20  
- 10  
0
Pulsed  
VGS = 4.5 V  
DS  
V
= 10 V  
Pulsed  
- 10  
- 1  
4.0 V  
TA = 125°C  
75°C  
25°C  
25°C  
- 0.1  
2.5 V  
- 0.01  
- 0.001  
- 0.0001  
0
- 0.2  
- 0.4  
- 0.6  
- 0.8  
- 0.5  
- 1  
- 1.5  
- 2  
- 2.5  
VDS - Drain to Source Voltage - V  
VGS - Gate to Source Voltage - V  
GATE CUT-OFF VOLTAGE vs.  
CHANNEL TEMPERATURE  
FORWARD TRANSFER ADMITTANCE vs.  
DRAIN CURRENT  
- 1.4  
- 1.2  
- 1  
100  
10  
1
VDS = 10 V  
Pulsed  
VDS = 10 V  
D
I
= 1.0 mA  
TA = 125°C  
75°C  
25°C  
25°C  
- 0.8  
- 0.6  
- 0.4  
0.1  
-50  
0
50  
100  
150  
- 0.01  
- 0.1  
- 1  
- 10  
- 100  
Tch - Channel Temperature - °C  
ID - Drain Current - A  
DRAIN TO SOURCE ON-STATE RESISTANCE vs.  
CHANNEL TEMPERATURE  
DRAIN TO SOURCE ON-STATE RESISTANCE vs.  
GATE TO SOURCE VOLTAGE  
30  
30  
ID = 6.0 A  
ID = 6.0 A  
Pulsed  
Pulsed  
25  
20  
15  
10  
5
25  
20  
15  
10  
5
VGS = 2.5 V  
4.0 V  
4.5 V  
0
0
-50  
0
50  
100  
150  
0
- 2  
- 4  
- 6  
- 8  
- 10  
- 12  
Tch - Channel Temperature - °C  
VGS - Gate to Source Voltage - V  
4
Data Sheet G16253EJ1V0DS  
µPA1817  
DRAIN TO SOURCE ON-STATE  
RESISTANCE vs. DRAIN CURRENT  
DRAIN TO SOURCE ON-STATE  
RESISTANCE vs. DRAIN CURRENT  
30  
25  
20  
15  
10  
5
30  
25  
20  
15  
10  
5
VGS = 4.0 V  
Pulsed  
VGS = 4.5 V  
Pulsed  
A
°
T
= 125 C  
TA = 125°C  
75°C  
75°C  
25°C  
25°C  
25°C  
25°C  
0
0
- 0.01  
- 0.1  
- 1  
- 10  
- 100  
- 0.01  
- 0.1  
- 1  
- 10  
- 100  
ID - Drain Current - A  
ID - Drain Current - A  
DRAIN TO SOURCE ON-STATE  
RESISTANCE vs. DRAIN CURRENT  
CAPACITANCE vs.  
DRAIN TO SOURCE VOLTAGE  
30  
25  
20  
15  
10  
5
10000  
1000  
100  
VGS = 0 V  
f = 1.0 MHz  
VGS = 2.5 V  
Pulsed  
TA = 125°C  
Ciss  
75°C  
Coss  
Crss  
25°C  
25°C  
0
- 0.1  
- 1  
- 10  
- 100  
- 0.01  
- 0.1  
- 1  
- 10  
- 100  
VDS - Drain to Source Voltage - V  
ID - Drain Current - A  
SWITCHING CHARACTERISTICS  
SOURCE TO DRAIN DIODE  
FORWARD VOLTAGE  
10000  
1000  
100  
100  
10  
VDD = 10 V  
VGS = 4.0 V  
RG = 10 Ω  
VGS = 0 V  
Pulsed  
f
t
1
td(off)  
0.1  
0.01  
d(on)  
t
tr  
10  
0.4  
0.6  
0.8  
1
1.2  
- 0.01  
- 0.1  
- 1  
- 10  
- 100  
ID - Drain Current - A  
VF(S-D) - Source to Drain Voltage - V  
5
Data Sheet G16253EJ1V0DS  
µPA1817  
DYNAMIC INPUT/OUTPUT CHARACTERISTICS  
- 5  
ID = 12 A  
- 4  
- 3  
- 2  
- 1  
0
VDD = 4.0 V  
10 V  
16 V  
0
5
10  
15  
20  
25  
30  
35  
QG - Gate Charge - nC  
6
Data Sheet G16253EJ1V0DS  
µPA1817  
[MEMO]  
7
Data Sheet G16253EJ1V0DS  
µPA1817  
The information in this document is current as of August, 2002. The information is subject to  
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or  
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all  
products and/or types are available in every country. Please check with an NEC sales representative  
for availability and additional information.  
No part of this document may be copied or reproduced in any form or by any means without prior  
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.  
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of  
third parties by or arising from the use of NEC semiconductor products listed in this document or any other  
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any  
patents, copyrights or other intellectual property rights of NEC or others.  
Descriptions of circuits, software and other related information in this document are provided for illustrative  
purposes in semiconductor product operation and application examples. The incorporation of these  
circuits, software and information in the design of customer's equipment shall be done under the full  
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third  
parties arising from the use of these circuits, software and information.  
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers  
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize  
risks of damage to property or injury (including death) to persons arising from defects in NEC  
semiconductor products, customers must incorporate sufficient safety measures in their design, such as  
redundancy, fire-containment, and anti-failure features.  
NEC semiconductor products are classified into the following three quality grades:  
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products  
developed based on a customer-designated "quality assurance program" for a specific application. The  
recommended applications of a semiconductor product depend on its quality grade, as indicated below.  
Customers must check the quality grade of each semiconductor product before using it in a particular  
application.  
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio  
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and industrial robots  
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster  
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed  
for life support)  
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life  
support systems and medical equipment for life support, etc.  
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's  
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not  
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness  
to support a given application.  
(Note)  
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.  
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for  
NEC (as defined above).  
M8E 00. 4  

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