FDS86140 [ONSEMI]

N 沟道 PowerTrench® MOSFET 100V,11.2A,9.8mΩ;
FDS86140
型号: FDS86140
厂家: ONSEMI    ONSEMI
描述:

N 沟道 PowerTrench® MOSFET 100V,11.2A,9.8mΩ

PC 开关 光电二极管 晶体管
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March 2011  
FDS86140  
N-Channel PowerTrench® MOSFET  
100 V, 11.2 A, 9.8 mΩ  
Features  
General Description  
„ Max rDS(on) = 9.8 mΩ at VGS = 10 V, ID = 11.2 A  
This N-Channel MOSFET is produced using Fairchild  
Semiconductor‘s advanced Power Trench® process that has  
„ Max rDS(on) = 16 mΩ at VGS = 6 V, ID = 9 A  
been optimized for rDS(on)  
ruggedness.  
, switching performance and  
„ High performance trench technologh for extremely low rDS(on)  
„ High power and current handing capability in a widely used  
surface mount package  
Applications  
„ 100% UIL Tested  
„ RoHS Compliant  
„ DC/DC Converters and Off-Line UPS  
„ Distributed Power Architectures and VRMs  
„ Primary Swith for 24 V and 48 V Systems  
„ High Voltage Synchronous Rectifier  
D
D
G
S
S
S
4
3
2
1
5
6
7
8
D
D
D
D
D
D
G
SO-8  
S
S
Pin 1  
S
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
100  
±20  
11.2  
50  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Pulsed  
V
V
ID  
A
mJ  
W
EAS  
PD  
Single Pulse Avalanche Energy  
Power Dissipation  
(Note 3)  
264  
5.0  
TC = 25 °C  
TA = 25 °C  
(Note 1)  
Power Dissipation  
(Note 1a)  
2.5  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
(Note 1)  
25  
50  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
Tape Width  
12 mm  
Quantity  
FDS86140  
FDS86140  
SO-8  
13’’  
2500 units  
©2011 Fairchild Semiconductor Corporation  
FDS86140 Rev.C  
www.fairchildsemi.com  
1
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V  
100  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 μA, referenced to 25 °C  
70  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = 80 V, VGS = 0 V  
VGS = ±20 V, VDS = 0 V  
1
μA  
±100  
nA  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 μA  
2
2.7  
-11  
4
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
D = 250 μA, referenced to 25 °C  
VGS = 10 V, ID = 11.2 A  
GS = 6 V, ID = 9 A  
mV/°C  
8.1  
9.8  
16  
V
10.8  
rDS(on)  
Static Drain to Source On Resistance  
Forward Transconductance  
mΩ  
VGS = 10 V, ID = 11.2 A,  
TJ = 125 °C  
13.1  
35  
17  
gFS  
VDS = 10 V, ID = 11.2 A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1940  
440  
20  
2580  
585  
30  
pF  
pF  
pF  
Ω
VDS = 50 V, VGS = 0 V,  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
0.9  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
13.7  
5.6  
23  
25  
11  
38  
10  
41  
23  
ns  
ns  
VDD = 50 V, ID = 11.2 A,  
V
GS = 10 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
ns  
4.8  
29  
ns  
Qg  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 5 V  
nC  
nC  
nC  
nC  
Qg  
16.5  
8.0  
6.5  
VDD = 50 V,  
D = 11.2 A  
I
Qgs  
Qgd  
Drain-Source Diode Characteristics  
V
GS = 0 V, IS = 11.2 A  
(Note 2)  
(Note 2)  
0.8  
0.7  
53  
1.3  
1.2  
85  
VSD  
Source-Drain Diode Forward Voltage  
V
VGS = 0 V, IS = 2 A  
trr  
Reverse Recovery Time  
ns  
IF = 11.2 A, di/dt = 100 A/μs  
Qrr  
Reverse Recovery Charge  
59  
94  
nC  
NOTES:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R  
is determined by  
θJA  
θJC  
θCA  
the user's board design.  
a) 50 °C/W when mounted on a  
1 in pad of 2 oz copper.  
b) 125 °C/W when mounted on a  
minimum pad.  
2
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.  
3. Starting T = 25 °C, L = 1 mH, I = 23 A, V = 90 V, V = 10 V.  
J
AS  
DD  
GS  
©2011 Fairchild Semiconductor Corporation  
FDS86140 Rev.C  
www.fairchildsemi.com  
2
Typical Characteristics TJ = 25 °C unless otherwise noted  
50  
4
3
2
1
0
VGS = 10 V  
VGS = 4.5 V  
VGS = 7 V  
40  
VGS = 6 V  
VGS = 5 V  
VGS = 5 V  
30  
VGS = 7 V  
VGS = 6 V  
20  
VGS = 4.5V  
10  
VGS = 10 V  
PULSE DURATION = 80 μs  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
DUTY CYCLE = 0.5% MAX  
0
0
1
2
3
4
0
10  
20  
30  
40  
50  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
50  
2.0  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
ID = 11.2 A  
GS = 10 V  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
V
40  
30  
20  
10  
0
ID = 11.2 A  
TJ = 125 o  
C
TJ = 25 o  
C
4
5
6
7
8
9
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
50  
100  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 0 V  
TJ = 150 o  
40  
30  
20  
10  
0
10  
1
C
VDS = 5 V  
TJ = 25 o  
C
TJ = 150 o  
C
0.1  
TJ = -55 o  
C
TJ = 25 o  
C
0.01  
TJ = -55 o  
C
0.001  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
2
3
4
5
6
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2011 Fairchild Semiconductor Corporation  
FDS86140 Rev.C  
www.fairchildsemi.com  
3
Typical Characteristics TJ = 25 °C unless otherwise noted  
10  
5000  
1000  
ID = 11.2 A  
VDD = 50 V  
8
Ciss  
VDD = 25 V  
VDD = 75 V  
6
4
2
0
Coss  
100  
10  
f = 1 MHz  
= 0 V  
V
GS  
Crss  
0.1  
1
10  
100  
0
6
12  
18  
24  
30  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Q , GATE CHARGE (nC)  
g
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
20  
12  
9
10  
TJ = 25 oC  
TJ = 100 oC  
VGS = 10 V  
6
VGS = 6 V  
TJ = 125 o  
C
3
RθJA = 50 oC/W  
1
0.01  
0
25  
0.1  
1
10  
100  
50  
75  
100  
125  
150  
TA, AMBIENT TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs Ambient Temperature  
80  
10  
2000  
SINGLE PULSE  
θJA = 125 oC/W  
A = 25 oC  
1000  
100  
10  
R
100us  
T
1 ms  
1
0.1  
THIS AREA IS  
10 ms  
LIMITED BY r  
DS(on)  
100 ms  
SINGLE PULSE  
TJ = MAX RATED  
RθJA = 125 oC/W  
TA = 25 oC  
1 s  
10 s  
DC  
1
0.01  
0.5  
10-4  
10-3  
10-2  
t, PULSE WIDTH (sec)  
10-1  
1
10  
0.01  
0.1  
1
10  
100  
500  
100 1000  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 11. Forward Bias Safe  
Operating Area  
Figure12. Single Pulse Maximum  
Power Dissipation  
©2011 Fairchild Semiconductor Corporation  
FDS86140 Rev.C  
www.fairchildsemi.com  
4
Typical Characteristics TJ = 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.1  
0.05  
P
DM  
0.02  
0.01  
0.01  
t
1
t
2
NOTES:  
DUTY FACTOR: D = t /t  
SINGLE PULSE  
RθJA = 125 oC/W  
1
2
PEAK T = P  
J
x Z  
x R  
+ T  
DM  
θJA  
θJA A  
0.001  
0.0005  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 13. Junction-to-Ambient Transient Thermal Response Curve  
©2011 Fairchild Semiconductor Corporation  
FDS86140 Rev.C  
www.fairchildsemi.com  
5
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are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
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ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
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expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
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