M74VHCT157ADTR2G [ONSEMI]

Quad 2−Channel Multiplexer; 四路2通道多路复用器
M74VHCT157ADTR2G
型号: M74VHCT157ADTR2G
厂家: ONSEMI    ONSEMI
描述:

Quad 2−Channel Multiplexer
四路2通道多路复用器

解复用器 逻辑集成电路 光电二极管
文件: 总7页 (文件大小:102K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MC74VHCT157A  
Quad 2−Channel Multiplexer  
The MC74VHCT157A is an advanced high speed CMOS quad  
2−channel multiplexer fabricated with silicon gate CMOS technology.  
It achieves high speed operation similar to equivalent Bipolar  
Schottky TTL while maintaining CMOS low power dissipation.  
It consists of four 2−input digital multiplexers with common select  
(S) and enable (E) inputs. When E is held High, selection of data is  
inhibited and all the outputs go Low.  
http://onsemi.com  
MARKING  
The select decoding determines whether the A or B inputs get routed  
to the corresponding Y outputs.  
DIAGRAMS  
The VHCT inputs are compatible with TTL levels. This device can  
be used as a level converter for interfacing 3.3 V to 5.0 V because it  
has full 5.0 V CMOS level output swings.  
The VHCT157A input structures provide protection when voltages  
between 0 V and 5.5 V are applied, regardless of the supply voltage.  
16  
1
SOIC−16  
D SUFFIX  
CASE 751B  
VHCT157AG  
AWLYWW  
1
The output structures also provide protection when V = 0 V. These  
CC  
input and output structures help prevent device destruction caused by  
supply voltage−input/output voltage mismatch, battery backup, hot  
insertion, etc.  
The inputs tolerate voltages up to 7.0 V, allowing the interface of  
5.0 V systems to 3.0 V systems.  
16  
VHCT  
157A  
ALYWG  
G
TSSOP−16  
DT SUFFIX  
CASE 948F  
1
1
Features  
High Speed: t = 4.1 ns (Typ) at V = 5.0 V  
PD  
CC  
16  
Low Power Dissipation: I = 4 mA (Max) at T = 25°C  
CC  
A
SOEIAJ−16  
M SUFFIX  
CASE 966  
74VHCT157  
ALYWG  
TTL−Compatible Inputs: V = 0.8 V; V = 2.0 V  
IL  
IH  
Power Down Protection Provided on Inputs and Outputs  
Balanced Propagation Delays  
1
1
Designed for 2.0 V to 5.5 V Operating Range  
A
WL, L  
Y
= Assembly Location  
= Wafer Lot  
Low Noise: V  
= 0.8 V (Max)  
OLP  
Pin and Function Compatible with Other Standard Logic Families  
Latchup Performance Exceeds 300 mA  
= Year  
WW, W = Work Week  
G or G  
= Pb−Free Package  
ESD Performance:  
(Note: Microdot may be in either location)  
Human Body Model > 2000 V;  
Machine Model > 200 V  
Chip Complexity: 82 FETs or 20 Equivalent Gates  
Pb−Free Packages are Available*  
FUNCTION TABLE  
Inputs  
Outputs  
E
S
Y0 − Y3  
H
L
L
X
L
H
L
A0A3  
B0B3  
A0 − A3, B0 − B3 = the levels of  
the respective Data−Word Inputs.  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 5 of this data sheet.  
*For additional information on our Pb−Free strategy and soldering details, please  
download the ON Semiconductor Soldering and Mounting Techniques  
Reference Manual, SOLDERRM/D.  
©
Semiconductor Components Industries, LLC, 2005  
1
Publication Order Number:  
December, 2005 − Rev. 2  
MC74VHCT157A/D  
MC74VHCT157A  
V
E
S
1
2
16  
15  
CC  
A0  
B0  
Y0  
A3  
B3  
Y3  
A2  
B2  
Y2  
3
4
14  
13  
A1  
5
6
12  
11  
B1  
7
8
10  
Y1  
GND  
9
Figure 1. Pin Assignment  
2
3
A0  
B0  
A1  
B1  
4
7
Y0  
5
6
Y1  
Y2  
NIBBLE  
INPUTS  
DATA  
OUTPUTS  
11  
10  
14  
13  
A2  
B2  
A3  
B3  
9
12  
Y3  
15  
1
E
S
Figure 2. Expanded Logic Diagram  
15  
1
E
S
EN  
G1  
This device contains protection circuitry to  
guard against damage due to high static  
voltages or electric fields. However, pre-  
cautions must be taken to avoid applications  
of any voltage higher than maximum rated  
voltages to this high−impedance circuit. For  
2
3
5
6
MUX  
A0  
B0  
A1  
B1  
1
1
4
7
Y0  
Y1  
Y2  
Y3  
proper operation, V and V  
should be  
in  
out  
11  
10  
14  
13  
A2  
B2  
9
constrained to the range GND v (V or V  
)
in  
out  
v V  
.
CC  
Unused inputs must always be tied to an  
appropriate logic voltage level (e.g., either  
A3  
B3  
12  
GND or V ). Unused outputs must be left  
CC  
open.  
Figure 3. IEC Logic Symbol  
http://onsemi.com  
2
MC74VHCT157A  
MAXIMUM RATINGS (Note 1)  
Symbol  
Parameter  
Value  
Unit  
V
V
Positive DC Supply Voltage  
Digital Input Voltage  
−0.5 to +7.0  
−0.5 to +7.0  
−0.5 to +7.0  
CC  
V
V
IN  
V
DC Output Voltage  
Output in 3−State  
V
OUT  
High or Low State  
−0.5 to V +0.5  
CC  
I
Input Diode Current  
−20  
$20  
$25  
$75  
mA  
mA  
mA  
mA  
mW  
IK  
I
Output Diode Current  
DC Output Current, per Pin  
OK  
I
OUT  
I
DC Supply Current, V and GND Pins  
CC  
CC  
P
Power Dissipation in Still Air  
SOIC Package  
TSSOP  
200  
180  
D
T
V
Storage Temperature Range  
ESD Withstand Voltage  
−65 to +150  
°C  
STG  
Human Body Model (Note 2)  
Machine Model (Note 3)  
>2000  
>200  
V
ESD  
Charged Device Model (Note 4)  
>2000  
I
Latchup Performance  
Above V and Below GND at 125°C (Note 5)  
$300  
mA  
LATCHUP  
CC  
q
Thermal Resistance, Junction−to−Ambient  
SOIC Package  
TSSOP  
143  
164  
°C/W  
JA  
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit  
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,  
damage may occur and reliability may be affected.  
1. Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the  
Recommended Operating Conditions.  
2. Tested to EIA/JESD22−A114−A  
3. Tested to EIA/JESD22−A115−A  
4. Tested to JESD22−C101−A  
5. Tested to EIA/JESD78  
RECOMMENDED OPERATING CONDITIONS  
Symbol  
Characteristics  
Min  
4.5  
0
Max  
5.5  
Unit  
V
V
DC Supply Voltage  
DC Input Voltage  
DC Output Voltage  
CC  
V
5.5  
V
IN  
V
Output in 3−State  
High or Low State  
0
V
V
OUT  
CC  
T
Operating Temperature Range, all Package Types  
Input Rise or Fall Time  
−55  
0
125  
20  
°C  
A
t , t  
r
V = 5.0 V + 0.5 V  
CC  
ns/V  
f
DEVICE JUNCTION TEMPERATURE VERSUS TIME TO  
0.1% BOND FAILURES  
Junction  
Temperature °C  
FAILURE RATE OF PLASTIC = CERAMIC  
UNTIL INTERMETALLICS OCCUR  
Time, Hours  
Time, Years  
80  
1,032,200  
419,300  
178,700  
79,600  
37,000  
17,800  
8,900  
117.8  
47.9  
20.4  
9.4  
90  
100  
110  
120  
130  
140  
1
4.2  
1
10  
100  
1000  
2.0  
TIME, YEARS  
1.0  
Figure 4. Failure Rate vs. Time Junction Temperature  
http://onsemi.com  
3
 
MC74VHCT157A  
DC CHARACTERISTICS (Voltages Referenced to GND)  
V
T
A
= 25°C  
T
A
85°C  
−55°C T ≤  
A
CC  
125°C  
Symbol  
Parameter  
Condition  
(V)  
Min  
Typ  
Max  
Min  
Max  
Min  
Max Unit  
V
Minimum High−Level Input  
Voltage  
4.5 to  
5.5  
2
2
0.8  
2
V
IH  
V
Maximum Low−Level Input  
Voltage  
4.5 to  
5.5  
0.8  
0.8  
0.8  
V
V
IL  
V
Maximum High−Level Output  
Voltage  
V
= V or V  
= −50 mA  
OH  
IN  
IH  
IL  
IL  
IL  
IL  
I
4.5  
4.5  
4.5  
4.4  
4.5  
0.0  
4.4  
3.8  
4.4  
OH  
V
= V or V  
IN  
IH  
I
= −8 mA  
3.94  
3.66  
OH  
V
Maximum Low−Level Output  
Voltage  
V
= V or V  
V
OL  
IN  
IH  
I
= 50 mA  
0.1  
0.1  
0.1  
OL  
V
= V or V  
IN  
IH  
I
= 8 mA  
4.5  
0 to 5.5  
5.5  
0.36  
0.1  
0.44  
1.0  
0.52  
1.0  
OH  
I
Input Leakage Current  
V
V
= 5.5 V or GND  
mA  
mA  
IN  
IN  
IN  
I
Maximum Quiescent Supply  
Current  
= V or GND  
4.0  
40.0  
40.0  
CC  
CC  
I
Additional Quiescent Supply  
Current (per Pin)  
Any one input:  
= 3.4 V  
All other inputs:  
5.5  
1.35  
0.5  
1.5  
5
1.5  
5
mA  
CCT  
V
IN  
V
= V or GND  
IN  
CC  
I
Output Leakage Current  
V
= 5.5 V  
0
mA  
OPD  
OUT  
AC ELECTRICAL CHARACTERISTICS (Input t = t = 3.0ns)  
r
f
−55°C T  
A
125°C  
T
A
= 25°C  
T = 85°C  
A
Min  
Typ  
Max  
Min  
Max  
Min  
Max  
Symbol  
Parameter  
Test Conditions  
= 3.3 0.3 V C = 15pF  
Unit  
t
t
t
,
Maximum Propagation Delay;  
A to B to Y  
V
V
V
V
V
V
5.6  
8.0  
7.0  
10.0  
1.0  
1.0  
7.7  
11.0  
1.0  
1.0  
7.7  
11.0  
ns  
PLH  
t
CC  
CC  
CC  
CC  
CC  
CC  
L
C = 50pF  
L
PHL  
= 5.0 0.5 V C = 15pF  
4.1  
5.6  
6.4  
8.4  
1.0  
1.0  
7.5  
9.5  
1.0  
1.0  
7.5  
9.5  
L
C = 50pF  
L
,
Maximum Propagation Delay;  
S to Y  
= 3.3 0.3 V C = 15pF  
6.1  
8.5  
7.5  
10.5  
1.0  
1.0  
8.2  
11.5  
1.0  
1.0  
8.2  
11.5  
ns  
ns  
PLH  
L
t
C = 50pF  
L
PHL  
= 5.0 0.5 V C = 15pF  
5.3  
6.8  
8.1  
10.1  
1.0  
1.0  
9.5  
11.5  
1.0  
1.0  
9.5  
11.5  
L
C = 50pF  
L
,
Maximum Propagation Delay;  
E to Y  
= 3.3 0.3 V C = 15pF  
6.1  
8.5  
7.5  
10.5  
1.0  
1.0  
8.2  
11.5  
1.0  
1.0  
8.2  
11.5  
PLH  
L
t
C = 50pF  
L
PHL  
= 5.0 0.5 V C = 15pF  
5.6  
7.1  
8.6  
10.6  
1.0  
1.0  
10.0  
12.0  
1.0  
1.0  
10.0  
12.0  
L
C = 50pF  
L
C
Maximum Input Capacitance  
4
10  
10  
10  
pF  
pF  
IN  
Typical @ 25°C, V = 5.0 V  
CC  
20  
C
PD  
Power Dissipation Capacitance (Note 6)  
6. C is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.  
PD  
Average operating current can be obtained by the equation: I  
power consumption; P = C V  
) = C V f + I . C is used to determine the no−load dynamic  
CC(OPR  
PD CC in CC PD  
2
f + I V  
.
D
PD  
CC  
in  
CC  
CC  
NOISE CHARACTERISTICS (Input t = t = 3.0ns, C = 50pF, V = 5.0 V)  
r
f
L
CC  
T
A
= 25°C  
Typ  
0.3  
Max  
0.8  
Symbol  
Characteristic  
Unit  
V
V
Quiet Output Maximum Dynamic V  
V
OLP  
OL  
Quiet Output Minimum Dynamic V  
− 0.3  
− 0.8  
2.0  
V
V
V
OLV  
OL  
V
Minimum High Level Dynamic Input Voltage  
Maximum Low Level Dynamic Input Voltage  
IHD  
V
0.8  
ILD  
http://onsemi.com  
4
 
MC74VHCT157A  
V
V
CC  
CC  
50%  
50%  
A, B or S  
A, B or S  
GND  
GND  
t
t
PHL  
PHL  
t
t
PLH  
PLH  
50% V  
50% V  
CC  
CC  
Y
Y
Figure 5. Switching Waveform  
Figure 6. Inverting Switching  
TEST POINT  
OUTPUT  
DEVICE  
UNDER  
C *  
L
TEST  
INPUT  
*Includes all probe and jig capacitance  
Figure 7. Test Circuit  
Figure 8. Input Equivalent Circuit  
ORDERING INFORMATION  
Device  
Package  
Shipping  
MC74VHCT157AD  
MC74VHCT157ADG  
SOIC−16  
48 Units / Rail  
48 Units / Rail  
SOIC−16  
(Pb−Free)  
MC74VHCT157ADR2  
MC74VHCT157ADR2G  
SOIC−16  
2500 Tape & Reel  
2500 Tape & Reel  
SOIC−16  
(Pb−Free)  
MC74VHCT157ADT  
MC74VHCT157ADTG  
MC74VHCT157ADTR2  
M74VHCT157ADTR2G  
MC74VHCT157AM  
TSSOP−16*  
TSSOP−16*  
TSSOP−16*  
TSSOP−16*  
SOEIAJ−16  
96 Units / Rail  
96 Units / Rail  
2500 Tape & Reel  
2500 Tape & Reel  
50 Units / Rail  
MC74VHCT157AMG  
SOEIAJ−16  
(Pb−Free)  
50 Units / Rail  
MC74VHCT157AMEL  
MC74VHCT157AMELG  
SOEIAJ−16  
2000 Tape & Reel  
2000 Tape & Reel  
SOEIAJ−16  
(Pb−Free)  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D.  
*This package is inherently Pb−Free.  
http://onsemi.com  
5
MC74VHCT157A  
PACKAGE DIMENSIONS  
SOIC−16  
D SUFFIX  
CASE 751B−05  
ISSUE J  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
−A−  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSIONS A AND B DO NOT INCLUDE  
MOLD PROTRUSION.  
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)  
PER SIDE.  
5. DIMENSION D DOES NOT INCLUDE DAMBAR  
PROTRUSION. ALLOWABLE DAMBAR  
PROTRUSION SHALL BE 0.127 (0.005) TOTAL  
IN EXCESS OF THE D DIMENSION AT  
MAXIMUM MATERIAL CONDITION.  
16  
9
8
−B−  
P 8 PL  
M
S
B
0.25 (0.010)  
1
MILLIMETERS  
INCHES  
MIN  
G
DIM MIN  
MAX  
10.00  
4.00  
1.75  
0.49  
1.25  
MAX  
0.393  
0.157  
0.068  
0.019  
0.049  
A
B
C
D
F
9.80  
3.80  
1.35  
0.35  
0.40  
0.386  
0.150  
0.054  
0.014  
0.016  
F
R X 45  
K
_
G
J
1.27 BSC  
0.050 BSC  
C
0.19  
0.10  
0
0.25  
0.25  
7
0.008  
0.004  
0
0.009  
0.009  
7
−T−  
SEATING  
PLANE  
K
M
P
R
J
M
_
_
_
_
5.80  
0.25  
6.20  
0.50  
0.229  
0.010  
0.244  
0.019  
D
16 PL  
M
S
S
0.25 (0.010)  
T B  
A
TSSOP−16  
DT SUFFIX  
CASE 948F−01  
ISSUE A  
NOTES:  
16X KREF  
1. DIMENSIONING AND TOLERANCING PER  
ANSI Y14.5M, 1982.  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION A DOES NOT INCLUDE MOLD  
FLASH. PROTRUSIONS OR GATE BURRS.  
MOLD FLASH OR GATE BURRS SHALL NOT  
EXCEED 0.15 (0.006) PER SIDE.  
M
S
S
V
0.10 (0.004)  
T U  
S
0.15 (0.006) T U  
K
K1  
4. DIMENSION B DOES NOT INCLUDE  
INTERLEAD FLASH OR PROTRUSION.  
INTERLEAD FLASH OR PROTRUSION SHALL  
NOT EXCEED 0.25 (0.010) PER SIDE.  
5. DIMENSION K DOES NOT INCLUDE  
DAMBAR PROTRUSION. ALLOWABLE  
DAMBAR PROTRUSION SHALL BE 0.08  
(0.003) TOTAL IN EXCESS OF THE K  
DIMENSION AT MAXIMUM MATERIAL  
CONDITION.  
16  
9
2X L/2  
J1  
B
−U−  
SECTION N−N  
L
J
PIN 1  
IDENT.  
6. TERMINAL NUMBERS ARE SHOWN FOR  
REFERENCE ONLY.  
7. DIMENSION A AND B ARE TO BE  
DETERMINED AT DATUM PLANE −W−.  
8
1
N
0.25 (0.010)  
S
0.15 (0.006) T U  
A
MILLIMETERS  
DIM MIN MAX  
INCHES  
MIN MAX  
M
−V−  
A
B
4.90  
4.30  
−−−  
0.05  
0.50  
5.10 0.193 0.200  
4.50 0.169 0.177  
N
C
1.20  
−−− 0.047  
F
D
F
0.15 0.002 0.006  
0.75 0.020 0.030  
G
H
J
J1  
K
K1  
L
0.65 BSC  
0.026 BSC  
DETAIL E  
0.18  
0.09  
0.09  
0.19  
0.19  
0.28 0.007 0.011  
0.20 0.004 0.008  
0.16 0.004 0.006  
0.30 0.007 0.012  
0.25 0.007 0.010  
−W−  
C
6.40 BSC  
0.252 BSC  
M
0
8
0
8
_
_
_
_
0.10 (0.004)  
H
DETAIL E  
SEATING  
−T−  
D
PLANE  
G
http://onsemi.com  
6
MC74VHCT157A  
PACKAGE DIMENSIONS  
SOEIAJ−16  
M SUFFIX  
CASE 966−01  
ISSUE A  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER  
16X KREF  
M
S
S
V
ANSI Y14.5M, 1982.  
0.10 (0.004)  
T U  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION A DOES NOT INCLUDE MOLD  
FLASH. PROTRUSIONS OR GATE BURRS.  
MOLD FLASH OR GATE BURRS SHALL NOT  
EXCEED 0.15 (0.006) PER SIDE.  
S
0.15 (0.006) T U  
K
K1  
4. DIMENSION B DOES NOT INCLUDE  
INTERLEAD FLASH OR PROTRUSION.  
INTERLEAD FLASH OR PROTRUSION SHALL  
NOT EXCEED 0.25 (0.010) PER SIDE.  
5. DIMENSION K DOES NOT INCLUDE  
DAMBAR PROTRUSION. ALLOWABLE  
DAMBAR PROTRUSION SHALL BE 0.08  
(0.003) TOTAL IN EXCESS OF THE K  
DIMENSION AT MAXIMUM MATERIAL  
CONDITION.  
16  
9
2X L/2  
J1  
B
−U−  
SECTION N−N  
L
J
PIN 1  
IDENT.  
6. TERMINAL NUMBERS ARE SHOWN FOR  
REFERENCE ONLY.  
7. DIMENSION A AND B ARE TO BE  
DETERMINED AT DATUM PLANE −W−.  
8
1
N
0.25 (0.010)  
S
0.15 (0.006) T U  
A
MILLIMETERS  
DIM MIN MAX  
INCHES  
MIN MAX  
M
−V−  
A
B
4.90  
4.30  
−−−  
0.05  
0.50  
5.10 0.193 0.200  
4.50 0.169 0.177  
N
C
1.20  
−−− 0.047  
F
D
F
0.15 0.002 0.006  
0.75 0.020 0.030  
G
H
J
J1  
K
K1  
L
0.65 BSC  
0.026 BSC  
DETAIL E  
0.18  
0.09  
0.09  
0.19  
0.19  
0.28 0.007 0.011  
0.20 0.004 0.008  
0.16 0.004 0.006  
0.30 0.007 0.012  
0.25 0.007 0.010  
−W−  
C
6.40 BSC  
0.252 BSC  
M
0
8
0
8
_
_
_
_
0.10 (0.004)  
H
DETAIL E  
SEATING  
PLANE  
−T−  
D
G
ON Semiconductor and  
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MC74VHCT157A/D  

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