SSD30P06-45D [SECOS]

P-Ch Enhancement Mode Power MOSFET; P沟道增强型功率MOSFET
SSD30P06-45D
型号: SSD30P06-45D
厂家: SECOS HALBLEITERTECHNOLOGIE GMBH    SECOS HALBLEITERTECHNOLOGIE GMBH
描述:

P-Ch Enhancement Mode Power MOSFET
P沟道增强型功率MOSFET

文件: 总4页 (文件大小:349K)
中文:  中文翻译
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SSD30P06-45D  
P-Ch Enhancement Mode Power MOSFET  
28A, -60V, RDS(ON) 49mΩ  
Elektronische Bauelemente  
RoHS Compliant Product  
A suffix of “-C” specifies halogen free  
DESCRIPTION  
These miniature surface mount MOSFETs utilize high cell density process.  
Low RDS(on) assures minimal power loss and conserves energy, making this  
device ideal for use in power management circuitry. Typical applications  
are PWMDC-DC converters, power management in portable and battery-powered  
products such as computers, printers, battery charger, telecommunication  
power system, and telephones power system.  
TO-252(D-Pack)  
FEATURES  
Low RDS(on) provides higher efficiency and extends battery life.  
Miniature TO-252 surface mount package saves board space.  
High power and current handling capability.  
A
B
C
D
Extended VGS range (±25) for battery pack applications.  
G E  
PRODUCT SUMMARY  
PRODUCT SUMMARY  
K
J
H F  
N
O
P
ID(A)  
28  
24  
VDS(V)  
-60  
RDS(on) m(  
49@VGS= -10V  
60@VGS= -4.5V  
  
Drain  
M
  
Gate  
Millimeter  
Millimeter  
REF.  
REF.  
Min.  
Max.  
Min.  
Max.  
A
B
C
D
E
F
6.4  
5.20  
2.20  
0.45  
6.8  
6.8  
5.50  
2.40  
0.58  
7.3  
J
K
M
N
O
P
2.30 REF.  
0.70  
0.50  
0.9  
0.90  
1.1  
1.6  
  
Source  
0
0.43  
0.15  
0.58  
2.40  
5.40  
0.8  
3.0  
6.2  
1.20  
G
H
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)  
PARAMETER  
SYMBOL  
VDS  
RATINGS  
UNIT  
Drain-Source Voltage  
-60  
±20  
V
V
Gate-Source Voltage  
VGS  
Continuous Drain Current a  
Pulsed Drain Current b  
ID @TA=25℃  
IDM  
61  
A
±40  
A
Continuous Source Current (Diode Conduction) a  
Total Power Dissipation a  
IS  
-30  
A
PD @TA=25℃  
TJ, TSTG  
50  
W
°C  
Operating Junction and Storage Temperature Range  
-55 ~ 175  
THERMAL RESISTANCE RATINGS  
Maximum Thermal Resistance Junction-Ambient a  
RθJA  
RθJC  
50  
°C / W  
°C / W  
Maximum Thermal Resistance Junction-Case  
3.0  
Notes  
a. Surface Mounted on 1” x 1” FR4 Board.  
b. Pulse width limited by maximum junction temperature.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
16-Aug-2010 Rev.A  
Page 1 of 4  
SSD30P06-45D  
P-Ch Enhancement Mode Power MOSFET  
28A, -60V, RDS(ON) 49mΩ  
Elektronische Bauelemente  
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)  
SYMBO  
PARAMETER  
MIN. TYP. MAX. UNIT TEST CONDITIONS  
Static  
Gate-Threshold Voltage  
Gate-Body Leakage  
VGS(th)  
IGSS  
-1  
-
-
-
±100  
-1  
VDS= VGS, ID = -250 μA  
-
nA VDS = 0V, VGS= ±20V  
-
-
VDS= -48V, VGS= 0V  
μA  
Zero Gate Voltage Drain Current  
On-State Drain Current a  
IDSS  
ID(on)  
-
-
-10  
-
VDS= -48V, VGS=0V, TJ=55°C  
-20  
-
A
VDS = -5V, VGS= -10V  
VGS= -10V, ID= -28A  
VGS= -4.5V, ID= -24A  
VDS= -15V, ID= -28A  
IS= -2.5 A, VGS= 0 V  
-
-
-
-
-
49  
60  
-
Drain-Source On-Resistance a  
RDS(ON)  
mΩ  
-
Forward Transconductance a  
Diode Forward Voltage  
gfs  
8
-
S
V
VSD  
-1.2  
Dynamic b  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
Turn-on Delay Time  
Rise Time  
Qg  
Qgs  
Qgd  
Td(on)  
Tr  
-
-
-
-
-
-
-
18  
5
-
-
-
-
-
-
-
V
DS = -30 V  
nC VGS = -4.5 V  
ID = -28 A  
2
8
VDD= -30 V  
ID= -1 A  
10  
35  
12  
nS VGEN = -10 V  
RL= 30   
Turn-off Delay Time  
Td(off)  
Tf  
RG= 6   
Fall Time  
Notes  
a. Pulse testPulse width 300 μs, duty cycle 2.  
b. Guaranteed by design, not subject to production testing.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
16-Aug-2010 Rev.A  
Page 2 of 4  
SSD30P06-45D  
P-Ch Enhancement Mode Power MOSFET  
28A, -60V, RDS(ON) 49mΩ  
Elektronische Bauelemente  
CHARACTERISTIC CURVE  
15  
12  
9
15  
12  
9
TA = -55oC  
VGS = -10V  
25oC  
-4.5V  
125oC  
6
6
3
3
0
0
1
2
3
4
5
0
1
2
3
4
5
V
GS - Gate-to-Source Voltage (V)  
V
DS - Drain-to-Source Voltage (V)  
Output Characteristics  
Transfer Characteristics  
2400  
2000  
1600  
1200  
800  
400  
0
1.8  
1.6  
1.4  
1.2  
1
Ciss  
Coss  
Crss  
-4.5V  
-10V  
0.8  
0
5
10 15 20 25 30  
0
2
4
6
8
10  
VDS - Drain-to-Source Voltage (V)  
ID - Drain Current (A)  
On-Resistance vs. Drain Current  
Capacitance  
2
-10  
-8  
-6  
-4  
-2  
0
VGS = -10V  
1.8  
1.6  
1.4  
1.2  
1
0.8  
0.6  
0.4  
0
6
12  
18  
24  
30  
36  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
On-Resistance vs. Junction Temperature  
Qg, Charge (nC)  
Gate Charge  
On-Resistance vs. Junction Temperature  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
16-Aug-2010 Rev.A  
Page 3 of 4  
SSD30P06-45D  
P-Ch Enhancement Mode Power MOSFET  
28A, -60V, RDS(ON) 49mΩ  
Elektronische Bauelemente  
CHARACTERISTIC CURVE  
100  
10  
0.4  
0.3  
0.2  
0.1  
0
TA = 125oC  
25oC  
1
0.1  
0.01  
0.001  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
2
4
6
8
10  
VSD - Source-to-Drain Voltage (V)  
VGS - Gate-to-Source Voltage (V)  
Source-Drain Diode Forward Voltage  
On-Resistance vs.Gate-to Source Voltage  
50  
40  
30  
20  
10  
1.9  
ID = -250  
A
μ
1.8  
1.7  
1.6  
1.5  
1.4  
1.3  
1.2  
1.1  
0
-50  
-25  
0
25  
50  
75  
100  
125  
150  
0.001  
0.01  
0.1  
1
10  
100  
1000  
TJ - Temperature (oC)  
Time ( sec)  
Threshold Voltage  
Single Pulse Power  
1
D = 0.5  
RθJA(t) = r(t) + Rθ  
JA  
RθJA = 125oC/W  
0.2  
0.1  
0.1  
0.05  
P(pk)  
TA = P * RθJA(t)  
DutyCycle, D = t1 / t2  
t1  
0.02  
0.01  
t2  
0.01  
SINGLE PULSE  
0.001  
0.001  
0.0001  
0.01  
0.1  
1
10  
100  
1000  
Square Wave Pulse Duration (sec)  
Normalized Thermal Transient Impedance, Junction-to-Ambient  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
16-Aug-2010 Rev.A  
Page 4 of 4  

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