SML20J175 [SEME-LAB]

N-CHANNEL ENHANCEMENT MODE HIGH VOLTAGE POWER MOSFETS; N沟道增强型高压功率MOSFET
SML20J175
型号: SML20J175
厂家: SEME LAB    SEME LAB
描述:

N-CHANNEL ENHANCEMENT MODE HIGH VOLTAGE POWER MOSFETS
N沟道增强型高压功率MOSFET

晶体 晶体管 开关 脉冲 高压 局域网 高电压电源
文件: 总2页 (文件大小:26K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SML20J122  
SOT–227 Package Outline.  
Dimensions in mm (inches)  
1 1.8 (0 .4 6 3 )  
1 2.2 (0 .4 8 0 )  
31 .5 (1 .2 4 0)  
31 .7 (1 .2 4 8)  
N–CHANNEL  
ENHANCEMENT MODE  
HIGH VOLTAGE  
8 .9 (0 .35 0 )  
9 .6 (0 .37 8 )  
7 .8 (0 .3 07 )  
8 .2 (0 .3 22 )  
4 .1 (0 .16 1)  
4 .3 (0 .16 9)  
W
=
Hex Nut M 4  
(4 places)  
4 .8 (0 .18 7)  
4 .9 (0 .19 3)  
(4 places)  
H =  
1
2
3
R
POWER MOSFETS  
4.0 (0 .1 57 )  
4.2 (0 .1 65 )  
0 .7 5 (0.03 0)  
0 .8 5 (0.03 3)  
4
VDSS  
200V  
112A  
3.3 (0.129)  
3.6 (0.143)  
5.1 (0.2 01 )  
5.9 (0.2 32 )  
4.0 (0.157)  
=
(2 Places)  
ID(cont)  
R
14.9 (0.587)  
15.1 (0.594)  
1 .9 5 (0 .07 7 )  
2.1 4 (0 .0 84 )  
3 0 .1 (1 .1 8 5 )  
3 0 .3 (1 .1 9 3 )  
RDS(on) 0.019  
S
D
G
38.0 (1.496)  
38.2 (1.504)  
• Faster Switching  
• Lower Leakage  
• 100% Avalanche Tested  
* Source terminals are shorted  
internally. Current handling  
capability is equal for  
S
either Source terminal.  
• Popular SOT–227 Package  
D
S
StarMOS is a new generation of high voltage  
N–Channel enhancement mode power MOSFETs.  
This new technology minimises the JFET effect,  
increases packing density and reduces the  
on-resistance. StarMOS also achieves faster  
switching speeds through optimised gate layout.  
G
ABSOLUTE MAXIMUM RATINGS (T  
= 25°C unless otherwise stated)  
case  
Drain – Source Voltage  
200  
112  
V
A
A
V
DSS  
Continuous Drain Current  
I
I
D
1
Pulsed Drain Current  
448  
DM  
Gate – Source Voltage  
±30  
V
V
GS  
V
Gate – Source Voltage Transient  
±40  
GSM  
Total Power Dissipation @ T  
Derate Linearly  
= 25°C  
500  
W
case  
P
D
4
W/°C  
Operating and Storage Junction Temperature Range  
Lead Temperature : 0.063” from Case for 10 Sec.  
–55 to 150  
300  
T , T  
J
STG  
°C  
A
T
L
1
Avalanche Current (Repetitive and Non-Repetitive)  
112  
I
AR  
1
Repetitive Avalanche Energy  
30  
E
E
AR  
AS  
mJ  
2
Single Pulse Avalanche Energy  
1300  
1) Repetitive Rating: Pulse Width limited by maximum junction temperature.  
2) Starting T = 25°C, L = 579µH, R = 25, Peak I = 112A  
J
G
L
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.  
E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk  
5/99  
SML20J122  
STATIC ELECTRICAL RATINGS (T  
= 25°C unless otherwise stated)  
case  
Characteristic  
Test Conditions  
Min. Typ. Max. Unit  
BV  
I
Drain – Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
V
V
V
V
V
V
V
V
= 0V , I = 250µA  
200  
V
DSS  
GS  
DS  
DS  
GS  
DS  
DS  
GS  
GS  
D
= V  
50  
DSS  
µA  
DSS  
(V  
= 0V)  
= 0.8V  
, T = 125°C  
500  
GS  
DSS  
C
I
Gate – Source Leakage Current  
Gate Threshold Voltage  
= ±30V , V  
= 0V  
±100 nA  
GSS  
DS  
V
= V  
> I  
, I = 1.0mA  
D
2
4
V
A
GS(TH)  
GS  
x R  
Max  
D(ON)  
DS(ON)  
2
I
On State Drain Current  
112  
D(ON)  
= 10V  
= 10V , I = 0.5 I [Cont.]  
2
R
Drain – Source On State Resistance  
0.019  
DS(ON)  
D
D
DYNAMIC CHARACTERISTICS  
Characteristic  
Test Conditions  
Min. Typ. Max. Unit  
C
C
C
Input Capacitance  
V
V
= 0V  
9700  
iss  
GS  
DS  
Output Capacitance  
= 25V  
2250  
680  
320  
44  
pF  
nC  
oss  
rss  
Reverse Transfer Capacitance  
f = 1MHz  
3
Q
Q
Q
t
Total Gate Charge  
V
V
= 10V  
g
GS  
DD  
Gate – Source Charge  
Gate – Drain (“Miller”) Charge  
Turn–on Delay Time  
Rise Time  
= 0.5 V  
DSS  
gs  
gd  
I = I [Cont.] @ 25°C  
155  
20  
D
D
V
= 15V  
d(on)  
GS  
DD  
t
t
t
V
= 0.5 V  
35  
r
DSS  
ns  
Turn-off Delay Time  
Fall Time  
I = I [Cont.] @ 25°C  
55  
d(off)  
f
D
D
R
= 0.6Ω  
7
G
SOURCE – DRAIN DIODE RATINGS AND CHARACTERISTICS  
Characteristic  
Test Conditions  
Min. Typ. Max. Unit  
I
I
Continuous Source Current (Body Diode)  
1
112  
A
S
Pulsed Source Current  
Diode Forward Voltage  
(Body Diode)  
448  
SM  
2
V
t
V
= 0V , I = – I [Cont.]  
1.3  
V
SD  
GS  
S
D
Reverse Recovery Time  
Reverse Recovery Charge  
I = – I [Cont.] , dl / dt = 100A/µs  
340  
5
ns  
µC  
rr  
S
D
s
Q
I = – I [Cont.] , dl / dt = 100A/µs  
S D s  
rr  
THERMAL CHARACTERISTICS  
Characteristic  
Min. Typ. Max. Unit  
R
R
Junction to Case  
0.25  
°C/W  
40  
θJC  
Junction to Ambient  
θJA  
1) Repetitive Rating: Pulse Width limited by maximum junction temperature.  
2) Pulse Test: Pulse Width < 380µS , Duty Cycle < 2%  
3) See MIL–STD–750 Method 3471  
CAUTION — Electrostatic Sensitive Devices. Anti-Static Procedures Must Be Followed.  
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.  
E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk  
5/99  

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