SSM4565GM [SSC]

COMPLEMENTARY N- AND P-CHANNEL ENHANCEMENT-MODE POWER MOSFETS; 互补N沟道和P沟道增强型功率MOSFET
SSM4565GM
型号: SSM4565GM
厂家: SILICON STANDARD CORP.    SILICON STANDARD CORP.
描述:

COMPLEMENTARY N- AND P-CHANNEL ENHANCEMENT-MODE POWER MOSFETS
互补N沟道和P沟道增强型功率MOSFET

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中文:  中文翻译
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SSM4565M/GM  
COMPLEMENTARY N- AND P-CHANNEL ENHANCEMENT-MODE POWER MOSFETS  
N-CH BVDSS  
RDS(ON)  
ID  
40V  
25mW  
7.6A  
Simple drive requirement  
Lower gate charge  
D2  
D2  
D1  
D1  
Fast switching characteristic  
G2  
S2  
P-CH BVDSS  
RDS(ON)  
ID  
-40V  
G1  
SO-8  
S1  
33mW  
-6.5A  
Description  
Advanced Power MOSFETs from Silicon Standard provide the  
designer with the best combination of fast switching,  
ruggedized device design, low on-resistance and cost-effectiveness.  
D2  
S2  
D1  
S1  
G2  
G1  
The SSM4565M is in the SO-8 package, which is widely preferred for  
commercial and industrial surface mount applications, and is well suited  
for low voltage applications such as DC/DC converters.  
This device is available with Pb-free lead finish (second-level interconnect) as SSM4565GM.  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
Units  
N-channel  
P-channel  
-40  
VDS  
VGS  
Drain-Source Voltage  
40  
±20  
7.6  
6
V
V
Gate-Source Voltage  
±20  
ID @ TA=25°C  
ID @ TA=70°C  
IDM  
Continuous Drain Current3  
Continuous Drain Current3  
Pulsed Drain Current1  
-6.5  
A
-5.2  
A
30  
-30  
A
PD @ TA=25°C  
Total Power Dissipation  
Linear Derating Factor  
2.0  
0.016  
W
W/°C  
°C  
°C  
TSTG  
TJ  
Storage Temperature Range  
Operating Junction Temperature Range  
-55 to 150  
-55 to 150  
Thermal Data  
Symbol  
Parameter  
Value  
62.5  
Unit  
Rthj-a  
Thermal Resistance Junction-ambient3  
Max.  
°C/W  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
1 of 5  
SSM4565M/GM  
N-channel Electrical Characteristics @ Tj=25oC (unless otherwise specified)  
Symbol  
BVDSS  
Parameter  
Test Conditions  
VGS=0V, ID=250uA  
Min. Typ. Max. Units  
Drain-Source Breakdown Voltage  
40  
-
-
-
V
V/°C  
m  
mΩ  
V
BVDSS/Tj  
Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA  
Static Drain-Source On-Resistance2 VGS=10V, ID=7A  
VGS=4.5V, ID=5A  
0.03  
-
RDS(ON)  
-
-
-
25  
32  
3
-
VGS(th)  
gfs  
Gate Threshold Voltage  
VDS=VGS, ID=250uA  
VDS=10V, ID=7A  
1
-
-
Forward Transconductance  
12  
-
S
IDSS  
Drain-Source Leakage Current (T=25oC)  
uA  
uA  
nA  
nC  
nC  
nC  
ns  
VDS=40V, VGS=0V  
VDS=32V, VGS=0V  
VGS=±20V  
ID=7A  
-
-
-
-
-
-
-
-
-
-
-
-
-
-
1
j
Drain-Source Leakage Current (T=70oC)  
-
25  
j
IGSS  
Qg  
±100  
Gate-Source Leakage  
Total Gate Charge2  
Gate-Source Charge  
Gate-Drain ("Miller") Charge  
Turn-on Delay Time2  
Rise Time  
-
17  
4
27  
-
Qgs  
Qgd  
td(on)  
tr  
VDS=32V  
VGS=4.5V  
10  
11  
8
-
VDS=20V  
-
ns  
ID=1A  
-
ns  
td(off)  
tf  
Turn-off Delay Time  
Fall Time  
RG=3.3, VGS=10V  
RD=20Ω  
30  
11  
-
-
ns  
pF  
pF  
pF  
Ciss  
Coss  
Crss  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
VGS=0V  
1400 2240  
VDS=25V  
250  
170  
-
-
f=1.0MHz  
Source-Drain Diode  
Symbol  
Parameter  
Forward On Voltage2  
Reverse Recovery Time2  
Test Conditions  
IS=1.7A, VGS=0V  
IS=7A, VGS=0V  
Min. Typ. Max. Units  
VSD  
trr  
-
-
-
-
1.2  
V
26  
21  
-
-
ns  
nC  
Qrr  
Reverse Recovery Charge  
dI/dt=100A/µs  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
2 of 5  
SSM4565M/GM  
P-channel Electrical Characteristics @ Tj=25oC (unless otherwise specified)  
Symbol  
Parameter  
Test Conditions  
Min. Typ. Max. Units  
BVDSS  
Drain-Source Breakdown Voltage  
VGS=0V, ID=-250uA  
-40  
-
-
-0.03  
-
-
V
V/°C  
m  
mΩ  
V
BVDSS/T j  
Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=-1mA  
Static Drain-Source On-Resistance2 VGS=-10V, ID=-6A  
-
RDS(ON)  
-
33  
VGS=-4.5V, ID=-4A  
-
-
42  
VGS(th)  
gfs  
Gate Threshold Voltage  
VDS=VGS, ID=-250uA  
VDS=-10V, ID=-6A  
VDS=-40V, VGS=0V  
VDS=-32V, VGS=0V  
VGS=±20V  
-1  
-
-
-3  
Forward Transconductance  
10  
-
-
S
Drain-Source Leakage Current (T=25oC)  
IDSS  
uA  
uA  
nA  
nC  
nC  
nC  
ns  
-
-1  
j
Drain-Source Leakage Current (T=70oC)  
-
-
-25  
j
IGSS  
Qg  
Gate-Source Leakage  
Total Gate Charge2  
Gate-Source Charge  
Gate-Drain ("Miller") Charge  
Turn-on Delay Time2  
Rise Time  
-
-
±100  
ID=-6A  
-
20  
4
32  
-
Qgs  
Qgd  
td(on)  
tr  
VDS=-32V  
-
VGS=-4.5V  
-
10  
11  
7
-
VDS=-20V  
-
-
ns  
ID=-1A  
-
-
ns  
td(off)  
tf  
Turn-off Delay Time  
Fall Time  
RG=3.3, VGS=-10V  
RD=20Ω  
-
67  
43  
-
ns  
-
-
pF  
pF  
pF  
Ciss  
Coss  
Crss  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
VGS=0V  
-
1440 2300  
VDS=-25V  
-
250  
190  
-
-
f=1.0MHz  
-
Source-Drain Diode  
Symbol  
Parameter  
Forward On Voltage2  
Reverse Recovery Time2  
Test Conditions  
IS=-1.7A, VGS=0V  
IS=-6A, VGS=0V  
Min. Typ. Max. Units  
VSD  
trr  
-
-
-
-
-1.2  
V
27  
23  
-
-
ns  
nC  
Qrr  
Reverse Recovery Charge  
dI/dt=-100A/µs  
Notes:  
1.Pulse width limited by max. junction temperature.  
2.Pulse width <300us , duty cycle <2%.  
3.Surface mounted on 1 in2 copper pad of FR4 board ; 135°C/W when mounted on min. copper pad.  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
3 of 5  
SSM4565M/GM  
N-channel  
140  
120  
100  
80  
60  
40  
20  
0
T A = 150 o  
C
T A = 25 o C  
120  
100  
80  
60  
40  
20  
0
10V  
10V  
7.0V  
7.0V  
5.0V  
4.5V  
5.0V  
4.5V  
VG =3.0V  
VG =3.0V  
0
1
2
3
4
5
6
0
1
2
3
4
5
6
VDS , Drain-to-Source Voltage (V)  
VDS , Drain-to-Source Voltage (V)  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
27  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
I D = 5 A  
I D = 7 A  
T
A =25 o C  
VG =10V  
23  
19  
15  
-50  
0
50  
100  
150  
3
5
7
9
11  
VGS , Gate-to-Source Voltage (V)  
T j , Junction Temperature ( o C)  
Fig 3. On-Resistance vs. Gate Voltage  
Fig 4. Normalized On-Resistance  
vs. Junction Temperature  
8
1.5  
1.3  
1.1  
0.9  
0.7  
0.5  
6
4
T j =150 o  
C
T j =25 o C  
2
0
-50  
0
50  
100  
150  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
T j , Junction Temperature ( o C)  
VSD , Source-to-Drain Voltage (V)  
Fig 5. Forward Characteristic of  
Reverse Diode  
Fig 6. Gate Threshold Voltage vs.  
Junction Temperature  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
4 of 5  
SSM4565M/GM  
N-channel  
f=1.0MHz  
14  
10000  
1000  
100  
I D =7A  
12  
VDS =32V  
10  
8
C iss  
6
4
C oss  
C rss  
2
0
1
5
9
13  
17  
21  
25  
29  
0
10  
20  
30  
40  
VDS , Drain-to-Source Voltage (V)  
QG , Total Gate Charge (nC)  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
1
100  
Duty factor=0.5  
100us  
0.2  
0.1  
10  
0.1  
1ms  
0.05  
10ms  
1
0.02  
0.01  
100ms  
1s  
PDM  
t
0.01  
Single Pulse  
T
0.1  
T A =25 o C  
Duty factor = t/T  
Peak Tj = PDM x Rthja + Ta  
Rthja =135oC/W  
Single Pulse  
DC  
0.01  
0.001  
0.1  
1
10  
100  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
VDS , Drain-to-Source Voltage (V)  
t , Pulse Width (s)  
Fig 9. Maximum Safe Operating Area  
Fig 10. Effective Transient Thermal Impedance  
VDS  
VG  
90%  
QG  
4.5V  
QGS  
QGD  
10%  
VGS  
tr  
t
d(off)tf  
td(on)  
Charge  
Q
Fig 11. Switching Time Waveform  
Fig 12. Gate Charge Waveform  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
4 of 5  
SSM4565M/GM  
P-channel  
100  
100  
80  
60  
40  
20  
0
T A = 25 o C  
-10V  
T A = 150 o C  
-10V  
80  
60  
40  
20  
0
-7.0V  
-7.0V  
-5.0V  
-4.5V  
-5.0V  
-4.5V  
V G =-3.0V  
V G =-3.0V  
0
1
2
3
4
5
6
7
8
9
0
1
2
3
4
5
6
7
8
9
-V DS , Drain-to-Source Voltage (V)  
-V DS , Drain-to-Source Voltage (V)  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
41  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
I D = - 4 A  
T A =25 o C  
I D = -6 A  
V G =-10V  
37  
33  
29  
25  
-50  
0
50  
100  
150  
3
5
7
9
11  
T j , Junction Temperature ( o C)  
-V GS ,Gate-to-Source Voltage (V)  
Fig 3. On-Resistance vs. Gate Voltage  
Fig 4. Normalized On-Resistance  
vs. Junction Temperature  
6
5
4
3
2.0  
1.5  
1.0  
0.5  
0.0  
T j =150 o C  
T j =25 o C  
2
1
0
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
-50  
0
50  
100  
150  
T j , Junction Temperature ( o C)  
-V SD , Source-to-Drain Voltage (V)  
Fig 5. Forward Characteristic of  
Reverse Diode  
Fig 6. Gate Threshold Voltage vs.  
Junction Temperature  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
5 of 5  
SSM4565M/GM  
P-channel  
f=1.0MHz  
16  
10000  
1000  
100  
I D =-6A  
V
DS =-32V  
12  
C iss  
8
4
C oss  
C rss  
0
1
5
9
13  
17  
21  
25  
29  
0.0  
10.0  
20.0  
30.0  
40.0  
50.0  
-V DS , Drain-to-Source Voltage (V)  
Q G , Total Gate Charge (nC)  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
1
100  
Duty factor=0.5  
0.2  
100us  
1ms  
10  
0.1  
0.1  
0.05  
1
10ms  
100ms  
1s  
0.02  
0.01  
PDM  
0.01  
t
T
Single Pulse  
0.1  
T A =25 o C  
Duty factor = t/T  
Peak Tj = PDM x Rthja + Ta  
Rthja=135oC/W  
Single Pulse  
DC  
0.01  
0.001  
0.0001  
0.1  
1
10  
100  
0.001  
0.01  
0.1  
1
10  
100  
1000  
-V DS , Drain-to-Source Voltage (V)  
t , Pulse Width (s)  
Fig 9. Maximum Safe Operating Area  
Fig 10. Effective Transient Thermal Impedance  
VDS  
VG  
90%  
QG  
-4.5V  
QGS  
QGD  
10%  
VGS  
td(off)  
tr  
td(on)  
tf  
Q
Charge  
Fig 11. Switching Time Waveform  
Fig 12. Gate Charge Waveform  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
4 of 5  
SSM4565M/GM  
Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no  
guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no  
responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its  
use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including  
without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to  
the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of  
Silicon Standard Corporation or any third parties.  
12/10/2004 Rev.2.01  
www.SiliconStandard.com  
5 of 5  

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