EMIF10-COZ01F3 [STMICROELECTRONICS]

EMI FILTER INCLUDING ESD PROTECTION; EMI滤波器,它包括ESD保护
EMIF10-COZ01F3
型号: EMIF10-COZ01F3
厂家: ST    ST
描述:

EMI FILTER INCLUDING ESD PROTECTION
EMI滤波器,它包括ESD保护

LTE
文件: 总7页 (文件大小:119K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
EMIF10-COM01F2  
®
EMI FILTER  
INCLUDING ESD PROTECTION  
IPAD™  
MAIN PRODUCT CHARACTERISTICS  
EMI filtering and ESD protection for:  
Computers and printers  
Communication systems  
Mobile phones  
DESCRIPTION  
The EMIF10-COM01F2 is a highly integrated  
device designed to suppress EMI / RFI noise in all  
systems subjected to electromagnetic interfer-  
ences. The EMIF10 Flip-Chip packaging means  
the package size is equal to the die size.  
Additionally, this filter includes an ESD protection  
circuitry which prevents the protected device from  
destruction when subjected to ESD surges up to  
15 kV.  
Flip-Chip  
(25 Bumps)  
Table 1: Order Code  
Part Number  
Marking  
EMIF010-COM01F2  
FE  
Figure 1: Pin Configuration (Ball side)  
BENEFITS  
C
E
D
B
A
EMI symmetrical (I/O) low-pass filter  
Lead free package  
I5  
I4  
I3  
I2  
I1  
1
2
3
4
5
Very low PCB space consuming: < 6mm2  
Very thin package: 0.65 mm  
I10  
GND  
010  
05  
I9  
GND  
09  
I8  
GND  
08  
I7  
GND  
07  
I6  
GND  
06  
High efficiency in ESD suppression on both  
input & output pins  
High reliability offered by monolithic integration  
04  
03  
02  
01  
COMPLIES WITH THE FOLLOWING STANDARDS:  
IEC61000-4-2 level 4  
15kV (air discharge)  
8kV (contact discharge)  
Figure 2: Basic cell configuration  
Low-pass Filter  
Input  
Output  
RI/O = 200  
Cline = 45 pF  
TM: IPAD is a trademark of STMicroelectronics.  
April 2005  
REV. 2  
1/7  
EMIF10-COM01F2  
Table 2: Absolute Ratings (Tamb = 25°C)  
Symbol  
Parameter and test conditions  
Value  
Unit  
15  
8
ESD discharge IEC61000-4-2, air discharge  
ESD discharge IEC61000-4-2, contact discharge  
VPP  
kV  
Tj  
Junction temperature  
125  
°C  
°C  
°C  
Top  
Tstg  
Operating temperature range  
Storage temperature range  
- 40 to + 85  
- 55 to + 150  
Table 3: Electrical Characteristics (Tamb = 25°C)  
I
Symbol  
Parameter  
Breakdown voltage  
VBR  
IRM  
VRM  
VCL  
Rd  
Leakage current @ VRM  
Stand-off voltage  
VCL VBR VRM  
Clamping voltage  
V
IRM  
IR  
Dynamic impedance  
Peak pulse current  
IPP  
Series resistance between Input &  
Output  
RI/O  
slope :1 / R  
d
IPP  
Cline  
Input capacitance per line  
Symbol  
Test conditions  
Min.  
Typ.  
Max.  
10  
Unit  
V
VBR  
IR = 1 mA  
6
8
IRM  
Rd  
VRM = 3V per line  
500  
nA  
IPP = 10A, tp = 2.5µs  
1
RI/O  
Cline  
tLH  
180  
200  
45  
220  
50  
At 0V bias  
pF  
ns  
Vinput = 2.8V  
Rload = 100k  
25  
2/7  
EMIF10-COM01F2  
Figure 3: S21(db) attenuation measurement  
Figure 4: Analog crosstalk  
0.00  
dB  
EMIF10-COM01F2: Typical S21(dB) measurement on line I10/O10  
0.00  
dB  
-10.00  
-5.00  
-20.00  
-30.00  
-40.00  
-50.00  
-60.00  
-70.00  
-80.00  
-90.00  
-100.00  
-10.00  
-15.00  
-20.00  
-25.00  
-30.00  
-35.00  
-40.00  
-45.00  
-50.00  
1.0M  
3.0M  
10.0M 30.0M  
100.0M 300.0M  
f/Hz  
1.0G  
3.0G  
100.0k  
1.0M  
10.0M  
100.0M  
1.0G  
f/Hz  
Note: Spikes at high frequencies are induced by the PCB layout  
Figure 5: ESD response to IEC61000-4-2  
(+15kV air discharge) on one input V(in) and on  
one output (Vout)  
Figure 6: ESD response to IEC61000-4-2 (-15kV  
air discharge) on one input V(in) and on one  
output (Vout)  
V(in1)  
V(in1)  
V(out1)  
V(out1)  
Figure 7: Rise time measurement  
EMIF10-COM01F2  
In  
Out  
Vout  
Square signal  
Generator Vc = 2.8V  
100k  
Vout  
Vin  
Vin  
3/7  
EMIF10-COM01F2  
Figure 8: Capacitance versus reverse applied  
voltage  
C(pF)  
50  
F=1MHz  
Vosc=30mV  
40  
30  
20  
10  
0
1
2
3
4
5
VR(V)  
Figure 9: Aplac model  
200R  
out  
in  
Demif10 model  
BV = 7  
IBV = 1m  
CJO = 25p  
M = 0.3333  
RS = 1  
MODEL = demif10  
MODEL = demif10  
VJ = 0.6  
TT = 100n  
sub  
PCB grounding recommendations  
In order to ensure a good efficiency in terms of ESD protection and filtering behavior, we recommend to  
implement microvias (100 µm dia.) between the GND bumps and the GND layer. GND bumps can be con-  
nected together in PCB layer 1, and in addition, if possible, use through hole vias (200 µm dia.) in both  
sides of filter to improve contact to GND (layer). This layout will minimize the distance to the ground and  
thus parasitic inductances. In addition, we recommend to have GND plane wherever possible.  
4/7  
EMIF10-COM01F2  
Figure 10: Ordering Information Scheme  
EMIF yy  
-
xxx zz Fx  
EMI Filter  
Number of lines  
Information  
x = resistance value (Ohms)  
z = capacitance value / 10(pF)  
or  
3 letters = application  
2 digits = version  
Package  
F = Flip-Chip  
x
= 1: 500µm, Bump = 315µm  
= 2: Leadfree Pitch = 500µm, Bump = 315µm  
= 3: Leadfree Pitch = 400µm, Bump = 250µm  
Figure 11: FLIP-CHIP Package Mechanical Data  
500ꢀm 50  
650ꢀm 65  
315ꢀm 50  
2.42mm 50ꢀm  
Figure 12: Foot print recommendations  
Figure 13: Marking  
545  
400  
Dot, ST logo  
xx = marking  
z = packaging location  
yww = datecode  
(y = year  
Copper pad Diameter :  
250ꢀm recommended , 300ꢀm max  
ww = week)  
E
Solder stencil opening : 330ꢀm  
x x z  
Solder mask opening recommendation :  
340ꢀm min for 315ꢀm copper pad diameter  
y
w w  
All dimensions in µm  
5/7  
EMIF10-COM01F2  
Figure 14: FLIP-CHIP Tape and Reel Specification  
Dot identifying Pin A1 location  
Ø 1.5 +/- 0.1  
4 +/- 0.1  
ST  
ST  
ST  
0.73 +/- 0.05  
4 +/- 0.1  
User direction of unreeling  
All dimensions in mm  
Table 4: Ordering Information  
Ordering code  
Marking  
Package  
Weight  
Base qty  
5000  
Delivery mode  
EMIF10-COM01F2  
FE  
Flip-Chip  
8.3 mg  
Tape & reel  
Note: More informations are available in the application notes:  
AN1235: “Flip-Chip: Package description and recommendations for use”  
AN1751: "EMI Filters: Recommendations and measurements"  
Table 5: Revision History  
Date  
Revision  
Description of Changes  
14-Dec-2004  
12-Apr-2005  
1
2
First issue.  
Die clearance reduction.  
6/7  
EMIF10-COM01F2  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted  
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject  
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not  
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is a registered trademark of STMicroelectronics.  
All other names are the property of their respective owners  
© 2005 STMicroelectronics - All rights reserved  
STMicroelectronics group of companies  
Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan -  
Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States of America  
www.st.com  
7/7  

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