74ACTQ04FCQR [TI]
ACT SERIES, HEX 1-INPUT INVERT GATE, CDFP14, CERAMIC, FP-14;
| 型号： | 74ACTQ04FCQR |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | ACT SERIES, HEX 1-INPUT INVERT GATE, CDFP14, CERAMIC, FP-14 CD 输入元件 逻辑集成电路 |
| 文件： | 总8页 (文件大小：167K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
March 1993
54ACTQ/74ACTQ04
Quiet Series Hex Inverter
General Description
Features
Y
CC
I
reduced by 50%
The ’ACTQ04 contains six inverters and utilizes NSC Quiet
Series technology to guarantee quiet output switching and
improved dynamic threshold performance. FACT Quiet Ser-
iesTM features GTOTM output control and undershoot cor-
rector in addition to a split ground bus for superior ACMOS
performance.
Y
Guaranteed simultaneous switching noise level and
dynamic threshold performance
Improved latch-up immunity
Y
Y
Y
Y
Y
Minimum 4 kV ESD protection
Outputs source/sink 24 mA
’ACTQ04 has TTL-compatible inputs
Standard Military Drawing (SMD)
Ð ’ACTQ04: 5962-89734
Logic Symbol
Connection Diagrams
Pin Assignment
for DIP, Flatpak and SOIC
Pin Assignment
for LCC
IEEE/IEC
TL/F/10890–1
TL/F/10890–2
TL/F/10890–3
Pin Names
Description
A
n
Inputs
O
n
Outputs
FACTTM, FACT Quiet SeriesTM, and GTOTM are trademarks of National Semiconductor Corporation.
C
1995 National Semiconductor Corporation
TL/F/10890
RRD-B30M75/Printed in U. S. A.
Absolute Maximum Rating (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Recommended Operating
Conditions (Note 2)
Supply Voltage (V
’ACTQ
)
CC
4.5V to 5.5V
b
a
0.5V to 7.0V
Supply Voltage (V
)
CC
Input Voltage (V )
I
0V to V
0V to V
CC
DC Input Diode Current (I
)
IK
Output Voltage (V
)
O
CC
e b
b
a
V
I
V
I
0.5V
a
20 mA
20 mA
Operating Temperature (T )
A
e
V
CC
0.5V
b
b
a
40 C to 85 C
74ACTQ
54ACTQ
§
55 C to 125 C
§
§
b
b
a
0.5V
DC Input Voltage (V )
I
0.5V to V
0.5V to V
CC
a
§
DC Output Diode Current (I
)
OK
Minimum Input Edge Rate (dV/dt)
’ACTQ Devices
e b
b
a
V
V
0.5V
a
20 mA
20 mA
O
O
125 mV/ns
e
V
CC
0.5V
V
V
from 0.8V to 2.0V
@
IN
a
DC Output Voltage (V
DC Output Source
)
O
0.5V
50 mA
50 mA
CC
4.5V, 5.5V
CC
Note 2: All commercial packaging is not recommended for applications re-
b
a
quiring greater than 2000 temperature cycles from 40 C to 125 C.
§
§
g
g
or Sink Current (I
)
O
DC V
or Ground Current
CC
per Output Pin (I or I
CC
)
GND
)
b
a
65 C to 150 C
Storage Temperature (T
§
§
STG
DC Latch-up Source
or Sink Current
g
300 mA
Junction Temperature (T )
J
CDIP
PDIP
175 C
§
140 C
§
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation outside of databook specifications.
DC Characteristics for ’ACTQ Family Devices
74ACTQ
54ACTQ
74ACTQ
e
e
T
A
V
T
CC
A
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
55 C to 125 C
b a
40 C to 85 C
(V)
§
§
§
§
Typ
Guaranteed Limits
e
0.1V
V
V
V
Minimum High Level
Input Voltage
4.5
5.5
1.5
1.5
2.0
2.0
2.0
2.0
2.0
2.0
V
IH
OUT
V
V
V
b
or V
CC
0.1V
e
Maximum Low Level
Input Voltage
4.5
5.5
1.5
1.5
0.8
0.8
0.8
0.8
0.8
0.8
V
OUT
0.1V
IL
b
or V
CC
0.1V
50 mA
or V
Minimum High Level
Output Voltage
4.5
5.5
4.49
5.49
4.4
5.4
4.4
5.4
4.4
5.4
OH
e b
I
OUT
e
*V
IN
V
IL
IH
b
b
4.5
5.5
3.86
4.86
3.70
4.70
3.76
4.76
24 mA
V
V
I
OH
24 mA
e
e
V
OL
Maximum Low Level
Output Voltage
4.5
5.5
0.001
0.001
0.1
0.1
0.1
0.1
0.1
0.1
I
50 mA
OUT
*V
IN
V or V
IL IH
4.5
5.5
0.36
0.36
0.50
0.50
0.44
0.44
24 mA
V
I
OL
24 mA
I
Maximum Input
Leakage Current
IN
e
g
g
g
1.0
5.5
0.1
1.0
mA
V
I
V , GND
CC
*All outputs loaded; thresholds on input associated with output under test.
2
DC Characteristics for ’ACTQ Family Devices (Continued)
74ACTQ
54ACTQ
74ACTQ
e
e
T
A
V
T
CC
A
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
55 C to 125 C
b a
40 C to 85 C
(V)
§
§
§
§
Typ
Guaranteed Limits
e
b
2.1V
I
Maximum
/Input
V
V
CC
CCT
I
5.5
0.6
1.6
50
1.5
75
mA
I
CC
e
²
I
I
I
Minimum Dynamic
5.5
5.5
mA
mA
V
V
V
1.65V Max
e
3.85V Min
OLD
OHD
CC
OLD
Output Current
b
b
50
75
OHD
e
Maximum Quiescent
Supply Current
V
CC
IN
5.5
5.0
5.0
5.0
5.0
2.0
1.5
40.0
20.0
mA
V
or GND (Note 1)
V
V
V
V
Quiet Output Maximum
Figures 2-12,13
(Notes 2, 3)
OLP
OLV
IHD
ILD
1.1
Dynamic V
OL
Quiet Output Minimum
Dynamic V
Figures 2-12,13
(Notes 2, 3)
b
b
1.2
0.6
V
OL
Minimum High Level
1.9
2.2
V
(Notes 2, 4)
(Notes 2, 4)
Dynamic Input Voltage
Maximum Low Level
1.2
0.8
V
Dynamic Input Voltage
²
Maximum test duration 2.0 ms, one output loaded at a time.
@ @
for 54ACTQ 25 C is identical to 74ACTQ 25 C.
§ §
Note 1: I
CC
Note 2: Plastic DIP package.
@
Note 3: Max number of outputs defined as (n). Data inputs are 0V to 3V. One output GND.
b
Note 4: Max number of data inputs (n) switching. (n 1) inputs switching 0V to 3V (’ACTQ). Input-under-test switching: 3V to threshold (V ), 0V to threshold
ILD
e
(V ), f
IHD
1 MHz.
AC Electrical Characteristics
74ACTQ
54ACTQ
e b
74ACTQ
e b
40 C
T
55 C
T
§
to 125 C
§
A
A
e a
A
V *
CC
(V)
T
25 C
§
50 pF
a
e
a
e
Symbol
Parameter
to 85 C
Units
§
50 pF
§
50 pF
e
C
L
C
C
L
L
Min
Typ
Max
Min
Max
Min
Max
t
t
Propagation Delay
Data to Output
PLH
5.0
5.0
5.0
2.0
6.5
6.5
0.5
7.5
1.5
10.0
9.5
2.0
8.0
8.0
1.0
ns
ns
ns
Propagation Delay
Data to Output
PHL
2.0
7.5
1.0
1.5
2.0
t
t
,
Output to Output
OSHL
1.0
Skew**
OSLH
g
*Voltage Range 5.0 is 5.0V 0.5V.
**Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification
applies to any outputs switching in the same direction, either HIGH to LOW (t
) or LOW to HIGH (t
). Parameter guaranteed by design.
OSLH
OSHL
Capacitance
Symbol
Parameter
Typ
Units
Conditions
e
e
C
C
Input Capacitance
4.5
pF
V
OPEN
5.0V
IN
CC
Power Dissipation
Capacitance
V
PD
CC
75
pF
3
6. Set the word generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for AC
devices. Verify levels with a digital volt meter.
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the noise
characteristics of FACT.
V /V
OLP OLV
and V
/V :
OHP OHV
Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50X coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
#
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
Measure V
and V
OLV
on the quiet output during the
and V on the quiet out-
#
#
OLP
HL transition. Measure V
1. Verify Test Fixture Loading: Standard Load 50 pF, 500X.
OHP
put during the LH transition.
OHV
2. Deskew the word generator so that no two channels
have greater than 150 ps skew between them. This re-
quires that the oscilloscope be deskewed first. Swap out
the channels that have more than 150 ps of skew until all
channels being used are within 150 ps. It is important to
deskew the word generator channels before testing. This
will ensure that the outputs switch simultaneously.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
and V
:
IHD
ILD
Monitor one of the switching outputs using a 50X coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
#
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
First increase the input LOW voltage level, V , until the
IL
output begins to oscillate. Oscillation is defined as noise
#
#
#
4. Set V
to 5.0V.
CC
on the output LOW level that exceeds V limits, or on
IL
output HIGH levels that exceed V limits. The input
IH
LOW voltage level at which oscillation occurs is defined
5. Set the word generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and affect the results of the measurement.
as V
.
ILD
Next increase the input HIGH voltage level on the word
generator, V until the output begins to oscillate. Oscilla-
IH
tion is defined as noise on the output LOW level that
exceeds V limits, or on output HIGH levels that exceed
IL
V
limits. The input HIGH voltage level at which oscilla-
.
IH
tion occurs is defined as V
IHD
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
TL/F/10890–4
FIGURE 1. Quiet Output Noise Voltage Waveforms
Note A. V
and V
are measured with respect to ground reference.
OLP
OHV
e
e
Note B. Input pulses have the following characteristics: f
k
150 ps.
1 MHz, t
r
e
3 ns, t
3 ns, skew
f
TL/F/10890–5
FIGURE 2. Simultaneous Switching Test Circuit
4
Ordering Information
The device number is used to form part of a simplified purchasing code where the package type and temperature range are
defined as follows:
74ACTQ 04
P
C
QR
Temperature Range Family
Special Variations
e
e
e
e
74ACTQ
54ACTQ
Commercial TTLÐCompatible
Military TTLÐCompatible
X
QR
Devices shipped in 13 reels
×
Commercial grade device with
burn-in
Device Type
e
QB
Military grade device with
environmental and burn-in
processing shipped in tubes
Package Code
e
e
e
e
e
P
D
F
L
Plastic DIP
Ceramic DIP
Flatpak
Leadless Ceramic Chip Carrier (LCC)
Small Outline (SOIC)
Temperature Range
e
e
b a
C
M
Commercial ( 40 C to 85 C)
§
§
b a
Military ( 55 C to 125 C)
§
§
S
5
Physical Dimensions inches (millimeters)
20-Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
14-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J14A
6
Physical Dimensions inches (millimeters) (Continued)
14-Lead Small Outline Integrated Circuit (S)
NS Package Number M14A
14-Lead Plastic Dual-In-Line Package (P)
NS Package Number N14A
7
Physical Dimensions inches (millimeters) (Continued)
14-Lead Ceramic Flatpak (F)
NS Package Number W14B
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failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
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2. A critical component is any component of a life
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