TPD4S014_1110 [TI]

COMPLETE PROTECTION SOLUTION FOR USB CHARGER PORT INCLUDING ESD PROTECTION FOR ALL LINES AND; 完整保护解决方案,用于USB充电器端口包括ESD保护所有行
TPD4S014_1110
型号: TPD4S014_1110
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

COMPLETE PROTECTION SOLUTION FOR USB CHARGER PORT INCLUDING ESD PROTECTION FOR ALL LINES AND
完整保护解决方案,用于USB充电器端口包括ESD保护所有行

文件: 总17页 (文件大小:2816K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TPD4S014  
www.ti.com  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
COMPLETE PROTECTION SOLUTION FOR USB CHARGER PORT  
INCLUDING ESD PROTECTION FOR ALL LINES AND  
OVER-VOLTAGE PROTECTION ON VBUS  
Check for Samples: TPD4S014  
1
FEATURES  
APPLICATIONS  
Input Voltage Protection at VBUS up to 28V  
Low Ron nFET Switch  
Cell Phones  
eBook  
Supports >2A charging current  
Portable Media Players  
Digital Camera  
Over Voltage and Under Voltage Lock Out  
Features  
Low Capacitance TVS ESD Clamp for USB2.0  
High speed Data Rate  
DSQ PACKAGE  
(TOP SIDE/SEE-THROUGH VIEW)  
Internal 16ms Startup Delay  
VBUS  
10  
1
VBUSOUT  
VBUSOUT  
Integrated Input Enable and Status Output  
Signal  
VBUS  
Thermal Shutdown Feature  
EN  
ACK  
ID  
GND  
D+  
ESD Performance D+/D/ID/VBUS Pins  
±15-kV Contact Discharge (IEC 61000-4-2)  
±15-kV Air Gap Discharge (IEC 61000-4-2)  
5
6
D-  
Space Saving QFN Package (2mm×2mm)  
DESCRIPTION  
The TPD4S014 is a single-chip solution for USB charger port protection. This device offers low capacitance TVS  
type ESD clamps for the D+, D- and standard Capacitance for the ID pin. On the VBUS pin, this device can  
handle over-voltage protection up to 28V. The over voltage lock-out feature ensures that if there is a fault  
condition at the VBUS line, the TPD4S014 is able to isolate the VBUS line and protects the internal circuitry from  
damage. Similarly, the under voltage lock out feature ensures that there is no power drain from the internal VCC  
plane to external VBUS side in case there is short to GND. There is a 16ms turn-on delay after VBUS crosses  
the under voltage lockout threshold, in order to let the voltage stabilize before closing the switch. This function  
acts as a deglitch and prevents unnecessary switching if there is any ringing on the line during connection.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2011, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
TPD4S014  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
www.ti.com  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
CIRCUIT SCHEMATIC DIAGRAM  
V
V
OUT  
BUS  
BUS  
Control Logic  
+
Charge Pump  
ACK  
Internal  
Band Gap  
Reference  
OVLO  
UVLO  
EN  
GND  
D+  
D-  
ID  
DEVICE OPERATION  
OTP  
X
UVLO  
OVLO  
EN  
X
SW  
OFF  
OFF  
OFF  
ON  
ACK  
H
X
L
X
H
L
H
H
L
X
X
L
H
L
L
L
L
L
H
X
X
X
OFF  
H
OTP = Over temperature protection circuit active  
UVLO = Under voltage lock-out circuit active  
OVLO = Over voltage lock-out circuit active  
SW = Load switch  
CP = Charge pump  
X = Dont Care  
H = True  
L = False  
2
Copyright © 2011, Texas Instruments Incorporated  
 
 
TPD4S014  
www.ti.com  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
PIN FUNCTIONS  
PIN  
TYPE  
DESCRIPTION  
NAME  
D–  
NO.  
6
I/O  
I/O  
I/O  
USB data–  
USB data+  
USB ID signal  
D+  
7
ID  
5
Open-Drain Adapter-Voltage Indicator Output. ACOK is driven low after the VIN voltage is stable  
between UVLO and OVLO for 16ms (typ). Connect a pullup resistor from ACOK to the logic I/O  
voltage of the host system.  
ACK  
4
O
I
EN  
3
Enable Active-Low Input. Drive EN low to enable the switch. Drive EN high to disable the switch.  
USB connector VBUS  
VBUS  
9, 10  
USB Input  
Power  
VBUS_O  
UT  
1, 2  
8
Power Output Connect to PCB internal PCB plane  
GND  
Ground  
Connect to PCB ground plane  
Central  
PAD  
Central  
PAD  
Heat Sink  
Electrically disconnected. Use as heat sink. Connect to GND plane via large PCB PAD  
ABSOLUTE MAXIMUM RATINGS(1)(2)  
over operating free-air temperature range (unless otherwise noted)  
VALUE  
MIN  
UNIT  
MAX  
30  
Max Voltage on VBUS  
0.5  
V
A
Continuous current through NFET  
Max Current through D+, D-, ID, VBUS ESD clamps  
Continuous current through logic output  
Maximum junction temperature  
2.6  
-50  
50  
mA  
mA  
°C  
kV  
kV  
kV  
50  
40  
150  
±15  
±15  
±2  
IEC 61000-4-2 Contact Discharge  
IEC 61000-4-2 Air-gap Discharge  
Human-Body Model  
D+, D, ID, VBUS pins  
D+, D, ID, VBUS pins  
EN, ACK, VBUSOUT pins  
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may  
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond  
those specified is not implied.  
(2) The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum.  
THERMAL INFORMATION  
TPD4S014  
THERMAL METRIC(1)  
UNITS  
DSQ (10) PINS  
θJA  
Junction-to-ambient thermal resistance  
70.3  
46.3  
33.8  
2.9  
θJCtop  
θJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
ψJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
ψJB  
33.5  
16.3  
θJCbot  
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.  
Copyright © 2011, Texas Instruments Incorporated  
3
TPD4S014  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
www.ti.com  
ELECTRICAL CHARACTERISTICS, EN, ACK, D+, D, ID Pins  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN TYP MAX UNIT  
VIH  
High-level input voltage EN  
Load current = 50 µA  
Load current = 50 µA  
VI = 3.3 V  
1
V
V
VIL  
Low-level input voltage EN  
0.5  
IL  
Input Leakage Current EN, D+, D, ID  
Low-level output voltage ACK  
1.0 µA  
VOL  
IOL = 2 mA  
0.1  
V
V
VD  
Diode forward Voltage D+, D, ID pins; lower clamp diode  
Differential Capacitance between the D+, Dlines  
Capacitance to GND for the D+, Dlines  
Capacitance to GND for the ID line  
Reverse stand-off voltage of D+, D- and ID pins  
Breakdown voltage D+, D, ID pins  
Breakdown voltage on Vbus  
IO = 8 mA  
0.95  
ΔCIO  
CIO  
0.03  
1.6  
19  
pF  
pF  
pF  
V
CIO-ID  
VRS  
VBR  
VBR VBUS  
RDYN  
5
Ibr = 1 mA  
Ibr = 1 mA  
II = 1 Amps  
6
V
28  
V
Dynamic on resistance D+, D, ID clamps  
1
Ω
ELECTRICAL CHARACTERISTICS OVP CIRCUITS  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN TYP MAX UNIT  
INPUT UNDERVOLTAGE LOCKOUT  
Under-voltage lock-out, input power  
detected threshold rising  
VUVLO+  
VBUS increasing from 0V to 5V, No load on OUT pin 2.65  
VBUS decreasing from 5V to 0V, No load on OUT  
2.8  
3
V
Under-voltage lock-out, input power  
detected threshold falling  
VUVLO  
2.25 2.44  
2.7  
V
pin  
VHYS-UVLO  
Hysteresis on UVLO  
Δ of VUVLO+ and VUVLO–  
150 360 550  
mV  
INPUT TO OUTPUT CHARACTERISTICS  
RDS-  
VBUSSWITCH  
VBUS switch resistance  
VBUS = 5 V, IOUT = 500 mA  
151 200 mΩ  
tON  
Turn-ON time  
Turn-OFF time  
RL = 36 , CL = 10 uF  
RL = 36 , CL = 10 uF  
16 17.4  
18  
8
ms  
tOFF  
µs  
INPUT OVERVOLTAGE PROTECTION (OVP)  
Input overvoltage protection  
threshold  
VOVP+  
VBUS  
VBUS increasing from 5 V to 7 V, No Load  
5.55 6.15 6.45  
5.75 5.98 6.24  
V
V
Input overvoltage protection  
threshold falling  
VOVP-  
VBUS  
VBUS  
VBUS decreasing from 7V to 5V, No Load  
VBUS decreasing from 7 V to 5 V, No Load  
VHYS-OVP  
td(OVP)  
Hysteresis on OVP  
25 100 275  
11  
mV  
Max Overvoltage delay  
µs  
Recovery time from input  
overvoltage condition  
tREC  
VBUS  
Time measured from VBUS 8 V 6 V, 1-µs fall-time  
8
9
ms  
SUPPLY CURRENT CONSUMPTION  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
TYP  
MAX  
UNIT  
IVBUS  
VBUS Operating Current  
Consumption  
No load on VBUS_OUT pin, VBUS = 5 V, EN = 0  
V
147.6  
160  
µA  
IVBUS_OFF  
VBUS Operating Current  
Consumption  
No load on VBUS_OUT pin, VBUS = 5 V, EN = 5  
V
111.8  
120  
µA  
THERMAL SHUTDOWN FEATURE  
TSHDN  
Thermal Shutdown  
144  
23  
°C  
°C  
TSHDN-HYS  
Thermal-Shutdown Hysteresis  
4
Copyright © 2011, Texas Instruments Incorporated  
TPD4S014  
www.ti.com  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
GENERAL OPERATION  
The TPD4S014 provides a single-chip protection solution for USB charger interfaces. The VBUS line is tolerant  
upto 28 V. A Low RDS(on) nFET switch is used to disconnect the downstream circuits in case of a fault condition.  
At power-up, when the voltage on VBUS is rising, the switch will close 16 ms after the input crosses the  
undervoltage threshold, thereby making power available to the downstream circuits. The TPD4S014 also has an  
ACK output, which deasserts to alert the system that a fault has occurred. The TPD4S014 offers 4 channel ESD  
clamps for D+, D-, ID, and VBUS pins that provide IEC61000-4-2 level 4 ESD protection. This eliminates the  
need for external TVS clamp circuits in the application.  
The TPD4S014 has an internal oscillator and charge pump that controls the turn-on of the internal nFET switch.  
The internal oscillator controls the timers that enable the turn-on of the charge pump and sets the state of the  
open-drain ACK output. If VBUS < VUVLO or if VBUS > VOVLO, the internal oscillator remains off, thus disabling the  
charge pump. The charge-pump at startup, after a 16ms internal delay, turns on the internal nFET switch and  
asserts ACK. At any time, if VBUS drops below VUVLO or rises above VOVLO, ACK is released and the nFET switch  
is disabled.  
When the input voltage rises above VOVP, or drops below the VUVLO, the internal VBUS switch is turned off,  
removing power to the application. The ACK signal is asserted when a fault condition is detected. If the fault was  
an over voltage event, the VBUS FET switch turns on 8ms after input voltage returns below VOVP VHYS-OVP and  
remains above VUVLO. If the fault was an under voltage event, the switch turns on 16ms after the voltage  
returns above VUVLO+ (similar to start up). When the switch turns on, the ACK is asserted once again.  
A 16ms deglitch time has been introduced in to the turn on sequence to ensure that the input supply has  
stabilized before turning the switch ON. Noise on the Vbus line, could turn on the switch when the fault condition  
is still active. To avoid this, OVP glitch immunity allows noise on the VBUS line to be rejected. Such a glitch  
protection circuitry is also introduced in the turn off sequence in order to prevent the switch from turning off for  
voltage transients. The glitch protection circuitry integrates the glitch over time, allowing the OVP circuitry to  
trigger faster for larger voltage excursions above the OVP threshold and slower for shorter excursions. The  
protection circuitry has a maximum delay of 8 µs.  
When the device is ON, current flowing through the device will cause the device to heat up. Over heating can  
lead to permanent damage to the device. To prevent this, an over temperature protection has been designed into  
the device. Whenever the junction temperature exceeds 145 °C, the switch will turn off, thereby limiting the  
temperature. The ACK signal will be asserted for an over temperature event. Once the device cools down to  
below 120 °C the ACK signal will be deasserted, and the switch will turn on if the EN is active and the VBUS  
voltage is within the UVLO and OVP thresholds. While the over temperature protection in the device will not  
kick-in unless the die temperature reaches 145 °C, It is generally recommended that care is taken to keep the  
junction temperature below 125 °C. Operation of the device above 125 °C for extended periods of time can affect  
the long-term reliability of the part.  
The junction temperature of the device can be calculated using below formula:  
Tj = Ta + P qJA  
D
(1)  
Tj  
=
=
=
=
Junction temperature  
Ambient temperature  
Thermal resistance  
Ta  
θJA  
PD  
Power Dissipated in device  
P = I2Ron  
D
(2)  
I
=
=
Current through device  
Max on resistance of device  
RON  
Copyright © 2011, Texas Instruments Incorporated  
5
TPD4S014  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
www.ti.com  
Example  
At 2A continuous current power dissipation is given by:  
P = 22 ´0.2 = 0.8W  
D
If the ambient temperature is about 60oC the junction temperature will be:  
T = 60 + 0.8´70.3 = 116.24  
( )  
j
This Implies that, at an ambient temperature of 60° Celcuis that TPD4S014 can pass a continuous of 2A with no  
problem. Conversely, the above calculation can also be used to calculate the total continuous current the  
TPD4S014 can handle at any given temperature.  
APPLICATION DIAGRAM  
1.8 V - 3.3 V (from System V  
10KΩ  
OUT)  
BUS  
To Processor  
ACK  
EN  
Battery  
Charger  
TPD4S014  
From Processor  
VBUS  
D+  
V
OUT  
BUS  
10 µF  
10 µF  
D-  
ID  
Vbus  
D+  
USB  
Transceiver  
D-  
ID  
Figure 1. tandard Implementation for Non-OTG USB System  
1.8 V - 3.3 V (from System V  
OUT)  
To OTG power supply (5 V)  
BUS  
10kΩ  
Current  
Limit Switch  
To Processor  
ACK  
EN  
Battery  
Charger  
TPD4S014  
V
From Processor  
OUT  
VBUS  
D+  
BUS  
10 µF  
10 µF  
D-  
ID  
Vbus  
D+  
USB  
Transceiver  
D-  
ID  
It is recommended the CVBUS >= CVBUS_OUT. This is necessary to ensure that the VBUS voltage doesnt drop below  
the UVLO threshold when the device turns on at start up.  
Figure 2. Implementation for System With OTG System Support  
6
Copyright © 2011, Texas Instruments Incorporated  
 
TPD4S014  
www.ti.com  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
TYPICAL CHARACTERISTICS  
Figure 3. IEC61000-4-2 -8kV Contact Waveform  
Figure 4. IEC61000-4-2 +8kV Contact Waveform  
Figure 5. Capacitance Variation With Voltage  
Figure 6. Variation of On Resistance with Ambient  
Temperature  
Figure 7. Max Pulse Current Through Switch vs  
Pulse Duration  
Figure 8. UVLO Threshold Variation With  
Temperature  
Copyright © 2011, Texas Instruments Incorporated  
7
TPD4S014  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
www.ti.com  
Figure 9. OVP Threshold Variation With  
Temperature  
Figure 10. Start Up Inrush Current Characteristics  
Figure 11. Device Turn on Characteristics  
Figure 12. Device Turn OFF Characteristics  
(Undervoltage)  
Figure 13. Device Turn OFF Characteristics (Overvoltage)  
8
Copyright © 2011, Texas Instruments Incorporated  
 
TPD4S014  
www.ti.com  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
Figure 14. Eye Diagram With No EVM And No IC,  
Full USB2.0 Speed At 480Mbps  
Figure 15. Eye Diagram With EVM, No IC, Full  
USB2.0 Speed At 480Mbps  
Figure 16. Eye Diagram With EVM and IC, Full USB2.0 Speed At 480Mbps  
Copyright © 2011, Texas Instruments Incorporated  
9
TPD4S014  
SLVSAU0B MAY 2011REVISED OCTOBER 2011  
www.ti.com  
REVISION HISTORY  
Changes from Revision A (June 2011) to Revision B  
Page  
Changed name of VCC to VBUSOUT throughout the entire document. .................................................................................. 2  
Deleted row from Device Operation table. ............................................................................................................................ 2  
Added additional application diagram. .................................................................................................................................. 6  
Added Eye Diagrams to Typical Characteristics section. ..................................................................................................... 8  
10  
Copyright © 2011, Texas Instruments Incorporated  
PACKAGE OPTION ADDENDUM  
www.ti.com  
30-Jul-2011  
PACKAGING INFORMATION  
Status (1)  
Eco Plan (2)  
MSL Peak Temp (3)  
Samples  
Orderable Device  
Package Type Package  
Drawing  
Pins  
Package Qty  
Lead/  
Ball Finish  
(Requires Login)  
TPD4S014DSQR  
ACTIVE  
SON  
DSQ  
10  
3000  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU Level-2-260C-1 YEAR  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Oct-2011  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TPD4S014DSQR  
SON  
DSQ  
10  
3000  
179.0  
8.4  
2.2  
2.2  
1.2  
4.0  
8.0  
Q2  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Oct-2011  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SON DSQ 10  
SPQ  
Length (mm) Width (mm) Height (mm)  
195.0 200.0 45.0  
TPD4S014DSQR  
3000  
Pack Materials-Page 2  
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