GT50J122 [TOSHIBA]

Current Resonance Inverter Switching Application; 电流谐振逆变器开关的应用
GT50J122
型号: GT50J122
厂家: TOSHIBA    TOSHIBA
描述:

Current Resonance Inverter Switching Application
电流谐振逆变器开关的应用

晶体 开关 晶体管 功率控制 双极性晶体管 栅 局域网
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GT50J122  
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT  
GT50J122  
Current Resonance Inverter Switching Application  
Unit: mm  
Enhancement mode type  
High speed : t = 0.16 μs (typ.) (I = 60A)  
f
C
Low saturation voltage: V  
Fourth-generation IGBT  
= 1.9 V (typ.) (I = 60A)  
C
CE (sat)  
TO-3P(N) (Toshiba package name)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-emitter voltage  
Gate-emitter voltage  
V
V
600  
±25  
V
V
CES  
GES  
@ Tc = 100°C  
31  
Continuous collector  
current  
I
A
A
C
@ Tc = 25°C  
50  
Pulsed collector current  
I
120  
CP  
@ Tc = 100°C  
@ Tc = 25°C  
62  
Collector power  
dissipation  
P
W
C
JEDEC  
156  
JEITA  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55 to 150  
TOSHIBA  
2-16C1C  
Weight: 4.6 g (typ.)  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
Thermal Characteristics  
Characteristics  
Thermal resistance  
Symbol  
Max  
0.80  
Unit  
R
°C/W  
th (j-c)  
Marking  
TOSHIBA  
GT50J122  
Part No. (or abbreviation code)  
Lot No.  
A line indicates  
lead (Pb)-free package or  
lead (Pb)-free finish.  
1
2006-11-01  
GT50J122  
Electrical Characteristics (Ta = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
I
V
V
= ±25 V, V = 0  
3.0  
±500  
1.0  
6.0  
2.5  
nA  
mA  
V
GES  
GE  
CE  
CE  
Collector cut-off current  
Gate-emitter cut-off voltage  
Collector-emitter saturation voltage  
Input capacitance  
I
= 600 V, V  
= 0  
CES  
GE  
V
I
I
= 60 mA, V  
= 5 V  
GE (OFF)  
C
C
CE  
V
= 60 A, V  
= 15 V  
1.9  
V
CE (sat)  
GE  
= 10 V, V = 0, f = 1 MHz  
GE  
C
V
4800  
0.17  
0.23  
0.16  
0.41  
pF  
ies  
CE  
t
Resistive Load  
Rise time  
r
V
V
= 300 V, I = 60 A  
C
Turn-on time  
Switching time  
t
CC  
GG  
on  
μs  
= ±15 V, R = 30 Ω  
Fall time  
t
f
0.26  
G
(Note 1)  
Turn-off time  
t
off  
Note 1: Switching time measurement circuit and input/output waveforms  
V
GE  
90%  
10%  
0
0
R
G
R
L
I
C
0
90%  
90%  
V
CC  
10%  
10%  
V
CE  
t
d (off)  
t
f
t
r
t
t
on  
off  
2
2006-11-01  
GT50J122  
I
– V  
I – V  
C CE  
C
CE  
120  
100  
80  
60  
40  
20  
0
120  
100  
80  
60  
40  
20  
0
Common emitter  
Common emitter  
Tc = −40°C  
Tc = 25°C  
15  
10  
8
15  
10  
8
20  
20  
7
7
V
= 6 V  
GE  
4
V
= 6 V  
GE  
4
0
1
2
3
5
0
1
2
3
5
Collector-emitter voltage  
V
(V)  
Collector-emitter voltage  
V
(V)  
CE  
CE  
I
– V  
I – V  
C GE  
C
CE  
120  
100  
80  
60  
40  
20  
0
120  
100  
80  
60  
40  
20  
0
Common emitter  
10  
Common emitter  
Tc = 125°C  
V
= 5 V  
CE  
20  
8
15  
7
V
= 6 V  
GE  
25  
40  
Tc = 125°C  
0
1
2
3
4
5
0
2
4
6
8
10  
Gate-emitter voltage  
V
(V)  
GE  
Collector-emitter voltage  
V
(V)  
CE  
V
Tc  
CE (sat)  
3.2  
2.4  
1.6  
0.8  
0.0  
I
= 120 A  
C
80  
60  
30  
10  
Common emitter  
V
= 15 V  
GE  
60  
20  
20  
60  
100  
140  
Case temperature Tc (°C)  
3
2006-11-01  
GT50J122  
V
V
– Q  
C – V  
CE  
CE, GE  
G
400  
300  
200  
100  
0
20  
15  
10  
5
30000  
10000  
Common emitter  
= 5 Ω  
Tc = 25°C  
R
L
C
ies  
5000  
3000  
1000  
500  
300  
C
oes  
V
= 300 V  
CE  
100  
C
res  
Common emitter  
= 0  
f = 1 MHz  
Tc = 25°C  
50  
30  
100  
V
GE  
200  
10  
0.0  
0
320  
1
10  
100  
1000  
0
80  
160  
240  
Collector-emitter voltage  
V
(V)  
CE  
Gate charge  
Q
G
(nC)  
Switching Time – R  
Switching Time – I  
G
C
5
3
10  
Common emitter  
Common emitter  
V
= 300 V  
5
3
CC  
V
= 300 V  
= 30 Ω  
CC  
I
= 60 A  
C
R
t
t
G
off  
on  
V
= ±15 V  
GG  
V
= ±15 V  
GG  
1
Tc = 25°C  
Tc = 25°C  
1
t
r
0.5  
0.3  
t
f
0.5  
0.3  
t
off  
t
f
0.1  
0.1  
t
on  
0.05  
0.03  
0.05  
0.03  
t
r
0.01  
0.01  
0
10  
100  
1000  
0
10  
20  
30  
40  
50  
60  
70  
Gate resistance  
R
G
()  
Collector current  
I
C
(A)  
Safe Operating Area  
Reverse Bias SOA  
1000  
3000  
1000  
*: Single non-repetitive  
pulse Tc = 25°C  
T 125°C  
j
I
max  
C
(continuous)  
V
= 20 V  
= 10 Ω  
GG  
Curves must be derated  
linearly with increases in  
temperature.  
300  
100  
R
G
500  
300  
I
max (pulsed) *  
C
100  
10 μs*  
30  
10  
50  
30  
100 μs*  
10 ms*  
10  
1 ms*  
5
3
3
1
DC operation  
10  
1
1
1
100  
1000  
CE  
10000  
10  
100  
1000  
10000  
Collector-emitter voltage  
V
(V)  
Collector-emitter voltage  
V
(V)  
CE  
4
2006-11-01  
GT50J122  
I max Tc  
C
r
– t  
th (t)  
w
60  
50  
40  
30  
20  
10  
0
102  
101  
100  
Tc = 25°C  
Common  
emitter  
V
= 15 V  
GE  
1
10−  
2
10−  
3
10−  
100  
101  
102  
5
4
3
2
1
25  
50  
75  
100  
125  
150  
10−  
10−  
10−  
10−  
10−  
Case temperature Tc (°C)  
Pulse width  
t
(s)  
w
5
2006-11-01  
GT50J122  
RESTRICTIONS ON PRODUCT USE  
20070701-EN  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patents or other rights of  
TOSHIBA or the third parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
6
2006-11-01  

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