GT50J123 [TOSHIBA]
Insulated Gate Bipolar Transistor;型号: | GT50J123 |
厂家: | TOSHIBA |
描述: | Insulated Gate Bipolar Transistor 栅 |
文件: | 总10页 (文件大小:214K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
GT50J123
Discrete IGBTs Silicon N-Channel IGBT
GT50J123
1. Applications
•
•
•
Hard Switching
High-Speed Switching
Power Factor Correction (PFC)
2. Features
(1) Sixth generation
(2) Low saturation voltage: VCE(sat) = 1.9 V (typ.) (IC = 50 A, Ta = 25 )
(3) High junction temperature: Tj = 175 (max)
3. Packaging and Internal Circuit
1: Gate
2: Collector (heatsink)
3: Emitter
TO-3P(N)
Start of commercial production
2018-10
©2018
2018-11-15
Rev.1.0
1
Toshiba Electronic Devices & Storage Corporation
GT50J123
4. Absolute Maximum Ratings (Note) (Ta = 25, unless otherwise specified)
Characteristics
Symbol
Rating
Unit
V
Collector-emitter voltage
Gate-emitter voltage
Collector current (DC)
Collector current (DC)
Collector current (1 ms)
VCES
VGES
IC
600
±25
59
(Tc = 25)
A
(Tc = 100)
IC
33
ICP
120
Short circuit withstand time
Collector power dissipation
Junction temperature
Storage temperature
Mounting torque
(Note 1)
(Note 2)
tsc
PC
5
µs
W
(Tc = 25)
230
175
Tj
Tstg
TOR
-55 to 175
0.8
Nm
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
In general, loss of IGBT increases more when it has positive temperature coefficient and gets higher
temperature.
In case that the temperature rise due to loss of IGBT exceeds the heat release capacity of a device, it leads
to thermorunaway and results in destruction.
Therefore, please design heat release of a device with due consideration to the temperature rise of IGBT.
Note 1: VCC = 300 V, VGG = +15 V/0 V, RG = 24 Ω, Tj ≤ 150
Note 2: Ensure that the junction temperature does not exceed 175 .
5. Thermal Characteristics
Characteristics
Junction-to-case thermal resistance
Symbol
Max
0.65
Unit
Rth(j-c)
/W
6. Electrical Characteristics
6.1. Static Characteristics (Ta = 25, unless otherwise specified)
Characteristics
Gate leakage current
Symbol
Test Condition
Min
Typ.
Max
Unit
IGES
ICES
VGE = ±25 V, VCE = 0 V
±100
100
6.5
nA
µA
V
Collector cut-off current
VCE = 600 V, VGE = 0 V
Gate-emitter cut-off voltage
VGE(OFF) IC = 3 mA, VCE = 5 V
4.5
5.5
1.9
2.5
Collector-emitter saturation voltage
Collector-emitter saturation voltage
VCE(sat) IC = 50 A, VGE = 15 V, Tc = 25
VCE(sat) IC = 50 A, VGE = 15 V, Tc = 150
2.5
©2018
Toshiba Electronic Devices & Storage Corporation
2018-11-15
Rev.1.0
2
GT50J123
6.2. Dynamic Characteristics (Ta = 25, unless otherwise specified)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Input capacitance
Cies
VCE = 10 V, VGE = 0 V, f = 100 kHz
2900
0.08
0.06
0.2
pF
Switching time (turn-on delay time)
Switching time (rise time)
td(on) Inductive load
µs
VCC = 300 V, IC = 30 A,
VGG = +15 V/0 V, RG = 24 Ω
Tc = 25,
tr
ton
Switching time (turn-on time)
See Fig. 6.2.1, 6.2.2, 6.2.3
Switching time (turn-off delay time)
Switching time (fall time)
td(off)
tf
0.28
0.04
0.38
0.8
Switching time (turn-off time)
toff
Switching loss (turn-on switching loss)
Switching loss (turn-off switching loss)
Switching time (turn-on delay time)
Switching time (rise time)
Eon
Eoff
mJ
0.6
td(on) Inductive load
0.08
0.08
0.25
0.3
µs
VCC = 300 V, IC = 30 A,
VGG = +15 V/0 V, RG = 24 Ω
Tc = 150,
tr
ton
Switching time (turn-on time)
See Fig. 6.2.1, 6.2.2, 6.2.3
Switching time (turn-off delay time)
Switching time (fall time)
td(off)
tf
0.06
0.4
Switching time (turn-off time)
toff
Switching loss (turn-on switching loss)
Switching loss (turn-off switching loss)
Eon
Eoff
1.2
mJ
0.8
Fig. 6.2.1 Test Circuit of Switching Time
Fig. 6.2.2 Timing Chart of Switching Time
Fig. 6.2.3 Timing Chart of Switching Loss
©2018
Toshiba Electronic Devices & Storage Corporation
2018-11-15
Rev.1.0
3
GT50J123
7. Marking (Note)
Fig. 7.1 Marking
Note: A line under a Lot No. identifies the indication of product Labels.
[[G]]/RoHS COMPATIBLE or [[G]]/RoHS [[Pb]]
Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS
compatibility of Product.
The RoHS is the Directive 2011/65/EU of the European Parliament and of the Council of 8 June 2011 on the
restriction of the use of certain hazardous substances in electrical and electronic equipment.
Note: This transistor is sensitive to electrostatic discharge and should be handled with care.
©2018
Toshiba Electronic Devices & Storage Corporation
2018-11-15
Rev.1.0
4
GT50J123
8. Characteristics Curves (Note)
Fig. 8.1 IC - VCE
Fig. 8.3 IC - VCE
Fig. 8.5 VCE - VGE
Fig. 8.2 IC - VCE
Fig. 8.4 IC - VCE
Fig. 8.6 VCE - VGE
©2018
2018-11-15
Rev.1.0
5
Toshiba Electronic Devices & Storage Corporation
GT50J123
Fig. 8.7 VCE - VGE
Fig. 8.9 VCE(sat) - Tc
Fig. 8.11 ton, tr, td(on) - IC
Fig. 8.8 VCE - VGE
Fig. 8.10 ton, tr, td(on) - RG
Fig. 8.12 toff, tf, td(off) - RG
©2018
Toshiba Electronic Devices & Storage Corporation
2018-11-15
Rev.1.0
6
GT50J123
Fig. 8.13 toff, tf, td(off) - IC
Fig. 8.14 Eon, Eoff - RG
Fig. 8.15 Eon, Eoff - IC
Fig. 8.16 VCE, VGE - Qg
Fig. 8.17 Safe Operating Area
(Guaranteed Maximum)
Fig. 8.18 Reverse Bias SOA
(Guaranteed Maximum)
©2018
Toshiba Electronic Devices & Storage Corporation
2018-11-15
Rev.1.0
7
GT50J123
Fig. 8.19 rth(j-c) - tw
(Guaranteed Maximum)
Note: The above characteristics curves are presented for reference only and not guaranteed by production test,
unless otherwise noted.
©2018
Toshiba Electronic Devices & Storage Corporation
2018-11-15
Rev.1.0
8
GT50J123
Package Dimensions
Unit: mm
Weight: 4.6 g (typ.)
Package Name(s)
TOSHIBA: 2-16C1S
Nickname: TO-3P(N)
©2018
Toshiba Electronic Devices & Storage Corporation
2018-11-15
Rev.1.0
9
GT50J123
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information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the
precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application
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including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating
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EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY
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Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances,
including without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES OCCURRING
AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.
https://toshiba.semicon-storage.com/
©2018
2018-11-15
Rev.1.0
10
Toshiba Electronic Devices & Storage Corporation
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