AD53509 [ADI]

High-Performance Driver/Comparator Active Load on a Single Chip; 高性能驱动器/在一个芯片上比较器有源负载
AD53509
型号: AD53509
厂家: ADI    ADI
描述:

High-Performance Driver/Comparator Active Load on a Single Chip
高性能驱动器/在一个芯片上比较器有源负载

驱动器 比较器
文件: 总8页 (文件大小:110K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
High-Performance Driver/Comparator  
Active Load on a Single Chip  
a
AD53509  
FEATURES  
FUNCTIONAL BLOCK DIAGRAM  
250 MHz Operation  
Driver/Comparator and Active Load Included  
On-Chip Schottky Diode Bridge  
52-Lead LQFP Package with Built-In Heat Sink  
V
V
V
V
V
V
V
V
CC  
34  
CC  
CC  
51  
CC  
52  
EE  
39  
EE  
40  
EE EE  
41 32  
39nF  
CHDCPL  
VH 47  
VTERM 45  
DATA 37  
AD53509  
APPLICATIONS  
Automatic Test Equipment  
Semiconductor Test Systems  
Board Test Systems  
VHDCPL  
38  
43  
42  
DATA  
39nF  
CLDCPL  
46ꢀ  
IOD  
DRIVER  
V
OUT  
IOD  
Instrumentation and Characterization Equipment  
VLDCPL  
RLD 49  
50  
RLD  
31  
V
L
HCOMP  
LEH  
LEH  
PRODUCT DESCRIPTION  
QH  
The AD53509 is a single chip that performs the pin electronics  
functions of driver, comparator and active load in ATE VLSI  
and memory testers. In addition, a Schottky diode bridge for the  
active load and a VCOM buffer are included internally.  
QH  
COMPARATOR  
QL  
QL  
The driver is a proprietary design that features three active  
states: Data High Mode, Data Low Mode and Term Mode as  
well as an Inhibit State. This facilitates the implementation of  
high speed active termination. The output voltage range is –2 V  
to +7 V to accommodate a wide variety of test devices. The  
output leakage is typically less than 250 nA over the entire sig-  
nal range.  
LEL  
LEL  
LCOMP  
ACTIVE LOAD  
VCOMI  
IOLC  
+1  
VCOMS  
OUT_L  
V/I  
IOLRTN  
The dual comparator, with an input range equal to the driver  
output range, features built-in latches and ECL-compatible  
outputs. The outputs are capable of driving 50 signal lines  
terminated to –2 V. Signal tracking capability is upwards of  
5 V/ns.  
IOHRTN  
INHL 36  
35  
INHL  
THERM  
1.0A/K  
IOHC  
V/I  
14, 26  
NC  
The active load can be set for up to 40 mA load current with  
9,33,44,46,48  
PWRGND  
2,5,8  
less than a 10 µA linearity error through the entire set range.  
VCCO  
HQGND2  
HQGND  
I
OH, IOL and the buffered VCOM are independently adjustable.  
On-board Schottky diodes provide high speed switching and low  
capacitance.  
NC = NO CONNECT  
Also included on the chip is an on-board temperature sensor  
whose purpose is to give an indication of the surface tempera-  
ture of the DCL. This information can be used to measure θJC  
and θJA or flag an alarm if proper cooling is lost. Output from  
the sensor is a current sink that is proportional to absolute tem-  
perature. The gain is trimmed to a nominal value of 1.0 µA/K.  
As an example, the output current can be sensed by using a  
10 kresistor connected from 10 V to the THERM (IOUT) pin.  
A voltage drop across the resistor will be developed that equals:  
10K × 1 µA/K = 10 mV/K = 2.98 V at room temperature.  
REV. A  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, nor for any infringements of patents or other rights of third parties  
which may result from its use. No license is granted by implication or  
otherwise under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781/329-4700  
Fax: 781/326-8703  
World Wide Web Site: http://www.analog.com  
© Analog Devices, Inc., 2000  
AD53509–SPECIFICATIONS  
DRIVER SPECIFICATIONS  
(All specifications are at TJ = 85C 5C, VS = 11 V 3%, –VS = –6 V = 3% unless otherwise noted. All temperature coefficients are  
measured at TJ = 75C to 95C.)  
Parameter  
Min  
Typ  
Max  
Unit  
Test Conditions  
DIFFERENTIAL INPUT CHARACTERISTICS  
(DATA to DATA, IOD to IOD, RLD to RLD)  
Input Voltage  
–2  
+3  
V
Differential Input Range  
Bias Current  
2
V
µA  
All Digital Inputs Within a 2 V Range  
VIN = –2 V, +3 V  
–250  
+250  
REFERENCE INPUTS  
Bias Currents  
–50  
+50  
µA  
VL, VH, VT = 5 V  
OUTPUT CHARACTERISTICS  
Logic High Range  
Logic Low Range  
Amplitude (VH and VL)  
Absolute Accuracy  
VH Offset  
–2  
–2  
0.1  
+7  
+6  
9
V
V
V
DATA = H, VH = –2 V to +7 V, VL = –2 V, VT = 0 V  
DATA = L, VL = –2 V to +6 V, VH = 7 V, VT = 0 V  
VL = 0.0 V, VH = 0.1 V, VT = 0 V  
V
L = –2 V, VH = +7 V, VT = 0 V  
–50  
0.3 – 5  
–50  
+50  
mV  
DATA = H, VH = 0 V, VL = –2 V, VT = –1 V  
DATA = H, VH = –1 V to +7 V, VL = –2 V, VT = –2 V  
DATA = L, VL = 0 V, VH = 5 V, VT = 3 V  
DATA = L, VL = –2 V to +6 V, VH = 7 V, VT = 7 V  
VL = –2 V, VH = 0 V, VT = –1 V (VH Offset)  
VL = 0 V, VH = 5 V, VT = 3 V (VL Offset)  
V
H Gain + Linearity Error  
VL Offset  
L Gain + Linearity Error  
+0.3 + 5 % of VH + mV  
+50 mV  
+0.3 + 5 % of VL + mV  
V
–0.3 – 5  
Offset TC  
0.5  
mV/°C  
Output Resistance  
V
H = –2 V  
VH = +7 V  
L = –2 V  
44  
44  
44  
44  
46  
46  
46  
46  
48  
48  
48  
48  
VL = –2 V, VT = 0 V, IOUT = 0, +1, +30 mA  
VL = –1 V, VT = 0 V, IOUT = 0, –1, –30 mA  
VH = 6 V, VT = 0 V, IOUT = 0, 1, 30 mA  
VH = 7 V, VT = 0 V, IOUT = 0, –1, –30 mA  
VL = 0 V, VT = 0 V, IOUT = –30 mA (Trim Point)  
V
VL = +6 V  
VH = +3 V  
46  
Dynamic Current Limit  
Static Current Limit  
>100  
mA  
mA  
CBYP = 39 nF, VH = 6 V, VL = –2 V, VT = 0 V  
–85  
+85  
Output to –2 V, VH = 7 V, VL = –1 V, VT = 0 V  
DATA = H and Output to 7 V, VH = 6 V,  
VL = –2 V, VT = 0 V, DATA = L  
VT  
ERM  
Voltage Range  
–2  
–50  
+7  
+50  
V
mV  
TERM MODE, VT = –2 V to +7 V, VL = 0 V, VH = 3 V  
TERM MODE, VT = 0 V, VL = 0 V, VH = 3 V  
VT  
Offset  
ERM  
VTERM Gain + Linearity Error  
–0.3 +10  
+0.3 +10 % of VSET + mV TERM MODE, VT = –2 V to +7 V, VL = 0 V, VH = 3 V  
Offset TC  
0.5  
46  
mV/°C  
VT = 0 V, VL = 0 V, VH = 3 V  
IOUT = +30 mA, +1.0 mA, VT = –2.0 V, VH = 3 V, VL = 0 V  
IOUT = –30 mA, –1.0 mA, VT = +7.0 V, VH = 3 V, VL = 0 V  
Output Resistance  
44  
49  
IOUT  
= 30 mA, 1.0 mA, VT = 0 V, VH = 3 V, VL = 0 V  
DYNAMIC PERFORMANCE, (VH AND VL)  
Propagation Delay Time  
1.5  
2
ns  
Measured at 50%, VH = +400 mV, VL = –400 mV,  
VT = 0 V  
Measured at 50%, VH = +400 mV, VL = –400 mV,  
VT = 0 V  
Measured at 50%, VH = +400 mV, VL = –400 mV,  
VT = 0 V  
Propagation Delay TC  
ps/°C  
ps  
Delay Matching, Edge to Edge  
<100  
Rise and Fall Times  
1 V Swing  
3 V Swing  
5 V Swing  
9 V Swing  
0.42  
0.75  
1.65  
3.0  
ns  
ns  
ns  
ns  
Measured 20%–80%, VL = 0 V, VH = 1 V, VT = 0 V  
Measured 20%–80%, VL = 0 V, VH = 3 V, VT = 0 V  
Measured 10%–90%, VL = 0 V, VH = 5 V, VT = 0 V  
Measured 10%–90%, VL = –2 V, VH = 7 V, VT = 0 V  
Rise and Fall Time Temperature Coefficient  
1 V Swing  
3 V Swing  
5 V Swing  
Overshoot and Preshoot  
1
2
4
ps/°C  
ps/°C  
ps/°C  
Measured 20%–80%, VL = 0 V, VH = 1 V  
Measured 20%–80%, VL = 0 V, VH = 3 V  
Measured 10%–90%, VL = 0 V, VH = 5 V  
<3 + 50  
% of Step + mV VL, VH = –0.1 V, 0.1 V, VL, VH = 0.0 V, 1.0 V  
VL, VH = 0.0 V, 3.0 V, VL, VH = 0.0 V, 5.0 V  
VL, VH = –2.0 V, 7.0 V  
Settling Time  
to 15 mV  
to 4 mV  
<50  
<10  
ns  
µs  
VL = 0 V, VH = 0.5 V, VT = –2 V  
VL = 0 V, VH = 0.5 V, VT = –2 V  
–2–  
REV. A  
AD53509  
Parameter  
Min  
Typ  
Max  
Unit  
Test Conditions  
L = 0 V, VH = 2 V, Pulsewidth = 2.5 ns/7.5 ns, 30 ns/90 ns  
Delay Change vs. Pulsewidth  
Minimum Pulsewidth  
3 V Swing  
5 V Swing  
Toggle Rate  
50  
ps  
V
1.4  
2.0  
250  
ns  
ns  
MHz  
VL = 0 V, VH = 3 V, 90% (2.7 V) Reached, Measure @ 50%  
VL = 0 V, VH = 5 V, 90% (4.5 V) Reached, Measure @ 50%  
VL = 0 V, VH = 5 V, VDUT > 3.0 V p-p  
DYNAMIC PERFORMANCE, INHIBIT  
Delay Time, Active to Inhibit  
Delay Time, Inhibit to Active  
Delay Time Matching (Z)  
3.3  
2.9  
<2  
ns  
ns  
ns  
Measured at 50%, VH = +2 V, VL = –2 V, VT = 0 V  
Measured at 50%, VH = +2 V, VL = –2 V, VT = 0 V  
Z = Delay Time Active to Inhibit Test (Above)—  
Delay Time Inhibit to Active Test (Above)  
(Of Worst Two Edges)  
I/O Spike  
Rise, Fall Time, Active to Inhibit  
Rise, Fall Time, Inhibit to Active  
150  
1.6  
1.4  
mV, p-p  
ns  
ns  
VH = 0 V, VL = 0 V, VT = 0 V  
VH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)  
VH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)  
DYNAMIC PERFORMANCE , VTERM  
Delay Time, VH to VTERM, VL to VTERM  
Delay Time, VTERM to VH and VTERM to VL  
Overshoot and Preshoot  
2.5  
2.5  
<3.0 + 75  
ns  
ns  
Measured at 50%, VL = –1 V, VH = +1 V, VTERM = 0 V  
Measured at 50%, VL = VH = +0.4 V, VTERM = –0.4 V  
% of Step + mV VH/VL, VTERM = (0 V, –1 V), (0 V, –2.0 V),  
(0 V, 6.0 V)  
VTERM Mode Rise Time  
VTERM Mode Fall Time  
PSRR, DRIVE or TERM Mode  
2.2  
2.2  
35  
ns  
ns  
dB  
VL = –2 V, VH = +2 V, VTERM = 0 V, 20%–80%  
VL = –2 V, VH = +2 V, VTERM = 0 V, 20%–80%  
VS = VS 3%  
Specifications subject to change without notice.  
COMPARATOR SPECIFICATIONS  
(All specifications are at TJ = 85C 5C. [Outputs terminated in 150 to GND, +VS = 11 V 3% –VS = 6 V 3%, VCCO = 3.3 V unless  
otherwise specified.] All temperatures coefficients are measured at TJ = 75C to 95C.)  
Parameter  
Min  
Typ  
Max  
Unit  
Test Conditions  
DC INPUT CHARACTERISTICS  
Offset Voltage (VOS  
Offset Voltage (Drift)  
HCOMP, LCOMP Bias Current  
Voltage Range (VCM  
Differential Voltage (VDIFF  
Gain and Linearity  
)
–25  
+25  
mV  
µV/°C  
µA  
CMV = 0 V  
CMV = 0 V  
VIN = 0 V  
50  
–50  
–2  
+50  
+7.0  
9.0  
)
V
)
V
–0.05  
+0.05  
% FSR  
VIN = –2 V to +7 V (9 V FSR)  
LATCH ENABLE INPUTS  
Logic “1” Current (IIH  
)
250  
+3  
µA  
µA  
V
LEA, LEA, LEB, LEB = +3 V  
LEA, LEA, LEB, LEB = –2 V  
Logic “0” Current (IIL  
Logic Input Range  
)
–250  
–2  
DIGITAL OUTPUTS  
Logic “1” Voltage (VOH  
)
VCCO – 0.98  
0
V
V
V/ns  
V
Q or Q, 16.7 mA Load  
Q or Q, 10 mA Load  
Logic “0” Voltage (VOL  
Slew Rate  
)
VCCO – 1.5  
8
1
VCCO Range  
SWITCHING PERFORMANCE  
Propagation Delay  
Input to Output  
1.8  
2
2
ns  
ns  
ps/°C  
VIN = 2 V p-p,  
HCOMP = 1 V, LCOMP = 1 V  
Latch Enable to Output  
Propagation Delay Temperature Coefficient  
Propagation Delay Change with Respect to  
Slew Rate: 0.5 V, 1.0 V, 3.0 V/ns  
Slew Rate: 5.0 V/ns  
Amplitude: 1.0 V, 3.0 V, 5.0 V  
Equivalent Input Rise Time  
Pulsewidth Linearity  
<
<
<
100  
350  
200  
ps  
ps  
ps  
ps  
ps  
ns  
VIN = 0 V to 5 V  
VIN = 0 V to 5 V  
VIN = 1.0 V/ns  
VIN = 0 V to 3 V, 3 V/ns  
VIN = 0 V to 3 V, 3 V/ns, PW = 3 ns–8 ns  
Settling to 8 mV, VIN = 1 V to 0 V  
450  
<
200  
Settling Time  
25  
Latch Timing  
Input Pulsewidth  
Setup Time  
Hold Time  
Hysteresis  
1.68  
1.0  
1.1  
6
ns  
ns  
ns  
mV  
Latch Inputs Programmed for Hysteresis  
Specifications subject to change without notice.  
REV. A  
–3–  
AD53509–SPECIFICATIONS  
ACTIVE LOAD SPECIFICATIONS  
(All specifications are at TJ = 85C 5C, +VS = 11 V 3%, –VS = –6 V = 3% unless otherwise noted. All temperature coefficients are  
measured at TJ = 75C to 95C.)  
Parameter  
Min  
Typ  
Max  
Unit  
Test Conditions  
INPUT CHARACTERISTICS  
INHL, INHL  
Input Voltage  
–2  
+3  
V
IOHC = 1 V, IOLC = 1 V, VCOM = 2 V, OUT_L = 0 V  
Bias Current  
–250  
250  
µA  
INHL, INHL = –2 V, +3 V  
IOHC Current Program Range  
IOH = 0 mA to –40 mA  
IOLC Current Program Range  
IOL = 0 mA to +40 mA  
IOHC, IOLC Input Bias Current  
IOLRTN, IOHRTN Range  
VDUT Range  
VDUT Range, IOH = 0 mA to –40 mA  
VDUT Range, IOL = 0 mA to +40 mA  
VCOMI Input Range  
0
4
V
OUT_L = –0.7 V, +7 V  
0
–300  
–2  
–2  
–0.7  
–2  
4
V
µA  
V
V
V
OUT_L = –2 V, +5.7 V  
+300  
+7  
+7  
+7  
+5.7  
+7  
IOLC = 0 V, 4.0 V and IOHC = 0 V, 4.0 V  
IOL = +40 mA, IOH = –40 mA, OUT_L = –2 V, +7 V  
IOL = +40 mA, IOH = –40 mA, IOUT_L–VCOMI >1.3 V  
OUT_L –VCOM > 1.3 V  
VCOM–VDUT > 1.3 V  
IOL = +40 mA, IOH = –40 mA  
V
V
–2  
OUTPUT CHARACTERISTICS  
Accuracy  
Absolute Accuracy Error, Load Current  
–0.3 – 100  
+0.3 + 100 % ISET + µA IOL, IOH = 25 µA–40 mA, VCOM = 0 V, OUT_L = 2 V and  
IOL = 25 µA–40 mA, VCOM = +7 V, OUT_L = +5.7 V and  
IOH = 25 µA–40 mA, VCOM = –2 V, OUT_L = –0.7 V  
VCOM Buffer  
Offset Error  
Bias Current  
Gain Error  
–50  
–10  
–0.2  
+50  
+10  
+0.2  
mV  
µA  
%
IOL, IOH = 40 mA, VCOMI = 0 V, OUT_L = VCOM  
VCOMI = 0 V, OUT_L = VCOM  
IOL, IOH = 40 mA, VCOMI = –1 V to +6 V,  
VOUT = VCOM  
+1  
Linearity Error  
–10  
+10  
mV  
IOL, IOH = 40 mA, VCOMI = –1 V to +6 V,  
VOUT = VCOM  
Output Current TC  
< 2  
µA/°C  
Measured at IOH, IOL = 200 µA  
DYNAMIC PERFORMANCE  
Propagation Delay  
IOUT to Inhibit  
Inhibit to IOUT  
Propagation Delay Matching  
I/O Spike  
Settling Time to 15 mV  
Settling Time to 4 mV  
1.9  
2.8  
<1.8  
240  
<50  
<10  
ns  
ns  
ns  
mV  
ns  
µs  
VCOM = 2 V, IOL = +20 mA, IOH = –20 mA  
VCOM = 2 V, IOL = +20 mA, IOH = 20 mA  
VCOM = 0 V, IOL = +20 mA, IOH = –20 mA  
IOL = +20 mA, IOH = –20 mA, 50 Load, to Ϯ15 mV  
IOL = +20 mA, IOH = –20 mA, 50 Load, to Ϯ4 mV  
Specifications subject to change without notice.  
–4–  
REV. A  
AD53509  
TOTAL FUNCTION SPECIFICATIONS  
(All specifications are at TJ = 85C 5C, VS = 11 V 3%, –VS = –6 V = 3% unless otherwise noted. All temperature coefficients are  
measured at TJ = 75C to 95C.)  
Parameter  
Min  
Typ  
Max  
Unit  
Test Conditions  
OUTPUT CHARACTERISTICS  
Output Leakage Current, VOUT = –1 V to +5 V  
Output Leakage Current, VOUT = –2 V to +7 V  
Output Capacitance  
–250  
–500  
+250  
+500  
nA  
µA  
pF  
8
Driver and Load INHIBITED  
POWER SUPPLIES  
Total Supply Range  
Positive Supply  
17  
11  
–6  
V
V
V
Negative Supply  
Positive Supply Current  
Negative Supply Current  
VCCO Current  
Total Power Dissipation  
Temperature Sensor Gain Factor  
280  
290  
mA  
mA  
mA  
W
Driver = INH, ILOAD Program = 40 mA, Load = Active  
Driver = INH, ILOAD Program = 40 mA, Load = Active  
VCCO = 3.3 V, Comparator Output 150 to GND  
Driver = INH, ILOAD Program = 40 mA, Load = Active  
RLOAD = 10 k, VSOURCE = 11 V  
65  
1
4.8  
µA/K  
NOTES  
Connecting or shorting the decoupling pins to ground will result in the destruction of the device.  
Specifications subject to change without notice.  
Table I. Driver Truth Table  
DATA  
DATA  
IOD  
IOD  
RLD  
RLD  
OUTPUT STATE  
0
1
X
X
1
0
X
X
1
1
0
0
0
0
1
1
X
X
0
X
X
1
VL  
VH  
INH  
VTERM  
1
0
Table II. Comparator Truth Table  
OUTPUT STATES  
VOUT  
>HCOMP  
>HCOMP  
<HCOMP  
<HCOMP  
X
LEH  
LEH  
LEL  
LEL  
QH  
QH  
QL  
QL  
>LCOMP  
<LCOMP  
>LCOMP  
<LCOMP  
X
1
1
1
1
0
0
0
0
0
1
1
1
1
1
0
0
0
0
0
1
1
1
0
0
0
0
1
1
1
0
1
0
0
1
0
1
QH (t – 1)  
QH (t – 1) QL (t – 1) QL (t – 1)  
Table III. Active Load Truth Table  
OUTPUT STATES (Including Diode Bridge)  
OUT_L  
INHL  
INHL  
IOH  
IOL  
I(OUT_L)  
<VCOM  
>VCOM  
X
0
0
1
1
1
0
V(IOHC) × 10 mA  
V(IOHC) × 10 mA  
0
V(IOLC) × 10 mA  
V(IOLC) × 10 mA  
0
IOL  
IOH  
0
REV. A  
–5–  
AD53509  
ABSOLUTE MAXIMUM RATINGS1  
Environmental  
Power Supply Voltage  
Operating Temperature (Junction) . . . . . . . . . . . . . . . 175°C  
Storage Temperature . . . . . . . . . . . . . . . . –65°C to +150°C  
Lead Temperature (Soldering, 10 sec)3 . . . . . . . . . . . 260°C  
VCC to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 V  
VEE to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –8 V  
VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 V  
VCCO to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 V  
PWR GND HQ GND . . . . . . . . . . . . . . . . . . . . . . .  
Inputs  
DATA, DATA, IOD, IOD, RLD, RLD . . . . . . +5 V, –2 V  
DATA to DATA, IOD to IOD, RLD to RLD . . . . . . . 3 V  
LEL, LEL, LEH, LEH . . . . . . . . . . . . . . . . . . . +5 V, –2 V  
LEL to LEL, LEH to LEH . . . . . . . . . . . . . . . . . . . . . 3 V  
INHL, INHL . . . . . . . . . . . . . . . . . . . . . . . . . . . +5 V, –2 V  
NOTES  
1Stresses above those listed under Absolute Maximum Ratings may cause perma-  
nent damage to the device. This is a stress rating only; functional operation of the  
device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Absolute maximum limits apply  
individually, not in combination. Exposure to absolute maximum rating condi-  
tions for extended periods may affect device reliability.  
0.4 V  
2Output short circuit protection is guaranteed as long as proper heat sinking is  
employed to ensure compliance with the operating temperature limits.  
3To ensure lead coplanarity ( 0.002 inches) and solderability, handling with bare  
hands should be avoided and the device should be stored in environments at 24°C  
5°C (75°F 10°F) with relative humidity not to exceed 65%.  
INHL to INHL . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
3 V  
VH, VL, VTERM, VCOM_I to GND . . . . . . . . +8 V, –3 V  
VH to VL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 V  
(VH–VTERM) and (VTERM – VL) . . . . . . . . . . . . . 10 V  
IOHC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 V  
IOLC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 V  
HCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8 V, –3 V  
LCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8 V, –3 V  
HCOMP, LCOMP to VOUT . . . . . . . . . . . . . . . . . . . 10 V  
Table IV. Package Thermal Characteristics  
Air Flow, FM  
JA, C/W  
0
200  
400  
33  
25  
22  
Outputs  
V
OUT Short Circuit Duration . . . . . . . . . . . . . . . . Indefinite2  
VOUT Inhibit Mode . . . . . . . . . . . . . . . . . . . . . . . +8 V, –3 V  
VHDCPL . . . . . . . . Do Not Connect Except for Cap to VCC  
VLDCPL . . . . . . . . Do Not Connect Except for Cap to VEE  
QH, QH, QL, QL Maximum IOUT  
Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA  
Surge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA  
THERM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 V, 0 V  
IOHRTN, IOLRTN . . . . . . . . . . . . . . . . . . +8.5 V, –3.5 V  
VCOM_S Short Circuit Duration . . . . . . . . . . . . . . . 3 sec2  
ORDERING GUIDE  
Shipment Method  
Package  
Description  
Quantity per  
Shipping Container  
Package  
Option  
Model  
AD53509JSQ  
52-Lead LQFP-EDQUAD  
90  
SQ-52  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AD53509 features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
–6–  
REV. A  
AD53509  
PIN CONFIGURATION  
52 51 50 49 48 47 46 45 44 43 42 41 40  
39  
V
1
2
3
4
5
6
V
EE  
CC  
PIN 1  
IDENTIFIER  
38  
37  
36  
35  
34  
DATA  
DATA  
INHL  
VCCO  
QL  
QL  
VCCO  
QH  
INHL  
AD53509  
V
CC  
33 PWRGND  
HEAT SINK UP  
(Not to Scale)  
7
8
QH  
32  
V
EE  
VCCO  
PWRGND  
31  
V
L
9
30  
29  
28  
IOLC  
10  
11  
12  
13  
LEL  
LEL  
IOHC  
HQGND  
LEH  
LEH  
27  
IOHRTN  
14 15 16 17 18 19 20 21 22 23 24 25 26  
NC = NO CONNECT  
REV. A  
–7–  
AD53509  
OUTLINE DIMENSIONS  
Dimensions shown in inches and (mm).  
52-Lead LQFP–EDQUAD with Integral Heat Slug  
(SQ-52)  
0.063 (1.60)  
MAX  
0.030 (0.75)  
0.024 (0.60)  
0.018 (0.45)  
0.630 (16.00) SQ  
0.551 (14.00) SQ  
52  
40  
39  
1
SEATING  
PLANE  
0.270  
(6.86)  
DIA  
TOP VIEW  
(PINS DOWN)  
STANDOFF  
0.004 (0.10)  
MAX  
27  
13  
14  
26  
0.057 (1.45)  
0.055 (1.40)  
0.053 (1.35)  
0.006 (0.15)  
0.002 (0.05)  
7ꢂ  
3.5ꢂ  
0ꢂ  
0.008 (0.20)  
0.004 (0.09)  
0.039 (1.00)  
BSC  
0.020 (0.50)  
0.017 (0.42)  
0.014 (0.35)  
CENTER FIGURES ARE TYPICAL UNLESS OTHERWISE NOTED  
–8–  
REV. A  

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