AOD6N50 [AOS]

500V,5.3A N-Channel MOSFET; 500V , 5.3A N沟道MOSFET
AOD6N50
型号: AOD6N50
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

500V,5.3A N-Channel MOSFET
500V , 5.3A N沟道MOSFET

文件: 总6页 (文件大小:495K)
中文:  中文翻译
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AOD6N50  
500V,5.3A N-Channel MOSFET  
General Description  
Product Summary  
The AOD6N50 is fabricated using an advanced high  
voltage MOSFET process that is designed to deliver high  
levels of performance and robustness in popular AC-DC  
applications.By providing low RDS(on), Ciss and Crss along  
with guaranteed avalanche capability this device can be  
adopted quickly into new and existing offline power supply  
designs.  
VDS  
600V@150  
5.3A  
ID (at VGS=10V)  
RDS(ON) (at VGS=10V)  
< 1.4  
100% UIS Tested!  
100% Rg Tested!  
TO252  
DPAK  
Top View  
Bottom View  
D
D
D
G
S
G
S
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
VDS  
Maximum  
500  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
V
V
VGS  
±30  
TC=25°C  
5.3  
Continuous Drain  
CurrentB  
ID  
TC=100°C  
3.3  
A
Pulsed Drain Current C  
IDM  
17  
2.8  
Avalanche Current C  
IAR  
A
Repetitive avalanche energy C  
EAR  
EAS  
dv/dt  
118  
mJ  
Single plused avalanche energy H  
Peak diode recovery dv/dt  
TC=25°C  
235  
mJ  
V/ns  
W
W/ oC  
5
104  
PD  
Power Dissipation B  
Derate above 25oC  
0.83  
-50 to 150  
Junction and Storage Temperature Range  
TJ, TSTG  
TL  
°C  
Maximum lead temperature for soldering  
purpose, 1/8" from case for 5 seconds  
300  
°C  
Thermal Characteristics  
Parameter  
Symbol  
RθJA  
Typical  
Maximum  
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A,G  
43  
-
55  
0.5  
1.2  
Maximum Case-to-sink A  
Maximum Junction-to-CaseD,F  
RθCS  
RθJC  
1
Rev0: April 2012  
Page 1 of 6  
AOD6N50  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250A, VGS=0V, TJ=25°C  
ID=250A, VGS=0V, TJ=150°C  
500  
BVDSS  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Zero Gate Voltage Drain Current  
600  
0.6  
V
BVDSS  
/TJ  
V/ oC  
ID=250A, VGS=0V  
VDS=500V, VGS=0V  
1
IDSS  
µA  
10  
VDS=400V, TJ=125°C  
VDS=0V, VGS=±30V  
VDS=5V ID=250µA  
VGS=10V, ID=2.5A  
IGSS  
VGS(th)  
RDS(ON)  
gFS  
Gate-Body leakage current  
Gate Threshold Voltage  
±100  
4.5  
nΑ  
V
3.4  
4.1  
1.2  
5
Static Drain-Source On-Resistance  
Forward Transconductance  
Diode Forward Voltage  
1.4  
S
VDS=40V, ID=2.5A  
IS=1A,VGS=0V  
VSD  
0.76  
5
1
V
IS  
Maximum Body-Diode Continuous Current  
Maximum Body-Diode Pulsed Current  
A
ISM  
17  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
430  
40  
538  
58  
670  
80  
7
pF  
pF  
pF  
V
GS=0V, VDS=25V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
2.5  
1.2  
4.5  
2.3  
VGS=0V, VDS=0V, f=1MHz  
VGS=10V, VDS=400V, ID=5A  
3.5  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
9
3
2
11.5  
3.8  
4.1  
18  
14  
4.6  
6.2  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
VGS=10V, VDS=250V, ID=5A,  
Turn-On Rise Time  
32  
RG=25Ω  
tD(off)  
tf  
Turn-Off DelayTime  
34  
Turn-Off Fall Time  
22  
trr  
IF=5A,dI/dt=100A/µs,VDS=100V  
IF=5A,dI/dt=100A/µs,VDS=100V  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
145  
1.7  
182  
2.2  
220  
2.7  
ns  
Qrr  
µC  
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=150°C in a TO252 package, using junction-to-case thermal resistance, and is more useful in  
setting the upper dissipation limit for cases where additional heatsinking is used.  
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C.  
D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a  
maximum junction temperature of TJ(MAX)=150°C.  
G.These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.  
H. L=60mH, IAS=2.8A, VDD=150V, RG=10, Starting TJ=25°C  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev0: April 2012  
www.aosmd.com  
Page 2 of 6  
AOD6N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
8
100  
10  
1
10V  
VDS=40V  
-55°C  
6.5V  
6
125°C  
6V  
4
VGS=5.5V  
2
25°C  
0.1  
0
2
4
6
8
10  
0
5
10  
15  
20  
25  
30  
VGS(Volts)  
Figure 2: Transfer Characteristics  
VDS (Volts)  
Fig 1: On-Region Characteristics  
3
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
2.5  
2
VGS=10V  
ID=2.5A  
VGS=10V  
1.5  
1
0.5  
0
-100  
-50  
0
50  
100  
150  
200  
0
2
4
6
8
10  
12  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
ID (A)  
Figure 3: On-Resistance vs. Drain Current and Gat
Voltage  
1.2  
1.0E+02  
1.0E+01  
125°C  
1.1  
1
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
25°C  
0.9  
0.8  
-100  
-50  
0
50  
TJ (oC)  
Figure 5: Break Down vs. Junction Temperature  
100  
150  
200  
0.2  
0.4  
0.6  
0.8  
1.0  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
Rev0: April 2012  
www.aosmd.com  
Page 3 of 6  
AOD6N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
12  
9
10000  
1000  
100  
10  
VDS=400V  
ID=2.5A  
Ciss  
Coss  
6
Crss  
3
0
1
0
3
6
9
12  
15  
18  
0.1  
1
10  
100  
VDS (Volts)  
Qg (nC)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
100  
1000  
800  
600  
400  
200  
0
10µs  
10  
1
TJ(Max)=150°C  
TC=25°C  
RDS(ON)  
limited  
100µs  
1ms  
DC  
10ms  
TJ(Max)=150°C  
TC=25°C  
0.1  
0.01  
1
10  
100  
1000  
0.0001  
0.001  
0.01  
0.1  
1
10  
VDS (Volts)  
Pulse Width (s)  
Figure 10: Single Pulse Power Rating Junction-to-  
Case (Note F)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
10  
1
D=Ton/T  
TJ,PK=TC+PDM.ZθJC.RθJC  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
RθJC=1.2°C/W  
0.1  
PD  
0.01  
Single Pulse  
Ton  
T
0.001  
0.000001  
0.00001  
0.0001  
0.001  
Pulse Width (s)  
0.01  
0.1  
1
10  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Rev0: April 2012  
www.aosmd.com  
Page 4 of 6  
AOD6N50  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
120  
90  
60  
30  
0
6
5
4
3
2
1
0
0
25  
50  
75  
100  
125  
150  
0
25  
50  
75  
100  
125  
150  
TCASE (°C)  
TCASE (°C)  
Figure 12: Power De-rating (Note B)  
Figure 13: Current De-rating (Note B)  
500  
400  
300  
200  
100  
0
TJ(Max)=150°C  
TA=25°C  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 14: Single Pulse Power Rating Junction-to-Ambient (Note G)  
10  
1
D=Ton/T  
TJ,PK=TA+PDM.ZθJA.RθJA  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
RθJA=55°C/W  
0.1  
0.01  
0.001  
0.0001  
PD  
Single Pulse  
Ton  
T
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
10000  
Pulse Width (s)  
Figure 15: Normalized Maximum Transient Thermal Impedance (Note G)  
Rev0: April 2012  
www.aosmd.com  
Page 5 of 6  
AOD6N50  
Gate Charge Test Circuit &Waveform  
Vgss  
Qgg  
10V  
+
VDC  
+
Vdds  
Q
g
s
Qggd  
VDCC  
-
-
DUTT  
Vgss  
Igg  
Chharge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vdds  
Vdds  
90%  
10%  
+
Vddd  
DUUT  
Vgss  
VDCC  
Rgg  
-
Vgss  
Vgss  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
2
EAR=1/2 LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTestCircuit &Waveforms  
Qrr=- Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Rev0: April 2012  
www.aosmd.com  
Page 6 of 6  

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