AOTF10N50FDL [AOS]

Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET;
AOTF10N50FDL
型号: AOTF10N50FDL
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET

文件: 总6页 (文件大小:330K)
中文:  中文翻译
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AOTF10N50FD  
500V, 10A N-Channel MOSFET with Fast Recovery Diode  
General Description  
Product Summary  
VDS  
600V@150  
10A  
The AOTF10N50FD has been fabricated using an  
advanced high voltage MOSFET process that is designed  
to deliver high levels of performance and robustness in  
popular AC-DC applications. By providing low RDS(on), Ciss  
and Crss along with guaranteed avalanche capability this  
part can be adopted quickly into new and existing offline  
power supply designs.  
ID (at VGS=10V)  
RDS(ON) (at VGS=10V)  
< 0.75  
100% UIS Tested  
100% Rg Tested  
For Halogen Free add "L" suffix to part number:  
AOTF10N50FDL  
Top View  
TO-220F  
D
G
S
D
S
G
AOTF10N50FD  
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
AOTF10N50FD  
Units  
Drain-Source Voltage  
VDS  
500  
±30  
10*  
6*  
V
Gate-Source Voltage  
VGS  
V
A
TC=25°C  
Continuous Drain  
Current  
ID  
TC=100°C  
Pulsed Drain Current C  
IDM  
33  
3.8  
Avalanche Current C  
IAR  
A
Repetitive avalanche energy C  
EAR  
EAS  
dv/dt  
216  
mJ  
Single pulsed avalanche energy G  
Peak diode recovery dv/dt  
TC=25°C  
433  
mJ  
V/ns  
W
W/ oC  
5
50  
PD  
Power Dissipation B  
Derate above 25oC  
0.4  
Junction and Storage Temperature Range  
TJ, TSTG  
-55 to 150  
°C  
Maximum lead temperature for soldering  
purpose, 1/8" from case for 5 seconds  
Thermal Characteristics  
TL  
300  
°C  
Parameter  
Symbol  
RθJA  
AOT10N50FD  
Units  
°C/W  
°C/W  
Maximum Junction-to-Ambient A,D  
65  
Maximum Junction-to-Case  
RθJC  
2.5  
* Drain current limited by maximum junction temperature.  
Rev.1.0: July 2013  
www.aosmd.com  
Page 1 of 6  
AOTF10N50FD  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=10mA, VGS=0V, TJ=25°C  
ID=10mA, VGS=0V, TJ=150°C  
500  
BVDSS  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Zero Gate Voltage Drain Current  
600  
V
BVDSS  
/TJ  
V/ oC  
ID=10mA, VGS=0V  
0.56  
VDS=500V, VGS=0V  
VDS=400V, TJ=125°C  
VDS=0V, VGS=±30V  
VDS=5V, ID=250µA  
VGS=10V, ID=5A  
10  
µA  
IDSS  
100  
IGSS  
VGS(th)  
RDS(ON)  
gFS  
Gate-Body leakage current  
Gate Threshold Voltage  
±100  
4.2  
nΑ  
V
2.5  
3.1  
0.6  
10  
Static Drain-Source On-Resistance  
Forward Transconductance  
Diode Forward Voltage  
0.75  
S
VDS=40V, ID=5A  
IS=10A,VGS=0V  
VSD  
0.93  
1.6  
10  
33  
V
IS  
Maximum Body-Diode Continuous Current  
Maximum Body-Diode Pulsed Current  
A
ISM  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
820  
75  
5
1030 1240  
pF  
pF  
pF  
V
GS=0V, VDS=25V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
112  
10  
150  
15  
VGS=0V, VDS=0V, f=1MHz  
1.7  
3.4  
5.2  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
20  
26  
4.8  
9.5  
24  
35  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
VGS=10V, VDS=400V, ID=10A  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
VGS=10V, VDS=250V, ID=10A,  
Turn-On Rise Time  
65  
RG=25Ω  
t
D(off)  
tf  
Turn-Off DelayTime  
69  
Turn-Off Fall Time  
50  
trr  
IF=10A,dI/dt=100A/µs,VDS=100V  
IF=10A,dI/dt=100A/µs,VDS=100V  
116  
0.3  
190  
0.6  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
µC  
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial  
TJ =25°C.  
D. The R θJA is the sum of the thermal impedance from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a  
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.  
G. L=60mH, IAS=3.8A, VDD=150V, RG=25, Starting TJ=25°C  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev.1.0: July 2013  
www.aosmd.com  
Page 2 of 6  
AOTF10N50FD  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
25  
20  
15  
10  
5
100  
10  
1
-55°C  
VDS=40V  
10V  
6.5V  
6V  
125°C  
5.5V  
25°C  
VGS=5V  
0
0.1  
0
5
10  
15  
20  
25  
30  
2
4
6
8
10  
VDS (Volts)  
Fig 1: On-Region Characteristics  
VGS(Volts)  
Figure 2: Transfer Characteristics  
2.0  
1.6  
1.2  
0.8  
0.4  
0.0  
3
2.5  
2
VGS=10V  
ID=5A  
VGS=10V  
1.5  
1
0.5  
0
-100  
-50  
0
50  
100  
150  
200  
0
4
8
12  
16  
20  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
ID (A)  
Figure 3: On-Resistance vs. Drain Current  
and Gate Voltage  
1.2  
1E+02  
1E+01  
1E+00  
1E-01  
1E-02  
1E-03  
1E-04  
1E-05  
1.1  
1
125°C  
25°C  
0.9  
0.8  
0.0  
0.4  
0.8  
1.2  
1.6  
-100  
-50  
0
50  
100  
150  
200  
TJ (oC)  
VSD (Volts)  
Figure 5:Break Down vs. Junction Temparature  
Figure 6: Body-Diode Characteristics (Note E)  
Rev.1.0: July 2013  
www.aosmd.com  
Page 3 of 6  
AOTF10N50FD  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
12  
9
10000  
1000  
100  
10  
VDS=400V  
ID=10A  
Ciss  
Coss  
6
Crss  
3
1
0
0.1  
1
10  
100  
0
8
16  
Qg (nC)  
24  
32  
40  
VDS (Volts)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
100  
10  
12  
10  
8
RDS(ON)  
limited  
10µs  
100µs  
1ms  
1
6
10ms  
0.1s  
1s  
DC  
4
0.1  
0.01  
2
TJ(Max)=150°C  
TC=25°C  
0
0
25  
50  
75  
100  
125  
150  
1
10  
100  
1000  
TCASE (oC)  
VDS (Volts)  
Figure 10: Current De-rating (Note B)  
Figure 9: Maximum Forward Biased Safe Operating  
Area for AOTF10N50FD (Note F)  
10  
D=Ton/T  
In descending order  
TJ,PK=TC+PDM.ZθJC.RθJC  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
R
θJC=2.5°C/W  
1
0.1  
PD  
Single Pulse  
0.01  
Ton  
T
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance for AOTF10N50FD (Note F)  
Rev.1.0: July 2013  
www.aosmd.com  
Page 4 of 6  
AOTF10N50FD  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
VDS=100V  
IF=10A  
AOTF10N50FD  
10  
dI/dt=100A/µs  
5
0
-5  
-10  
-15  
AOT9N50  
400  
-800  
-600  
-400  
-200  
0
200  
600  
800  
1000  
1200  
Trr (nS)  
Figure 12: Diode Recovery Characteristics  
Rev.1.0: July 2013  
www.aosmd.com  
Page 5 of 6  
AOTF10N50FD  
Gate Charge Test Circuit &Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit& Waveforms  
L
2
EAR=1/2LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTest Circuit &Waveforms  
Qrr =- Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Rev.1.0: July 2013  
www.aosmd.com  
Page 6 of 6  

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