IRFZ44N [FREESCALE]

HEXFET® Power MOSFET; HEXFET®功率MOSFET
IRFZ44N
型号: IRFZ44N
厂家: Freescale    Freescale
描述:

HEXFET® Power MOSFET
HEXFET®功率MOSFET

晶体 晶体管 开关 脉冲 局域网
文件: 总8页 (文件大小:248K)
中文:  中文翻译
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IRFZ44N  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Ultra Low On-Resistance  
l Dynamic dv/dt Rating  
D
VDSS = 55V  
l 175°C Operating Temperature  
l Fast Switching  
RDS(on) = 17.5mΩ  
G
l Fully Avalanche Rated  
ID = 49A  
S
Description  
AdvancedHEXFET® PowerMOSFETsfromInternational  
Rectifierutilizeadvancedprocessingtechniquestoachieve  
extremelylowon-resistancepersiliconarea. Thisbenefit,  
combined with the fast switching speed and ruggedized  
device design that HEXFET power MOSFETs are well  
knownfor,providesthedesignerwithanextremelyefficient  
andreliabledeviceforuseinawidevarietyofapplications.  
The TO-220 package is universally preferred for all  
commercial-industrial applications at power dissipation  
levels to approximately 50 watts. The low thermal  
resistance and low package cost of the TO-220 contribute  
to its wide acceptance throughout the industry.  
TO-220AB  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current   
49  
35  
160  
A
PD @TC = 25°C  
Power Dissipation  
94  
W
W/°C  
V
Linear Derating Factor  
0.63  
VGS  
IAR  
Gate-to-Source Voltage  
± 20  
Avalanche Current  
25  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒ  
Operating Junction and  
9.4  
mJ  
V/ns  
5.0  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Mounting torque, 6-32 or M3 srew  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
Units  
RθJC  
RθCS  
RθJA  
1.5  
–––  
62  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
0.50  
–––  
°C/W  
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IRFZ44N  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
55 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.058 ––– V/°C Reference to 25°C, ID = 1mA  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– ––– 17.5 mVGS = 10V, ID = 25A  
„
2.0  
19  
––– 4.0  
––– –––  
V
S
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 25A„  
VDS = 55V, VGS = 0V  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 63  
––– ––– 14  
––– ––– 23  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
VDS = 44V, VGS = 0V, TJ = 150°C  
VGS = 20V  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -20V  
Qg  
ID = 25A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 44V  
VGS = 10V, See Fig. 6 and 13  
–––  
–––  
–––  
–––  
12 –––  
60 –––  
44 –––  
45 –––  
VDD = 28V  
ID = 25A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 12Ω  
VGS = 10V, See Fig. 10 „  
Between lead,  
6mm (0.25in.)  
from package  
and center of die contact  
VGS = 0V  
D
4.5  
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
–––  
–––  
–––  
–––  
nH  
G
7.5  
S
Ciss  
Coss  
Crss  
EAS  
Input Capacitance  
––– 1470 –––  
––– 360 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
Single Pulse Avalanche Energy‚  
–––  
88 –––  
pF  
ƒ = 1.0MHz, See Fig. 5  
––– 530150† mJ IAS = 25A, L = 0.47mH  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
D
IS  
49  
––– –––  
––– –––  
showing the  
A
G
ISM  
Pulsed Source Current  
integral reverse  
p-n junction diode.  
160  
S
(Body Diode)  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.3  
––– 63 95  
––– 170 260  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
V
TJ = 25°C, IS = 25A, VGS = 0V „  
TJ = 25°C, IF = 25A  
ns  
Qrr  
ton  
nC di/dt = 100A/µs „  
Notes:  
ƒISD 25A, di/dt 230A/µs, VDD V(BR)DSS  
TJ 175°C  
,
Repetitive rating; pulse width limited by  
max. junction temperature. (See fig. 11)  
„Pulse width 400µs; duty cycle 2%.  
This is a typical value at device destruction and represents  
operation outside rated limits.  
‚Starting TJ = 25°C, L = 0.48mH  
RG = 25, IAS = 25A. (See Figure 12)  
†This is a calculated value limited to TJ = 175°C .  
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IRFZ44N  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
TOP  
TOP  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
BOTTOM 4.5V  
4.5V  
4.5V  
20µs PULSE WIDTH  
T = 175 C  
J
20µs PULSE WIDTH  
°
°
T = 25 C  
J
1
0.1  
1
0.1  
1
10  
100  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000  
2.5  
49A  
=
I
D
2.0  
1.5  
1.0  
0.5  
0.0  
°
T = 25 C  
J
100  
10  
1
°
T = 175 C  
J
V
= 25V  
DS  
20µs PULSE WIDTH  
V
= 10V  
GS  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
°
4
5
6
7
8
9
10  
11  
T , Junction Temperature ( C)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
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IRFZ44N  
20  
16  
12  
8
2500  
2000  
1500  
1000  
500  
I
D
=
25A  
V
= 0V,  
f = 1MHz  
C
GS  
C
= C + C  
SHORTED  
ds  
iss  
gs  
gd ,  
gd  
V
V
V
= 44V  
DS  
C
= C  
gd  
rss  
= 27V  
DS  
C
= C + C  
oss  
ds  
= 11V  
DS  
C
iss  
C
C
oss  
4
rss  
0
0
1
10  
100  
0
10  
20  
30  
40  
50  
60  
70  
V
, Drain-to-Source Voltage (V)  
Q
, Total Gate Charge (nC)  
DS  
G
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R (on)  
DS  
100  
10  
1
°
T = 175 C  
J
100µsec  
1msec  
1
°
T = 25 C  
J
Tc = 25°C  
Tj = 175°C  
Single Pulse  
10msec  
V
= 0 V  
GS  
0.1  
0.1  
0.0  
0.6  
1.2  
1.8  
2.4  
1
10  
, Drain-toSource Voltage (V)  
100  
V
,Source-to-Drain Voltage (V)  
SD  
V
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
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IRFZ44N  
50  
40  
30  
20  
10  
0
RD  
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
VGS  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
175  
°
T , Case Temperature ( C)  
C
10%  
V
GS  
Fig 9. Maximum Drain Current Vs.  
t
t
r
t
t
f
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
10  
1
D = 0.50  
0.20  
0.10  
0.05  
P
DM  
0.1  
t
1
SINGLE PULSE  
(THERMAL RESPONSE)  
0.02  
0.01  
t
2
Notes:  
1. Duty factor D = t / t  
1
2
2. Peak T =P  
x Z  
+ T  
thJC C  
J
DM  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
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IRFZ44N  
300  
240  
180  
120  
60  
1 5V  
I
D
TOP  
10A  
18A  
BOTTOM 25A  
DRIVER  
L
V
G
D S  
D .U.T  
R
+
V
D D  
-
I
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
0
25  
50  
75  
100  
125  
150  
175  
°
Starting T , Junction Temperature ( C)  
J
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
I
AS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
VGS  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Current Sampling Resistors  
Charge  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
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IRFZ44N  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T*  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
+
-
VDD  
VGS  
* Reverse Polarity of D.U.T for P-Channel  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
[
=10V  
] ***  
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
[
[
]
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
]
SD  
Ripple 5%  
*** VGS = 5.0V for Logic Level and 3V Drive Devices  
Fig 14. For N-channel HEXFET® power MOSFETs  
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IRFZ44N  
Package Outline  
TO-220AB  
Dimensions are shown in millimeters (inches)  
10.54 (.415)  
10.29 (.405)  
- B  
-
3.78 (.149)  
3.54 (.139)  
2.87 (.113)  
2.62 (.103)  
4.69 (.185)  
4.20 (.165)  
1.32 (.052)  
1.22 (.048)  
- A  
-
6.47 (.255)  
6.10 (.240)  
4
15.24 (.600)  
14.84 (.584)  
1.15 (.045)  
M IN  
LEAD ASSIG NM ENTS  
1
2
3
4
- GATE  
1
2
3
- DRAIN  
- SOU RC E  
- DRAIN  
14.09 (.555)  
13.47 (.530)  
4.06 (.160)  
3.55 (.140)  
0.93 (.037)  
0.69 (.027)  
0.55 (.022)  
0.46 (.018)  
3X  
3X  
1.40 (.055)  
3X  
1.15 (.045)  
0.36 (.014)  
M
B
A
M
2.92 (.115)  
2.64 (.104)  
2.54 (.100)  
2X  
N OTES:  
1
2
D IM ENSIONING  
&
TOLERANCING PER ANSI Y14.5M , 1982.  
3
4
OUTLINE CONFORM S TO JEDEC OUTLINE TO-220AB.  
HEATSINK LEAD M EASUREM ENTS DO NOT INCLU DE BURRS.  
C ONTROLLING DIM ENSION : INCH  
&
Part Marking Information  
TO-220AB  
EXAMPLE : THIS IS AN IR F1010  
W ITH ASSEM BLY  
A
INTERNATIONAL  
RECTIFIER  
PART NU M BER  
LOT C ODE 9B1M  
IR F1010  
9246  
9B  
1M  
D ATE COD E  
(YYW W )  
ASSEMBLY  
LOT  
CO DE  
YY  
=
YEAR  
= W EEK  
W W  
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