FTK10N80PD [FS]

10.0 Amps, 800 Volts N-Channel MO S-FET;
FTK10N80PD
型号: FTK10N80PD
厂家: First Silicon Co., Ltd    First Silicon Co., Ltd
描述:

10.0 Amps, 800 Volts N-Channel MO S-FET

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SEMICONDUCTOR  
FTK10N80P/F/DD  
TECHNICAL DATA  
10.0 Amps, 800 Volts N-Channel MOS-FET  
DESCRIPTION  
These N-Channel enhancement mode power field effect  
Transistors are produced using planar stripe, DMOS  
technology.  
P :  
1
This advanced technology has been especially tailored  
to minimize on - state resistance , provide superior  
switching performance,and Withstand high energy pulse  
in the avalanche and commutaion mode .These devices  
are well suited for high efficiency switch mode power  
supply electronic lamp ballasts  
TO-220  
F :  
1
based on half bridge topology.  
TO-220F  
FEATURES  
* RDS(ON) = 1.15Ω@VGS = 10V  
* Fast switching capability  
* Avalanche energy tested  
DD :  
1
* Improved dv/dt capability, high ruggedness  
TO-263  
SYMBOL  
2.Drain  
1.Gate  
3.Source  
ORDERING INFORMATION  
Pin Assignment  
Order Number  
Package  
Packing  
1
2
3
FTK10N80P  
FTK10N80F  
FTK10N80DD  
TO-220  
TO-220F  
TO-263  
G
D
S
Tube  
Tube  
G
G
D
D
S
S
Reel & Taping  
Note: Pin Assignmen:  
G: Gate  
D: Drain  
S: Source  
2016. 07. 05  
Revision No : 0  
1/7  
FTK10N80P/F/DD  
(
TC = 25˚C, unless otherwise specified)  
ABSOLUTE MAXIMUM RATINGS  
PARAMET  
SYMBOL  
VDSS  
RATINGS  
UNIT  
V
Drain-Source Voltage  
800  
±30  
10  
VGSS  
Gate-Source Voltage  
V
IAR  
Avalanche Current (Note 1)  
A
TC = 25°C  
10  
A
Continuous Drain Current  
Pulsed Drain Current (Note 1)  
Avalanche Energy  
ID  
TC = 100°C  
6.0  
36  
IDM  
EAS  
A
Single Pulse(Note 2)  
920  
17  
mJ  
mJ  
Repetitive Limited by TJ(MAX)  
EAR  
Peak Diode Recovery dv/dt (Note 3)  
dv/dt  
4.5  
V/ns  
W
TC = 25°C  
142 / 65  
1.14 / 0.38  
+150  
Power Dissipation (TO-220,TO-263/ TO-220F)  
PD  
Derate above 25°C  
W / ˚C  
TJ  
Junction Temperature  
˚C  
˚C  
TSTG  
-55 ~ +150  
Operating and Storage Temperature  
Note: Absolute maximum ratings are those values beyond which the device could be permanently damaged.  
Absolute maximum ratings are stress ratings only and functional device operation is not implied.  
THERMAL DATA  
PARAMETER  
Junction-to-Ambient  
Junction-to-Case  
SYMBOL  
MIN  
TYP  
MAX  
62.5  
UNIT  
θJA  
TO-220, TO-263  
TO-220F  
θJc  
θJc  
˚C / W  
0.88  
1.93  
ELECTRICAL CHARACTERISTICS  
(TC = 25˚C , unless Otherwise specified.)  
PARAMETER  
OFF CHARACTERISTICS  
Drain-Source Breakdown Voltage  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
BVDSS  
IDSS  
VGS = 0V, ID = 250µA  
800  
V
10  
µA  
Drain-Source Leakage Current  
Gate-Body Leakage Current  
VDS = 800V, VGS = 0V  
IGSSF  
IGSSR  
VGS = 30V, VDS = 0V  
Forward  
Reverse  
100  
nA  
nA  
VGS = -30V, VDS = 0V  
-100  
ID = 250µA, Referenced to  
25°C  
ΔBVDSS / ΔTJ  
Breakdown Voltage Temperature Coefficient  
0.99  
V / ˚C  
ON CHARACTERISTICS  
Gate Threshold Voltage  
VGS(TH)  
RDS(ON)  
gFS  
VDS = VGS, ID = 250µA  
VGS = 10V, ID =5.0A  
2.0  
4.0  
V
S
Static Drain-Source On-Resistance  
1.15  
0.92  
5.5  
VDS = 40V, ID = 3.5A (Note 4)  
Forward Transconductance  
DYNAMIC CHARACTERISTICS  
Input Capacitance  
CISS  
COSS  
CRSS  
2800  
230  
20  
pF  
pF  
pF  
VDS = 25V, VGS = 0V,  
f = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
SWITCHING CHARACTERISTICS  
Turn-On Delay Time  
tD(ON)  
60  
ns  
tR  
tD(OFF)  
tF  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
V
DD =400V,I  
D
= 9.4A, R  
G
= 25Ω  
150  
120  
120  
58  
ns  
ns  
(Note 4,5)  
ns  
QG  
nC  
nC  
V
DS = 640V,I =9.4A,VGS = 10V  
D
QGS  
17.5  
(Note 4,5)  
QGD  
Gate-Drain Charge  
22  
nC  
2016. 07. 05  
Revision No : 0  
2/7  
FTK10N80P/F/DD  
(TJ  
=
˚C ,  
Otherwise specified.)  
unless  
25  
ELECTRICAL CHARACTERISTICS  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS  
VSD  
IS  
V
GS = 0 V, I = 10A  
S
Drain-Source Diode Forward Voltage  
1.4  
10  
V
A
Maximum Continuous Drain-Source Diode  
Forward Current  
Maximum Pulsed Drain-Source Diode Forward  
Current  
ISM  
36  
A
tRR  
VGS = 0 V, IS = 10A,  
Reverse Recovery Time  
650  
7.0  
ns  
QRR  
dIF/dt =100 A/µs (Note 4)  
Reverse Recovery Charge  
µC  
Note:  
1. Repetitive Rating : Pulse width limited by maximum junction temperature  
2. L = 17.3mH, IAS = 10A, VDD = 50V, R = 25 Ω, Starting T = 25°C  
3. ISD μs, VDD ≤ BVDSS, Starting TJ = 25°C  
G
J
≤ 9.4A, di/dt ≤ 300A/  
4. Pulse Test: Pulse width ≤ 300μs, Duty cycle ≤ 2%  
5. Essentially independent of operating temperature  
2016. 07. 05  
Revision No : 0  
3/7  
FTK10N80P/F/DD  
Typical Characteristics  
VGS  
15.0 V  
10.0 V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
Top :  
101  
101  
150oC  
Bottom : 5.5 V  
55oC  
25oC  
100  
100  
-1  
2. TC = 25  
101  
1. VDS = 50V  
8
10  
-1  
10  
-1  
2
4
6
10  
10  
100  
VGS, Gate-Source Voltage [V]  
VDS, Drain-Source Voltage [V]  
Figure 1. On Region Characteristics  
Figure 2. Transfer Characteristics  
2.5  
2.0  
1.5  
1.0  
0.5  
101  
VGS = 10V  
VGS = 20V  
100  
150  
25  
1. VGS = 0V  
J = 25  
-1  
10  
0
5
10  
15  
20  
25  
30  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
ID, Drain Current [A]  
VSD, Source-Drain voltage [V]  
Figure 3. On Resistance Variation vs  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature  
4000  
3500  
3000  
2500  
2000  
1500  
1000  
500  
12  
10  
8
C
C
C
iss = Cgs + Cgd (Cds = shorted)  
oss = Cds + Cgd  
rss = Cgd  
VDS = 160V  
VDS = 400V  
C
iss  
VDS = 640V  
6
Coss  
4
1. VGS = 0 V  
2. f = 1 MHz  
2
C
rss  
* Note : ID = 9.4A  
0
0
10  
-1  
0
10  
20  
30  
40  
50  
60  
70  
100  
101  
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
2016. 07. 05  
Revision No : 0  
4/7  
FTK10N80P/F/DD  
3.0  
2.5  
2.0  
1.5  
1.0  
1.2  
1.1  
1.0  
0.9  
0.8  
* Notes :  
1. VGS = 10 V  
1. VGS = 0 V  
2. ID  
0.5  
2. ID = 4.7 A  
0.0  
-100  
-50  
0
50  
100  
150  
200  
-100  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
Figure 7. Breakdown Voltage Variation  
vs Temperature  
Figure 8. On-Resistance Variation  
vs Temperature  
10  
8
Operation in This Area  
is Limited by R DS(on)  
102  
101  
100  
10  
s
100  
s
1 ms  
10 ms  
100 ms  
DC  
6
4
-1  
10  
* Notes :  
1. TC = 25 o  
2
C
2. TJ = 150 o  
C
3. Single Pulse  
-2  
0
25  
10  
100  
101  
102  
103  
50  
75  
100  
125  
150  
TC, Case Temperature [oC]  
VDS, Drain-Source Voltage [V]  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs Case Temperature  
100  
D=0 5  
0.2  
* Notes :  
1. Z JC(t) = 1.93 oC/W Max.  
2. Duty Factor, D=t1/t2  
3. TJM - TC = PDM * Z JC(t)  
0.1  
-1  
10  
0 05  
0 02  
0 01  
PDM  
t1  
single pu se  
-2  
10  
t2  
-5  
-4  
-3  
-2  
10  
-1  
10  
10  
10  
10  
100  
101  
t1, Square Wave Pulse Duration [sec]  
Figure 11. Transient Thermal Response Curve  
2016. 07. 05  
Revision No : 0  
5/7  
FTK10N80P/F/DD  
+
D.U.T.  
VDS  
-
+
-
L
RG  
Driver  
VDD  
* dv/dt controlled by R  
G
* ISD controlled by pulse period  
* D.U.T.-Device Under Test  
Same Type  
as D.U.T.  
VGS  
Fig. 1A Peak Diode Recovery dv/dt Test Circuit  
Period  
P. W.  
VGS  
(Driver)  
D=  
P.W.  
Period  
10V  
=
VGS  
I
FM, Body Diode Forward Current  
ISD  
(D.U.T.)  
di/dt  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
VDS  
(D.U.T.)  
VDD  
Body Diode  
Forward Voltage Drop  
Fig. 1B Peak Diode Recovery dv/dt Waveforms  
2016. 07. 05  
Revision No : 0  
6/7  
FTK10N80P/F/DD  
TEST CIRCUITS AND WAVEFORMS (Cont.)  
RL  
VDS  
VDS  
90%  
VDD  
VGS  
RG  
10%  
VGS  
D.U.T.  
10V  
tD(ON)  
tD(OFF)  
Pulse Width 1μs  
Duty Factor 0 1%  
tF  
tR  
Fig. 2A Switching Test Circuit  
Fig. 2B Switching Waveforms  
Same Type  
as D.U.T.  
50kΩ  
QG  
12V  
10V  
0 3μF  
0.2μF  
VDS  
QGS  
QGD  
VGS  
DUT  
VG  
3mA  
Charge  
Fig. 3A Gate Charge Test Circuit  
Fig. 3B Gate Charge Waveform  
L
VDS  
BVDSS  
RD  
VDD  
10V  
D.U.T.  
tp  
IAS  
Time  
tp  
Fig. 4A Unclamped Inductive Switching Test Circuit  
Fig. 4B Unclamped Inductive Switching Waveforms  
2016. 07. 05  
Revision No : 0  
7/7  

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