BSC0925ND [INFINEON]

极低的栅极和输出电荷,结合极低的导通状态电阻和小体积封装,使 OptiMOS™ 25V 成为要求较高的服务器、数据通信和通信电压调节器解决方案的最佳选择。OptiMOS™ 30V 产品专为满足笔记本电脑的电源管理需求而量身定制,可改善电磁干扰行为,以及延长电池寿命。可用于半桥配置(功率级 5x6);
BSC0925ND
型号: BSC0925ND
厂家: Infineon    Infineon
描述:

极低的栅极和输出电荷,结合极低的导通状态电阻和小体积封装,使 OptiMOS™ 25V 成为要求较高的服务器、数据通信和通信电压调节器解决方案的最佳选择。OptiMOS™ 30V 产品专为满足笔记本电脑的电源管理需求而量身定制,可改善电磁干扰行为,以及延长电池寿命。可用于半桥配置(功率级 5x6)

通信 电池 栅 数据通信 服务器 电脑 栅极 调节器
文件: 总10页 (文件大小:625K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BSC0925ND  
OptiMOSTM Power-MOSFET  
Product Summary  
Features  
VDS  
30  
5
V
• Dual N-channel OptiMOS™ MOSFET  
• Optimized for clean switching  
• 100% avalanche tested  
• Superior thermal resistance  
RDS(on),max  
ID  
mW  
A
40  
8.6  
13  
QOSS  
nC  
nC  
QG(0V..10V)  
• Optimized for high performance Buck converter  
• Qualified according to JEDEC1) for target applications  
• Pb-free lead plating; RoHS compliant  
VPhase  
• Halogen-free according to IEC61249-2-21  
Type  
Package  
Marking  
0925ND  
BSC0925ND  
PG-TISON-8  
Maximum ratings, at T j=25 °C, unless otherwise specified2)  
Value  
Parameter  
Symbol Conditions  
Unit  
I D  
V GS=10 V, T C=25 °C  
Continuous drain current  
40  
A
V GS=4.5 V,  
T A=25 °C3)  
15  
12  
V GS=4.5 V,  
T A=70 °C3)  
V GS=10 V, T A=25 °C4)  
T C=25 °C  
11  
160  
14  
Pulsed drain current5)  
I D,pulse  
E AS  
I D=20 A, R GS=25 W  
Avalanche energy, single pulse  
Gate source voltage  
mJ  
V
V GS  
±20  
1) J-STD20 and JESD22  
2) One transistor active  
3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
4) Device mounted on a minimum pad (one layer, 70 µm thick). One transistor active  
5) See figure 3 for more detailed information.  
Rev. 2.0  
page 1  
2013-07-30  
BSC0925ND  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
P tot  
T C=25 °C  
Power dissipation  
30  
W
T A=25 °C,  
R thJA=50 K/W3)  
2.5  
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... 150  
55/150/56  
°C  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Thermal characteristics  
R thJC  
Thermal resistance, junction - case  
-
-
-
-
-
-
-
-
4.2  
20  
K/W  
top  
6 cm2 cooling area3)  
minimum footprint4)  
R thJA  
Device on PCB  
50  
125  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS V GS=0 V, I D=1 mA  
V GS(th) V DS=V GS, I D=250 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
30  
-
-
-
V
1.2  
2.0  
V DS=30 V, V GS=0 V,  
T j=25 °C  
I DSS  
Zero gate voltage drain current  
-
-
0.1  
10  
1
µA  
V DS=30 V, V GS=0 V,  
T j=125 °C  
100  
I GSS  
V GS=20 V, V DS=0 V  
Gate-source leakage current  
-
-
10  
5.6  
4.2  
2.6  
100 nA  
R DS(on) V GS=4.5 V, I D=20 A  
V GS=10 V, I D=20 A  
R G  
Drain-source on-state resistance  
7
5
mW  
-
Gate resistance  
1.3  
5.2  
W
|V DS|>2|I D|R DS(on)max  
I D=30 A  
,
g fs  
Transconductance  
38  
77  
-
S
Rev. 2.0  
page 2  
2013-07-30  
BSC0925ND  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Dynamic characteristics  
C iss  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
-
-
-
-
-
-
-
870  
330  
49  
1157 pF  
V GS=0 V, V DS=15 V,  
f =1 MHz  
C oss  
Crss  
t d(on)  
t r  
439  
-
4.7  
3.8  
17  
-
-
-
-
ns  
V DD=15 V, V GS=10 V,  
I D=20 A, R G,ext=1.6 W  
t d(off)  
t f  
Turn-off delay time  
Fall time  
3.0  
Gate Charge Characteristics6)  
Gate to source charge  
Gate charge at threshold  
Gate to drain charge  
Switching charge  
Q gs  
-
-
-
-
-
-
2.4  
1.4  
2.2  
3.2  
6.7  
2.8  
3.2  
-
nC  
Q g(th)  
Q gd  
2.9  
-
V DD=15 V, I D=30 A,  
V GS=0 to 4.5 V  
Q sw  
Q g  
Gate charge total  
8.9  
-
V plateau  
Gate plateau voltage  
V
V DD=15 V, I D=30 A,  
V GS=0 to 10 V  
Q g  
Gate charge total  
-
13  
17  
nC  
V DS=0.1 V,  
V GS=0 to 4.5 V  
Q g(sync)  
Gate charge total, sync. FET  
Output charge  
-
-
5.4  
8.6  
-
Q oss  
V DD=15 V, V GS=0 V  
11  
Reverse Diode  
I S  
Diode continuous forward current  
Diode pulse current  
-
-
-
-
30  
A
T C=25 °C  
I S,pulse  
120  
V GS=0 V, I F=20 A,  
T j=25 °C  
V SD  
Diode forward voltage  
-
-
0.87  
5
1
-
V
V R=15 V, I F=I S,  
di F/dt =400 A/µs  
Q rr  
Reverse recovery charge  
nC  
6) See figure 16 for gate charge parameter definition  
Rev. 2.0  
page 3  
2013-07-30  
BSC0925ND  
1 Power dissipation  
2 Drain current  
P tot=f(T C)  
I D=f(T C); V GS≥10 V  
40  
30  
20  
10  
0
50  
40  
30  
20  
10  
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
TC [°C]  
TC [°C]  
3 Safe operating area  
I D=f(V DS); T C=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
Z thJC=f(t p)  
parameter: D =t p/T  
103  
101  
limited by on-state  
resistance  
1 µs  
0.5  
102  
10 µs  
100  
0.2  
100 µs  
10 ms  
0.1  
1 ms  
101  
0.05  
0.02  
DC  
10-1  
0.01  
100  
single pulse  
10-1  
10-2  
10-1  
100  
101  
102  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
VDS [V]  
tp [s]  
Rev. 2.0  
page 4  
2013-07-30  
BSC0925ND  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
R DS(on)=f(I D); T j=25 °C  
parameter: V GS  
parameter: V GS  
250  
8
3.3 V  
7
10 V  
8 V  
5 V  
200  
4.5 V  
6
4.5 V  
5 V  
5
150  
100  
50  
8 V  
10 V  
4
3
2
1
0
3.3 V  
0
0
1
2
3
0
10  
20  
30  
40  
50  
VDS [V]  
ID [A]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
250  
200  
150  
100  
50  
160  
120  
80  
40  
0
150 °C  
25 °C  
0
0
1
2
3
4
5
0
20  
40  
60  
80  
100  
VGS [V]  
ID [A]  
Rev. 2.0  
page 5  
2013-07-30  
BSC0925ND  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
R DS(on)=f(T j); I D=20 A; V GS=10 V  
V GS(th)=f(T j); V GS=V DS; I D=250 µA  
7
6
5
2.5  
2
typ  
1.5  
1
4
3
2
1
0
0.5  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Tj [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
10000  
104  
103  
102  
101  
100  
Ciss  
1000  
103  
Coss  
100  
102  
150 °C  
25 °C  
Crss  
10-1  
0
10  
101  
0.5  
1
1.5  
0
5
10  
15  
20  
25  
VDS [V]  
VSD [V]  
Rev. 2.0  
page 6  
2013-07-30  
BSC0925ND  
13 Avalanche characteristics  
14 Typ. gate charge  
V GS=f(Q gate); I D=30 A pulsed  
parameter: V DD  
I AS=f(t AV); R GS=25 W  
parameter: T j(start)  
100  
12  
10  
8
15 V  
6 V  
24 V  
25 °C  
10  
6
100 °C  
125 °C  
4
2
1
0
1
10  
100  
1000  
0
4
8
12  
16  
tAV [µs]  
Qgate [nC]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V BR(DSS)=f(T j); I D=1 mA  
34  
32  
30  
28  
26  
24  
22  
20  
V GS  
Qg  
V gs(th)  
Qg(th)  
Qsw  
Qgd  
Qgate  
Qgs  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Rev. 2.0  
page 7  
2013-07-30  
BSC0925ND  
Package Outline  
PG-TISON  
Rev. 2.0  
page 8  
2013-07-30  
BSC0925ND  
PG-TISON  
Dimensions in mm  
Rev. 2.0  
page 9  
2013-07-30  
BSC0925ND  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2012 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev. 2.0  
page 10  
2013-07-30  

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