IPD50N06S3L06ATMA1 [INFINEON]

Power Field-Effect Transistor, 50A I(D), 55V, 0.006ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, GREEN, PLASTIC PACKAGE-3;
IPD50N06S3L06ATMA1
型号: IPD50N06S3L06ATMA1
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 50A I(D), 55V, 0.006ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, GREEN, PLASTIC PACKAGE-3

脉冲 晶体管
文件: 总9页 (文件大小:158K)
中文:  中文翻译
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IPD50N06S3L-06  
OptiMOS®-T Power-Transistor  
Product Summary  
VDS  
55  
6.0  
50  
V
R DS(on),max  
I D  
m  
A
Features  
• N-channel - Logic Level - Enhancement mode  
• Automotive AEC Q101 qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green package (RoHS compliant)  
• Ultra low Rds(on)  
PG-TO252-3-11  
• 100% Avalanche tested  
Type  
Package  
Marking  
IPD50N06S3L-06  
PG-TO252-3-11 3N06L06  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
Continuous drain current1)  
I D  
T C=25 °C, VGS=10 V  
T C=100 °C,  
50  
50  
A
V
GS=10 V2)  
Pulsed drain current2)  
Avalanche energy, single pulse2)  
I D,pulse  
EAS  
T C=25 °C  
I D=25 A  
200  
710  
mJ  
A
I AS  
Avalanche current, single pulse  
50  
Gate source voltage3)  
VGS  
±16  
V
Ptot  
T C=25 °C  
Power dissipation  
136  
W
°C  
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... +175  
55/175/56  
Rev. 1.2  
page 1  
2009-05-20  
IPD50N06S3L-06  
Values  
Parameter  
Symbol  
Conditions  
Unit  
min.  
typ.  
max.  
Thermal characteristics2)  
R thJC  
R thJA  
Thermal resistance, junction - case  
SMD version, device on PCB  
-
-
-
-
-
-
1.1  
62  
40  
K/W  
minimal footprint  
6 cm2 cooling area4)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS  
VGS(th)  
V
V
GS=0 V, I D= 1 mA  
DS=VGS, I D=80 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
55  
-
-
V
1.2  
1.7  
2.2  
V
DS=55 V, VGS=0 V,  
I DSS  
Zero gate voltage drain current  
-
-
0.01  
1
1
µA  
T j=25 °C  
V
DS=55 V, VGS=0 V,  
100  
T j=125 °C2)  
I GSS  
V
V
V
GS=16 V, VDS=0 V  
GS=5 V, I D=37 A  
GS=10 V, I D=50 A  
Gate-source leakage current  
-
-
-
1
100 nA  
R DS(on)  
Drain-source on-state resistance  
8.4  
5.1  
11  
6
mΩ  
Rev. 1.2  
page 2  
2009-05-20  
IPD50N06S3L-06  
Values  
Parameter  
Symbol  
Conditions  
Unit  
min.  
typ.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t r  
-
-
-
-
-
-
-
9400  
1200  
1130  
20  
11750 pF  
1800  
V
GS=0 V, VDS=25 V,  
f =1 MHz  
1700  
-
-
-
-
ns  
V
V
DD=27.5 V,  
GS=10 V, I D=50 A,  
57  
t d(off)  
t f  
Turn-off delay time  
Fall time  
75  
R G=7 Ω  
115  
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
37  
27  
50  
40  
145  
-
nC  
Q gd  
V
V
DD=11 V, I D=50 A,  
GS=0 to 10 V  
Q g  
129  
3.9  
Vplateau  
Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
-
-
-
-
50  
T C=25 °C  
I S,pulse  
200  
V
GS=0 V, I F=50 A,  
VSD  
Diode forward voltage  
0.6  
0.9  
1.3  
V
T j=25 °C  
Reverse recovery time2)  
Reverse recovery charge2)  
t rr  
-
-
47  
62  
-
-
ns  
VR=27.5 V, I F=I S,  
diF/dt =100 A/µs  
Q rr  
nC  
1) Current is limited by bondwire; with an R thJC = 1.1 K/W the chip is able to carry 112 A at 25°C. For detailed  
information see Application Note ANPS071E.  
2) Defined by design. Not subject to production test.  
3) Qualified at -5V and +20V.  
4) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 1.2  
page 3  
2009-05-20  
IPD50N06S3L-06  
1 Power dissipation  
2 Drain current  
P
tot = f(T C); VGS 4 V  
I D = f(T C); VGS 4 V  
160  
140  
120  
100  
80  
60  
40  
20  
0
60  
40  
20  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
C [°C]  
T
C [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
thJC = f(t p)  
I D = f(VDS); T C = 25 °C; D = 0  
parameter: t p  
Z
parameter: D =t p/T  
101  
1000  
100  
10  
1 µs  
100  
0.5  
10 µs  
100 µs  
0.1  
1 ms  
10-1  
0.05  
0.01  
10-2  
single pulse  
10-3  
1
10-7  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
0.1  
1
10  
100  
t p [s]  
V
DS [V]  
Rev. 1.2  
page 4  
2009-05-20  
IPD50N06S3L-06  
5 Typ. output characteristics  
I D = f(VDS); T j = 25 °C  
parameter: VGS  
6 Typ. drain-source on-state resistance  
DS(on) = f(I D); T j = 25 °C  
R
parameter: VGS  
200  
10  
10 V  
6 V  
5 V  
6 V  
175  
150  
125  
100  
75  
8
6
5 V  
4.5 V  
8 V  
9 V  
4 V  
50  
10 V  
3.5 V  
25  
0
4
0
0
2
4
6
8
10  
50  
100  
150  
200  
V
DS [V]  
I
D [A]  
7 Typ. transfer characteristics  
I D = f(VGS); VDS = 4 V  
parameter: T j  
8 Typ. drain-source on-state resistance  
R
DS(on) = f(T j); I D = 50 A; VGS = 10 V  
150  
100  
50  
10  
-55 °C  
25 °C  
175 °C  
8
6
4
2
0
0
2
4
6
-60  
-20  
20  
60  
100  
140  
180  
V
GS [V]  
T j [°C]  
Rev. 1.2  
page 5  
2009-05-20  
IPD50N06S3L-06  
9 Typ. gate threshold voltage  
GS(th) = f(T j); VGS = VDS  
10 Typ. capacitances  
V
C = f(VDS); VGS = 0 V; f = 1 MHz  
parameter: I D  
2.5  
2.25  
2
Ciss  
104  
Coss  
800µA  
1.75  
1.5  
1.25  
1
Crss  
80µA  
103  
0.75  
102  
0.5  
-60  
0
5
10  
15  
DS [V]  
20  
25  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
11 Typical forward diode characteristicis  
12 Typ. avalanche characteristics  
AV = f(t AV  
IF = f(VSD)  
I
)
parameter: T j  
parameter: Tj(start)  
103  
102  
101  
100  
25°C  
100°C  
150°C  
10  
25 °C  
175 °C  
100  
1
1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
10  
100  
1000  
V
SD [V]  
t AV [µs]  
Rev. 1.2  
page 6  
2009-05-20  
IPD50N06S3L-06  
13 Typical avalanche Energy  
AS = f(T j)  
14 Drain-source breakdown voltage  
E
V
BR(DSS) = f(T j); I D = 1 mA  
parameter: I D  
65  
1500  
12.5 A  
1200  
60  
55  
50  
45  
900  
25 A  
600  
50 A  
300  
0
0
-60  
-20  
20  
60  
100  
140  
180  
50  
100  
150  
200  
T j [°C]  
T j [°C]  
15 Typ. gate charge  
GS = f(Q gate); I D = 50 A pulsed  
16 Gate charge waveforms  
V
parameter: VDD  
12  
V GS  
44 V  
11 V  
Q g  
10  
8
Vplateau  
6
V gs(th)  
4
2
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
0
0
50  
100  
150  
200  
Q
gate [nC]  
Rev. 1.2  
page 7  
2009-05-20  
IPD50N06S3L-06  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2009  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.2  
page 8  
2009-05-20  
IPD50N06S3L-06  
Revision History  
Version  
Date  
Changes  
Implementation of avalanche  
07.11.2007 current single pulse  
Data Sheet version 1.1  
Data Sheet version 1.1  
Data Sheet version 1.1  
Data Sheet version 1.1  
Data Sheet version 1.2  
Data Sheet version 1.2  
07.11.2007 Update of package drawing  
Update of avalanche diagram 12  
07.11.2007 and 13  
implementation of footnote 2 for  
07.11.2007 Eas specification  
Correction of marking and update  
15.06.2009 of disclaimer  
15.06.2009 Correction of package name  
Rev. 1.2  
page 9  
2009-05-20  

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