IRF6604PBF [INFINEON]

Power Field-Effect Transistor, 12A I(D), 30V, 0.0115ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, ROHS AND REACH COMPLIANT, MQ, ISOMETRIC-3;


型号：	IRF6604PBF
厂家：	Infineon
描述：	Power Field-Effect Transistor, 12A I(D), 30V, 0.0115ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, ROHS AND REACH COMPLIANT, MQ, ISOMETRIC-3 晶体晶体管功率场效应晶体管开关脉冲
文件：	总11页 (文件大小：205K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

PD - 94365B

IRF6604

HEXFET^®Power MOSFET

l Application Specific MOSFETs

l Ideal for CPU Core DC-DC Converters

l Low Conduction Losses

V_DSS

30V

R_DS(on)max

11.5mΩ@V_GS= 7.0V

13mΩ@V_GS= 4.5V

17nC

l Low Switching Losses

l Low Profile (<0.7 mm)

l Dual Sided Cooling Compatible

l Compatible with existing Surface Mount

Techniques

DirectFET ISOMETRIC

Description

The IRF6604 combines the latest HEXFET® Power MOSFET Silicon technology with the advanced DirectFET^TMpackaging

to achieve the lowest on-state resistance charge product in a package that has the footprint of an SO-8 and only 0.7 mm

profile. The DirectFET package is compatible with existing layout geometries used in power applications, PCB assembly

equipment and vapor phase, infra-red or convection soldering techniques. The DirectFET package allows dual sided cooling

to maximize thermal transfer in power systems, IMPROVING previous best thermal resistance by 80%.

The IRF6604 balances both low resistance and low charge along with ultra low package inductance to reduce both conduc-

tion and switching losses. The reduced total losses make this product ideal for high efficiency DC-DC converters that power

the latest generation of processors operating at higher frequencies. The IRF6604 has been optimized for parameters that

are critical in synchronous buck converters including Rds(on) and gate charge to minimize losses in the control FET socket.

Absolute Maximum Ratings

Parameter

Max.

Units

V_DS

Drain-to-Source Voltage

Gate-to-Source Voltage

±12

Continuous Drain Current, V_GS@ 7.0V

Pulsed Drain Current

@ T_C= 25°C

@ T_A= 25°C

@ T_A= 70°C

9.2

Power Dissipation

@T_A= 25°C

@T_A= 70°C

@T_C= 25°C

2.3

1.5

Power Dissipation

Linear Derating Factor

Operating Junction and

0.018

-40 to + 150

W/°C

°C

Storage Temperature Range

STG

Thermal Resistance

Parameter

Junction-to-Ambient

Typ.

–––

12.5

Max.

Units

R_θJA

–––

3.0

Junction-to-Ambient

Junction-to-Case

R_θJA

°C/W

R_θJC

–––

1.0

R_θJ-PCB

Junction-to-PCB Mounted

–––

Notes through are on page 11

www.irf.com

6/11/03

IRF6604

Static @ T_J= 25°C (unless otherwise specified)

Parameter

Min. Typ. Max. Units

Conditions

BV_DSS

∆Β

Drain-to-Source Breakdown Voltage

–––

V_GS= 0V, I_D= 250µA

∆

_DSS/ T_J

Breakdown Voltage Temp. Coefficient –––

Static Drain-to-Source On-Resistance –––

–––

––– mV/°C Reference to 25°C, I_D= 1mA

mΩ

R_DS(on)

9.0

11.5

V_GS= 7.0V, I_D= 12A

V_GS= 4.5V, I_D= 9.6A

V_DS= V_GS, I_D= 250µA

V_GS(th)

Gate Threshold Voltage

1.0

–––

-4.5

–––

3.0

∆

V_GS(th)/ T_J

Gate Threshold Voltage Coefficient

Drain-to-Source Leakage Current

––– mV/°C

I_DSS

100

-100

–––

µA

V_DS= 24V, V_GS= 0V

V_DS= 24V, V_GS= 0V, T_J= 125°C

I_GSS

Gate-to-Source Forward Leakage

Gate-to-Source Reverse Leakage

Forward Transconductance

Total Gate Charge

_GS= 12V

_GS= -12V

gfs

Q_g

V_DS= 15V, I_D= 9.6A

–––

Q_gs1

Pre-Vth Gate-to-Source Charge

Post-Vth Gate-to-Source Charge

Gate-to-Drain Charge

4.1

1.0

6.3

5.6

7.3

9.5

–––

V_DS= 15V

Q_gs2

Q_gd

nC V_GS= 4.5V

I_D= 9.6A

Q_godr

Gate Charge Overdrive

See Fig. 16

Q_sw

Switch Charge (Q_gs2+ Q_gd)

Q_oss

t_d(on)

t_r

Output Charge

V_DS= 16V, V_GS= 0V

Turn-On Delay Time

Rise Time

V_DD= 15V, V_GS= 4.5V

I_D= 9.6A

4.3

t_d(off)

t_f

Turn-Off Delay Time

Fall Time

ns Clamped Inductive Load

C_iss

C_oss

C_rss

Input Capacitance

Output Capacitance

Reverse Transfer Capacitance

––– 2270 –––

_GS= 0V

–––

420

190

–––

V_DS= 15V

ƒ = 1.0MHz

Avalanche Characteristics

Parameter

Single Pulse Avalanche Energy

Typ.

–––

Max.

Units

E_AS

I_AR

9.6

Avalanche Current

Repetitive Avalanche Energy

E_AR

0.23

Diode Characteristics

Parameter

Min. Typ. Max. Units

Conditions

I_S

Continuous Source Current

–––

MOSFET symbol

(Body Diode)

Pulsed Source Current

showing the

integral reverse

I_SM

–––

(Body Diode)

p-n junction diode.

V_SD

t_rr

Diode Forward Voltage

–––

0.94

1.2

T = 25°C, I = 9.6A, V = 0V

J S GS

Reverse Recovery Time

Reverse Recovery Charge

Forward Turn-On Time

ns T = 25°C, I = 9.6A

J F

Q_rr

t_on

di/dt = 100A/µs

Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)

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IRF6604

1000

100

1000

100

VGS

10V

VGS

10V

TOP

7.0V

4.5V

4.0V

3.5V

3.3V

3.0V

7.0V

4.5V

4.0V

3.5V

3.3V

3.0V

BOTTOM 2.7V

2.7V

20µs PULSE WIDTH

Tj = 150°C

20µs PULSE WIDTH

Tj = 25°C

0.1

100

0.1

100

, Drain-to-Source Voltage (V)

Fig 1. Typical Output Characteristics

Fig 2. Typical Output Characteristics

2.0

100.00

12A

= 150°C

1.5

1.0

0.5

0.0

= 25°C

10.00

= 15V

20µs PULSE WIDTH

= 7.0V

1.00

2.5

3.0

3.5

4.0

-60 -40 -20

80 100 120 140 160

T , Junction Temperature

( C)

, Gate-to-Source Voltage (V)

Fig 3. Typical Transfer Characteristics

Fig 4. Normalized On-Resistance

Vs. Temperature

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IRF6604

10000

6.0

5.0

4.0

3.0

2.0

1.0

0.0

= 0V,

f = 1 MHZ

= 9.6A

= C + C

SHORTED

iss

= 24V

= 15V

= C

rss

= C + C

oss

Ciss

1000

Coss

Crss

100

, Drain-to-Source Voltage (V)

Total Gate Charge (nC)

Fig 6. Typical Gate Charge Vs.

Fig 5. Typical Capacitance Vs.

Gate-to-Source Voltage

Drain-to-Source Voltage

100

1000

100

OPERATION IN THIS AREA

LIMITED BY R

(on)

T = 150

T = 25

100µsec

1msec

10msec

Tc = 25°C

Tj = 150°C

Single Pulse

= 0 V

0.1

0.0

0.5

1.0

1.5

2.0

100

1000

,Source-to-Drain Voltage (V)

, Drain-toSource Voltage (V)

Fig 7. Typical Source-Drain Diode

Fig 8. Maximum Safe Operating Area

Forward Voltage

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IRF6604

2.0

1.8

1.6

1.4

1.2

1.0

0.8

0.6

0.4

0.2

0.0

= 250µA

100

125

150

-75 -50 -25

75 100 125 150

T_A, Ambient Temperature

(°C)

, Temperature ( °C )

Fig 9. Maximum Drain Current Vs.

Fig 10. Threshold Voltage Vs. Temperature

Ambient Temperature

100

D = 0.50

0.20

0.10

0.05

0.02

0.01

SINGLE PULSE

Notes:

(THERMAL RESPONSE)

1. Duty factor D =

2. Peak T = P

/ t

+ T

thJA

0.1

0.00001

0.0001

0.001

0.01

0.1

100

t , Rectangular Pulse Duration (sec)

Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient

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IRF6604

15V

TOP

4.3A

7.7A

9.6A

BOTTOM

DRIVER

D.U.T

20V

Ω

0.01

Fig 12a. Unclamped Inductive Test Circuit

(BR)DSS

100

125

150

( C)

Starting Tj, Junction Temperature

Fig 12c. Maximum Avalanche Energy

Vs. Drain Current

L_D

V_DS

Fig 12b. Unclamped Inductive Waveforms

V_DD

D.U.T

Current Regulator

V_GS

Same Type as D.U.T.

Pulse Width < 1µs

Duty Factor < 0.1%

50KΩ

.2µF

12V

Fig 14a. Switching Time Test Circuit

V_DS

.3µF

D.U.T.

90%

3mA

10%

V_GS

Current Sampling Resistors

t_d(on)

t_d(off)

t_r

t_f

Fig 13. Gate Charge Test Circuit

Fig 14b. Switching Time Waveforms

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IRF6604

Driver Gate Drive

P.W.

D =

D.U.T

Period

=10V

Circuit Layout Considerations

• Low Stray Inductance

• Ground Plane

• Low Leakage Inductance

Current Transformer

D.U.T. I Waveform

Reverse

Recovery

Current

Body Diode Forward

Current

di/dt

D.U.T. V Waveform

Diode Recovery

dv/dt

V_DD

Re-Applied

Voltage

• dv/dt controlled by R_G

• Driver same type as D.U.T.

• I_SDcontrolled by Duty Factor "D"

• D.U.T. - Device Under Test

R_G

Body Diode

Forward Drop

Inductor Curent

Ripple ≤ 5%

* V_GS= 5V for Logic Level Devices

Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel

HEXFET^®Power MOSFETs

Vds

Vgs

Vgs(th)

Qgs1

Qgs2

Qgd

Qgodr

Fig 16. Gate Charge Waveform

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IRF6604

Power MOSFET Selection for Non-Isolated DC/DC Converters

Synchronous FET

Control FET

The power loss equation for Q2 is approximated

by;

Special attention has been given to the power losses

in the switching elements of the circuit - Q1 and Q2.

Power losses in the high side switch Q1, also called

the Control FET, are impacted by the R_ds(on)of the

MOSFET, but these conduction losses are only about

one half of the total losses.

P = P

+ P + P^*

drive output

loss

conduction

P = I_rms²× R_ds(on)

loss ( )

Power losses in the control switch Q1 are given

by;

+ Q × V × f

(

)



Q_oss



P_loss= P_conduction+ P_switching+ P_drive+ P_output



×V × f + Q × V × f

in rr in

(

)

 2



This can be expanded and approximated by;

*dissipated primarily in Q1.

= I ²× R_{ds(on )}

(

)

loss

rms

For the synchronous MOSFET Q2, R_ds(on)is an im-

portant characteristic; however, once again the im-

portance of gate charge must not be overlooked since

it impacts three critical areas. Under light load the

MOSFET must still be turned on and off by the con-

trol IC so the gate drive losses become much more

significant. Secondly, the output charge Q_ossand re-

verse recovery charge Q_rrboth generate losses that

are transfered to Q1 and increase the dissipation in

that device. Thirdly, gate charge will impact the

MOSFETs’ susceptibility to Cdv/dt turn on.



Q_gd

i_g



Q_gs2

i_g













+ I ×

× V × f + I ×

× V × f







+ Q × V × f

(

 Q_oss



)





×V × f

This simplified loss equation includes the terms Q_gs2

The drain of Q2 is connected to the switching node

of the converter and therefore sees transitions be-

tween ground and V_in. As Q1 turns on and off there is

a rate of change of drain voltage dV/dt which is ca-

pacitively coupled to the gate of Q2 and can induce

a voltage spike on the gate that is sufficient to turn

the MOSFET on, resulting in shoot-through current .

The ratio of Q_gd/Q_gs1must be minimized to reduce the

potential for Cdv/dt turn on.

and Q_osswhich are new to Power MOSFET data sheets.

Q_gs2is a sub element of traditional gate-source

charge that is included in all MOSFET data sheets.

The importance of splitting this gate-source charge

into two sub elements, Q_gs1and Q_gs2, can be seen from

Fig 16.

Q_gs2indicates the charge that must be supplied by

the gate driver between the time that the threshold

voltage has been reached and the time the drain cur-

rent rises to I_dmaxat which time the drain voltage be-

gins to change. Minimizing Q_gs2is a critical factor in

reducing switching losses in Q1.

Q_ossis the charge that must be supplied to the out-

put capacitance of the MOSFET during every switch-

ing cycle. Figure A shows how Q_ossis formed by the

parallel combination of the voltage dependant (non-

linear) capacitances C_dsand C_dgwhen multiplied by

the power supply input buss voltage.

Figure A: Q_ossCharacteristic

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IRF6604

DirectFET Outline Dimension, MQ Outline

(Medium Size Can, Q-Designation).

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IRF6604

DirectFET Board Footprint, MQ Outline

(Medium Size Can, Q-Designation).

DirectFET Tape & Reel Dimension

(Showing component orientation).

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IRF6604

DirectFET Part Marking

6604

Notes:

Surface mounted on 1 in. square Cu board.

Repetitive rating; pulse width limited by

max. junction temperature.

Starting T_J= 25°C, L = 0.70mH

R_G= 25Ω, I_AS= 9.6A.

ꢀ Used double sided cooling , mounting pad.

Mounted on minimum footprint full size board with metalized

back and with small clip heatsink.

Pulse width ≤ 400µs; duty cycle ≤ 2%.

T_Cmeasured with thermal couple mounted to top (Drain) of

part.

Data and specifications subject to change without notice.

This product has been designed and qualified for the Consumer market.

Qualification Standards can be found on IR’s Web site.

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105

TAC Fax: (310) 252-7903

Visit us at www.irf.com for sales contact information.6/03

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IRF6604PBF [INFINEON]

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