IRLR8743 [INFINEON]
The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. ;型号: | IRLR8743 |
厂家: | Infineon |
描述: | The StrongIRFET™ power MOSFET family is optimized for low RDS(on) and high current capability. The devices are ideal for low frequency applications requiring performance and ruggedness. The comprehensive portfolio addresses a broad range of applications including DC motors, battery management systems, inverters, and DC-DC converters. |
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中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
PD - 96123
IRLR8743PbF
IRLU8743PbF
HEXFET® Power MOSFET
Applications
l High Frequency Synchronous Buck
Converters for Computer Processor Power
l High Frequency Isolated DC-DC
Converters with Synchronous Rectification
for Telecom and Industrial Use
l Lead-Free
VDSS RDS(on) max
Qg
39nC
3.1m
30V
D
Benefits
S
S
D
l Very Low RDS(on) at 4.5V VGS
l Ultra-Low Gate Impedance
l Fully Characterized Avalanche Voltage
and Current
G
G
D-Pak
I-Pak
IRLR8743PbF
IRLU8743PbF
G
D
S
Gate
Drain
Source
Absolute Maximum Ratings
Parameter
Max.
30
Units
V
VDS
Drain-to-Source Voltage
V
Gate-to-Source Voltage
± 20
160
113
GS
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Pulsed Drain Current
I
I
I
@ TC = 25°C
@ TC = 100°C
D
D
A
640
135
68
DM
Maximum Power Dissipation
Maximum Power Dissipation
P
P
@TC = 25°C
@TC = 100°C
W
D
D
Linear Derating Factor
Operating Junction and
0.90
-55 to + 175
W/°C
°C
T
J
T
Storage Temperature Range
STG
Soldering Temperature, for 10 seconds
300 (1.6mm from case)
Thermal Resistance
Parameter
Junction-to-Case
Typ.
–––
–––
–––
Max.
1.11
50
Units
RθJC
RθJA
RθJA
Junction-to-Ambient (PCB Mount)
°C/W
Junction-to-Ambient
110
Notes through ꢀ are on page 11
www.irf.com
1
08/15/07
IRLR/U8743PbF
Static @ TJ = 25°C (unless otherwise specified)
Parameter
Min. Typ. Max. Units
Conditions
VGS = 0V, ID = 250µA
BVDSS
∆Β
RDS(on)
30
–––
–––
–––
1.35
–––
–––
–––
–––
–––
89
–––
–––
V
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-Resistance
∆
V
DSS/ TJ
20
––– mV/°C Reference to 25°C, ID = 1mA
2.4
3.0
1.9
-6.4
–––
–––
–––
–––
–––
39
3.1
3.9
VGS = 10V, ID = 25A
VGS = 4.5V, ID = 20A
VDS = VGS, ID = 100µA
Ω
m
VGS(th)
2.35
V
Gate Threshold Voltage
∆
V
∆
GS(th)/ TJ
––– mV/°C
Gate Threshold Voltage Coefficient
Drain-to-Source Leakage Current
IDSS
1.0
µA
VDS = 24V, VGS = 0V
VDS = 24V, VGS = 0V, TJ = 125°C
VGS = 20V
150
IGSS
100
nA
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Forward Transconductance
Total Gate Charge
-100
VGS = -20V
gfs
Qg
–––
59
S
V
DS = 15V, ID = 20A
–––
–––
–––
–––
–––
–––
–––
Qgs1
10
–––
–––
–––
–––
–––
–––
V
DS = 15V
GS = 4.5V
Pre-Vth Gate-to-Source Charge
Post-Vth Gate-to-Source Charge
Gate-to-Drain Charge
Gate Charge Overdrive
Switch Charge (Qgs2 + Qgd)
Output Charge
Qgs2
Qgd
3.9
13
nC
V
ID = 20A
Qgodr
12
See Fig. 16
Qsw
17
Qoss
21
nC VDS = 16V, VGS = 0V
RG
td(on)
tr
Gate Resistance
–––
–––
–––
–––
–––
0.85
19
1.5
–––
–––
–––
–––
Ω
VDD = 15V, VGS = 4.5V
Turn-On Delay Time
35
ID = 20A
ns
Rise Time
td(off)
tf
21
R = 1.8
Ω
Turn-Off Delay Time
G
17
See Fig. 14
Fall Time
Ciss
Coss
Crss
––– 4880 –––
VGS = 0V
Input Capacitance
–––
–––
950
470
–––
–––
VDS = 15V
ƒ = 1.0MHz
pF
Output Capacitance
Reverse Transfer Capacitance
Avalanche Characteristics
Parameter
Typ.
–––
–––
–––
Max.
250
20
Units
mJ
A
EAS
Single Pulse Avalanche Energy
IAR
Avalanche Current
EAR
13.5
mJ
Repetitive Avalanche Energy
Diode Characteristics
Parameter
Min. Typ. Max. Units
Conditions
IS
–––
–––
MOSFET symbol
Continuous Source Current
160
(Body Diode)
showing the
integral reverse
A
ISM
–––
–––
Pulsed Source Current
640
(Body Diode)
p-n junction diode.
VSD
–––
–––
–––
–––
18
1.0
27
48
V
T = 25°C, I = 20A, V = 0V
J S GS
Diode Forward Voltage
trr
ns T = 25°C, I = 20A, VDD = 15V
Reverse Recovery Time
J
F
Qrr
di/dt = 300A/µs
32
nC
Reverse Recovery Charge
ton
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Forward Turn-On Time
2
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IRLR/U8743PbF
1000
100
10
1000
100
10
VGS
10V
VGS
10V
TOP
TOP
4.5V
3.7V
3.5V
3.3V
3.0V
2.7V
2.5V
4.5V
3.7V
3.5V
3.3V
3.0V
2.7V
2.5V
BOTTOM
BOTTOM
2.5V
1
2.5V
60µs PULSE WIDTH
Tj = 175°C
≤
60µs PULSE WIDTH
Tj = 25°C
≤
1
0.1
0.1
1
10
100
0.1
1
10
100
V
, Drain-to-Source Voltage (V)
DS
V
, Drain-to-Source Voltage (V)
DS
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
1000
2.0
1.5
1.0
0.5
I
= 25A
D
V
= 10V
GS
100
10
1
T
= 175°C
J
T
= 25°C
V
J
= 15V
DS
≤
60µs PULSE WIDTH
0.1
0
2
4
6
8
-60 -40 -20 0 20 40 60 80 100120140160180
, Junction Temperature (°C)
T
J
V
, Gate-to-Source Voltage (V)
GS
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
vs. Temperature
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3
IRLR/U8743PbF
5.0
4.0
3.0
2.0
1.0
0.0
100000
V
= 0V,
= C
f = 1 MHZ
I = 20A
GS
D
V
V
= 24V
= 15V
C
C
C
+ C , C
SHORTED
DS
DS
iss
gs
gd
ds
= C
rss
oss
gd
= C + C
ds
gd
10000
1000
100
C
iss
C
oss
C
rss
0
5
10 15 20 25 30 35 40 45 50
1
10
, Drain-to-Source Voltage (V)
100
Q , Total Gate Charge (nC)
G
V
DS
Fig 6. Typical Gate Charge vs.
Fig 5. Typical Capacitance vs.
Gate-to-Source Voltage
Drain-to-Source Voltage
10000
1000
100
10
1000
100
10
OPERATION IN THIS AREA
LIMITED BY R
(on)
DS
T
= 175°C
J
100µsec
1msec
10msec
T
J
= 25°C
1
1
Tc = 25°C
Tj = 175°C
Single Pulse
V
= 0V
GS
0.1
0.1
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
, Source-to-Drain Voltage (V)
0
1
10
100
V
, Drain-to-Source Voltage (V)
V
SD
DS
Fig 8. Maximum Safe Operating Area
Fig 7. Typical Source-Drain Diode
Forward Voltage
4
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IRLR/U8743PbF
180
160
140
120
100
80
2.5
2.0
1.5
1.0
0.5
Limited By Package
I
= 100µA
D
60
40
20
0
-75 -50 -25
0
25 50 75 100 125 150175 200
25
50
75
100
125
150
175
T , Temperature ( °C )
J
T
, Case Temperature (°C)
C
Fig 9. Maximum Drain Current vs.
Fig 10. Threshold Voltage vs. Temperature
Case Temperature
10
1
0.1
D = 0.50
0.20
0.10
0.05
Ri (°C/W) τi (sec)
R1
R1
R2
R2
R3
R3
R4
R4
0.02879
0.000017
τ
τ
J τJ
τ
C
0.25773
0.000143
0.02
0.01
1τ1
Ci= τi/Ri
τ
τ
τ
2 τ2
3τ3
4τ4
0.48255 0.001411
0.34135 0.010617
0.01
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
SINGLE PULSE
( THERMAL RESPONSE )
0.001
1E-006
1E-005
0.0001
0.001
0.01
0.1
t
, Rectangular Pulse Duration (sec)
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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5
IRLR/U8743PbF
15V
1200
1000
800
600
400
200
0
I
D
TOP
2.7A
3.7A
DRIVER
+
L
V
DS
BOTTOM 20A
D.U.T
AS
R
G
V
DD
-
I
A
2
VGS
Ω
0.01
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
25
50
75
100
125
150
175
Starting T , Junction Temperature (°C)
J
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
I
AS
RD
Fig 12b. Unclamped Inductive Waveforms
VDS
VGS
D.U.T.
RG
+VDD
-
Current Regulator
Same Type as D.U.T.
VGS
PulseWidth ≤ 1 µs
Duty Factor ≤ 0.1 %
50KΩ
.2µF
12V
.3µF
Fig 14a. Switching Time Test Circuit
+
V
DS
V
D.U.T.
DS
-
90%
V
GS
3mA
10%
I
I
D
G
V
GS
Current Sampling Resistors
t
t
r
t
t
f
d(on)
d(off)
Fig 13. Gate Charge Test Circuit
Fig 14b. Switching Time Waveforms
6
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IRLR/U8743PbF
Driver Gate Drive
P.W.
Period
D.U.T
Period
D =
P.W.
+
*
=10V
V
GS
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
D.U.T. I Waveform
SD
+
-
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
-
+
D.U.T. V Waveform
DS
Diode Recovery
dv/dt
V
DD
VDD
Re-Applied
Voltage
• dv/dt controlled by RG
RG
+
-
Body Diode
Forward Drop
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Inductor Curent
I
SD
Ripple ≤ 5%
* VGS = 5V for Logic Level Devices
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
Vgs(th)
Qgs1
Qgs2
Qgodr
Qgd
Fig 16. Gate Charge Waveform
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7
IRLR/U8743PbF
Power MOSFET Selection for Non-Isolated DC/DC Converters
Synchronous FET
Control FET
The power loss equation for Q2 is approximated
by;
Special attention has been given to the power losses
in the switching elements of the circuit - Q1 and Q2.
Power losses in the high side switch Q1, also called
the Control FET, are impacted by the Rds(on) of the
MOSFET, but these conduction losses are only about
one half of the total losses.
P = P
+ P + P*
loss
conduction
drive
output
P = Irms 2 × Rds(on)
loss ( )
Power losses in the control switch Q1 are given
by;
+ Q × V × f
(
)
g
g
⎛
⎜
Qoss
⎞
⎠
Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput
+
×V × f + Q × V × f
(
)
in
rr
in
⎝ 2
This can be expanded and approximated by;
*dissipated primarily in Q1.
P
= I 2 × Rds(on )
(
)
loss
rms
For the synchronous MOSFET Q2, Rds(on) is an im-
portant characteristic; however, once again the im-
portance of gate charge must not be overlooked since
it impacts three critical areas. Under light load the
MOSFET must still be turned on and off by the con-
trol IC so the gate drive losses become much more
significant. Secondly, the output charge Qoss and re-
verse recovery charge Qrr both generate losses that
are transfered to Q1 and increase the dissipation in
that device. Thirdly, gate charge will impact the
MOSFETs’ susceptibility to Cdv/dt turn on.
⎛
⎛
Qgd
ig
⎞
Qgs2
ig
⎞
⎟
⎜
⎟
⎜
+ I ×
× V × f + I ×
× V × f
in
in
⎝
⎠
⎝
⎠
+ Q × V × f
(
)
g
g
⎛ Qoss
⎞
⎠
+
×V × f
in
⎝
2
This simplified loss equation includes the terms Qgs2
The drain of Q2 is connected to the switching node
of the converter and therefore sees transitions be-
tween ground and Vin. As Q1 turns on and off there is
a rate of change of drain voltage dV/dt which is ca-
pacitively coupled to the gate of Q2 and can induce
a voltage spike on the gate that is sufficient to turn
the MOSFET on, resulting in shoot-through current .
The ratio of Qgd/Qgs1 must be minimized to reduce the
potential for Cdv/dt turn on.
and Qoss which are new to Power MOSFETdata sheets.
Qgs2 is a sub element of traditional gate-source
charge that is included in all MOSFET data sheets.
The importance of splitting this gate-source charge
into two sub elements, Qgs1 and Qgs2, can be seen from
Fig 16.
Qgs2 indicates the charge that must be supplied by
the gate driver between the time that the threshold
voltage has been reached and the time the drain cur-
rent rises to Idmax at which time the drain voltage be-
gins to change. Minimizing Qgs2 is a critical factor in
reducing switching losses in Q1.
Qoss is the charge that must be supplied to the out-
put capacitance of the MOSFET during every switch-
ing cycle. Figure A shows how Qoss is formed by the
parallel combination of the voltage dependant (non-
linear) capacitances Cds and Cdg when multiplied by
the power supply input buss voltage.
Figure A: Qoss Characteristic
8
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IRLR/U8743PbF
D-Pak (TO-252AA) Package Outline
Dimensions are shown in millimeters (inches)
D-Pak (TO-252AA) Part Marking Information
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
www.irf.com
9
IRLR/U8743PbF
I-Pak (TO-251AA) Package Outline
Dimensions are shown in millimeters (inches)
I-Pak (TO-251AA) Part Marking Information
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
10
www.irf.com
IRLR/U8743PbF
D-Pak (TO-252AA) Tape & Reel Information
Dimensions are shown in millimeters (inches)
TR
TRL
TRR
16.3 ( .641 )
15.7 ( .619 )
16.3 ( .641 )
15.7 ( .619 )
12.1 ( .476 )
11.9 ( .469 )
8.1 ( .318 )
7.9 ( .312 )
FEED DIRECTION
FEED DIRECTION
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
13 INCH
16 mm
NOTES :
1. OUTLINE CONFORMS TO EIA-481.
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
Notes:
Calculated continuous current based on maximum allowable
Repetitive rating; pulse width limited by
max. junction temperature.
junction temperature. Package limitation current is 50A.
Starting TJ = 25°C, L = 1.252mH, RG = 25Ω,
IAS = 20A.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
ꢀ When mounted on 1" square PCB (FR-4 or G-10 Material).
For recommended footprint and soldering techniques refer to
application note #AN-994.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.08/2007
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11
IMPORTANT NOTICE
The information given in this document shall in no For further information on the product, technology,
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please
characteristics (“Beschaffenheitsgarantie”) .
contact your nearest Infineon Technologies office
(www.infineon.com).
With respect to any examples, hints or any typical
values stated herein and/or any information
regarding the application of the product, Infineon
Technologies hereby disclaims any and all
warranties and liabilities of any kind, including
without limitation warranties of non-infringement
of intellectual property rights of any third party.
WARNINGS
Due to technical requirements products may
contain dangerous substances. For information on
the types in question please contact your nearest
Infineon Technologies office.
In addition, any information given in this document
is subject to customer’s compliance with its
obligations stated in this document and any
applicable legal requirements, norms and
standards concerning customer’s products and any
use of the product of Infineon Technologies in
customer’s applications.
Except as otherwise explicitly approved by Infineon
Technologies in a written document signed by
authorized
representatives
of
Infineon
Technologies, Infineon Technologies’ products may
not be used in any applications where a failure of
the product or any consequences of the use thereof
can reasonably be expected to result in personal
injury.
The data contained in this document is exclusively
intended for technically trained staff. It is the
responsibility of customer’s technical departments
to evaluate the suitability of the product for the
intended application and the completeness of the
product information given in this document with
respect to such application.
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