HS-1115RH_02 [INTERSIL]

Radiation Hardened, High Speed, Low Power Output Limiting, Closed-Loop-Buffer Amplifier; 抗辐射,高速,低功率输出限制,闭环,缓冲放大器
HS-1115RH_02
型号: HS-1115RH_02
厂家: Intersil    Intersil
描述:

Radiation Hardened, High Speed, Low Power Output Limiting, Closed-Loop-Buffer Amplifier
抗辐射,高速,低功率输出限制,闭环,缓冲放大器

缓冲放大器
文件: 总4页 (文件大小:133K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
®
HS-1115RH  
Radiation Hardened, High Speed, Low Power  
Output Limiting, Closed-Loop-Buffer Amplifier  
August 1996  
Features  
Description  
• Electrically Screened to SMD 5962F9678501VPA  
• MIL-PRF-38535 Class V Compliant  
The HS-1115RH is a radiation hardened, high speed closed  
loop buffer featuring both user programmable gain and out-  
put limiting. They are QML approved and processed in full  
compliance with MIL-PRF-38535. Manufactured in propri-  
etary, complementary bipolar UHF-1 (DI bonded wafer) pro-  
cess, the HS-1115RH also offers a wide -3dB bandwidth of  
225MHz, very fast slew rate, excellent gain flatness and high  
output current.  
• User Programmable Output Voltage Limiting  
• User Programmable For Closed-Loop Gains of +1, -1  
or +2 Without Use of External Resistors  
• Standard Operational Amplifier Pinout  
• Fast Overdrive Recovery . . . . . . . . . . . . . . . <1ns (Typ)  
• Low Supply Current. . . . . . . . . . . . . . . . . . 6.9mA (Typ)  
• Excellent Gain Accuracy. . . . . . . . . . . . . .0.99V/V (Typ)  
• Wide -3dB Bandwidth . . . . . . . . . . . . . . . 225MHz (Typ)  
• Fast Slew Rate . . . . . . . . . . . . . . . . . . . . 1135V/μs (Typ)  
• High Input Impedance . . . . . . . . . . . . . . . . . . 1MΩ (Typ)  
• Excellent Gain Flatness (to 50MHz) . . . . . ±0.1dB (Typ)  
• Total Gamma Dose . . . . . . . . . . . . . . . . . 300K RAD (Si)  
This buffer is the ideal choice for high frequency applications  
requiring output limiting, especially those needing ultra fast  
overload recovery times. The limiting function allows the  
designer to set the maximum positive and negative output  
levels, thereby protecting later stages from damage or input  
saturation. The HS-1115RH also allows for voltage gains of  
+2, +1, and -1, without the use of external resistors. Gain  
selection is accomplished via connections to the inputs, as  
described in the “Application Information” text. The result is a  
• Neutron Damage . . . . . . . TBD (When Tests Complete) more flexible product, fewer part types in inventory, and  
more efficient use of board space.  
• Latch Up . . . . . . . . . . . . . . . . . . . None (DI Technology)  
Compatibility with existing op amp pinouts provides flexibility to  
Applications  
upgrade low gain amplifiers, while decreasing component  
count. Unlike most buffers, the standard pinout provides an  
upgrade path should a higher closed loop gain be needed at a  
future date.  
• Flash A/D Driver  
• Video Switching and Routing  
• Pulse and Video Amplifiers  
• Wideband Amplifiers  
• RF/IF Signal Processing  
• Imaging Systems  
Detailed electrical specifications are contained in SMD  
5962F9678501VPA, available on the Intersil Website.  
A Cross Reference Table is available on the Intersil Website  
for conversion of Intersil Part Numbers to SMDs. The address is:  
www.intersil.com/military/crossref.asp  
Ordering Information  
SMD numbers must be used to order Radiation Hardened  
Products.  
TEMP.  
PART NUMBER  
RANGE (oC)  
-55 to 125  
-40 to 85  
PACKAGE  
8 Ld CERDIP  
8 Ld PDIP  
PKG. NO.  
GDIP1-T8  
E8.3  
5962F9678501VPA  
HFA1115IP  
(Sample)  
HFA11XXEVAL  
Evaluation Board  
Pinout  
HS-1115RH  
MIL-STD-1835, GDIP1-T8  
(PDIP, CERDIP)  
TOP VIEW  
350  
NC  
-IN  
+IN  
V-  
1
2
3
4
8
7
6
5
V
H
350  
V+  
-
+
OUT  
V
L
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc.  
FN4098.1  
Copyright © Intersil Americas Inc. 2002. All Rights Reserved  
1
PRISM® is a registered trademark of Intersil Americas Inc. PRISM  
and design is a trademark of Intersil Americas Inc.  
HS-1115RH  
Application Information  
Closed Loop Gain Selection  
The HS-1115RH features a novel design which allows the Another straightforward approach is to add a 620Ω resistor  
user to select from three closed loop gains, without any in series with the positive input. This resistor and the  
external components. The result is a more flexible product, HS-1115RH input capacitance form a low pass filter which  
fewer part types in inventory, and more efficient use of board rolls off the signal bandwidth before gain peaking occurs.  
space.  
This configuration was employed to obtain the datasheet AC  
and transient parameters for a gain of +1.  
This “buffer” operates in closed loop gains of -1, +1, or +2, and  
gain selection is accomplished via connections to the ±inputs.  
Applying the input signal to +IN and floating -IN selects a gain  
of +1 (see next section for layout caveats), while grounding -IN  
selects a gain of +2. A gain of -1 is obtained by applying the  
input signal to -IN with +IN grounded.  
PC Board Layout  
The frequency response of this amplifier depends greatly on  
the amount of care taken in designing the PC board. The  
use of low inductance components such as chip resis-  
tors and chip capacitors is strongly recommended,  
while a solid ground plane is a must!  
The table below summarizes these connections:  
CONNECTIONS  
GAIN  
Attention should be given to decoupling the power supplies.  
A large value (10μF) tantalum in parallel with a small value  
(0.1μF) chip capacitor works well in most cases.  
(ACL  
)
+INPUT (PIN 3)  
-INPUT (PIN 2)  
-1  
GND  
Input  
+1  
Input  
NC (Floating)  
GND  
+2  
Input  
Terminated microstrip signal lines are recommended at the  
input and output of the device. Capacitance directly on the  
output must be minimized, or isolated as discussed in the  
next section.  
Unity Gain Considerations  
Unity gain selection is accomplished by floating the -Input of  
the HS-1115RH. Anything that tends to short the -Input to  
GND, such as stray capacitance at high frequencies, will  
cause the amplifier gain to increase toward a gain of +2. The  
result is excessive high frequency peaking, and possible  
instability. Even the minimal amount of capacitance associ-  
ated with attaching the -Input lead to the PCB results in  
approximately 3dB of gain peaking. At a minimum this  
requires due care to ensure the minimum capacitance at the  
-Input connection.  
For unity gain applications, care must also be taken to  
minimize the capacitance to ground seen by the amplifier’s  
inverting input. At higher frequencies this capacitance will  
tend to short the -INPUT to GND, resulting in a closed loop  
gain which increases with frequency. This will cause  
excessive high frequency peaking and potentially other  
problems as well.  
An example of a good high frequency layout is the  
Evaluation Board shown in Figure 1.  
Table 1 lists five alternate methods for configuring the  
HS-1115RH as a unity gain buffer, and the corresponding  
performance. The implementations vary in complexity and  
involve performance trade-offs. The easiest approach to  
implement is simply shorting the two input pins together, and  
applying the input signal to this common node. The amplifier  
bandwidth drops from 400MHz to 200MHz, but excellent  
gain flatness is the benefit. Another drawback to this  
approach is that the amplifier input noise voltage and input  
offset voltage terms see a gain of +2, resulting in higher  
noise and output offset voltages. Alternately, a 100pF  
capacitor between the inputs shorts them only at high  
frequencies, which prevents the increased output offset  
voltage but delivers less gain flatness.  
Driving Capacitive Loads  
Capacitive loads, such as an A/D input, or an improperly  
terminated transmission line will degrade the amplifier’s  
phase margin resulting in frequency response peaking and  
possible oscillations. In most cases, the oscillation can be  
avoided by placing a resistor (RS) in series with the output  
prior to the capacitance.  
RS and CL form a low pass network at the output, thus limit-  
ing system bandwidth well below the amplifier bandwidth of  
225MHz. By decreasing RS as CLincreases the maximum  
bandwidth is obtained without sacrificing stability.  
TABLE 1. UNITY GAIN PERFORMANCE FOR VARIOUS IMPLEMENTATIONS  
±0.1dB GAIN FLATNESS  
APPROACH  
PEAKING (dB)  
BW (MHz)  
400  
+SR/-SR (V/μs)  
1200/850  
1125/800  
1050/775  
875/550  
(MHz)  
Remove Pin 2  
2.5  
0.6  
0
20  
25  
65  
45  
19  
+RS = 620Ω  
170  
+RS = 620Ω and Remove Pin 2  
Short Pins 2, 3  
165  
0
200  
100pF cap. between pins 2, 3  
0.2  
190  
900/550  
FN4098.1  
2
HS-1115RH  
Evaluation Board  
The performance of the HS-1115RH may be evaluated using The layout and modified schematic of the board are shown  
the HFA11XX Evaluation Board, slightly modified as follows: in Figure 1.  
1. Remove the 500Ω feedback resistor (R2), and leave the  
To order evaluation boards, please contact your local sales  
office.  
connection open.  
2. a. For AV = +1 evaluation, remove the 500Ω gain setting  
resistor (R1), and leave pin 2 floating.  
b. For AV = +2, replace the 500Ω gain setting resistor with  
a 0Ω resistor to GND.  
(A = +1)  
V
or 0Ω (A = +2)  
V
V
H
R1  
V
H
1
2
3
4
8
7
6
5
0.1μF  
50Ω  
10μF  
+5V  
50Ω  
1
IN  
OUT  
+IN  
OUT  
V+  
V
L
V
L
V-  
10μF  
0.1μF  
GND  
GND  
GND  
-5V  
FIGURE 1A. SCHEMATIC  
FIGURE 1B. TOP LAYOUT  
FIGURE 1C. BOTTOM LAYOUT  
FIGURE 1. EVALUATION BOARD SCHEMATIC AND LAYOUT  
Burn-In Circuit  
Irradiation Circuit  
HS-1115RH CERDIP  
HS-1115RH CERDIP  
R
1
R
1
1
2
3
8
7
6
5
1
2
3
4
8
7
6
5
D
3
V+  
V+  
-
-
C
+
+
D
1
1
C
D
4
1
4
V-  
V-  
C
D
1
C
2
2
NOTES:  
R1 = 100Ω, ±5% (Per Socket)  
C1 = C2 = 0.01μF (Per Socket) or 0.1μF (Per Row) Minimum  
D1 = D2 = 1N4002 or Equivalent (Per Board)  
D3 = D4 = 1N4002 or Equivalent (Per Socket)  
V+ = +5.5V ±0.5V  
NOTES:  
R1 = 100Ω, ±5%  
C1 = 0.01μF  
V+ = +5.0V ±0.5V  
V- = -5.0V ±0.5V  
V- = -5.5V ±0.5V  
FN4098.1  
3
HS-1115RH  
Die Characteristics  
DIE DIMENSIONS:  
GLASSIVATION:  
59 mils x 58.2 mils x 19 mils ±1 mil  
1500μm x 1480μm x 483μm ±25.4μm  
Type: Nitride  
Thickness: 4kÅ ±0.5kÅ  
METALLIZATION:  
Type: Metal 1: AICu(2%)/TiW  
Thickness: Metal 1: 8kÅ ±0.4kÅ  
Type: Metal 2: AICu(2%)  
Thickness: Metal 2: 16kÅ ±0.8kÅ  
WORST CASE CURRENT DENSITY:  
< 2 x 105 A/cm2  
TRANSISTOR COUNT: 89  
SUBSTRATE POTENTIAL (Powered Up): Floating  
Metallization Mask Layout  
HS-1115RH  
-IN  
V
H
V+  
OUT  
+IN  
V-  
V
L
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice.  
Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reli-  
able. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may  
result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site www.intersil.com  
FN4098.1  
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