EFC2J004NUZTDG [ONSEMI]

Dual N-Channel Power MOSFET for 1-Cell Lithium-ion Battery Protection, 12 V, 14 A, 7.1 mΩ;
EFC2J004NUZTDG
型号: EFC2J004NUZTDG
厂家: ONSEMI    ONSEMI
描述:

Dual N-Channel Power MOSFET for 1-Cell Lithium-ion Battery Protection, 12 V, 14 A, 7.1 mΩ

电池
文件: 总8页 (文件大小:190K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATA SHEET  
www.onsemi.com  
MOSFET – Power, Dual,  
N-Channel, for 1-Cell  
Lithium-ion Battery  
Protection  
V
R
Max  
I Max  
SSS  
SS(on)  
S
7.1 m@ 4.5 V  
7.7 m@ 3.8 V  
9.5 m@ 3.1 V  
12.4 m@ 2.5 V  
12 V  
14 A  
12 V, 7.1 mW, 14 A  
ELECTRICAL CONNECTION  
N-Channel  
EFC2J004NUZ  
This Power MOSFET features a low onstate resistance. This  
device is suitable for applications such as power switches of portable  
machines. Best suited for 1cell lithiumion battery applications.  
4, 6  
5
Features  
2.5 V Drive  
1: Source1  
2: Gate1  
3: Source1  
4: Source 2  
5: Gate2  
2 kV ESD HBM  
2
Common-Drain Type  
ESD Diode-Protected Gate  
PbFree, Halide Free and RoHS Compliant  
6: Source2  
1, 3  
Applications  
1-Cell Lithium-ion Battery Charging and Discharging Switch  
MARKING  
DIAGRAM  
Specifications  
NA  
AYWZZ  
G
ABSOLUTE MAXIMUM RATINGS (T = 25°C)  
A
WLCSP6,  
2.11x1.18x0.10  
CASE 567NP  
Parameter  
Source to Source Voltage  
Gate to Source Voltage  
Source Current (DC)  
Symbol  
Value  
12  
Unit  
V
V
SSS  
GSS  
NA = Device Code  
V
8
V
A
Y
= Assembly Location  
= Year  
I
S
14  
A
W
= Work Week  
Source Current (Pulse)  
PW 100 s, duty cycle 1%  
I
SP  
60  
A
ZZ = Assembly Lot Number  
G
= PbFree Package  
Total Dissipation (Note 1)  
Junction Temperature  
Storage Temperature  
P
1.5  
150  
W
°C  
°C  
T
T
j
PIN CONNECTIONS  
T
stg  
55 to +150  
1: Source1  
2: Gate1  
3: Source1  
4: Source 2  
5: Gate2  
1
6
2
3
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
THERMAL RESISTANCE RATINGS  
6: Source2  
5
4
Parameter  
Symbol  
Value  
Unit  
Junction to Ambient (Note 1)  
R
83  
°C/W  
θ
JA  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 6 of  
this data sheet.  
2
1. Surface mounted on ceramic substrate (5000 mm × 0.8 mm).  
© Semiconductor Components Industries, LLC, 2022  
1
Publication Order Number:  
October, 2022 Rev. 2  
EFC2J004NUZ/D  
 
EFC2J004NUZ  
ELECTRICAL CHARACTERISTICS (T = 25°C) (Note 2)  
A
Parameter  
Symbol  
Conditions  
I = 1 mA, V = 0 V (Figure 1)  
Min  
12  
Typ  
Max  
Unit  
V
Source to Source Breakdown Voltage  
Zero-Gate Voltage Source Current  
Gate to Source Leakage Current  
Gate Threshold Voltage  
V
(BR)SSS  
S
GS  
I
V
= 10 V, V = 0 V (Figure 1)  
1
A  
A  
V
SSS  
GSS  
SS  
GS  
SS  
GS  
I
V
V
=
8 V, V = 0 V (Figure 2)  
1
SS  
V
R
(th)  
= 6 V, I = 1 mA (Figure 3)  
0.4  
3.7  
4.1  
4.6  
5.8  
1.3  
7.1  
7.7  
9.5  
12.4  
GS  
S
Static Source to Source On-State  
Resistance (Note 2)  
(on)  
I = 5 A, V = 4.5 V (Figure 4)  
5.4  
5.9  
6.7  
8.4  
15  
35  
100  
75  
36  
mꢁ  
mꢁ  
mꢁ  
mꢁ  
SS  
S
GS  
I = 5 A, V = 3.8 V (Figure 4)  
S
GS  
I = 5 A, V = 3.1 V (Figure 4)  
S
GS  
I = 5 A, V = 2.5 V (Figure 4)  
S
GS  
Turn-ON Delay Time  
Rise Time  
t (on)  
d
V
= 5 V, V = 3.8 V, I = 5 A,  
s
SS  
g
GS  
S
R = 10 k  
(Figure 5)  
t
r
s  
s  
s  
nC  
Turn-OFF Delay Time  
Fall Time  
t (off)  
d
t
f
Total Gate Charge  
Qg  
V
SS  
= 6 V, V = 4.5 V, I = 14 A  
GS  
S
(Figure 6)  
Forward Source to Source Voltage  
V
F(S-S)  
I = 3 A, V = 0 V  
(Figure 7)  
0.76  
V
S
GS  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
2. Mounted on onsemi board.  
www.onsemi.com  
2
 
EFC2J004NUZ  
Test Circuits are Example of Measuring FET1 Side  
/ I  
V
I
(BR)SSS SSS  
GSS  
S2  
S2  
S1  
G2  
G1  
G2  
A
G1  
A
V
SS  
When FET1 is measured,  
Gate and Source of FET2  
are shortcircuited.  
V
GS  
S1  
Figure 1. Test Circuit 1  
Figure 2. Test Circuit 2  
V
GS  
(th)  
R
(on)  
SS  
IS  
S2  
S1  
S2  
S1  
G2  
G1  
G2  
G1  
A
When FET1 is measured,  
Gate and Source of FET2  
are shortcircuited.  
V
V
SS  
V
GS  
V
GS  
Figure 3. Test Circuit 3  
t (on), t , t (off), t  
Figure 4. Test Circuit 4  
Qg  
S2  
G2  
d
r
d
f
S2  
RL  
A
G2  
When FET1 is measured,  
Gate and Source of FET2  
are shortcircuited.  
V
I
G
= 1 mA  
G1  
RL  
G1  
Rg  
V
SS  
S1  
S1  
V
SS  
PG  
When FET1 is measured,  
Gate and Source of FET2  
are shortcircuited.  
DC  
Figure 5. Test Circuit 5  
Figure 6. Test Circuit 6  
V
F(SS)  
S2  
I
S
G2  
G1  
VGS = 0 V  
V
When FET1 is measured,  
S1  
+4.5 V is added to V  
of FET2.  
GS  
Figure 7. Test Circuit 7  
NOTE: When FET2 is measured, the position of FET1 and FET2 is switched.  
www.onsemi.com  
3
EFC2J004NUZ  
6.0  
5.0  
4.0  
3.0  
15  
12  
9
3.1 V  
4.5 V  
T = 25°C  
A
V
SS  
= 6 V  
T = 75°C  
A
3.8 V  
25°C  
V
GS  
= 2.5 V  
6
3
0
2.0  
1.0  
25°C  
0
0
0.01  
0.02  
0.03  
0.04  
0.05  
0.06  
0
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8. 2.0  
V
SS  
, SOURCETOSOURCE VOLTAGE (V)  
Figure 8. IS VSS  
V
GS  
, GATETOSOURCE VOLTAGE (V)  
Figure 9. IS VGS  
10  
9
14  
12  
T = 25°C  
S
A
I
= 5 A  
V
GS  
= 2.5 V, I = 5 A  
S
8
10  
8
V
GS  
= 3.1 V, I = 5 A  
S
7
6
6
4
2
5
4
3
V
= 4.5 V, I = 5 A  
S
GS  
V
= 3.8 V, I = 5 A  
S
GS  
1
2
3
5
6
7
8
0
40  
4
60 40 20  
20  
60 80 100 120 140 160  
T , AMBIENT TEMPERATURE (°C)  
V
GS  
, GATETOSOURCE VOLTAGE (V)  
Figure 10. RSS(on) VGS  
A
Figure 11. RSS(on) Ta  
10  
7
1000  
100  
10  
7
5
V
GS  
= 0 V  
5
3
2
3
2
T = 75°C  
A
1.0  
7
5
7
5
3
3
2
td(off)  
25°C  
0.1  
7
2
tf  
tr  
5
3
2
25°C  
7
5
0.01  
7
5
V
V
= 5 V  
= 3.8 V  
td(on)  
SS  
3
2
3
2
GS  
I
= 5 A  
S
0.001  
1.0  
1.0  
2
3
5
7
10  
2
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
R , GATE RESISTANCE (kΩ)  
g
V , FORWARD SOURCE TO SOURCE VOLTAGE (V)  
F(S-S)  
Figure 12. IS VF(SS)  
Figure 13. SW Time Rg  
www.onsemi.com  
4
EFC2J004NUZ  
100  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0
7
V
I
= 6 V  
= 14 A  
SS  
5
3
2
I
I
= 60 A (PW 100 s)  
= 14 A  
10 μs  
100 μs  
1 ms  
SP  
S
S
10  
7
5
10 ms  
100 ms  
3
2
Operation in this area  
1.0  
7
is limited by R (on).  
SS  
DC Operation  
(T = 25°C)  
5
3
2
A
0.1  
T
= 25°C  
7
A
5
Single Pulse  
When mounted on ceramic substrate  
(5000 mm x 0.8 mm)  
3
2
2
0.01  
0.01  
7 0.1  
7 10  
2
3
5
2
3
71.0  
2
3
5
2
3
5
0
5
10  
15  
20  
25  
30  
35  
40  
V
SS  
, SOURCE TO SOURCE VOLTAGE (V)  
Q , TOTAL GATE CHARGE (nC)  
g
Figure 14. VGS Qg  
Figure 15. SOA  
1.6  
1.4  
Surface mounted on ceramic substrate  
(5000 mm x 0.8 mm)  
2
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
0
25  
50  
75  
100 125 150 175 200  
T , AMBIENT TEMPERATURE (°C)  
A
Figure 16. PT Ta  
100  
7
Duty Cycle = 0.5  
0.2  
5
3
2
0.1  
10  
7
0.05  
5
3
2
0.02  
0.01  
1.0  
7
5
Single Pulse  
3
2
Surface mounted on ceramic substrate  
(5000 mm x 0.8 mm)  
2
0.1  
2
3
5
7
5
7
2
3
5
7
2
3
2
3
5
7
2
3
5
7
2
3
5
7
0.0001  
0.01  
0.1  
1.0  
10  
0.00001  
0.001  
P , PULSE TIME (S)  
T
Figure 17. RqJA Pulse Time  
www.onsemi.com  
5
EFC2J004NUZ  
ORDERING INFORMATION  
Device  
Marking  
Package  
Shipping (Qty / Packing)  
EFC2J004NUZTDG  
NA  
WLCSP6, 2.11x1.18x0.10  
(PbFree / Halogen Free)  
5000 / Tape & Reel  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D.  
Note on usage: Since the EFC2J004NUZ is a MOSFET product, please avoid using this device in the vicinity of highly charged objects. Please contact sales  
for use except the designated application.  
www.onsemi.com  
6
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
WLCSP6, 2.11x1.18x0.10  
CASE 567NP  
ISSUE B  
SCALE 4:1  
DATE 22 DEC 2016  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER  
ASME Y14.5M, 1994.  
D
A
B
E
2. CONTROLLING DIMENSION: MILLIMETERS.  
MILLIMETERS  
DIM  
A
b
b1  
b2  
D
E
e
e2  
MIN  
0.08  
0.22  
0.27  
0.575  
NOM  
0.10  
0.25  
0.30  
0.605  
2.11 BSC  
1.18 BSC  
0.55 BSC  
0.6775 BSC  
MAX  
0.12  
0.28  
0.33  
0.635  
PIN A1  
REFERENCE  
2X  
0.05  
0.05  
C
C
2X  
TOP VIEW  
SIDE VIEW  
A
0.05  
0.05  
C
GENERIC  
MARKING DIAGRAM*  
C
SEATING  
C
PLANE  
XXXXXG  
AYWZZG  
4X b2  
0.05  
e2  
A
Y
= Assembly Location  
= Year  
M
C A B  
1
2
3
W
= Work Week  
e
ZZ = Assembly Lot  
G
= PbFree Package  
(Note: Microdot may be in either location)  
6
5
4
2X  
4X b1  
C A B  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
PbFree indicator, “G” or microdot “ G”,  
may or may not be present.  
b
M
M
0.05  
0.05  
BOTTOM VIEW  
C A B  
RECOMMENDED  
SOLDERING FOOTPRINT*  
4X  
0.605  
2X  
0.25  
PACKAGE  
OUTLINE  
0.55  
PITCH  
4X  
0.30  
1
0.678  
PITCH  
DIMENSIONS: MILLIMETERS  
*For additional information on our PbFree strategy and soldering  
details, please download the ON Semiconductor Soldering and  
Mounting Techniques Reference Manual, SOLDERRM/D.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON10195G  
WLCSP6, 2.11X1.18X0.10  
PAGE 1 OF 1  
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