FDMC8026S [ONSEMI]

30V N沟道PowerTrench® SyncFET™;
FDMC8026S
型号: FDMC8026S
厂家: ONSEMI    ONSEMI
描述:

30V N沟道PowerTrench® SyncFET™

开关 脉冲 光电二极管 晶体管
文件: 总9页 (文件大小:406K)
中文:  中文翻译
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June 2014  
FDMC8026S  
N-Channel PowerTrench® SyncFETTM  
30 V, 21 A, 4.4 mΩ  
Features  
General Description  
The FDMC8026S has been designed to minimize losses in  
power conversion application. Advancements in both silicon and  
package technologies have been combined to offer the lowest  
rDS(on) while maintaining excellent switching performance.This  
device has the added benefit of an efficient monolithic schottky  
body diode.  
„ Max rDS(on) = 4.4 mΩ at VGS = 10 V, ID = 19 A  
„ Max rDS(on) = 5.2 mΩ at VGS = 4.5 V, ID = 17.5 A  
„ Advanced package and silicon combination for low rDS(on) and  
high efficiency  
„ SyncFET Schottky Body Diode  
„ MSL1 robust package design  
„ 100% UIL tested  
Applications  
„ Synchronous Rectifier for DC/DC Converters  
„ Notebook Vcore/GPU low side switch  
„ Networking Point of Load low side switch  
„ Telecom secondary side rectification  
„ RoHS Compliant  
Top  
Bottom  
Pin 1  
S
S
D
D
S
S
S
G
S
D
D
D
G
D
D
D
MLP 3.3x3.3  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Continuous  
30  
V
V
(Note 4)  
(Note 1a)  
(Note 3)  
±20  
TC = 25°C  
TA = 25°C  
21  
ID  
19  
100  
A
-Pulsed  
EAS  
Single Pulse Avalance Energy  
Power Dissipation  
66  
mJ  
W
TC = 25°C  
TA = 25°C  
36  
PD  
Power Dissipation  
(Note 1a)  
2.4  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
3.4  
53  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ’’  
Tape Width  
12 mm  
Quantity  
FDMC8026S  
FDMC8026S  
MLP 3.3X3.3  
3000 units  
©2013 Fairchild Semiconductor Corporation  
FDMC8026S Rev.C7  
www.fairchildsemi.com  
1
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 1 mA, VGS = 0 V  
30  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 10 mA, referenced to 25 °C  
26  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
VDS = 24 V, VGS = 0 V  
500  
100  
μA  
Gate to Source Leakage Current, Forward VGS = 20 V, VDS = 0 V  
nA  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 1 mA  
D = 10 mA, referenced to 25 °C  
VGS = 10 V, ID = 19 A  
GS = 4.5 V, ID = 17.5 A  
1.2  
1.6  
-5  
3.0  
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
mV/°C  
3.8  
4.5  
4.4  
5.2  
V
rDS(on)  
Static Drain to Source On Resistance  
Forward Transconductance  
mΩ  
VGS = 10 V, ID = 19 A,  
TJ = 125 °C  
4.5  
5.8  
gFS  
VDS = 5 V, ID = 19 A  
106  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
2380  
885  
100  
0.7  
3165  
1175  
150  
pF  
pF  
pF  
Ω
VDS = 15 V, VGS = 0 V,  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
0.1  
2.5  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
11  
5
20  
10  
48  
10  
52  
25  
ns  
ns  
VDD = 15 V, ID = 19 A,  
V
GS = 10 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
30  
4
ns  
ns  
Qg  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 4.5 V  
37  
18  
6
nC  
nC  
nC  
nC  
Qg  
VDD = 15 V,  
D = 19 A  
I
Qgs  
Qgd  
6
Drain-Source Diode Characteristics  
V
GS = 0 V, IS = 2 A  
(Note 2)  
(Note 2)  
0.6  
0.8  
29  
0.8  
1.2  
47  
VSD  
Source to Drain Diode Forward Voltage  
V
VGS = 0 V, IS = 19 A  
trr  
Reverse Recovery Time  
ns  
IF = 19 A, di/dt = 300 A/μs  
Qrr  
Reverse Recovery Charge  
33  
53  
nC  
Notes:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R is determined by  
θCA  
θJA  
θJC  
the user's board design.  
a. 53 °C/W when mounted on a  
b. 125 °C/W when mounted on a  
minimum pad of 2 oz copper.  
2
1 in pad of 2 oz copper.  
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.  
3. E of 66 mJ is based on starting T = 25 °C, L = 0.3 mH, I = 21 A, V = 27 V, V = 10 V. 100% tested at L = 3 mH, I = 10.2 A.  
AS  
J
AS  
DD  
GS  
AS  
4. As an N-ch device, the negative Vgs rating is for low duty cycle pulse occurrence only. No continuous rating is implied.  
©2013 Fairchild Semiconductor Corporation  
FDMC8026S Rev.C7  
www.fairchildsemi.com  
2
Typical Characteristics TJ = 25 °C unless otherwise noted  
100  
5
4
3
2
1
0
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
VGS = 6 V  
80  
VGS = 4.5 V  
VGS = 3 V  
VGS = 4 V  
60  
VGS = 3.5 V  
VGS = 3 V  
VGS = 3.5 V  
40  
20  
PULSE DURATION = 80 μs  
VGS = 10 V  
80  
VGS = 4.5 V VGS = 6 V  
VGS = 4 V  
20  
DUTY CYCLE = 0.5% MAX  
0
0.0  
0.5  
1.0  
1.5  
2.0  
0
40  
60  
100  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs. Drain Current and Gate Voltage  
1.6  
12  
ID = 19 A  
GS = 10 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
V
ID = 19 A  
1.4  
1.2  
1.0  
0.8  
0.6  
9
6
3
0
TJ = 125 o  
C
TJ = 25 o  
C
2
4
6
8
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure4. On-Resistance vs. Gate to  
Source Voltage  
Figure 3. Normalized On Resistance  
vs. Junction Temperature  
100  
100  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 0 V  
80  
60  
40  
20  
0
VDS = 5 V  
TJ = 125 o  
C
TJ = 125 o  
C
10  
1
TJ = 25 oC  
TJ = 25 o  
C
TJ = -55 o  
C
TJ = -55 o  
C
0.1  
0.0  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs. Source Current  
©2013 Fairchild Semiconductor Corporation  
FDMC8026S Rev.C7  
www.fairchildsemi.com  
3
Typical Characteristics TJ = 25 °C unless otherwise noted  
10  
5000  
1000  
ID = 19 A  
8
Ciss  
VDD = 15 V  
VDD = 10 V  
6
4
2
0
Coss  
VDD = 20 V  
Crss  
100  
50  
f = 1 MHz  
= 0 V  
V
GS  
30  
0
8
16  
24  
32  
40  
0.1  
1
10  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s . D r a i n  
to Source Voltage  
80  
60  
40  
20  
0
30  
VGS = 10 V  
TJ = 25 oC  
10  
TJ = 100 oC  
VGS = 4.5 V  
TJ = 125 o  
C
R
θJC = 3.4 oC/W  
Limited by Package  
1
25  
50  
75  
100  
125  
150  
0.001  
0.01  
0.1  
1
10  
100  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10.M a x i m u m C o n t i n u o u s D r a i n  
Current vs. Case Temperature  
200  
100  
1000  
100 μs  
10  
1
100  
10  
1 ms  
10 ms  
100 ms  
1 s  
THIS AREA IS  
LIMITED BY rDS(on)  
SINGLE PULSE  
TJ = MAX RATED  
RθJA = 125oC/W  
SINGLE PULSE  
θJA = 125 oC/W  
0.1  
10 s  
DC  
R
T
A = 25 oC  
T
A = 25 oC  
1
0.01  
0.5  
10-4  
10-3  
10-2  
t, PULSE WIDTH (sec)  
10-1  
1
10  
0.01  
0.1  
1
10  
100200  
100 1000  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure12. Single Pulse Maximum  
Power Dissipation  
Figure 11. Forward Bias Safe  
Operating Area  
©2013 Fairchild Semiconductor Corporation  
FDMC8026S Rev.C7  
www.fairchildsemi.com  
4
Typical Characteristics TJ = 25 °C unless otherwise noted  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
0.1  
0.05  
0.02  
0.01  
P
DM  
0.01  
t
1
t
2
SINGLE PULSE  
NOTES:  
DUTY FACTOR: D = t /t  
0.001  
0.0001  
R
θJA = 125 oC/W  
1
2
PEAK T = P  
J
x Z  
x R  
+ T  
DM  
θJA  
θJA A  
(Note 1b)  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 13. Junction-to-Ambient Transient Thermal Response Curve  
©2013 Fairchild Semiconductor Corporation  
FDMC8026S Rev.C7  
www.fairchildsemi.com  
5
Typical Characteristics (continued)  
TM  
SyncFET Schottky body diode  
Characteristics  
Fairchild’s SyncFETTM process embeds a Schottky diode in  
parallel with PowerTrench MOSFET. This diode exhibits similar  
characteristics to a discrete external Schottky diode in parallel  
Schottky barrier diodes exhibit significant leakage at high tem-  
perature and high reverse voltage. This will increase the power  
in the device.  
with  
a MOSFET. Figure 14 shows the reverse recovery  
characteristic of the FDMC8026S.  
25  
20  
15  
10  
0.01  
TJ = 125 o  
C
0.001  
0.0001  
TJ = 100 o  
C
di/dt = 300 A/μs  
5
0
0.00001  
0.000001  
TJ = 25 o  
C
-5  
0
50  
100  
TIME (ns)  
150  
200  
250  
0
5
10  
15  
20  
25  
30  
VDS, REVERSE VOLTAGE (V)  
Figure 14. FDMC8026S SyncFETTM Body  
Diode Reverse Recovery Characteristic  
Figure 15. SyncFETTM Body Diode Re-  
verse Leakage vs. Drain-Source Voltage  
©2013 Fairchild Semiconductor Corporation  
FDMC8026S Rev.C7  
www.fairchildsemi.com  
6
(3.40)  
2.37  
0.05 C  
B
3.30  
A
8
5
2X  
0.45(4X)  
(0.40)  
2.15  
(1.70)  
3.30  
KEEP OUT  
AREA  
(0.65)  
0.70(4X)  
0.05 C  
PIN#1 IDENT  
1
4
TOP VIEW  
SIDE VIEW  
0.65  
0.42(8X)  
2X  
1.95  
ꢀꢁꢅꢃ“ꢀꢁꢀꢃ  
RECOMMENDED LAND PATTERN  
0.10 C  
0.08 C  
ꢀꢁꢂꢃ“ꢀꢁꢀꢃ  
ꢀꢁꢀꢄꢃ“ꢀꢁꢀꢄꢃ  
NOTES:  
C
SEATING  
A. DOES NOT CONFORM TO JEDEC  
REGISTRATION MO-229  
PLANE  
B. DIMENSIONS ARE IN MILLIMETERS.  
ꢆꢁꢆꢀ“ꢀꢁꢀꢃ  
C. DIMENSIONS AND TOLERANCES PER  
ASME Y14.5M, 2009.  
2.27+0.05  
(0.50)4X  
PIN #1 IDENT  
(0.79)  
D. LAND PATTERN RECOMMENDATION IS  
EXISTING INDUSTRY LAND PATTERN.  
1
4
ꢀꢁꢃꢀ“ꢀꢁꢀꢃꢇꢊ;ꢉ  
E. DRAWING FILENAME: MKT-MLP08Srev3.  
(0.35)  
(1.15)  
ꢆꢁꢆꢀ“ꢀꢁꢀꢃ  
R0.15  
ꢄꢁꢀꢀ“ꢀꢁꢀꢃ  
ꢀꢁꢆꢀ“ꢀꢁꢀꢃꢇꢆ;ꢉ  
8
5
ꢀꢁꢆꢃ“ꢀꢁꢀꢃꢇꢈ;ꢉ  
0.65  
0.10  
C A B  
1.95  
0.05  
C
BOTTOM VIEW  
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arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
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