FDMD8530 [ONSEMI]

双 N 沟道,PowerTrench® MOSFET,30V,201A,1.25mΩ;
FDMD8530
型号: FDMD8530
厂家: ONSEMI    ONSEMI
描述:

双 N 沟道,PowerTrench® MOSFET,30V,201A,1.25mΩ

开关 脉冲 光电二极管 晶体管
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中文:  中文翻译
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October 2015  
FDMD8530  
Dual N-Channel PowerTrench® MOSFET  
Q1: 30 V, 201 A, 1.25 mΩ Q2: 30 V, 201 A, 1.25 mΩ  
Features  
General Description  
Q1: N-Channel  
This device includes two 30V N-Channel MOSFETs in a dual  
power (5 mm X 6 mm) package. HS source and LS drain  
internally connected for half/full bridge, low source inductance  
package, low rDS(on)/Qg FOM silicon.  
„ Max rDS(on) = 1.25 mΩ at VGS = 10 V, ID = 35 A  
„ Max rDS(on) = 1.5 mΩ at VGS = 4.5 V, ID = 32 A  
Q2: N-Channel  
Applications  
„ Max rDS(on) = 1.25 mΩ at VGS = 10 V, ID = 35 A  
„ POL Synchronous Dual  
„ Max rDS(on) = 1.5 mΩ at VGS = 4.5 V, ID = 32 A  
„ One Phase Motor Half Bridge  
„ Half/Full Bridge Secondary Synchronous Rectification  
„ Ideal for Flexible Layout in Primary Side of Bridge Topology  
„ 100% UIL Tested  
„ Kelvin High Side MOSFET Drive Pin-out Capability  
„ RoHS Compliant  
Bottom  
Top  
D2/S1  
D2/S1  
G1  
G2  
Pin 1  
D2/S1  
G2  
S2  
GR  
D1  
D2/S1  
D2/S1  
D2/S1  
D1  
D1  
D1  
D1  
GR  
Pin 1  
G1  
Power 5 x 6  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted.  
Symbol  
VDS  
VGS  
Parameter  
Q1  
30  
Q2  
30  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Continuous  
V
V
±20  
201  
127  
351a  
1047  
661  
78  
±20  
201  
127  
351b  
1047  
661  
78  
TC = 25 °C  
TC = 100 °C  
TA = 25 °C  
(Note 5)  
(Note 5)  
ID  
A
Drain Current -Continuous  
-Pulsed  
(Note 4)  
(Note 3)  
EAS  
Single Pulse Avalanche Energy  
Power Dissipation  
mJ  
W
TC = 25 °C  
TA = 25 °C  
PD  
Power Dissipation  
2.21a  
2.21b  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
1.6  
551a  
1.6  
55 1b  
°C/W  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ’’  
Tape Width  
Quantity  
3000 units  
FDMD8530  
FDMD8530  
Power 5 x 6  
12 mm  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
1
www.fairchildsemi.com  
Electrical Characteristics TJ = 25 °C unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Type  
Min.  
Typ.  
Max. Units  
Off Characteristics  
Q1  
Q2  
30  
30  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V  
V
ΔBVDSS Breakdown Voltage Temperature  
Q1  
Q2  
20  
20  
I
D = 250 μA, referenced to 25 °C  
mV/°C  
ΔTJ  
IDSS  
Coefficient  
Q1  
Q2  
1
Zero Gate Voltage Drain Current  
VDS = 24 V, VGS = 0 V  
VGS = ±20 V, VDS = 0 V  
μA  
1
Q1  
Q2  
±100  
nA  
IGSS  
Gate to Source Leakage Current  
±100  
On Characteristics  
Q1  
Q2  
1.0  
1.0  
1.5  
1.5  
3.0  
V
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 μA  
3.0  
ΔVGS(th) Gate to Source Threshold Voltage  
Q1  
Q2  
-5  
-5  
I
D = 250 μA, referenced to 25 °C  
VGS = 10 V, ID = 35 A  
GS = 4.5 V, ID = 32 A  
mV/°C  
ΔTJ  
Temperature Coefficient  
0.77  
0.96  
1.1  
1.25  
1.5  
V
Q1  
Q2  
VGS = 10 V, ID = 35 A, TJ = 125 °C  
VGS = 10 V, ID = 35 A  
1.8  
1.25  
1.5  
mΩ  
rDS(on)  
Static Drain to Source On Resistance  
0.77  
0.96  
1.1  
VGS = 4.5 V, ID = 32 A  
VGS = 10 V, ID = 35 A, TJ = 125 °C  
1.8  
Q1  
Q2  
259  
259  
gFS  
Forward Transconductance  
VDD = 5 V, ID = 35 A  
S
Dynamic Characteristics  
Q1  
Q2  
7425 10395  
7425 10395  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
pF  
pF  
pF  
Ω
V
DS = 15 V, VGS = 0 V  
Q1  
Q2  
2190 3070  
2190 3070  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
f = 1 MHz  
Q1  
Q2  
220  
220  
310  
310  
Q1  
Q2  
0.1  
0.1  
1.9  
1.9  
3.8  
3.8  
Switching Characteristics  
Q1  
Q2  
14  
14  
25  
25  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
ns  
ns  
Q1  
Q2  
13  
13  
24  
24  
VDD = 15 V, ID = 35 A  
V
GS = 10 V, RGEN = 6 Ω  
Q1  
Q2  
71  
71  
114  
114  
Turn-Off Delay Time  
Fall Time  
ns  
Q1  
Q2  
21  
21  
34  
34  
ns  
Q1  
Q2  
106  
106  
149  
149  
Qg(TOT)  
Qg(TOT)  
Qgs  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 4.5 V  
nC  
nC  
nC  
nC  
Q1  
Q2  
50  
50  
70  
70  
V
DD = 15 V,  
Q1  
Q2  
16  
16  
I
D =35 A  
Q1  
Q2  
13  
13  
Qgd  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
2
www.fairchildsemi.com  
Electrical Characteristics TJ = 25 °C unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Type  
Min  
Typ  
Max  
Units  
Drain-Source Diode Characteristics  
Q1  
Q2  
0.8  
0.8  
1.3  
1.3  
VSD  
VSD  
trr  
Source to Drain Diode Forward Voltage VGS = 0 V, IS = 35 A  
(Note 2)  
(Note 2)  
V
V
Q1  
Q2  
0.7  
0.7  
1.2  
1.2  
Source to Drain Diode Forward Voltage VGS = 0 V, IS = 2 A  
Reverse Recovery Time  
Q1  
Q2  
54  
54  
87  
87  
ns  
nC  
IF = 35 A, di/dt = 100 A/μs  
Q1  
Q2  
39  
39  
63  
63  
Qrr  
Reverse Recovery Charge  
NOTES:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is determined by the user's board design.  
θJA  
θCA  
a. 55 °C/W when mounted on  
a 1 in padof 2oz copper  
b. 55 °C/W when mounted on  
a 1 in padof 2oz copper  
2
2
c. 155 °C/W when mounted on  
a minimum pad of 2 oz copper  
d. 155 °C/W when mounted on  
a minimum pad of 2 oz copper  
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.  
o
3. Q1: E of 661 mJ is based on starting T = 25 C, L = 3 mH, I = 21 A, V = 30 V, V = 10 V. 100% tested at L = 0.1 mH, I = 65 A.  
AS  
J
AS  
DD  
GS  
AS  
o
Q2: E of 661 mJ is based on starting T = 25 C, L = 3 mH, I = 21 A, V = 30 V, V = 10 V. 100% tested at L = 0.1 mH, I = 65 A.  
AS  
J
AS  
DD  
GS  
AS  
4. Pulsed Id please refer to Fig 11 SOA graph for more details.  
5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design.  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
3
www.fairchildsemi.com  
Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted.  
20  
15  
10  
5
150  
120  
90  
60  
30  
0
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 2.5 V  
VGS = 10 V  
VGS = 4.5 V  
VGS = 3.5 V  
VGS = 3 V  
VGS = 3 V  
VGS = 3.5 V  
VGS = 2.5 V  
VGS = 4.5 V  
VGS = 10 V  
0
0
30  
60  
90  
120  
150  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs. Drain Current and Gate Voltage  
1.6  
5
ID = 35 A  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
1.5  
1.4  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
VGS = 10 V  
4
3
2
1
0
ID = 35 A  
TJ = 125 o  
C
TJ = 25 o  
C
-75 -50 -25  
0
25 50 75 100 125 150  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs. Junction Temperature  
Figure4. On-Resistance vs. Gate to  
Source Voltage  
150  
200  
100  
VGS = 0 V  
TJ = 150 o  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
120  
90  
60  
30  
0
10  
C
VDS = 5 V  
TJ = 150 o  
C
1
TJ = 25 o  
C
TJ = 25 o  
C
0.1  
TJ = -55 o  
C
0.01  
TJ = -55 o  
C
0.001  
1.0  
1.5  
2.0  
2.5  
3.0  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs. Source Current  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
4
www.fairchildsemi.com  
Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted.  
10  
8
10000  
1000  
100  
ID = 35 A  
Ciss  
VDD = 15 V  
6
Coss  
VDD = 10 V  
VDD = 20 V  
4
2
f = 1 MHz  
GS = 0 V  
V
Crss  
0
0
22  
44  
66  
88  
110  
0.1  
1
10  
30  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s . D r a i n  
to Source Voltage  
210  
180  
150  
120  
90  
100  
TJ = 25 oC  
TJ = 100 o  
VGS = 10 V  
C
10  
VGS = 4.5 V  
TJ = 125 o  
C
60  
30  
RθJC = 1.6 oC/W  
0
25  
1
0.001  
0.01  
0.1  
1
10  
100  
1000  
50  
75  
100  
125  
150  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs. Case Temperature  
2000  
1000  
100000  
SINGLE PULSE  
RθJC = 1.6 oC/W  
10 μs  
T
C = 25 oC  
10000  
1000  
100  
100  
10  
1
100 μs  
THIS AREA IS  
LIMITED BY rDS(on)  
1 ms  
SINGLE PULSE  
TJ = MAX RATED  
RθJC = 1.6 oC/W  
10 ms  
100 ms/DC  
CURVE BENT TO  
MEASURED DATA  
T
C = 25 oC  
0.1  
0.1  
10  
10-5  
10-4  
10-3  
t, PULSE WIDTH (sec)  
10-2  
10-1  
1
1
10  
100 200  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure11. Forward Bias Safe  
Operating Area  
Figure12. Single Pulse Maximum Power  
Dissipation  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
5
www.fairchildsemi.com  
Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted.  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
P
0.05  
0.02  
0.01  
DM  
0.1  
t
1
t
2
NOTES:  
(t) = r(t) x R  
0.01  
0.001  
SINGLE PULSE  
Z
θJC  
θJC  
o
R
= 1.6 C/W  
θJC  
Peak T = P  
x Z (t) + T  
J
DM  
θJC C  
Duty Cycle, D = t / t  
1
2
10-5  
10-4  
10-3  
10-2  
10-1  
1
t, RECTANGULAR PULSE DURATION (sec)  
Figure 13. Junction-to-Case Transient Thermal Response Curve  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
6
www.fairchildsemi.com  
Typical Characteristics (Q2 N-Channel) TJ = 25 °C unless otherwise noted.  
20  
15  
10  
5
150  
120  
90  
60  
30  
0
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 2.5 V  
VGS = 10 V  
VGS = 4.5 V  
VGS = 3.5 V  
VGS = 3 V  
VGS = 3 V  
VGS = 3.5 V  
VGS = 2.5 V  
VGS = 4.5 V  
VGS = 10 V  
0
0
30  
60  
90  
120  
150  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 14. On- Region Characteristics  
Figure 15. Normalized on-Resistance vs. Drain  
Current and Gate Voltage  
5
1.6  
ID = 35 A  
PULSE DURATION = 80 μs  
1.5  
1.4  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
4
ID = 35 A  
3
2
TJ = 125 o  
C
1
0
TJ = 25 o  
C
2
4
6
8
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 17. On-Resistance vs. Gate to  
Source Voltage  
Figure 16. Normalized On-Resistance  
vs. Junction Temperature  
150  
200  
100  
VGS = 0 V  
TJ = 150 o  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
120  
90  
60  
30  
0
10  
C
VDS = 5 V  
TJ = 150 o  
C
1
TJ = 25 o  
C
TJ = 25 o  
C
0.1  
TJ = -55 o  
C
0.01  
0.001  
TJ = -55 o  
C
1.0  
1.5  
2.0  
2.5  
3.0  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 18. Transfer Characteristics  
Figure 19. Source to Drain Diode  
Forward Voltage vs. Source Current  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
7
www.fairchildsemi.com  
Typical Characteristics (Q2 N-Channel) TJ = 25°C unless otherwise noted.  
10000  
1000  
100  
10  
8
ID = 35 A  
Ciss  
VDD = 15 V  
6
Coss  
VDD = 10 V  
VDD = 20 V  
4
2
f = 1 MHz  
VGS = 0 V  
Crss  
0
0.1  
1
10  
30  
0
22  
44  
66  
88  
110  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 21. Capacitance vs. Drain  
to Source Voltage  
Figure 20. Gate Charge Characteristics  
210  
180  
150  
120  
90  
100  
10  
1
TJ = 25 o  
C
VGS = 10 V  
TJ = 100 o  
C
VGS = 4.5 V  
TJ = 125 o  
C
60  
30  
RθJC = 1.6 oC/W  
0
25  
0.001  
0.01  
0.1  
1
10  
100  
1000  
50  
75  
100  
125  
150  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure 22. Unclamped Inductive  
Switching Capability  
F ig ure 23 . Ma ximum C on tin uo us D rain  
Current vs. Case Temperature  
2000  
1000  
100000  
10000  
1000  
100  
SINGLE PULSE  
RθJC = 1.6 oC/W  
TC = 25 o  
10 μs  
C
100  
10  
1
100 μs  
THIS AREA IS  
LIMITED BY rDS(on)  
1 ms  
SINGLE PULSE  
TJ = MAX RATED  
RθJC = 1.6 oC/W  
10 ms  
100 ms/DC  
CURVE BENT TO  
MEASURED DATA  
TC = 25 o  
C
0.1  
0.1  
10  
10-5  
10-4  
10-3  
t, PULSE WIDTH (sec)  
10-2  
10-1  
1
1
10  
100 200  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 24. Forward Bias Safe  
Operating Area  
Figure 25. Single Pulse Maximum Power  
Dissipation  
©2015 Fairchild Semiconductor Corporation  
FDMD8530 Rev.1.0  
8
www.fairchildsemi.com  
Typical Characteristics (Q2 N-Channel) TJ = 25 °C unless otherwise noted.  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
P
DM  
0.05  
0.02  
0.01  
0.1  
t
1
t
2
NOTES:  
(t) = r(t) x R  
0.01  
0.001  
SINGLE PULSE  
Z
θJC  
θJC  
o
R
= 1.6 C/W  
θJC  
Peak T = P  
x Z (t) + T  
J
DM  
θJC C  
Duty Cycle, D = t / t  
1
2
10-5  
10-4  
10-3  
10-2  
10-1  
1
t, RECTANGULAR PULSE DURATION (sec)  
Figure 26. Junction-to-Case Transient Thermal Response Curve  
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FDMD8530 Rev.1.0  
9
www.fairchildsemi.com  
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