SSG4505 [SECOS]

Enhancement Mode Power Mos.FET; 增强模式电源Mos.FET
SSG4505
型号: SSG4505
厂家: SECOS HALBLEITERTECHNOLOGIE GMBH    SECOS HALBLEITERTECHNOLOGIE GMBH
描述:

Enhancement Mode Power Mos.FET
增强模式电源Mos.FET

文件: 总7页 (文件大小:980K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SSG4505  
N Channel 10A, 30V,RDS(ON) 14mΩ  
Ω
P Channel -8.4A, -30V,RDS(ON) 20m  
Elektronische Bauelemente  
Enhancement Mode Power Mos.FET  
RoHS Compliant Product  
SOP-8  
Description  
0.19  
0.25  
0.40  
0.90  
o
0.375 REF  
The SSG4505 provide the designer with the best combination of fast switching,  
ruggedized device design, low on-resistance and cost-effectiveness.  
The SOP-8 package is universally preferred for all commercial  
industrial surface mount application and suited for low  
6.20  
5.80  
0.25  
3.80  
4.00  
1.27Typ.  
0.35  
0.49  
0.10~0.25  
4.80  
5.00  
voltage applications such as DC/DC converters.  
1.35  
1.75  
o
8 o  
Features  
Dimensions in millimeters  
* Simple Drive Requirement  
D1 D1 D2 D2  
* Lower On-Resistance  
8
6
5
7
* Fast Switching Performance  
D1  
D2  
4505SS  
Date Code  
G2  
G1  
S1  
S2  
2
1
3
4
S1 G1 S2 G2  
Absolute Maximum Ratings  
Ratings  
Parameter  
Symbol  
Unit  
V
Drain-Source Voltage  
VDS  
30  
±20  
10  
-30  
Gate-Source Voltage  
VGS  
±20  
-8.4  
-6.7  
-30  
V
A
Continuous Drain Current3  
Continuous Drain Current3  
Pulsed Drain Current1  
ID@TA=25oC  
ID@TA=70oC  
IDM  
7.9  
30  
A
A
Total Power Dissipation  
PD@TA=25 o  
C
2.0  
W
W/oC  
Linear Derating Factor  
0.016  
o
C
-55~+150  
Tj, Tstg  
Operating Junction and Storage Temperature Range  
Thermal Data  
Parameter  
Symbol  
Ratings  
Unit  
oC /W  
Thermal Resistance Junction-ambient3  
62.5  
Rthj-a  
Max.  
http://www.SeCoSGmbH.com/  
Any changing of specification will not be informed individual  
01-Jan-2008 Rev. B  
Page 1 of 7  
SSG4505  
N Channel 10A, 30V,RDS(ON) 14mΩ  
Ω
P Channel -8.4A, -30V,RDS(ON) 20m  
Elektronische Bauelemente  
Enhancement Mode Power Mos.FET  
Electrical Characteristics N Channel( Tj=25oC Unless otherwise specified)  
Parameter  
Symbol  
Max.  
Min.  
Typ.  
Unit  
Test Condition  
_
_
V
VGS=0V, ID=250uA  
BVDSS  
Drain-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
Gate Threshold Voltage  
30  
_
o
V/o  
C
_
C
Reference to 25 , ID=1mA  
0.02  
_
BVDS/ Tj  
VGS(th)  
IGSS  
V
3.0  
1.0  
_
VDS=VGS, ID=250uA  
_
_
±
±
VGS= 20V  
100  
nA  
Gate-Source Leakage Current  
Drain-Source Leakage Current (Tj=25o )  
C
uA  
uA  
VDS=30V,VGS=0  
_
1
IDSS  
Drain-Source Leakage Current (Tj=70o )  
C
_
_
_
_
VDS=24V,VGS=0  
VGS=10V, ID=6A  
25  
14  
Static Drain-Source On-Resistance2  
mΩ  
RDS(ON)  
_
_
VGS=4.5V, ID=4A  
20  
_
_
_
_
_
_
Total Gate Charge2  
Gate-Source Charge  
23  
65  
_
Qg  
Qgs  
ID=9A  
VDS=24V  
VGS=4.5V  
nC  
6
_
_
14  
Gate-Drain ("Miller") Charge  
Turn-on Delay Time2  
Rise Time  
Qgd  
Td(ON)  
14  
10  
VDD=15V  
ID=1 A  
_
Tr  
nS  
VGS=10V  
_
_
Td(Off)  
Turn-off Delay Time  
36  
Ω
RG=3.3  
Ω
RD=15  
_
Tf  
17  
Fall Time  
_
_
2830  
_
Input Capacitance  
1770  
430  
Ciss  
VGS=0V  
VDS=25V  
f=1.0MHz  
pF  
S
Output Capacitance  
Reverse Transfer Capacitance  
Forward Transconductance  
Coss  
_
_
_
_
350  
14  
Crss  
Gfs  
VDS=10V, ID=9A  
Source-Drain Diode  
Parameter  
Symbol  
Max.  
Min.  
Typ.  
Unit  
Test Condition  
_
_
Forward On Voltage2  
1.2  
_
VSD  
IS=1.7A,VGS=0V  
V
_
_
nS  
nC  
Trr  
31  
25  
Reverse Recovery Time  
Reverse Recovery Charge  
IS=9A,V GS=0V  
dl/dt=100A/us  
_
Qrr  
Notes: 1.Pulse width limited by Max. junction temperature.  
2.Pulse width 300us, dutycycle 2%.  
3.Surface mounted on 1 inch2 copper pad of FR4 board;135 °C/W when mounted on min. copper pad.  
http://www.SeCoSGmbH.com/  
Any changing of specification will not be informed individual  
01-Jan-2008 Rev. B  
Page 2 of 7  
SSG4505  
N Channel 10A, 30V,RDS(ON) 14mΩ  
Ω
P Channel -8.4A, -30V,RDS(ON) 20m  
Elektronische Bauelemente  
Enhancement Mode Power Mos.FET  
Electrical Characteristics P-Channel( Tj=25oC Unless otherwise specified)  
Min.  
Typ.  
Unit  
Parameter  
Symbol  
Max.  
Test Condition  
_
_
V
VGS=0V, ID=-250uA  
BVDSS  
Drain-Source Breakdown Voltage  
-30  
_
Reference to 25o ,ID=-1mA  
C
V/o  
C
_
Breakdown Voltage Temp. Coefficient  
GateThreshold Voltage  
BVDS/ Tj  
VGS(th)  
IGSS  
-0.02  
_
V
-3.0  
-1.0  
_
VDS=VGS, ID=-250uA  
_
_
±
±
VGS= 20V  
Gate-Source Leakage Current  
100  
nA  
_
Drain-Source Leakage Current (Tj=25o )  
C
uA  
uA  
VDS=-30V,VGS=0  
-1  
-25  
20  
30  
IDSS  
oC  
_
_
_
_
Drain-Source Leakage Current (Tj=70 )  
VDS=-24V,VGS=0  
VGS=-10V, ID=-8A  
Static Drain-Source On-Resistance2  
mΩ  
RDS(ON)  
_
_
_
_
_
VGS=-4.5V, ID=-4A  
Total Gate Charge2  
Qg  
27  
4
45  
_
ID=-8A  
VDS=-24V  
VGS=-4.5V  
nC  
Gate-Source Charge  
Gate-Drain ("Miller") Charge  
Qgs  
Qgd  
_
_
18  
16  
_
_
Turn-on Delay Time2  
Rise Time  
Td(ON)  
Tr  
VDS=-15V  
ID=-1A  
_
_
_
11  
VGS=-10V  
nS  
_
Td(Off)  
Ω
RG=3.3  
Turn-off Delay Time  
Fall Time  
40  
Ω
RD=15  
_
_
_
T
f
25  
2530  
_
Input Capacitance  
1580  
Ciss  
Coss  
Crss  
Gfs  
VGS=0V  
VDS=-25V  
f=1.0MHz  
Output Capacitance  
pF  
S
540  
450  
_
_
_
_
Reverse Transfer Capacitance  
Forward Transconductance  
VDS=-10V, ID=-8A  
14  
Source-Drain Diode  
Parameter  
Symbol  
Max.  
Min.  
Typ.  
Unit  
V
Test Condition  
_
_
Forward On Voltage2  
-1.2  
_
VSD  
IS=-1.7A,VGS=0V  
_
_
nS  
nC  
Trr  
40  
32  
Reverse Recovery Time  
Reverse Recovery Charge  
IS=-8A,VGS=0V  
dl/dt=100A/us  
_
Qrr  
Notes: 1.Pulse width limited by Max. junction temperature.  
2.Pulse width 300us, dutycycle 2%.  
3.Surface mounted on 1 inch2 copper pad of FR4 board;135 °C/W when mounted on min. copper pad.  
http://www.SeCoSGmbH.com/  
Any changing of specification will not be informed individual  
01-Jan-2008 Rev. B  
Page 3 of 7  
SSG4505  
N Channel 10A, 30V,RDS(ON) 14mΩ  
Ω
P Channel -8.4A, -30V,RDS(ON) 20m  
Elektronische Bauelemente  
Enhancement Mode Power Mos.FET  
Characteristics Curve N-Channel  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
Fig 4. Normalized On-Resistance  
v.s. Junction Temperature  
Fig 3. On-Resistance v.s. Gate Voltage  
Fig 5. Forward Characteristics of  
Reverse Diode  
Fig 6. Gate Threshold Voltage v.s.  
Junction Temperature  
http://www.SeCoSGmbH.com/  
Any changing of specification will not be informed individual  
01-Jan-2008 Rev. B  
Page 4 of 7  
SSG4505  
N Channel 10A, 30V,RDS(ON) 14mΩ  
Ω
P Channel -8.4A, -30V,RDS(ON) 20m  
Elektronische Bauelemente  
N-Channel  
Enhancement Mode Power Mos.FET  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
Fig 9. Maximum Safe Operating Area Fig 10. Effective Transient Thermal Impedance  
Fig 11. Switching Time Waveform  
Fig 12. Gate Charge Waveform  
http://www.SeCoSGmbH.com/  
Any changing of specification will not be informed individual  
01-Jan-2008 Rev. B  
Page 5 of 7  
SSG4505  
N Channel 10A, 30V,RDS(ON) 14mΩ  
Ω
P Channel -8.4A, -30V,RDS(ON) 20m  
Elektronische Bauelemente  
Enhancement Mode Power Mos.FET  
P-Channel  
Des
GND  
capace input  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
Fig 4. Normalized On-Resistance  
v.s. Junction Temperature  
Fig 3. On-Resistance v.s. Gate Voltage  
Fig 5. Forward Characteristics of  
Reverse Diode  
Fig 6. Gate Threshold Voltage v.s.  
Junction Temperature  
http://www.SeCoSGmbH.com/  
Any changing of specification will not be informed individual  
01-Jan-2008 Rev. B  
Page 6 of 7  
SSG4505  
N Channel 10A, 30V,RDS(ON) 14mΩ  
Ω
P Channel -8.4A, -30V,RDS(ON) 20m  
Elektronische Bauelemente  
Enhancement Mode Power Mos.FET  
P-Channel  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
Fig 9. Maximum Safe Operating Area Fig 10. Effective Transient Thermal Impedance  
Fig 11. Switching Time Waveform  
Fig 12. Gate Charge Waveform  
h tp://www.SeCoSGmbH.com/  
Any changing of specification will not be informed individual  
01-Jan-2008 Rev. B  
Page 7 of 7  

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