SSF7510 [SILIKRON]
Power switching application; 电源开关的应用![SSF7510](http://pdffile.icpdf.com/pdf1/p00142/img/icpdf/SSF75_785544_icpdf.jpg)
型号: | SSF7510 |
厂家: | ![]() |
描述: | Power switching application |
文件: | 总5页 (文件大小:330K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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SSF7510
Feathers:
ID=75A
Advanced trench process technology
BV=75V
Special designed for Convertors and power controls
High density cell design for ultra low Rdson
Fully characterized Avalanche voltage and current
Avalanche Energy 100% test
Rdson=10mohm
Description:
The SSF7510 is a new generation of middle voltage and
high current N–Channel enhancement mode trench power
MOSFET. This new technology increases the cell density
and reduces the on-resistance; its typical Rdson can reduce
to 6.8mohm.
Application:
Power switching application
SSF7510 TOP View (TO220)
Absolute Maximum Ratings
Parameter
Max.
75
Units
A
ID@Tc=25ْC
ID@Tc=100ْC
IDM
Continuous drain current,VGS@10V
Continuous drain current,VGS@10V
70
Pulsed drain current
Power dissipation
①
300
150
2.0
PD@TC=25ْC
W
W/ْC
V
Linear derating factor
Gate-to-Source voltage
VGS
dv/dt
EAS
EAR
TJ
±20
31
Peak diode recovery voltage
Single pulse avalanche energy
Repetitive avalanche energy
Operating Junction and
v/ns
mJ
②
480
TBD
–55 to +150
Cْ
TSTG
Storage Temperature Range
Thermal Resistance
Parameter
Min.
—
Typ.
0.83
—
Max.
—
Units
RθJC
RθJA
Junction-to-case
Junction-to-ambient
Cْ /W
—
62
Electrical Characteristics @TJ=25 Cْ (unless otherwise specified)
Parameter
Min. Typ.
Max. Units
Test Conditions
VGS=0V,ID=250μA
VGS=10V,ID=40A
VDS=VGS,ID=250μA
VDS=5V,ID=30A
VDS=75V,VGS=0V
VDS=75V,
BVDSS
RDS(on)
VGS(th)
gfs
Drain-to-Source breakdown voltage
Static Drain-to-Source on-resistance
Gate threshold voltage
75
—
2.0
-
—
—
V
Ω
V
S
0.007 0.01
2.7
58
—
4.0
—
1
Forward transconductance
—
IDSS
Drain-to-Source leakage current
μA
—
—
—
—
10
VGS=0V,TJ=150ْC
IGSS
Gate-to-Source forward leakage
100
nA VGS=20V
©Silikron Semiconductor CO.,LTD.
2008.8.1
Version : 1.0
page
1of5
SSF7510
Gate-to-Source reverse leakage
Total gate charge
—
—
—
—
—
—
—
—
—
—
—
—
90
-100
—
—
—
—
—
—
—
—
—
—
VGS=-20V
Qg
ID=30A
VDD=30V
VGS=10V
nC
nS
pF
Qgs
Qgd
td(on)
tr
Gate-to-Source charge
Gate-to-Drain("Miller") charge
Turn-on delay time
Rise time
14
24
18.2
15.6
70.5
13.8
3150
300
240
VDD=30V
ID=2A ,RL=15Ω
RG=2.5Ω
td(off)
tf
Turn-Off delay time
Fall time
VGS=10V
Ciss
Coss
Crss
Input capacitance
VGS=0V
VDS=25V
f=1.0MHZ
Output capacitance
Reverse transfer capacitance
Source-Drain Ratings and Characteristics
Parameter
Continuous Source Current
(Body Diode)
Min.
Typ.
—
Max.
Units
Test Conditions
.
.
MOSFET symbol
showing the
IS
—
75
A
integral reverse
p-n junction diode.
Pulsed Source Current
ISM
—
—
300
(Body Diode)
①
VSD Diode Forward Voltage
—
-
-
—
57
1.3
—
V
TJ=25ْC,IS=40A,VGS=0V ③
TJ=25ْC,IF=75A
trr
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn-on Time
nS
nC
di/dt=100A/μs ③
Qrr
ton
107
—
Intrinsic turn-on time is negligible (turn-on is dominated by Ls + LD)
Notes:
① Repetitive rating; pulse width limited by max junction temperature.
② Test condition: L =0.3mH, ID = 57A, VDD = 47V
③ Pulse width≤300μS; duty cycle≤1.5% RG = 25ΩStarting TJ = 25°C
EAS test circuits:
Gate charge test circuit:
dss
BV
©Silikron Semiconductor CO.,LTD.
2008.8.1
Version : 1.0
page
2of5
SSF7510
Switch Time Test Circuit:
Switch Waveforms:
Transfer Characteristic
Capacitance
On Resistance vs Junction Temperature
Breakdown Voltage vs Junction Temperature
©Silikron Semiconductor CO.,LTD.
2008.8.1
Version : 1.0
page
3of5
SSF7510
Gate Charge
Source-Drain Diode Forward Voltage
Safe Operation Area
Max Drain Current vs Junction Temperature
Transient Thermal Impedance Curve
©Silikron Semiconductor CO.,LTD.
2008.8.1
Version : 1.0
page
4of5
SSF7510
TO220 MECHANICAL DATA:
©Silikron Semiconductor CO.,LTD.
2008.8.1
Version : 1.0
page
5of5
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