CXD2434ATQ [SONY]

Timing Generator for Progressive Scan CCD Image Sensor; 时序发生器逐行扫描CCD图像传感器
CXD2434ATQ
型号: CXD2434ATQ
厂家: SONY CORPORATION    SONY CORPORATION
描述:

Timing Generator for Progressive Scan CCD Image Sensor
时序发生器逐行扫描CCD图像传感器

传感器 换能器 图像传感器 CD
文件: 总26页 (文件大小:522K)
中文:  中文翻译
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CXD2434ATQ  
Timing Generator for Progressive Scan CCD Image Sensor  
Description  
48 pin TQFP (Plastic)  
The CXD2434ATQ is an IC developed to generate  
the timing pulses required by the Progressive Scan  
CCD image sensors as well as signal processing  
circuits. The CXD2434ATQ adds EFS operation  
when using the high-speed electronic shutter and  
other changes to the CXD2434TQ specifications.  
Features  
External trigger function  
Electronic shutter function  
Supports non-interlaced operation  
30 frames/s  
Absolute Maximum Ratings (Ta=25 °C)  
Supply voltage  
Input voltage  
VDD  
VSS –0.5 to +7.0  
V
VI VSS –0.5 to VDD +0.5 V  
VO VSS –0.5 to VDD +0.5 V  
Output voltage  
Operating temperature  
Built-in driver for the horizontal (H) clock  
Base oscillation 1560 fH (24.5454 MHz)  
Topr  
–20 to +75  
°C  
°C  
Storage temperature  
Applications  
Tstg  
–55 to +150  
Progressive Scan CCD cameras  
Recommended Operating Conditions  
Structure  
Supply voltage  
Operating temperature  
Topr  
VDD  
4.75 to 5.25  
V
Silicon gate CMOS IC  
–20 to +75  
°C  
Applicable CCD Image Sensors  
ICX084AK, ICX084AL  
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by  
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the  
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.  
—1—  
E97841-TE  
CXD2434ATQ  
Block Diagram  
36 35 34 33 32 31  
47 46  
42 29 26 25  
10  
13  
14  
21  
22  
23  
18  
17  
16  
19  
39  
38  
40  
3
4
5
7
8
9
RG  
H1  
PS  
STRB  
DCLK  
DATA  
SMD1  
SMD2  
TG  
REGISTER  
H2  
XSHP  
XSHD  
XRS  
XV1  
XV2  
XV3  
XSG  
CLD  
CL  
PULSE GENERATOR  
DECODE  
COUNTER  
GATE  
11  
28  
48  
41  
XSUB  
TEST1  
TEST2  
1/2  
CKO  
RESET  
43 44 45  
12 15 20 24 27 30 37  
1
2
6
Pin Configuration (Top View)  
36 35 34 33 32 31 30 29 28 27 26 25  
VSS 37  
CL 38  
24 VSS  
23 XRS  
22 XSHD  
21 XSHP  
20 VDD  
19 XSG  
18 XV1  
17 XV2  
16 XV3  
15 VSS  
14 H2  
CLD 39  
CKO 40  
RESET 41  
STDBY 42  
TRIG 43  
ESG 44  
EFS 45  
HD 46  
CXD2434ATQ  
VD 47  
TEST2 48  
13 H1  
10 11 12  
1
2
3
4
5
6
7
8
9
—2—  
CXD2434ATQ  
Pin Description  
Pin No. Symbol  
I/O  
Description  
1
2
OSCO  
OSCI  
O
I
Inverter output for oscillation.  
Inverter input for oscillation.  
Switching for electronic shutter speed input method. (With pull-up resistor)  
Low: Serial input, High: Parallel input  
Shutter speed setting. (With pull-up resistor)  
Shutter speed setting. (With pull-up resistor)  
GND  
3
PS  
I
4
STRB  
DCLK  
VSS  
I
5
I
6
I
7
DATA  
SMD1  
SMD2  
RG  
Shutter speed setting. (With pull-up resistor)  
Shutter mode setting. (With pull-up resistor)  
Shutter mode setting. (With pull-up resistor)  
Reset gate pulse output.  
8
I
9
I
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
O
O
O
O
O
O
O
O
O
O
O
XSUB  
VDD  
CCD discharge pulse output.  
Power supply.  
H1  
Clock output for horizontal CCD drive.  
Clock output for horizontal CCD drive.  
GND  
H2  
VSS  
XV3  
Clock output for vertical CCD drive.  
Clock output for vertical CCD drive.  
Clock output for vertical CCD drive.  
Sensor charge readout pulse output.  
Power supply.  
XV2  
XV1  
XSG  
VDD  
XSHP  
XSHD  
XRS  
VSS  
Sample-and-hold pulse output.  
Sample-and-hold pulse output.  
Sample-and-hold pulse output.  
GND  
Switching for external trigger discharge operation. (With pull-up resistor)  
Low: No high-speed discharge, High: High-speed discharge  
Switching for readout timing. (With pull-up resistor)  
Low: ESG input valid, High: ESG input invalid  
GND  
25  
26  
FSE  
I
I
SMDE  
27  
28  
VSS  
I
TEST1  
Test. (With pull-down resistor)  
WEN mode setting. (With pull-down resistor)  
Low: Effective line, High: XSG synchronization  
Power supply.  
29  
WM  
I
30  
31  
32  
33  
34  
35  
36  
37  
38  
39  
VDD  
XCPDM  
XCPOB  
PBLK  
ID  
O
O
O
O
O
O
O
O
Clamp pulse output.  
Clamp pulse output.  
Blanking cleaning pulse output.  
Line identification output.  
WEN  
BUSY  
VSS  
Write enable output.  
Trigger mode flag output.  
GND  
CL  
780 fH clock output.  
CLD  
AD conversion pulse output.  
—3—  
CXD2434ATQ  
Pin No. Symbol  
I/O  
Description  
40  
41  
CKO  
O
I
1560 fH clock output.  
RESET  
RESET. (With pull-up resistor) Low : Reset, High : Normal  
Standby. (With pull-up resistor)  
42  
STDBY  
I
Low: Internal clock supply stopped, High: Normal  
External trigger input. (With pull-up resistor)  
External readout input. (With pull-up resistor)  
Vertical CCD discharge input. (With pull-up resistor)  
Horizontal sync signal input.  
43  
44  
45  
46  
47  
48  
TRIG  
ESG  
EFS  
HD  
I
I
I
I
I
I
VD  
Vertical sync signal input.  
TEST2  
Test. (With pull-up resistor)  
Electrical Characteristics  
1. DC Characteristics  
VDD=4.75 V to 5.25 V Topr= –20 to +75 °C  
Item  
Supply voltage  
Symbol  
VDD  
Conditions  
Min.  
4.75  
Typ.  
5.0  
Max.  
5.25  
Unit  
V
Input voltage 1  
VIH1  
VIL1  
0.7 VDD  
V
(Input pins other than those listed below)  
Input voltage 2  
0.3 VDD  
0.3 VDD  
0.4  
V
VIH2  
VIL2  
0.7 VDD  
VDD–0.4  
VDD–0.4  
VDD–0.4  
VDD–0.4  
VDD/2  
V
(Pin 2)  
V
Output voltage 1  
VOH1  
VOL1  
VOH2  
VOL2  
VOH3  
VOL3  
VOH4  
VOL4  
VOH5  
VOL5  
RFB  
IOH=–2.5 mA  
IOL=4.5 mA  
V
(Output pins other than those listed below)  
Output voltage 2  
V
IOH=–5.0 mA  
IOL=9.0 mA  
V
(Pins 21, 22, 23, 38, 39 and 40)  
Output voltage 3  
0.4  
V
IOH=–7.5 mA  
IOL=13.5 mA  
IOH=–14.0 mA  
IOL=24.0 mA  
V
(Pin 10)  
0.4  
V
Output voltage 4  
V
(Pins 13 and 14)  
0.4  
V
Output voltage 5  
V
(Pin 1)  
VDD/2  
V
Feedback resistor  
Pull-up resistor  
VIN=VSS or VDD  
VIL=0 V  
1 M  
50 k  
50 k  
40  
mA  
RPU  
100 k  
100 k  
Pull-down resistor  
Current consumption  
RPD  
VIH=VDD  
IDD  
VDD=5 V  
—4—  
CXD2434ATQ  
2. AC Characteristics  
1) Waveform characteristics of H1, H2 and RG  
0.9VDD  
H1  
0.1VDD  
tRH1  
tWH1  
tFH1  
0.9VDD  
H2  
0.1VDD  
tFH2  
tWH2  
tRH2  
0.9VDD  
RG  
0.1VDD  
tRRG  
tWRG  
tFRG  
VDD=5.0 V, Topr=25 °C, load capacitance of H1 and H2=100 pF, load capacitance of RG=10 pF  
Symbol  
Definition  
Min.  
Typ.  
6
Max.  
15  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tRH1  
tFH1  
H1 rise time  
H1 fall time  
5
15  
tWH1  
tRH2  
tFH2  
H1 high level time  
H2 rise time  
25  
35  
6
15  
15  
H2 fall time  
5
tWH2  
tRRG  
tFRG  
tWRG  
H2 low level time  
RG rise time  
25  
35  
2
5
5
RG fall time  
2
RG high level time  
10  
15  
20  
—5—  
CXD2434ATQ  
2) Phase characteristics of H1, H2, RG, XSHP, XSHD, XRS, CL, CLD and CKO  
tH1  
0.5VDD  
0.5VDD  
0.5VDD  
H1  
H2  
0.5VDD  
0.5VDD  
tPD3  
tPD1  
tPD2  
0.5VDD  
0.5VDD  
RG  
tPD4  
tPD5  
tW1  
0.5VDD  
0.5VDD  
XSHP  
XSHD  
tW2  
tPD6  
0.5VDD  
0.5VDD  
tPD7  
0.5VDD  
0.5VDD  
0.5VDD  
XRS  
CLD  
CL  
tPD8  
tW3  
tPD9  
0.5VDD  
tPD10  
tW4  
0.5VDD  
0.5VDD  
tW5  
tW5  
0.5VDD  
0.5VDD  
CLO  
0.5VDD  
0.5VDD  
tPD11  
tPD11  
VDD=5.0 V, Topr=25 °C, load capacitance of CL and CKO=30 pF, load capacitance of CLD, XSHP, XSHD, XRS and RG=10 pF  
Symbol  
tH1  
Definition  
Min.  
Typ.  
82  
0
Max.  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
H1 cycle  
tPD1  
tPD2  
tPD3  
tPD4  
tPD5  
tPD6  
tPD7  
tPD8  
tPD9  
tPD10  
tPD11  
tW1  
H2 rising delay, activated by the falling edge of H1  
H2 falling delay, activated by the rising edge of H1  
H1 rising delay, activated by the rising edge of RG  
XSHP falling delay, activated by the falling edge of RG  
H1 falling delay, activated by the rising edge of XSHP  
H1 rising delay, activated by the rising edge of XSHD  
CLD falling delay, activated by the falling edge of XSHD  
CLD falling delay, activated by the rising edge of XRS  
XRS falling delay, activated by the falling edge of CLD  
CL falling delay, activated by the rising edge of H1  
H1 rising (falling) delay, activated by the rising edge of CKO  
XSHP pulse width  
–5  
–5  
–5  
–2  
–7  
–5  
–5  
17  
0
5
5
0
0
5
4
10  
7
2
2
7
2
7
22  
8
27  
15  
5
–5  
–5  
13  
15  
17  
38  
17  
0
2
7
18  
20  
22  
41  
20  
23  
25  
27  
45  
24  
tW2  
XSHD pulse width  
tW3  
CLD pulse width  
tW4  
CL pulse width  
tW5  
CKO pulse width  
—6—  
CXD2434ATQ  
3) Phase conditions of HD, VD, TRIG, EFS and ESG  
0.5VDD  
CL  
tSETUP  
tHOLD  
HD, VD, TRIG  
EFS, ESG  
0.5VDD  
0.5VDD  
VDD=5.0 V, Topr=25 °C, load capacitance of CL=30 pF  
Symbol  
tSETUP  
tHOLD  
Definition  
Min.  
Typ.  
Max.  
Unit  
ns  
HD, VD, TRIG, EFS and ESG setup time, activated by CL  
HD, VD, TRIG, EFS and ESG hold time, activated by CL  
20  
5
ns  
4) Phase characteristics of XV1, XV2, XV3, XSG, PBLK, XCPDM, XCPOB, BUSY, WEN and ID  
0.5VDD  
0.5VDD  
CL  
tPDCL1  
XV1, XV2, XV3  
BUSY, WEN, ID  
0.5VDD  
tPDCL2  
0.5VDD  
tPDCL3  
XSG, PBLK,  
XCPDM, XCPOB  
0.5VDD  
VDD=5.0 V, Topr=25 °C, load capacitance of CL=30 pF,  
load capacitance of XV1, XV2, XV3, XSG, PBLK, XCPDM, XCPOB, BUSY, WEN and ID=10 pF  
Symbol  
Definition  
Min.  
30  
Typ.  
Max.  
65  
Unit  
ns  
tPDCL1 XV1, XV2 and XV3 delay, activated by the falling edge of CL  
tPDCL2 BUSY, WEN and ID delay, activated by the rising edge of CL  
40  
60  
ns  
XSG, PBLK, XCPDM and XCPOB delay, activated by the  
tPDCL3  
40  
55  
ns  
rising edge of CL  
—7—  
CXD2434ATQ  
Description of Functions  
1. Progressive Scan CCD drive pulse generation  
Combining this IC with a crystal oscillator generates a fundamental frequency of 24.5454 MHz.  
CCD drive pulse generation is synchronized with the HD and VD inputs.  
Set fCL to 780 fHD and fHD to 525 fVD.  
The various operations are performed by the TRIG, EFS and ESG inputs. (See the following items.)  
<Detection timing for VD, TRIG, EFS and ESG>  
CL  
1
35  
HD  
H1  
T1  
Detection timing for VD,  
TRIG, EFS and ESG  
After HD input is detected, the status of VD, TRIG, ESG and EFS is detected during T1.  
Do not change the status of VD, TRIG, ESG and EFS during T1.  
When input is from a non-synchronized system, the low level period for each pulse should be set to 63.5 µs  
or longer to prevent misoperation.  
2. Reset  
The internal register values are undetermined immediately after power-on, so perform one of the following  
reset operations.  
1. Reset by the RESET pin  
Reset is performed by setting the RESET pin low for a period of 80 ns or more. Reset can also be  
performed by setting the RESET pin low during power-on and then switching the RESET pin from low to  
high when VDD rises to 4.75 V or higher. Note that when reset is performed by the RESET pin, the  
electronic shutter settings made by serial input are also reset.  
2. Reset by turning off the electronic shutter  
Reset is performed by setting the shutter mode to electronic shutter off and inputting VD. Note that in  
this case the TRIG, ESG and EFS pins should all be set high.  
—8—  
CXD2434ATQ  
3. Electronic shutter  
<Shutter modes>  
The electronic shutter has the following four shutter modes.  
Electronic shutter off :  
Exposure time is 1/30 s.  
High-speed electronic shutter : Exposure time is shorter than 1/30 s.  
Low-speed electronic shutter: Exposure time is longer than 1/30 s.  
Flickerless :  
Exposure time is 1/50 s. This is a special feature of the high-speed  
electronic shutter, and reduces flicker from fluorescent lights, etc. in areas  
with 50 Hz power supply  
<Shutter mode and speed setting methods>  
PS=Low : Serial input; set by the STRB, DCLK and DATA pins. The SMD1 and SMD2 pins are not used.  
PS=High : Parallel input; set by the STRB, DCLK, DATA, SMD1 and SMD2 pins.  
3-1. [Serial input]  
Serial input is set by the STRB, DCLK and DATA pins. The electronic shutter mode and the meanings of the  
numbers indicated by D0 to 9 vary according to the SMD1 and SMD2 setting of the internal register.  
STRB  
DCLK  
DATA  
SMD2 SMD1 D9  
D8  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
SMD1 SMD2  
Mode  
D0 to 9  
H
L
H
H
L
Electronic shutter off (1/30 s accumulation)  
High-speed electronic shutter  
Number of exposed lines (Note 1)  
Number of exposed frames (Note 2)  
H
Low-speed electronic shutter  
Note 1) Relationship between the number of exposed lines and the exposure time  
The relationship between the number of exposed lines and the exposure time is as follows.  
(Exposure time)=(Number of exposed lines) × (One horizontal scan period) + (Accumulation time for  
the readout lines)  
In this formula, one horizontal scan period equals the HD falling interval, and the accumulation time for  
the readout lines is the time from the rising edge of XSUB to the rising edge of XSG (456 bits). Also,  
(Number of exposed lines) should be set to greater than 1 but less than 524.  
Note 2) The number of exposed frames should be set to greater than 1 but less than 1023. However, when  
the number of exposed frames is 1 and SMDE is set to high, external trigger mode does not function.  
Timing Chart (Serial input)  
STRB  
tWD  
tSDS  
tHDD  
tWS  
DCLK  
DATA  
tSDD  
—9—  
CXD2434ATQ  
AC characteristics for serial input  
Symbol  
Definition  
Min.  
Max.  
tSDD  
tHDD  
tSDS  
tWS  
DATA setup time, activated by the rising edge of DCLK  
DATA hold time, activated by the rising edge of DCLK  
DCLK setup time, activated by the falling edge of STRB  
STRB pulse width  
10 ns  
10 ns  
10 ns  
82 ns  
82 ns  
tWD  
DCLK pulse width  
3-2. [Parallel input]  
PS  
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
SMD1  
H
L
SMD2  
H
L
STRB  
X
DCLK  
X
DATA  
X
Exposure time  
1/30 s  
Mode  
Electronic shutter off  
Flickerless  
X
X
X
1/50 s  
L
H
H
H
H
H
H
H
H
L
H
L
H
H
L
H
H
H
H
L
1/60 s  
L
1/125 s  
1/250 s  
1/500 s  
1/1000 s  
1/2000 s  
1/4000 s  
1/10000 s  
2 FRM  
L
H
L
L
L
High-speed shutter  
L
H
L
H
H
L
L
L
L
H
L
L
L
L
L
H
H
H
H
H
H
H
H
H
L
H
H
L
H
H
H
H
L
L
3 FRM  
L
H
L
4 FRM  
L
L
5 FRM  
Low-speed shutter  
L
H
L
H
H
L
6 FRM  
L
L
7 FRM  
L
H
L
L
8 FRM  
L
L
L
9 FRM  
—10—  
CXD2434ATQ  
4. External trigger mode  
External trigger mode starts exposure in sync with the external trigger input. No special pins are required to  
set this mode.  
The IC prepares to shift to external trigger mode with the falling edge of the TRIG pin (Note). The timing to  
shift to external trigger mode varies according to the mode setting. (See the table.) The BUSY pin  
maintains high status during external trigger mode. Whether or not to discharge the vertical CCD charge is  
set by FSE.  
Note) See the detection timing for VD, TRIG, EFS and ESG.  
Mode settings during external trigger (Note 1)  
PS  
L
SMD1 SMD2  
Description of operation  
The IC is shifted to external trigger mode by HD, exposure is finished after the set  
time, and XSG is output. (Note 2) (Note 3)  
L
L
X
H
H
The IC is shifted to external trigger mode by HD, exposure is finished 1/50 s later,  
and XSG is output.  
H
L
L
X
X
H
H
L
Do not set for external trigger.  
H
Trigger input is not accepted.  
Note 1) The SMD1 and SMD2 setting method varies according to the PS status. See “3. Electronic shutter”.  
PS=Low : Set by serial input.  
PS=High : Set by the SMD1 and SMD2 pins.  
Note 2) The exposure time setting method is the same as the exposure time setting for the electronic shutter.  
Note 3) When FSE=high, set the number of exposed lines from 1 to 522.  
<FSE and discharge operation>  
During external trigger mode, the previously exposed signal charge sometimes remains in the vertical CCD  
when exposure finishes. In this case, the image shot with external trigger mode is output overlapped with  
the previously shot image. Setting FSE to high performs discharge operation for signal charges remaining  
in the vertical CCD after trigger input. Discharge operation is not performed when FSE is low. This setting  
is only valid when SMD1 is low.  
<Finishing the exposure period with ESG>  
During external trigger mode, exposure can be finished in sync with the falling edge of ESG (Note). If  
SMDE is set to low, the XSG pulse is output regardless of the electronic shutter setting, when the falling  
edge of ESG is detected. ESG should be fixed to high status at all times other than during external trigger  
mode. Do not change SMDE while BUSY is high.  
Note) See the detection timing for VD, TRIG, EFS and ESG.  
<Signal after external trigger mode>  
After high-speed external trigger mode is finished, the exposure time differs from that performed by the  
electronic shutter setting. This is because the start and finish of external trigger mode are not synchronized  
to VD input.  
—11—  
CXD2434ATQ  
5. Discharge of the vertical CCD  
During EFS is low, discharge of the vertical CCD is performed. During FSE is high in the external trigger  
mode, the vertical control line by line is possible. That is different from discharge operation. The falling in  
the effective interval of EFS is detected, discharge is not performed even if the low status is held until the  
next effective period. For frames using EFS, set electronic shutter off or high-speed electronic shutter.  
When EFS is used, WEN (WM=low) may not indicate the proper status.  
<Discharge start>  
Vertical CCD discharge is started in sync with HD input after the falling edge of EFS (Note). Approximately  
3420 ns (81.4 ns × 42 clock pulses) are required to transfer one line vertically.  
Note) See the detection timing for VD, TRIG, EFS and ESG.  
<Discharge finish>  
Since the operation uses 42 clock pulses as one unit, when the rising edge of EFS is detected in interval  
[n], discharge operation stops from interval [n+1]. The period from the rising edge of EFS to the falling  
edge of VD must be longer than 2HD.  
Timing Chart 1  
n–1  
n
n+1  
EFS  
XV1  
XV3  
Timing Chart 2  
n
n+1  
CL  
XV3  
<Maximum number of dischargeable lines>  
The number of lines transferred by discharge transfer and normal transfer during the following period  
should not exceed 4096 lines.  
Period : The period from when the XSG pin becomes low until XSG becomes low again or the TRIG pin  
becomes low.  
6. Internal logic stop (standby mode)  
When the STDBY pin is set to low, clock supply is stopped to a part of the internal logic. However, output  
from the oscillation cell (OSCI and OSCO pins) as well as the CL and CKO pins does not stop. The status  
of each output pin when STDBY is low is shown below.  
High :  
Low :  
XSUB, XSG  
RG, H1, H2, XV1, XV2, XV3, XSHP, XSHD, XRS, XCPOB, XCPDM, PBLK, ID, WEN,  
BUSY, CLD  
Not stopped : OSCO, CL, CKO  
—12—  
CXD2434ATQ  
7. Mode settings  
7-1. VD input-related  
BUSY  
H
SMD1  
L
SMD2  
H
SMDE  
X
EFS  
X
VD input  
Invalid  
Readout operation or the number of  
accumulated frames is counted.  
Readout operation is performed.  
Invalid  
H
L
H
L
L
X
X
X
H
X
Note 1) When PS is high, SMD1 and SMD2 indicate the status of the SMD1 and SMD2 pins, respectively.  
When PS is low, these are the corresponding internal register values. See “3. Electronic shutter”.  
Note 2) Operation when PS=high, SMD1=low and SMD2=low conforms to that when SMD1=low and  
SMD2=high.  
7-2. TRIG, ESG and EFS input-related  
BUSY  
SMDE  
X
TRIG  
ESG  
EFS  
Discharge period  
(Note 1)  
Prohibited  
Invalid  
H
H
L
Prohibited  
Exposure period  
Readout operation (Note 4)  
Signal output period  
Prohibited  
IC shifted to  
Discharge operation  
(Note 6) (Note 7)  
Before TRIG input  
external trigger  
mode (Note 3)  
X
L
Prohibited (Note 5)  
After TRIG input  
(Note 2) (Note 3)  
Prohibited  
Prohibited  
Note 1) Only when FSE is high.  
Note 2) Valid only during low-speed shutter.  
Note 3) See “4. External trigger mode”.  
Note 4) ESG input is valid only one time after TRIG input. Do not input ESG two times or more.  
Note 5) Fix ESG to high status when BUSY is low.  
Note 6) When EFS is low, readout is not activated by VD input. See “7-1. VD input-related”.  
Note 7) Use in electronic shutter off state.  
Note 8) In case any two pins or more among TRIG, ESG, and EFS are falled at the same time, the operation is  
not guaranteed.  
7-3. WEN mode switching by WM  
WM  
L
Description of WEN operation  
Lines for which the signal from the CCD is valid output high; all other lines output low.  
Output is synchronized with XSG.  
H
—13—  
CXD2434ATQ  
—14—  
CXD2434ATQ  
0 1 5  
8 0 5  
4 1  
1
—15—  
CXD2434ATQ  
7 0 1  
5 3  
1
0 8 7  
—16—  
CXD2434ATQ  
7 0 1  
5 3  
1
0 8 7  
—17—  
CXD2434ATQ  
8 0 5  
4 1  
1
7 2  
1
—18—  
CXD2434ATQ  
5 3  
1
0 8 7  
—19—  
CXD2434ATQ  
—20—  
CXD2434ATQ  
8 0 5  
4 1  
1
—21—  
CXD2434ATQ  
8 0 5  
4 1  
1
7 2  
1
—22—  
CXD2434ATQ  
4 6 2  
6 5 2  
3 1  
6
1
7 2  
1
—23—  
CXD2434ATQ  
7 0 1  
5 3  
1
0 8 7  
—24—  
CXD2434ATQ  
—25—  
CXD2434ATQ  
Package Outline Unit : mm  
48PIN TQFP (PLASTIC)  
1.27 MAX  
1.0 ± 0.1  
9.0 ± 0.4  
7.0 ± 0.2  
25  
36  
0.1  
37  
24  
A
13  
48  
1
12  
0.2 ± 0.1  
0.5  
0.125 ± 0.05  
0.08  
M
0.1 ± 0.1  
+ 7°  
3° – 3°  
DETAIL A  
PACKAGE STRUCTURE  
PACKAGE MATERIAL  
LEAD TREATMENT  
LEAD MATERIAL  
EPOXY RESIN  
SOLDER PLATING  
42 ALLOY  
SONY CODE  
EIAJ CODE  
TQFP-48P-L071  
TQFP048-P-0707-AN  
JEDEC CODE  
PACKAGE WEIGHT  
0.2g  
—26—  

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